CN111610393A - Automatic test system and method for multi-channel broadband microwave integrated component - Google Patents
Automatic test system and method for multi-channel broadband microwave integrated component Download PDFInfo
- Publication number
- CN111610393A CN111610393A CN202010411940.5A CN202010411940A CN111610393A CN 111610393 A CN111610393 A CN 111610393A CN 202010411940 A CN202010411940 A CN 202010411940A CN 111610393 A CN111610393 A CN 111610393A
- Authority
- CN
- China
- Prior art keywords
- test
- tested
- product
- data
- automatic test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 490
- 238000000034 method Methods 0.000 title claims abstract description 44
- 230000008569 process Effects 0.000 claims abstract description 31
- 238000004891 communication Methods 0.000 claims description 34
- 238000012545 processing Methods 0.000 claims description 20
- 238000001228 spectrum Methods 0.000 claims description 14
- 238000001514 detection method Methods 0.000 claims description 10
- 239000011159 matrix material Substances 0.000 claims description 9
- 238000009432 framing Methods 0.000 claims description 4
- 238000010998 test method Methods 0.000 claims description 2
- 238000007726 management method Methods 0.000 description 20
- 230000009286 beneficial effect Effects 0.000 description 3
- 230000008859 change Effects 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 3
- 238000013461 design Methods 0.000 description 3
- 238000003745 diagnosis Methods 0.000 description 3
- 230000005764 inhibitory process Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 230000000007 visual effect Effects 0.000 description 3
- 238000011161 development Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- 101100117775 Arabidopsis thaliana DUT gene Proteins 0.000 description 1
- 101150091805 DUT1 gene Proteins 0.000 description 1
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 239000000725 suspension Substances 0.000 description 1
- 238000012795 verification Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention is suitable for the technical field of microwave micro-system test, and provides an automatic test system and method for a multi-channel broadband microwave integrated component, wherein the system comprises: the system comprises an upper computer, a test instrument and a product to be tested; the upper computer can configure the reference data of the product to be tested, the working mode of the product to be tested and the state parameters of the testing instrument; acquiring calibration data files of a product to be tested and a test instrument, and issuing the calibration data files to the test instrument; the method comprises the steps of carrying out data reconstruction on an automatic test instruction according to the working mode of a product to be tested, sending the automatic test instruction after data reconstruction to a calibrated test instrument, collecting test data generated in the automatic test process of the calibrated test instrument, and generating a test result report according to the test data.
Description
Technical Field
The invention belongs to the technical field of microwave micro-system testing, and particularly relates to an automatic testing system and method for a multi-channel broadband microwave integrated component.
Background
The multi-channel broadband microwave integrated component is a complex microwave component formed by microwave functional modules which are packaged in a serialized and standardized mode, the testing task scale is large, the testing indexes are multiple, the traditional manual testing method is time-consuming and labor-consuming, the actual testing requirements cannot be met, the technical capability level and the business proficiency of operators are measured, and the measuring results are possibly influenced.
The automatic test system is the main direction of microwave assembly test development, and a set of suitable automatic test system can help designers to obtain, summarize and analyze test data, timely find out design defects and problems, and when the design and test efficiency is improved, the manpower and material resource cost is reduced, and the market competitiveness is improved.
However, most of the existing automatic test systems are building block type desktop instrument systems or integrated type modular instrument systems, and for complex microwave assemblies with large test task scale and multiple test indexes, the test flow is complex, the test time is long, and the accuracy and consistency of test results are poor.
Disclosure of Invention
In view of this, embodiments of the present invention provide an automatic testing system and method for a multi-channel broadband microwave integrated component, so as to solve the problems in the prior art that a complex microwave component has a complex testing process, a long testing time, and poor accuracy and consistency of testing results.
A first aspect of an embodiment of the present invention provides an automatic testing system for a multi-channel broadband microwave integrated component, including: the system comprises an upper computer, a test instrument and a product to be tested;
the upper computer is used for configuring reference data of the product to be tested, a working mode of the product to be tested and state parameters of the testing instrument; acquiring calibration data files of the product to be tested and the test instrument, and sending the calibration data files to the test instrument; according to the working mode of the product to be tested, carrying out data reconstruction on an automatic test instruction, sending the automatic test instruction after data reconstruction to a calibrated test instrument, collecting test data generated in the automatic test process of the calibrated test instrument, and generating a test result report according to the test data;
the test instrument is used for calibrating according to the calibration data file; receiving the automatic test instruction after the data reconstruction, and automatically testing the calibrated product to be tested according to the automatic test instruction after the data reconstruction to generate test data;
the product to be tested works in different working modes according to different automatic test instructions; and receiving the automatic test instruction after the data reconstruction through the test instrument, and changing the working mode according to the automatic test instruction after the data reconstruction.
Optionally, the host computer includes: the device comprises an input module, an automatic test module and a data reconstruction module;
the input module is used for configuring the reference data of the product to be tested and the state parameters of the test instrument and acquiring calibration data files of the product to be tested and the test instrument;
the automatic test module is used for generating an automatic test instruction according to the index to be tested of the product to be tested;
the data reconstruction module is used for configuring the working mode of the product to be tested, reconstructing data of the automatic test instruction according to the working mode of the product to be tested, and sending the automatic test instruction after data reconstruction to the calibrated test instrument so as to facilitate the calibrated test instrument to perform automatic test.
Optionally, configuring the working mode of the product to be tested, and performing data reconstruction on the automatic test instruction according to the working mode of the product to be tested, includes:
assigning a value to a command type byte of a communication data frame of the automatic test instruction, which corresponds to the working mode of the product to be tested, so as to configure the working mode of the product to be tested;
and framing or splicing the byte content of the frame data of the communication data frame according to the working mode of the product to be tested to obtain an automatic test instruction after data reconstruction.
Optionally, the host computer still includes: a data processing module;
the data processing module is used for processing the test data and generating a test result report; according to the test data, carrying out nonlinear interpolation fitting to obtain temperature compensation data of the product to be tested in a preset temperature range, and sending the temperature compensation data to the product to be tested;
the data reconstruction module is further configured to convert a data type or a data format of the test data so that the data processing module generates the temperature compensation data.
Optionally, the test instrument comprises an incubator, a test fixture and other test instruments;
the incubator is connected with the upper computer, is internally provided with the product to be tested and is used for controlling the test temperature of the product to be tested;
the test fixture is connected with the other test instruments and used for clamping the product to be tested;
and the other testing instruments are used for testing the indexes to be tested of the products to be tested.
Optionally, the other test apparatus includes at least any one of: oscilloscope, signal source input device, spectrum analyzer, network analyzer and automatic test bench of microsystem.
Optionally, the microsystem automatic test table includes: the system comprises an input side adapter, an output side adapter, a switch matrix, a multi-path power divider and a digital control module;
the input side adapter is connected with at least one of the oscilloscope, the signal source input device, the spectrum analyzer and the network analyzer, and the output side adapter is connected with at least one product to be tested through the test fixture, wherein the input side adapter and the output side adapter connect at least one of the oscilloscope, the signal source input device, the spectrum analyzer and the network analyzer with the at least one product to be tested;
the switch matrix is used for controlling input and output switching among multiple channels of the product to be tested in the automatic test process;
the multi-path power divider is used for inputting or outputting multi-channel signals of the product to be detected;
and the digital control module is used for controlling the switch matrix and the multi-path power divider through the output and the turn-off of the pulse signal, the trigger signal and the control signal in the automatic test process in a data communication mode, so that one-key automatic test is realized.
A second aspect of the embodiments of the present invention provides an automatic testing method for a multi-channel broadband microwave integrated component, including:
configuring reference data of a product to be tested and state parameters of a testing instrument;
acquiring calibration data files of the test instrument and the product to be tested; calibrating the test instrument after configuring the state parameters and the product to be tested after configuring the reference data based on the calibration data files of the test instrument and the product to be tested;
generating an automatic test instruction according to the index to be tested of the product to be tested, or performing data reconstruction on the automatic test instruction according to the working mode of the product to be tested to generate an automatic test instruction after data reconstruction;
and based on the automatic test instruction or the automatic test instruction after data reconstruction, automatically testing the calibrated product to be tested by using the calibrated test instrument.
Optionally, after the automatic test instruction based on the automatic test instruction or the automatic test instruction after data reconstruction is used to automatically test the calibrated product to be tested by using the calibrated test instrument, the method further includes:
and collecting test data generated in the automatic test process of the calibrated test instrument, and generating a test result report according to the test data.
Optionally, the automatically testing the calibrated product to be tested by using the calibrated testing instrument based on the automatic testing instruction or the automatic testing instruction after data reconstruction includes:
based on the automatic test instruction or the automatic test instruction after data reconstruction, performing first automatic test on a product to be tested by using a calibrated test instrument to obtain first test data;
according to the first test data, carrying out nonlinear interpolation fitting to obtain temperature compensation data of the product to be tested in a preset temperature range, and calibrating the product to be tested by using the temperature compensation data;
performing second automatic test on the calibrated product to be tested by using the calibrated test instrument to obtain second test data;
and verifying the temperature compensation data according to the second test data and the index to be tested of the product to be tested, and carrying out fault state detection on the product to be tested to obtain a test result report of the product to be tested.
Compared with the prior art, the embodiment of the invention has the following beneficial effects: through the upper computer, the reference data of the product to be tested can be configured, the query of software and hardware information of the product to be tested and the check of the product information to be tested in the multiple testing processes are facilitated, the problems in the test are conveniently and rapidly positioned, and the unification and the configurability of embedded software of the product to be tested are realized. The state parameters of the test instrument can be configured, and the problem that the instrument is damaged due to the fact that the initial state of the test instrument is not matched with the input and output state parameters of the test instrument is solved. The working mode of a product to be tested can be configured, a calibration data file of the product to be tested and a test instrument is obtained, the calibration data file is issued to the test instrument and the product to be tested for calibration, data reconstruction is carried out on an automatic test instruction according to the working mode of the product to be tested, the automatic test instruction after data reconstruction is issued to the calibrated test instrument, test data generated in the automatic test process of the calibrated test instrument is collected, a test result report is generated according to the test data, and the accuracy and the consistency of the test result are improved. Through the test instrument, calibration can be performed according to the calibration data file; and receiving the automatic test instruction after the data reconstruction, and automatically testing the calibrated product to be tested according to the automatic test instruction after the data reconstruction to generate test data, thereby simplifying the test flow of the product to be tested, realizing one-key automatic test and being beneficial to shortening the test time. The product to be tested can work in different working modes according to different automatic test instructions; the test instrument receives the automatic test instruction after the data reconstruction, and changes the product to be tested in the working mode according to the automatic test instruction after the data reconstruction, so that the debugging and the test of the product to be tested are facilitated, and the production efficiency and the test efficiency of the product to be tested are obviously improved.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without inventive exercise.
FIG. 1 is a block diagram of an automatic testing system for a multi-channel broadband microwave integrated component according to an embodiment of the present invention;
FIG. 2 is a block diagram of a system application of the upper computer according to the embodiment of the present invention;
fig. 3 is a schematic flowchart of an automatic testing method for a multi-channel broadband microwave integrated component according to an embodiment of the present invention.
Detailed Description
In the following description, for purposes of explanation and not limitation, specific details are set forth, such as particular system structures, techniques, etc. in order to provide a thorough understanding of the embodiments of the invention. It will be apparent, however, to one skilled in the art that the present invention may be practiced in other embodiments that depart from these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present invention with unnecessary detail.
In order to explain the technical means of the present invention, the following description will be given by way of specific examples.
Referring to fig. 1, an automatic testing system for a multi-channel broadband microwave integrated component according to an embodiment of the present invention will now be described. Multichannel broadband microwave integrated component automatic test system includes: host computer, test instrument and the product that awaits measuring.
The upper computer comprises automatic test software for controlling the test instrument and the product to be tested, and can be used for configuring reference data of the product to be tested, a working mode of the product to be tested and state parameters of the test instrument; the device can also be used for acquiring calibration data files of a product to be tested and a test instrument and sending the calibration data files to the test instrument; and the automatic test instruction can be subjected to data reconstruction according to the working mode of the product to be tested, the automatic test instruction subjected to data reconstruction is issued to the calibrated test instrument, test data generated in the automatic test process of the calibrated test instrument is collected, and a test result report is generated according to the test data.
The automatic test software can be developed by C #, the upper computer communicates with the test instrument and a product to be tested through communication data frames, the upper computer can collect test data generated by the test instrument in the automatic test process through a User Datagram Protocol (UDP), the test data are analyzed and an operation result is output, and meanwhile, the operation result is generated into a test result report.
Optionally, referring to fig. 2, the upper computer may include an input module, an automatic test module, and a data reconstruction module.
The input module can be used for configuring the reference data of the product to be tested and the state parameters of the testing instrument and acquiring the calibration data files of the product to be tested and the testing instrument.
The automatic testing software contained in the upper computer can be divided into two parts, namely application management and a testing program, wherein the application management can comprise a visual interface, the visual interface comprises an input module and an output module, and the input module is used for inputting configurable parameters, such as configuration of reference data of a product to be tested or state parameters of a testing instrument.
For the reference data of the product to be tested, when the product to be tested is initially debugged, the embedded software of the product to be tested is only responsible for completing the control of the product to be tested and does not contain the state parameter information of the product to be tested, and after each set of product to be tested downloads the corresponding embedded software and completes the debugging, the relevant information of the product to be tested is not stored. If the product to be tested has a problem in later use, it is difficult to find the root of the problem unless the original data is retained in the debugging process. And sometimes the version of the embedded software is replaced, the state of each set of product to be tested may need to be modified, recompiled and downloaded according to the actual condition, and if detailed and timely records are not available, the problems that the version of the embedded software of the product to be tested is not controlled and the software version is disordered are likely to be caused.
The embodiment of the invention can carry out configurable design on the execution state parameters and the reference data of the embedded software of the product to be tested through the input module of the upper computer. After each set of product to be tested downloads embedded software, reference data related to the product to be tested, such as an actually measured temperature code, a self-checking comparison threshold voltage value, a wide-band and narrow-band logarithmic baseline voltage value and the like, are downloaded to the built-in FLASH, parameters which may need to be modified according to actual conditions in the development stage of the product to be tested are configured through an input module of the upper computer, a configured specific value is stored to a specific address of the built-in FLASH of the software to be tested through a communication data frame, each data which needs to be stored in the product to be tested can be completely stored through a FLASH operation module of the product to be tested, and because the embedded software of the product to be tested can start from any position in the FLASH address and an address which needs to be written in can be completely controlled by the external upper computer, if the storage address needs to be modified, an external control address can be directly changed and sent to the built-in FLASH of the product to be tested according to the format of the communication data frame, therefore, flexible modification and configuration of the reference data of the product to be tested are realized.
The required datum data can be read at a proper time after the product to be tested is electrified and started every time, the problems of contrast checking and quick positioning in the process of multiple tests of the product to be tested are facilitated, and the unification and the configurability of embedded software of the product to be tested are realized.
Optionally, the reference data may further include information such as a product lot number, a modification date, a product model number, a software version number, a verification lot number, a clock division ratio, and even a test result, which are related to the product to be tested.
Similarly, the state parameters of the testing instrument can be configured through the input module of the upper computer according to the actual condition of the product to be tested.
Optionally, the output module of the upper computer may be configured to display a test result report obtained by analyzing and calculating test data generated in the automatic test process.
And the automatic test module can be used for generating an automatic test instruction according to the index to be tested of the product to be tested.
The automatic testing module is used as a part of a testing program of automatic testing software contained in the upper computer, the index to be tested of a product to be tested can be obtained through the parameter reading unit, the function processing unit can generate an automatic testing instruction according to the index to be tested of the product to be tested, and the thread calling unit can carry out testing time sequence control on the generated automatic testing instruction so as to realize automatic testing of a plurality of indexes to be tested in sequence.
The data reconstruction module can be used for configuring the working mode of the product to be tested, reconstructing data of the automatic test instruction according to the working mode of the product to be tested, and sending the automatic test instruction after data reconstruction to the calibrated test instrument so as to automatically test the calibrated test instrument.
The data reconstruction module is mainly used for processing communication data frames interacted between the upper computer and the testing instrument.
Optionally, the data reconfiguration module configures a working mode of the product to be tested, performs data reconfiguration on the automatic test instruction according to the working mode of the product to be tested, and may configure the working mode of the product to be tested by assigning a value to a command type byte of a communication data frame of the automatic test instruction corresponding to the working mode of the product to be tested; and framing or splicing the byte content of the frame data of the communication data frame according to the working mode of the product to be tested to obtain an automatic test instruction after data reconstruction.
The product to be tested can work in different working modes according to different automatic test instructions; and receiving the automatic test instruction after the data reconstruction through the test instrument, and changing the working mode according to the automatic test instruction after the data reconstruction.
The embedded software of the traditional product to be tested is in one-to-one correspondence with the communication protocol, and the communication protocols used by different products to be tested are different, so that the corresponding communication data frames are different. In the embodiment of the invention, based on the principles of software design universalization, serialization and modularization, three working modes are designed for embedded software of a product to be tested: the product mode is used for normal work of a product to be detected; the debugging mode is used for debugging the product to be tested; and the user mode is used for user-defined work. The product mode is a working mode of a traditional product to be tested; the debugging mode corresponds to a control program needed by debugging of a product to be tested before final delivery, the control range of the debugging mode is wider than that of a product mode or a user mode, and when a user uses the debugging mode to cause a problem, the control program corresponding to the debugging mode can be called to search for the positioning problem more quickly. The embodiment of the invention comprehensively considers that control programs corresponding to a product mode, a debugging mode and a user mode of a product to be tested are put together to form embedded software with three working modes, different assignments of command type bytes of a communication data frame sent by an upper computer represent different working modes of the product to be tested, and by changing the value of the command type bytes of the communication data frame, the communication data frame can be framed again or frame data byte content can be spliced according to communication protocol requirements corresponding to different working modes of the product to be tested, data structure conversion is carried out, and rapid switching between different modes of the product to be tested is realized.
The internal debugging mode instruction corresponding to the debugging mode of the product to be tested is generally not open to the user, the upper computer can send an internal debugging mode instruction set to carry out debugging work or send a user normal work mode instruction set to simulate the normal work of the user in the debugging stage before delivery, and after the user is delivered, the user can control the user work program by sending the user normal work mode instruction set. In order to prevent a user from accidentally sending an instruction set of a debugging mode, an external control interface can be added into embedded software for protection, and when the external interface is in a certain specific state, for example, the port level is high or low, the instruction set of the debugging mode is effective, so that the user can be prevented from mistakenly operating to enter the debugging mode to damage data stored in a finalized product to a certain extent.
According to the embodiment of the invention, the configurable embedded software is arranged on the product to be tested, three working modes of the product to be tested can be realized through one-time programming, and the communication data frame sent by the upper computer can be used for switching the three working modes of the product to be tested, so that the programming time of the product to be tested is greatly shortened, and the production efficiency is improved.
Optionally, a communication data frame sent by the upper computer not only contains a product working mode instruction corresponding to a product mode of a product to be tested, an internal debugging mode instruction corresponding to a debugging mode and a user normal working mode instruction corresponding to a user mode, but also reserves control words for expandable parameter configuration, self-defined dynamic change of input parameters is set through automatic test software, data byte content in the communication data frame is self-defined, bytes are framed, a dynamic framing parameter configuration function of communication data is realized, special requirements of different users on the communication data can be met, and the communication data frame has strong flexibility and configurability.
Optionally, in order to effectively reduce the frame length of the communication data frame, data bytes of different instructions may also be multiplexed in the communication data frame.
Optionally, the data reconstruction module may further convert the data type or the data format of the acquired test data according to a need to obtain the required test data.
Optionally, the test program may further include a software driver management module, a hardware driver management module, a thread management module, and a device management module.
The automatic test module is used as a main module of a test program, software drive management and hardware drive management can be completed through an object management interface and an object service interface, the software drive management module can be used for loading software drivers, interfaces or configuration files and the like of automatic test software, loading and instruction calling of Dynamic Link Library (DLL) files of a test instrument are completed, and software configuration of an upper computer is managed. The hardware driving management module can be used for loading and detecting a test instrument interface connected with automatic test software of the upper computer and managing hardware configuration of the upper computer.
The thread management module can be used for the mutual association and task allocation between the automatic test module and other modules, including thread starting, thread suspension, test restart and thread quitting, and can perform test time sequence control and realize the automatic test of a plurality of indexes to be tested in sequence through the thread calling unit of the automatic test module and the thread management module.
The device management module can acquire the device address of the test instrument, and can complete the state setting, parameter setting or test data reading of the test instrument by the automatic test software according to the state parameters of the test instrument configured by the input module based on UDP communication, COM communication, USB communication or other communication modes.
Optionally, the test program of the upper computer may further include a data processing module.
The data processing module can be used for processing the test data and generating a test result report; and performing nonlinear interpolation fitting according to the test data to obtain temperature compensation data of the product to be tested within a preset temperature range, and sending the temperature compensation data to the product to be tested.
The data processing module can analyze or calculate the collected test data, generate a test result report and store the test result report to a designated position, and can report the generated test result report to an output module of the upper computer so that the output module can display the test result report.
The temperature compensation data is the characteristic that the power of a product to be measured at a certain frequency is increased or reduced due to the change of temperature, and the power of the product to be measured can be compensated through a control component of the product to be measured so as to achieve the function of keeping a fixed value at any temperature state, namely, the power of all frequency points in a band of the product to be measured is kept consistent at any temperature state in a temperature band range through the temperature compensation data.
The data processing module can obtain a plurality of test data in a test temperature range, can obtain a temperature-temperature compensation data curve at corresponding temperature according to the plurality of test data, such as three or five test data, can fit a temperature-temperature compensation data fitting curve in the whole test temperature range according to the temperature-temperature compensation data curve, and can calculate a compensation value of the frequency point or frequency band, which changes along with the temperature, in the whole test temperature range by using a nonlinear function corresponding to the temperature-temperature compensation data fitting curve in the whole test temperature range, so as to serve as the temperature compensation data of the frequency point or frequency band in the whole test temperature range. The data processing module can send the temperature compensation data to the product to be tested through the communication data frame, the product to be tested can detect the current environment temperature by using a temperature sensor in the product to be tested in the automatic test process, and the compensation value of the current temperature point is calculated according to the change of the frequency point.
Optionally, the data type or data format of the test data may be converted by the data reconstruction module, so that the data processing module generates the temperature compensation data.
The FLASH of the product to be tested needs to store temperature compensation data at different working points and under different temperature states, test the temperature compensation data, modify the storage address and erase or write the temperature compensation data, and the external control address can be directly changed and sent to the internal FLASH digital module of the product to be tested according to the communication data frame format without modifying the embedded software program of the product to be tested.
Optionally, according to the requirement of the index to be tested of the product to be tested, the automatic test software can comprehensively test the proposed index parameter to be tested and the required debugging parameter, the automatic test software comprehensively collects the working state parameter of the product to be tested, analyzes the collected state parameter, converts the test data into the representation mode required by the index to be tested, can record in the background as the reference of fault judgment, and can call the historical test data in the database to compare with the current test data to complete fault detection; when the product to be tested is judged to have a fault, historical test data and current test data in work can be called, a fault test engine is started, and a fault tree inference engine is operated in parallel to complete fault positioning; and fusing fault positioning results, analyzing the fault positioning results of different inference machines, distinguishing the relationship of the results, obtaining a fault diagnosis conclusion from the results and the relationship of the results, outputting the fault diagnosis conclusion through an output module and displaying the fault diagnosis conclusion through a visual interface.
The test instrument of the embodiment of the invention can be used for calibrating according to the calibration data file; and receiving an automatic test instruction after data reconstruction, and automatically testing the calibrated product to be tested according to the automatic test instruction after data reconstruction to generate test data.
Alternatively, referring to fig. 1, the test instruments may include incubators, test fixtures, and other test instruments.
The incubator is connected with the upper computer, and at least one product to be tested DUT1 can be placed in the incubator and used for controlling the testing temperature of the product to be tested.
The test fixture is connected with other test instruments and can be used for clamping a product to be tested.
Other testing instruments can be used for testing the indexes to be tested of the products to be tested according to the requirements of automatic testing.
Optionally, the other testing apparatus may include at least any one of: oscilloscope, signal source input device, spectrum analyzer, network analyzer and automatic test bench of microsystem.
Optionally, the microsystem automatic test platform may include: the system comprises an input side adapter, an output side adapter, a switch matrix, a multi-path power divider and a digital control module.
The input side adapter is connected with at least one of the oscilloscope, the signal source input device, the spectrum analyzer and the network analyzer, the output side adapter is connected with at least one product to be tested through the test fixture, and the input side adapter and the output side adapter connect at least one of the oscilloscope, the signal source input device, the spectrum analyzer and the network analyzer with at least one product to be tested, so that interface conversion among the oscilloscope, the signal source input device, the spectrum analyzer and the network analyzer and the product to be tested is realized.
The switch matrix can be used for controlling the input and output switching among multiple channels of a product to be tested in the automatic test process; the multi-path power divider can be used for inputting or outputting multi-channel signals of a product to be detected; the digital control module can be used for realizing one-key automatic test in a data communication mode through the output of pulse signals, trigger signals and control signals and the switching-off control switch matrix and the multi-path power divider in the automatic test process, and manual operation intervention in the automatic test process is avoided.
Optionally, the input module of the upper computer may obtain calibration data files of the product to be tested and the test instrument, where the calibration data files of the test instrument may include configuration data files of a multi-path power divider, configuration data files of frequency point attenuation compensation, configuration data files of radio frequency cable differential loss, and the like; the calibration data file of the product to be tested can comprise temperature compensation data initialization data files and the like of the product to be tested in different temperature states.
In practical application, an excitation signal for receiving a channel test enters a power distribution network formed by a multi-path power divider from a signal source through an input side adapter of a micro-system automatic test table, an output side adapter interface outputs the excitation signal to an input interface of a product to be tested, the product to be tested is fed back to a test instrument through the output side adapter, a program control switch and the like of the micro-system automatic test table after being output, and an upper computer can acquire test data generated by the test instrument. Calibration data files input to the terminal and output in the channel calibration process can be all written into the configuration files by automatic test software, and the stored calibration data files can be read in the automatic test process to be calibrated.
According to the automatic test system for the multi-channel broadband microwave integrated component, the reference data of the product to be tested and the state parameters of the test instrument can be configured through the input module of the upper computer, and the calibration data file of the product to be tested and the test instrument is obtained; the embedded software test system has the advantages that the software and hardware information of the product to be tested can be conveniently inquired, the information of the product to be tested can be conveniently checked in the automatic test process for multiple times, the problems in the automatic test can be conveniently and quickly positioned, the unification and the configurability of the embedded software of the product to be tested are realized, and the problem that the instrument is damaged due to the fact that the initial state of a test instrument is not matched with the input and output state parameters of the test instrument. The working mode of the product to be tested can be configured through a data reconstruction module of the upper computer, the automatic test instruction is subjected to data reconstruction according to the working mode of the product to be tested, and the automatic test instruction subjected to data reconstruction is sent to the calibrated test instrument; the data processing module of the upper computer can process the test data generated in the automatic test process of the calibrated test instrument to generate a test result report; and according to the test data, carrying out nonlinear interpolation fitting to obtain temperature compensation data of the product to be tested in a preset temperature range, and writing the temperature compensation data into the product to be tested. The functions of the work mode of the product to be tested, the dynamic reconfigurable configuration of the test data, the self calibration of the test data and the automatic writing of the temperature compensation data are realized, the test flow of the product to be tested is simplified, the 24-hour unattended operation and one-key full-automatic test of index parameters of the product to be tested are facilitated, and the test efficiency and the test precision are higher.
Fig. 3 is a schematic flow chart of an automatic testing method for a multi-channel broadband microwave integrated component according to an embodiment of the present invention, which corresponds to the automatic testing system for a multi-channel broadband microwave integrated component according to the above embodiments. As shown in fig. 3, the method may include:
Before configuring the reference data of the product to be tested and the state parameters of the test instrument, the upper computer, the test instrument and the product to be tested can be connected according to the automatic test system of the multi-channel broadband microwave integrated component shown in fig. 1. The test fixture can be used for placing a multi-channel broadband microwave integrated assembly, namely a product to be tested, into the test fixture, the test fixture is provided with a direct switching interface and is always connected with a test instrument, the finished product to be tested only needs to be taken down from the test fixture and replaced by a new product to be tested, and cables or data lines of various connectors do not need to be reconnected to the product to be tested at each time. And then connecting a control interface data line, a radio frequency test cable or a power interface cable and the like between the upper computer and the test instrument.
After the connection among the upper computer, the test instrument and the product to be tested is completed, the automatic test software of the upper computer is opened, the power supplies of the test instruments such as the oscilloscope, the signal source, the spectrum analyzer, the network analyzer, the micro-system automatic test board, the incubator and the like are started, and whether the connection control states of the oscilloscope, the signal source, the spectrum analyzer, the network analyzer, the micro-system automatic test board, the incubator and the like and the upper computer are normal or not can be detected through the hardware drive management module of the upper computer.
When the connection control states of the oscilloscope, the signal source, the spectrum analyzer, the network analyzer, the micro-system automatic test board, the incubator and the like and the upper computer are normal and can normally communicate, the initial state parameter configuration of the test instrument and the corresponding reference data configuration of a product to be tested can be completed by using the input module of the upper computer according to the initial input and output states of the test instrument, and the product to be tested or the test instrument is prevented from being damaged.
After the initial state parameter configuration of the test instrument and the corresponding reference data configuration of the product to be tested are completed, other input configuration parameters can be re-selectively set by using an input module of the upper computer according to the test indexes of the product to be tested, for example, the initial frequency, the termination frequency, the frequency stepping, the parameters to be tested, the working state and the like of the product to be tested can be selectively set, and if the setting is not required to be re-selected, the default state which can be stored or set can run automatic test software in the upper computer. The reset and selected state can be stored, and the last selected and set state or parameter can be automatically loaded and called when the automatic test software is started next time without repeated setting again.
102, acquiring calibration data files of a test instrument and a product to be tested; and calibrating the test instrument after configuring the state parameters and the product to be tested after configuring the reference data based on the calibration data files of the test instrument and the product to be tested.
Before the automatic test, calibration data files of the test instrument and the product to be tested, such as a configuration data file of a multi-path power divider, a frequency point attenuation compensation configuration data file, a radio frequency cable differential loss configuration data file and the like in the test instrument, a temperature compensation data initialization data file and the like of the product to be tested in different temperature states, can be obtained and loaded.
The calibration data files of the test instrument and the product to be tested can be obtained by performing calibration test on the test instrument or the product to be tested through automatic test software.
After the calibration is finished, a software driver management module of the upper computer can be used for loading a software driver, an interface or a configuration file of the automatic test software, completing the loading and instruction calling of the test instrument DLL, and completing the initialization of the automatic test module, the data reconstruction module, the thread management module, the equipment management module and the data processing module of the automatic test software.
After each module of the automatic test software is initialized, the fault state point detection function can be started to complete current detection, attenuator detection, detection noise baseline peak-to-peak value, detection slope, detection rise time and power-on time initialization detection, and meanwhile, the fault state point is subjected to state monitoring in the whole automatic test process, so that the fault source can be conveniently positioned in the subsequent automatic test process.
And 103, generating an automatic test instruction according to the index to be tested of the product to be tested, or performing data reconstruction on the automatic test instruction according to the working mode of the product to be tested to generate the automatic test instruction after data reconstruction.
If the product to be tested needs to be automatically tested in different working modes, the automatic test instruction can be subjected to data reconstruction according to the working mode of the product to be tested, and the automatic test instruction after data reconstruction is generated, otherwise, the automatic test instruction can be directly generated according to the index to be tested of the product to be tested.
And step 104, automatically testing the calibrated product to be tested by using the calibrated testing instrument based on the automatic testing instruction or the automatic testing instruction after data reconstruction.
When the calibrated product to be tested is automatically tested by the calibrated testing instrument based on the automatic testing instruction or the automatic testing instruction after data reconstruction, the automatic test software starts the thread management module to control the test time sequence, according to the configured set value of the input module, the frequency switching output of a signal source under different power states can be controlled, the output frequency is accessed to a radio frequency input port of a multichannel broadband microwave integrated micro component (namely a product to be tested) after passing through a multi-path power divider, an oscilloscope can be connected with a frequency conversion intermediate frequency output port of a micro system automatic test bench to read the amplitude and phase parameter indexes of intermediate frequency transmission signals of each path of channel, a frequency spectrum analyzer can read gain, output power and stray indexes, and a network analyzer can read standing wave, image frequency inhibition, isolation, noise, interference inhibition and out-of-band inhibition indexes.
Optionally, after the calibrated product to be tested is automatically tested by the calibrated test instrument based on the automatic test instruction or the automatic test instruction after data reconstruction, test data generated in the automatic test process of the calibrated test instrument, such as various index data to be tested, may also be collected, and a test result report is generated according to the test data.
Optionally, based on the automatic test instruction or the automatic test instruction after data reconstruction, the calibrated test instrument is used to automatically test the calibrated product to be tested, and based on the automatic test instruction or the automatic test instruction after data reconstruction, the calibrated test instrument is used to automatically test the product to be tested for the first time to obtain first test data, and the automatic test software can complete data processing on frequency characteristic parameters and amplitude-phase parameters in the first test data and output directly read parameters on an application management platform of the automatic test software; meanwhile, nonlinear interpolation fitting can be carried out according to the first test data to obtain temperature compensation data of the product to be tested in a preset temperature range, and the product to be tested is calibrated by utilizing the temperature compensation data; performing second automatic test on the calibrated product to be tested by using the calibrated test instrument to obtain second test data; and verifying the correctness of the temperature compensation data according to the secondary test data and the index to be tested of the product to be tested, and detecting the fault state of the product to be tested to obtain a test result report, a test data file or a process log and the like of the product to be tested.
Optionally, after all tests are completed, the test result report can be output by the user-defined data template in different document formats.
The automatic test method of the multi-channel broadband microwave integrated component can match the actual situation of a product to be tested or a test instrument by configuring the reference data of the product to be tested and the state parameters of the test instrument, calibrate the test instrument configured with the state parameters and the product to be tested configured with the reference data by acquiring the calibration data files of the test instrument and the product to be tested, generate an automatic test instruction according to the index to be tested of the product to be tested, or reconstruct the data of the automatic test instruction according to the working mode of the product to be tested to generate the automatic test instruction after reconstructing the data, and automatically test the calibrated product to be tested by using the calibrated test instrument based on the automatic test instruction or the automatic test instruction after reconstructing the data, thereby being beneficial to improving the efficiency and the precision of the automatic test of the multi-channel broadband microwave integrated component, the testing process is simple, and the one-key full-automatic testing of the index parameters is convenient to realize.
The above-mentioned embodiments are only used for illustrating the technical solutions of the present invention, and not for limiting the same; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not substantially depart from the spirit and scope of the embodiments of the present invention, and are intended to be included within the scope of the present invention.
Claims (10)
1. An automatic test system for a multi-channel broadband microwave integrated component is characterized by comprising: the system comprises an upper computer, a test instrument and a product to be tested;
the upper computer is used for configuring reference data of the product to be tested, a working mode of the product to be tested and state parameters of the testing instrument; acquiring calibration data files of the product to be tested and the test instrument, and sending the calibration data files to the test instrument; according to the working mode of the product to be tested, carrying out data reconstruction on an automatic test instruction, sending the automatic test instruction after data reconstruction to a calibrated test instrument, collecting test data generated in the automatic test process of the calibrated test instrument, and generating a test result report according to the test data;
the test instrument is used for calibrating according to the calibration data file; receiving the automatic test instruction after the data reconstruction, and automatically testing the calibrated product to be tested according to the automatic test instruction after the data reconstruction to generate test data;
the product to be tested works in different working modes according to different automatic test instructions; and receiving the automatic test instruction after the data reconstruction through the test instrument, and changing the working mode according to the automatic test instruction after the data reconstruction.
2. The automatic test system for the multi-channel broadband microwave integrated component according to claim 1, wherein the upper computer comprises: the device comprises an input module, an automatic test module and a data reconstruction module;
the input module is used for configuring the reference data of the product to be tested and the state parameters of the test instrument and acquiring calibration data files of the product to be tested and the test instrument;
the automatic test module is used for generating an automatic test instruction according to the index to be tested of the product to be tested;
the data reconstruction module is used for configuring the working mode of the product to be tested, reconstructing data of the automatic test instruction according to the working mode of the product to be tested, and sending the automatic test instruction after data reconstruction to the calibrated test instrument so as to facilitate the calibrated test instrument to perform automatic test.
3. The system of claim 2, wherein the configuring the operating mode of the product to be tested and the performing the data reconstruction of the automatic test command according to the operating mode of the product to be tested comprises:
assigning a value to a command type byte of a communication data frame of the automatic test instruction, which corresponds to the working mode of the product to be tested, so as to configure the working mode of the product to be tested;
and framing or splicing the byte content of the frame data of the communication data frame according to the working mode of the product to be tested to obtain an automatic test instruction after data reconstruction.
4. The automatic testing system of claim 2, wherein the upper computer further comprises: a data processing module;
the data processing module is used for processing the test data and generating a test result report; according to the test data, carrying out nonlinear interpolation fitting to obtain temperature compensation data of the product to be tested in a preset temperature range, and sending the temperature compensation data to the product to be tested;
the data reconstruction module is further configured to convert a data type or a data format of the test data so that the data processing module generates the temperature compensation data.
5. The multi-channel broadband microwave integrated component automatic test system according to any one of claims 1 to 4, characterized in that the test instruments comprise incubators, test fixtures and other test instruments;
the incubator is connected with the upper computer, is internally provided with the product to be tested and is used for controlling the test temperature of the product to be tested;
the test fixture is connected with the other test instruments and used for clamping the product to be tested;
and the other testing instruments are used for testing the indexes to be tested of the products to be tested.
6. The automated multi-channel broadband microwave integrated package test system of claim 5, wherein the other test instruments include at least any one of: oscilloscope, signal source input device, spectrum analyzer, network analyzer and automatic test bench of microsystem.
7. The automated multi-channel broadband microwave integrated component test system of claim 6, wherein the automated microsystem test station comprises: the system comprises an input side adapter, an output side adapter, a switch matrix, a multi-path power divider and a digital control module;
the input side adapter is connected with at least one of the oscilloscope, the signal source input device, the spectrum analyzer and the network analyzer, and the output side adapter is connected with at least one product to be tested through the test fixture, wherein the input side adapter and the output side adapter connect at least one of the oscilloscope, the signal source input device, the spectrum analyzer and the network analyzer with the at least one product to be tested;
the switch matrix is used for controlling input and output switching among multiple channels of the product to be tested in the automatic test process;
the multi-path power divider is used for inputting or outputting multi-channel signals of the product to be detected;
and the digital control module is used for controlling the switch matrix and the multi-path power divider through the output and the turn-off of the pulse signal, the trigger signal and the control signal in the automatic test process in a data communication mode, so that one-key automatic test is realized.
8. A multi-channel broadband microwave integrated component automatic test method is characterized by comprising the following steps:
configuring reference data of a product to be tested and state parameters of a testing instrument;
acquiring calibration data files of the test instrument and the product to be tested; calibrating the test instrument after configuring the state parameters and the product to be tested after configuring the reference data based on the calibration data files of the test instrument and the product to be tested;
generating an automatic test instruction according to the index to be tested of the product to be tested, or performing data reconstruction on the automatic test instruction according to the working mode of the product to be tested to generate an automatic test instruction after data reconstruction;
and based on the automatic test instruction or the automatic test instruction after data reconstruction, automatically testing the calibrated product to be tested by using the calibrated test instrument.
9. The method for automatically testing the multi-channel broadband microwave integrated component according to claim 8, wherein after the automatically testing the calibrated product to be tested by using the calibrated testing instrument based on the automatically testing instruction or the automatically testing instruction after the data reconstruction, the method further comprises:
and collecting test data generated in the automatic test process of the calibrated test instrument, and generating a test result report according to the test data.
10. The method according to claim 8, wherein the automatically testing the calibrated product to be tested by using the calibrated testing instrument based on the automatic testing instruction or the automatic testing instruction after data reconstruction comprises:
based on the automatic test instruction or the automatic test instruction after data reconstruction, performing first automatic test on a product to be tested by using a calibrated test instrument to obtain first test data;
according to the first test data, carrying out nonlinear interpolation fitting to obtain temperature compensation data of the product to be tested in a preset temperature range, and calibrating the product to be tested by using the temperature compensation data;
performing second automatic test on the calibrated product to be tested by using the calibrated test instrument to obtain second test data;
and verifying the temperature compensation data according to the second test data and the index to be tested of the product to be tested, and carrying out fault state detection on the product to be tested to obtain a test result report of the product to be tested.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010411940.5A CN111610393A (en) | 2020-05-15 | 2020-05-15 | Automatic test system and method for multi-channel broadband microwave integrated component |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010411940.5A CN111610393A (en) | 2020-05-15 | 2020-05-15 | Automatic test system and method for multi-channel broadband microwave integrated component |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN111610393A true CN111610393A (en) | 2020-09-01 |
Family
ID=72199378
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010411940.5A Pending CN111610393A (en) | 2020-05-15 | 2020-05-15 | Automatic test system and method for multi-channel broadband microwave integrated component |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN111610393A (en) |
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112104526A (en) * | 2020-09-21 | 2020-12-18 | 中国人民解放军陆军装备部驻北京地区军事代表局驻石家庄地区第一军事代表室 | Test system and test method |
| CN112114224A (en) * | 2020-09-03 | 2020-12-22 | 合肥移瑞通信技术有限公司 | Automatic test system of device to be tested |
| CN112179394A (en) * | 2020-09-10 | 2021-01-05 | 中国电子科技集团公司第三十八研究所 | Intelligent instrument and meter verification system and method |
| CN112213625A (en) * | 2020-09-30 | 2021-01-12 | 中国航空工业集团公司雷华电子技术研究所 | Automatic temperature test method and device for signal generation board |
| CN112731110A (en) * | 2020-12-29 | 2021-04-30 | 北京振兴计量测试研究所 | Multi-frequency-point microwave device automatic test method and test system |
| CN113630192A (en) * | 2021-08-06 | 2021-11-09 | 通号(北京)轨道工业集团有限公司轨道交通技术研究院 | Transponder testing method and device, electronic equipment and computer storage medium |
| CN114050878A (en) * | 2021-12-16 | 2022-02-15 | 成都中科微信息技术研究院有限公司 | Method and device for automatically testing stray suppression of multi-channel radio frequency system |
| CN114070425A (en) * | 2021-11-15 | 2022-02-18 | 中国电子科技集团公司第三十八研究所 | Phased array radio frequency wave beam pointing switching time test system and method |
| CN115632696A (en) * | 2022-10-12 | 2023-01-20 | 中国科学院微小卫星创新研究院 | Automatic testing system and method for inter-satellite link to-be-tested equipment |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103034209A (en) * | 2012-12-18 | 2013-04-10 | 湖南大唐先一科技有限公司 | Discrimination method for on-line measured data accuracy |
| CN104076214A (en) * | 2014-06-11 | 2014-10-01 | 南京第五十五所技术开发有限公司 | Multi-channel microwave module automatic test method |
| CN105067933A (en) * | 2015-08-31 | 2015-11-18 | 中国人民解放军63908部队 | Universal system for electronic equipment testability validation and evaluation and testing method |
| CN107733539A (en) * | 2017-08-21 | 2018-02-23 | 西安空间无线电技术研究所 | A kind of spaceborne multichannel microwave receiver frequency converter test system |
| CN208860948U (en) * | 2018-08-31 | 2019-05-14 | 广东圣大电子有限公司 | A kind of TR component magnitude-phase characteristics rapid microwave test macro |
| CN110927502A (en) * | 2019-12-12 | 2020-03-27 | 北京格润海泰科技有限公司 | Automatic test system and method for radio frequency assembly |
-
2020
- 2020-05-15 CN CN202010411940.5A patent/CN111610393A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103034209A (en) * | 2012-12-18 | 2013-04-10 | 湖南大唐先一科技有限公司 | Discrimination method for on-line measured data accuracy |
| CN104076214A (en) * | 2014-06-11 | 2014-10-01 | 南京第五十五所技术开发有限公司 | Multi-channel microwave module automatic test method |
| CN105067933A (en) * | 2015-08-31 | 2015-11-18 | 中国人民解放军63908部队 | Universal system for electronic equipment testability validation and evaluation and testing method |
| CN107733539A (en) * | 2017-08-21 | 2018-02-23 | 西安空间无线电技术研究所 | A kind of spaceborne multichannel microwave receiver frequency converter test system |
| CN208860948U (en) * | 2018-08-31 | 2019-05-14 | 广东圣大电子有限公司 | A kind of TR component magnitude-phase characteristics rapid microwave test macro |
| CN110927502A (en) * | 2019-12-12 | 2020-03-27 | 北京格润海泰科技有限公司 | Automatic test system and method for radio frequency assembly |
Non-Patent Citations (2)
| Title |
|---|
| 徐兰英等: "《现代传感与检测技术》", 30 May 2015, 国防工业出版社 * |
| 郑宏斌等: "宽带微波微系统自动测试系统的设计与实现", 《半导体检测与设备》 * |
Cited By (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112114224A (en) * | 2020-09-03 | 2020-12-22 | 合肥移瑞通信技术有限公司 | Automatic test system of device to be tested |
| CN112179394B (en) * | 2020-09-10 | 2021-07-23 | 中国电子科技集团公司第三十八研究所 | Intelligent instrument and meter verification system and method |
| CN112179394A (en) * | 2020-09-10 | 2021-01-05 | 中国电子科技集团公司第三十八研究所 | Intelligent instrument and meter verification system and method |
| WO2022052836A1 (en) * | 2020-09-10 | 2022-03-17 | 中国电子科技集团公司第三十八研究所 | Intelligent instrument and meter verification system and method |
| CN112104526A (en) * | 2020-09-21 | 2020-12-18 | 中国人民解放军陆军装备部驻北京地区军事代表局驻石家庄地区第一军事代表室 | Test system and test method |
| CN112213625A (en) * | 2020-09-30 | 2021-01-12 | 中国航空工业集团公司雷华电子技术研究所 | Automatic temperature test method and device for signal generation board |
| CN112731110A (en) * | 2020-12-29 | 2021-04-30 | 北京振兴计量测试研究所 | Multi-frequency-point microwave device automatic test method and test system |
| CN112731110B (en) * | 2020-12-29 | 2023-08-18 | 北京振兴计量测试研究所 | Automatic testing method and system for multi-frequency-point microwave device |
| CN113630192A (en) * | 2021-08-06 | 2021-11-09 | 通号(北京)轨道工业集团有限公司轨道交通技术研究院 | Transponder testing method and device, electronic equipment and computer storage medium |
| CN114070425A (en) * | 2021-11-15 | 2022-02-18 | 中国电子科技集团公司第三十八研究所 | Phased array radio frequency wave beam pointing switching time test system and method |
| CN114070425B (en) * | 2021-11-15 | 2023-05-16 | 中国电子科技集团公司第三十八研究所 | Phased array radio frequency beam pointing switching time testing system and method |
| CN114050878A (en) * | 2021-12-16 | 2022-02-15 | 成都中科微信息技术研究院有限公司 | Method and device for automatically testing stray suppression of multi-channel radio frequency system |
| CN115632696A (en) * | 2022-10-12 | 2023-01-20 | 中国科学院微小卫星创新研究院 | Automatic testing system and method for inter-satellite link to-be-tested equipment |
| CN115632696B (en) * | 2022-10-12 | 2023-08-29 | 中国科学院微小卫星创新研究院 | Automatic testing system and method for inter-satellite link to-be-tested equipment |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN111610393A (en) | Automatic test system and method for multi-channel broadband microwave integrated component | |
| US20110286506A1 (en) | User Interface for Signal Integrity Network Analyzer | |
| US8131529B2 (en) | Method and system for simulating test instruments and instrument functions | |
| US9470759B2 (en) | Test instrument having a configurable interface | |
| CN103365770A (en) | Mobile terminal software testing system and software testing method | |
| US11782809B2 (en) | Test and measurement system for analyzing devices under test | |
| CN111934788A (en) | Radio frequency index testing method and system of head-mounted equipment and related components | |
| CN110609183A (en) | IVI technology-based identification module and automatic test system of complete machine | |
| CN113726604A (en) | Antenna interface unit testing method, device, terminal and readable storage medium | |
| CN116087867A (en) | Method for testing operation reliability of intelligent electric energy meter | |
| CN115112977A (en) | Multi-channel frequency conversion module calibration and measurement integrated automatic test platform and test method | |
| CN117787155A (en) | Chip testability code dynamic simulation test system and test method | |
| CN112485699A (en) | Server power supply test system | |
| US7065466B2 (en) | Attenuator test system | |
| CN107733740B (en) | VEE-based communication equipment automatic test method | |
| CN116506007A (en) | Optical module firmware testing system and method | |
| CN115932544A (en) | Device and method for automatically testing power consumption of GPU chip | |
| CN115733543A (en) | Optical module firmware time sequence test platform and test method | |
| CN116413533A (en) | Automatic line loss calibration method applied to module test fixture | |
| CN115980548A (en) | Chip system testing method and device, electronic equipment and storage medium | |
| CN113037583B (en) | Test apparatus, method and readable storage medium | |
| CN219417707U (en) | Automatic calibration and detection system for radio metering | |
| CN115378840B (en) | Communication chip test system and method | |
| US20230266390A1 (en) | Test Abstraction Data Model | |
| CN115932689A (en) | Method, system, device, processor and storage medium for realizing automatic measurement processing of trace noise for vector network analyzer |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20200901 |
|
| RJ01 | Rejection of invention patent application after publication |