TWI459002B - Automatic test system and test process - Google Patents

Description

Automatic test system and method

The present invention relates to an automatic test system and method, and more particularly to an automatic test system and method thereof for collaborative processing.

The power supply is the most indispensable electronic component in electronic products, and in order to ensure the quality of the power supply, etc., in the design and manufacturing process of the power supply, a large number of tests and verifications must be passed to ensure that each The quality of a product can meet the requirements of customers.

With the development of electronic products, the power supply is equipped with a variety of new functions, but the more functions, the more items that need to be tested and inspected. At present, when testing the power supply for products, there are many types of tests and projects. Each test project has different parameter settings, and most of them adopt semi-automatic test methods, that is, functional tests of specific projects by different machines. After the test is completed, the test results produced by the machine are manually input into the computer for comparison, comparison, and even some of the path settings of some machines need to be manually Switching is performed. Therefore, in the process of product testing, the efficiency of product testing is often low due to the foregoing reasons.

In addition, the existing test system has shortcomings such as insufficient comprehensiveness and low efficiency, because the test machine is usually a machine with a long life. Some of the older test machines will have worse scalability in hardware devices than the new ones, and their software autonomy is relatively poor, and the measured results are not accurate enough. For this reason, the staff still need to supplement and complete the test items that are lacking in the test system by performing manual operations in the various functional tests of different machines. Moreover, after the relevant test operation is completed, the test results must be manually integrated by the staff, or some test results can be converted into relevant statistical charts and aggregated into the consolidated report for preservation. Or provide customer confirmation and verification, which not only consumes labor and test time, but also reduces overall test efficiency.

In view of this, how to develop an automated test system and method that is automated, accurate, low-cost, high-efficiency, and capable of integration and collaborative operation is an urgent problem that the related technical field currently needs to solve.

One of the objectives of the present invention is to provide an automated test system and method for collaboratively processing a group of devices through an electronic device, and the device can be controlled by the electronic device to perform product-related tests for automation, precision, and Low cost and high efficiency.

Another object of the present invention is to provide an automated test system and method, which can automatically output test results as a form or a graphic file after the end of the automated test, thereby reducing the complicated process of manually analyzing data, thereby improving the product. Test efficiency.

In order to achieve the above object, a broader aspect of the present invention provides an automatic test system comprising: a device group having a plurality of devices; and an electronic device, The input unit is configured to input an instruction; the storage unit; the controller is connected to the input unit and the storage unit, and is loaded into the storage unit according to the instruction, for controlling and starting the automatic test program, and transmitting the test instruction; Connected to the controller; and integrated with the communication interface, one end connected to the controller and the other end connected to the device group for integrating and transmitting test instructions to at least one of the plurality of devices of the device group for automated testing operation.

According to the concept of the present case, the automatic test system includes an automatic test report, which is an automatic test report outputted to the controller for calculation and consolidation.

According to the concept of the present case, the test report is at least one of an automatically generated form and a graphic file.

According to the concept of the present invention, the device group further includes a condition device group and a test device group, wherein the condition device group includes at least one of an AC power device, a load test device, and a signal switching device.

According to the concept of the present invention, the test device group includes at least one of a waveform test device, a voltage test device, a current and power test device, and other test devices.

According to the concept of the present case, the electronic device is a computer system plus a transmission interface.

According to the concept of the present case, the electronic device is an improved industrial platform.

According to the concept of the present invention, the input unit is a keyboard and a mouse, the controller is a central processing unit, and the output unit is a screen or a printing device.

According to the concept of the present case, the integrated transmission interface is a universal interface bus.

According to the concept of the case, the automatic test operation is written by a graphical editing language.

To achieve the above objectives, one of the broader aspects of the present invention provides an automatic test method that includes the following steps: providing a test system including a hardware model and address configuration interface, a test condition input interface, and hardware control The output value display interface; enter the hardware model and address configuration interface to select at least one device in the device group; enter the test condition input interface to set the test condition to be performed; select whether to enter the hardware control and its output The value display interface; if yes, enter the hardware control and its output value display interface to set the parameters of the at least one device; if not, enter the product test specification interface to set the product to be tested The specification target; entering the test program interface, driving the at least one device to perform product related testing according to the plurality of set values; and outputting the test report.

According to the concept of the present case, an execution system login operation is further included for confirming a user's account number and password.

According to the concept of the present case, when the user's account number and password are input incorrectly, the error message prompting interface is entered and the system is left.

According to the concept of the present invention, the device group further includes a condition device group and a test device group, wherein the condition device group includes at least one of an AC power device, a load test device, and a signal switching device.

According to the concept of the present invention, the test device group includes at least one of a waveform test device, a voltage test device, a current and power test device, and other test devices.

According to the concept of the case, after entering the parameters of the hardware control interface and setting device, The device can be instrumented and displayed to show the output of the test device.

According to the concept of the case, it is possible to select a test operation for different functions.

According to the concept of the present case, when the test report is output, the test report is automatically presented in the form of at least one of the form and the graphic file, and stored.

1‧‧‧Automatic test system

10‧‧‧Electronic devices

101‧‧‧ Controller

102‧‧‧Input unit

103‧‧‧storage unit

104‧‧‧Output unit

105‧‧‧Integrated transmission interface

11‧‧‧Device Group

117‧‧‧Conditional device group

118‧‧‧Testing device group

110‧‧‧AC power supply unit

111‧‧‧Electronic load device

112‧‧‧Signal switching device

113‧‧‧ Waveform test device

114‧‧‧Voltage test device

115‧‧‧ Current and power test equipment

116‧‧‧Other test devices

S20~S29‧‧‧Steps for automatic test method

S300~S393‧‧‧Second test steps for efficiency test

First Figure: It is a schematic diagram of the apparatus of the automatic test system of the preferred embodiment of the present invention.

Second: It is a schematic flow chart of the automatic test method of the preferred embodiment of the present invention.

One of the third figure and the third figure: it is a schematic diagram of the test procedure flow of the efficiency test using the automatic test method of the present case.

Figure 4: This is an efficiency test report chart that is automatically output using the automated test method of this case.

Some exemplary embodiments embodying the features and advantages of the present invention are described in detail in the following description. It is to be understood that the present invention is capable of various modifications in the various aspects of the present invention, and the description and illustration are in the nature of

Please refer to the first figure, which is a schematic diagram of the apparatus of the automatic test system of the preferred embodiment of the present invention. As shown in the figure, the automatic test system 1 of the present invention is mainly composed of an electronic device 10 and a device group 11. The electronic device 10 has a controller 101, an input unit 102, a storage unit 103, an output unit 104, and an integrated transmission interface 105. The input unit 102 is used for the user to input an instruction, and the controller 101 is connected with the input sheet. The unit 102, the storage unit 103, the output unit 104, and the integrated transmission interface 105 are electrically connected to receive the instruction input by the user in the input unit 102, and are loaded into the storage unit 103 according to the designation to control and start an automatic The test program is tested and a test command is transmitted to the integrated transport interface 105.

In this embodiment, the automatic test program may be, but is not limited to, an automated test collaborative software written by a graphical editing language, such as LabVIEW, which may send test instructions by the controller 101 of the electronic device 1, and The plurality of devices 110, 111, 112, 113, 114, 115, 116 are tested by integrating the transmission interface 105 and thereby controlling a plurality of devices 110, 111, 112, 113, 114, 115, 116 of the device group 11. Automated testing of the product, and the automated test procedures written by LabVIEW are highly efficient, stable, and compatible, helping to maintain the stable operation of automated test systems.

Referring to the first figure, one end of the integrated transmission interface 105 is electrically connected to the controller 101, and the other end is electrically connected to the device group 11 for integrating the message of the device group 11 and transmitting the test by the controller 101. The instructions are passed to at least one of the plurality of devices 110, 111, 112, 113, 114, 115, 116 of the device group 11 for automated test operations. After the automated test operation of one of the plurality of devices 110, 111, 112, 113, 114, 115, 116 is completed, a test result is transmitted from the integrated transmission interface 105 to the controller 101, and the operation and the sink are performed. The result of the operation and the rounding is transmitted to the output unit 104 to output a test report.

In some embodiments, the electronic device 10 can be, but is not limited to, a computer system, which can be a personal computer system or a server system, or even a PCI eXtensions for Instrumentation (PXI). This is limited to this. It can be seen that the device type to which the electronic device 10 is applied is not limited to personal use, or It is an electronic device used by enterprises, which makes it more widely used, and the electronic device 10 accompanying its different applications, even if different types of electronic devices 10 are replaced in the future, since the operation interface is still a standardized interface, the user is The operation does not need to be re-adapted, and the convenience of operation is added, and if the electronic device 10 is a modified industrial platform (PXI), the improved industrial platform (PXI) has high plasticity and can be adapted accordingly. The test requirements, combined with different test modules, combined into different test systems, coupled with the plasticity of its peripheral devices, can be through different integrated transmission interfaces, such as: GPIB-488, RS-232, USB, Ethernet, parallel, and other transmission interfaces communicate and communicate with other peripheral devices, and thus can be combined with existing test devices, such as a plurality of devices 110, 111, 112, 113, 114, 115 in the device group 11, 116 combined into a more efficient, more flexible automated test system.

In other embodiments, the input unit 102 of the electronic device 10 can be a keyboard and a mouse, but not limited thereto; the controller 101 can be, but is not limited to, a central processing unit; the storage unit 103 can be The memory unit or a hard disk device is not limited thereto; the output unit 104 can be, but is not limited to, a screen or a printing device, such as a printer; for example, the integrated transmission interface 105 can be A General Purpose Interface Bus (GPIB), but not limited to this.

Referring to the first figure again, as shown in the figure, the device group 11 includes a conditional device group 117 and a test device group 118, and the condition device group 117 is mainly used to provide the AC power required for the product to be tested. The electronic load device (AC source) 110, the electronic load device (E load) 111, and the signal multiplexing device (Signal Multiplexer) 112 are not limited thereto. Among them, the device supporting the AC power source 110 It can be Chroma6430, 6530, 6560, 6590, etc., but not limited thereto. The devices supporting the electronic load device (E load) 111 can be Chroma 6304 (63030), 6334 (63303), 6334 (63306), 6314 (63112). The device is not limited thereto, and the device supporting the signal multiplexing device (Signal Multiplexer) 112 may be a device such as DG3 RD-TE Rev0, Rev1 or Scalable to PXI-2527, but is not limited thereto.

The test device group 118 is used for performing waveform, voltage, current and power related tests of products such as a power supply, and includes a waveform test device (Oscilloscop) 113, a voltage test device (Multi Meter) 114, and a current and power test. Devices such as Power Meter 115 and other New Equipments 116 are not limited thereto. In addition, the device supporting the waveform test device (Oscilloscop) 113 may be Tektronix TDS5054, TDS5034B, DPO7054; LeCroy LT354ML, 44Xi or Scalable to PXI-5105, PXI-5124, etc., but not limited thereto. The device supporting the voltage meter (Multi Meter) 114 may be an Agilent 34970A, 34401A or the like, but is not limited thereto. The device supporting the current and power test device (Power Meter) 115 may be Chroma 6630, 66202; Xitron 2801 or Scalable to PXI-4071, but not limited thereto.

In this way, when at least one of the plurality of devices 110, 111, 112, 113, 114, 115, and 116 in the device group 11 is to be used for product-related testing, the message integration through the integrated transmission interface 105 is required. Further, the electronic device 10 communicates and coordinates with the electronic device 10, and after the user performs relevant command input and parameter setting on the electronic device 10, the electronic device 10 and the device group 11 can automatically perform message communication and cooperative processing operations. a plurality of devices 110, 111 in the drive device group 11 At least one of 112, 113, 114, 115, and 116 performs product testing, and after the product-related test ends, the test result is transmitted back to the electronic device 10 for calculation and consolidation, and outputted to the output unit 104. A test report.

In this embodiment, the test report output by the output unit 104 can be, but is not limited to, a text file or a spreadsheet, such as a Word or Excel file, an automatically outputted form or a waveform diagram, a trend graph, etc. A chart for the user to query the test result of the automated test, or directly provide the test report of the output to the customer for confirmation and verification; thereby automatically outputting the test report, the manual report is exempted In addition to reducing the errors caused by human operations, it can improve the efficiency of automated testing, and can develop different report output formats according to the requirements of different customers to achieve the advantages of customized test reports. . Furthermore, the automatic test system 1 of the present invention is matched with the high-precision precision test instrument in the device group 11, thereby effectively improving the accuracy of the automated test method, and at the same time, matching and applying the existing electronic device 10 The integrated transmission interface 105 and some existing test devices can effectively reduce the cost, and the existing devices 110, 111, 112, 113 in the device group 11 can be manipulated only through the electronic device 10 and the integrated transmission interface 105. 114, 115, 116, no need to re-purchase new test equipment, and no need to re-learn in the operation of the system, not only easy to operate, but also has the advantages of high stability and low cost.

Please refer to the second figure, which is a schematic flowchart of the automatic test method of the preferred embodiment of the present invention. As shown in the figure, the automatic test method of the present invention mainly includes the following steps: First, the user performs a system login operation (as shown in step S20) on an electronic device 10, and at this time, the system login is entered. A page (not shown) that can be entered into the automated test system by entering the user's account number and password. After the user completes the account and password input, the system will confirm whether the user's account and password are correct (ID and Password are Correct?) (as shown in step S21), if the user input account and password are correct, Then, it will enter a hardware model and address configuration interface (System H/W Configuration) (as shown in step S22), in the hardware model and address configuration interface can be selected by a device group 11 to be set At least one device tested, as long as the account and password entered by the user are incorrect, an error message prompt interface (Show Error Message) will be entered (as shown in step S210), and then the system will be directly left (Exit) System) (as shown in step S29).

After setting the device to be tested in the hardware model and address configuration interface, a test condition input interface (shown in step S23) is entered, and the test condition input interface allows the user to Customize different test conditions, for example, the user can select 50% load as the test condition, etc., but not limited to this. After the input of the test condition is finished, the user can select whether to enter the hardware and its output value display control interface (as shown in step S24). If the user selects yes, the hardware control and the output value display interface can be entered (H/ And the control parameter of the at least one device is set, and Instrument control (H/W Control), and further display a result of the at least one device (Show Result). If the user chooses not to enter the hardware control and its output value display interface, then directly enters a product test specification (Test Specification) (as shown in step S26), after entering the product test specification interface, the user can Set the product specification target for the test to be tested. When the product test is finished, the product can be tested. Compare with the set product specification target to determine if the product passed the test target.

And after setting the product test specification, entering a program and function test (Program and Function Test) for setting the test item, and driving the at least one device to perform the product related test according to the plurality of set values (eg, step S27) In the test program interface, the test function can be selected in sequence for different functions, wherein each test function of the different functions has a test program (as shown in the third figure), thereby being different Different test procedures and test items are developed for the test requirements. Finally, after the test program is executed, the at least one device transmits the test result to the electronic device 10 through the integrated transmission interface 105, and outputs a test report (Report) on the output unit 104 (as shown in step S28). The test report can be automatically presented on the output unit 104 in the form of a form or a graphic, and can be stored or outputted by the user, and after the user finishes viewing or storing the test report of the output. , will exit, exit the system (Exit System) (as shown in step S29) to complete the automated test method of the case. In this way, the automated test method of the present case can combine the functions of instrument control and function test, wherein the steps of inputting the parameters of the instrument can control and monitor the related device group 11, and the automatic test is prepared by writing. The steps can be automated and can automatically generate reports on the electronic device 10, thus having powerful automatic testing and monitoring functions.

Please also refer to one of the third figure and the third figure ii, which is a schematic diagram of the test procedure flow of the efficiency test using the automatic test method of the present case. As shown in the figure, when a product is tested in the efficiency of the foregoing embodiment, an efficiency test is performed when the user performs an efficiency test in the test program interface. In the meantime, the product will be tested in the following steps: First, the system will let the user select whether to display the pause message (Show Message Doesn't Chick?) (as shown in step S300), if the selection is yes, then A Show Message will be displayed (as shown in step S301), and then the display information can be operated. If the selection is no, proceed to the following steps: Set Loading and On (as shown in step S311) and Power Meter Initialize (as shown in step S312); After the load and the start are set and the power analyzer is initialized, at least one device to be tested is loaded, and the Turn On Delay is delayed, so that the at least one device has sufficient reaction time (as shown in step S321). At this time, the delay start time is in milliseconds (mS), but not limited to this.

Then, the step of turning on the product input power (Set Vin and On) (as shown in step S322), after the product power is turned on, continuing to test whether the product sets the pre-test main output state (DC State Before Test isn) 't None?) (as shown in step S330), if it is YES, it is detected whether the main output of the product is turned on (DC State Before Test is ON?) (as shown in step S331), and thereafter, if If yes, the main output (Set DC ON) is turned on (as shown in step S332), if it is no, the main output (Set DC OFF) is turned off (as shown in step S333); as for the test If the pre-test main output state is not set, proceed directly to the next step: Measure Delay (as shown in step S341), so that the test product reaches an output stable state, wherein the delay measurement time is The second (S) is the unit.

Thereafter, the step of measuring data (Measure Test Data) is started (as shown in step S342), that is, the related data of the product is started to be measured. First, choose whether to choose first Detecting the product output voltage (Von Spec isn't None?) (as shown in step S350), if it is YES, then comparing the output voltage with a set value to detect whether the output voltage is greater than the setting The value (Vout>Von?) (as shown in step S351), if the result of the test is that the output voltage is greater than the set value, the test of the next step is performed, and if not, the product has a problem and an error is output. The message (as shown in step S352) and record the value of the test (Record Test Data) (as shown in step S372), and enter the step of the subsequent product power supply (Vin State After Test is On?) (step S380) Shown). When the output voltage is greater than the set value, it means that the product to be tested is in normal operation, and can enter a step of defining whether the subsequent efficiency specification is defined (Efficiency Spec isn't None?) (as shown in step S360), Mainly to check whether the user needs to check the efficiency in the input conditions, and if so, directly evaluate the efficiency (Judgment Efficiency Spec) (as shown in step S361), and if not, proceed to the next test condition, ie In order to perform the load test specification definition step (Idc Spec isn't None?) (as shown in step S370), if the user needs to perform load detection in the setting, the load evaluation (Judgment Idc Spec) will be performed (eg Step S371), if the user does not set the load test, the next step is to record the test message (as shown in step S372), which can output the aforementioned output voltage. Relevant test data such as efficiency and load are recorded together.

After testing the main items of the above-mentioned products to be tested, the subsequent related settings are further set: whether the input power of the product is turned on after the test is completed (Vin State After Test is On?) (as shown in step S380), if no , the product's input power (Set Vin Off) is turned off (as shown in step S381), and if so, whether to further set the main output state after the product test is completed (DC State After Test isn' t None? (as shown in step S390), if yes, continue to determine whether the main output of the product is turned on (DC State After Test is ON?) (as shown in step S391), if it is the main output after the test is completed If it is enabled, the main output (Set DC ON) can be turned on according to the user's setting (as shown in step S392). If the main output is turned off after the test is completed, it can be set according to another setting of the user. The main output (Set DC OFF) is turned off (as shown in step S393), thereby completing the efficiency test flow of the product to be tested.

1‧‧‧Automatic test system

10‧‧‧Electronic devices

101‧‧‧ Controller

102‧‧‧Input unit

103‧‧‧storage unit

104‧‧‧Output unit

105‧‧‧Integrated transmission interface

11‧‧‧Device Group

117‧‧‧Conditional device group

118‧‧‧Testing device group

110‧‧‧AC power supply unit

111‧‧‧Electronic load device

112‧‧‧Signal switching device

113‧‧‧ Waveform test device

114‧‧‧Voltage test device

115‧‧‧ Current and power test equipment

116‧‧‧Other test devices

Claims (16)

An automatic test system comprising: a device group having a plurality of devices; and a modified industrial platform comprising: an input unit for inputting an instruction; a storage unit; a controller coupled to the input The unit and the storage unit are loaded into the storage unit according to the instruction for controlling and starting an automatic test program, and transmitting a test command; an output unit connected to the controller; and an integrated transmission interface, The integrated transmission interface is a universal interface bus, one end is connected to the controller, and the other end is connected to the device group for integrating and transmitting the test command to at least one of the plurality of devices of the device group. , 俾 conduct an automated test operation. For example, in the automatic test system described in claim 1, the automatic test system includes an automatic test report, which is a test result transmitted to the controller, and after the calculation and the collection, the automatic test report is output. . The automatic test system of claim 2, wherein the test report is at least one of an automatically generated form and a graphic file. The automatic test system of claim 1, wherein the device group further comprises a conditional device group and a test device group, wherein the condition device group comprises an AC power supply device and a load test device. At least one of the signal switching devices One device. The automatic test system of claim 1, wherein the test device group comprises at least one of a waveform test device, a voltage test device, a current and power test device, and other test devices. The automatic test system of claim 1, wherein the electronic device is a computer system. The automatic test system of claim 1, wherein the input unit is a keyboard and a mouse, and the controller is a central processing unit, and the output unit is a screen or a printing device. The automatic test system of claim 1, wherein the automatic test operation is written by a one-dimensional editing language (LabVIEW). An automatic test method for an improved industrial platform, comprising the steps of: providing a test system comprising a hardware model and address configuration interface, a test condition input interface, and a hardware control and output value thereof Displaying the interface; entering the hardware model and address configuration interface for selecting at least one device in a device group; entering the test condition input interface for setting a test condition to be performed; selecting whether to enter the hardware Control and its output value display interface; if yes, enter the hardware control and its output value display interface to set the parameters of the at least one device; if not, enter a product test specification interface for setting One of the product specification targets to be tested; entering a test program interface, driving the at least one device to perform product related testing according to the plurality of set values; and Output a test report. The automatic test method described in claim 9 further includes performing a system login operation for confirming a user's account number and password. For example, the automatic test method described in claim 10, wherein when the user's account number and password are input incorrectly, an error message prompting interface is entered and the system is left. The automatic test method of claim 9, wherein the device group further comprises a conditional device group and a test device group, wherein the condition device group comprises an AC power supply device and a load test device. At least one of the signal switching devices. The automatic test method of claim 9, wherein the test device group comprises at least one of a waveform test device, a voltage test device, a current and power test device, and other test devices. The automatic test method according to claim 9, wherein after entering a hardware control and its output value display interface and setting a parameter of the device, the device can be controlled by the instrument, and the system can display the test. One of the outputs of the device. For example, the automatic test method described in claim 9 of the patent application may select a test operation for different functions. The automatic test method of claim 9, wherein when the test report is output, the test report is automatically presented in a form of at least one of a form and a graphic file, and stored.