CN205199969U - Can realize automatic classification's after chip testing test equipment - Google Patents
Can realize automatic classification's after chip testing test equipment Download PDFInfo
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- CN205199969U CN205199969U CN201520855796.9U CN201520855796U CN205199969U CN 205199969 U CN205199969 U CN 205199969U CN 201520855796 U CN201520855796 U CN 201520855796U CN 205199969 U CN205199969 U CN 205199969U
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Abstract
The utility model provides a can realize automatic classification's after chip testing test equipment, relate to chip testing technical field, its structure includes the chip sequencer, install the computer of testing software and be used for realizing the single -chip control circuit and the RS232 serial ports logic level converting circuit of the conversion between RS232 signal and the TLL signal, the chip being location signal output of chip sequencer is connected with single -chip control circuit's chip being location signal receiving terminal electricity, single -chip control circuit's test signal output with RS232 serial ports logic level converting circuit's the first signal input electricity is connected, RS232 serial ports logic level converting circuit's the first signal output is connected with the test input of computer electricity, the test result output of computer is connected with single -chip control circuit's test result signal reception end electricity, single -chip control circuit's test result signal output part is connected with the test result receiving terminal of chip sequencer electricity, can supply softwareengineer to compile realizes the direct communication of testing software (computer end) and chip sequencer behind the software.
Description
Technical field
The utility model relates to chip testing technology field, particularly relates to a kind of testing equipment realizing automatic classification after chip testing.
Background technology
General chip all will carry out Performance Detection before dispatching from the factory, and the chip of requirement up to specification just can carry out packaging and dispatch from the factory.In prior art, the artificial mode of general employing is detected to chip, chip is manually put into test bench by staff, test chip requirement up to specification, then chip is put into non-defective unit district, the requirement if test chip falls short of specifications, then chip is put into defective products district, separated by the chip fallen short of specifications with this, the operating efficiency of this mode is lower.
Because the interface of testing software (computer end) allows the signal of communication to be RS232 signal (i.e. serial data interface), the interface of chip sorting machine allows the signal of communication to be TTL signal (i.e. parallel data grabbing card), therefore, testing software cannot with chip sorting machine Direct Communication, therefore, there is certain difficulty in the automatic detection and the automatic classification that want to realize chip.
Utility model content
The purpose of this utility model is to avoid weak point of the prior art and provides a kind of testing equipment realizing automatic classification after chip testing, realize the Direct Communication between testing software (computer terminal) and chip sorting machine after the testing equipment of automatic classification can write software for software engineer after this can realize chip testing, and then the automatic classification after chip testing can be realized.
The purpose of this utility model is achieved through the following technical solutions:
A kind of testing equipment realizing automatic classification after chip testing is provided, comprise computer and chip sorting machine, computer is equipped with testing software, chip sorting machine comprises at least one test station, chip sorting machine is for placing chip to be tested and being classified by the chip tested, it is characterized in that: also comprise Signal transmissions plate, described Signal transmissions plate comprises single chip machine controlling circuit for realizing the conversion between RS232 signal and ttl signal and RS232 serial port logic level shifting circuit, the chip of described chip sorting machine signal output part and the chip of the single chip machine controlling circuit signal receiving end that puts in place that puts in place is electrically connected, the test signal output of single chip machine controlling circuit is electrically connected with the first signal input part of described RS232 serial port logic level shifting circuit, first signal output part of RS232 serial port logic level shifting circuit is electrically connected with the test input of computer, the test result output of computer is electrically connected with the test result signal receiving end of single chip machine controlling circuit, the test result signal output part of single chip machine controlling circuit is electrically connected with the test result receiving terminal of chip sorting machine.
Signal isolation circuit is provided with between the signal input side of described chip sorting machine and single chip machine controlling circuit.
Described signal isolation circuit comprises photoelectrical coupler.
Buffering driver is provided with between the signal outlet side of described single chip machine controlling circuit and described chip sorting machine.
Described buffering driver comprises the chip that model is 7407.
Described RS232 serial port logic level shifting circuit comprises the chip that model is MAX232.
Described single chip machine controlling circuit is connected with the first socket, described first socket and sorting chips mechatronics.
Described first socket comprises 50 pins.
Described RS232 serial port logic level shifting circuit is connected with the second socket, and described second socket is electrically connected with computer.
Described second socket comprises nine pins.
The beneficial effects of the utility model: the connection of the utility model by utilizing Signal transmissions plate to realize between computer and chip sorting machine, because Signal transmissions plate adopts chip microcontroller, and the RS232 level that the TLL level (being generally 0 to+5V) that single-chip microcomputer exports can receive with computer (being generally-10V to+10V) does not conform to, the TLL level conversion that therefore single-chip microcomputer can be exported by RS232 serial port logic level shifting circuit is the RS232 level that computer can receive, because single chip machine controlling circuit can realize the conversion between RS232 signal and ttl signal, therefore, Signal transmissions plate of the present utility model realizes the Direct Communication between testing software (computer terminal) and chip sorting machine after can writing software for software engineer, and then the automatic classification that can realize after chip testing, and then enhance productivity.
Accompanying drawing explanation
Accompanying drawing is utilized to be described further utility model, but the embodiment in accompanying drawing does not form any restriction of the present utility model, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to the following drawings.
Fig. 1 is a kind of using state figure realizing the testing equipment of automatic classification after chip testing of the present utility model.
Fig. 2 is a kind of circuit diagram realizing the testing equipment of automatic classification after chip testing of the present utility model.
Fig. 3 is the structural representation of the patchcord JP1 of embodiment.
Detailed description of the invention
With the following Examples the utility model is further described.
The present embodiment a kind of realizes the testing equipment of automatic classification after chip testing, as shown in Figure 1, comprise computer and chip sorting machine, computer is equipped with testing software, chip sorting machine comprises at least one test station, chip sorting machine is for placing chip to be tested and being classified by the chip tested, it is characterized in that: also comprise Signal transmissions plate, described Signal transmissions plate comprises single chip machine controlling circuit for realizing the conversion between RS232 signal and ttl signal and RS232 serial port logic level shifting circuit, the chip of described chip sorting machine signal output part and the chip of the single chip machine controlling circuit signal receiving end that puts in place that puts in place is electrically connected, the test signal output of single chip machine controlling circuit is electrically connected with the first signal input part of described RS232 serial port logic level shifting circuit, first signal output part of RS232 serial port logic level shifting circuit is electrically connected with the test input of computer, the test result output of computer is electrically connected with the test result signal receiving end of single chip machine controlling circuit, the test result signal output part of single chip machine controlling circuit is electrically connected with the test result receiving terminal of chip sorting machine.
The connection of the present embodiment by utilizing Signal transmissions plate to realize between computer and chip sorting machine, because Signal transmissions plate adopts chip microcontroller, and the RS232 level that the TLL level (being generally 0 to+5V) that single-chip microcomputer exports can receive with computer (being generally-10V to+10V) does not conform to, the TLL level conversion that therefore single-chip microcomputer can be exported by RS232 serial port logic level shifting circuit is the RS232 level that computer can receive, because single chip machine controlling circuit can realize the conversion between RS232 signal and ttl signal, therefore, the Signal transmissions plate of the present embodiment realizes the Direct Communication between testing software (computer terminal) and chip sorting machine after can writing software for software engineer, and then the automatic classification that can realize after chip testing, and then enhance productivity.
In Fig. 1, SOT, for starting test signal, is sent by chip sorting machine, has been in place, can starts test by the testing software chip under test of Signal transmissions plate notice computer; EOT is test settling signal, issues chip sorting machine by testing software, and notice chip sorting machine chip under test has been tested; BIN signal represents test result, issues chip sorting machine by testing software by Signal transmissions plate.General BIN1 represents that test result is passed through (PASS), and other BIN represents dissimilar test not by the result of (FAIL).
Concrete, as shown in Figure 2, the Signal transmissions plate of the present embodiment is for having the chip sorting machine of four test station.
This signal detection transmission board comprises single chip machine controlling circuit and RS232 serial port logic level shifting circuit.
The level EIA-RS-232C of RS232 serial port logic level shifting circuit: standard RS232 has made regulation to the opering characteristic of electric apparatus, logic level and various holding wire function.On TxD and RxD: logical one (MARK)=-3V ~-15V, logical zero (SPACE)=+ 3 ~+15V, on the control lines such as RTS, CTS, DSR, DTR and DCD: signal effectively (is connected, ON state, positive voltage)=+ 3V ~+15V, invalidating signal (disconnecting, OFF state, negative voltage)=-3V ~-15V.
Because computer serial port RS232 level is-10V to+10V, and the signal voltage of general scm application system be Transistor-Transistor Logic level 0 to+5V, the model in circuit is that the chip U2 of MAX232 is just used to carry out level conversion.
Single chip machine controlling circuit: single-chip processor i/o mouth P3.0, P3.1 are connected with MAX232 chip pin 12,11 respectively, single-chip microcomputer receives the test result that sends of testing software by P3.0, P3.1 mouth and sends test command to testing software, BIN and EOT signal is sent to classifier by P0, P1, P3.4, P3.5, P3.6, P3.7, P2.0, P2.1, P2.2, P2.3 mouth for judging that chip sorting machine sends SOT signal, corresponding chip Site1, Site2, Site3 and Site4.
The operation principle of this circuit: the first socket J1 of 50 pins connects chip sorting machine, chip sorting machine installs chip after test bench, sends SOT signal (SOT1, SOT2, SOT3, SOT4 represents the chip situation of a test station respectively, ) to the photocoupler set IC6 of Signal transmissions plate (Low level effective), carry out signal isolation, receive the I/O mouth (P2.0 of single-chip microcomputer U1 again, P2.1, P2.2, P2.3), the test command of corresponding test station is exported rs 232 serial interface signal to chip U2(level switch module MAX323 by pin P3.1 by single-chip microcomputer U1) carry out level conversion (because computer serial port RS232 level is-10v+10v, and the signal voltage of general scm application system is Transistor-Transistor Logic level 0+5v, in circuit, model is that the chip U2 of MAX232 is just used to carry out level conversion), chip U2 connects computer by the second socket J3 of nine pins again, testing software on computer starts test, test result order is converted into the pin P3.0 that BIN signal and EOT signal export single-chip microcomputer U1 to and is received by single-chip microcomputer U1 by testing software again, single-chip microcomputer U1 is again by pin P0, P1, P3.4, P3.5, P3.6, P3.7 sends BIN and EOT signal to chip sorting machine, chip sorting machine is classified to chip according to the test result of chip.
The voltage exported due to single chip machine controlling circuit is stable not, be provided with buffering driver (as the chip IC 1 of Fig. 2, chip IC 2, chip IC 3 and chip IC 4) between the signal outlet side of described single chip machine controlling circuit and described chip sorting machine, the model of described chip IC 1, chip IC 2, chip IC 3 and chip IC 4 is all 7407.
Because notebook computer directly can not be connected with the Signal transmissions plate of the present embodiment, notebook computer cannot be utilized to carry out burning program to the single-chip microcomputer of Signal transmissions plate, therefore patchcord JP1 can be adopted to realize notebook computer be directly connected with the Signal transmissions plate of the present embodiment, facilitate during burning program and use notebook computer.
Finally should be noted that; above embodiment is only in order to illustrate the technical solution of the utility model; but not the restriction to the utility model protection domain; although done to explain to the utility model with reference to preferred embodiment; those of ordinary skill in the art is to be understood that; can modify to the technical solution of the utility model or equivalent replacement, and not depart from essence and the scope of technical solutions of the utility model.
Claims (10)
1. one kind can realize the testing equipment of automatic classification after chip testing, comprise computer and chip sorting machine, computer is equipped with testing software, chip sorting machine comprises at least one test station, chip sorting machine is for placing chip to be tested and being classified by the chip tested, it is characterized in that: also comprise Signal transmissions plate, described Signal transmissions plate comprises single chip machine controlling circuit for realizing the conversion between RS232 signal and ttl signal and RS232 serial port logic level shifting circuit, the chip of described chip sorting machine signal output part and the chip of the single chip machine controlling circuit signal receiving end that puts in place that puts in place is electrically connected, the test signal output of single chip machine controlling circuit is electrically connected with the first signal input part of described RS232 serial port logic level shifting circuit, first signal output part of RS232 serial port logic level shifting circuit is electrically connected with the test input of computer, the test result output of computer is electrically connected with the test result signal receiving end of single chip machine controlling circuit, the test result signal output part of single chip machine controlling circuit is electrically connected with the test result receiving terminal of chip sorting machine.
2. a kind of testing equipment realizing automatic classification after chip testing as claimed in claim 1, is characterized in that: be provided with signal isolation circuit between the signal input side of described chip sorting machine and single chip machine controlling circuit.
3. a kind of testing equipment realizing automatic classification after chip testing as claimed in claim 2, is characterized in that: described signal isolation circuit comprises photoelectrical coupler.
4. a kind of testing equipment realizing automatic classification after chip testing as claimed in claim 1, is characterized in that: be provided with buffering driver between the signal outlet side of described single chip machine controlling circuit and described chip sorting machine.
5. a kind of testing equipment realizing automatic classification after chip testing as claimed in claim 4, is characterized in that: described buffering driver comprises the chip that model is 7407.
6. a kind of testing equipment realizing automatic classification after chip testing as claimed in claim 1, is characterized in that: described RS232 serial port logic level shifting circuit comprises the chip that model is MAX232.
7. a kind of testing equipment realizing automatic classification after chip testing as claimed in claim 1, is characterized in that: described single chip machine controlling circuit is connected with the first socket, described first socket and sorting chips mechatronics.
8. a kind of testing equipment realizing automatic classification after chip testing as claimed in claim 7, is characterized in that: described first socket comprises 50 pins.
9. a kind of testing equipment realizing automatic classification after chip testing as claimed in claim 1, is characterized in that: described RS232 serial port logic level shifting circuit is connected with the second socket, and described second socket is electrically connected with computer.
10. a kind of testing equipment realizing automatic classification after chip testing as claimed in claim 9, is characterized in that: described second socket comprises nine pins.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520855796.9U CN205199969U (en) | 2015-10-30 | 2015-10-30 | Can realize automatic classification's after chip testing test equipment |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201520855796.9U CN205199969U (en) | 2015-10-30 | 2015-10-30 | Can realize automatic classification's after chip testing test equipment |
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| CN205199969U true CN205199969U (en) | 2016-05-04 |
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110320427A (en) * | 2018-03-28 | 2019-10-11 | 北京君正集成电路股份有限公司 | Chip detecting method and device |
| CN110320459A (en) * | 2018-03-28 | 2019-10-11 | 北京君正集成电路股份有限公司 | Chip automated testing method and device |
| CN110320458A (en) * | 2018-03-28 | 2019-10-11 | 北京君正集成电路股份有限公司 | Automate chip test system |
| CN110320457A (en) * | 2018-03-28 | 2019-10-11 | 北京君正集成电路股份有限公司 | Chip grabs control method and device |
| CN111044883A (en) * | 2019-12-30 | 2020-04-21 | 深圳佰维存储科技股份有限公司 | DDR test system and DDR test method |
| CN111346845A (en) * | 2020-03-18 | 2020-06-30 | 广东利扬芯片测试股份有限公司 | Chip testing method and chip testing system |
| CN112474432A (en) * | 2020-10-19 | 2021-03-12 | 深圳市景旺电子股份有限公司 | LCR testing arrangement |
-
2015
- 2015-10-30 CN CN201520855796.9U patent/CN205199969U/en active Active
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110320427A (en) * | 2018-03-28 | 2019-10-11 | 北京君正集成电路股份有限公司 | Chip detecting method and device |
| CN110320459A (en) * | 2018-03-28 | 2019-10-11 | 北京君正集成电路股份有限公司 | Chip automated testing method and device |
| CN110320458A (en) * | 2018-03-28 | 2019-10-11 | 北京君正集成电路股份有限公司 | Automate chip test system |
| CN110320457A (en) * | 2018-03-28 | 2019-10-11 | 北京君正集成电路股份有限公司 | Chip grabs control method and device |
| CN111044883A (en) * | 2019-12-30 | 2020-04-21 | 深圳佰维存储科技股份有限公司 | DDR test system and DDR test method |
| CN111346845A (en) * | 2020-03-18 | 2020-06-30 | 广东利扬芯片测试股份有限公司 | Chip testing method and chip testing system |
| CN112474432A (en) * | 2020-10-19 | 2021-03-12 | 深圳市景旺电子股份有限公司 | LCR testing arrangement |
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