CN117251348A - Method and system for testing equipment performance - Google Patents
Method and system for testing equipment performance Download PDFInfo
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- CN117251348A CN117251348A CN202311142963.0A CN202311142963A CN117251348A CN 117251348 A CN117251348 A CN 117251348A CN 202311142963 A CN202311142963 A CN 202311142963A CN 117251348 A CN117251348 A CN 117251348A
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- 238000012360 testing method Methods 0.000 title claims abstract description 179
- 238000000034 method Methods 0.000 title claims abstract description 20
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- 239000011159 matrix material Substances 0.000 claims description 16
- 238000010998 test method Methods 0.000 claims description 9
- 238000004806 packaging method and process Methods 0.000 claims description 6
- 238000010586 diagram Methods 0.000 description 5
- 230000002688 persistence Effects 0.000 description 3
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- 238000007726 management method Methods 0.000 description 1
- 238000011056 performance test Methods 0.000 description 1
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- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/30—Monitoring
- G06F11/34—Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation ; Recording or statistical evaluation of user activity, e.g. usability assessment
- G06F11/3409—Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation ; Recording or statistical evaluation of user activity, e.g. usability assessment for performance assessment
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Abstract
The invention provides a method and a system for testing equipment performance, which belong to the technical field of testing and comprise the following steps: acquiring an ATML file for describing test data, and extracting a signal parameter set, a tested object port set, a signal direction, a path mapping set and a test instrument capability set from the ATML file; matching the test signals transmitted to the test instrument in the test instrument capability set according to the signal type, the signal direction and the signal attribute; mapping the capacity port of the test instrument to a resource port by using a path mapping group, mapping the resource port of the test instrument to a physical port, and establishing path search between the physical port and a tested object port in a tested object port group set; when the equipment is tested, the computer is used for calling the stored results of capacity matching and path searching of the testing instrument, and the testing system is controlled to test the equipment. The method and the system can be repeatedly used for the test instrument under different test requirements.
Description
Technical Field
The invention belongs to the technical field of testing, and particularly relates to a method and a system for testing equipment performance.
Background
Performance testing of a test instrument, device or system can help ensure product quality, improve user experience, and reduce potential risks. The traditional performance test method is a manual test, and a tester observes and records the behavior of the tester through manual operation equipment. This approach may be effective for small batches or individual tests, but is less efficient in large-scale and complex tests. It is therefore desirable to automatically test a test instrument, device or system using a computer.
An automatic test system is a computer system for automatically performing software or hardware tests. Its main purpose is to detect problems of functions, performance, stability and other aspects of the program or system by automating the execution of test cases to ensure that the software or hardware has high quality and reliability before delivery to the user.
The existing automatic test systems are specially developed for special test tasks, and the problems that information is difficult to interact and the universality and compatibility are poor exist among different test systems.
Disclosure of Invention
In order to overcome the defects in the prior art, the invention provides a method for testing the performance of equipment.
In order to achieve the above object, the present invention provides the following technical solutions:
a method of testing device performance, comprising:
acquiring an ATML file for describing test data, and extracting a signal parameter set, a tested object port set, a signal direction, a path mapping set and a test instrument capability set from the ATML file;
matching the test signal with corresponding test instrument capability in the test instrument capability set according to the signal type, the signal direction and the signal attribute of the test signal; mapping the capacity port of the test instrument to a resource port by using the path mapping group, and mapping the resource port of the test instrument to a physical port; establishing path searching between the physical port and the tested object port in the tested object port group set; storing the matching result of the test instrument and the established path searching result;
when the equipment is tested, the computer is used for calling the stored results of matching and path searching of the testing instrument, and the testing system is controlled to test the equipment.
Further, the ATML file includes: test description file TD, test station file TS, adapter file TA, wireList file, test instrument description file TI, and tested object file UUT.
Further, the signal parameter set has a structure as follows:
P1＝SignalType：[(Attribute1:value1)，(Attribute2:value2)……]
wherein SignalType is a signal type, attribute is a signal Attribute, and value is a value corresponding to the signal Attribute;
the structure of the port group set of the tested object is as follows:
P2＝ConnectType：[(PortType1:port1)，(PortType2:port2)……]
wherein ConnectType is connection type, portType is port type, and port is port name;
the structure of the test signal direction is as follows:
P3＝SignalDirection∈[Source，Sensor]
wherein Sensor is the receiving direction and Source is the emitting direction.
Further, the path map group includes:
MapTsTi, mapTaTs, mapUutTa, mapCapability, mapResources, mapTsTs, mapUutTs are respectively the wiring mappings of TS to TI, TA to TS, UUT to TA, TI capability port to TI resource port, TI resource port to TI physical port, TS to TS, UUT to TS.
Further, the signal type, the signal direction and the signal attribute of the test signal are that the test signal is matched with the corresponding test instrument capability in the test instrument capability set; comprising the following steps:
checking whether the SignalType is matched;
detecting whether SignalDirection is matched, if so, traversing to check whether the Attribute full scale can be completely matched;
checking whether the value meets the requirement, and if so, adding the matched capability set.
Further, the establishing a path search between the physical port and the object port in the object port group set includes:
searching MapTsTi to obtain a wiring relation from the test instrument description file TI to the test station file TS;
searching MapTaTs to obtain a wiring relation from the test station file TS to the adapter file TA;
searching MapUutTa to obtain the wiring relation from TA to UUT of the measured object file.
Further, the method further comprises the following steps: aiming at each test instrument driver, packaging the driver as a template according to ATML requirements and Ctypes mapping rules;
and establishing a local index for all the generated test instrument drivers according to UUIDs of the test stations and the test instruments, and taking signals and ports as real-parameter input driving methods to call the drivers.
Further, the method further comprises the following steps: if the physical port is not directly connected to the tested object port, a matrix switch distribution algorithm is used for matching the physical port with the tested object port with a matrix switch path.
A system for testing the performance of a device, comprising:
the file analysis module is used for acquiring an ATML file for describing test data, extracting a signal parameter set, a tested object port set, a signal direction, a path mapping set and a test instrument capability set from the ATML file;
the test instrument matching module is used for matching corresponding test instrument capabilities of the test signals in the test instrument capability set according to the signal types, the signal directions and the signal attributes of the test signals;
the path searching module is used for mapping the capacity port of the test instrument to the resource port by utilizing the path mapping group and mapping the resource port of the test instrument to the physical port; establishing path searching between the physical port and the tested object port in the tested object port group set;
the information persistence module is used for storing the matching result of the test instrument and the established path searching result;
and the execution module is used for controlling the test system to test the equipment by using the stored test instrument matching and path searching results called by the computer.
The method and the system for testing the performance of the equipment have the following beneficial effects:
after the test behavior information in the ATML file is extracted, the different test signals are matched with the test instrument capability in the test behavior information, so that the computer can find the corresponding test instrument capability according to the different types of test signals; the signal interfaces of the test instrument and the tested object are abstracted, so that the test program is irrelevant to specific hardware and only focuses on the functions and the characteristics of the signals, and the problems that in the prior art, information is difficult to interact between different test systems and the universality and the compatibility are poor are solved. And on the basis, matching the test instruments and distributing and storing paths for repeated use of the test instruments under different test requirements.
Drawings
In order to more clearly illustrate the embodiments of the present invention and the design thereof, the drawings required for the embodiments will be briefly described below. The drawings in the following description are only some of the embodiments of the present invention and other drawings may be made by those skilled in the art without the exercise of inventive faculty.
FIG. 1 is a schematic diagram of a system module of a method for testing equipment performance according to the present invention;
FIG. 2 is a schematic diagram of ATML file structure relationship;
FIG. 3 is a schematic diagram of a path search process according to the present invention;
FIG. 4 is a schematic diagram of a switch matrix structure according to the present invention;
fig. 5 is a schematic diagram of a switch matrix path structure according to the present invention.
Detailed Description
The present invention will be described in detail below with reference to the drawings and the embodiments, so that those skilled in the art can better understand the technical scheme of the present invention and can implement the same. The following examples are only for more clearly illustrating the technical aspects of the present invention, and are not intended to limit the scope of the present invention.
Examples:
the invention provides a method and a system for testing equipment performance, which are specifically shown in fig. 1 and comprise the following steps: acquiring an ATML file for describing test data, and extracting a signal parameter set, a tested object port set, a signal direction, a path mapping set and a test instrument capability set from the ATML file; matching the test signal with corresponding test instrument capability in the test instrument capability set according to the signal type, the signal direction and the signal attribute of the test signal; mapping the capacity port of the test instrument to a resource port by using the path mapping group, and mapping the resource port of the test instrument to a physical port; establishing path searching between the physical port and the tested object port in the tested object port group set; storing the matching result of the test instrument and the established path searching result; when the equipment is tested, the computer is used for calling the stored results of matching and path searching of the testing instrument, and the testing system is controlled to test the equipment.
The following are specific details of the invention:
1) Extracting test information:
as shown in fig. 2, an ATML file structure is shown, and ATML files (including a test description file (TD), a test station file (TS), an adapter file (TA), a WireList file, a test instrument description file (TI), and a test object file (UUT)) are input.
The TD file contains test Behavior information, and is described by all the Actions/Behavir/Operations nodes under the test description/DetailedTestInformation/Actions, and input parameters (signal parameter group, tested object port group, signal direction) are extracted according to the tag group as follows:
the TS file contains the wiring from TI to TS, described by the TestStationDescription/NetworkList tag group; the TA file contains TS to TA wiring and is described by a TestAdaptterDescription/NetworkList tag group; the WireList file contains the UUT to TA wiring relationship. Described by a WireList/WireList tag group; the UUT file comprises a tested object port and is described by a UUTDescription/Interface tag group; the TI file contains capability information and port mapping information of the test instrument, the test instrument capability is described by instruments descriptions/Capabilities, and the test instrument capability extracted according to the tag group is as follows:
Capabilitys＝∑TI/InstrumentDescription/Capability
port mapping information is described by Capability/Capability map and InstrumentDescription/networkList tag sets. The path mapping information extracted from the tag group is as follows:
2) Performing test instrument matching on the signals:
for one Signal of the input parameter group, traversing the capabilities set, and firstly checking whether the SignalType of the capabilities is matched; secondly, whether the SignalDirections are matched is detected, if so, whether the Attribute full scale can be completely matched is checked through traversal; if the values are matched, checking whether the value meets the requirement, and if so, adding the capability of the testing instrument into a matched capability set; and finally obtaining all capability sets meeting the requirements.
3) As shown in fig. 3, a path search module is used to perform a path search for each capability port of the matched capability set. And mapping the capacity ports to the resource ports according to MapRestources and mapping the resource ports to the physical ports according to MapCapavailability.
4) And for the physical port, firstly, obtaining the wiring relation from TI to TS according to MapTsTi, then obtaining the wiring relation from TS to TA of the test station file according to MapTaTs, and then obtaining the wiring relation from TA to UUT according to MapUutTa, and checking with the input second parameter set (UUT port) to judge whether the path search is correct.
5) If the physical port of the test instrument is directly connected to the port of the tested object, the step 6 is directly carried out, otherwise, the matrix configuration module is called to plan the path. As shown in fig. 4, which shows a matrix switch structure and a predetermined matrix path, the input of the row port row of the TI access matrix and the port col of the UUT access matrix searched in step 4 will obtain a single switch path
[1，1，row，col，-1]
Traversing row at the same time as column at col can get paths of all three switches:
[1，3，row，i，j，i，j，col，-1]，i∈[1,col],j∈[1,row]
and by analogy, traversing the column where i is located and the row where j is located at the same time can obtain paths of five matrix switches. For most cases, the single switch and three switch paths have met the test requirements.
The matrix switch allocation algorithm reduces a large amount of manual wiring of the test instrument, can dynamically allocate path resources according to the test requirements and the test instrument in a short time, and avoids short circuit caused by path conflict.
Aiming at dynamic path allocation of the matrix, a path allocation algorithm using a minimum matrix switch is provided, and compared with a popular depth-first algorithm, the matching speed is greatly improved; besides dynamic matching, all available matrix switch paths can be rapidly provided for users to select for the second time
6) And (5) repeating the steps 2 to 5, and completing the matching of the test instrument and the path searching by all signals of the parameter set. As shown in fig. 5, the general structure of JSON persistence information is shown, and the call information persistence module stores path search information as JSON file for repeated call of user, for example:
{
"IO+DO+0x64+127.0.0.1+DIGITAL_SERIAL_d57f5eca-c180-4962-bc49-12f776d62cc0":
["IO:DO_CH_HI-1＝>TS:DIO#1_GRP7_CH_1＝>TA:DIO#1_GRP7_CH_1＝>TA:X1_XX2333Y90A_A＝>UUT:XX2333Y90A_A",
"IO:DO_CH_LO-1＝>TS:DIO#1_GRP7_COM＝>TA:DIO#1_GRP7_COM＝>TA:X1_XX2333Y90A_10GNDB4＝>UUT:XX2333Y90A_10GNDB4"]
}
the format is a partial JSON file structure of the IO card path search information, according to the file description path information, a search algorithm is not required to be called again when the test instrument resource is called repeatedly, and if the test behavior is changed, the file is regenerated.
7) And calling a drive packaging module to complete the drive packaging of the test instrument. After inputting test station files, extracting all TI files according to UUID, selecting any test instrument, selecting a dll driver of the test instrument, verifying a dependent item after the header file, generating a main driving template according to Ctypes after completing the dependent item, extracting the capability and resource pins in the TI files according to the method in the step 3, selecting the driving digits of packaging, generating a test instrument capability driving template, wherein the template is named as the test instrument capability, the method is named as a required test verb, and filling control logic into the method by a user.
The method has the advantages that the existing automatic test platform is poor in cross-platform performance, the driving and calling logic is complex, the Ctypes module is used for packaging the test instrument driver, and the cross-platform requirement of driving and calling is met.
Aiming at the characteristics of difficult cross-platform test and complex driving and calling logic of the existing automatic test system, the invention secondarily packages the driving logic of the test instrument, shields part of complex driving and calling logic and cross-platform operation logic, and provides quick calling for the automatic test system.
8) And calling a drive management module, and establishing a local index for all the generated test instrument drives according to UUIDs of the test station and the test instruments, wherein the specific index is as follows:
UUID/capability. Py of UUID/_TI of drive bit/_TS
The same test instrument multiplexing drive of different test stations is realized, the signal group, the port group and the test instrument resource port group are used as real parameters to be transmitted into the test instrument capacity driving method to realize drive call, and control logic call is completed.
The above embodiments are merely preferred embodiments of the present invention, the protection scope of the present invention is not limited thereto, and any simple changes or equivalent substitutions of technical solutions that can be obviously obtained by those skilled in the art within the technical scope of the present invention disclosed in the present invention belong to the protection scope of the present invention.
Claims (9)
1. A method of testing device performance, comprising:
acquiring an ATML file for describing test data, and extracting a signal parameter set, a tested object port set, a signal direction, a path mapping set and a test instrument capability set from the ATML file;
matching the test signals transmitted to the test instrument in the test instrument capability set according to the signal type, the signal direction and the signal attribute;
mapping the capacity port of the test instrument to a resource port by using a path mapping group, mapping the resource port of the test instrument to a physical port, and establishing path search between the physical port and a tested object port in a tested object port group set;
when the equipment is tested, the computer is used for calling the stored results of capacity matching and path searching of the testing instrument, and the testing system is controlled to test the equipment.
2. A method of testing device performance according to claim 1, wherein the ATML file comprises: test description file TD, test station file TS, adapter file TA, wireList file, test instrument description file TI, and tested object file UUT.
3. A method of testing the performance of a device according to claim 1,
the structure of the signal parameter set is as follows:
P1＝SignalType：[(Attribute1:value1)，(Attribute2:value2)……]
wherein SignalType is a signal type, attribute is a signal Attribute, and value is a value corresponding to the signal Attribute;
the structure of the port group set of the tested object is as follows:
P2＝ConnectType：[(PortType1:port1)，(PortType2:port2)……]
wherein ConnectType is connection type, portType is port type, and port is port name;
the structure of the test signal direction is as follows:
P3＝SignalDirection∈[Source，Sensor]
wherein Sensor is the receiving direction and Source is the emitting direction.
4. A method of testing device performance according to claim 2, wherein the set of path mappings comprises:
MapTsTi, mapTaTs, mapUutTa, mapCapability, mapResources, mapTsTs, mapUutTs are respectively the wiring mappings of TS to TI, TA to TS, UUT to TA, TI capability port to TI resource port, TI resource port to TI physical port, TS to TS, UUT to TS.
5. A method of testing the performance of a device according to claim 3, wherein the test signals transmitted to the test instruments are matched with corresponding test instrument capabilities in the test instrument capability set according to the signal type, the signal direction and the signal attribute; comprising the following steps:
checking whether the SignalType is matched;
detecting whether SignalDirection is matched, if so, traversing to check whether the Attribute full scale can be completely matched;
checking whether the value meets the requirement, and if so, adding the matched capability set.
6. The method of testing device performance of claim 4, wherein establishing a path search between a physical port and an object port of the set of object ports under test comprises:
searching MapTsTi to obtain a wiring relation from the test instrument description file TI to the test station file TS;
searching MapTaTs to obtain a wiring relation from the test station file TS to the adapter file TA;
searching MapUutTa to obtain the wiring relation from TA to UUT of the measured object file.
7. A method of testing the performance of a device according to claim 1, further comprising:
aiming at each test instrument driver, packaging the driver as a template according to ATML requirements and Ctypes mapping rules;
and establishing a local index for all the generated test instrument drivers according to UUIDs of the test stations and the test instruments, and taking signals and ports as real-parameter input driving methods to call the drivers.
8. A method of testing the performance of a device according to claim 1, further comprising: if the physical port is not directly connected to the tested object port, a matrix switch distribution algorithm is used for matching the physical port with the tested object port with a matrix switch path.
9. A system for testing the performance of a device, comprising:
the file analysis module is used for acquiring an ATML file for describing test data, extracting a signal parameter set, a tested object port set, a signal direction, a path mapping set and a test instrument capability set from the ATML file;
the test instrument matching module is used for matching corresponding test instrument capacity in the test instrument capacity set according to the signal type, the signal direction and the signal attribute for the test signal transmitted to the test instrument;
the path searching module is used for mapping the capacity port of the test instrument to the resource port by utilizing the path mapping group, mapping the resource port of the test instrument to the physical port, and establishing path searching between the physical port and the tested object port in the tested object port group set;
and the execution module is used for controlling the test system to test the equipment by using the stored test instrument capacity matching and path searching results called by the computer.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN117472674A (en) * | 2023-12-27 | 2024-01-30 | 中国电子科技集团公司第十研究所 | Software radio measurement method based on resource pool |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117472674A (en) * | 2023-12-27 | 2024-01-30 | 中国电子科技集团公司第十研究所 | Software radio measurement method based on resource pool |
| CN117472674B (en) * | 2023-12-27 | 2024-04-02 | 中国电子科技集团公司第十研究所 | Software radio measurement method based on resource pool |
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