CN116185735A - Interface testing method and device - Google Patents

Interface testing method and device Download PDF

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Publication number
CN116185735A
CN116185735A CN202310146329.8A CN202310146329A CN116185735A CN 116185735 A CN116185735 A CN 116185735A CN 202310146329 A CN202310146329 A CN 202310146329A CN 116185735 A CN116185735 A CN 116185735A
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tested
information
interface
test
category
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李墨慷
董丽颖
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Megarobo Technologies Co Ltd
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Megarobo Technologies Co Ltd
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Priority to CN202310146329.8A priority Critical patent/CN116185735A/en
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2268—Logging of test results
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273—Test methods
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
    • Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

The application discloses an interface testing method and device, in the method, testing configuration information is obtained, wherein the testing configuration information comprises at least 2 pieces of interface information to be tested, which are arranged according to a preset sequence; analyzing the test configuration information, and sequentially determining current interface information to be tested based on at least 2 interface information to be tested, which are set according to a preset sequence; transmitting a test instruction corresponding to the current interface information to be tested to the equipment to be tested; and receiving a test result or test data returned from the device to be tested. Therefore, the method does not need to test a plurality of interfaces to be tested one by one manually, only needs to automatically and sequentially determine the current interface information to be tested by analyzing the test configuration information, automatically sends a test instruction to the equipment to be tested, and receives test data or test results thereof, so that the speed of testing the interfaces is increased, and the efficiency of testing the interfaces can be improved.

Description

Interface testing method and device
Technical Field
The present disclosure relates to the field of automated testing technologies, and in particular, to an interface testing method and apparatus.
Background
Before the electronic device is put into use, quality detection is required. And whether the interface is abnormal or not is one of important links for measuring the quality of the electronic equipment.
In the prior art, the interface test method generally adopted is as follows: and the tester performs corresponding test on each interface of the electronic equipment, and then puts the electronic equipment into use or maintains the electronic equipment according to the test result.
However, the above-mentioned interface test method adopts a manual test mode, and under the condition that the number of interfaces of the electronic device is large, the problems of long test time, large manpower and the like easily occur, so that the efficiency of the interface test is reduced.
Disclosure of Invention
In view of this, the embodiments of the present application provide an interface testing method and apparatus, which aim to improve the efficiency of interface testing.
In a first aspect, an embodiment of the present application provides an interface testing method, where the method includes:
acquiring test configuration information, wherein the test configuration information comprises at least 2 pieces of interface information to be tested, which are arranged according to a preset sequence;
analyzing the test configuration information, and sequentially determining current interface information to be tested based on the at least 2 interface information to be tested, which are set according to a preset sequence;
transmitting a test instruction corresponding to the current interface information to be tested to the equipment to be tested;
and receiving a test result returned by the equipment to be tested, or receiving test data output by a current interface to be tested of the equipment to be tested, which corresponds to the current interface information to be tested.
Optionally, the interface to be tested includes an interface to be tested belonging to a category information of a first category;
the test result returned from the device to be tested comprises the following steps:
and when the current interface to be tested corresponding to the current interface to be tested information belongs to the first category, receiving the test result returned by the equipment to be tested, wherein the test result is a result generated by comparing the write-in data written into a memory by the equipment to be tested from the current interface to be tested according to the test instruction with the read-out data read out from the memory.
Optionally, the first type of interface to be tested includes a serial peripheral SPI interface or a serial communication I 2 And C, interface.
Optionally, the interface to be tested includes an interface to be tested belonging to a category information of a second category;
the sending, to the device to be tested, a test instruction corresponding to the current interface information to be tested, including:
when the current interface to be tested corresponding to the current interface information to be tested belongs to the second category, a test instruction and a test file packet corresponding to the current interface information to be tested are sent to the equipment to be tested, so that the equipment to be tested controls a display screen connected with the current interface to be tested to display based on the test instruction and the test file packet.
Optionally, the second class of interfaces to be tested includes at least one of: the low-voltage differential signaling LVDS interface, the liquid crystal display communication EDP interface, the high-definition multimedia HDMI interface, the mobile industry processor MIPI interface or the V-BY-ONE interface.
Optionally, the interface to be tested includes an interface to be tested belonging to a third category of category information;
the test data received from the device to be tested and output by the current interface to be tested corresponding to the current interface to be tested information comprises:
when the current interface to be tested corresponding to the current interface to be tested information belongs to the third category, receiving the test voltage output by the current interface to be tested of the equipment to be tested, wherein the test voltage is obtained by detecting the current interface to be tested after the equipment to be tested outputs the preset standard voltage to the current interface to be tested based on the test instruction;
the method further comprises the steps of:
and when the current interface to be tested corresponding to the current interface to be tested information belongs to the third category, comparing the test voltage with the preset standard voltage to obtain a test result of the current interface to be tested.
Optionally, the interface to be tested of the third class includes a general purpose input output GPIO interface.
Optionally, the interface information to be tested includes single information of the interface to be tested and category information of the interface to be tested, and each category information corresponds to at least 2 interfaces to be tested;
the sending, to the device to be tested, a test instruction corresponding to the current interface information to be tested, including:
when the current interface information to be tested is the category information, a test instruction corresponding to the category information is sent to the equipment to be tested, and selection control signals corresponding to at least 2 interfaces to be tested one by one corresponding to the category information are sequentially sent to test jigs connected with at least 2 interfaces to be tested corresponding to the category information, so that the test jigs select one interface to be tested from the at least 2 interfaces to be tested to be the current interface to be tested based on the selection control signals;
the receiving the test result returned from the device to be tested or receiving the test data output by the current interface to be tested of the device to be tested corresponding to the current interface to be tested information, including:
When the current interface to be tested information is the category information, sequentially receiving at least 2 interfaces to be tested corresponding to the category information from the device to be tested as the test data output by the current interface to be tested when the current interface to be tested is the current interface to be tested respectively, or receiving at least 2 interfaces to be tested corresponding to the category information from the device to be tested as the test results returned when the current interface to be tested is the current interface to be tested respectively.
Optionally, the category information includes the first category;
the category information includes the third category.
Optionally, each piece of interface information to be tested is correspondingly provided with a test action identifier, and the test action identifier comprises a manual identifier or an automatic identifier;
analyzing the test configuration information, and sequentially determining current interface information to be tested based on the at least 2 interface information to be tested, which are set according to a preset sequence, wherein the method comprises the following steps:
if the current test action identifier of the current interface information to be tested is the manual identifier, receiving the test result input by a user, and determining that the next interface information to be tested is the current interface information to be tested based on the preset sequence;
And if the current test action identifier of the current interface information to be tested is the automatic identifier, automatically determining that the next interface information to be tested is the current interface information to be tested based on the preset sequence.
Optionally, the interface information to be tested includes single information of the interface to be tested and category information of the interface to be tested, and each category information corresponds to at least 2 interfaces to be tested;
the category information includes the first category; the test action identifier of the first category is the automatic identifier;
the category information includes the second category; the test action identifier of the second category is the manual identifier;
the category information includes the third category; the test action identifier of the third category is the automatic identifier.
Optionally, the method further comprises:
and leading out the test result/test data.
In a second aspect, an embodiment of the present application provides an interface testing apparatus, including:
the device comprises an acquisition module, a test module and a test module, wherein the acquisition module is used for acquiring test configuration information, and the test configuration information comprises at least 2 pieces of interface information to be tested, which are arranged according to a preset sequence;
the analysis module is used for analyzing the test configuration information and sequentially determining the current interface information to be tested based on the at least 2 interface information to be tested, which are arranged according to the preset sequence; the method comprises the steps of carrying out a first treatment on the surface of the
The sending module is used for sending a test instruction corresponding to the current interface information to be tested to the equipment to be tested;
the receiving module is used for receiving a test result returned by the equipment to be tested or receiving test data output by a current interface to be tested of the equipment to be tested, which corresponds to the current interface information to be tested.
Optionally, the interface to be tested includes an interface to be tested belonging to a category information of a first category;
the apparatus further comprises:
and the first response module is used for obtaining a result generated by comparing the writing data written into the memory by the current interface to be tested with the reading data read out from the memory according to the test instruction sent by the sending module when the current interface to be tested corresponding to the current interface to be tested belongs to the first category, and sending the result to the receiving module.
Optionally, the interface to be tested includes an interface to be tested belonging to a category information of a second category;
and the second response module is used for controlling a display screen connected with the current interface to be tested to display according to the test instruction and the test file packet which are sent by the sending module and correspond to the current interface to be tested when the current interface to be tested corresponding to the current interface to be tested belongs to the second category.
Optionally, the interface to be tested includes an interface to be tested belonging to a third category of category information;
the receiving module is configured to receive the test voltage output from the current interface to be tested of the device to be tested when the current interface to be tested corresponding to the current interface to be tested information belongs to the third class, where the test voltage is a voltage detected from the current interface to be tested after the device to be tested outputs the preset standard voltage to the current interface to be tested based on the test instruction;
the apparatus further comprises:
and the test result generation module is used for comparing the test voltage with the preset standard voltage when the current interface to be tested corresponding to the current interface to be tested information belongs to the third category, and obtaining the test result of the current interface to be tested.
Optionally, the interface information to be tested includes single information of the interface to be tested and category information of the interface to be tested; each category information corresponds to at least 2 interfaces to be tested;
the sending module is used for sending a test instruction corresponding to the category information to the equipment to be tested when the current interface information to be tested is the category information, and sequentially sending selection control signals corresponding to at least 2 interfaces to be tested one by one, wherein the selection control signals correspond to the category information;
The apparatus further comprises:
the selection test module is used for selecting one interface to be tested from at least 2 interfaces to be tested corresponding to the category information based on the selection control signal as the current interface to be tested;
the receiving module is configured to sequentially receive, when the current interface to be tested information is category information, the test data output when at least 2 interfaces to be tested corresponding to the category information of the device to be tested are respectively the current interfaces to be tested, or receive test results returned when the at least 2 interfaces to be tested of the device to be tested are respectively the current interfaces to be tested.
Optionally, the interface information to be tested includes specific interface information to be tested and interface information to be tested; each class of interfaces to be tested comprises at least two specific interfaces to be tested;
each interface information to be tested is correspondingly provided with a test action identifier, and the test action identifier comprises a manual identifier or an automatic identifier;
the analysis module is used for receiving the test result input by a user if the test action identifier of the current interface information to be tested is an artificial identifier, and determining that the next interface information to be tested is the current interface information to be tested based on the preset sequence; and if the current test action identifier is an automatic identifier, automatically determining that the next interface information to be tested is the current interface information to be tested based on the preset sequence.
In a third aspect, an embodiment of the present application provides an electronic device, including:
a memory for storing a computer program;
a processor, configured to execute the computer program, so that the device executes the interface testing method described in the foregoing first aspect.
In a fourth aspect, embodiments of the present application provide a computer storage medium, where a computer program is stored, where the computer program is executed by a processor to implement the interface testing method described in the first aspect.
Compared with the prior art, the embodiment of the application has the following beneficial effects:
the embodiment of the application provides an interface testing method and device, wherein in the method, testing configuration information is obtained, and the testing configuration information comprises at least 2 pieces of interface information to be tested, which are arranged according to a preset sequence; analyzing the test configuration information, and sequentially determining current interface information to be tested based on at least 2 interface information to be tested, which are set according to a preset sequence; transmitting a test instruction corresponding to the current interface information to be tested to the equipment to be tested; and receiving a test result returned by the device to be tested, or receiving test data output by a current interface to be tested of the device to be tested, which corresponds to the current interface information to be tested. Therefore, the method does not need to test the interfaces to be tested one by one in a mode of consuming more manpower, only needs to automatically and sequentially determine the information of the current interface to be tested by analyzing the test configuration information, and automatically sends the test instruction corresponding to the information of the current interface to be tested and the test data/test result of the current interface to be tested received from the equipment to be tested to the equipment to be tested, so that the speed of testing the interfaces can be increased, the time consumed by testing the interfaces is greatly saved, and the efficiency of testing the interfaces is improved.
Drawings
In order to more clearly illustrate the present embodiments or the technical solutions in the prior art, the drawings that are required for the embodiments or the description of the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
Fig. 1 is an application scenario of an interface testing method provided in an embodiment of the present application;
fig. 2 is a flowchart of an interface testing method provided in an embodiment of the present application;
fig. 3 is a schematic diagram of test configuration information according to an embodiment of the present application;
fig. 4 is a schematic diagram of an interface testing method according to an embodiment of the present application;
FIG. 5 is a derived graph of an interface test result according to an embodiment of the present disclosure;
fig. 6 is a schematic structural diagram of an interface testing device according to an embodiment of the present application;
fig. 7 is a schematic structural diagram of another interface testing device according to an embodiment of the present application.
Detailed Description
In order to make the present application solution better understood by those skilled in the art, the following description will clearly and completely describe the technical solution in the embodiments of the present application with reference to the accompanying drawings in the embodiments of the present application, and it is apparent that the described embodiments are only some embodiments of the present application, not all embodiments. All other embodiments, which can be made by one of ordinary skill in the art without undue burden from the present disclosure, are within the scope of the present disclosure.
Currently, the interface testing method in the prior art generally refers to: and the tester performs corresponding test on each interface of the electronic equipment, and then puts the electronic equipment into use or maintains the electronic equipment according to the test result. However, the interface test method adopts a manual test mode, so that the problems of long test time, more manpower and the like easily occur under the condition of more interfaces of the electronic equipment, and the efficiency of the interface test is reduced.
In order to solve the above problems, embodiments of the present application provide an interface testing method and apparatus, where in the method, test configuration information is obtained, where the test configuration information includes at least 2 pieces of interface information to be tested that are set according to a preset sequence; analyzing the test configuration information, and sequentially determining current interface information to be tested based on at least 2 interface information to be tested, which are set according to a preset sequence; transmitting a test instruction corresponding to the current interface information to be tested to the equipment to be tested; and receiving a test result returned by the device to be tested, or receiving test data output by a current interface to be tested of the device to be tested, which corresponds to the current interface information to be tested. Therefore, the method does not need to test the interfaces to be tested one by one in a mode of consuming more manpower, only needs to automatically and sequentially determine the information of the current interface to be tested by analyzing the test configuration information, and automatically sends the test instruction corresponding to the information of the current interface to be tested and the test data/test result of the current interface to be tested received from the equipment to be tested to the equipment to be tested, so that the speed of testing the interfaces can be increased, the time consumed by testing the interfaces is greatly saved, and the efficiency of testing the interfaces is improved.
For example, one of the scenarios of the embodiments of the present application may be applied to the scenario shown in fig. 1. The scenario includes a database 101 and a test device 102, where the database 101 includes test configuration information, the test device 102 obtains the test configuration information from the database 101 by adopting an implementation manner provided by the embodiment of the present application, and performs an interface test by adopting the implementation manner provided by the embodiment of the present application.
First, in the above application scenario, although the description of the actions of the implementation provided by the embodiments of the present application is performed by the test device 102; however, the embodiment of the present application is not limited in terms of execution subject, as long as the actions disclosed in the embodiments provided by the embodiment of the present application are executed.
Second, the above scenario is only one example of a scenario provided in the embodiments of the present application, and the embodiments of the present application are not limited to this scenario.
The following describes in detail, by way of embodiments, specific implementation manners of an interface testing method and apparatus in the embodiments of the present application with reference to the accompanying drawings.
Referring to fig. 2, the flowchart of an interface testing method provided in the embodiment of the present application, with reference to fig. 2, may specifically include:
s201: and acquiring test configuration information, wherein the test configuration information comprises at least 2 pieces of interface information to be tested, which are arranged according to a preset sequence.
After the test device is connected with the device to be tested including at least 2 interfaces to be tested, test configuration information corresponding to the at least 2 interfaces to be tested can be transferred into the test device, wherein the test configuration information includes at least 2 interfaces to be tested information arranged according to a preset sequence.
S202: analyzing the test configuration information, and sequentially determining the current interface information to be tested based on at least 2 interface information to be tested, which are set according to a preset sequence.
The testing equipment analyzes the testing configuration information, and sequentially determines that each interface information to be tested is the current interface information to be tested according to at least 2 interfaces to be tested included in the testing configuration information and the preset sequence, namely the testing equipment tests at least 2 interfaces to be tested of the testing equipment according to the preset sequence.
For example, the interface information to be tested may be an identifier of the interface to be tested, the abbreviation of the interface to be tested may be used as the identifier thereof, and the preset sequence may be preset by the tester according to the sequence of the plurality of interfaces to be tested in the device to be tested. Of course, other interface information to be tested or other orders may be set in other manners, which do not affect the implementation of the embodiments of the present application.
S203: and sending a test instruction corresponding to the current interface information to be tested to the equipment to be tested.
After the current interface information to be tested is determined, the test equipment sends a test instruction corresponding to the current interface information to be tested to the equipment to be tested, so that the equipment to be tested determines the current interface to be tested according to the test instruction corresponding to the current interface information to be tested.
S204: and receiving a test result returned by the device to be tested, or receiving test data output by a current interface to be tested of the device to be tested, which corresponds to the current interface information to be tested.
The equipment to be tested returns the test result of the current interface to be tested to the test equipment, or returns the test data output by the current interface to be tested to the test equipment, and the test equipment receives the test result of the current interface to be tested or the output test data.
In this embodiment of the present application, the types of the plurality of interfaces to be tested in the device to be tested may not be specifically limited, and for convenience of understanding, the following description will be made respectively. It should be noted that the implementations presented in the following description are only exemplary and not representative of all implementations of the embodiments of the present application.
Preferably, the interface to be tested may include an interface to be tested belonging to the category information being a first category; accordingly, step S204 may specifically include: when the current interface to be tested corresponding to the current interface to be tested information belongs to a first category, the test equipment receives a test result returned from the test equipment, wherein the test result refers to: after receiving a test instruction corresponding to the first type of interface to be tested, the device to be tested writes data into the memory from the first type of interface to be tested, reads the written data from the memory after the writing is completed, compares the written data with the read data to obtain a comparison result, and sends the comparison result to the test device as a test result of the first type of interface to be tested, wherein the test device receives the test result of the first type of interface to be tested, and the test result reflects whether the test of the first type of interface to be tested is passed or not. Therefore, when the current interface to be tested belongs to the first class of interfaces to be tested, the first class of interfaces to be tested are tested more intuitively according to comparison between the writing data written into the memory and the reading data read out from the memory, and the accuracy of interface testing is improved. Although in the present embodiment, the data is written and read and compared by the device to be tested, of course, in practical application, the data in the memory may also be read and compared by the test device.
Further preferably, the first type of interface to be tested may specifically include a serial peripheral SPI interface or a serial communication I 2 And C, interface. Of course, other interfaces to be tested of the first category may be used, and the implementation of the embodiments of the present application is not affected.
Preferably, the interface to be tested may include an interface to be tested belonging to the category information being the second category; accordingly, step S203 may specifically include: when the current interface to be tested corresponding to the current interface to be tested information belongs to a second category, the test equipment sends a test instruction and a test file packet corresponding to the second category of interfaces to be tested to the equipment to be tested, wherein the test file packet comprises files required for displaying a display screen through the interfaces to be tested of the second category, the second category of interfaces to be tested are connected with the display screen, and the equipment to be tested controls the display screen connected with the second category of interfaces to be tested to display according to the test instruction and the test file packet. It can be seen that when the current interface to be tested belongs to the interface to be tested of the second category, a test instruction corresponding to the interface to be tested of the second category is sent to the equipment to be tested, and meanwhile, a test file packet is also sent to the equipment to be tested, so that whether a display screen connected with the interface to be tested of the second category displays corresponding information in the test file packet or not is checked, whether the display screen is abnormal or whether other display screen detection equipment is adopted to judge whether the display screen is abnormal or not is convenient to observe by a subsequent tester, and therefore, the interface to be tested of the second category is tested by adopting a more convenient test method.
Further preferably, the interface to be tested of the second category may specifically include at least one of the following: the low-voltage differential signaling LVDS interface, the liquid crystal display communication EDP interface, the high-definition multimedia HDMI interface, the mobile industry processor MIPI interface or the V-BY-ONE interface; correspondingly, the test file package can comprise parameters and images corresponding to the interfaces to be tested of the second category, so that the display screen displays images received by the equipment to be tested according to the test file package.
Preferably, the interface to be tested may include an interface to be tested belonging to a third category of category information; accordingly, step S204 may specifically include: when the current interface to be tested corresponding to the current interface to be tested information belongs to a third category, the test voltage output by the current interface to be tested of the equipment to be tested is received, wherein the test voltage is the voltage obtained by detecting the current interface to be tested after the equipment to be tested outputs the preset standard voltage to the current interface to be tested based on the test instruction. Specifically, after receiving a test instruction corresponding to the information of the interface to be tested in the third category, the device to be tested outputs a preset standard voltage to the interface to be tested in the third category, then the voltage detector can detect the interface to be tested in the third category to obtain a test voltage and send the test voltage to the test device, and finally the test device receives the test voltage output by the interface to be tested in the third category of the device to be tested.
Correspondingly, the interface testing method can further comprise the following steps: when the current interface to be tested corresponding to the current interface to be tested information belongs to the third type of interface to be tested, the test equipment compares the received test voltage of the third type of interface to be tested with the preset standard voltage to obtain a test result whether the test of the third type of interface to be tested passes or not.
Further preferably, the interface to be tested of the third class may specifically comprise a general purpose input output GPIO interface.
Further preferably, the test voltage output by the interface to be tested of the third category may be detected by a multimeter as the voltage detector, and the test device obtains the test voltage of the interface to be tested of the third category by the multimeter.
Therefore, different testing methods are specifically selected for different kinds of interfaces to be tested, and the universality of the interface testing method can be improved.
Preferably, the interface information to be tested may include single information of the interface to be tested or class information of the interface to be tested, and each class information corresponds to at least 2 interfaces to be tested. For example, the interface information to be tested may include a single information SPI1 of the SPI interface, that is, only one SPI interface with a reference number of 1 corresponds to the SPI interface, or may include interface information to be tested of a third class of GPIO, where at least 2 GPIO interfaces, such as GPIO1 to GPIO3 with reference numbers of 1 to 3, may be corresponding to the interface information to be tested of the third class, that is, the interface to be tested belonging to the third class in the device to be tested may be tested according to the interface information to be tested of the third class.
Accordingly, step S203 may specifically include: when the current interface information to be tested is category information, the test equipment sends a test instruction corresponding to the category information to the equipment to be tested, and sequentially sends selection control signals corresponding to at least 2 interfaces to be tested, which correspond to the category information, to the test jigs connected with at least 2 interfaces to be tested, wherein the test jigs sequentially select one interface to be tested from the at least 2 interfaces to be tested to be the current interface to be tested based on the sequentially received selection control signals;
accordingly, step S204 may specifically include: when the current interface information to be tested is category information, the testing equipment sequentially receives at least 2 interfaces to be tested corresponding to the category information from the equipment to be tested, wherein the at least 2 interfaces to be tested are respectively test data sequentially output when the current interface to be tested is, or returned test results.
Further preferably, the category information may include a first category, a second category, or a third category.
It can be seen that the interface information to be tested can include not only single information of the interface to be tested, but also category information of the interface information to be tested, namely when the equipment to be tested includes a large number of interfaces to be tested, the category information of the interface to be tested can be set according to categories, so that the number of the interface information to be tested in the test configuration information is reduced, and the load of the test equipment for executing the analysis task during the test can be reduced; meanwhile, when the class information of the interfaces to be tested corresponds to at least 2 interfaces to be tested, selection control signals corresponding to the at least 2 interfaces to be tested one by one are sequentially sent to the test fixture, so that each interface to be tested corresponding to the class information is sequentially tested, any one of the at least 2 interfaces to be tested is sequentially and automatically selected to be tested according to the selection control signals, and the efficiency of interface test is further improved. It can be understood that the development of the equipment to be tested can be reduced by sending the selection control signal to the test fixture, and the cost can be reduced for the development of the test fixture relative to the development of the equipment to be tested because the equipment to be tested belongs to the vending equipment and the test equipment comprising the test fixture is the equipment for detecting the equipment to be tested. If the interface to be tested is of a first type, selecting a control signal as a signal for controlling one of at least two interfaces to be tested belonging to the first type to be selected to write data into the memory; if the interface to be tested is of the second type, selecting a control signal to control one of the two interfaces to be tested belonging to the second type to control the output of the display image to the display screen; and if the interface to be tested is in the third category, selecting a control signal to control one of the two interfaces to be tested belonging to the third category to control the output test voltage.
For example, if the device to be tested specifically includes a plurality of interfaces to be tested of a third class, and the interfaces to be tested of the third class are specifically a plurality of GPIO interfaces, the test device needs to test the plurality of GPIO interfaces; firstly, a test device sends a test instruction corresponding to third category information to a device to be tested, and simultaneously sends a selection control signal of one GPIO interface in a plurality of GPIO interfaces; then, the equipment to be tested controls the GPIO interfaces to output the same preset standard voltage of 3.3v according to the test instruction; then, the test fixture selects the corresponding GPIO interface to output test voltage according to the selection control signal, and meanwhile, the test fixture is connected with the universal meter; after the universal meter detects the test voltage on the GPIO interface, the test voltage is sent to the test equipment; the test equipment compares the test voltage of the GPIO interface according to the preset standard voltage and the test voltage of the GPIO interface measured by the universal meter, if the test voltage is the same as the test voltage, the test result of the GPIO interface is obtained, otherwise, the test result of the GPIO interface is obtained, wherein the test result of the GPIO interface is not obtained; finally, after the test equipment completes the test of one GPIO interface, the test equipment sends out the selection control signal of the next GPIO interface until all the GPIO interfaces in the equipment to be tested are tested.
For example, if the device to be tested specifically includes a plurality of interfaces to be tested of the first class, the interfaces to be tested of the first class are specifically 2 SPI interfaces and 3I interfaces 2 C interface, the test equipment needs to test 2 SPI interfaces and 3I interfaces 2 C, testing the interface; accordingly, a memory for writable data and readable data is included on the test fixture. Firstly, test equipment sends a test instruction corresponding to first class information to the equipment to be tested, and simultaneously sends a selection control signal of one SPI interface in 2 SPI interfaces; then, the testing jig selects a corresponding SPI interface according to the selection control signal, the equipment to be tested writes data into a memory in the testing jig through the SPI interface, reads the written data from the memory, compares the written data with read data to obtain a comparison result, sends the comparison result to the testing equipment as a testing result of the SPI interface, and the testing equipment can obtain a testing result whether the testing of the SPI interface is passed or not according to the testing result; then, after the test equipment completes the test on one SPI interface, the next SPI interface selection control signal is sent out until all SPI interfaces in the equipment to be tested complete the test; finally, the test equipment sends 3I to the equipment to be tested 2 One of the C interfaces I 2 Selecting control signals of the C interface, and continuously executing subsequent steps until all I in the equipment to be tested 2 And C, the interface completes the test.
Further preferably, the method of performing the interface test using the memory may also be applied to the interface to be tested of the third category. For example, if the interface to be tested of the third class is specifically a GPIO interface, correspondingly, a singlechip including the GPIO interface or a field programmable gate array FPGA chip including the GPIO interface needs to be provided on the test fixture, the GPIO interface of the device to be tested writes voltage through the corresponding GPIO interface of the singlechip or FPGA chip, reads the voltage after the writing is completed, and the device to be tested compares the written voltage with the read voltage to obtain a test result of the GPIO interface and feeds the test result back to the test device.
Preferably, each interface information to be tested is correspondingly provided with a test action identifier, and the test action identifier comprises a manual identifier or an automatic identifier; accordingly, step S202 may specifically include: analyzing the test configuration information, sequentially determining current interface information to be tested based on at least 2 interface information to be tested which are set in a preset sequence, and determining a current test action identifier; if the current test action identification of the current interface information to be tested is an artificial identification, receiving a test result of the current interface to be tested corresponding to the current interface information to be tested, which is input by a user, and determining that the next interface information to be tested is the current interface information to be tested based on a preset sequence by the test equipment; if the current test action identification of the current interface information to be tested is an automatic identification, the next interface information to be tested is automatically determined to be the current interface information to be tested based on a preset sequence.
Therefore, different test action identifiers are set for the interface information to be tested, and more proper test actions can be set according to the characteristics of different interfaces to be tested, so that the test speed of testing the interface to be tested is improved.
For example, referring to fig. 3, a schematic diagram of test configuration information is shown. Referring to fig. 3, the interface information to be tested is composed of its abbreviations and numbers, wherein the interface to be tested is marked as 1 if automatic testing is adopted, and is marked as 0 if manual testing is adopted. Of course, other manners may be adopted without affecting the implementation of the embodiments of the present application.
Further preferably, the interface information to be tested includes single information of the interface to be tested and category information of the interface to be tested, and each category information corresponds to at least 2 interfaces to be tested; when the category information comprises a first category, the test action identifier of the first category is an automatic identifier, namely at least 2 interfaces to be tested corresponding to the first category information are tested corresponding to the automatic identifier; when the category information comprises a second category, the test action identifier of the second category is a manual identifier, namely at least 2 interfaces to be tested corresponding to the second category information are all tested corresponding to the automatic identifier; when the category information comprises a third category, the test action identification of the third category is an automatic identification, namely at least 2 interfaces to be tested corresponding to the third category information are tested corresponding to the automatic identification.
Further preferably, the test device may specifically include an upper computer, and when the class information includes a second class, that is, at least 2 interfaces to be tested corresponding to the second class information are interfaces to be tested of the second class, the upper computer may generate a test result input interface for inputting a test result. For example, if the current interface to be tested is an HDMI interface, the user inputs a test result of whether the test of the HDMI interface is passed to the test result input interface according to a comparison result of the display screen and the image in the test file packet, so that the upper computer automatically determines that the next interface information to be tested is the current interface information to be tested based on the preset sequence.
Preferably, referring to fig. 4, an architecture diagram of an interface testing method is shown. Referring to fig. 4, the test device may specifically include an upper computer and a test fixture, where the device to be tested may specifically be a PG device, where the upper computer and the PG device are connected by a LAN bus, and a first type of interface SPI interface and I to be tested of the PG device 2 The interface C and the GPIO interface of the interface to be tested of the third class are connected with the test fixture; specifically, the test fixture may include a relay for receiving the selection control signal, where the relay is connected to multiple GPIO interfaces of the PG device, the multimeter, and the host computer, and the multimeter is connected to the host computer; the test fixture also comprises a memory connected with the SPI interface and the I2C interface; the HDMI interface of the PG equipment is connected with the display screen. The specific implementation manner of testing the interfaces to be tested of the PG device can refer to the specific implementation manner of S201 to S204, and will not be described in detail herein.
In addition, in an alternative embodiment of the present application, the interface testing method may further include: test results/test data are derived. The test equipment derives the test result or the test data received from the current interface to be tested of the equipment to be tested, and can check the test state or the test result of the equipment to be tested, so that the abnormal item in the test state or the test result is further positioned, and the user can maintain the abnormal item correspondingly. For example, a test status table may be generated to view a test procedure, and a test report of a device under test may be generated to view test results or test data of a plurality of interfaces under test in the device under test.
For example, referring to fig. 5, an export graph of interface test results is shown. Referring to fig. 5, the test results of all the interfaces to be tested in the device to be tested can be looked up according to the derived graph.
Based on the above-mentioned content related to S201-S204, in this embodiment, test configuration information is obtained, where the test configuration information includes at least 2 interface information to be tested set according to a preset sequence; analyzing the test configuration information, and sequentially determining current interface information to be tested based on at least 2 interface information to be tested, which are set according to a preset sequence; transmitting a test instruction corresponding to the current interface information to be tested to the equipment to be tested; and receiving a test result returned by the device to be tested, or receiving test data output by a current interface to be tested of the device to be tested, which corresponds to the current interface information to be tested. Therefore, the method does not need to test the interfaces to be tested one by one in a mode of consuming more manpower, only needs to automatically and sequentially determine the information of the current interface to be tested by analyzing the test configuration information, and automatically sends the test instruction corresponding to the information of the current interface to be tested and the test data/test result of the current interface to be tested received from the equipment to be tested to the equipment to be tested, so that the speed of testing the interfaces can be increased, the time consumed by testing the interfaces is greatly saved, and the efficiency of testing the interfaces is improved.
The embodiments of the present application provide some specific implementation manners of the interface testing method, and based on this, the present application further provides a corresponding apparatus. The apparatus provided in the embodiments of the present application will be described from the viewpoint of functional modularization.
Referring to fig. 6, which is a schematic structural diagram of an interface testing apparatus 600 according to an embodiment of the present application, the apparatus 600 may include:
the acquiring module 601 is configured to acquire test configuration information, where the test configuration information includes at least 2 pieces of interface information to be tested set according to a preset sequence;
the parsing module 602 is configured to parse the test configuration information, and sequentially determine current interface information to be tested based on at least 2 interface information to be tested set according to a preset sequence;
a sending module 603, configured to send a test instruction corresponding to the current interface information to be tested to the device to be tested;
the receiving module 604 is configured to receive a test result returned from the device to be tested, or receive test data output from a current interface to be tested of the device to be tested, where the test data corresponds to current interface information to be tested.
In this embodiment of the present application, by matching the four modules, that is, the acquisition module 601, the analysis module 602, the sending module 603, and the receiving module 604, the multiple interfaces to be tested need not to be tested one by one in a manner of consuming more manpower, only the current interface information to be tested needs to be automatically and sequentially determined by analyzing the test configuration information, and the test instruction corresponding to the current interface information to be tested and the test data/test result of the current interface to be tested received from the device to be tested are automatically sent to the device to be tested, so that the speed of testing the interfaces can be accelerated, the time consumed by the interface test is greatly saved, and the efficiency of the interface test is improved.
As an implementation manner, the interface to be tested of the device to be tested may specifically include the interface to be tested belonging to the category information as the first category; accordingly, the receiving module 604 may specifically be configured to:
when the current interface to be tested corresponding to the current interface to be tested information belongs to a first category, receiving a test result returned from the equipment to be tested, wherein the test result is a result generated by comparing the write-in data written into the memory by the equipment to be tested from the current interface to be tested according to the test instruction with the read-out data read out from the memory;
accordingly, the interface test apparatus 600 may further include:
and the first response module is used for obtaining a result generated by comparing the writing data written into the memory by the current interface to be tested with the reading data read out from the memory according to the test instruction sent by the sending module when the current interface to be tested corresponding to the current interface to be tested belongs to the first category, and sending the result to the receiving module. The first response module is integrated on a device to be tested, which comprises a plurality of interfaces to be tested.
As one implementation, the first type of interface to be tested may specifically include a serial peripheral SPI interface or serial communication I 2 And C, interface.
As an implementation manner, the interface to be tested of the device to be tested may specifically include the interface to be tested belonging to the category information being the second category; accordingly, the sending module 603 may specifically be configured to:
when the current interface to be tested corresponding to the current interface information to be tested belongs to a second category, sending a test instruction and a test file packet corresponding to the current interface information to be tested to the equipment to be tested, so that the equipment to be tested controls a display screen connected with the current interface to be tested to display based on the test instruction and the test file packet;
accordingly, the interface test apparatus 600 may further include:
and the second response module is used for controlling the display screen connected with the current interface to be tested to display according to the test instruction and the test file packet which are sent by the sending module and correspond to the current interface to be tested when the current interface to be tested corresponding to the current interface to be tested belongs to the second category. The second response module is integrated on the device to be tested, which comprises a plurality of interfaces to be tested.
As an embodiment, the interfaces to be tested of the second category may specifically include at least one of the following: the low-voltage differential signaling LVDS interface, the liquid crystal display communication EDP interface, the high-definition multimedia HDMI interface, the mobile industry processor MIPI interface or the V-BY-ONE interface.
As an embodiment, the interface to be tested of the device to be tested may specifically include an interface to be tested belonging to the category information of the third category; accordingly, the receiving module 604 may specifically be configured to:
when the current interface to be tested corresponding to the current interface to be tested information belongs to a third category, the test voltage output by the current interface to be tested of the equipment to be tested is received, wherein the test voltage is the voltage obtained by detecting the current interface to be tested after the equipment to be tested outputs the preset standard voltage to the current interface to be tested based on the test instruction.
Accordingly, the interface test apparatus 600 may further include:
the test result generation module is used for comparing the test voltage with a preset standard voltage when the current interface to be tested corresponding to the current interface information to be tested belongs to a third category, and obtaining the test result of the current interface to be tested; the selection test module is integrated in an upper computer of the test equipment.
As an embodiment, the interface to be tested of the third class may specifically include a general purpose input/output GPIO interface.
As an embodiment, the obtaining the interface information to be tested in the module 601 may specifically include: single information of interfaces to be tested or category information of the interfaces to be tested, wherein each category information corresponds to at least 2 interfaces to be tested; accordingly, the sending module 603 may specifically be configured to:
When the current interface information to be tested is the category information, a test instruction corresponding to the category information is sent to the equipment to be tested, and selection control signals corresponding to at least 2 interfaces to be tested one by one corresponding to the category information are sequentially sent to test jigs connected with at least 2 interfaces to be tested corresponding to the category information, so that the test jigs select one interface to be tested from the at least 2 interfaces to be tested to be the current interface to be tested based on the selection control signals; accordingly, the receiving module 604 may specifically be configured to:
when the current interface information to be tested is the category information, sequentially receiving the test data output when at least 2 interfaces to be tested corresponding to the category information of the equipment to be tested are respectively the current interfaces to be tested, or receiving the test results returned when at least 2 interfaces to be tested corresponding to the category information of the equipment to be tested are respectively the current interfaces to be tested;
accordingly, the interface test apparatus 600 may further include:
and the selection test module is used for selecting one interface to be tested from at least 2 interfaces to be tested corresponding to the category information as the current interface to be tested based on the selection control signal. The selection test module is integrated in the test fixture.
As an embodiment, the category information may specifically include a first category; or the category information may specifically include a third category.
As an implementation manner, each piece of interface information to be tested in the obtaining module 601 may be correspondingly provided with a test action identifier, where the test action identifier includes a manual identifier or an automatic identifier; accordingly, the parsing module 602 may be specifically configured to:
if the current test action identifier of the current interface information to be tested is the manual identifier, receiving the test result input by a user, and determining that the next interface information to be tested is the current interface information to be tested based on the preset sequence;
and if the current test action identifier of the current interface information to be tested is the automatic identifier, automatically determining that the next interface information to be tested is the current interface information to be tested based on the preset sequence.
As an implementation manner, the interface information to be tested specifically may include single information of the interface to be tested or class information of the interface to be tested, where each class information corresponds to at least 2 interfaces to be tested;
accordingly, the category information may specifically include the first category; the test action identifier of the first category is the automatic identifier;
Accordingly, the category information may specifically include the second category; the test action identifier of the second category is the manual identifier;
accordingly, the category information may specifically include the third category; the test action identifier of the third category is the automatic identifier.
As an embodiment, the interface test apparatus 600 may further include:
and the export module is used for exporting the test result/test data.
Referring to fig. 7, which is a schematic structural diagram of another interface testing apparatus 700 provided in an embodiment of the present application, the apparatus 700 may include:
the upper computer 701 may specifically include: the device comprises an acquisition module, an analysis module, a sending module, a receiving module and a test result generation module;
the device under test 702 may specifically include: a first response module and a second response module;
the test fixture 703 may specifically include: a test module is selected.
The specific application of each module included in the host computer 701, the device to be tested 702, and the test fixture 703 may refer to the specific application mode of the interface test apparatus 600, and will not be described herein.
The embodiment of the application also provides corresponding equipment and a computer storage medium, which are used for realizing the scheme provided by the embodiment of the application.
The device comprises a memory and a processor, wherein the memory is used for storing a computer program, and the processor is used for executing the computer program to enable the device to execute the interface testing method of any embodiment of the application.
The computer storage medium has a computer program stored therein, and when the code is executed, a device running the computer program implements the interface testing method of any of the embodiments of the present application.
The "first" and "second" in the names of "first", "second" (where present) and the like in the embodiments of the present application are used for name identification only, and do not represent the first and second in sequence.
From the above description of embodiments, it will be apparent to those skilled in the art that all or part of the steps of the above described example methods may be implemented in software plus general hardware platforms. Based on such understanding, the technical solutions of the present application may be embodied in the form of a software product, which may be stored in a storage medium, such as a read-only memory (ROM)/RAM, a magnetic disk, an optical disk, or the like, including several instructions for causing a computer device (which may be a personal computer, a server, or a network communication device such as a router) to perform the methods of the embodiments or portions of the embodiments of the present application.
It should be noted that, in the present specification, each embodiment is described in a progressive manner, and identical and similar parts of each embodiment are all referred to each other, and each embodiment is mainly described in a different point from other embodiments. In particular, for the device embodiments, since they are substantially similar to the method embodiments, the description is relatively simple, and reference is made to the description of the method embodiments for relevant points. The apparatus embodiments described above are merely illustrative, wherein elements illustrated as separate elements may or may not be physically separate, and elements illustrated as elements may or may not be physical elements, may be located in one place, or may be distributed over a plurality of network elements. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment. Those of ordinary skill in the art will understand and implement the present invention without undue burden.
The foregoing is merely one specific embodiment of the present application, but the scope of the present application is not limited thereto, and any changes or substitutions easily conceivable by those skilled in the art within the technical scope of the present application should be covered in the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.

Claims (20)

1. An interface testing method, for testing a plurality of interfaces to be tested of a device to be tested, the method comprising:
acquiring test configuration information, wherein the test configuration information comprises at least 2 pieces of interface information to be tested, which are arranged according to a preset sequence;
analyzing the test configuration information, and sequentially determining current interface information to be tested based on the at least 2 interface information to be tested, which are set according to a preset sequence;
transmitting a test instruction corresponding to the current interface information to be tested to the equipment to be tested;
and receiving a test result returned by the equipment to be tested, or receiving test data output by a current interface to be tested of the equipment to be tested, which corresponds to the current interface information to be tested.
2. The method of claim 1, wherein the interface to be tested comprises an interface to be tested belonging to a class information of a first class;
the test result returned from the device to be tested comprises the following steps:
and when the current interface to be tested corresponding to the current interface to be tested information belongs to the first category, receiving the test result returned by the equipment to be tested, wherein the test result is a result generated by comparing the write-in data written into a memory by the equipment to be tested from the current interface to be tested according to the test instruction with the read-out data read out from the memory.
3. The method of claim 2, wherein the first class of interfaces to be tested comprises a serial peripheral SPI interface or a serial communication I 2 And C, interface.
4. The method according to claim 1, wherein the interfaces to be tested comprise interfaces to be tested belonging to a category information of a second category;
the sending, to the device to be tested, a test instruction corresponding to the current interface information to be tested, including:
when the current interface to be tested corresponding to the current interface information to be tested belongs to the second category, a test instruction and a test file packet corresponding to the current interface information to be tested are sent to the equipment to be tested, so that the equipment to be tested controls a display screen connected with the current interface to be tested to display based on the test instruction and the test file packet.
5. The method of claim 4, wherein the second class of interfaces to be tested comprises at least one of: the low-voltage differential signaling LVDS interface, the liquid crystal display communication EDP interface, the high-definition multimedia HDMI interface, the mobile industry processor MIPI interface or the V-BY-ONE interface.
6. The method according to claim 1, wherein the interfaces to be tested comprise interfaces to be tested belonging to a third category of category information;
The test data received from the device to be tested and output by the current interface to be tested corresponding to the current interface to be tested information comprises:
when the current interface to be tested corresponding to the current interface to be tested information belongs to the third category, receiving the test voltage output by the current interface to be tested of the equipment to be tested, wherein the test voltage is obtained by detecting the current interface to be tested after the equipment to be tested outputs a preset standard voltage to the current interface to be tested based on the test instruction;
the method further comprises the steps of:
and when the current interface to be tested corresponding to the current interface to be tested information belongs to the third category, comparing the test voltage with the preset standard voltage to obtain a test result of the current interface to be tested.
7. The method of claim 6, wherein the third class of interfaces to be tested comprises general purpose input-output GPIO interfaces.
8. The method according to any one of claims 1-7, wherein the interface information to be tested comprises single information of interfaces to be tested or class information of interfaces to be tested, each of the class information corresponding to at least 2 interfaces to be tested;
The sending, to the device to be tested, a test instruction corresponding to the current interface information to be tested, including:
when the current interface information to be tested is the category information, a test instruction corresponding to the category information is sent to the equipment to be tested, and selection control signals corresponding to at least 2 interfaces to be tested one by one corresponding to the category information are sequentially sent to test jigs connected with at least 2 interfaces to be tested corresponding to the category information, so that the test jigs select one interface to be tested from the at least 2 interfaces to be tested to be the current interface to be tested based on the selection control signals;
the receiving the test result returned from the device to be tested or receiving the test data output by the current interface to be tested of the device to be tested corresponding to the current interface to be tested information, including:
when the current interface information to be tested is the category information, sequentially receiving the test data output when at least 2 interfaces to be tested corresponding to the category information of the equipment to be tested are respectively the current interfaces to be tested, or receiving the test results returned when at least 2 interfaces to be tested corresponding to the category information of the equipment to be tested are respectively the current interfaces to be tested.
9. The method of claim 8, wherein the category information includes the first category when claim 8 is dependent on claim 2;
when claim 8 is dependent on claim 6, said category information comprises said third category.
10. The method according to any one of claims 1-7, wherein each interface information to be tested is correspondingly provided with a test action identifier, and the test action identifier comprises a manual identifier or an automatic identifier;
analyzing the test configuration information, and sequentially determining current interface information to be tested based on the at least 2 interface information to be tested, which are set according to a preset sequence, wherein the method comprises the following steps:
if the current test action identifier of the current interface information to be tested is the manual identifier, receiving the test result input by a user, and determining that the next interface information to be tested is the current interface information to be tested based on the preset sequence;
and if the current test action identifier of the current interface information to be tested is the automatic identifier, automatically determining that the next interface information to be tested is the current interface information to be tested based on the preset sequence.
11. The method according to claim 10, wherein the interface information to be tested comprises single information of interfaces to be tested or class information of interfaces to be tested, each of the class information corresponding to at least 2 interfaces to be tested;
when claim 10 is dependent on claim 2, said category information comprises said first category; the test action identifier of the first category is the automatic identifier;
when claim 10 is dependent on claim 4, said category information comprises said second category; the test action identifier of the second category is the manual identifier;
when claim 10 is dependent on claim 6, said category information comprises said third category; the test action identifier of the third category is the automatic identifier.
12. The method according to claim 1, wherein the method further comprises:
and leading out the test result/test data.
13. An interface testing apparatus for testing a plurality of interfaces to be tested of a device to be tested, the apparatus comprising:
the device comprises an acquisition module, a test module and a test module, wherein the acquisition module is used for acquiring test configuration information, and the test configuration information comprises at least 2 pieces of interface information to be tested, which are arranged according to a preset sequence;
The analysis module is used for analyzing the test configuration information and sequentially determining the current interface information to be tested based on the at least 2 interface information to be tested, which are arranged according to the preset sequence;
the sending module is used for sending a test instruction corresponding to the current interface information to be tested to the equipment to be tested;
the receiving module is used for receiving a test result returned by the equipment to be tested or receiving test data output by a current interface to be tested of the equipment to be tested, which corresponds to the current interface information to be tested.
14. The apparatus of claim 13, wherein the interface to be tested comprises an interface to be tested belonging to a class information of a first class;
the apparatus further comprises:
and the first response module is used for obtaining a result generated by comparing the writing data written into the memory by the current interface to be tested with the reading data read out from the memory according to the test instruction sent by the sending module when the current interface to be tested corresponding to the current interface to be tested belongs to the first category, and sending the result to the receiving module.
15. The apparatus of claim 13, wherein the interface to be tested comprises an interface to be tested belonging to a category information of a second category;
And the second response module is used for controlling a display screen connected with the current interface to be tested to display according to the test instruction and the test file packet which are sent by the sending module and correspond to the current interface to be tested when the current interface to be tested corresponding to the current interface to be tested belongs to the second category.
16. The apparatus of claim 13, wherein the interface to be tested comprises an interface to be tested belonging to a third category of category information;
the receiving module is configured to receive the test voltage output from the current interface to be tested of the device to be tested when the current interface to be tested corresponding to the current interface to be tested information belongs to the third class, where the test voltage is a voltage detected from the current interface to be tested after the device to be tested outputs the preset standard voltage to the current interface to be tested based on the test instruction;
the apparatus further comprises:
and the test result generation module is used for comparing the test voltage with the preset standard voltage when the current interface to be tested corresponding to the current interface to be tested information belongs to the third category, and obtaining the test result of the current interface to be tested.
17. The apparatus of claim 13, wherein the interface information to be tested comprises individual information of an interface to be tested and class information of the interface to be tested; each category information corresponds to at least 2 interfaces to be tested;
the sending module is used for sending a test instruction corresponding to the category information to the equipment to be tested when the current interface information to be tested is the category information, and sequentially sending selection control signals corresponding to at least 2 interfaces to be tested one by one, wherein the selection control signals correspond to the category information;
the apparatus further comprises:
the selection test module is used for selecting one interface to be tested from at least 2 interfaces to be tested corresponding to the category information based on the selection control signal as the current interface to be tested;
the receiving module is configured to sequentially receive, when the current interface information to be tested is category information, the test data output when at least 2 interfaces to be tested corresponding to the category information of the device to be tested are respectively the current interfaces to be tested, or receive, when at least 2 interfaces to be tested corresponding to the category information of the device to be tested are respectively the test results returned when the interfaces to be tested are currently tested.
18. The device according to claim 13, wherein each interface information to be tested is correspondingly provided with a test action identifier, and the test action identifier comprises a manual identifier or an automatic identifier;
the analysis module is used for receiving the test result input by a user if the test action identifier of the current interface information to be tested is an artificial identifier, and determining that the next interface information to be tested is the current interface information to be tested based on the preset sequence; and if the current test action identifier is an automatic identifier, automatically determining that the next interface information to be tested is the current interface information to be tested based on the preset sequence.
19. An electronic device, the device comprising:
a memory for storing a computer program;
a processor for executing the computer program to cause the apparatus to perform the steps of the interface testing method of any one of claims 1 to 12.
20. A computer readable storage medium, characterized in that the computer readable storage medium has stored therein a computer program which, when executed by a processor, implements the steps of the interface testing method of any of claims 1 to 12.
CN202310146329.8A 2023-02-08 2023-02-08 Interface testing method and device Pending CN116185735A (en)

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