CN108254652B - Testing device of backplane connector - Google Patents
Testing device of backplane connector Download PDFInfo
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- CN108254652B CN108254652B CN201711417979.2A CN201711417979A CN108254652B CN 108254652 B CN108254652 B CN 108254652B CN 201711417979 A CN201711417979 A CN 201711417979A CN 108254652 B CN108254652 B CN 108254652B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/67—Testing the correctness of wire connections in electric apparatus or circuits
Abstract
The invention discloses a testing device of a backplane connector, which comprises: the first test board is provided with a first connector and a first output connector connected with the first connector; the second test board is provided with a second connector and a second output connector connected with the second connector; wherein the first connection portion and the second connection portion both have 6 × 18 pin pairs; the backplane connector has 6 × 18 differential pairs formed by a plurality of plug terminals, and is divided into three sub-connectors, each sub-connector having 6 × 6 differential pairs therein; the 3 × 6 differential pairs in the sub-connector are derived from either the 3 × 6 pin pairs of the first connection or the 3 × 6 pin pairs of the second connection. The test device can realize accurate and efficient test for the test of the backplane connector with a plurality of pairs of differential signals (108 paths of differential signals).
Description
Technical Field
The invention relates to a testing device of a backplane connector.
Background
With the rapid development of high-speed circuit technology, the high-speed backplane is used as an important part of the signals of the interconnection board card, and the quality of the signal integrity is seriously affected by the quality of hard indexes such as insertion loss, return loss, near-end crosstalk, far-end crosstalk, connector end impedance and link impedance.
In order for high speed signals in the system to meet the signal quality requirements specified by the corresponding signal protocol, the signals sent from the originating side are correctly received by the terminating side, and the loss, crosstalk, and impedance on the high speed interconnect backplane link must meet the requirements. Therefore, in order to obtain specific performance index parameters, a high-speed backplane connector test fixture must be introduced.
One type of backplane connector is the 6 x 18pair of anfeinuo xcide + high speed connector, which transmits up to 108 differential high speed signals. However, the current backplane high-speed connector test fixture cannot meet the test of a 6 × 18pair (108 differential signals) multi-path complex backplane connector, and cannot complete the signal integrity test of the high-speed backplane connector.
Disclosure of Invention
In view of the problems in the related art, the present invention provides a testing apparatus for a backplane connector, which can achieve an accurate and efficient test for testing a backplane connector with multiple pairs of differential signals (108 differential signals).
The technical scheme of the invention is realized as follows:
according to an aspect of the present invention, there is provided a test apparatus for a backplane connector, including: the first test board is provided with a first connector and a first output connector connected with the first connector; the second test board is provided with a second connector and a second output connector connected with the second connector; wherein the first connector and the second connector both have 6 x 18 pin pairs; the backplane connector has 6 × 18 differential pairs formed by a plurality of plug terminals, and is divided into three sub-connectors, each sub-connector having 6 × 6 differential pairs therein; the 3 x 6 differential pairs in the sub-connector are derived from either the 3 x 6 pin pairs of the first connector or the 3 x 6 pin pairs of the second connector.
According to an embodiment of the present invention, while the 3 × 6 differential pairs in the sub-connector are drawn by the 3 × 6 pin pairs of the first connector, the remaining 3 × 6 differential pairs in the sub-connector are drawn by the 3 × 6 pin pairs of the second connector; or when 3 x 6 differential pairs in the sub-connector are extracted from 3 x 6 pin pairs of the second connector, the remaining 3 x 6 differential pairs in the sub-connector are extracted from 3 x 6 pin pairs of the first connector.
According to the embodiment of the invention, the testing device further comprises a terminating resistor, and the terminating resistor is arranged on each pin pair adjacent to the pin pair led out.
According to an embodiment of the invention, the 3 × 6 pairs of signal outputs are 3 rows of signal outputs adjacent to each other.
According to an embodiment of the invention, the test device further comprises a calibration line part, the calibration lines in the calibration line part being a 3.5inch calibration line and a 7inch calibration line.
According to the embodiment of the invention, the traces on the first test board and the traces on the second test board are both 3.5 inches.
According to an embodiment of the invention, the testing device is further adapted to test the second backplane connector; when 3 x 6 differential pairs in a sub-connector of a backplane connector are brought out by one of the first connector or the second connector, 3 x 6 differential pairs in a sub-connector of a second backplane connector are brought out by the other of the first connector or the second connector.
According to an embodiment of the present invention, the test apparatus further comprises a vector network analyzer VNA, a test input of the VNA being connected to the first output connector and the second output connector.
The invention provides a test device of a 6 x 18pair backplane connector, which provides accurate and efficient test configuration for connector test of multiple pairs of differential signals; when testing, only 3 × 6 pin pairs of the first connector of the first test board P1 and 3 × 6 pin pairs of the second connector of the second test board P2 need to be led out by SMA connectors, and the 6 × 18pair backplane connector link signal integrity test can be completed by using different combinations of the first test board P1 and the second test board P2.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
Fig. 1 is a schematic diagram of a test apparatus for backplane connectors according to an embodiment of the present invention;
fig. 2 is a layout diagram of plug terminals of a 6 × 18pair backplane connector;
fig. 3 is a schematic diagram of a configuration in which a signal on a sub-connector is led out using a first test board P1;
fig. 4 is a schematic diagram of a configuration in which a signal on the sub-connector is led out using the second test board P2.
Fig. 5 to 7 are schematic diagrams of a test arrangement of individual sub-connectors of a backplane connector;
fig. 8 is a schematic diagram of a 6 x 18pair backplane connector for testing in a backplane.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments that can be derived by one of ordinary skill in the art from the embodiments given herein are intended to be within the scope of the present invention.
As shown in fig. 1, a test apparatus 10 for backplane connectors according to an embodiment of the present invention includes: a first test board P1, wherein a first connector 12 and a first output terminal connected to the first connector 12 are disposed on the first test board P1; the second test board P2 is provided with a second connector 14 and a second output terminal connected to the second connector 14 on the second test board P2. The first output connection on the first test board P1 and the second output connection on the second test board P2 may both be 2.4mm SMA connections, and all signals on the test apparatus 10 are directed through the 2.4mm SMA connections and connected to the test equipment through the SMA connections.
Fig. 2 is a layout diagram of plug terminals of a 6 × 18pair backplane connector having 6 × 18 differential pairs of a plurality of plug terminals. Considering the jig layout size, it is impossible to extract all differential signals in its entirety. Thus, the backplane connector is divided into three sub-connectors (1-6 columns, 7-12 columns, 13-18 columns) so that there are 6 x 6 differential pairs in each sub-connector, each sub-connector corresponding to a 6 x 6pair connector. Referring to fig. 3 to 4, the first connector 12 on the first test board P1 and the second connector 14 on the second test board P2 both have 6 × 6 pin pairs; the 3 x 6 differential pairs in the sub-connector are derived from either the 3 x 6 pin pairs of the first connector 12 or the 3 x 6 pin pairs of the second connector 14. Taking the signals on the sub-connectors (columns 13-18) respectively coming out from the test boards P1 and P2 as an example, as shown in fig. 3, the first test board P1 comes out AB, CD and EF pair; as shown in FIG. 4, a second test board P2 leads GH, JK and LM pair.
According to the technical scheme, the test device 10 of the 6 x 18pair backplane connector is designed, so that accurate and efficient test configuration is provided for connector test of multiple pairs of differential signals; when testing, only 3 × 6 pin pairs of the first connector of the first test board P1 and 3 × 6 pin pairs of the second connector of the second test board P2 need to be led out by SMA connectors, and the 6 × 18pair backplane connector link signal integrity test can be completed by using different combinations of the first test board P1 and the second test board P2.
In one embodiment, while the 3 × 6 differential pairs in the sub-connector are routed out of the 3 × 6 pin pairs of the first connector 12, the remaining 3 × 6 differential pairs in the sub-connector are routed out of the 3 × 6 pin pairs of the second connector 14; or 3 x 6 differential pairs in the sub-connector are taken out by 3 x 6 pin pairs of the second connector 14, the remaining 3 x 6 differential pairs in the sub-connector are taken out by 3 x 6 pin pairs of the first connector 12. Preferably, the 3 x 6 pairs of signal outputs are 3 rows of signal outputs adjacent to each other. Specifically, the test configuration of the sub-connectors (columns 13-18) is shown in FIG. 5; the test configuration of the sub-connectors (columns 7-13) is shown in FIG. 6; the test configuration for the sub-connectors (columns 1-6) is shown in fig. 7. With such a configuration, the test of all the plug terminals of the 6 × 18pair backplane connector can be completed using the first test board P1 and the second test board P2.
The test apparatus 10 further includes termination resistors, shown in connection with fig. 2 and 3, disposed on each pin pair adjacent to the pin pair that is to be led out. That is, the adjacent pin from which the signal is extracted is terminated with a 50 ohm resistor.
Referring again to FIG. 1, the test apparatus 10 also includes a calibration line portion 16, the calibration lines in the calibration line portion 16 being a 3.5inch calibration line and a 7inch calibration line. In order to obtain the loss and impedance parameters of the backplane link by using the testing device 10, the loss of the first testing board P1 and the second testing board P2 must be removed, and therefore, the 7-inch and 3.5-inch calibration lines are used to remove the loss of the testing device 10.
Preferably, the traces on the first test board P1 and the traces on the second test board P2 are both 3.5 inches. In order to meet the SI requirement of 3dB loss of each test board (wire and connector), a proper board is selected, a corresponding laminated file is designed, wire impedance is designed, reasonable layout wire is arranged, and the wires of the first test board P1 and the second test board P2 are strictly controlled to be 3.5 inch.
In one embodiment, the test apparatus 10 is also used for testing a second backplane connector; when 3 x 6 differential pairs in a daughter connector of a backplane connector are routed out of one of the first connector 12 or the second connector 14, 3 x 6 differential pairs in a daughter connector of a second backplane connector are routed out of the other of the first connector 12 or the second connector 14. In one embodiment, the test apparatus 10 further comprises a VNA (vector network analyzer), a test input of which is connected to the first output connector and the second output connector.
Specifically, as shown in fig. 8, a 6 × 18pair backplane connector may be used in a backplane having 6 × 18pair Xcede + high-speed connectors (connector 1.. connector 6), wherein the 6 high-speed connectors are interconnected in pairs. The connector at the backplane end is a male connector, and the connector on the testing device 10 is a female connector, which is used for being plugged into the connector on the backplane.
Two backplane connectors to be tested are selected according to the interconnection of the actual backplane to be tested, and the two backplane connectors are shown in fig. 8 as the connector 1 and the connector 6. The corresponding test configuration shown in fig. 2 to 7 is selected according to the layout position of the plug terminal where the signal under test is located. The SMA head on the first test board P1, from which the differential signals are extracted, is connected to ports 1 and 3 of the VNA, and the SMA head on the test board P2, from which the differential signals are extracted, is connected to ports 2 and 4 of the VNA. Thus, the test apparatus 10 of the present invention can test the insertion loss, near-end crosstalk, far-end crosstalk, and link impedance control of the interconnected backplane connector links.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.
Claims (7)
1. A device for testing a backplane connector, comprising:
the test circuit comprises a first test board, a second test board and a third test board, wherein the first test board is provided with a first connector and a first output connector connected with the first connector;
the second test board is provided with a second connector and a second output connector connected with the second connector;
wherein the first connector and the second connector each have 6 x 18 pin pairs;
the backplane connector has 6 × 18 differential pairs of a plurality of plug terminals, the backplane connector is divided into three sub-connectors, and each sub-connector has 6 × 6 differential pairs therein; the 3 x 6 differential pairs in the sub-connectors are led out by the 3 x 6 pin pairs of the first connector of the first test board or the 3 x 6 pin pairs of the second connector of the second test board;
while the 3 × 6 differential pairs in the sub-connector are extracted from the 3 × 6 pin pairs of the first connector, the remaining 3 × 6 differential pairs in the sub-connector are extracted from the 3 × 6 pin pairs of the second connector; or when 3 × 6 differential pairs in the sub-connector are extracted from 3 × 6 pin pairs of the second connector, the remaining 3 × 6 differential pairs in the sub-connector are extracted from 3 × 6 pin pairs of the first connector.
2. The device for testing a backplane connector according to claim 1, further comprising a terminating resistor provided on each pin pair adjacent to the pin pair led out.
3. The apparatus for testing a backplane connector of claim 1, wherein said 3 x 6 pairs of signal outputs are 3 rows of signal outputs adjacent to each other.
4. The device for testing a backplane connector according to claim 1, further comprising a calibration line part, wherein the calibration lines in the calibration line part are a 3.5-inch calibration line and a 7-inch calibration line.
5. The apparatus for testing the backplane connector of claim 1, wherein the traces on the first test board and the traces on the second test board are 3.5 inches.
6. The device for testing backplane connectors according to claim 1, wherein said testing device is further adapted to test a second backplane connector; when 3 x 6 differential pairs in the sub-connectors of the backplane connector are brought out by one of the first connector or the second connector, 3 x 6 differential pairs in the sub-connectors of the second backplane connector are brought out by the other of the first connector or the second connector.
7. The apparatus for testing a backplane connector of claim 1, further comprising a Vector Network Analyzer (VNA), wherein a test input of the VNA is connected to the first output connector and the second output connector.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711417979.2A CN108254652B (en) | 2017-12-25 | 2017-12-25 | Testing device of backplane connector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711417979.2A CN108254652B (en) | 2017-12-25 | 2017-12-25 | Testing device of backplane connector |
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| CN108254652A CN108254652A (en) | 2018-07-06 |
| CN108254652B true CN108254652B (en) | 2021-07-13 |
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| CN201711417979.2A Active CN108254652B (en) | 2017-12-25 | 2017-12-25 | Testing device of backplane connector |
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Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN110441628A (en) * | 2019-07-29 | 2019-11-12 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | High speed connector performance test methods, apparatus and system |
| CN113078521B (en) * | 2021-02-23 | 2023-01-06 | 中国航天时代电子有限公司 | Switching device for testing integrity of Gbit-level high-speed bus signals |
| CN116781108A (en) * | 2022-03-07 | 2023-09-19 | 中兴通讯股份有限公司 | Signal link crosstalk testing device and method |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1667582A (en) * | 2004-03-12 | 2005-09-14 | 鸿富锦精密工业（深圳）有限公司 | Motherboard function test board |
| CN102402474A (en) * | 2010-09-10 | 2012-04-04 | 中兴通讯股份有限公司 | Prototype verification device for programmable logic devices |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2891082Y (en) * | 2006-03-14 | 2007-04-18 | 鸿富锦精密工业（深圳）有限公司 | Expandable tester |
| CN100487468C (en) * | 2006-06-07 | 2009-05-13 | 华为技术有限公司 | Rear-panel testing system |
| CN101201761A (en) * | 2006-12-14 | 2008-06-18 | 英业达股份有限公司 | System for detecting interface backboard of serial attaching minitype computer system |
| CN103913603B (en) * | 2013-01-04 | 2017-02-22 | 航天科工防御技术研究试验中心 | Test adaptor of electric connector |
| CN205450140U (en) * | 2015-12-30 | 2016-08-10 | 深圳市兴森快捷电路科技股份有限公司 | Hermaphroditic connector's survey test panel and device |
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Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1667582A (en) * | 2004-03-12 | 2005-09-14 | 鸿富锦精密工业（深圳）有限公司 | Motherboard function test board |
| CN102402474A (en) * | 2010-09-10 | 2012-04-04 | 中兴通讯股份有限公司 | Prototype verification device for programmable logic devices |
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Effective date of registration: 20181227 Address after: 610213 846, southern section of Tianfu Avenue, Huayang street, Tianfu New District, Chengdu, Sichuan Applicant after: CHINESE CORPORATION DAWNING INFORMATION INDUSTRY CHENGDU CO., LTD. Applicant after: Dawning Information Industry (Beijing) Co., Ltd. Address before: 100193 No. 36 Building, No. 8 Hospital, Wangxi Road, Haidian District, Beijing Applicant before: Dawning Information Industry (Beijing) Co., Ltd. |
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