TWI457533B - Surface decline measuring method and measuring equipment thereof - Google Patents

Surface decline measuring method and measuring equipment thereof Download PDF

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Publication number
TWI457533B
TWI457533B TW102100389A TW102100389A TWI457533B TW I457533 B TWI457533 B TW I457533B TW 102100389 A TW102100389 A TW 102100389A TW 102100389 A TW102100389 A TW 102100389A TW I457533 B TWI457533 B TW I457533B
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Taiwan
Prior art keywords
sinking
receiver
light source
rail
light
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TW102100389A
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Chinese (zh)
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TW201428228A (en
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Guan Wen Chen
Ta Wei Chen
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Wistron Corp
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Priority to TW102100389A priority Critical patent/TWI457533B/en
Priority to CN201310015835.XA priority patent/CN103913120A/en
Publication of TW201428228A publication Critical patent/TW201428228A/en
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Publication of TWI457533B publication Critical patent/TWI457533B/en

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表面下沈量量測方法及其量測設備Surface sinking measurement method and measuring device thereof

本發明係有關於一種表面下沈量量測方法,特別係有關於一種應用於快速檢測的表面下沈量量測方法。The invention relates to a method for measuring the amount of surface sinking, in particular to a method for measuring the amount of surface sinking applied to rapid detection.

在習知技術中,為了取得裝置(例如,伺服器主機)的機殼表面下沈量的資訊,一般以厚薄規搭配目測的方式進行量測,或者,以單點式數位電子量表進行量測。In the prior art, in order to obtain the information on the surface sinking amount of the device (for example, the server main body), the measurement is generally performed by using a thin gauge with a visual measurement, or by using a single-point digital electronic meter. Measurement.

以厚薄規搭配目測的方式進行量測,其準確性以及量測效率極差,無法有效量化及規範量測方法及準則,且測量結果無法數位化。The measurement with the thickness gauge and the visual inspection method has extremely poor accuracy and measurement efficiency, and cannot effectively quantify and standardize the measurement methods and criteria, and the measurement results cannot be digitized.

使用單點式數位電子量表測量下沉量,其優點為可以數位化測量結果,但是礙於此方法為單點式測量,若要將整體機殼下表面之下沉量測量完畢,所需時間相對較長。另外,單點式數位電子量表為接觸式量測儀器,故量表之接觸探頭有磨損之使用壽命問題。並且可能刮傷待測物表面。The use of a single-point digital electronic scale to measure the amount of sinking has the advantage of being able to digitize the measurement results, but because this method is a single-point measurement, it is necessary to measure the amount of the underlying surface of the entire chassis. The time is relatively long. In addition, the single-point digital electronic scale is a contact type measuring instrument, so the contact probe of the measuring meter has a wear life problem. And it may scratch the surface of the object to be tested.

一種表面下沈量量測設備,用以量測一裝置之一機殼表面的下沈量,包括一支撐架、一光源、一接收器以及一控制單元。支撐架支撐該裝置。光源提供一光線,其中,該光源位於一基準平面,該光線沿水平方向行進。接收器接收該光線,其中,該接收器位於該基準平面,當該裝置之該機殼表面的下沈量超過容許值時,該機殼表面與該基準平面發生干涉而阻礙該接收器接收該光線。控制單元耦接該接收器,該控制單元依據該接收器是否接收到該光線的結果,而判斷該裝置之該機殼表面是否存在下沈量超過容許值的情況。A surface sinking measuring device for measuring the amount of sinking of a surface of a casing, comprising a support frame, a light source, a receiver and a control unit. The support frame supports the device. The light source provides a light, wherein the light source is in a reference plane that travels in a horizontal direction. The receiver receives the light, wherein the receiver is located in the reference plane, and when the sinking amount of the casing surface of the device exceeds an allowable value, the casing surface interferes with the reference plane to prevent the receiver from receiving the light. Light. The control unit is coupled to the receiver, and the control unit determines whether the surface of the casing of the device has a sinking amount exceeding an allowable value according to whether the receiver receives the light.

應用本發明實施例之表面下沈量量測設備及所搭配的表面 下沈量量測方法,相較於單點式數位電子量表的量測方式,本發明實施例之表面下沈量量測方法可快速的檢知機殼表面下沈量,並且設備的損壞率極低。相較於以厚薄規搭配目測的量測方式,本發明實施例之表面下沈量量測方法可具體量化檢測結果,並可建立穩定的檢測步驟以及準則。因此,相較於習知技術,本發明實施例之表面下沈量量測方法提供了快速的檢測速度以及精確且穩定的量測結果。Surface sinking measuring device and surface matched with the embodiment of the invention The sinking amount measuring method can directly detect the sinking amount of the casing surface and the damage rate of the equipment is extremely low compared to the measuring method of the single-point digital electronic meter. Compared with the measurement method with the thick gauge and the visual inspection, the surface sinking measurement method of the embodiment of the present invention can specifically quantify the detection result, and can establish a stable detection step and a criterion. Therefore, the surface sinking measurement method of the embodiment of the present invention provides a fast detection speed and an accurate and stable measurement result as compared with the prior art.

1‧‧‧表面下沈量量測設備1‧‧‧Surface sinking measuring equipment

11‧‧‧支撐架11‧‧‧Support frame

111‧‧‧支撐部111‧‧‧Support

12‧‧‧光源12‧‧‧Light source

121‧‧‧光線121‧‧‧Light

13‧‧‧接收器13‧‧‧ Receiver

14‧‧‧第一導軌14‧‧‧First rail

15‧‧‧第二導軌15‧‧‧Second rail

2‧‧‧裝置2‧‧‧ device

21‧‧‧機殼表面21‧‧‧Shell surface

22‧‧‧凸耳22‧‧‧ lugs

第1圖係顯示以本發明實施例之表面下沈量量測設備,量測一裝置之機殼表面下沈量,其中,該裝置之該機殼表面的下沈量超過容許值; 第2圖係顯示以本發明實施例之表面下沈量量測設備,量測一裝置之機殼表面下沈量,其中,該裝置之該機殼表面的下沈量未超過容許值; 第3圖係顯示以本發明實施例之表面下沈量量測設備的立體圖。1 is a view showing a surface sinking measuring device according to an embodiment of the present invention, measuring a surface sinking amount of a device, wherein a sinking amount of a surface of the device exceeds an allowable value; 2 is a view showing a surface sinking measuring device according to an embodiment of the present invention, measuring a surface sinking amount of a device, wherein a sinking amount of the surface of the device does not exceed an allowable value; Fig. 3 is a perspective view showing a surface sinking amount measuring apparatus according to an embodiment of the present invention.

參照第1、2以及3圖,其係顯示本發明實施例之表面下沈量量測設備1,其用以量測一裝置2之一機殼表面21(下表面)的下沈量。表面下沈量量測設備1包括一支撐架11、一光源12、一接收器13以及一控制單元(未圖示)。支撐架11支撐該裝置2。光源12提供一光線121,其中,該光源12位於一基準平面B,該光線121沿水平方向行進。接收器13接收該光線121,其中,該接收器13同樣位於該基準平面B。參照第1圖,當該裝置2之該機殼表面21的下沈量超過容許值時,該機殼表面21與該基準平面B發生干涉而阻礙該接收器13接收該光線121。參照第2圖,當該裝置2之該機殼表面21的下沈量未超過容許值時,該機殼表面21則不會與該基準平面B發生干涉,因而該接收器13接收到該光線121。控制單元耦接該接收器13,該控制單元依據該接收器13是否接收到該光線121的結果,而判斷該裝置2之該機殼表面21是否存在下沈量超過容許值的情況。如,在第1圖中,由於該接收器13未接收到光線121,因此可判斷該機殼表面21存在下沈量超過容許值的情況;在第2圖中,由於該接收器13接收到光線121,因此可判斷該機殼表面21在此偵測位置未存在下沈量超過容許值的情況。Referring to Figures 1, 2 and 3, there is shown a surface sinking amount measuring apparatus 1 according to an embodiment of the present invention for measuring the amount of sinking of a casing surface 21 (lower surface) of a device 2. The surface sinking measuring device 1 includes a support frame 11, a light source 12, a receiver 13, and a control unit (not shown). The support frame 11 supports the device 2. The light source 12 provides a light ray 121, wherein the light source 12 is located at a reference plane B that travels in a horizontal direction. The receiver 13 receives the light ray 121, wherein the receiver 13 is also located at the reference plane B. Referring to Fig. 1, when the amount of sinking of the casing surface 21 of the apparatus 2 exceeds an allowable value, the casing surface 21 interferes with the reference plane B to prevent the receiver 13 from receiving the light 121. Referring to Fig. 2, when the sinking amount of the casing surface 21 of the apparatus 2 does not exceed the allowable value, the casing surface 21 does not interfere with the reference plane B, and the receiver 13 receives the light. 121. The control unit is coupled to the receiver 13, and the control unit determines whether the chassis surface 21 of the device 2 has a sinking amount exceeding an allowable value according to whether the receiver 13 receives the light 121. For example, in FIG. 1, since the receiver 13 does not receive the light ray 121, it can be judged that the casing surface 21 has a sinking amount exceeding the allowable value; in the second figure, since the receiver 13 receives The light 121 can be judged that the casing surface 21 does not have a sinking amount exceeding the allowable value at the detected position.

搭配參照第3圖,在此實施例中,表面下沈量量測設備1更包括一第一導軌14以及一第二導軌15,該第一導軌14平行於該第二導軌15,該光源12設於該第一導軌14,該接收器13設於該第二導軌15。該光源12沿該第一導軌14於該基準平面B上移動,該接收器13於該第二導軌15上以對應該光源12的方式移動。藉此,可以提供單一維度的檢測,該控制單元依據該接收器13是否接收到該光線121的結果,而判斷該裝置2之該機殼表面21在單一維度上的何處存在下沈量超過容許值的情況。Referring to FIG. 3, in this embodiment, the surface sinking measuring device 1 further includes a first rail 14 and a second rail 15, the first rail 14 is parallel to the second rail 15, and the light source 12 is disposed on The first rail 14 is disposed on the second rail 15 . The light source 12 moves along the first guide rail 14 on the reference plane B. The receiver 13 moves on the second guide rail 15 in a manner corresponding to the light source 12. Thereby, a single dimension of detection can be provided, and the control unit determines, according to whether the receiver 13 receives the result of the light ray 121, where the shell surface 21 of the device 2 has a sinking amount exceeding a single dimension. The case of allowable values.

在此實施例中,該光源12為紅外線光源,其亦可以為其他型式的直線光源,例如雷射。在一實施例中,該光源12於該第一導軌14上係由步進馬達驅動,該接收器13於該第二導軌15上係由步進馬達驅動,控制單元耦接步進馬達。由於步進馬達具備行程編碼與回饋功能,因此控制單元可精確控制該光源12及該接收器13的位置,並依此判斷該裝置2之該機殼表面21在單一維度上的何處存在下沈量超過容許值的情況。In this embodiment, the light source 12 is an infrared light source, which may also be other types of linear light sources, such as lasers. In an embodiment, the light source 12 is driven by the stepping motor on the first rail 14, the receiver 13 is driven by the stepping motor on the second rail 15, and the control unit is coupled to the stepping motor. Since the stepping motor has a stroke encoding and feedback function, the control unit can precisely control the position of the light source 12 and the receiver 13, and thereby determine where the casing surface 21 of the device 2 exists in a single dimension. The case where the sinking amount exceeds the allowable value.

該裝置2包括二凸耳22,分別形成於該裝置2之相反的兩側。該支撐架11包括二支撐部111,該等支撐部111分別支撐該等凸耳22。在此實施例中,該等支撐部111為L型結構。應用凸耳的設計,可以避免支撐部與光源發生干涉,以確保偵測順利進行。The device 2 includes two lugs 22 formed on opposite sides of the device 2, respectively. The support frame 11 includes two support portions 111 that support the lugs 22, respectively. In this embodiment, the support portions 111 are L-shaped structures. The design of the lug prevents the support from interfering with the light source to ensure smooth detection.

在一實施例中,在經過一維偵測,取得該裝置2之該機殼表面21在單一維度上的下沈量資訊之後,可將裝置水平旋轉90度,再次由該光源12以及該接收器13對該機殼表面21進行另一維度的偵測,以取得該機殼表面21整體平面(二維)的機殼表面下沈量資訊。In an embodiment, after one-dimensional detection is performed to obtain the sinking amount information of the casing surface 21 of the device 2 in a single dimension, the device can be horizontally rotated by 90 degrees, and the light source 12 and the receiving source are again received. The device 13 performs another dimension detection on the surface 21 of the casing to obtain the information on the surface sinking amount of the entire plane (two-dimensional) of the casing surface 21.

在取得上述下沈量資訊之後,使用者可更依據裝置2內的電子元件配置情況,判斷是何電子元件造成下沈量超過容許值的問題。例如,若下沈量超過容許值的位置為電源供應器的設置位置,可據此判斷電源供應器的重量過重,需要考慮更換電源供應器,或重新調整電源供應器的擺放位置。After obtaining the above sinking amount information, the user can further determine the problem of the electronic component causing the sinking amount to exceed the allowable value according to the electronic component configuration in the device 2. For example, if the position where the sinking amount exceeds the allowable value is the setting position of the power supply, it can be judged that the power supply is too heavy, and it is necessary to consider replacing the power supply or re-adjusting the position of the power supply.

應用本發明實施例之表面下沈量量測設備及所搭配的表面下沈量量測方法,相較於單點式數位電子量表的量測方式,本發明實施例之表面下沈量量測方法可快速的檢知機殼表面下沈量,並且設備的損壞率極低。相較於以厚薄規搭配目測的量測方式,本發明實施例之表面下沈量 量測方法可具體量化檢測結果,並可建立穩定的檢測步驟以及準則。因此,相較於習知技術,本發明實施例之表面下沈量量測方法提供了快速的檢測速度以及精確且穩定的量測結果。According to the surface sinking measuring device and the surface sinking amount measuring method of the embodiment of the present invention, the surface sinking amount measuring method of the embodiment of the present invention can be quickly detected compared to the measuring method of the single-point digital electronic meter. It is known that the surface of the casing sinks and the damage rate of the equipment is extremely low. The surface sinking amount of the embodiment of the present invention is compared with the measuring method with the thickness gauge and the visual inspection. The measurement method can specifically quantify the detection results and establish stable detection steps and criteria. Therefore, the surface sinking measurement method of the embodiment of the present invention provides a fast detection speed and an accurate and stable measurement result as compared with the prior art.

本發明實施例之表面下沈量量測設備及所搭配的表面下沈量量測方法,可用於檢測電腦主機或伺服器主機等電子設備。在上述的電子設備檢測中,機殼表面下沈的情況並不是十分複雜,因此可透過本發明實施例之表面下沈量量測設備及所搭配的表面下沈量量測方法,快速檢查下沈量是否存在超過容許值的情況。The surface sinking measuring device and the method for measuring the surface sinking amount of the embodiment of the invention can be used for detecting electronic devices such as a computer host or a server host. In the above-mentioned electronic device detection, the case where the surface of the casing sinks is not very complicated, so that the surface sinking measuring device and the surface sinking amount measuring method according to the embodiment of the present invention can be used to quickly check whether the sinking amount exists. The case where the allowable value is exceeded.

雖然本發明已以具體之較佳實施例揭露如上,然其並非用以限定本發明,任何熟習此項技藝者,在不脫離本發明之精神和範圍內,仍可作些許的更動與潤飾,因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。Although the present invention has been described above in terms of the preferred embodiments thereof, it is not intended to limit the invention, and those skilled in the art can make some modifications and refinements without departing from the spirit and scope of the invention. Therefore, the scope of the invention is defined by the scope of the appended claims.

11‧‧‧支撐架11‧‧‧Support frame

12‧‧‧光源12‧‧‧Light source

121‧‧‧光線121‧‧‧Light

13‧‧‧接收器13‧‧‧ Receiver

14‧‧‧第一導軌14‧‧‧First rail

15‧‧‧第二導軌15‧‧‧Second rail

2‧‧‧裝置2‧‧‧ device

21‧‧‧機殼表面21‧‧‧Shell surface

22‧‧‧凸耳22‧‧‧ lugs

Claims (9)

一種表面下沈量量測設備,用以量測一裝置之一機殼表面的下沈量,包括:一支撐架,支撐該裝置;一光源,提供一光線,其中,該光源位於一基準平面,該光線沿水平方向行進;一接收器,接收該光線,其中,該接收器位於該基準平面,當該裝置之該機殼表面的下沈量超過容許值時,該機殼表面與該基準平面發生干涉而阻礙該接收器接收該光線;以及一控制單元,耦接該接收器,該控制單元依據該接收器是否接收到該光線的結果,而判斷該裝置之該機殼表面是否存在下沈量超過容許值的情況,其中,該裝置包括二凸耳,分別形成於該裝置之相反的兩側,該支撐架包括二支撐部,該等支撐部分別支撐該等凸耳。 A surface sinking measuring device for measuring a sinking amount of a surface of a casing of a device, comprising: a support frame supporting the device; a light source providing a light, wherein the light source is located on a reference plane, The light travels in a horizontal direction; a receiver receives the light, wherein the receiver is located in the reference plane, and when the sinking amount of the casing surface of the device exceeds an allowable value, the casing surface and the reference plane occur Interfering with the receiver to receive the light; and a control unit coupled to the receiver, the control unit determining whether the surface of the casing of the device has a sinking amount according to whether the receiver receives the light In the case where the allowable value is exceeded, the device includes two lugs which are respectively formed on opposite sides of the device, and the support frame includes two supporting portions, and the supporting portions respectively support the lugs. 如申請專利範圍第1項所述之表面下沈量量測設備,其更包括一第一導軌以及一第二導軌,該第一導軌平行於該第二導軌,該光源設於該第一導軌,該接收器設於該第二導軌,該光源沿該第一導軌於該基準平面上移動,該接收器於該第二導軌上以對應該光源的方式移動,該控制單元依據該接收器是否接收到該光線的結果,而判斷該裝置之該機殼表面的何處存在下沈量超過容許值的情況。 The surface sinking measuring device of claim 1, further comprising a first rail and a second rail, the first rail being parallel to the second rail, wherein the light source is disposed on the first rail, The receiver is disposed on the second rail, the light source moves along the first rail on the reference plane, and the receiver moves on the second rail in a manner corresponding to the light source, and the control unit receives the receiver according to whether the receiver receives As a result of the light, it is judged where the surface of the casing of the apparatus has a sinking amount exceeding an allowable value. 如申請專利範圍第2項所述之表面下沈量量測設備,其中,該光源為紅外線光源。 The surface sinking measuring device according to claim 2, wherein the light source is an infrared light source. 如申請專利範圍第2項所述之表面下沈量量測設備,其中,該光源於該第一導軌上係由步進馬達驅動,該接收器於該第二導軌上係由步進馬達驅動。 The surface sinking measuring device according to claim 2, wherein the light source is driven by the stepping motor on the first rail, and the receiver is driven by the stepping motor on the second rail. 如申請專利範圍第1項所述之表面下沈量量測設備,其中,該等支撐部為L型結構。 The surface sinking measuring device according to claim 1, wherein the supporting portions are L-shaped structures. 一種表面下沈量量測方法,用以量測一裝置之一機殼表面的下沈量,包括:提供一表面下沈量量測設備,該表面下沈量量測設備包括一支撐架、一光源、一接收器以及一控制單元,支撐架支撐該裝置,該光源提供一光 線,其中,該光源位於一基準平面,該光線沿水平方向行進,該接收器接收該光線,其中,當該裝置之該機殼表面的下沈量超過容許值時,該機殼表面與該基準平面發生干涉而阻礙該接收器接收該光線,該一控制單元,耦接該接收器,該控制單元依據該接收器是否接收到該光線的結果,而判斷該裝置之該機殼表面是否存在下沈量超過容許值的情況;以及將該光源設於一第一導軌,將該接收器設於一第二導軌,該光源沿該第一導軌於該基準平面上移動,該接收器於該第二導軌上以對應該光源的方式移動,該控制單元依據該接收器是否接收到該光線的結果,而判斷該裝置之該機殼表面的何處存在下沈量超過容許值的情況。 A surface sinking measurement method for measuring a sinking amount of a casing surface of a device, comprising: providing a surface sinking measuring device, the surface sinking measuring device comprising a support frame, a light source, and a receiver And a control unit supporting the device, the light source providing a light a line, wherein the light source is located in a reference plane, the light travels in a horizontal direction, and the receiver receives the light, wherein the surface of the casing and the surface of the casing when the amount of sinking of the casing exceeds an allowable value The reference plane interferes to prevent the receiver from receiving the light, and the control unit is coupled to the receiver, and the control unit determines whether the surface of the device is present according to whether the receiver receives the light. a case where the sinking amount exceeds the allowable value; and the light source is disposed on a first rail, the receiver is disposed on a second rail, and the light source moves along the first rail on the reference plane, and the receiver is The second rail moves in a manner corresponding to the light source, and the control unit determines, according to whether the receiver receives the light, whether the surface of the casing has a sinking amount exceeding an allowable value. 如申請專利範圍第6項所述之表面下沈量量測方法,其更包括依據裝置的電子元件配置情況,判斷是何電子元件造成下沈量超過容許值的問題。 The method for measuring the surface sinking amount as described in claim 6 further includes the problem of determining, by the electronic component arrangement of the device, which electronic component causes the sinking amount to exceed the allowable value. 如申請專利範圍第7項所述之表面下沈量量測方法,其更包括將裝置水平旋轉90度,再次由該光源以及該接收器對該機殼表面進行偵測,以取得該機殼表面整體平面的機殼表面下沈量資訊。 The surface sinking measurement method of claim 7, further comprising rotating the device horizontally by 90 degrees, and detecting the surface of the casing again by the light source and the receiver to obtain the whole surface of the casing. Information on the surface sinking of the flat case. 如申請專利範圍第6項所述之表面下沈量量測方法,其中,該裝置包括二凸耳,分別形成於該裝置之相反的兩側,該支撐架包括二支撐部,該等支撐部分別支撐該等凸耳,該等支撐部為L型結構。The surface sinking measurement method according to claim 6, wherein the device comprises two lugs, respectively formed on opposite sides of the device, the support frame comprises two support portions, and the support portions respectively support The lugs have an L-shaped structure.
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