CN112474432A

CN112474432A - LCR testing arrangement

Info

Publication number: CN112474432A
Application number: CN202011119378.5A
Authority: CN
Inventors: 胡珂珂; 康国庆; 杨磊磊
Original assignee: Shenzhen Kinwong Electronic Co Ltd
Current assignee: Shenzhen Kinwong Electronic Co Ltd
Priority date: 2020-10-19
Filing date: 2020-10-19
Publication date: 2021-03-12

Abstract

This application is applicable to flexible circuit board test technical field, provides an LCR testing arrangement, includes: the test jig is used for positioning a product and comprises an upper die and a lower die, and probes are respectively arranged on the upper die and the lower die; the LCR tester is electrically connected with the test frame and used for testing the test parameters of the product; and the first optical coupling isolation plate is electrically connected between the test frame and the LCR tester. A first optical coupling isolation plate in the LCR testing device can isolate signals influencing an LCR tester, and the LCR testing device has high testing accuracy.

Description

LCR testing arrangement

Technical Field

The invention relates to the technical field of flexible circuit board testing, in particular to an LCR testing device.

Background

Along with the continuous intellectuality and the portability of mobile terminal product, the continuation of journey ability and the convenience of charging of battery in the communication equipment receive more and more attention from the consumer. At present, the wired plug-in type charging mode is poor in experience, and frequent plugging can cause the wearing of a plug interface and reduce the charging rate; the wireless charging module adopts non-plug-in type contact charging, has the advantages of convenience and safety, and is a charging mode with a wide development prospect at present.

At present, LCR (liquid Crystal display) testing is the main method for carrying out functional testing on the wireless charging FPC by FPC manufacturers, and because the starting of the wireless charging FPC product is late, single products are mainly placed into a testing jig manually at present, and LCR testing is carried out through an LCR tester. However, due to the transmission loss of the testing equipment and the influence of the power signal interference, the situation of erroneous determination caused by data abnormality is easy to occur, and therefore, the accuracy of the LCR test still needs to be improved.

Disclosure of Invention

In view of this, the present application provides an LCR testing apparatus, which can improve the accuracy of LCR testing, and solve the above-mentioned problems.

The embodiment of the application provides an LCR testing arrangement, includes:

the test jig is used for positioning a product and comprises an upper die and a lower die, and probes are respectively arranged on the upper die and the lower die;

the LCR tester is electrically connected with the test frame and used for testing the test parameters of the product; and

and the first optical coupling isolation plate is electrically connected between the test frame and the LCR tester.

In one embodiment, the test rack further comprises an output port, and the output port is electrically connected with the LCR tester through a parallel data line;

the length of the parallel data lines is less than or equal to 1.5 meters.

In one embodiment, the probe is a high frequency probe; the output port is a gold-plated SMA standard interface.

In one embodiment, the LCR testing device further comprises an automaton, the automaton comprises a power supply and a control module, and the testing frame and the LCR tester are electrically connected with the power supply and the control module;

the LCR testing device further comprises a second optical coupling isolation plate, and the second optical coupling isolation plate is electrically connected between the power supply and control module and the testing frame.

In one embodiment, the automatic machine further comprises a lifting mechanism electrically connected with the power supply and control module, and the lifting mechanism is connected with the upper die and used for driving the upper die to lift and lower so that the upper die and the lower die are matched.

In an embodiment, the automaton further comprises a test platform and a translation mechanism which is arranged on the test platform and electrically connected with the power supply and the control module, wherein the translation mechanism is connected with a lower die of the test frame and used for driving the lower die to move in a direction parallel to the test platform.

In one embodiment, the robot further comprises a first guide rail disposed on the testing platform and extending along a first direction, and the translation mechanism is slidably connected to the first guide rail.

In an embodiment, the LCR testing apparatus further includes a data processor, where the data processor is configured to receive test data sent by the LCR tester, determine whether the test parameters of the product are qualified according to the test data, and output a control signal.

In one embodiment, the automatic machine further comprises a transfer mechanism arranged on the test platform, and the transfer mechanism is used for grabbing and transferring the product; the transfer mechanism is provided with a visual sensor, and the visual sensor is used for identifying the product and acquiring the position of the product.

In an embodiment, the automaton further comprises a to-be-tested article placing table arranged on the test platform, and a defective article placing table and a non-defective article placing table which are arranged adjacently;

the test platform is provided with a second guide rail and a third guide rail which are perpendicular to the first guide rail, the transfer mechanism comprises a feeding transfer piece and a discharging transfer piece, and the feeding transfer piece is connected to the second guide rail in a sliding mode and used for placing a product on the to-be-tested product placing table on the lower die; the blanking transfer piece is connected to the third guide rail in a sliding mode and used for placing products in the lower die on the good product placing table or the defective product placing table according to the control signals.

Above-mentioned LCR testing arrangement is because first opto-coupler isolator electric connection is between test jig and LCR tester, and first opto-coupler isolator can keep apart the signal that has the interference to LCR tester output signal, and then promotes measuring accuracy. Therefore, the LCR testing device is high in measurement accuracy, and misjudgment of products caused by data deviation is avoided.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without inventive exercise.

FIG. 1 is a schematic structural diagram of an LCR testing apparatus provided in an embodiment of the present application;

FIG. 2 is a schematic diagram of a portion of the structure of the LCR test apparatus shown in FIG. 1;

FIG. 3 is a schematic diagram of a testing jig, a lifting mechanism, a translation mechanism, and an LCR tester of the LCR testing apparatus according to an embodiment of the present application.

The designations in the figures mean:

100. an LCR testing device 100;

10. a test jig; 11. an upper die; 12. a lower die; 13. a probe; 14. an output port;

20. an LCR tester;

31. a first opto-isolator plate; 32. parallel data lines; 33. a second optically coupled isolator plate;

40. an automaton; 41. a power supply and control module; 42. a lifting mechanism; 421. a lifting drive member; 422. a lifting platform; 423. buckling; 43. a translation mechanism; 44. a first guide rail; 45. a transfer mechanism; 451. a feeding transfer member; 452. blanking transfer pieces; 46. a visual sensor; 47. a second guide rail; 48. a third guide rail;

50. a data processor;

61. placing a to-be-detected article on a platform; 62. a defective product placing table; 63. and (5) placing a good product placing table.

Detailed Description

In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be described in further detail below with reference to the accompanying drawings, which are examples. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.

It will be understood that when an element is referred to as being "secured to" or "disposed on" another element, it can be directly or indirectly secured to the other element. When an element is referred to as being "connected to" another element, it can be directly or indirectly connected to the other element. The terms "upper", "lower", "left", "right", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description, and do not indicate or imply that the referred devices or elements must have a specific orientation, be constructed and operated in a specific orientation, and thus, are not to be construed as limiting the patent. The terms "first", "second" and "first" are used merely for descriptive purposes and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features. The meaning of "plurality" is two or more unless specifically limited otherwise.

To illustrate the technical solution of the present invention, the following description is made with reference to the specific drawings and examples.

Referring to fig. 1 and fig. 2, an embodiment of the present application provides an LCR testing apparatus 100 for testing parameters of a product. In this embodiment, the product is a wireless charging FPC, but is not limited thereto, and the product may also be other elements.

The LCR test apparatus 100 includes a test jig 10, an LCR tester 20, and a first optically coupled isolator plate 31.

The test jig 10 is used for positioning a product, the test jig 10 comprises an upper die 11 and a lower die 12, and probes 13 are respectively arranged on the upper die 11 and the lower die 12. The probe 13 of the upper die 11 is a transfer probe, the probe 13 of the lower die 12 is a test probe, and the probes 13 of the upper die 11 and the lower die 12 contact a product together to form a test loop.

The LCR tester 20 is electrically connected to the test rack 10 and is used to test the test parameters of the product. The test parameter may be one or more of inductance, capacitance, resistance.

The first optical coupler isolation plate 31 is electrically connected between the test rack 10 and the LCR tester 20, and is used for isolating interference of a power supply and a control signal of the test rack 10 on an output signal of the LCR tester 20, and improving the accuracy of measurement.

The testing process of the LCR testing apparatus 100 of the above embodiment is as follows: the test jig 10 positions a product to be tested, and the probe 13 of the upper die 11 and the probe 13 of the lower die 12 simultaneously contact a part to be tested of the product to form a test loop; the LCR tester 20 acquires a test signal of the product through the test rack 10 and outputs test data.

Because the first optical coupler isolator 31 is electrically connected between the test jig 10 and the LCR tester 20, the first optical coupler isolator 31 can isolate the interference of a power supply, a control signal and other signals to the output signal of the LCR tester 20, and further improve the accuracy of measurement. Therefore, the LCR testing apparatus 100 has high measurement accuracy, and avoids erroneous judgment of products due to data deviation.

In one embodiment, the test rack 10 further includes an output port 14, the output port 14 being electrically connected to the LCR tester 20 via a parallel data line 32.

Preferably, the length of the parallel data lines 32 is less than or equal to 1.5 meters. The parallel data lines 32 have a shielding function, and the length of the parallel data lines 32 is controlled within 1.5 m, so that the influence of the parallel data lines 32 on resistance and inductance can be reduced.

Preferably, the output port 14 is a gold-plated SMA standard interface, so as to further reduce the influence of resistance and inductance.

In one embodiment, the probe 13 is a high frequency probe. Specifically, the probe 13 may be made of gold-plated brass nickel, and fixed on the testing jig 10 in a soldering manner, so that compared with a common copper-plated brass probe, the resistance and the contact resistance of the probe during testing can be better reduced, and the influence on the testing accuracy is reduced.

In one embodiment, the LCR testing apparatus 100 further comprises a robot 40, the robot 40 comprises a power supply and control module 41, and the test rack 10 and the LCR tester 20 are electrically connected to the power supply and control module 41. The power and control module 41 is used to provide power to the LCR testing apparatus 100 and to control the various modules.

The LCR testing apparatus 100 further includes a second optical isolator plate 33, wherein the second optical isolator plate 33 is electrically connected between the power and control module 41 and the testing jig 10. The second optical coupling isolation plate 33 is used for isolating interference of a power supply and a control signal of the automaton 40 to an output signal of the LCR tester 20, and the accuracy of measurement is further improved.

In one embodiment, the LCR testing apparatus 100 further includes a data processor 50, and the data processor 50 is configured to receive the test data from the LCR tester 20, determine whether the test parameters of the product are qualified according to the test data, and output a control signal and a determination instruction.

Preferably, the LCR testing apparatus 100 further includes a display screen connected to the data processor 50, and the display screen receives the test data and the judgment instruction for the product test from the data processor 50. When the data processor 50 judges that the product is qualified, the data processor 50 sends out a qualified instruction, and the display screen displays that the product is in an 'OK' state; when the data processor 50 judges that the product is unqualified, the data processor 50 sends an unqualified instruction, and the display screen displays that the product is in an NG state. Therefore, the LCR testing apparatus 100 can process the test data in real time through the data processor 50 and display the test data and the test result through the display screen, which is convenient to use.

Referring to fig. 1 to fig. 3, in an embodiment, the automatic machine 40 further includes a lifting mechanism 42 electrically connected to the power supply and control module 41, and the lifting mechanism 42 is connected to the upper mold 11 and is configured to drive the upper mold 11 to lift and lower so as to open or close the upper mold 11 and the lower mold 12.

The lifting mechanism 42 includes a lifting driving member 421 and a lifting platform 422 connected to each other, wherein the lifting driving member 421 may be a driving member such as a cylinder or a ball screw, but is not limited thereto. The lifting platform 422 is connected to the upper mold 11 of the testing jig 10, in this embodiment, a buckle 423 is disposed on the lifting platform 422, and the buckle 423 is used for clamping the upper mold 11, it can be understood that the buckle 423 may be replaced by other fixing members. Because the lifting mechanism 42 can drive the upper die 11 to lift, so as to realize automatic die assembly or die opening, manual die assembly is not needed, and the automation degree and the testing efficiency of the test are improved.

In one embodiment, the robot 40 further includes a testing platform, and a translation mechanism 43 disposed on the testing platform and electrically connected to the power supply and control module 41, wherein the translation mechanism 43 is connected to the lower mold 12 of the testing jig 10 for driving the lower mold 12 to move in a direction parallel to the testing platform.

In this embodiment, the translation mechanism 43 includes a slide platform on which the lower mold 12 is disposed. The translation mechanism 43 further includes a translation driving member (not shown) for driving the sliding platform to move, and the translation driving member may be, but not limited to, an air cylinder, a ball screw, etc. So, translation mechanism 43 can drive lower mould 12 and remove to in lower mould 12 is put into with the product that awaits measuring, or remove the unloading platform with the product after the test, promoted efficiency of software testing.

Preferably, robot 40 further includes a first rail 44 disposed on the test platform and extending in a first direction, and translation mechanism 43 is slidably coupled to first rail 44. The first guide rail 44 is used to guide the movement of the translation mechanism 43 to improve the movement accuracy of the lower die 12. The lower part of the translation mechanism 43 can be connected with the first guide rail 44 in a sliding way through a guide rail sliding block.

Robot 40 also includes a transfer mechanism 45 disposed on the test platform, transfer mechanism 45 being configured to grasp and transfer the product. In the present embodiment, the transfer mechanism 45 is a double-row air plate swing arm with a suction cup, but the present invention is not limited thereto, and the transfer mechanism 45 may be a robot or the like. The transfer mechanism 45 is capable of placing a product into the lower die 12 or removing a product from the lower die 12.

The transfer mechanism 45 is provided with a visual sensor 46, and the visual sensor 46 is used for identifying the product and acquiring the position of the product. The visual sensor 46 may be a CCD camera, but is not limited thereto, and the visual sensor 46 may also be a CMOS or other visual sensing element. In this embodiment, the visual sensor 46 is capable of identifying a mark (mark) on the product to obtain product information; the visual sensor 46 can also acquire the position of the product to enable the transfer mechanism 45 to accurately grasp the product. Further, the visual sensor 46 can also obtain the placing direction of the product, so that the transferring mechanism 45 can rotate the product as required and then place the product into the lower mold 12.

In one embodiment, the automatic machine 40 further includes a to-be-tested article placing table 61 disposed on the testing platform, and a defective article placing table 62 and a good article placing table 63 disposed adjacent to each other.

A second guide rail 47 and a third guide rail 48 which are perpendicular to the first guide rail 44 are arranged on the test platform, the transfer mechanism 45 comprises a feeding transfer piece 451 and a discharging transfer piece 452, and the feeding transfer piece 451 is connected to the second guide rail 47 in a sliding manner and used for placing a product on the to-be-tested product placing table 61 on the lower die 12; the blanking transfer member 452 is slidably connected to the third guide rail 48, and is configured to place the product in the lower mold 12 on the defective product placement table 62 or the good product placement table 63 according to a control signal.

Specifically, a test position, a feeding position and a discharging position are arranged on the first guide rail 44, the upper die 11 is arranged above the test position, the feeding position is arranged at a position of the first guide rail 44 corresponding to the second guide rail 47, and the discharging position is arranged at a position of the first guide rail 44 corresponding to the third guide rail 48. The feeding transfer member 451 reciprocates between the test object placing table 61 and the feeding level; the blanking transfer member 452 moves between the blanking position, defective product placement table 62, and good product placement table 63. The defective product placement table 62 and the good product placement table 63 may be provided on both sides of the third guide rail 48, respectively, or may be provided on the same side of the third guide rail 48 in sequence.

So, this LCR testing arrangement 100 can realize automatic feeding, automatic test and categorised unloading, and degree of automation is higher.

It will be appreciated that the transfer mechanism 45 may also comprise only one transfer member and that the third rail 48 may be omitted, in which case the feeding and discharging is effected by means of one transfer member.

It will be appreciated that when the transfer mechanism 45 is a robot, both the second rail 47 and the third rail 48 may be omitted.

It is understood that the translation mechanism 43 may also be a two-dimensional translation mechanism 43, in which case the translation mechanism 43 can drive the lower mold 12 to move in two vertical directions,

the LCR test apparatus 100 of the above embodiment is tested as follows.

Firstly, a product is placed in a to-be-detected product placing table 61, and the product can be placed in a plastic suction box; the feeding transfer piece 451 moves to the position of the placing table 61 of the article to be measured, the visual identifier identifies the article and obtains the position information of the article, then the feeding moving assembly grabs the article and moves along the second guide rail 47, and the article is placed in the lower die 12 at the feeding position; the translation mechanism 43 drives the lower die 12 to move to a position to be tested, the lifting mechanism 42 drives the upper die 11 to move towards the lower die 12, so that the upper die 11 and the lower die 12 are matched, and the probe 13 of the upper die 11, the product and the probe 13 of the lower die 12 form a test loop.

Next, the test is started, and the LCR tester 20 receives the test signal output from the test rack 10 and generates test data, and then transmits the test data to the data processor 50. The data processor 50 judges whether the test data is qualified, outputs a qualified instruction or an unqualified instruction to the display screen, and outputs a control signal to the transfer mechanism 45; the display screen displays the detection state of the product.

Then, the lifting mechanism 42 drives the upper mold 11 away from the lower mold 12, and the translation mechanism 43 drives the lower mold 12 to move along the first guide rail 44 to the discharging position. The transfer mechanism 45 picks up the product in the lower mold 12 and moves along the third guide rail 48, and places the product in the tested product stand or the defective product stand according to the control signal.

The LCR testing device 100 is provided with the first optical coupler isolation plate 31 between the testing jig 10 and the LCR tester 20, so that interference of a power supply and other signals to output signals of the LCR tester 20 can be isolated, and data fluctuation is avoided, therefore, the LCR testing device 100 has high testing precision.

Further, the LCR testing apparatus 100 is provided with the second optical coupler isolation plate 33 between the testing jig 10 and the power supply and control module 41, so that the isolation effect of signals can be further improved, and the testing accuracy is further improved. Meanwhile, the LCR testing device 100 comprises the automatic machine 40, the automatic machine 40 comprises the lifting mechanism 42, the translation mechanism 43 and the transfer mechanism 45, automatic product transfer and automatic die assembly can be achieved, the automation degree is improved, the testing efficiency is further improved, and the testing cost is reduced.

The above embodiments are only used to illustrate the technical solutions of the present application, and not to limit the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not substantially depart from the spirit and scope of the embodiments of the present application and are intended to be included within the scope of the present application.

Claims

1. An LCR testing device, comprising:

2. The LCR testing apparatus of claim 1, wherein the test rack further comprises an output port electrically connected to the LCR tester by parallel data lines;

the length of the parallel data lines is less than or equal to 1.5 meters.

3. An LCR test device according to claim 2 wherein the probe is a high frequency probe; the output port is a gold-plated SMA standard interface.

4. The LCR testing apparatus of claim 1, further comprising a robot comprising a power supply and a control module, the test rack, the LCR tester both electrically connected to the power supply and the control module;

5. An LCR testing apparatus according to claim 4 wherein the robot further comprises a lift mechanism electrically connected to the power and control module, the lift mechanism being connected to the upper mold and adapted to move the upper mold up and down to open or close the upper and lower molds.

6. An LCR testing device according to claim 5 wherein the robot further comprises a testing platform and a translation mechanism disposed on the testing platform and electrically connected to the power supply and control module, the translation mechanism being connected to the lower mold of the testing jig for driving the lower mold to move in a direction parallel to the testing platform.

7. An LCR testing device according to claim 6 wherein the robot further comprises a first rail disposed on the testing platform and extending in a first direction, the translation mechanism being slidably connected to the first rail.

8. The LCR test apparatus of claim 7, wherein the LCR test apparatus further comprises a data processor, the data processor is configured to receive the test data from the LCR tester, determine whether the test parameters of the product are acceptable according to the test data, and output a control signal.

9. An LCR testing device according to claim 8 wherein the robot further comprises a transfer mechanism on the test platform for grasping and transferring a product;

the transfer mechanism is provided with a visual sensor, and the visual sensor is used for identifying the product and acquiring the position of the product.

10. The LCR testing device according to claim 9, wherein the automaton further comprises a placing table for the object to be tested, and a placing table for the defective object and a placing table for the good object, which are adjacently arranged;

the test platform is provided with a second guide rail and a third guide rail which are perpendicular to the first guide rail, the transfer mechanism comprises a feeding transfer piece and a discharging transfer piece, and the feeding transfer piece is connected to the second guide rail in a sliding mode and used for placing a product on the to-be-tested product placing table on the lower die; the blanking transfer piece is connected to the third guide rail in a sliding mode and used for placing the products in the lower die on the good product placing table or the defective product placing table according to the control signals.