TWI407104B - Testing clamp - Google Patents

Abstract

The present invention relates to a testing clamp. The testing clamp includes a connect member, a first connector and a number of second connectors. The connect member includes a TU (Testing Unit) post and an ODT (Object Under Test) port. The first connector is set on the TU port. The second connectors are set on the ODT port. The first connector is used for connecting to a testing device. Each second connector is used for connecting to an object under test. The testing clamp can test many objects by setting a number of second connectors on the ODT port. Thereby, the frequency for replacing the testing clamp is reduced.

Description

Test Fixture

The invention relates to a test fixture.

In the design of the test fixture, usually one end of the connecting component is the test end, and the other end is the tested end, and the connector connection detecting device (TU) disposed at the testing end is set at the connector of the tested end. Connect the Object Under Test (ODT). The connector of the detecting device usually does not need to be plugged and unplugged frequently. However, the connector connected to the device under test needs to be plugged and unplugged as the device under test is replaced, which easily damages the connector of the tested end, which requires frequent Replace the test fixture.

In view of this, it is necessary to provide a test fixture that can effectively reduce the frequency of replacement.

A test fixture includes a connecting component, a first connector, and a plurality of second connectors. The connecting component has a test end and a tested end. The test end is provided with the first connector, and the tested second end is provided with the plurality of second connectors. The first connector is for connecting to a detecting device, and each of the second connectors is for connecting to a device under test. The first connector has a first slot, and each second connector has a second slot, the first slot The slot and each of the second slots each have a plurality of corresponding connecting ends, wherein the corresponding connecting ends of the second connectors are connected to each other and the connecting ends of each of the second connectors are electrically connected in series to the first connection via the same resistor Corresponding to the connection end.

Compared with the prior art, the test fixture can effectively reduce the test fixture by setting a plurality of second connectors on the tested end of the connecting component, so that the test fixture can test more devices under test. Change the frequency.

100‧‧‧Test fixture

11‧‧‧Test end

12‧‧‧tested end

10‧‧‧Connecting components

20‧‧‧First connector

30‧‧‧Second connector

40‧‧‧Detection device

31‧‧‧second slot

32‧‧‧resistance

322‧‧‧Resistance row

26‧‧‧First slot

310‧‧‧ Grounding terminal

320‧‧‧Connecting end

FIG. 1 is a schematic structural diagram of a test fixture provided by an embodiment of the present invention.

2 is a schematic structural view of the tested end of the test fixture of FIG. 1.

3 is a circuit diagram of the tested end of the test fixture of FIG. 1.

The following preferred embodiments will be described in detail below with reference to the accompanying drawings.

Referring to FIG. 1 to FIG. 3 , the test fixture 100 provided by the embodiment of the present invention includes a connecting component 10 , a first connector 20 , a plurality of second connectors 30 , and a plurality of resistors 32 . The connecting component 10 has a test end 11 and a tested end 12, and the test end 11 is provided with the first connector 20, and the tested end 12 is provided with a plurality of second connectors 30. The first connector 20 is for connecting to a detecting device 40, and each of the second connectors 30 is for connecting to a device under test (not shown). In the present embodiment, the connecting component 10 is a cable. It can be understood that the connecting component 10 can also be a flexible circuit board (FPC Cable).

The first connector 20 has a first slot 26, and each of the second connectors 30 has a second slot 31. The first slot 26 and each of the second slots 31 each have at least one corresponding ground end 310 and a plurality of corresponding connecting ends 320. It can be understood that the grounding end 310 and the connecting end 320 can be disposed on both sides of the first slot 26 and the second slot 31. In this embodiment, the grounding end 310 and the connecting end 320 are both disposed at The number of the second connectors 30 is four, and the number of the ground terminals 310 is six, and the number of the connection ends 320 is 14. The number of the connection ends 320 of the second connector 30 is determined by the device under test. The number of the connection terminals 320 on the first connector 20 cannot be less than the number of the connection terminals 320 on the second connector 30. Therefore, the device under test connected to the second connector 30 can transmit the signal to the detecting device 40 via the first connector 20, and the remaining connection terminals 320 of the first connector 20 are not connected to any circuit.

The corresponding connecting end 320 of each second slot 31 is electrically connected in series via a resistor 32. The connecting end 320 of the second connector 20 and the connecting end 320 corresponding to the first connector 30 are electrically connected via a resistor 32. In series. The first slot 26 and the corresponding grounding end 310 of each second slot 31 are electrically grounded, so that the test fixture 100 functions as an electromagnetic interference prevention (EMI), and further, the test fixture 100 The ground end can be connected to the ground end of the detecting device 40 or to the ground end of the device under test.

In this embodiment, the plurality of resistors 32 between the first slot 26 and the second slot 31 connected thereto form a resistor row 322, and the plurality of resistors 32 between each of the second slots 31 respectively form a plurality of resistor rows 322.

During use, only one of the four second slots 31 can be electrically connected to the device under test, because if the four second slots 31 are electrically connected to the device under test at the same time, the detecting device 40 will be caused. The input signal received is a superposition of the output signals of the four devices under test.

Further, each resistor 32 of the test fixture 100 requires a resistance value of 0 Ω (ohm) in the test process, which is equivalent to not connecting the resistor 32. Therefore, in order to facilitate the test, each resistor is designed during the design process. The resistance value of 32 is 0 Ω. When the resistance value is not required to be zero, in order to facilitate the replacement of the resistor 32, the 14 resistors 32 can be placed on the test fixture 100 by being placed on the 14 resistor bases, respectively. In the present embodiment, the resistor row 322 formed by the resistor 32 is placed on a test resistor base (not shown) to be disposed on the test fixture 100. Of course, the resistor row 322 can be directly soldered. In the test fixture 100, since the device under test is generally in a batch, the second slot 31 is often broken, and the resistor row 322 is intact. Therefore, once the resistance of the resistor row 322 is set, it is generally unnecessary. replace. When the resistance of all the resistors 32 is 0 Ω, the connection terminals 320 of each of the second connectors 30 are electrically connected to the connection terminals 320 of the first connector 20, so that each of the second connectors 30 is disposed in parallel. The test element 12 of the connecting element 10 is on the test end 12.

When the signal band sent by the device under test is a low frequency signal, impedance matching is generally not required, so each resistor 32 does not need to be replaced, and its resistance value is an initial resistance value of 0 Ω, and one of the four second slots 31 can be arbitrarily selected. It is electrically connected to the device under test. Sometimes, in order to improve the load carrying capacity, it is also possible to appropriately replace the resistance values of some or all of the resistors 32 as needed. Impedance matching Matching) is a part of microwave electronics. It is mainly used on transmission lines to achieve the purpose that all high frequency microwave signals can be transmitted to the load point. No signal is reflected back to the source point, thus improving energy efficiency. When one of the four second slots 31 is damaged, that is, the corresponding second connector 30 is damaged, and if the damaged second slot 31 is damaged due to an open circuit, the third and the second without damage may be Optionally, one of the connectors 30 is electrically connected to the device under test; if the damaged second slot 31 is damaged due to a short circuit, the damaged second connector 30 is selected between the second connector 30 and the first connector 20. The second connector 30 is connected to the device under test, because the damaged second slot 31 may be electrically grounded via the ground terminal 310 due to the short circuit, thereby affecting the signal transmission of the device under test.

When the signal band transmitted by the device under test is a high frequency signal, impedance matching is required, and the resistance value of some or all of the resistors 32 is appropriately replaced. When the four second slots 31 are not damaged, one of the four second slots 31 can be arbitrarily selected to be electrically connected to the device under test. When one of the four second slots 31 is damaged, that is, the corresponding second connector 30 is damaged, and if the damaged second slot 31 is damaged due to an open circuit, the third and the second without damage may be Optionally, one of the connectors 30 is electrically connected to the device under test; if the damaged second slot 31 is damaged due to a short circuit, the second connection between the damaged second connector 30 and the first connector 20 The device 30 remains and the remaining second connector 30 (including the damaged second connector 30) must be cut and discarded. Because the damaged second slot 31 may have an impedance due to the shorting, the impedance of the entire test fixture 100 does not match. In the process of cutting off the damaged second slot 31, in order to avoid damage to the circuit trace between two adjacent second slots 31, the resistor row of the damaged second connector 30 must first be damaged. The 322 is unplugged and then sheared at the unplugged resistor bank 322 to repeal the damaged second connector 30.

In summary, during the use, the second slot 31 of the second connector 30 farthest from the first connector 20 is generally preferentially used to avoid unnecessary waste. When one of the second slots 31 has processed the high frequency signal and needs to process the low frequency signal, one of the used second slot 31 and the first slot 26 may be selected. The measuring device is electrically connected; one of the other second slots 31 may be electrically connected to the device under test, that is, the second insertion between the second slot 31 and the first slot 26 that has been used. In the slot 31, the resistor 32 corresponding to the used second slot 31 needs to be matched and changed. Therefore, it is possible to dispense with the trouble of changing the resistor 32 by preferentially using the second slot 31 of the second connector 30 farthest from the first connector 20.

Compared with the prior art, the test fixture 100 can effectively test the test fixture 100 by testing a plurality of second connectors 30 on the tested end 12 of the connecting component 10, thereby effectively reducing the number of devices under test. The frequency of replacement of the test fixture 100.

In summary, the present invention complies with the requirements of the invention patent and submits a patent application according to law. However, the above description is only the preferred embodiment of the present invention, and the scope of the present invention is not limited to the above-described embodiments, and equivalent modifications or variations made by those skilled in the art in light of the spirit of the present invention are It should be covered by the following patent application.

100‧‧‧Test fixture

11‧‧‧Test end

12‧‧‧tested end

10‧‧‧Connecting components

20‧‧‧First connector

30‧‧‧Second connector

40‧‧‧Detection device

Claims (14)

A test fixture comprising a connecting component and a first connector, the connecting component having a test end and a tested end, the test end being provided with the first connector, the first connector for connecting A detecting device is improved in that a plurality of second connectors are disposed on the tested end, each second connector is configured to connect to a device under test, the first connector has a first slot, and each second The connector has a second slot, and the first slot and each of the second slots have a plurality of corresponding connecting ends, wherein the corresponding connecting ends of the second connector are connected to each other and each second connector The connecting end is electrically connected in series to the corresponding connecting end of the first connector via the same resistor. The test fixture of claim 1, wherein the connecting component is a cable. The test fixture of claim 1, wherein the connecting component is a flexible circuit board. The test fixture of claim 1, wherein the first connector has a first slot, each second connector has a second slot, the first slot and each of the first slots The two slots each have at least one corresponding ground end and a plurality of corresponding connecting ends, and the corresponding connecting ends of each second slot are electrically connected in series via a resistor, and the connecting end of the second connector is The corresponding connector of the first connector is electrically connected in series via a resistor, and the corresponding grounding end of the first slot and each second slot is electrically grounded, and the number of the second connector on the tested end is i, each of the above first second connectors The connecting end is electrically connected in series to the corresponding connecting end of the first connector via the resistor, and each connecting end of the second second connector is electrically connected in series via the resistor to the corresponding connecting end of the first second connector. Then, and so on until each connection end of the ith second connector is electrically connected in series via the resistor to the corresponding connection end of the i-1th second connector. The test fixture of claim 4, wherein the plurality of resistors between the first slot and the second slot connected thereto form a resistor row, and the plurality of resistors between each second slot respectively Form a complex resistor row. The test fixture of claim 4, wherein the resistance of the resistor is zero ohms. The test fixture of claim 4, wherein when the device under test is a device to be tested for high frequency signals, it is necessary to replace resistors of different resistance values to match. The test fixture of claim 4, wherein when one of the second connectors is damaged due to an open circuit, the second connector that is not damaged is selected to be connected to the device under test. The test fixture of claim 4, wherein when one of the second connectors is damaged due to a short circuit, and when the device under test is a device to be tested with a high frequency signal, the damage is retained. A second connector between the second connector and the first connector, and the remaining second connector including the damaged second connector must be removed. The test fixture of claim 9, wherein when the second connector is removed, the corresponding resistor of the damaged second connector is unplugged, and shearing is performed at a position where the resistor is removed. The test fixture of claim 4, wherein when one of the second connectors is damaged due to a short circuit, and when the device under test is a low-frequency signal device, the second damage is selected. A second connector between the connector and the first connector is coupled to the device under test. The test fixture of claim 4, wherein each resistor is placed on a test fixture by being placed on a resistor base. The test fixture of claim 5, wherein each of the resistor rows is respectively disposed on a resistor row base and disposed on the test fixture. The test fixture of claim 4, wherein the number of the connecting ends on the first connector is not less than the number of the connecting ends on the second connector.