TWI427299B - High - pressure multi - point test equipment and method with main and auxiliary steps - Google Patents

Description

High-pressure multi-point test equipment and method with main and auxiliary steps

The present invention relates to a detecting device, and more particularly to a high-pressure multi-point testing device and method for a primary and secondary step in which a plurality of test objects are connected in parallel in a group mode.

For general parts testing, such as motors, fans or transformers, etc., the quality inspection must use a pressure-resistant machine to perform high-voltage measurement to confirm whether the object under test meets the withstand voltage conditions of safety specifications.

Therefore, in order to ensure that each part is a good product, a high-voltage test procedure is required before each component is shipped. If a transformer is taken as an example, the transformer must at least test the primary core, the core to the secondary and the primary to the secondary. After three test procedures, if each test must be tested for 1 second, each transformer must take 3 seconds to test the second transformer, resulting in lengthy test time, wasted manpower and time, and is not economical.

Therefore, in order to improve the above-mentioned shortcomings, that is, when a group parallel test equipment is available, multiple sets of transformers can be tested at the same time to save test time and manpower; however, multiple sets of test objects can be tested at the same time, although the test time can be shortened. And manpower, but when there are defective products in the test group, at this stage, all the objects to be tested in the group are temporarily judged to be bad, and then the second test is performed through a lengthy test procedure, and such a test method is easy for the personnel. Mishandling, resulting in mixing, and can not do statistical analysis of data.

In addition, when the high voltage test is actually carried out, if the contact point with the object to be tested is in poor contact, arcing often occurs, which may affect the life of the contact point in the long run; and because of poor contact, the high voltage may not be reliably transmitted to the contact point. When the object to be tested is damaged, the defective voltage product is misidentified as a good product. For high-voltage generating equipment, the above-mentioned arc light will cause interference to the equipment itself and even other auxiliary test equipment, which will affect the reliability and stability of the equipment, and thus the reliability of the test results.

It can be seen that the above-mentioned conventional test equipment and test methods have great defects to be improved.

The first object of the present invention is to provide a high-pressure multi-point testing device and method with main and auxiliary steps, which are to test the object to be tested in the main and sub-test step separation mode, so as to reduce the test time and improve the test speed.

A second object of the present invention is to provide a high-voltage multi-point test apparatus and method having a main and a sub-step, which is to automatically enter a sub-step test program when the main step test program determines that the test object group is defective. The test object is tested to find the real defective product.

A third object of the present invention is to provide a high-pressure multi-point testing device and method with a main and a sub-step, which displays the position of a real bad test object on a panel, so that the operator can easily remove the defective product.

A fourth object of the present invention is to provide a main high voltage multi-point test apparatus and method for outputting a true bad test object position signal on a backplane contact, and rejecting the defective product by an automatic device.

A fifth object of the present invention is to provide a main high voltage multi-point test apparatus and method for performing contact inspection with an object to be tested before a high voltage test to avoid test errors.

The high-pressure multi-point testing device with the main and auxiliary steps capable of achieving the above object includes: a high/low voltage switching device comprising a plurality of high voltage switches and a plurality of low voltage switches, wherein the voltage output mode of the high/low voltage switching device is a high voltage Switching of the switch and the low-voltage switch; a test channel group comprising a plurality of test channels, each of which is matched with a high-voltage switch and a low-voltage switch of the high/low voltage switching device, so that a single test channel is used to convert the voltage An output mode; a high voltage generating device having a high voltage end and a low voltage end connected to all high voltage switches of the high/low voltage switching device; a current detecting device coupled to the high voltage generating device a low-voltage end and a high-low voltage switching device for detecting a current value; and a central control unit for storing a main step test program and a sub-step test program, wherein the test parameters of the main step test program and the sub-step test program include Test voltage, test time, the central control unit will drive the high voltage output device to generate high voltage output and control high / Voltage switching means of the voltage output mode, the output of the test channel group for a plurality of groups and a plurality of sets of high voltage low voltage signal, to simultaneously detect a plurality of analytes for, and receives a current detecting means for transmitting a current signal.

A high-pressure multi-point test method for achieving the above-mentioned objects, comprising: (1) driving a high-voltage output device to generate high-voltage output and control through a central control unit for storing a main step test program and a sub-step test program a voltage output mode of a high/low voltage switching device; (2) the test channel group outputs a plurality of sets of high voltage and a plurality of sets of low voltage signals to simultaneously detect a plurality of objects to be tested, and receive a current detecting device to transmit (3) performing a main step test procedure, driving the high voltage generating device to output a high voltage through the high voltage terminal through the central control unit, transmitting the test object group to the object to be tested, and detecting the current signal through the current detecting device, and The current signal is transmitted to the central control unit for interpretation to determine the state of all the objects to be tested. If any defect in the test group is detected, the sub-step test procedure is entered; and (4) the sub-step test is entered. a program for performing a high voltage test of an individual object to be tested, and driving the high voltage generating device to output a high voltage sequence to each of the objects to be tested through the high voltage terminal via the central control unit, and The low voltage returning high voltage generating device is outputted from each of the objects to be tested, and the central control unit respectively determines the state of each object to be tested through the current value drawn by the current detecting device, and transmits the test result to the display device for display. Repeat step (4) to perform the high-voltage test of the next test object until all the test objects are individually tested to find the test object of the defective product.

Among them, it also includes (2-1) a contact check step, which is for each group. The group performs the contact test individually, and drives the high voltage generating device to output a voltage value to the object to be tested through the high voltage terminal through the central control unit, and the central control unit can determine whether the test group has contact through the current value detected by the current detecting device. Bad situation.

The test result of the step (4) can be transmitted to the backboard output of the high voltage multi-point test equipment.

The method further includes a step of connecting the test points of all the test objects to the test channels of the test channel group, and each test channel is switched by the high-voltage switch and the low-voltage switch of the high-low voltage switch device. Any output set high voltage or low voltage or no output voltage.

Please refer to FIG. 1 , which is a block diagram of a main high voltage multi-point testing device and method provided by the present invention, which mainly includes: a high/low voltage switching device 1 including an array high voltage switch SH And a plurality of low voltage switches SL, the voltage output mode of the high/low voltage switching device 1 is the switching between the high voltage switch SH and the low voltage switch SL; a test channel group 2, the test channel group 2 includes a complex array test Each of the test channels 21a-21n is connected to a set of high voltage switch SH and a low voltage switch SL of the high/low voltage switching device 1, and when the high voltage switch SH is in an ON state, the low voltage switch SL That is, the non-conduction state (OFF), so that the single test channel 21a~21n can only selectively perform high voltage or low voltage output or no voltage output; a high voltage generating device 3 having a high voltage end 31 and a low voltage end 32 The high voltage terminal 31 is electrically connected to all the high voltage switches SH of the high/low voltage switching device 1 to transmit the high voltage signal to the high voltage switch SH, and the low voltage terminal 32 is electrically connected to the current detecting device 4 to be described later; Current detecting device 4. The current detecting device 4 is electrically connected to the low voltage end 32 of the high voltage generating device 3 and a low voltage switch SL of the central control unit 5 and the high/low voltage switching device 1; the low current return is detected by the current detecting device 4 The current value is transmitted, and the detection result is transmitted to the central control unit 5 for interpretation; a central control unit 5 for performing the main step test procedure and the sub-step test procedure, receiving the current detecting device 4 Detecting the signal and the setting signal of the input device 6, and interpreting and processing the signal, driving the high voltage generating device 3 to generate a high voltage output and controlling the switching between the high voltage switch SH of the high/low voltage switching device 1 and the low voltage switch SL, and The test result is displayed through the following display device 7; an input device 6 provides the test parameter setting of the test parameter and the test object, and transmits the set value to the central control unit 5 for storage, the test parameter includes the test voltage, the test A parameter such as time; a display device 7 for displaying test results and related information at the time of testing.

In a preferred embodiment, when the person completes the pre-test setting via the input device 6, the input and output points of the plurality of test objects are simultaneously connected to the test channels 21a-21n of the test channel group 2.

When the test is started, the central control unit 5 first performs the main step test procedure, which first drives the high voltage generating device 3 to output a high voltage signal via the high voltage terminal 31, and transmits it to the input test point on each object to be tested through the high voltage switch SH. And passing the signal through the low-voltage switch SL and the current detecting device 4 and the low-voltage end 32 of the high-voltage generating device 3 through the output test point of the object to be tested to form a detecting circuit, so that the current detecting device 4 can detect the current flowing back. The value is sent back to the central control unit 5 for interpretation. When the central control unit 5 interprets multiple sets of objects to be tested as good products, the test is completed; if the central control unit 5 determines the plurality of groups of objects to be tested When one or more sets are defective, the sub-step test program is automatically entered, and all the set parameters are automatically copied to the sub-step test program.

Entering the sub-step test procedure, each group of test objects in the group is subjected to high-voltage test to find defective products, complete high-voltage test, thereby reducing manpower, and improving test speed and test reliability requirements.

In addition, the central control unit 5 can detect the current value detected by the current detecting device 4 against the plurality of groups of the object to be tested before the high voltage test, and determine whether there is a close contact connection between the object to be tested and the channel group 2, thereby avoiding contact failure and generating The case of mistesting.

The high voltage generating device 3 described above is a transformer.

Please refer to FIG. 1 to FIG. 3 at the same time, which is an application example of the present invention. In this embodiment, the three sets of transformers are simultaneously tested as an example, and when the high voltage test is started, the steps are as follows:

Step S10:

(1) The test channel group 2 has nine test channels 21a-21i, and each of the test channels 21a-21i can be arbitrarily outputted by the high voltage switch SH and the low voltage switch SL of the high and low voltage switching device 1 Low voltage or no output voltage;

(2) The channel one 21a, the channel four 21d and the channel seven 21g are respectively connected with the primary test points 81 of the three sets of transformers 8; the channel two 21b, the channel five 21e and the channel eight 21h are respectively connected with the three sets of transformers 8 The core test point 82 is connected; the channel three 21c, the channel six 21f and the channel nine 21i are respectively connected with the secondary test points 83 of the three sets of transformers 8; the transformer 8 can be divided into three test groups during the high voltage test. The first test group is a high voltage test of the primary 81 pairs of cores 82, the second test group is a high voltage test of the secondary 83 pairs of cores 82, and the third test group is a high voltage test of the primary 81 pairs of secondary 83;

Step S20:

1. The main step and the sub-step test program setting of the first test group are set via the input device 6:

(a) The main test procedure of the first test group, the test parameter setting, the test parameter includes the test time, the voltage output by the high voltage generating device, etc.; (b) setting the test point of the main step of the first test group The high voltage switch SH corresponding to channel one 21a, channel four 21d and channel seven 21g is switched to the on state (ON), and the low voltage switch SL is in the non-conduction state (OFF), so that channel one 21a, channel four 21d and channel seven 21g output High-voltage signal; switch the low-voltage switch SL corresponding to channel 2 21b, channel 5 21e and channel VIII 21h to the on state (ON), and the high-voltage switch SH to the non-conduction state (OFF), so that channel 2 21b, channel 5 21e and channel VIII 21h output low voltage signal; (c) set the substep to the test point of the first group of transformers 8 of the first test group, set channel one 21a as high voltage output, and channel two 21b as low voltage output; Setting the sub-step to the test point of the second group of transformers 8 of the first test group, setting channel four 21d as a high voltage output, and setting channel five 21e as a low voltage output; (e) setting a sub-step to the first Test group of the third group of transformers 8 In the pilot position, channel 7 21g is set as high voltage output, channel 8 21h is set as low voltage output; 2. Main step and substep test program setting of setting second test group via input device 6: (a) second The main steps of the test group are set of test parameters, the test parameters include the test time, the voltage output by the high voltage generating device 3, etc.; (b) the test point of the main step of the second test group is set, and the channel 3c is The high voltage switch SH corresponding to the channel six 21f and the channel nine 21i is switched to the on state (ON), and the low voltage switch SL is in the non-conduction state (OFF), so that the channel three 21c, the channel six 21f and the channel nine 21i output a high voltage signal; The low voltage switch SL corresponding to the two 21b, the channel five 21e and the channel eight 21h is switched to the on state (ON), and the high voltage switch SH is in the non-conducting state (OFF), so that the channel 2 21b, the channel 5 21e and the channel 8 21h output a low voltage signal; (c) setting the sub-step to the test point of the first group of transformers 8 of the second test group, setting channel 3 21c as a high voltage output, and setting channel 2 21b as a low voltage output; (d) setting a pair of sub-steps The second test group Transformer test point group of the pin 8, the channel six lines 21f is set to a high voltage output, the five channels 21e Set to low voltage output; (e) set the sub-step to the test point of the third group of transformers 8 of the second test group, set channel 9 21i as high voltage output, and set channel 8 21h as low voltage output; The main step and the sub-step test program setting of the third test group are set via the input device 6: (a) the main test parameter setting of the main step of the third test group, the test parameter includes the test time and the voltage output by the high voltage generating device (b) setting the test point pin of the main step of the third test group, switching the high voltage switch SH corresponding to channel one 21a, channel four 21d and channel seven 21g to the on state (ON), and the low voltage switch SL is not The conduction state (OFF) causes the channel 21a, the channel 4d, and the channel 7g to output a high voltage signal; and the low voltage switch SL corresponding to the channel 3c, the channel 6th, and the channel 21i is switched to the ON state, the high voltage switch SH For the non-conducting state (OFF), the channel three 21c, the channel six 21f and the channel nine 21i output a low voltage signal; (c) setting the sub-step to the test point of the first group of transformers 8 of the third test group, Channel one 21a is set to high voltage output Channel 3c is set to low voltage output; (d) setting the test step of the second group of transformers 8 of the third test group in the sub-step, setting channel 4 21 as the high voltage output, and setting channel 6 21f as Low-voltage output; (e) setting the sub-step to the test point of the third group of transformers 8 of the third test group, setting channel 7 21g as the high-voltage output, and setting the channel 9 21i as the low-voltage output; the above setting result They are all stored in the central control unit 5.

Step S30:

1. The first test group contact test, the central control unit 5 will drive the high voltage generating device 3 to output voltage through the high voltage terminal 31 to the channel one 21a, the channel four 21d, the channel seven 21g, the voltage will pass through the channel two 21b, the channel five 21e And the channel 8h is returned to the high voltage generating device 3 via the current detecting device 4, and the central control unit 5 can determine whether the first test group has poor contact by the current value detected by the current detecting device 4.

2. The second test group contact test, the central control unit 5 will drive the high voltage generating device 3 to output the voltage through the high voltage terminal 31 to the channel three 21c, the channel six 21f, the channel nine 21i, the voltage will pass through the channel two 21b, the channel five 21e And the channel 8h is returned to the high voltage generating device 3 via the current detecting device 4, and the central control unit 5 can determine whether the second test group has poor contact by the current value detected by the current detecting device 4.

3. The third test group contact test, the central control unit 5 will drive the high voltage generating device 3 through the high voltage terminal 31 to output voltage to the channel one 21a, the channel four 21d, the channel seven 21g, the voltage will pass through the channel three 21c, channel six 21f And the channel 9 21i is returned to the high voltage generating device 3 via the current detecting device 4, and the central control unit 5 can determine whether the third test group has poor contact by the current value detected by the current detecting device 4.

Then proceed to the main test of the first test group test S40:

The central control unit 5 drives the high voltage generating device 3 to output a high voltage via the high voltage terminal 31 to the channel one 21a, the channel four 21d, and the channel seven 21g, while the channel two 21b, the channel five 21e, and the channel eight 21h output a low voltage return to the high voltage. The device 3 enables the current detecting device 4 to capture the current signals of the channel 2 21b, the channel 5 21e, and the channel 8 21h, and transmits the signal to the central control unit 5 for interpretation. If the primary 81 of the transformer 8 is determined to be the core 82 is good, then the three sets of transformers 8 are good, and the test results are transmitted to the display device 7 for display or transmission to the back panel output point; if it is determined to be defective, it automatically enters the sub-step test program;

Then enter the sub-step test procedure S41:

(a) First, the test of the first group of transformers 8 is performed. The central control unit 5 drives the high voltage generating device 3 to output a high voltage to the channel one 21a via the high voltage terminal 31, and the channel two 21b outputs a low voltage back to the high voltage generating device. 3. The central control unit 5 determines that the primary 81 of the first group of transformers 8 is a good or defective product via the current value captured by the current detecting device 4, and transmits the test result to the display device 6 for display or transmission. To the backplane output point;

(b) Next, a test of the second group of transformers is performed. The central control unit 5 drives the high voltage generating device 3 to output a high voltage through the high voltage terminal 31 to the channel 4d, and the channel 5e will output a low voltage to the high voltage generating device 3, The central control unit 5 determines that the primary 81 of the first group of transformers 8 is a good or defective product via the current value captured by the current detecting device 4, and transmits the test result to the display device 7 for display or transmission to the back. Board output point;

(c) Next, a test of the third group of transformers 8 is performed. The central control unit 5 drives the high voltage generating device 3 to output a high voltage to the channel VII 21g via the high voltage terminal 31, and the channel VIII 21h outputs a low voltage back to the high voltage generating device 3. The central control unit 5 determines that the primary 81 of the first group of transformers 8 is a good or defective product via the current value captured by the current detecting device 4, and transmits the test result to the display device 7 for display or transmission to the display device 7. Backplane output point.

Then, the high voltage test S50 of the second test group is performed, and the main step test flow of the second test group is the same as the first test group, and the difference is that the channel is outputted by channel three 21c, channel six 21f, and channel nine 21i. High voltage, while channel 2 21b, channel 5 21e and channel 8 21h output low voltage, to judge the secondary 83 of the three sets of transformers to the core 82 as a good or defective product; if it is a defective product, it will automatically enter the sub-step test procedure. S51, the test procedure of the sub-step test program is the same as the first test group, the difference is that the channel 3 21c outputs a high voltage, and the channel 2 21b outputs a low voltage, thereby determining that the secondary 83 of the first group of transformers 8 is the core 82 Good or defective; then channel 6 21f output high voltage, channel 5 21e output low voltage, to conclude that the secondary 83 of the second group of transformers 8 is good or bad for the core 82; then the channel 9 21i output high voltage, channel 8 21h output low voltage Therefore, it is determined that the secondary 83 of the third group of transformers 8 is good or defective for the core 82; the other processes are the same as the testing process of the first test group, and are not described herein.

Finally, the high voltage test S60 of the third test group is performed, and the main step test flow of the third test group is the same as the first test group, and the difference is that the channel is output by channel 21a, channel 4d, and channel 7g. High voltage, while channel three 21c, channel six 21f and channel nine 21i output low voltage, in order to judge the primary 81 of the three sets of transformer 8 to the secondary 83 as a good or defective product; if it is a defective product, it will automatically enter the sub-step test In the program S61, the test procedure of the sub-step test program is the same as the first test group, the difference is that the channel one 21a outputs a high voltage, and the channel three 21c outputs a low voltage, thereby determining the primary 81 pair of the first group of transformers 8 to the secondary 83 For good or bad products; then the channel 4d output high voltage, channel 6 21f output low voltage, to conclude that the primary 81 of the second group of transformers 8 to the secondary 83 is good or defective; then the channel seven 8g output high voltage, channel nine 21i output The low voltage is used to determine that the primary 81 of the third group of transformers 8 is a good or bad product for the secondary 83; the other processes are the same as the first test group test flow, and are not described herein.

The high-voltage test of the above-mentioned transformer 8 is only a preferred embodiment of the present invention, and is not intended to limit the scope of the patent application in this case. If any product is to pass the high-voltage test mode of the main and sub-steps in the future, it should be included in the application scope of the case. in.

Compared with other conventional products, the invention has the following advantages:

1. The invention tests the object to be tested in the separation mode of the main and auxiliary test steps, so as to reduce the test time and increase the test speed.

2. When the main step test program determines that the test object group is defective, the main step test program automatically enters the sub-step test program to test the individual test objects to find the genuine defective product.

3. The invention displays the position of the real bad test object on the panel, so that the operator can easily remove the defective product.

4. The invention outputs the true bad test object position signal on the backplane contact, and rejects the defective product by the automatic device.

5. The invention performs contact inspection with the object to be tested before the high voltage test to avoid test errors.

1. . . High/low voltage switching device

SH. . . High voltage switch

SL. . . Low voltage switch

2. . . Test channel group

21a~21n. . . Test channel

3. . . High pressure generating device

31. . . High pressure end

32. . . Low pressure end

4. . . Current detecting device

5. . . Central control unit

6. . . Input device

7. . . Display device

8. . . transformer

81. . . primary

82. . . core

83. . . Secondary

1 is a block diagram of a high voltage multi-point test apparatus and method with primary and secondary steps of the present invention;

2 is a schematic diagram of an apparatus for a high-voltage multi-point test apparatus and method with primary and secondary steps according to the present invention;

FIG. 3 is a flow chart showing the operation of the high-voltage multi-point testing device and method with the main and auxiliary steps of the present invention.

1. . . High/low voltage switching device

SH. . . High voltage switch

SL. . . Low voltage switch

2. . . Test channel group

21a~21n. . . Test channel

3. . . High pressure generating device

31. . . High pressure end

32. . . Low pressure end

4. . . Current detecting device

5. . . Central control unit

6. . . Input device

7. . . Display device

Claims (9)

A primary and secondary step high voltage multi-point testing device includes: a high/low voltage switching device comprising an array high voltage switch and a plurality of low voltage switches; a test channel group comprising a plurality of test channels, each set of test channels All of them are equipped with a high voltage switch and a low voltage switch of the high/low voltage switching device, so that a single test channel is used to change the voltage output mode; a high voltage generating device has a high voltage end and a low voltage end, and the high voltage end is high and/ The high voltage switch of the low voltage switching device is electrically connected; a current detecting device is connected between the low voltage end and the high and low voltage switching device connected to the high voltage generating device for detecting the current value; a central control unit is The current detecting device is connected to perform a main step test program and a sub-step test program, and the central control unit drives the high voltage generating device to generate a high voltage output and control a voltage output mode of the high/low voltage switching device to enable the test channel group Output multiple sets of high voltage and multiple sets of low voltage signals to simultaneously detect multiple sets of test objects and receive current detection The current signal transmitted by the device, when the main step test program determines that the test object group is defective, it will enter the sub-step test procedure to test the individual object to be tested to find the genuine defective product; an input device is provided Test parameters and test point settings of the test object, and transfer the set value to a central control unit for storage, the test parameters include test voltage, test time and other parameters; and a display device is connected to the central control unit, To display test results and related information at the time of testing. For example, the high-voltage multi-point test equipment of the main and auxiliary steps described in claim 1 of the patent scope, the voltage output mode of the high/low voltage switching device is the switching of the high voltage switch and the low voltage switch. For example, the main and auxiliary step high-pressure multi-point test equipment described in claim 1 of the patent scope, wherein the test parameters of the main step test program and the sub-step test program Contains test voltage and test time. The high-pressure multi-point test apparatus of the main and auxiliary steps as described in claim 1, wherein the high-voltage generating device is a transformer. A high-voltage multi-point test method having a main and a sub-step for testing a plurality of test objects connected to a test channel group of a high-voltage multi-point test device, the test method comprising: (1) passing a test for storing the main step The central control unit of the program and the sub-step test program drives a high voltage generating device to generate a high voltage output and controls a voltage output mode of a high/low voltage switching device; (2) the test channel group outputs a plurality of sets of high voltage and multiple sets of low voltage signals And forming a detection loop to simultaneously detect the plurality of groups of the object to be tested and receive a current signal transmitted by the current detecting device; (3) performing a main step test procedure to drive the high voltage generating device through the high voltage through the central control unit The terminal outputs a high voltage, is transmitted to the object to be tested through the test channel group, detects the current signal through the current detecting device, and transmits the current signal to the central control unit for interpretation to determine the state of all the objects to be tested, if the test group If there is any defective product in the object to be tested, the sub-step test procedure is entered; and (4) the sub-step test procedure is entered to perform the height of the individual test object. The pressure test drives the high voltage generating device to output a high voltage sequence to each of the objects to be tested through the high voltage terminal, and outputs a low voltage to each of the objects to be tested to return to the high voltage generating device, and the central control unit draws through the current detecting device. The current value is used to determine the state of each test object to find a genuine defective product, and the test result is transmitted to the display device. For example, the high-pressure multi-point test method for the main and auxiliary steps described in claim 5 of the patent application further includes repeating the above step (4), performing the high-voltage test of the next test object until all the test objects are individually tested, Find the object to be tested for defective products. The high-voltage multi-point test method having the main and sub-steps as described in claim 5, further comprising (2-1) a contact point inspection step, performing contact test on each group individually, and driving through the central control unit The high voltage generating device outputs a voltage value to the object to be tested through the high voltage end, and the central control unit can determine whether the test group has poor contact by the current value detected by the current detecting device. The high-voltage multi-point test method having the main and sub-steps as described in claim 5, wherein the test result of the step (4) can be transmitted to the backplane output of the high-voltage multi-point test equipment. The high-voltage multi-point test method with the main and auxiliary steps as described in claim 5 of the patent application further includes a step of connecting the test point of all the test objects to each test channel of the test channel group, each The test channel can output the set high voltage or low voltage or no output voltage by switching between the high voltage switch and the low voltage switch of the high and low voltage switching devices.