TWI400513B - Laser repair apparatus for a panel - Google Patents
Laser repair apparatus for a panel Download PDFInfo
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- TWI400513B TWI400513B TW97126158A TW97126158A TWI400513B TW I400513 B TWI400513 B TW I400513B TW 97126158 A TW97126158 A TW 97126158A TW 97126158 A TW97126158 A TW 97126158A TW I400513 B TWI400513 B TW I400513B
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Description
本發明涉及面板雷射修補機方面的技術領域,尤指一種面板雷射修補機上用於測試該面板或檢測板是否有瑕疵的檢測機構。The invention relates to the technical field of a panel laser repairing machine, in particular to a detecting mechanism for testing whether the panel or the detecting board is flawed on a panel laser repairing machine.
台灣公告第M312849、M313734號專利,其皆係單獨利用探針組上的複數探針接觸該面板一側之檢測板上的接觸點,以透過該檢測板上的檢測線路將測試訊號送入該面板中。然而,該些探針輸入的測試訊號係需經過該接觸點及該檢測線路。因此單獨利用該些探針將測試訊號輸入該面板的檢測方式,係無法確認出所檢測到的瑕疵是在該面板還是該檢測板的檢測線路。一般的檢測板僅係用於供輸入測試訊號,其最後係會被裁切掉,因此如該檢測板的檢測線路有瑕疵時並不會影響該面板的品質。而該習知的雷射修補機卻會因為無法確認是否該面板還是該檢測板有瑕疵,而將該僅檢測板有瑕疵者一齊作為不良品或是對其作雷射修補。如此,不但增加產品的不良率而且亦會浪費成本。Taiwan Patent No. M312849 and M313734 both use a plurality of probes on a probe set to contact a contact point on a test board on one side of the panel to transmit a test signal through the detection line on the test board. In the panel. However, the test signals input by the probes are required to pass through the contact point and the detection line. Therefore, by using the probes alone to input the test signals into the detection mode of the panel, it is impossible to confirm whether the detected defects are on the panel or the detection lines of the detection board. The general test board is only used to input the test signal, and the final test will be cut off. Therefore, if the detection line of the test board is flawed, the quality of the panel will not be affected. However, the conventional laser repairing machine may not be able to confirm whether the panel or the detecting board is flawed, and the detecting board may be used as a defective product or laser repaired. This will not only increase the defect rate of the product but also waste costs.
本發明提供一種能確認該面板還是該檢測板有瑕疵之面板雷射修補機。其中該面板之縱、橫側邊分別各延伸有 一檢測板。每一檢測板上具有複數接觸點及分別與該些接觸點連接的複數條檢測線路,該些檢測線路並分別與該面板之複數縱向或橫向畫素的開關電路連接。該雷射修補機包括一機台、一檢測機構、一雷射修補裝置及一影像擷取裝置。該機台具一框體、一燈源及一龍門,該框體係供置放該面板,且具有垂直相鄰接的兩框桿,該燈源係設在該框體下方,該龍門可於該框體上方移動。該檢測機構包括複數檢測裝置分別設於該兩框桿上,每一檢測裝置包括一座體、一探針組及一導電組。該座體係可移動地設於相對應框桿上。該探針組具有一第一昇降座及複數探針,該第一昇降座係可昇降地設於該座體上,該些探針係結合於該第一昇降座,可供接觸該面板之檢測板的接觸點,以將測試訊號輸入該面板的相對應畫素的開關電路。該導電組係具有一第二昇降座及一導電棉,該第二昇降座係可昇降地設於該座體上,該導電棉係設於該昇降座上可供接觸該檢面板之檢測線路靠近該面板的一端,以將電力輸入該面板的相對應畫素的開關電路。該雷射修補裝置可移動地設於該龍門,可對機台上的面板的進行雷射修補。該影像擷取裝置結合於該雷射修補裝置上,可供擷取該機台上之面板的影像。The present invention provides a panel laser repairing machine capable of confirming whether the panel or the detecting board is defective. Wherein the longitudinal and lateral sides of the panel are respectively extended A test board. Each of the detection boards has a plurality of contact points and a plurality of detection lines respectively connected to the contact points, and the detection lines are respectively connected to the plurality of vertical or horizontal pixel switching circuits of the panel. The laser repairing machine includes a machine table, a detecting mechanism, a laser repairing device and an image capturing device. The machine platform has a frame body, a light source and a gantry. The frame system is provided with the panel, and has two vertically adjacent frame rods. The light source is disposed under the frame body, and the gantry can be Move above the frame. The detecting mechanism comprises a plurality of detecting devices respectively disposed on the two frame rods, each detecting device comprising a body, a probe set and a conductive group. The seat system is movably disposed on the corresponding frame pole. The probe set has a first lifting base and a plurality of probes. The first lifting base is detachably mounted on the base body, and the probes are coupled to the first lifting base for contacting the panel. The contact point of the board is tested to input the test signal into the corresponding pixel switching circuit of the panel. The conductive group has a second lifting seat and a conductive cotton, and the second lifting seat is hoistably disposed on the base body, and the conductive cotton is disposed on the lifting seat for contacting the detecting line of the inspection panel Near one end of the panel to input power into the corresponding pixel switching circuit of the panel. The laser repairing device is movably disposed on the gantry to perform laser repair on the panel on the machine. The image capturing device is coupled to the laser repairing device for capturing images of the panel on the machine.
本發明係可藉由該些探針接觸該檢測板的接觸點,以將測試訊號輸入該面板的相對應畫素的開關電路,以進行該面板的初步測試,然後再利用該導電棉接觸該檢測板之檢測線路靠近該面板的一端,以將電力輸入該面板的相對應畫素的開關電路,以進一步進行該面板還是該檢測板有 瑕疵的確認。進而可藉此發現檢測板的瑕疵,以達到降低產品不良率及成本之目的。The invention can contact the contact point of the detecting board by the probes to input a test signal into a switch circuit of a corresponding pixel of the panel to perform preliminary testing of the panel, and then contact the conductive cotton with the conductive cotton. A detection circuit of the detection board is adjacent to one end of the panel to input power into a corresponding pixel switching circuit of the panel to further perform the panel or the detection board Confirmation of 瑕疵. In turn, the defect of the test board can be found to achieve the purpose of reducing product defect rate and cost.
至於本發明的其它發明內容與更詳細的技術及功效說明,將揭露於隨後的說明。Other inventive aspects and more detailed technical and functional descriptions of the present invention are disclosed in the following description.
第一~十圖係顯示本發明之面板雷射修補機包括一機台1、一支撐機構2、複數固定裝置3、一檢測機構4、一雷射修補裝置5及一影像擷取裝置6。The first to tenth drawings show that the panel laser repairing machine of the present invention comprises a machine table 1, a support mechanism 2, a plurality of fixing devices 3, a detecting mechanism 4, a laser repairing device 5 and an image capturing device 6.
在該第一、二圖中係顯示,該面板7之縱、橫側邊分別各延伸有一檢測板8。每一檢測板8上具有複數接觸點80及分別與該些接觸點80連接的複數條檢測線路81。該些檢測線路81並分別與該面板7之複數縱向或橫向畫素的開關電路(圖中未示)連接。In the first and second figures, a detection plate 8 is extended on each of the longitudinal and lateral sides of the panel 7. Each of the detecting plates 8 has a plurality of contact points 80 and a plurality of detecting lines 81 respectively connected to the contact points 80. The detection lines 81 are respectively connected to a plurality of vertical or horizontal pixel switching circuits (not shown) of the panel 7.
在該第三圖中係顯示,該機台1具有一框體10、一燈源(圖中未示)及一龍門12。該框體10係由一第一框桿100、一第二框桿101、一第三框桿102及一第四框桿103圍成一矩形而成。該第二框桿101及第四框桿103係相互平行。該燈源係設在該框體10下方。該龍門12係可於該框體10上方移動。In the third figure, the machine 1 has a frame 10, a light source (not shown) and a gantry 12. The frame body 10 is formed by a first frame rod 100, a second frame rod 101, a third frame rod 102 and a fourth frame rod 103. The second frame rod 101 and the fourth frame rod 103 are parallel to each other. The light source is disposed below the frame 10. The gantry 12 system is movable above the frame 10.
在該第四、五圖中係顯示,該第二框桿101及第四框桿103上分別具有一軌道13。該支撐機構2包括複數支撐桿20及一驅動模組20a。每一支撐桿20的兩端係分別可移動地連接於該兩軌道13。於每一支撐桿20頂面具有一 防磨層200供該面板置於其上時不會磨損,另該支撐桿20上又具有複數氣孔201貫通至頂面,且可產生一吸力將其上的面板吸附,及可吹出氣體使其上的面板略微上浮。該驅動模組20a包括兩第一驅動裝置21及複數第二驅動裝置22。每一第一驅動裝置21係包括一伸縮壓缸210設於該第二框桿101上。該伸縮壓缸210具有可伸縮作動之一伸縮軸211,該伸縮軸211的端部係連結於靠近該第一框桿100之支撐桿20上。該些第二驅動裝置22係位在該第一框桿100上,可供分別驅動其餘的支撐桿20於該框體10上水平的移動。每一第二驅動裝置22包括一齒條220、一齒輪221及一馬達222。該齒條220係設於該第二框桿101上且與該軌道13平行,在本實施例中該些第二驅動裝置22係共用一齒條220。該齒輪221係與該齒條220嚙合。該馬達222係設於該支撐桿20上可供驅動該齒輪221轉動。In the fourth and fifth figures, the second frame rod 101 and the fourth frame rod 103 respectively have a track 13. The support mechanism 2 includes a plurality of support rods 20 and a drive module 20a. Both ends of each of the support rods 20 are movably coupled to the two rails 13, respectively. There is a mask on each of the support rods 20 The wear-resistant layer 200 does not wear when the panel is placed thereon, and the support rod 20 has a plurality of air holes 201 extending through the top surface, and generates a suction force to adsorb the panel thereon, and can blow out the gas to make it The upper panel is slightly up. The driving module 20a includes two first driving devices 21 and a plurality of second driving devices 22. Each of the first driving devices 21 includes a telescopic cylinder 210 disposed on the second frame rod 101. The telescopic cylinder 210 has a telescopic shaft 211 that is telescopically movable. The end of the telescopic shaft 211 is coupled to the support rod 20 adjacent to the first frame rod 100. The second driving devices 22 are fastened to the first frame 100 for driving the remaining support bars 20 to move horizontally on the frame 10. Each of the second driving devices 22 includes a rack 220, a gear 221, and a motor 222. The rack 220 is disposed on the second frame rod 101 and is parallel to the rail 13 . In the embodiment, the second driving devices 22 share a rack 220 . The gear 221 is meshed with the rack 220. The motor 222 is disposed on the support rod 20 for driving the gear 221 to rotate.
在該第六、七圖中係顯示,該些固定裝置3係分別設於第一框桿100及該第四框桿103上。每一固定裝置3包括一驅動器30及一定位塊31。該驅動器30係可移動地設於相對應的框桿上,該定位塊31係可被該驅動器30驅動而垂直該相對應框桿地移動。In the sixth and seventh figures, the fixing devices 3 are respectively disposed on the first frame rod 100 and the fourth frame rod 103. Each fixture 3 includes a driver 30 and a positioning block 31. The driver 30 is movably disposed on a corresponding frame rod, and the positioning block 31 is drivable by the driver 30 to move perpendicularly to the corresponding frame.
在該第六~九圖中係顯示,該檢測機構4係包括複數檢測裝置40及複數驅動部41。該些檢測裝置40係分別設於該第一框桿100及該第四框桿103上。該些驅動部41係可分別驅動該些檢測裝置40於相對應的框桿上移動。每一檢測裝置40包括一座體42、一探針組43及一導電組44。該座體42係可移動地設於相對應的框桿上。該探針組43 包括一第一昇降座430及複數探針431。該第一昇降座430係可昇降地設於該座體42上。該些探針431係結合於該第一昇降座430可供由下方接觸該檢測板8上的接觸點80,以將測試訊號輸入該面板7之相對應縱向或橫向畫素的開關電路,如第二圖所示。該導電組44包括一第二昇降座440及一導電棉441。該第二昇降座440係可昇降地設於該座體42上。該導電棉441係結合於該第二昇降座440的頂面,可供由下方接觸該檢測板8上之檢測線路81靠近該面板7的一端,以將電力輸入該面板7之相對應縱向或橫向畫素的開關電路,如第二圖所示。每一驅動部41包括一齒條45、一齒輪46及一馬達47。該齒條45係設於相對應框桿上,該齒輪46係與該齒條45嚙合,該馬達47係設於該相對應檢測裝置40的座體42上。在本實施例中同一框桿上的複數驅動部41係共用一條齒條45。In the sixth to ninth figures, the detecting mechanism 4 includes a complex detecting device 40 and a plurality of driving portions 41. The detecting devices 40 are respectively disposed on the first frame rod 100 and the fourth frame rod 103. The driving portions 41 can respectively drive the detecting devices 40 to move on the corresponding frame rods. Each detection device 40 includes a body 42 , a probe set 43 and a conductive set 44 . The base 42 is movably disposed on a corresponding frame rod. The probe set 43 A first lifting base 430 and a plurality of probes 431 are included. The first lifting base 430 is detachably mounted on the base 42. The probes 431 are coupled to the first lifting block 430 for contacting the contact points 80 on the detecting board 8 to input test signals into the corresponding vertical or horizontal pixels of the panel 7, such as The second picture shows. The conductive group 44 includes a second lifting base 440 and a conductive cotton 441. The second lifting base 440 is detachably mounted on the base 42. The conductive cotton 441 is coupled to the top surface of the second lifting base 440 for contacting the detecting line 81 on the detecting board 8 to the end of the panel 7 to input electric power into the corresponding longitudinal direction of the panel 7 or The switching circuit of the horizontal pixel is as shown in the second figure. Each drive portion 41 includes a rack 45, a gear 46, and a motor 47. The rack 45 is disposed on the corresponding frame rod. The gear 46 meshes with the rack 45. The motor 47 is disposed on the base 42 of the corresponding detecting device 40. In the present embodiment, the plurality of driving portions 41 on the same frame rod share a single rack 45.
在該第三圖中係顯示,該雷射修補裝置5係可移動地設於該龍門12,可對機台1上的面板的進行雷射修補。該影像擷取裝置6係結合於該雷射修補裝置5上,可供擷取該面板的影像。In the third figure, the laser repairing device 5 is movably disposed on the gantry 12 to perform laser repair on the panel on the machine 1. The image capturing device 6 is coupled to the laser repairing device 5 for capturing images of the panel.
在該第十圖中係顯示,每一探針431具有一探針管432、一伸縮桿433及一彈簧434。該探針管432係結合在該第一昇降座430。該探針管432朝上的一端具一開口435。該探針管432的內側管壁上具有一定位凸部436。該伸縮桿433係一端具有一探針頭437,另一端係由該開口435延伸入該探針管432中,且具有一凸塊438,該凸塊438係可被該定位凸部436限制在該探針管432中。該彈 簧434係設在該探針管432中且頂於該凸塊438,供將該伸縮桿433朝該開口435的方向頂出。In the tenth figure, each probe 431 has a probe tube 432, a telescopic rod 433 and a spring 434. The probe tube 432 is coupled to the first lifting base 430. The upward end of the probe tube 432 has an opening 435. The probe tube 432 has a positioning protrusion 436 on the inner tube wall. The telescopic rod 433 has a probe head 437 at one end, and the other end extends into the probe tube 432 from the opening 435, and has a protrusion 438, which is limited by the positioning protrusion 436. The probe tube 432 is in the middle. The bomb A spring 434 is disposed in the probe tube 432 and is mounted on the protrusion 438 for ejecting the telescopic rod 433 toward the opening 435.
第十一、十二圖係顯示,一取料機構(圖中未示)將該面板送至該框體10上方時,該些支撐桿20上的複數氣孔201會對該面板7的底面吹氣,以使該面板7略微懸浮。當該面板7的兩垂接相鄰接的側邊頂靠到該些固定裝置3的定位塊31時,該驅動器30會驅動該定位塊31移動以將該面板7頂於定位。此時該些支撐桿20上的複數氣孔201會產生吸力以吸住該面板7的底面。之後,該燈源朝該面板投射光線,該探針組43的探針431可上昇接觸該檢測板供將測試訊號輸入該面板7。而該龍門12可於該框體10上方移動,該雷射修補裝置5可於該龍門12上移動以修補該面板7上的瑕疵,該影像擷取裝置6可於該龍門12上移動以擷取該面板7的影像供檢查。The eleventh and twelfth drawings show that when a reclaiming mechanism (not shown) sends the panel to the upper side of the frame 10, the plurality of air holes 201 on the support bars 20 will blow the bottom surface of the panel 7. Gas to make the panel 7 slightly suspended. When the two adjacent sides of the panel 7 abut against the positioning block 31 of the fixing device 3, the driver 30 drives the positioning block 31 to move to position the panel 7. At this time, the plurality of air holes 201 on the support rods 20 generate suction to attract the bottom surface of the panel 7. Thereafter, the light source projects light toward the panel, and the probe 431 of the probe set 43 can ascend contact with the detection board for inputting a test signal to the panel 7. The gantry 12 is movable over the frame 10, and the laser repairing device 5 is movable on the gantry 12 to repair the cymbal on the panel 7. The image capturing device 6 can be moved on the gantry 12 to The image of the panel 7 is taken for inspection.
第八、十圖係顯示,該第一昇降座430帶動該探針431上昇至使該探針頭437接觸該檢測板8時,該伸縮桿433係可藉由該彈簧434的作用而於該探針管432一端彈性伸縮,以緩衝該探針431接觸該檢測板8的力道。如此,便可避免該探針431與該檢測板8的接觸力道過大,進而可因此增長該探針431的使用壽命。而且,該些探針431接觸該檢測板8的接觸點80時,如第二圖所示,係可將測試訊號輸入該面板7的相對應畫素的開關電路,以進行該面板的初步測試(第十五圖的a步驟)。The eighth and tenth views show that when the first lifting base 430 drives the probe 431 to rise to bring the probe head 437 into contact with the detecting board 8, the telescopic rod 433 can be acted upon by the spring 434. One end of the probe tube 432 is elastically stretched to buffer the force of the probe 431 contacting the detecting plate 8. In this way, the contact force between the probe 431 and the detecting board 8 can be prevented from being excessive, and thus the service life of the probe 431 can be increased. Moreover, when the probes 431 are in contact with the contact points 80 of the detecting board 8, as shown in the second figure, the test signals can be input into the corresponding pixel switching circuit of the panel 7 to perform preliminary testing of the panel. (Step a of the fifteenth figure).
第九圖係顯示,在利用該些探針431對該面板7進行初步測試並發現瑕疵後,可再利用該第二昇降座440帶動 該導電棉441上昇至接觸該檢測板8的檢測線路81,如第二圖所示,使該導電棉44可將電力輸入該面板7的相對應畫素的開關電路,以進一步確認是該面板7還是該檢測板8有瑕疵(第十五圖的b步驟),並藉此發現該檢測板8的瑕疵,以達到降低產品不良率及成本之目的。The ninth figure shows that after the panel 7 is initially tested and found by using the probes 431, the second lifting seat 440 can be reused. The conductive cotton 441 rises to the detecting line 81 contacting the detecting board 8, as shown in the second figure, so that the conductive cotton 44 can input power into the switching circuit of the corresponding pixel of the panel 7 to further confirm that the panel is 7 The test board 8 is also defective (step b of the fifteenth figure), and thereby the flaw of the test board 8 is found to achieve the purpose of reducing product defect rate and cost.
第十三、十四圖係顯示,當欲檢查該面板7位於該支撐桿20正上方的區域時,該第一驅動裝置21或該第二驅動裝置22係可驅動相對應的支撐桿20移動一距離,待檢查完畢後再將該支撐桿20移回原位。藉此,係可使得該面板7上的瑕疵不會被該支撐桿20的陰影所遮掩,而使該面板7的所有位置皆能被精確的檢查到,進而能大幅提昇面板檢查的精確度。The thirteenth and fourteenth drawings show that when the panel 7 is to be inspected in an area directly above the support rod 20, the first driving device 21 or the second driving device 22 can drive the corresponding support rod 20 to move. At a distance, the support rod 20 is moved back to the original position after the inspection is completed. Thereby, the cymbal on the panel 7 can be prevented from being obscured by the shadow of the support rod 20, so that all positions of the panel 7 can be accurately inspected, thereby greatly improving the accuracy of the panel inspection.
無論如何,任何人都可以從上述例子的說明獲得足夠教導,並據而了解本發明確實有產業上之利用性。而且又未見與本發明相同或類似的技術公開於前,所以本發明有新穎性及進步性,而符合發明專利要件,爰依法提出申請。In any case, anyone can obtain sufficient teaching from the description of the above examples and understand that the present invention does have industrial applicability. Moreover, the same or similar technology as the present invention has not been disclosed before, so the present invention is novel and progressive, and conforms to the invention patent requirements, and is filed according to law.
1‧‧‧機台1‧‧‧ machine
10‧‧‧框體10‧‧‧ frame
100‧‧‧第一框桿100‧‧‧first frame
101‧‧‧第二框桿101‧‧‧Second frame
102‧‧‧第三框桿102‧‧‧ Third frame
103‧‧‧第四框桿103‧‧‧Fourth pole
12‧‧‧龍門12‧‧‧Longmen
13‧‧‧軌道13‧‧‧ Track
2‧‧‧支撐機構2‧‧‧Support institutions
20‧‧‧支撐桿20‧‧‧Support rod
200‧‧‧防磨層200‧‧‧ wear layer
201‧‧‧氣孔201‧‧‧ stomata
20a‧‧‧驅動模組20a‧‧‧Drive Module
21‧‧‧第一驅動裝置21‧‧‧First drive
210‧‧‧伸縮壓缸210‧‧‧Retractable cylinder
211‧‧‧伸縮軸211‧‧‧ Telescopic shaft
22‧‧‧第二驅動裝置22‧‧‧Second drive
220‧‧‧齒條220‧‧‧ rack
221‧‧‧齒輪221‧‧‧ Gears
222‧‧‧馬達222‧‧‧ motor
3‧‧‧固定裝置3‧‧‧Fixed devices
30‧‧‧驅動器30‧‧‧ drive
31‧‧‧定位塊31‧‧‧ Positioning block
4‧‧‧檢測機構4‧‧‧Testing agency
40‧‧‧檢測裝置40‧‧‧Detection device
41‧‧‧驅動部41‧‧‧ Drive Department
42‧‧‧座體42‧‧‧ body
43‧‧‧探針組43‧‧‧ probe set
430‧‧‧第一昇降座430‧‧‧First lift
431‧‧‧探針431‧‧‧ probe
432‧‧‧探針管432‧‧‧ probe tube
433‧‧‧伸縮桿433‧‧‧ Telescopic rod
434‧‧‧彈簧434‧‧‧ Spring
435‧‧‧開口435‧‧‧ openings
436‧‧‧定位凸部436‧‧‧ positioning convex
437‧‧‧探針頭437‧‧‧ probe head
438‧‧‧凸塊438‧‧‧Bumps
44‧‧‧導電組44‧‧‧ Conductive group
440‧‧‧第二昇降座440‧‧‧Second lift
441‧‧‧導電棉441‧‧‧ conductive cotton
45‧‧‧齒條45‧‧‧ rack
46‧‧‧齒輪46‧‧‧ Gears
47‧‧‧馬達47‧‧‧Motor
5‧‧‧雷射修補裝置5‧‧‧Roar repairing device
6‧‧‧影像擷取裝置6‧‧‧Image capture device
7‧‧‧面板7‧‧‧ panel
8‧‧‧檢測板8‧‧‧Test board
80‧‧‧接觸點80‧‧‧Contact points
81‧‧‧檢測線路81‧‧‧Detection line
第一圖係本發明所述面板及檢測板的平面示意圖。The first figure is a schematic plan view of the panel and the detecting board of the present invention.
第二圖係本發明所述面板及檢測板的局部放大示意圖。The second figure is a partially enlarged schematic view of the panel and the detecting board of the present invention.
第三圖係本發明之立體圖。The third figure is a perspective view of the present invention.
第四圖係本發明之支撐機構的局部立體放大示意圖。The fourth figure is a partially enlarged perspective view of the support mechanism of the present invention.
第五圖係本發明之支撐機構的局部剖面放大示意圖。Figure 5 is a partial cross-sectional enlarged view of the support mechanism of the present invention.
第六圖係本發明之固定裝置的放大示意圖。Figure 6 is an enlarged schematic view of the fixture of the present invention.
第七圖係本發明之檢測機構的立體放大示意圖。The seventh drawing is a perspective enlarged view of the detecting mechanism of the present invention.
第八圖係本發明之探針組的動作示意圖。The eighth figure is a schematic view of the operation of the probe set of the present invention.
第九圖係本發明之導電組的動作示意圖。The ninth drawing is a schematic view of the operation of the conductive group of the present invention.
第十圖係本發明之探針的剖面放大示意圖。The tenth drawing is an enlarged schematic cross-sectional view of the probe of the present invention.
第十一圖係本發明之面板的定位動作示意圖(俯視)。The eleventh drawing is a schematic view of the positioning operation of the panel of the present invention (top view).
第十二圖係本發明之面板的定位動作示意圖(側視)。Fig. 12 is a schematic view showing the positioning operation of the panel of the present invention (side view).
第十三圖係本發明之支撐桿的動作示意圖(俯視)。The thirteenth drawing is a schematic view (top view) of the support rod of the present invention.
第十四圖係本發明之支撐桿的動作示意圖(側視)。Figure 14 is a schematic view (side view) of the support rod of the present invention.
第十五圖係本發明之面板雷射修補方法的流程圖。The fifteenth figure is a flow chart of the panel laser repairing method of the present invention.
100‧‧‧第一框桿100‧‧‧first frame
103‧‧‧第四框桿103‧‧‧Fourth pole
3‧‧‧固定裝置3‧‧‧Fixed devices
30‧‧‧驅動器30‧‧‧ drive
31‧‧‧定位塊31‧‧‧ Positioning block
4‧‧‧檢測機構4‧‧‧Testing agency
40‧‧‧檢測裝置40‧‧‧Detection device
41‧‧‧驅動部41‧‧‧ Drive Department
43‧‧‧探針組43‧‧‧ probe set
44‧‧‧導電組44‧‧‧ Conductive group
Claims (11)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW97126158A TWI400513B (en) | 2008-07-10 | 2008-07-10 | Laser repair apparatus for a panel |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW97126158A TWI400513B (en) | 2008-07-10 | 2008-07-10 | Laser repair apparatus for a panel |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201003188A TW201003188A (en) | 2010-01-16 |
TWI400513B true TWI400513B (en) | 2013-07-01 |
Family
ID=44825455
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW97126158A TWI400513B (en) | 2008-07-10 | 2008-07-10 | Laser repair apparatus for a panel |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI400513B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI693002B (en) * | 2017-12-18 | 2020-05-01 | 大陸商上海微電子裝備(集團)股份有限公司 | Additive manufacturing device and manufacturing method |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI547333B (en) * | 2013-02-04 | 2016-09-01 | 旭東機械工業股份有限公司 | Laser cut apparatus |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3704057A (en) * | 1971-06-02 | 1972-11-28 | American Cyanamid Co | Electrochromic device having identical display and counter electrode materials |
TW200519011A (en) * | 2003-10-17 | 2005-06-16 | Olympus Corp | Substrate conveying system |
TWI241934B (en) * | 2003-12-03 | 2005-10-21 | Quanta Display Inc | Apparatus and method for inspecting and repairing circuit defect |
TW200827690A (en) * | 2006-12-22 | 2008-07-01 | All Ring Tech Co Ltd | A test platform for light on test of LCD panels |
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2008
- 2008-07-10 TW TW97126158A patent/TWI400513B/en active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3704057A (en) * | 1971-06-02 | 1972-11-28 | American Cyanamid Co | Electrochromic device having identical display and counter electrode materials |
TW200519011A (en) * | 2003-10-17 | 2005-06-16 | Olympus Corp | Substrate conveying system |
TWI241934B (en) * | 2003-12-03 | 2005-10-21 | Quanta Display Inc | Apparatus and method for inspecting and repairing circuit defect |
TW200827690A (en) * | 2006-12-22 | 2008-07-01 | All Ring Tech Co Ltd | A test platform for light on test of LCD panels |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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TWI693002B (en) * | 2017-12-18 | 2020-05-01 | 大陸商上海微電子裝備(集團)股份有限公司 | Additive manufacturing device and manufacturing method |
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TW201003188A (en) | 2010-01-16 |
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