CN112485699A - Server power supply test system - Google Patents
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
The invention discloses a server power supply test system, which comprises: the control host is used for processing the input parameters, the internal parameters and the output signals of the power supply to be tested of the server to be tested according to the test condition data to obtain a test result; the power meter is connected between the control host and the power supply to be tested and used for reading input parameters of the power supply to be tested; the analysis device is connected between the control host and the power supply to be tested and used for reading internal parameters of the power supply to be tested; the data acquisition card is connected between the power supply to be detected and the control host computer so as to send an output signal of the power supply to be detected to the control host computer; and the database is used for storing the test condition data and receiving and storing the test result sent by the control host to generate a test report. The test system solves the technical problems of difficult analysis of test data, low test efficiency and poor accuracy of the test data in the prior art.
Description
Technical Field
The invention relates to the field of server testing, in particular to a server power supply testing system.
Background
In the field of server testing, testing of power supplies is a very important link in server testing. The current server power supply testing method is to manually operate an oscilloscope to measure input and output signals of a power supply and to operate a script under a system to read partial power supply information.
However, in the process of implementing the technical solution of the invention in the embodiments of the present application, the inventors of the present application find that the above-mentioned technology has at least the following technical problems:
on one hand, the number of the testing channels of the oscilloscopes is limited, when the testing signals are more, a plurality of oscilloscopes need to operate simultaneously, and the data are not on the same oscillogram, so that the testing data are difficult to analyze; on the other hand, when the test items are switched, different pressures are applied to the server to be tested, each item of data in the process needs to be recorded manually, a large amount of time is spent, and the test efficiency is low; finally, after the test is finished, the test report needs to be manually collated, a large amount of time is also spent, and the accuracy of the test data is poor.
Disclosure of Invention
The embodiment of the application provides a server power supply testing system, solves the technical problems of difficulty in analysis of test data, low test efficiency and poor accuracy of the test data in the prior art, and achieves the technical effects of improving the test efficiency and the accuracy of the test data.
The application provides the following technical scheme through an embodiment of the application:
the application provides a server power supply test system, includes:
the control host is used for processing the input parameters, the internal parameters and the output signals of the power supply to be tested of the server to be tested according to the test condition data to obtain a test result;
the power meter is connected between the control host and the power supply to be tested and used for reading input parameters of the power supply to be tested;
the analysis device is connected between the control host and the power supply to be tested and used for reading internal parameters of the power supply to be tested;
the data acquisition card is connected between the power supply to be detected and the control host computer so as to send an output signal of the power supply to be detected to the control host computer;
and the database is used for storing the test condition data and receiving and storing the test result sent by the control host to generate a test report.
Optionally, the reading the input parameters of the power supply to be tested includes reading an input current, an input voltage, and an input power of the power supply to be tested.
Optionally, the system further includes a jig board, and the jig board is connected to the power supply to be tested of the server to be tested, so as to lead out pin of the output signal of the power supply to be tested.
Optionally, the system further includes a signal attenuator connected between the jig board and the data acquisition device to attenuate the output signal of the power source to be detected acquired on the jig board for acquisition by the data acquisition card.
Optionally, the system further includes a PC, where the PC accesses the database, enters the test condition data into the database, obtains the test result data from the database, and generates the test report according to a set format.
Optionally, the system further comprises a printer, the printer accessing the database or the PC to print the test result data or the test report.
Optionally, the test condition data includes sample information of a power supply to be tested of the server to be tested, a test item, a determination criterion of the test item, a hardware configuration of the test item, a load of the test item, or an input condition of the test item.
Optionally, the control host is further configured to: in the whole test process, the control host controls the hardware equipment in the system to be opened or closed according to a set sequence, or the control host switches the working mode of the hardware equipment in the system according to different test items.
Optionally, the processing, by the control host, the input parameter, the internal parameter, and the output signal of the power supply to be tested of the server to be tested according to the test condition data to obtain a test result, where the processing includes:
the control host reads the test condition data, and after the test item information is obtained, all hardware equipment and a server to be tested in the system are started;
the control host selects a corresponding test method to execute the test according to the different test items to obtain the input parameters, the internal parameters and the output signals of the power supply to be tested, processes the corresponding input parameters, the internal parameters and the output signals of the power supply to be tested according to the judgment standard of the test items, and gives a test result;
and the control host writes the test result into the database for storage so as to generate the test report.
Optionally, before performing the test, the load matching training is performed on the server to be tested: the method comprises the steps that pressure is applied to the server to be tested through different pressurizing tools, the analysis device reads power consumption records of the power source to be tested of the server to be tested in different pressure states and calculates the percentage of the output power of the power source to be tested in the different pressure states to the rated output power of the power source to be tested so as to match the load required by the test item, and the corresponding judgment standard is matched according to the matched load.
One or more technical solutions provided in the embodiments of the present application have at least the following technical effects or advantages:
1. the data acquisition card is used for replacing the oscilloscope, so that a plurality of test signals can be met, the time for manually debugging the oscilloscope is saved, the test efficiency is improved, and the test data are on the same interface, so that the data analysis is facilitated;
2. when the test items are switched, equipment does not need to be set, and only corresponding test conditions need to be edited, so that a large amount of time is saved, and the test efficiency is improved;
3. after the test is finished, the test report does not need to be manually arranged, and the test result is automatically judged by the system, so that a large amount of time is saved, and the test efficiency and the accuracy of the test result are improved;
4. in the whole test process, the number of times that personnel contacted the instrument is reduced, the high-precision equipment protection degree is improved, and the damage of equipment caused by reasons such as misoperation is prevented.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on the drawings without creative efforts.
FIG. 1 is a schematic diagram of a server power supply testing system according to an embodiment of the present application;
FIG. 2 is a software topology diagram of a server power supply test system in an embodiment of the present application;
FIG. 3 is a flowchart illustrating a test of a server power test system according to an embodiment of the present disclosure;
Detailed Description
The embodiment of the application provides a server power supply testing system, and solves the technical problems that in the prior art, testing data is difficult to analyze, testing efficiency is low, and testing data accuracy is poor.
In order to solve the technical problems, the general idea of the embodiment of the application is as follows:
the application provides a server power supply test system, includes:
the control host is used for processing the input parameters, the internal parameters and the output signals of the power supply to be tested of the server to be tested according to the test condition data to obtain a test result;
the power meter is connected between the control host and the power supply to be tested and used for reading input parameters of the power supply to be tested;
the analysis device is connected between the control host and the power supply to be tested and used for reading internal parameters of the power supply to be tested;
the data acquisition card is connected between the power supply to be detected and the control host computer so as to send an output signal of the power supply to be detected to the control host computer;
and the database is used for storing the test condition data and receiving and storing the test result sent by the control host to generate a test report.
In order to better understand the technical solution, the technical solution will be described in detail with reference to the drawings and the specific embodiments.
The present embodiment provides a server power supply testing system, as shown in fig. 1, including:
the control host 101 is used for processing the input parameters, the internal parameters and the output signals of the power supply 107 to be tested of the server 106 to be tested according to the test condition data to obtain a test result;
the power meter 102 is connected between the control host 101 and the power supply 107 to be tested and used for reading input parameters of the power supply 107 to be tested;
the analysis device 103 is connected between the control host 101 and the power supply 107 to be tested and used for reading internal parameters of the power supply 107 to be tested;
the data acquisition card 104 is connected between the power supply 107 to be tested and the control host 101 so as to send an output signal of the power supply 107 to be tested to the control host 101;
the database 105 is used for storing the test condition data and receiving and saving the test result sent by the control host 101 to generate a test report.
The following describes the specific components and implementation method of the system provided in this embodiment in detail with reference to fig. 1:
the control host 101 is a system control center of the server power test system in the present application, and in a specific implementation process, the control host 101 is connected to other hardware devices in the system through a GPIB (General-Purpose-Bus) Bus or a USB (Universal Serial Bus) Bus to implement communication. The control host 101 may be a computer, a computing chip, or any other device capable of implementing a system control function, and is not limited herein.
The power meter 102 is connected between the control host 101 and the power source 107 to be measured, and is used for measuring the input voltage, the input current and the input power of the power source 107 to be measured. In a specific implementation process, an AC/DC Source 108 may be further connected between the power meter 102 and the control host 101, and is configured to provide AC power or DC power for the power Source 107 to be tested, and the AC/DC Source 108 may set different operating modes to meet power requirements of corresponding test items. For example, the AC/DC Source 108 may be set in a list mode to achieve a periodic voltage frequency change, or the AC/DC Source 108 may be set in a step mode to achieve a voltage or frequency step-wise increase according to a set value.
The analysis device 103 is connected between the control host 101 and the power source 107 to be tested, and is used for reading internal parameters of the power source 107 to be tested. In a specific implementation, the analyzer 103 may be an 8451IIC analyzer, and the 8451IIC analyzer communicates with the control host 101 and the power source 107 to be tested via a USB connection. The internal parameters read by the 8451IIC analyzer may be fault records, fault clearance records, power consumption records under different pressure conditions, etc. of the power supply 107 to be tested. Alternatively, the analysis device 103 may be BMC software of the server to be tested, and the BMC software communicates with the power supply 107 to be tested, and then obtains communication information between the two by using the flag software. Of course, the analysis device 103 may also be a test chip, and is not limited herein.
The data acquisition card 104 is connected between the power source 107 to be tested and the control host 101, and transmits an output signal of the power source 107 to be tested to the control host 101. In a specific implementation process, since the power source to be tested 107 exists inside the server to be tested 106, a jig board 109 may be further manufactured, and the jig board 109 is connected to the power source to be tested 107 to lead out pin of an output signal of the power source to be tested 107. In addition, a signal attenuator 110 is connected between the data acquisition card 104 and the fixture plate 109, and in a specific implementation process, the signal attenuator 110 attenuates signals acquired on the fixture plate by different multiples according to different test requirements, so as to acquire the signals by corresponding channels of the data acquisition card 104.
And the database 105 is written in SQL language and is used for storing test condition data and receiving and storing test results sent by the control host 101 so as to generate a test report. In a specific implementation, the database is located on a data storage device such as a computer, a server, a notebook computer, and the like, and is not limited herein. More specifically, the server power supply test system of the present application may further include a PC (personal computer) 0111, and the PC111 may be configured to edit test condition data of the server power supply test system and store the test condition data in the database 105 by ip remote access.
In a specific implementation process, the test condition data may be edited and entered through an asp design web page, including sample information of the power supply 107 to be tested, such as the model, supplier information, and output path number of the power supply to be tested, generally, the output path number of the power supply to be tested is 4, or, of course, 2, depending on the specific model of the power supply to be tested, and is not limited herein, nor listed one by one.
In a specific implementation, the test condition data further includes test items of the power source under test 107, for example, the test items may be test items of the power source under test related to the server power source, such as input high voltage and low voltage of the power source under test, power conversion efficiency, AC distortion, load limit, and over-power protection, which are not listed here.
In a specific implementation process, the test condition data further includes hardware configuration information of the power supply 107 to be tested, and in the hardware configuration information, a data acquisition card channel is configured for an input/output signal of the power supply to be tested, for example, an acquisition card channel with a selection range of 15V for an input signal a, or an acquisition card channel with a selection range of 5V for an output signal B, and the like.
In a specific implementation, the test condition data further includes a determination criterion of the power source under test 107 under a test item, for example, the AC distortion of the power source under test is tested under a condition of load5, the waveform change of the power source under test must satisfy the determination criterion C, and when the test result does not meet the criterion, the control host 101 determines that the AC distortion test of the power source under test 107 fails.
In a specific implementation, the test condition data further includes a load required for a test item of the power source 107 to be tested. For example, in the AC distortion test project for the power supply under test, the load required is load5, which means that the rated output percentage of the power supply under test is simulated to be 50%. When the load is load5, the server power test system automatically matches the determination criterion assigned to the AC distortion test item as determination criterion C.
In a specific implementation, the test condition data further includes input conditions of the power supply to be tested. The input condition is mainly setting of the AC/DC Source, for example, the AC/DC Source can be set to be step output, cycle output, steady state output, transient output, distortion output, etc. according to the test requirement, which is not listed here.
In a specific implementation, the PC111 may also obtain the test result from the database 105 by ip remote access, and convert the test result into a target format by a data conversion program to generate a test report. In a specific implementation process, the data conversion program is written by vba (visual Basic for applications). In addition, the power supply test system of the present application further includes a printer 112, and the printer 112 may be connected to the PC111 to print a test report in a target format, or the printer 112 may also directly access the database 105 to print test result data stored in the database 105.
The Software topology of the server power supply testing system of the present application is given below, as shown in fig. 2, 201 is a Software part (Software) of the testing system, which is mainly compiled by Labview, and is compiled by using a graphical editing language G, so that various instruments and devices can be defined and simulated according to the needs of a user; 202 is an Operating System (OS) of the test system, and in a specific implementation process, a windows system or a Mac IOS X system is mainly used by a PC, drivers (drivers) of each test device are installed in the system, and each test device adopts a GPIB bus protocol and is uniformly controlled by a test program in a control host. 203 is a Hardware equipment part (Hardware) of the test system, which comprises an analysis device and other test instruments, wherein in a specific application, the connection between the analysis device and Labview is realized by IIC (Inter-Integrated Circuit bus); the connection between other test instruments and Labview is realized by a virtual architecture such as VISA.
In a specific implementation process, the server power test system of the present application may perform a test according to a flow shown in fig. 3.
Firstly, executing initialization in step S301, setting an initial value as idle input to enter initialization before initialization, and adjusting a program to prepare for entering test after the initialization is entered;
next, step S302 is executed to read the database, and read the test condition data from the database 105 to obtain the test item information;
then, executing step S303 AC/DC Source ON, and starting Source power supply;
then, performing power meter matching in step S304, and adjusting the working mode of the power meter according to the type and mode of the Source to record different AC input power consumption and DC input power consumption;
then, step S305 PS _ ON is executed to start the server to be tested;
next, step S306 of running the server to be tested is executed, when the models of the power supplies to be tested are matched for the first time, matching training is performed on the server to be tested, pressure is applied to the server to be tested through different pressurizing tools, the analyzing device 103 reads power consumption records of the power supplies to be tested in different pressure states and calculates the percentage of the output power of the power supplies to be tested in different pressure states to the rated output power of the power supplies to be tested, so as to match loads required by the test items, and match corresponding determination standards according to the matched loads.
Then, executing the step S307 of testing, selecting different testing methods according to different testing items, and processing corresponding waveform data;
next, step S308 is executed to reduce the voltage of the server to be tested, remove the pressurization state of the server to be tested, and prepare to enter the next test;
then, step S309 is executed to write the test result data, and the test result data is written into the database for storage, so as to generate a test report;
next, step S310 PS _ OFF is executed, and the server to be tested is turned OFF;
then, step S311 is executed to turn OFF the AC/DC Source OFF;
finally, step S312 is executed to wait for discharging, and end the test after the power to be tested is discharged.
The technical scheme in the embodiment of the application at least has the following technical effects or advantages:
1. the data acquisition card is used for replacing the oscilloscope, so that a plurality of test signals can be met, the time for manually debugging the oscilloscope is saved, the test efficiency is improved, and the test data are on the same interface, so that the data analysis is facilitated;
2. when the test items are switched, equipment does not need to be set, and only corresponding test conditions need to be edited, so that a large amount of time is saved, and the test efficiency is improved;
3. after the test is finished, the test report does not need to be manually arranged, and the test result is automatically judged by the system, so that a large amount of time is saved, and the test efficiency and the accuracy of the test result are improved;
4. in the whole test process, the number of times that personnel contacted the instrument is reduced, the high-precision equipment protection degree is improved, and the damage of equipment caused by reasons such as misoperation is prevented.
While preferred embodiments of the present invention have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. Therefore, it is intended that the appended claims be interpreted as including preferred embodiments and all such alterations and modifications as fall within the scope of the invention.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present invention without departing from the spirit and scope of the invention. Thus, if such modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include such modifications and variations.
Claims (10)
1. A server power supply test system, comprising:
the control host is used for processing the input parameters, the internal parameters and the output signals of the power supply to be tested of the server to be tested according to the test condition data to obtain a test result;
the power meter is connected between the control host and the power supply to be tested and used for reading input parameters of the power supply to be tested;
the analysis device is connected between the control host and the power supply to be tested and used for reading internal parameters of the power supply to be tested;
the data acquisition card is connected between the power supply to be detected and the control host computer so as to send an output signal of the power supply to be detected to the control host computer;
and the database is used for storing the test condition data and receiving and storing the test result sent by the control host to generate a test report.
2. The system of claim 1, wherein the reading input parameters of the power source under test comprises reading an input current, an input voltage, and an input power of the power source under test.
3. The system of claim 1, further comprising a jig board connected to a power supply under test of the server under test to lead out an output signal pin of the power supply under test.
4. The system of claim 1, further comprising a signal attenuator connected between the jig board and the data acquisition device for attenuating the output signal of the power source to be detected acquired on the jig board for acquisition by the data acquisition card.
5. The system of claim 1, further comprising a PC, said PC accessing said database, entering said test condition data into said database and retrieving said test result data from said database, and generating said test report in a set format.
6. The system of claim 1, further comprising a printer that accesses the database or the PC to print the test result data or the test report.
7. The system of claim 1, wherein the test condition data includes sample information of a power source under test of the server under test, a test item, a determination criterion of the test item, a hardware configuration of the test item, a load of the test item, or an input condition of the test item.
8. The system of claim 1, wherein the control host is further to: in the whole test process, the control host controls the hardware equipment in the system to be opened or closed according to a set sequence, or the control host switches the working mode of the hardware equipment in the system according to different test items.
9. The system of claim 1, wherein the control host processes the input parameters, the internal parameters and the output signals of the power source to be tested of the server to be tested according to the test condition data to obtain the test result, comprising:
the control host reads the test condition data, and after the test item information is obtained, all hardware equipment and a server to be tested in the system are started;
the control host selects a corresponding test method to execute the test according to the different test items to obtain the input parameters, the internal parameters and the output signals of the power supply to be tested, processes the corresponding input parameters, the internal parameters and the output signals of the power supply to be tested according to the judgment standard of the test items, and gives a test result;
and the control host writes the test result into the database for storage so as to generate the test report.
10. The system of claim 9, wherein prior to performing the test, the server under test is load-matched for training: the method comprises the steps that pressure is applied to the server to be tested through different pressurizing tools, the analysis device reads power consumption records of the power source to be tested of the server to be tested in different pressure states and calculates the percentage of the output power of the power source to be tested in the different pressure states to the rated output power of the power source to be tested so as to match the load required by the test item, and the corresponding judgment standard is matched according to the matched load.
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|---|---|---|---|
| CN202011322633.6A CN112485699A (en) | 2020-11-23 | 2020-11-23 | Server power supply test system |
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| CN202011322633.6A CN112485699A (en) | 2020-11-23 | 2020-11-23 | Server power supply test system |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113640696A (en) * | 2021-06-30 | 2021-11-12 | 苏州浪潮智能科技有限公司 | Automatic plug test system of server PSU |
| CN113794606A (en) * | 2021-09-17 | 2021-12-14 | 合肥润东通信科技股份有限公司 | Test system and method for efficiently testing coaxial voice gateway |
-
2020
- 2020-11-23 CN CN202011322633.6A patent/CN112485699A/en not_active Withdrawn
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113640696A (en) * | 2021-06-30 | 2021-11-12 | 苏州浪潮智能科技有限公司 | Automatic plug test system of server PSU |
| CN113794606A (en) * | 2021-09-17 | 2021-12-14 | 合肥润东通信科技股份有限公司 | Test system and method for efficiently testing coaxial voice gateway |
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