CN108646115A - LCR tests system and device - Google Patents
LCR tests system and device Download PDFInfo
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- CN108646115A CN108646115A CN201810623894.8A CN201810623894A CN108646115A CN 108646115 A CN108646115 A CN 108646115A CN 201810623894 A CN201810623894 A CN 201810623894A CN 108646115 A CN108646115 A CN 108646115A
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- 238000012360 testing method Methods 0.000 title claims abstract description 266
- 238000001514 detection method Methods 0.000 claims abstract description 126
- 238000012545 processing Methods 0.000 claims abstract description 72
- 230000005540 biological transmission Effects 0.000 claims abstract description 50
- 230000004913 activation Effects 0.000 claims description 23
- 241001269238 Data Species 0.000 claims description 5
- 238000007689 inspection Methods 0.000 claims description 5
- 238000012216 screening Methods 0.000 abstract description 2
- 238000000034 method Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 238000012797 qualification Methods 0.000 description 3
- 101000746134 Homo sapiens DNA endonuclease RBBP8 Proteins 0.000 description 1
- 101000969031 Homo sapiens Nuclear protein 1 Proteins 0.000 description 1
- 102100021133 Nuclear protein 1 Human genes 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 235000013399 edible fruits Nutrition 0.000 description 1
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- 230000006870 function Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract
LCR test systems provided by the present invention provided by the invention and device, including, LCR testing data processing modules are set in LCR test machines and computer, computer-internal module；The data transmission interface of LCR test machines and the data-interface of computer connect；LCR test machines obtain the current detection data of electronic device, and current detection data are sent in the LCR testing data processing modules of computer；LCR testing data processing modules show the current detection data received the generation page.During solving existing electron device testing, data read poor, low to the device screening efficiency problem of accuracy.Test data can be shown by a variety of display devices, improve the delivery efficiency of test data and the reading accuracy of test data, simultaneously convenient for the follow-up storage of detection parameters and output, reduces the testing cost of electronic device detection and improve detection efficiency and accuracy.
Description
Technical field
The present invention relates to the technical field of measurement and test of electrical part parameter more particularly to LCR test systems and devices.
Background technology
In the test process of electronic device, it will usually be tested device, but tested using Special testing device
In the process, it needs to carry out the reading of test parameter to test device by the display screen of Special testing device, and therefrom tells
The test result of current test device, determines whether good devices.To for currently testing the test parameter and knot of device
Fruit can only be given by way of manual record and be recorded, and the examination to testing device relies primarily on people and sentences to the reading of parameter
It is disconnected, the accuracy of device detection is reduced, especially in the case where high-volume carries out device detection, reduces testing efficiency simultaneously
Debugging is improved, simultaneously as the display area by detection device is limited to, to reduce the reading effect of detection data
Rate.For the above situation, detection device is treated in such a way that more people detect and are checked in the prior art and is detected, but
The above method also reduces testing efficiency while increasing personnel's input cost, and data reading can not be completely secured
Accuracy.
Invention content
The object of the present invention is to provide LCR test systems and devices.During solving existing electron device testing, data
Read poor, low to the device screening efficiency problem of accuracy.
In order to achieve the above object, LCR provided by the invention tests system, including, it is LCR test machines and computer, described
The LCR testing data processing modules are set in computer-internal module；The data transmission interface of the LCR test machines with it is described
The data-interface of computer connects；The LCR test machines obtain the current detection data of electronic device, by the current detection number
According to being sent in the LCR testing data processing modules of the computer；The LCR testing data processing modules will receive
The current detection data generate the page shown.
In a preferred embodiment, further include：Device eligible state instruction device；The device eligible state refers to
Showing device is connect with the data transmission interface of the computer；It is received according to the LCR testing data processing modules current
The comparison result of detection data and the detection data to prestore, to the data transmission interface output device eligible state instruction device
By indicating activation bit and not by indicating activation bit, the device eligible state instruction device passes through finger according to
Show activation bit and not by indicating that activation bit drives the device eligible state instruction device.
In a preferred embodiment, the inspection of the LCR test machines is received by the computer input device
Survey parameter or self-test control instruction；The detection parameters or self-test control instruction are loaded into LCR testing data processing modules；
The LCR testing data processing modules are sent out the detection parameters or self-test control instruction by the data-interface of the computer
It is sent in the data transmission interface of the LCR test machines；The data transmission interface of the LCR test machines is according to the detection received
Parameter setting current detection parameter boots up self-test according to the self-test control instruction received.
In a preferred embodiment, the LCR test machines are received by the computer input device more
Frequency sets control instruction；Multi-frequency setting control instruction is loaded into LCR testing data processing modules；The LCR
Multi-frequency setting control instruction is sent to the LCR by testing data processing module by the data-interface of the computer
In the data transmission interface of test machine；The data transmission interface of the LCR test machines sets control according to the multi-frequency received
After multiple test frequencies of instruction setting current detection device, the test parameter of the multiple test frequencies of current detection device is obtained
Value；The LCR test machines connect the test parameter value of the multiple test frequencies of current detection device by the data transmission
Oral instructions are sent in the LCR testing data processing modules of the computer；The LCR testing data processing modules pass through the page
The chart that two-dimensional coordinate is carried out to the test parameter value of the multiple test frequencies of current detection device is shown.
In a preferred embodiment, if the LCR testing data processing modules send out self-test control instruction, if connecing
Receive the current detection data for getting electronic device；Then judge whether the current detection data of the electronic device are that setting can
By property detected value section, if not in the section, detection prompt messages are generated, and shown.
Meanwhile the present invention also provides a kind of LCR test devices, including, LCR test machines and computer, the computer
The LCR testing data processing modules are set in internal module；The data transmission interface of the LCR test machines and the computer
Data-interface connection；The LCR test machines obtain the current detection data of electronic device, and the current detection data are sent
Into the LCR testing data processing modules of the computer；Described in the LCR testing data processing modules will receive
Current detection data generate the page and are shown.
In a preferred embodiment, further include：Device eligible state instruction device；The device eligible state refers to
Showing device is connect with the data transmission interface of the computer；It is received according to the LCR testing data processing modules current
The comparison result of detection data and the detection data to prestore, to the data transmission interface output device eligible state instruction device
By indicating activation bit and not by indicating activation bit, the device eligible state instruction device passes through finger according to
Show activation bit and not by indicating that activation bit drives the device eligible state instruction device.
In a preferred embodiment, the inspection of the LCR test machines is received by the computer input device
Survey parameter or self-test control instruction；The detection parameters or self-test control instruction are loaded into LCR testing data processing modules；
The LCR testing data processing modules are sent out the detection parameters or self-test control instruction by the data-interface of the computer
It is sent in the data transmission interface of the LCR test machines；The data transmission interface of the LCR test machines is according to the detection received
Parameter setting current detection parameter boots up self-test according to the self-test control instruction received.
In a preferred embodiment, the LCR test machines are received by the computer input device more
Frequency sets control instruction；Multi-frequency setting control instruction is loaded into LCR testing data processing modules；The LCR
Multi-frequency setting control instruction is sent to the LCR by testing data processing module by the data-interface of the computer
In the data transmission interface of test machine；The data transmission interface of the LCR test machines sets control according to the multi-frequency received
After multiple test frequencies of instruction setting current detection device, the test parameter of the multiple test frequencies of current detection device is obtained
Value；The LCR test machines connect the test parameter value of the multiple test frequencies of current detection device by the data transmission
Oral instructions are sent in the LCR testing data processing modules of the computer；The LCR testing data processing modules pass through the page
The chart that two-dimensional coordinate is carried out to the test parameter value of the multiple test frequencies of current detection device is shown.
In a preferred embodiment, if the LCR testing data processing modules send out self-test control instruction, if connecing
Receive the current detection data for getting electronic device；Then judge whether the current detection data of the electronic device are that setting can
By property detected value section, if not in the section, detection prompt messages are generated, and shown.
As shown in the above, the beneficial effects of the present invention are LCR test systems and device in the present invention are using
In the process, by the way that the detection data of current device to be transferred directly in computer, data can be carried out on the screen of computer
Reading, to improve detection data reading reliability；Meanwhile by device eligible state instruction device to current detection
Device can give intuitive detection, and then improve the detection efficiency of device；It in turn, can by LCR testing data processing modules
Controls, the parameter setting information such as the reliable access of detection parameters, self-test control, multiband detection and detection device are received, to LCR
Test machine carries out remote control, improves control and the setting efficiency of LCR test machines.This improves the outputs of test data
The reading accuracy of efficiency and test data, while the follow-up storage convenient for detection parameters and output reduce electronic device inspection
The testing cost of survey simultaneously improves detection efficiency and accuracy.
Description of the drawings
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technology description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
Some embodiments of invention for those of ordinary skill in the art without creative efforts, can be with
Obtain other attached drawings according to these attached drawings.
Fig. 1 is in one embodiment of the present invention, and LCR tests the control system schematic diagram of system and device；
Fig. 2 is in another embodiment of the present invention, and LCR tests the control system schematic diagram of system and device；
Fig. 3 is in another embodiment of the invention, and LCR tests the control system schematic diagram of system and device.
Specific implementation mode
Below in conjunction with the attached drawing of the present invention, technical scheme of the present invention is clearly and completely described, it is clear that institute
The embodiment of description is only a part of the embodiment of the present invention, instead of all the embodiments.Based on the embodiments of the present invention,
The every other embodiment that those of ordinary skill in the art are obtained without creative efforts, belongs to this hair
The range of bright protection.
In one embodiment of the invention, a kind of LCR tests system is disclosed, as shown in Figure 1, including LCR tests
LCR testing data processing modules 202 are set in machine 101 and computer 201,201 internal module of computer.LCR test machines 101
Data transmission interface is connect with the COM1 data-interfaces of computer 201.Above-mentioned LCR test machines 101 use HIOKI-3532-50.
During use, first according to the type of electronic device to be detected, testing conditions is set, pass through the test of LCR test machines 101 later
"+, _ pole " that pen treats detection device is detected, and obtains the current detection data of electronic device, current detection data are sent
Into the LCR testing data processing modules 202 of computer 201.Above computer can be " desktop computer, tablet computer or notebook
Give and realize " LCR testing data processing modules 202 can be by loading the achievable program list of programming language in computer systems
Member realizes its function.The current detection data received are generated the page by LCR testing data processing modules 202, in computer
It is shown on display screen.
For ease for the treatment of the quick judgement of detection device, in a kind of embodiment of the present invention, as shown in Fig. 2, including：
Device eligible state instruction device 301.The data transmission interface COM of device eligible state instruction device 301 and computer 201 or
USB interface connects.Above-mentioned device eligible state instruction device 301 is to show that more indicator lights that microcontroller 302 is processing core are aobvious
Showing device, as shown in figure 3, the data transmission interface COM or USB interface of its input terminal and computer 201 that show microcontroller 302
Connection, drive output with connect respectively with qualified indicator light 303 and unqualified indicator light 304.If LCR test datas handle mould
Range of the current detection data that block 202 receives in the detection data (the qualification parameters data of current test device) to prestore
It is interior, then to data transmission interface output device eligible state instruction device 301 by indicating activation bit, device eligible state
Instruction device 301 is according to by indicating activation bit to device eligible state instruction device device eligible state instruction device 301
Carry out the qualified driving of indicator light 303 display.If being received according to LCR testing data processing module LCR testing data processing modules 202
To current detection data with not in the comparison result model of the detection data qualification parameters data of device (current test) to prestore
In enclosing, then to the not qualified status indication information of data transmission interface output device, device eligible state instruction device 301 is not according to
It is shown by indicating that activation bit carries out driving to unqualified indicator light 304.To convenient for tester to current detection device
Testing result, which more intuitive, quick can be given, to be judged.
Pass through the input unit of computer 201 in one embodiment of the invention for ease of carrying out self-test to equipment
Receive the detection parameters or self-test control instruction of LCR test machines 101.Detection parameters or self-test control instruction are loaded into LCR to survey
It tries in data processing module 202.LCR testing data processing module LCR testing data processing modules 202 pass through computer computer
The data transmission that detection parameters or self-test control instruction are sent to LCR test machine LCR test machines 101 by 201 data-interface connects
In mouthful.The data transmission interface of LCR test machines 101 is according to the detection parameters setting current detection parameter received or according to reception
To self-test control instruction boot up self-test.
Multiband for ease for the treatment of detection device is detected, and in a kind of embodiment of the present invention, passes through calculating
The multi-frequency that the input unit of machine 201 receives LCR test machines 101 sets control instruction.By multi-frequency setting control instruction load
Into LCR testing data processing modules 202.LCR testing data processing modules 202 will be more by the data-interface of computer 201
Frequency setting control instruction is sent in the data transmission interface of LCR test machines 101.The data transmission interface of LCR test machines 101
After setting multiple test frequencies of current detection device according to the multi-frequency setting control instruction received, current detector is obtained
The test parameter value of the multiple test frequencies of part.LCR test machines 101 are by the test parameter value of the multiple test frequencies of current detection device
It is transmitted in the LCR testing data processing modules 202 of computer 201 by data transmission interface.LCR testing data processing modules
202 charts for carrying out two-dimensional coordinate to the test parameter value of the multiple test frequencies of current detection device by the page are shown.
To treat whether detection device is effectively contacted with the test pen both ends of LCR test machines, to avoid " accidentally
Sentence " or the case where " misreading " occur, in one embodiment of the invention, if LCR testing data processing modules 202 send out from
Control instruction is examined, if receiving the current detection data for getting electronic device.Then judge the current detection data of electronic device
Whether it is if that setting reliability detected value section generates detection prompt messages, and shown not in the section.
The present invention another kind be additionally provide a kind of LCR test devices in embodiment, including, LCR test machines 101
And LCR testing data processing modules 202 are set in computer 201,201 internal module of computer.The data of LCR test machines 101
Coffret is connect with the data-interface of computer 201.LCR test machines 101 obtain the current detection data of electronic device, will work as
Preceding detection data is sent in the LCR testing data processing modules 202 of computer 201.LCR testing data processing modules 202 will
The current detection data received generate the page and are shown.
The another kind of the present invention is to further include in embodiment：Device eligible state instruction device 301.Device qualification shape
State instruction device 301 is connect with the data transmission interface of computer 201.It is received according to LCR testing data processing modules 202
The comparison result of current detection data and the detection data to prestore, to data transmission interface output device eligible state instruction device
301 by indicate activation bit and not by indicate activation bit, device eligible state instruction device 301 according to pass through instruction
Activation bit and not by indicate activation bit device eligible state instruction device 301 is driven.
The another kind of the present invention is to receive LCR test machines 101 by the input unit of computer 201 in embodiment
Detection parameters or self-test control instruction.Detection parameters or self-test control instruction are loaded into LCR testing data processing modules 202
In.LCR testing data processing modules 202 are sent detection parameters or self-test control instruction by the data-interface of computer 201
Into the data transmission interface of LCR test machines 101.The data transmission interface of LCR test machines 101 is according to the detection parameters received
Setting current detection parameter boots up self-test according to the self-test control instruction received.
The another kind of the present invention is to receive LCR test machines 101 by the input unit of computer 201 in embodiment
Multi-frequency sets control instruction.Multi-frequency setting control instruction is loaded into LCR testing data processing modules 202.LCR is tested
Multi-frequency setting control instruction is sent to LCR test machines 101 by data processing module 202 by the data-interface of computer 201
Data transmission interface in.The data transmission interface of LCR test machines 101 is according to the multi-frequency setting control instruction setting received
After multiple test frequencies of current detection device, the test parameter value of the multiple test frequencies of current detection device is obtained.LCR is tested
The test parameter value of the multiple test frequencies of current detection device is transmitted to computer 201 by machine 101 by data transmission interface
In LCR testing data processing modules 202.LCR testing data processing modules 202 are by the page to the multiple tests of current detection device
The chart that the test parameter value of frequency carries out two-dimensional coordinate is shown.
The another kind of the present invention is in embodiment, if LCR testing data processing modules 202 send out self-test control instruction,
If receiving the current detection data for getting electronic device.Then judge whether the current detection data of electronic device are that setting can
By property detected value section, if not in the section, detection prompt messages are generated, and shown.
The above description is merely a specific embodiment, but scope of protection of the present invention is not limited thereto, any
Those familiar with the art in the technical scope disclosed by the present invention, can easily think of the change or the replacement, and should all contain
Lid is within protection scope of the present invention.Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (10)
1.LCR tests system, which is characterized in that including being arranged in LCR test machines and computer, the computer-internal module
The LCR testing data processing modules；The data transmission interface of the LCR test machines connects with the data-interface of the computer
It connects；
The LCR test machines obtain the current detection data of electronic device, and the current detection data are sent to the calculating
In the LCR testing data processing modules of machine；
The LCR testing data processing modules show the current detection data received the generation page.
2. LCR according to claim 1 tests system, which is characterized in that further include：Device eligible state instruction device；
The device eligible state instruction device is connect with the data transmission interface of the computer；At the LCR test datas
The comparison result of reason module the current detection data received and the detection data to prestore, to the data transmission interface follower
Part eligible state instruction device indicates activation bit by indicating activation bit and not passing through, device eligible state instruction
Device according to it is described by indicate activation bit and not by indicate activation bit to the device eligible state instruction device into
Row driving.
3. LCR according to claim 1 tests system, which is characterized in that received by the computer input device
The detection parameters or self-test control instruction of the LCR test machines；The detection parameters or self-test control instruction are loaded into LCR to survey
It tries in data processing module；
The LCR testing data processing modules are referred to the detection parameters or self-test control by the data-interface of the computer
Order is sent in the data transmission interface of the LCR test machines；
The data transmission interface of the LCR test machines is according to the detection parameters setting current detection parameter received or according to reception
To self-test control instruction boot up self-test.
4. LCR according to claim 1 or 3 tests system, which is characterized in that connect by the computer input device
Receive the multi-frequency setting control instruction of the LCR test machines；Multi-frequency setting control instruction is loaded into LCR test datas
In processing module；
The multi-frequency is set control instruction hair by the LCR testing data processing modules by the data-interface of the computer
It is sent in the data transmission interface of the LCR test machines；
The data transmission interface of the LCR test machines sets current detection device according to the multi-frequency setting control instruction received
Multiple test frequencies after, obtain the multiple test frequencies of current detection device test parameter value；
The LCR test machines connect the test parameter value of the multiple test frequencies of current detection device by the data transmission
Oral instructions are sent in the LCR testing data processing modules of the computer；
The LCR testing data processing modules are by the page to the test parameter value of the multiple test frequencies of current detection device
The chart for carrying out two-dimensional coordinate is shown.
5. LCR according to claim 3 tests system, which is characterized in that if the LCR testing data processing modules are sent out
Self-test control instruction, if receiving the current detection data for getting electronic device；Then judge the current inspection of the electronic device
Whether measured data is if that setting reliability detected value section generates detection prompt messages, and carry out not in the section
Display.
6.LCR test devices, which is characterized in that including being arranged in LCR test machines and computer, the computer-internal module
The LCR testing data processing modules；The data transmission interface of the LCR test machines connects with the data-interface of the computer
It connects；
The LCR test machines obtain the current detection data of electronic device, and the current detection data are sent to the calculating
In the LCR testing data processing modules of machine；
The LCR testing data processing modules show the current detection data received the generation page.
7. LCR test devices according to claim 6, which is characterized in that further include：Device eligible state instruction device；
The device eligible state instruction device is connect with the data transmission interface of the computer；At the LCR test datas
The comparison result of reason module the current detection data received and the detection data to prestore, to the data transmission interface follower
Part eligible state instruction device indicates activation bit by indicating activation bit and not passing through, device eligible state instruction
Device according to it is described by indicate activation bit and not by indicate activation bit to the device eligible state instruction device into
Row driving.
8. LCR test devices according to claim 6, which is characterized in that received by the computer input device
The detection parameters or self-test control instruction of the LCR test machines；The detection parameters or self-test control instruction are loaded into LCR to survey
It tries in data processing module；
The LCR testing data processing modules are referred to the detection parameters or self-test control by the data-interface of the computer
Order is sent in the data transmission interface of the LCR test machines；
The data transmission interface of the LCR test machines is according to the detection parameters setting current detection parameter received or according to reception
To self-test control instruction boot up self-test.
9. the LCR test devices according to claim 6 or 8, which is characterized in that connect by the computer input device
Receive the multi-frequency setting control instruction of the LCR test machines；Multi-frequency setting control instruction is loaded into LCR test datas
In processing module；
The multi-frequency is set control instruction hair by the LCR testing data processing modules by the data-interface of the computer
It is sent in the data transmission interface of the LCR test machines；
The data transmission interface of the LCR test machines sets current detection device according to the multi-frequency setting control instruction received
Multiple test frequencies after, obtain the multiple test frequencies of current detection device test parameter value；
The LCR test machines connect the test parameter value of the multiple test frequencies of current detection device by the data transmission
Oral instructions are sent in the LCR testing data processing modules of the computer；
The LCR testing data processing modules are by the page to the test parameter value of the multiple test frequencies of current detection device
The chart for carrying out two-dimensional coordinate is shown.
10. LCR test devices according to claim 8, which is characterized in that if the LCR testing data processing modules are sent out
Come from inspection control instruction, if receiving the current detection data for getting electronic device；Then judge the current of the electronic device
Whether detection data is if that setting reliability detected value section generates detection prompt messages, go forward side by side not in the section
Row display.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810623894.8A CN108646115A (en) | 2018-06-15 | 2018-06-15 | LCR tests system and device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810623894.8A CN108646115A (en) | 2018-06-15 | 2018-06-15 | LCR tests system and device |
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| CN108646115A true CN108646115A (en) | 2018-10-12 |
Family
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| CN201810623894.8A Pending CN108646115A (en) | 2018-06-15 | 2018-06-15 | LCR tests system and device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112474432A (en) * | 2020-10-19 | 2021-03-12 | 深圳市景旺电子股份有限公司 | LCR testing arrangement |
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