TWI461255B - 用於產生薄墊中的模塑窗之方法 - Google Patents

用於產生薄墊中的模塑窗之方法 Download PDF

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Publication number
TWI461255B
TWI461255B TW100110367A TW100110367A TWI461255B TW I461255 B TWI461255 B TW I461255B TW 100110367 A TW100110367 A TW 100110367A TW 100110367 A TW100110367 A TW 100110367A TW I461255 B TWI461255 B TW I461255B
Authority
TW
Taiwan
Prior art keywords
polishing
layer
recess
hole
adhesive layer
Prior art date
Application number
TW100110367A
Other languages
English (en)
Chinese (zh)
Other versions
TW201143969A (en
Inventor
史威克柏格斯勞Ａ
班尼特杜里Ｅ
班維紐多明尼克Ｊ
Original Assignee
應用材料股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 應用材料股份有限公司 filed Critical 應用材料股份有限公司
Publication of TW201143969A publication Critical patent/TW201143969A/zh
Application granted granted Critical
Publication of TWI461255B publication Critical patent/TWI461255B/zh

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Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00—Lapping machines or devices; Accessories
    • B24B37/11—Lapping tools
    • B24B37/20—Lapping pads for working plane surfaces
    • B24B37/205—Lapping pads for working plane surfaces provided with a window for inspecting the surface of the work being lapped
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00—Lapping machines or devices; Accessories
    • B24B37/11—Lapping tools
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04—Apparatus for manufacture or treatment
    • H10P72/0428—Apparatus for mechanical treatment or grinding or cutting

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
TW100110367A 2010-04-16 2011-03-25 用於產生薄墊中的模塑窗之方法 TWI461255B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US12/762,175 US8393940B2 (en) 2010-04-16 2010-04-16 Molding windows in thin pads

Publications (2)

Publication Number Publication Date
TW201143969A TW201143969A (en) 2011-12-16
TWI461255B true TWI461255B (zh) 2014-11-21

Family

ID=44788545

Family Applications (1)

Application Number Title Priority Date Filing Date
TW100110367A TWI461255B (zh) 2010-04-16 2011-03-25 用於產生薄墊中的模塑窗之方法

Country Status (5)

Country Link
US (1) US8393940B2 (enExample)
JP (1) JP5657775B2 (enExample)
KR (1) KR101761389B1 (enExample)
TW (1) TWI461255B (enExample)
WO (1) WO2011129959A2 (enExample)

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WO2008154185A2 (en) * 2007-06-08 2008-12-18 Applied Materials, Inc. Thin polishing pad with window and molding process
CN103222034B (zh) * 2010-11-18 2016-03-09 嘉柏微电子材料股份公司 包含透射区域的抛光垫
US8535115B2 (en) * 2011-01-28 2013-09-17 Applied Materials, Inc. Gathering spectra from multiple optical heads
JP5893479B2 (ja) * 2011-04-21 2016-03-23 東洋ゴム工業株式会社 積層研磨パッド
US9597769B2 (en) * 2012-06-04 2017-03-21 Nexplanar Corporation Polishing pad with polishing surface layer having an aperture or opening above a transparent foundation layer
ITTV20120147A1 (it) * 2012-07-30 2014-01-31 Hausbrandt Trieste 1892 Spa Capsula per la preparazione di bevande
US8961266B2 (en) * 2013-03-15 2015-02-24 Applied Materials, Inc. Polishing pad with secondary window seal
JP6838811B2 (ja) 2014-05-02 2021-03-03 スリーエム イノベイティブ プロパティズ カンパニー 断続的構造化研磨物品並びに被加工物の研磨方法
US9868185B2 (en) * 2015-11-03 2018-01-16 Cabot Microelectronics Corporation Polishing pad with foundation layer and window attached thereto
US10213894B2 (en) 2016-02-26 2019-02-26 Applied Materials, Inc. Method of placing window in thin polishing pad
WO2018005767A1 (en) * 2016-06-29 2018-01-04 Saint-Gobain Abrasives, Inc. Abrasive tools and methods for forming same
TWI629297B (zh) * 2016-07-05 2018-07-11 智勝科技股份有限公司 研磨層及其製造方法以及研磨方法
US10259099B2 (en) * 2016-08-04 2019-04-16 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Tapering method for poromeric polishing pad
JP2019528187A (ja) * 2016-08-31 2019-10-10 アプライド マテリアルズ インコーポレイテッドＡｐｐｌｉｅｄ Ｍａｔｅｒｉａｌｓ，Ｉｎｃｏｒｐｏｒａｔｅｄ 環状プラテン又は研磨パッドを有する研磨システム
KR101947877B1 (ko) * 2016-11-24 2019-02-13 두산중공업 주식회사 병렬 복열 방식의 초임계 이산화탄소 발전 시스템
KR101904322B1 (ko) * 2017-01-23 2018-10-04 에스케이씨 주식회사 연마패드 및 이의 제조방법
TWI650202B (zh) 2017-08-22 2019-02-11 智勝科技股份有限公司 研磨墊、研磨墊的製造方法及研磨方法
US10569383B2 (en) 2017-09-15 2020-02-25 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Flanged optical endpoint detection windows and CMP polishing pads containing them
US11325221B2 (en) * 2017-11-16 2022-05-10 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Polishing pad with multipurpose composite window
JP7134005B2 (ja) * 2018-07-26 2022-09-09 富士紡ホールディングス株式会社 研磨パッド
US20250303515A1 (en) * 2024-03-29 2025-10-02 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Multifunctional endpoint detection window

Citations (3)

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JPH08197434A (ja) * 1995-01-23 1996-08-06 Sony Corp 研磨用パッド
TW200510470A (en) * 2003-04-22 2005-03-16 Jsr Corp Polishing pad and method of polishing a semiconductor wafer
TW200906543A (en) * 2007-06-08 2009-02-16 Applied Materials Inc Thin polishing pad with window and molding process

Family Cites Families (15)

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Publication number Priority date Publication date Assignee Title
US5893796A (en) * 1995-03-28 1999-04-13 Applied Materials, Inc. Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus
JP3431115B2 (ja) * 1995-03-28 2003-07-28 アプライド マテリアルズ インコーポレイテッド ケミカルメカニカルポリシングの操作をインシチュウでモニタするための装置及び方法
US5738574A (en) 1995-10-27 1998-04-14 Applied Materials, Inc. Continuous processing system for chemical mechanical polishing
US6994607B2 (en) * 2001-12-28 2006-02-07 Applied Materials, Inc. Polishing pad with window
DE60011798T2 (de) * 1999-09-29 2005-11-10 Rohm and Haas Electronic Materials CMP Holdings, Inc., Wilmington Schleifkissen
US6685537B1 (en) 2000-06-05 2004-02-03 Speedfam-Ipec Corporation Polishing pad window for a chemical mechanical polishing tool
US6855034B2 (en) 2001-04-25 2005-02-15 Jsr Corporation Polishing pad for semiconductor wafer and laminated body for polishing of semiconductor wafer equipped with the same as well as method for polishing of semiconductor wafer
JP2003273046A (ja) * 2002-03-13 2003-09-26 Nihon Micro Coating Co Ltd 研磨装置及びテープ並びに方法
US6875077B2 (en) * 2002-03-18 2005-04-05 Raytech Innovative Solutions, Inc. Polishing pad for use in chemical/mechanical planarization of semiconductor wafers having a transparent window for end-point determination and method of making
JP2008044103A (ja) * 2003-04-09 2008-02-28 Jsr Corp 研磨複層体および半導体ウエハの研磨方法
JP2004343090A (ja) * 2003-04-22 2004-12-02 Jsr Corp 研磨パッドおよび半導体ウェハの研磨方法
US6986705B2 (en) * 2004-04-05 2006-01-17 Rimpad Tech Ltd. Polishing pad and method of making same
EP1739729B1 (en) * 2004-04-23 2012-03-28 JSR Corporation Polishing pad for semiconductor wafer, polishing multilayered body for semiconductor wafer having same, and method for polishing semiconductor wafer
JP4904027B2 (ja) 2005-08-10 2012-03-28 ニッタ・ハース株式会社 研磨パッド
US7179151B1 (en) * 2006-03-27 2007-02-20 Freescale Semiconductor, Inc. Polishing pad, a polishing apparatus, and a process for using the polishing pad

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08197434A (ja) * 1995-01-23 1996-08-06 Sony Corp 研磨用パッド
TW200510470A (en) * 2003-04-22 2005-03-16 Jsr Corp Polishing pad and method of polishing a semiconductor wafer
TW200906543A (en) * 2007-06-08 2009-02-16 Applied Materials Inc Thin polishing pad with window and molding process

Also Published As

Publication number Publication date
KR101761389B1 (ko) 2017-07-25
JP2013525124A (ja) 2013-06-20
WO2011129959A3 (en) 2012-04-19
JP5657775B2 (ja) 2015-01-21
US8393940B2 (en) 2013-03-12
WO2011129959A2 (en) 2011-10-20
US20110256818A1 (en) 2011-10-20
TW201143969A (en) 2011-12-16
KR20130088744A (ko) 2013-08-08

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