TWI399550B - Testing system and method - Google Patents

Testing system and method Download PDF

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TWI399550B
TWI399550B TW96145662A TW96145662A TWI399550B TW I399550 B TWI399550 B TW I399550B TW 96145662 A TW96145662 A TW 96145662A TW 96145662 A TW96145662 A TW 96145662A TW I399550 B TWI399550 B TW I399550B
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test
preset
switching
electronic product
test system
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TW96145662A
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TW200923382A (en
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Shih Fang Wong
Jiang-Feng Shan
Tsung Jen Chuang
Wen-Wu Wang
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Hon Hai Prec Ind Co Ltd
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測試系統及方法 Test system and method

本發明涉及測試系統,尤其涉及一種對電子產品進行測試的測試系統及方法。 The present invention relates to a test system, and more particularly to a test system and method for testing an electronic product.

隨著電子技術的迅猛發展,電子產品的功能越來越多元化,產品組裝技術也越來越精細。對應的,產品功能測試也越來越重要。然而,目前對產品電路板的測試都是需要經過專門訓練的技術人員採用萬用表和示波器等測試裝置逐項檢測電路板是否達到對應的技術指標,在測試的過程中需要根據測試專案反復移動電子產品或測試裝置,浪費了人力物力不說,還浪費了大量的時間。另外,技術人員在測試的過程中難免會出現失誤,導致測試結果不準確。 With the rapid development of electronic technology, the functions of electronic products are becoming more diversified, and the product assembly technology is becoming more and more refined. Correspondingly, product functional testing is also becoming more and more important. However, at present, the test of the product board requires a specially trained technician to test whether the board meets the corresponding technical specifications by using a test device such as a multimeter and an oscilloscope. In the process of testing, it is necessary to repeatedly move the electronic product according to the test project. Or testing the device, wasting human and material resources, and wasting a lot of time. In addition, technicians will inevitably make mistakes during the testing process, resulting in inaccurate test results.

有鑒於此,有必要提供一種可自動測試電子產品的測試系統。 In view of this, it is necessary to provide a test system that can automatically test electronic products.

此外,還有必要提供一種可自動測試電子產品的測試方法。 In addition, it is necessary to provide a test method that can automatically test electronic products.

一種測試系統,包括測試介面、主控制器、訊號產生器和儀表單元。該測試介面包括用於與待測電子產品的測試點相連 的複數測試管腳。該主控制器用於輸出控制指令。該訊號產生器用於根據該控制指令輸出預設訊號,該預設訊號通過該測試介面輸入到該待測電子產品。該儀表單元包括用於從對應測試管腳讀取測試資料並輸出到該主控制器的複數儀表;該主控制器還用於判斷該測試資料是否在正常範圍之內並記錄。 A test system including a test interface, a main controller, a signal generator, and a meter unit. The test interface includes a test point for connecting to the electronic product to be tested The plural test pins. The main controller is used to output control commands. The signal generator is configured to output a preset signal according to the control command, and the preset signal is input to the electronic product to be tested through the test interface. The meter unit includes a plurality of meters for reading test data from the corresponding test pins and outputting to the main controller; the main controller is further configured to determine whether the test data is within a normal range and record.

一種測試方法,包括以下步驟:生成控制指令;根據該控制指令向待測電子產品輸出預設訊號;從該電子產品讀取測試資料;判斷該測試資料是否在正常範圍之內並記錄。 A testing method includes the following steps: generating a control command; outputting a preset signal to the electronic product to be tested according to the control command; reading the test data from the electronic product; determining whether the test data is within a normal range and recording.

所述測試系統的測試介面與待測電子產品的所有測試點相連,藉由控制單元向電子產品輸出不同的預設資料,藉由儀表單元讀取對應的測試資料,最後以該控制單元判斷測試資料是否正常,從而判斷電子產品是否合格,整個過程無需移動電子產品,可自動完成。該測試系統和測試方法的測試流程簡單、易操作,工作人員不需經過培訓即可獨立操作該測試系統,測試系統可自動完成所有測試專案而不需移動待測電子產品,節省了人力和物力,降低了整個測試所需的成本,提高了產品的測試效率以及測試結果的正確率。 The test interface of the test system is connected to all test points of the electronic product to be tested, and the control unit outputs different preset data to the electronic product, and the corresponding test data is read by the meter unit, and finally the test unit judges the test. Whether the data is normal or not, so as to judge whether the electronic product is qualified, the whole process does not need to move the electronic product, and can be automatically completed. The testing process of the test system and the test method is simple and easy to operate, and the worker can operate the test system independently without training. The test system can automatically complete all test projects without moving the electronic product to be tested, saving manpower and material resources. , reducing the cost of the entire test, improving the test efficiency of the product and the correct rate of test results.

10,50‧‧‧測試系統 10,50‧‧‧Test system

12‧‧‧測試介面 12‧‧‧Test interface

14‧‧‧儀表單元 14‧‧‧ instrument unit

16‧‧‧主控制器 16‧‧‧Master Controller

18‧‧‧訊號產生器 18‧‧‧Signal Generator

20‧‧‧切換單元 20‧‧‧Switch unit

30‧‧‧電子產品 30‧‧‧Electronic products

70‧‧‧兩連片電路板 70‧‧‧Two continuous circuit boards

100‧‧‧測試方法 100‧‧‧Test method

182‧‧‧切換控制電路 182‧‧‧Switching control circuit

184‧‧‧電源電路 184‧‧‧Power circuit

186‧‧‧振盪電路 186‧‧‧Oscillation circuit

S101~S107‧‧‧測試方法之流程步驟 S101~S107‧‧‧ Test procedure

圖1為一較佳實施方式之測試系統之結構框圖。 1 is a block diagram of a test system of a preferred embodiment.

圖2為另一較佳實施方式之測試系統之結構框圖。 2 is a block diagram showing the structure of a test system according to another preferred embodiment.

圖3為一較佳實施方式之測試方法之流程圖。 3 is a flow chart of a test method of a preferred embodiment.

如圖1所示,用於對電子產品30進行測試的測試系統10包括測試介面12、儀表單元14、主控制器16、訊號產生器18以及切換單元20。 As shown in FIG. 1, the test system 10 for testing the electronic product 30 includes a test interface 12, a meter unit 14, a main controller 16, a signal generator 18, and a switching unit 20.

測試介面12為測試系統10的輸入/輸出(Input/Output,I/O)介面,其包括複數測試管腳,分別與電子產品30的對應測試點相連,例如與電子產品30的訊號輸入端口、訊號輸出端口、電源端口,以及電子產品30的電路板中待測元器件的端口相連。對應的,上述複數測試管腳可分為輸出測試管腳和輸入測試管腳。其中,輸出測試管腳的一端與電子產品30的訊號輸入端口或電源端相連,另一端藉由切換單元20與訊號產生器18相連。輸入測試管腳的一端與電子產品30的訊號輸出端或待測元器件的端口相連,另一端藉由切換單元20與儀表單元14相連。本實施例中,測試管腳採用雙頭針。 The test interface 12 is an input/output (I/O) interface of the test system 10, which includes a plurality of test pins respectively connected to corresponding test points of the electronic product 30, for example, with a signal input port of the electronic product 30, The signal output port, the power port, and the port of the component to be tested in the circuit board of the electronic product 30 are connected. Correspondingly, the above plurality of test pins can be divided into an output test pin and an input test pin. The one end of the output test pin is connected to the signal input port or the power end of the electronic product 30, and the other end is connected to the signal generator 18 by the switching unit 20. One end of the input test pin is connected to the signal output end of the electronic product 30 or the port of the component to be tested, and the other end is connected to the meter unit 14 by the switching unit 20. In this embodiment, the test pin uses a double-ended needle.

儀表單元14包括複數儀表,分別用於在切換單元20的控制下以一定順序或同時從對應輸入測試管腳讀取測試資料並輸出到主控制器16。上述複數儀表可以包括用於測量電流的電流計、測量電壓的電壓計和用於測量頻率的頻率計。 The meter unit 14 includes a plurality of meters for respectively reading test data from the corresponding input test pins in a certain order or simultaneously under the control of the switching unit 20 and outputting them to the main controller 16. The above plurality of meters may include an ammeter for measuring current, a voltmeter for measuring voltage, and a frequency meter for measuring frequency.

本實施例中,主控制器16是一台安裝有測試程式的電腦,用於控制測試的進程、切換測試專案、計算和記錄測試結果。本實施例中,主控制器16與訊號產生器18和儀表單元14相連,其根據設定向訊號產生器18發送控制指令並接收儀表單元14輸出的測試資料,對測試資料進行分析,生成並記錄測試 結果。主控制器16還可以即時將該測試結果向用戶顯示,並在對應的測試資料超出正常範圍時報警或輸出提示訊號。 In this embodiment, the main controller 16 is a computer with a test program installed to control the progress of the test, switch the test project, calculate and record the test results. In this embodiment, the main controller 16 is connected to the signal generator 18 and the meter unit 14, and sends a control command to the signal generator 18 according to the setting and receives the test data output by the meter unit 14, analyzes the test data, generates and records the test data. test result. The main controller 16 can also display the test result to the user in real time, and alarm or output a prompt signal when the corresponding test data is out of the normal range.

訊號產生器18包括可編程控制器(programmable logic controller,PLC)及週邊電路,用於對主控制器16輸出的控制指令進行解碼,生成切換指令以控制切換單元20選擇測試專案,同時生成預設訊號並藉由切換單元20和對應輸出測試管腳輸出到電子產品30。其中,預設訊號可以是預設電流,預設電壓或預設頻率。容易理解的,不同的電子產品30具有不同種類的測試專案,因此需採用擴展單元對上述可編程控制器的輸入/輸出介面進行擴展,以備傳輸複數測試資料。擴展單元可為擴展晶片,例如8255可編程並行I/O擴展介面。而當需要測試的專案比較少時,也可以不採用擴展單元14。 The signal generator 18 includes a programmable logic controller (PLC) and peripheral circuits for decoding the control command output by the main controller 16, generating a switching command to control the switching unit 20 to select a test project, and generating a preset. The signal is output to the electronic product 30 by the switching unit 20 and the corresponding output test pin. The preset signal may be a preset current, a preset voltage or a preset frequency. It is easy to understand that different electronic products 30 have different kinds of test projects, so an expansion unit is needed to expand the input/output interface of the above programmable controller in order to transmit complex test data. The expansion unit can be an expansion chip, such as an 8255 programmable parallel I/O expansion interface. When the number of projects to be tested is relatively small, the expansion unit 14 may not be used.

本實施例中,訊號產生器18包括切換控制電路182、電源電路184和振盪電路186。切換控制電路182用於對主控制器16輸出的控制指令進行解碼,生成切換指令以控制切換單元20的動作。 In this embodiment, the signal generator 18 includes a switching control circuit 182, a power supply circuit 184, and an oscillating circuit 186. The switching control circuit 182 is configured to decode the control command output by the main controller 16 and generate a switching command to control the operation of the switching unit 20.

電源電路184用於產生預設電壓和電流,主要用以對電子產品30進行電壓和電流測試。很多電子產品30都具有外接電源供電方式和電池供電方式兩種供電方式,有的電子產品30還具有通用資料匯流排介面供電方式。在測試該等電子產品30時,需在不同供電方式下實現所有電壓、電流和頻率測試。為此,電源電路184包括複數電源單元,分別輸出不同的預 設電壓和電流以類比不同的供電方式。 The power circuit 184 is used to generate a preset voltage and current, and is mainly used for voltage and current testing of the electronic product 30. Many electronic products 30 have two power supply modes: an external power supply mode and a battery power supply mode, and some electronic products 30 also have a universal data bus interface power supply mode. When testing these electronic products 30, all voltage, current and frequency tests are required under different power supply modes. To this end, the power supply circuit 184 includes a plurality of power supply units that respectively output different pre-conditions. Set the voltage and current to be analogous to the different power supply methods.

振盪電路186用於產生預設頻率。當電子產品30為包括兩個以上電路板的集合體電路板(即以板對板方式互聯的電路板,例如combo光碟機)時,則該預設頻率可用於檢驗該兩個以上集合電路板之間的連接。其具體測試方法為:振盪電路186輸出預設頻率,該預設頻率通過測試介面從電子產品30的其中一個集合電路板的訊號輸入端口輸入,儀表單元14中的頻率計由切換單元20連接到另一塊集合電路板的對應的訊號輸出端口上,主控制器16從頻率計接收檢測到的頻率訊號,判斷是否失真以及失真的程度,再結合常規的阻抗測試即可判斷兩塊集合電路板的連接是否良好。當電子產品30為無線產品時,還可檢測到其無線通訊品質是否合格。振盪電路186也可包括複數振盪電路單元,用於產生不同的預設頻率,每個振盪電路單元的輸出端都可藉由一開關(屬於切換單元20)連接到測試電子產品30的訊號輸入端口。這樣,可藉由切換上述開關,先後以不同頻率對電子產品30進行測試。 The oscillating circuit 186 is operative to generate a preset frequency. When the electronic product 30 is an assembly circuit board including two or more circuit boards (ie, a circuit board interconnected in a board-to-board manner, such as a combo optical disc drive), the preset frequency can be used to verify the two or more collective circuit boards. the connection between. The specific test method is: the oscillating circuit 186 outputs a preset frequency, which is input from a signal input port of one of the integrated circuit boards of the electronic product 30 through a test interface, and the frequency meter in the meter unit 14 is connected to the switching unit 20 by the switching unit 20 On the corresponding signal output port of another collective circuit board, the main controller 16 receives the detected frequency signal from the frequency meter to determine whether the distortion and the degree of distortion, and then combines the conventional impedance test to determine the two sets of circuit boards. The connection is good. When the electronic product 30 is a wireless product, it can also detect whether the wireless communication quality is qualified. The oscillating circuit 186 can also include a plurality of oscillating circuit units for generating different preset frequencies, and the output of each oscillating circuit unit can be connected to the signal input port of the test electronic product 30 by a switch (belonging to the switching unit 20). . Thus, the electronic product 30 can be tested at different frequencies by switching the above switches.

切換單元20包括複數開關,其中部分連接在儀表單元14的複數儀表與測試介面12之間,用於根據訊號產生器18輸出的切換指令切換儀表單元14到測試介面12的連接,以控制儀表單元14中對應儀表從測試介面12的對應輸入測試管腳讀取測試資料。另一部分開關連接在訊號產生器18與測試介面12之間,用於根據訊號產生器18輸出的切換指令切換訊號產生器18到測試介面12的連接,以控制將訊號產生器18輸出的預設資 料通過對應的輸出測試管腳輸出到電子產品30。容易理解的,當儀表單元14中的儀表較多時,主控制器16的輸入/輸出端口可能會不夠用,此時需在主控制器16與儀表單元14之間連接開關。本實施例中切換單元20中的開關採用繼電器,當然也可採用其他類型的電子開關。 The switching unit 20 includes a plurality of switches, which are partially connected between the plurality of meters of the meter unit 14 and the test interface 12 for switching the connection of the meter unit 14 to the test interface 12 according to the switching instruction output by the signal generator 18 to control the meter unit. The corresponding meter in 14 reads the test data from the corresponding input test pin of the test interface 12. The other part of the switch is connected between the signal generator 18 and the test interface 12 for switching the connection of the signal generator 18 to the test interface 12 according to the switching instruction output by the signal generator 18 to control the preset output by the signal generator 18. Capital The material is output to the electronic product 30 through the corresponding output test pin. It is easy to understand that when there are many meters in the meter unit 14, the input/output port of the main controller 16 may not be sufficient, and the switch needs to be connected between the main controller 16 and the meter unit 14. In the embodiment, the switch in the switching unit 20 uses a relay, and of course other types of electronic switches can also be used.

測試系統10的具體工作過程為:主控制器16根據設定向訊號產生器18下達一個測試專案的控制指令,訊號產生器18中的切換控制電路182根據該控制指令生成切換指令,控制切換單元20中的對應開關將電源電路184或振盪電路186輸出的預設訊號通過對應輸出測試管腳輸出到電子產品30中,同時還控制切換單元20將儀表單元14中的對應儀表連接到測試介面12的對應測試管腳上,以讀取電子產品30的輸出訊號(即測試資料)。主控制器16從儀表單元14接收和存儲測試資料,並進行分析判斷以生成結果,如果測試結果在正常範圍內,主控制器16下達下一個測試專案的控制指令。如果測試結果超出正常範圍,主控制器16報警或輸出提示資訊,然後下達下一個測試專案的控制指令。這樣,切換單元20在主控制器16的控制下,不斷將不同的預設資料登錄電子產品30,並切換對應的儀表讀取相應的測試資料,整體配合,自動完成測試過程而不需移動電子產品30。 The specific working process of the test system 10 is: the main controller 16 issues a control command to the signal generator 18 according to the setting, and the switching control circuit 182 in the signal generator 18 generates a switching instruction according to the control command, and controls the switching unit 20 The corresponding switch in the power circuit 184 or the oscillating circuit 186 outputs the preset signal to the electronic product 30 through the corresponding output test pin, and also controls the switching unit 20 to connect the corresponding meter in the meter unit 14 to the test interface 12. Corresponding to the test pin, the output signal (ie, test data) of the electronic product 30 is read. The main controller 16 receives and stores the test data from the meter unit 14, and performs an analysis and judgment to generate a result. If the test result is within the normal range, the main controller 16 issues a control command for the next test project. If the test result is out of the normal range, the main controller 16 alarms or outputs a prompt message, and then releases the control command of the next test project. In this way, under the control of the main controller 16, the switching unit 20 continuously logs different preset data into the electronic product 30, and switches the corresponding meter to read the corresponding test data, and the overall cooperation automatically completes the testing process without moving the electronic device. Product 30.

另一較佳實施例中,測試系統50包括測試介面12、複數儀表單元14、主控制器16、訊號產生器18、以及複數切換單元20,可用于進行多連片電路板的測試。其中,多連片電路板是 指一完整的電路板上包括複數相同的電路區域,最終該多連片電路板將按區域被分割為複數獨立的電路板(電子產品30)。如圖2所示,本實施例中,測試系統50包括兩個儀表單元14和兩個切換單元20,用於進行兩連片電路板70的測試。測試系統50在同時對多連片電路板70中的兩個電子產品30進行測試時,兩個電子產品30對應的儀表單元14和切換單元20相互獨立,訊號產生器18控制兩個儀表單元14中的對應儀表同時對兩個電子產品30的相同專案進行測試,該儀表讀到測試資料後立刻控制進行下一個專案的測試。 In another preferred embodiment, the test system 50 includes a test interface 12, a plurality of meter units 14, a main controller 16, a signal generator 18, and a plurality of switching units 20 that can be used to test a multi-connected circuit board. Among them, the multi-connected circuit board is A complete circuit board includes a plurality of identical circuit regions, and finally the multi-connected circuit board is divided into a plurality of independent boards (electronics 30) by region. As shown in FIG. 2, in the present embodiment, the test system 50 includes two meter units 14 and two switching units 20 for testing the two-piece circuit board 70. When the test system 50 tests two electronic products 30 in the multi-piece circuit board 70 at the same time, the meter unit 14 and the switching unit 20 corresponding to the two electronic products 30 are independent of each other, and the signal generator 18 controls the two meter units 14 The corresponding meter in the test simultaneously tests the same project of the two electronic products 30, and the meter controls the test of the next project immediately after reading the test data.

如圖3所示,一較佳實施例中,應用於測試系統10的測試方法100包括以下步驟: As shown in FIG. 3, in a preferred embodiment, the test method 100 applied to the test system 10 includes the following steps:

步驟S101,主控制器向切換控制電路182輸出控制指令。 In step S101, the main controller outputs a control command to the switching control circuit 182.

步驟S102,切換控制電路182根據該控制指令向切換單元20輸出切換指令。 In step S102, the switching control circuit 182 outputs a switching instruction to the switching unit 20 in accordance with the control command.

步驟S103,切換單元20根據該切換指令將電源電路184或振盪電路186輸出的某一預設電壓、電流或頻率訊號通過對應輸出測試管腳輸出到電子產品30中。其中,該電子產品30可以是集合體電路板。 In step S103, the switching unit 20 outputs a predetermined voltage, current or frequency signal output by the power circuit 184 or the oscillating circuit 186 to the electronic product 30 through the corresponding output test pin according to the switching instruction. The electronic product 30 can be an integrated circuit board.

步驟S104,切換單元20同時根據該切換指令將儀表單元14中的對應儀表連接到測試介面12的對應測試管腳上,以從電子產品30讀取測試資料。該測試資料可包括對應元器件的的電壓和電流訊號,訊號輸出端口的電壓、電流或頻率訊號。 In step S104, the switching unit 20 simultaneously connects the corresponding meter in the meter unit 14 to the corresponding test pin of the test interface 12 according to the switching instruction to read the test data from the electronic product 30. The test data may include voltage and current signals of the corresponding components, voltage, current or frequency signals of the signal output port.

步驟S105,主控制器16從儀表單元14接收和存儲測試資料,對該測試資料進行分析判斷以生成測試結果,並存儲。其中,生成測試結果的步驟可包括藉由對複數測試資料進行計算以得到一測試結果資料的步驟。 In step S105, the main controller 16 receives and stores the test data from the meter unit 14, analyzes and judges the test data to generate test results, and stores them. The step of generating a test result may include the step of obtaining a test result data by calculating the plurality of test data.

步驟S106,主控制器16判斷該測試資料或測試結果是否在正常範圍之內。如果測試結果在正常範圍內,則進行下一項測試,執行步驟S101。如果測試資料或測試結果超出正常範圍,執行步驟S107。 In step S106, the main controller 16 determines whether the test data or the test result is within the normal range. If the test result is within the normal range, the next test is performed, and step S101 is performed. If the test data or the test result is out of the normal range, step S107 is performed.

步驟S107,主控制器16根據情況報警或輸出提示資訊,然後進行下一項測試,執行步驟S101。當然,如果本測試專案結果關係到電子產品30是否合格,或可影響其他測試專案的進行,可在檢測其超出正常範圍後停止進行後續檢測專案,節省流程。 In step S107, the main controller 16 alarms or outputs the prompt information according to the situation, and then performs the next test, and executes step S101. Of course, if the result of this test project is related to the eligibility of the electronic product 30, or may affect the progress of other test projects, the follow-up test project may be stopped after the detection of the test project beyond the normal range, thereby saving the process.

綜上所述,本發明具有測試流程簡單、易操作、可自動完成設定測試專案而不需移動待測電子產品的優點,節省了人力和物力,降低了整個測試所需的成本,提高了產品的測試效率以及測試結果的正確率。 In summary, the invention has the advantages of simple test procedure, easy operation, automatic setting of the test project without moving the electronic product to be tested, saving manpower and material resources, reducing the cost required for the whole test, and improving the product. Test efficiency and the correct rate of test results.

10‧‧‧測試系統 10‧‧‧Test system

12‧‧‧測試介面 12‧‧‧Test interface

14‧‧‧儀表單元 14‧‧‧ instrument unit

16‧‧‧主控制器 16‧‧‧Master Controller

18‧‧‧訊號產生器 18‧‧‧Signal Generator

20‧‧‧切換單元 20‧‧‧Switch unit

30‧‧‧電子產品 30‧‧‧Electronic products

182‧‧‧切換控制電路 182‧‧‧Switching control circuit

184‧‧‧電源電路 184‧‧‧Power circuit

186‧‧‧振蕩電路 186‧‧‧Oscillation circuit

Claims (14)

一種測試系統,其改良在於,包括:測試介面,包括用於與待測電子產品的測試點相連的複數測試管腳;主控制器,用於輸出控制指令;訊號產生器,用於根據該控制指令輸出預設訊號;該預設訊號通過該測試介面輸入到該待測電子產品;儀表單元,包括用於從對應測試管腳讀取測試資料並輸出到該主控制器的複數儀表;該主控制器還用於判斷該測試資料是否在正常範圍之內並記錄。 A test system, the improvement comprising: a test interface comprising a plurality of test pins for connecting to test points of an electronic product to be tested; a main controller for outputting control commands; and a signal generator for controlling according to the control The command outputs a preset signal; the preset signal is input to the electronic product to be tested through the test interface; the meter unit includes a plurality of instruments for reading test data from the corresponding test pin and outputting to the main controller; The controller is also used to determine whether the test data is within the normal range and recorded. 如申請專利範圍第1項所述之測試系統,其中該預設訊號至少包括以下中的一種:預設電流,預設電壓,預設頻率。 The test system of claim 1, wherein the preset signal includes at least one of the following: a preset current, a preset voltage, and a preset frequency. 如申請專利範圍第1項所述之測試系統,其中該訊號產生器還用於根據該控制指令輸出切換指令。 The test system of claim 1, wherein the signal generator is further configured to output a switching instruction according to the control instruction. 如申請專利範圍第3項所述之測試系統,其中該測試系統還包括切換單元,用於根據該切換指令切換該儀表單元與該測試介面的連接,以控制該儀表單元從對應測試管腳讀取測試資料。 The test system of claim 3, wherein the test system further comprises a switching unit, configured to switch the connection between the meter unit and the test interface according to the switching instruction, to control the meter unit to read from the corresponding test pin. Take test data. 如申請專利範圍第4項所述之測試系統,其中該切換單元包括複數開關。 The test system of claim 4, wherein the switching unit comprises a plurality of switches. 如申請專利範圍第5項所述之測試系統,其中該開關由繼電器控制。 The test system of claim 5, wherein the switch is controlled by a relay. 如申請專利範圍第4項所述之測試系統,其中該訊號產生器包括:切換控制電路,用於根據該控制指令生成該切換指令;電源電路,用於生成預設電壓和電流;振盪電路,用於生成預設頻率。 The test system of claim 4, wherein the signal generator comprises: a switching control circuit for generating the switching instruction according to the control instruction; a power supply circuit for generating a preset voltage and current; and an oscillating circuit, Used to generate a preset frequency. 如申請專利範圍第3項所述之測試系統,其中該測試系統還包括切換單元,用於根據該切換指令切換該訊號產生器與該測試介面的連接,以控制將該預設訊號通過對應測試管腳輸出到該待測電子產品。 The test system of claim 3, wherein the test system further includes a switching unit, configured to switch a connection between the signal generator and the test interface according to the switching instruction, to control the preset signal to pass the corresponding test. The pin is output to the electronic product to be tested. 如申請專利範圍第8項所述之測試系統,其中該切換單元包括複數開關。 The test system of claim 8, wherein the switching unit comprises a plurality of switches. 如申請專利範圍第9項所述之測試系統,其中該開關由繼電器控制。 The test system of claim 9, wherein the switch is controlled by a relay. 如申請專利範圍第8項所述之測試系統,其中該訊號產生器包括:切換控制電路,用於根據該控制指令生成該切換指令;電源電路,用於生成預設電壓和電流;振盪電路,用於生成預設頻率。 The test system of claim 8, wherein the signal generator comprises: a switching control circuit for generating the switching instruction according to the control instruction; a power supply circuit for generating a preset voltage and current; and an oscillating circuit, Used to generate a preset frequency. 一種測試方法,包括以下步驟:生成控制指令;根據該控制指令生成切換指令;根據該切換指令將用於讀取該測試資料的對應儀表連接到該待測電子產品的對應端口上,以從該待測電子產品讀取測試資料;從該電子產品讀取測試資料;判斷該測試資料是否在正常範圍之內並記錄。 A test method includes the steps of: generating a control instruction; generating a switching instruction according to the control instruction; and connecting, according to the switching instruction, a corresponding meter for reading the test data to a corresponding port of the electronic product to be tested, to The test product is read by the electronic product to be tested; the test data is read from the electronic product; the test data is judged to be within the normal range and recorded. 如申請專利範圍第12項所述之測試方法,其中該預設訊號至少包括以下中的一種:預設電流,預設電壓,預設頻率。 The test method of claim 12, wherein the preset signal comprises at least one of the following: a preset current, a preset voltage, and a preset frequency. 如申請專利範圍第13項所述之測試方法,其中該根據該控制指令向待測電子產品輸出預設訊號步驟包括:根據該控制指令生成切換指令;根據該切換指令切換用於生成該預設訊號的模組的端口與該待測電子產品的連接,以控制將對應預設訊號輸出到該待測電子產品的對應端口。 The test method of claim 13, wherein the step of outputting the preset signal to the electronic product to be tested according to the control instruction comprises: generating a switching instruction according to the control instruction; switching according to the switching instruction for generating the preset The port of the module of the signal is connected to the electronic product to be tested to control the output of the corresponding preset signal to the corresponding port of the electronic product to be tested.
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