201211553 六、發明說明： 【發明所屬之技術領域】 本發明係關於一種檢測設備，特別是指—種將多顆待 物以群組模式並接測試之具主副步驟高壓多點測試設備及 方法。 【先前技術】201211553 VI. Description of the Invention: [Technical Field] The present invention relates to a detecting device, and more particularly to a high-pressure multi-point testing device and method for a primary and secondary step in which multiple objects are connected in parallel in a group mode . [Prior Art]
一般零件測試，如馬達、風扇或變壓器…等，其β == = ;:高壓量測’以確認該待測物;否符 因此，為確保每個零件皆為良品，在每個 前，皆要進行高壓測試程序，若以變壓器為例變= :必須測試初級對鐵心、鐵心對次級及初級對次級 ΐ程Λ每次必須測試1秒，每個變壓器在測試二須花 3私鐘才此進行第2個變壓器 長，浪費人力與時間，不符合經濟效益。&成I式時間几 因此’為改善上述缺失，即有群組並 :可同時測試多組變壓器，以達到節省測試時 力:：:試見雖然可縮短測試時間及人 測物暫時判定不良，再階段係將群組内全部的待 容*因…作失誤，造成二無 接觸=時在試如果與待測物之接觸點 命;又因為不良的::生;響接觸點的壽 :的測試設備造成干擾，相對地：可對其它附 性，進而影響的測試結果的可靠性¥又備的了罪度以及穩定 201211553 上述習用測試設備及測試方 法具有極大的缺 由此可見 失有待改進。 【發明内容】 本發明之第一目的即在於提供一種具主 點測試設備及方法，係以主、副測試步驟分離;二:广壓多 物’以達到減少測試時間，提高測試速度之式測试待測 本發明之第二目的係在於提供一種具主副步 點測試設備及方法’係當主步驟測試程序判'待 測物進行測試，找出真正不良品。 十對個別待 本發明之第三目的係在於提供一種具主 點測試設備及方法，係將真正的不良待測物位置顯示：：： 上’讓操作人員極易將不良品剔除。 y' ，備目的係在於提供一種具主高壓多點測試 设備及方法，係將真正的不良待測物位置訊號輸 點上’藉由自動設備將不良品剔除。 之”係在於提供一種具主高壓多點測試 a僙及方法，提供尚壓測試前先進行與待測物間的 查，以避免測試失誤。 可達成上述發明目的之具主副步驟高壓多點測試設備，包 括：-高/低壓切換裝置，其係包含數個高壓開關及數個低壓 開關’該高/低壓切換I置之電壓輸出才莫式為高壓μ關與低壓 開關啟閉的切換；-測試通道組，其係包含複數個測試通 道，每一個測試通道皆搭配高/低壓切換裝置之一個高壓開關 及一個低壓開關，使單一測試通道用以變換電壓輸出模式； 一高壓產生裝置，其具有一高壓端及一低壓端，該高壓端係 與高/低壓切換裝置之全部高壓開關連接；一電流偵測裝置， 其係與連接於高壓產生裝置之該低壓端與高低壓切換裝置 間，用以偵測電流值；以及一中央控制單元，係用以儲存主 201211553 步驟測試程序及副步驟測試程序，該主步驟測試程序及副步 驟測試程序的測試參數包含測試電壓'測試時間該中央控 制單元會驅使高壓Μ冑置產生高壓㈣及控制高二低壓切 換裝置之電壓輸出模式，使輸出通道組用以輸出多组高電壓 及多組低電壓信號，以同時對多個待測物進行偵測，並會接 收電流偵測裝置傳送的電流信號。 可達成上述發明目的之具主副步驟高壓多點測試， 括：General parts testing, such as motors, fans or transformers, etc., β == = ;: high pressure measurement 'to confirm the object to be tested; no, therefore, to ensure that each part is good, in front of each To carry out the high-voltage test procedure, if the transformer is used as an example =: the primary core, the core to the secondary and the primary to the secondary must be tested. Each test must be tested for 1 second, and each transformer must be tested for 2 private clocks. Only the second transformer is long, which wastes manpower and time and is not economically viable. &I type time is therefore 'to improve the above missing, that is, there are groups and: can test multiple sets of transformers at the same time, in order to save the test force::: See the test time can be shortened and the human measurement temporarily determined bad In the next stage, all the waiting contents in the group are mistaken, causing two no contact = when the test is in contact with the object to be tested; and because of the bad:: raw; the life of the contact point: The test equipment causes interference, relatively: the reliability of the test results that can be affected by other attachments, and thus the sin and stability 201211553. The above-mentioned conventional test equipment and test methods have great disadvantages. . SUMMARY OF THE INVENTION The first object of the present invention is to provide a device and method for testing main points, which are separated by primary and secondary test steps, and two: wide-pressure multi-objects to reduce test time and improve test speed. The second object of the present invention is to provide a device and method for testing a main sub-step point, which is to test the object to be tested to find a genuine defective product. Ten pairs of individual objects The third object of the present invention is to provide a device and method for testing main points, which is to display the position of the real bad test object::: The above is easy for the operator to remove the defective product. y', the purpose of the project is to provide a main high-voltage multi-point test equipment and method, which is to remove the defective product by the automatic equipment. The system is to provide a main high-pressure multi-point test and method to provide a check between the test object and the test object before the pressure test to avoid the test error. The test equipment comprises: a high/low voltage switching device, which comprises a plurality of high voltage switches and a plurality of low voltage switches. The voltage output of the high/low voltage switching I is a switching of the high voltage μ off and the low voltage switch opening and closing; a test channel group comprising a plurality of test channels, each test channel being associated with a high voltage switch and a low voltage switch of the high/low voltage switching device, such that a single test channel is used to convert the voltage output mode; a high voltage generating device The utility model has a high voltage end and a low voltage end, wherein the high voltage end is connected with all the high voltage switches of the high/low voltage switching device; a current detecting device is connected between the low voltage end and the high and low voltage switching device connected to the high voltage generating device. Used to detect the current value; and a central control unit for storing the main 201211553 step test program and the sub-step test program, the main step test The test parameters of the program and the sub-step test program include the test voltage 'test time. The central control unit will drive the high voltage device to generate high voltage (4) and control the voltage output mode of the high and low voltage switching device, so that the output channel group is used to output multiple sets of high voltage. And a plurality of sets of low-voltage signals to simultaneously detect a plurality of objects to be tested, and receive current signals transmitted by the current detecting device. The high-voltage multi-point test with the main and auxiliary steps can achieve the above object, including:
(1)通過-用以儲存主步驟測試程序及副步驟測試程序 之:央控制單元，驅使-高壓產生裝置產生高壓輸出及㈣ 一尚/低壓切換裝置之電壓輸出模式； (2 )該輸出通道組輸出多組高電壓及多組低電壓信號， 以同時對多個待測物進行偵測，並接收—電流㈣裝置。傳 的電流信號； (3 )進仃主步驟測試程序，透過中央控制單元驅使高壓 產生裝置經由高屋端輸出高„，經輸出通道組傳送至待測 :: 經由電流憤測裝置偵測電流信號，並將電流信號傳送至 =控制單Μ判讀’以判斷全部待測物狀態，若該測試群 、、且中的待物測有任-不良品時，則進人副步驟測試程序；以 及 試二: 測試程序，進行個別待測物的高壓測 經由中央控制單元驅使高麼產生裝置經高壓端輸出高電 順序至各待測物，並由各待測物輸出低電壓回高壓產生裝 龍央控制單元經由電流偵測裝置操取的電流值，分別 物狀態，並將職結果傳送至顯㈣置顯示。重 次一待測物的高墨測試，直至全部待測物 白個制4元成，以找出不良品的待測物。 其中1包含（2-1) 一接觸點檢查步驟，係對每一個群 201211553 組個別進行接觸測試，經由中央控制單元驅使高壓產生裝置 經向壓端輸出一電壓值至待測物，透過電流偵測裝置偵測的 電流值，中央控制單元即可判斷該測試群組是否有接觸不良 的情況。 其中，該步驟（4 )之測試結果可傳送至高壓多點測試設 備之背板輸出。 其中，更包含一步驟，係將全部待測物之測試點腳位與測 試通道組之各個測試通道相連接，每個測試通道藉由高低壓 切換裝置之间壓開關及低壓開關的切換，皆可任意輸出設定 的高壓或低壓或不輸出電壓。 【實施方式】 請參閱圖-所示，係本發明所提供之具主高壓多點測試 設備及方法之方塊圖，主要包括： 一一尚/低壓切換裝置1，該高/低壓切換裝置丨係包含數 組高壓開關SH及數個低壓開關SL，使該高/低壓切換裝置j 之電壓輸出模式為各組高壓開關SH與低壓開關8[的啟閉切 換； ，-測試通道組2,該測試通道組2係包含複數組測試通 道2 1 a 2 1 η，母一組測§式通道2丨a〜21 η皆與高/低壓切換裝置 1的一組高壓開關SH及一個低壓開關SL相連接，當高壓開 關SH呈導通狀態（〇N)日寺，低壓開關儿即為不導通狀態 (OFF )，使單-測試通道21a〜21n只能選擇 壓輸出或無電壓輸出； 一高壓產生裝置3,該高壓產生裝置3具有高壓端31及 低壓端32’該高壓端31係與高/低壓切換裝1 i之全部高壓 P幵1關SH電性連接，以將高壓信號傳送至高壓開關sh°，:低 壓端32則與後述的電流偵測裝置4相電性連接； 一電流偵測裝置4,該電流偵測裴置4係與高壓產生裝 201211553 置3之低壓端32及一中央控制單元5及高/低壓切換裝置^ 之低壓開關SL電性連接；係透過電流偵測裝置4偵^低壓 回流的電流值大小，並將偵測結果傳送至中央控制單元5 判讀； 一中央控制單元5，該中央控制單元5用以執行主步驟 測試程序及副步驟測試程序，接收來自電流偵測裝置4偵測 信號及輸入裝置6的設定信號，並對信號進行判讀及處理 後，驅气高壓產生裝置3產生高壓輸出及控制高/低壓切換裝 置1之尚壓開關SH與低壓開關SL啟閉的切換，並將測試結 果經由下述顯示裝置7顯示； 'β ^輸入裝置6，係提供測試參數及待測物之測試點設 =人並，6χ &值傳送至中央控制單元5中儲存該測試參數 包έ測試電壓、測試時間等參數； -顯示裝置7,用以顯示測試結果以及測試時的相關訊 0 —在實施例中，當人Μ經由輸人裝置6完成測試前 夕，，且待測物之輸入及輸出待測點同時連接於測試 通道組2之測試通道21a〜21n。 庠’ ^ ί '則j ’中央控制單元5會先進行主步驟測試程 號，經言壓產生裝置3經由高壓端31輸出-高壓信 並經由^嘲丨I SH傳送至待每個待測物上的輸入測試點， 測穿置彳4 ^ 之輸出測試點將信號經低壓開關SIj及電流偵 IS產生裝置3之低壓端32回流，以形成-檢 測社果僖〇 4^偵'則裝置4可㈣到回流的電流值，並將偵 判讀，當中央控制單元5判讀多 判斷多組待成本次測試；若中央控制單元5 進入副步驟測組或—組以上為不良品時，即會自動 步驟測試程序二而所有設定的參數會自動被複製至副 步驟測4程序’係群組中每組待測物進行高壓測 201211553 要ί 一作人力 f置2 /制单元5在高壓測試前可透過電流偵測 二對多組待測物憤測的電流值，判斷待測物與通道组2 間1有緊密接觸連接，避免接觸不良，纟生誤測試的情形。 其中，上述之高壓產生裝置3係為變壓器。 ^時參閱圖-至圖三料，係本發明之應用實施例， 2實施例中係、以同時測試三組變壓器為例 測試時，其步驟如下： 问灸 步驟S10 : ^ ( 1 )該測試通道組2具有九個測試通道2丨a〜2丨i，每個 試通道2 1 a〜2 11藉由尚低壓切換裝置}之高壓開關及 :壓開關SL的切換，皆可任意輸出設定的高壓或低 輸出電壓； 一 係將通道一 21a、通道四21d及通道七21g分別與 二組變壓器8的初級測試點81相連接；該通道二21b、通道 = 2le及通道八2ih係分别與三組變壓器8的鐵心測試點μ 目連接，該通道三21c、通道六21f及通道九21i係分別與三 組變壓器8的次級測試點83相連接；在進行高壓測試時可 f變壓器8分成二個測試群組，第一測試群組為初級$ 1對 ，心82的尚壓測試，第二測試群組為次級83對鐵心82的 阿壓測試，第三測試群組為初級8丨對次級83的高壓測試； 步驟S20 : 1 ·經由輸入裝置6設定第一測試群組之主步驟及副步驟 測試程序設定： ^ ( a )第一測試群組之主步驟程序各項測試參數設定， 遠剩試參數包含測試時間、高壓產生裝置輸出的電壓等設 定； (b )設定第一測試群組主步驟的測試點腳位，將通道 21a、通道四21d及通道七2ig對應的高壓開關SH切換 201211553 為導通狀態（ON )，低壓開關SL為不導通狀態（OFF )，使 通道一 21a、通道四21d及通道七21g輸出高壓信號；將通 道二21b、通道五21e及通道八21h對應的低壓開關SL切換 為導通狀態（ON ) ’高壓開關SH為不導通狀態（OFF )，使 通道二21b、通道五21e及通道八21h輸出低壓信號； (c )設定副步驟對第一測試群組之第一組變壓器8的 測試點腳位，係將通道一 21a設定為高壓輸出，將通道二2ib 設定為低壓輸出； (d )設定副步驟對第一測試群組之第二組變壓器8的 測試點腳位，係將通道四21 d設定為高壓輸出，將通道五2 i e 設定為低壓輸出； (e )設定副步驟對第一測試群組之第三組變壓器8的 測試點腳位，係將通道七21g設定為高壓輸出，將通道八21h 設定為低壓輸出； 2.經由輸入裝置6設定第二測試群組之主步驟及副步驟 測試程序設定： (a)第一測試群組之主步驟各項測試參數設定，該測 試參數包含測試時間、高壓產生裝置3輸出的電壓等設定； (b )設定第二測試群組主步驟的測試點腳位，將通道 三21c、通道六21f及通道九21i對應的高壓開關SH切換為 導通狀態（ON )，低壓開關SL為不導通狀態（0FF )，使通 道三21c、通道六21f及通道九2Π輸出高壓信號；將通道二 21 b、通道五21 e及通道八21 h對應的低壓開關SL切換為導 通狀態（ON )，高壓開關SH為不導通狀態（0FF )，使通道 二21b、通道五21e及通道八21h輸出低壓信號； (c )設定副步驟對第二測試群组之第一組變壓器8的 測試點腳位’係將通道三21c設定為高壓輸出，將通道二21b 設定為低壓輸出； (d )設定副步驟對第二測試群組之第二組變壓器&的 測試點腳位，係將通道六21f設定為高壓輸出，將通道五21e 201211553 設定為低壓輸出； (e )設定副步驟對第二測試群組之第三組變壓器8的 測試點腳位，係將通道九21i設定為高壓輸出，將通道八21h 設定為低壓輸出； 3.經由輸入裝置6設定第三測試群組之主步驟及副步驟 測試程序設定： (a )第三測試群組之主步驟各項測試參數設定，該測 試參數包含測試時間、高壓產生裝置輸出的電壓等設定； (b) 設定第三測試群組主步驟的測試點腳位將通道 一 21a、通道四21d及通道七21g對應的高壓開關SH切換 為導通狀態（ON)’低壓開關SL為不導通狀態（〇ff)，使 通道一 21a、通道四21d及通道七21g輸出高壓信號；將通 道二21c、通道六2lf及通道九21i對應的低壓開關切換 為導通狀態（ON)’高壓開關SH為不導通狀態（〇ff)，使 通道三21c、通道六21f及通道九2Η輸出低壓信號； (c) 設定副步驟對第三測試群組之第一組變壓器8 測試點腳位，係將通道一 21a設定為高壓輸出 道 設定為低壓輸出； ⑷設；^步驟對第三測試群組之第二組變 測試點腳位，係將通道四21讯玄 ^ 設定為低壓輸出;…向壓輸出，將通道六21f(1) Pass-to store the main step test program and the sub-step test program: the central control unit, the drive-high voltage output device generates a high voltage output and (4) a voltage/output mode of the low/low voltage switching device; (2) the output channel The group outputs multiple sets of high voltage and multiple sets of low voltage signals to simultaneously detect multiple objects to be tested and receive the current (four) device. The current signal is transmitted; (3) The main step test procedure is to drive the high voltage generating device to the high output through the high-rise terminal through the central control unit, and transmit it to the test through the output channel group:: detecting the current signal through the current intrusion device, And the current signal is transmitted to the = control unit Μ interpretation ' to determine the state of all the objects to be tested, if the test group, and the object to be tested have any - defective products, then enter the sub-step test procedure; and test two : The test program performs the high voltage measurement of the individual test objects through the central control unit to drive the high-output device to output the high-voltage sequence to the objects to be tested through the high-voltage end, and the low-voltage output of each test object is returned to the high-voltage generation device. The current value of the unit through the current detecting device, respectively, the state of the object, and the job result is transmitted to the display (four) display. The high ink test of the object to be tested is repeated until all the objects to be tested are white, 4 yuan, In order to find the object to be tested for defective products, 1 includes (2-1) a contact point inspection step, and each group of 201211553 groups is individually tested for contact, and the high-voltage generating device is driven by the central control unit. The central control unit can determine whether the test group has poor contact condition by outputting a voltage value to the object to be tested and passing the current value detected by the current detecting device. Among them, the test of the step (4) The result can be transmitted to the backplane output of the high-voltage multi-point test equipment. The method further includes a step of connecting the test point of all the test objects to each test channel of the test channel group, and each test channel is high. The switching between the pressure switch and the low-voltage switch between the low-voltage switching devices can output the set high voltage or low voltage or no output voltage arbitrarily. [Embodiment] Please refer to the figure - shown, the main high voltage multi-point test provided by the present invention The block diagram of the device and method mainly includes: a low/low voltage switching device 1 comprising an array high voltage switch SH and a plurality of low voltage switches SL for voltage output of the high/low voltage switching device j The mode is the switching between the high voltage switch SH and the low voltage switch 8 of each group; , - the test channel group 2, the test channel group 2 includes the complex array test channel 2 1 a 2 1 η, the parent group § Channels 2丨a~21 η are connected to a set of high-voltage switch SH and a low-voltage switch SL of the high/low voltage switching device 1. When the high-voltage switch SH is in a conducting state (〇N), the low-voltage switch is The non-conducting state (OFF) enables the single-test channels 21a to 21n to select only the voltage output or the voltageless output; a high voltage generating device 3 having a high voltage terminal 31 and a low voltage terminal 32' All of the high voltage P幵1 off SH of the high/low voltage switching device 1i are electrically connected to transmit the high voltage signal to the high voltage switch sh°, and the low voltage terminal 32 is electrically connected to the current detecting device 4 to be described later; The current detecting device 4 is electrically connected to the low voltage end 32 of the high voltage generating device 201211553 and a low voltage switch SL of the central control unit 5 and the high/low voltage switching device ^; The measuring device 4 detects the magnitude of the current of the low-voltage reflow, and transmits the detection result to the central control unit 5 for interpretation; a central control unit 5 for performing the main step test procedure and the sub-step test procedure, receiving From current detecting device 4 After the signal and the setting signal of the input device 6 are measured, and the signal is interpreted and processed, the high-pressure generating device 3 generates a high-voltage output and controls the switching of the pressure switch SH of the high/low voltage switching device 1 and the opening and closing of the low-voltage switch SL. And the test result is displayed through the following display device 7; 'β ^ input device 6, is provided with test parameters and the test point of the test object set = person, 6 χ & value is transmitted to the central control unit 5 to store the test parameter Included in the test voltage, test time and other parameters; - display device 7 for displaying the test result and the relevant information at the time of the test - in the embodiment, on the eve of the completion of the test by the input device 6, and the object to be tested The input and output points to be tested are simultaneously connected to the test channels 21a to 21n of the test channel group 2.庠 ' ^ ί ' Then j ' central control unit 5 will first perform the main step test pass number, and the pressure generating device 3 outputs a high voltage signal via the high voltage end 31 and transmits it to each object to be tested via the sneak peek I SH On the input test point, the output test point of the measurement through 4 ^ reflows the signal through the low voltage switch SIj and the low voltage end 32 of the current detection IS generating device 3 to form a detection body 4 (4) The current value to the return flow, and the detection is read, when the central control unit 5 interprets the multi-judgment multiple-waiting cost test; if the central control unit 5 enters the sub-step test group or the above-mentioned group is a defective product, the automatic step is Test procedure 2 and all the set parameters will be automatically copied to the sub-step test 4 program's group of each object to be tested for high-voltage measurement 201211553 to be a manpower f set 2 / system 5 can pass current before high-voltage test Detecting the current value of two pairs of test objects, and judging that the object to be tested is in close contact with the channel group 2 to avoid contact failure and mis-testing. The high voltage generating device 3 described above is a transformer. When referring to the figure-to-three materials, it is an application example of the present invention. In the second embodiment, when testing three sets of transformers at the same time as an example, the steps are as follows: Moxibustion step S10: ^ (1) The test The channel group 2 has nine test channels 2丨a~2丨i, and each test channel 2 1 a~2 11 can be arbitrarily output set by the high voltage switch of the low voltage switching device and the switching of the pressure switch SL. High voltage or low output voltage; one system connects channel one 21a, channel four 21d and channel seven 21g to primary test point 81 of two sets of transformers 8; the channel two 21b, channel = 2le and channel eight 2ih are respectively and three The core test point of the group transformer 8 is connected, and the channel three 21c, the channel six 21f and the channel nine 21i are respectively connected with the secondary test points 83 of the three sets of transformers 8; when the high voltage test is performed, the f transformer 8 is divided into two. Test group, the first test group is the primary $1 pair, the heart 82 is still tested, the second test group is the secondary 83 pair of core 82 pressure test, and the third test group is the primary 8 pair High voltage test of secondary 83; Step S20: 1 · Set via input device 6 The main step and the sub-step test program setting of the first test group: ^ (a) The main test procedure of the first test group is set by various test parameters, and the far-away test parameters include the test time, the voltage output by the high-voltage generating device, and the like. (b) Set the test point pin of the main step of the first test group, and switch the high voltage switch SH corresponding to channel 21a, channel 4 21d and channel 7 2ig to 201211553 to be in the on state (ON), and the low voltage switch SL to be in the non-conducting state. (OFF), so that channel one 21a, channel four 21d and channel seven 21g output high voltage signals; switch the low voltage switch SL corresponding to channel two 21b, channel five 21e and channel eight 21h to the on state (ON) 'high voltage switch SH is not Turn-on state (OFF), so that channel 2 21b, channel 5 21e and channel 8 21h output low-voltage signals; (c) set the sub-step to the test point of the first group of transformers 8 of the first test group, the channel one 21a is set to high voltage output, channel 2 2ib is set to low voltage output; (d) set the substep to the test point of the second group of transformer 8 of the first test group, the channel 4 21 d is set to high voltage , set channel 5 2 ie as low voltage output; (e) set the test step pin of the third group of transformer 8 of the first test group in the sub-step, set channel 7 21g as high voltage output, set channel 8 21h For the low-voltage output; 2. The main step and the sub-step test program setting of the second test group are set via the input device 6: (a) the main test parameters of the main test group of the first test group, the test parameters include the test time, The voltage output from the high voltage generating device 3 is set, etc.; (b) setting the test point of the main step of the second test group, and switching the high voltage switch SH corresponding to the channel three 21c, the channel six 21f and the channel nine 21i to the on state (ON) ), the low-voltage switch SL is in a non-conducting state (0FF), so that the channel three 21c, the channel six 21f and the channel nine 2 Π output a high-voltage signal; the channel two 21 b, the channel five 21 e and the channel eight 21 h corresponding to the low-voltage switch SL switch In the on state (ON), the high voltage switch SH is in a non-conducting state (0FF), so that channel 2 21b, channel 5 21e, and channel 8 21h output a low voltage signal; (c) setting a sub-step to the first group of the second test group Transformer 8 The test point pin 'sets channel 3 21c as a high voltage output and channel 2 21b as a low voltage output; (d) sets the substep to the test point of the second group of transformers & Set channel 6 21f to high voltage output and channel 5 21e 201211553 to low voltage output; (e) set the test step for the third group of transformers 8 of the second test group in the sub-step, set channel 9 21i to High-voltage output, set channel VIII21h to low-voltage output; 3. Set the main step and sub-step test program setting of the third test group via input device 6: (a) Test parameters of the main steps of the third test group The test parameter includes the test time, the voltage output by the high voltage generating device, etc.; (b) setting the test point of the main step of the third test group, the high voltage switch SH corresponding to the channel 21a, the channel 4d, and the channel 7g Switching to the on state (ON) 'The low voltage switch SL is in the non-conducting state (〇ff), so that channel one 21a, channel four 21d and channel seven 21g output high voltage signals; channel two 21c, channel six 2lf and channel nine 21i The low voltage switch should be switched to the ON state (ON). The high voltage switch SH is in the non-conducting state (〇ff), so that the channel 3c, the channel 621f, and the channel 9-2 output low voltage signals; (c) setting the sub-step to the third test The first group of transformers in the group 8 test points, the channel one 21a is set to the high voltage output channel set to low voltage output; (4) set; ^ step to the third test group of the second group of test points, Set channel 4 21 Xuan ^ to low voltage output; ... to the pressure output, channel 6 21f
in i ) ^又1田】步驟對第三測試群組之第三組變壓器8的 測試點腳位，係將通道士 0〜^ 設定為低壓輸出； 卜又疋為高壓輸出，將通道九2U 步驟t之設定結果皆讀存於中央控制單元5中》 產生LUtl:接觸測試’中央控制單元5會驅使高壓 座生裝置3經而壓端31輪 通道七2ie，該電壓會經由歷至通道一 21a、通道四21d、 21h經電流偵測裝置4 f 2lb、通道五21e及通道八 口流而壓產生裝置3，透過電流偵測 201211553 裝置4偵測的電流值’中央控制單开^ i t, 組是否有接觸不良的情況；單…可判斷第-測試群 2. 第二測料組接觸測試，令央控制單元5會 產生裝置3經咼壓端31輸出電壓至通道= 通道九2U，該電壓會經由通道二21b、^；2^通道六21f、 一 Z1D 通道五21e；5補消λ 2 lh經電流偵測裝置4回流高壓產生裝置3， 裝置4偵測的電流值，中央控制單元 組是否有接觸不良的情況； 第-測4群 3. 第三測試群組接觸測試，中央控制單元$ 產生裝置3經高壓端31輪出電壓至通道—2U、通道四 ^道七=，該電壓會經由通道三⑴、通道六加及通道九 11 £ 4^ ^ ^ ^ ^ ^ 3 ^ ^ t ^ ^ 值，中央控制單元5即可判斷第三測試群組 疋否有接觸不良的情況； 接著進行第一測試群組之主步驟測試S4〇 : :央控制單元5會驅使高壓產生裝置3經由高壓端Η :出向電壓至通道一 21a、通道四21d、通道七2ig，而通道 1:、通道五21e、通道八21h會輸出低電壓回流至高壓 =裝置3 ’使電流偵測裝置4可操取通道二21b、通道五 制單-通道八，21 h回流的電流信號並將信號傳送至中央控 為卢，5中判5賣若判定全部變壓器8之初級81對鐵心82 示^ °〇，則三組變壓器8皆為良品，並將測試結果傳送至顯 :置7顯示或傳送至背板輸出點；若判定為不良品， 動進入副步驟測試程序； 再進入副步驟測試程序S41 : 單_( a)係先進行第一組變壓器8的的測試，該中央控制 道:5會驅使高壓產生裝置3經高壓端31輸出高電壓至通 十亥中^la’而通道二21b會輸出低電壓回高壓產生裝置3, “二Γ以：會經由電流摘測裝置4棟取的電流值，判 、叉座1§ 8之初級81對鐵心82為良品或不良品，並 201211553 將測試結果傳送至顯示裝置6顯示或傳送至背板輸出點； (b)接著進行第二組變壓器的的測試，該中央控制單 元5會驅使高壓產生裝置3經高壓端31輸出高電壓至通道 四21d’而通道五21e會輸出低電壓回高壓產生裝置3，該 中央控制單元5會經由電流偵測裝置4擷取的電流值，判斷 第一組變壓器8之初級81對鐵心82為良品或不良品，並將 測試結果傳送至顯示裝置7顯示或傳送至背板輸出點； ( c )接著進行第三組變壓器8的的測試，該中央控制 單5會驅使高壓產生裝置3經高壓端31輸出高電壓至通 道七21g’而通道八21h會輸出低電壓回高壓產生裝置3,In i) ^又1田] Step to the test point of the third group of transformers 8 of the third test group, the channel 0~^ is set as the low voltage output; Bu is also the high voltage output, the channel is 9U The setting result of step t is read in the central control unit 5" Generate LUtl: contact test 'The central control unit 5 will drive the high voltage generating device 3 through the pressure terminal 31 channel seven 2ie, the voltage will pass through the channel to the channel one 21a, channel four 21d, 21h through the current detection device 4 f 2lb, channel five 21e and channel eight mouth flow pressure generating device 3, through the current detection 201211553 device 4 detected current value 'central control single open ^ it, Whether the group has poor contact; single... can judge the first test group 2. The second test group contact test, so that the central control unit 5 will generate the device 3 output voltage through the pressing end 31 to the channel = channel nine 2U, The voltage will pass through channel 2 21b, ^; 2^ channel 6 21f, a Z1D channel 5 21e; 5 cancel λ 2 lh through the current detecting device 4 back to the high voltage generating device 3, the current value detected by the device 4, the central control unit Whether the group has poor contact; the first - test 4 group 3. In the three test group contact test, the central control unit $ generating device 3 rotates the voltage through the high voltage terminal 31 to the channel - 2 U, the channel four channel seven =, the voltage will pass through the channel three (1), the channel six plus the channel nine 11 £ 4 ^ ^ ^ ^ ^ ^ 3 ^ ^ ^ ^ ^ value, the central control unit 5 can determine whether the third test group has a bad contact; then the main test step of the first test group test S4〇: : The control unit 5 drives the high voltage generating device 3 via the high voltage terminal Η: the outgoing voltage to the channel one 21a, the channel four 21d, the channel seven 2ig, and the channel 1:, channel five 21e, channel eight 21h will output a low voltage return to the high voltage = device 3 'The current detecting device 4 can operate the channel 2 21b, the channel 5 system single-channel eight, the 21 h return current signal and the signal is transmitted to the central control for Lu, 5 in the 5 to sell if the determination of all transformers 8 The primary 81 pairs of the iron core 82 show ^ ° 〇, then the three sets of transformers 8 are good, and the test results are transmitted to the display: set 7 display or transmitted to the back panel output point; if it is determined to be defective, move into the sub-step test procedure ; Enter the sub-step test procedure S41: Single _( a) Performing the test of the first group of transformers 8, the central control track: 5 will drive the high voltage generating device 3 to output a high voltage through the high voltage terminal 31 to the Tongshihai ^la' and the channel 2 21b will output a low voltage back to the high voltage generating device 3. , "Two Γ : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , Transfer to the backplane output point; (b) Next, test the second set of transformers, the central control unit 5 will drive the high voltage generating device 3 to output a high voltage through the high voltage terminal 31 to the channel four 21d' and the channel five 21e will output low The voltage is returned to the high voltage generating device 3, and the central control unit 5 determines, via the current value drawn by the current detecting device 4, that the primary 81 of the first group of transformers 8 is good or defective for the core 82, and transmits the test result to the display. The device 7 displays or transmits to the backplane output point; (c) then performs a test of the third set of transformers 8, which drives the high voltage generating device 3 to output a high voltage through the high voltage terminal 31 to the channel seven 21g' and the channel Eight 21h will output a low voltage back to the high voltage generating device 3,
3亥中央控制單元5會經由電流偵測裝置4擷取的電流值，判 斷第一組變壓器8之初級81對鐵心82為良品或不良品，並 將測試結果傳送至顯示裝置7顯示或傳送至背板輸出點。The central control unit 5 determines that the primary 81 of the first group of transformers 8 is a good or defective product, and transmits the test result to the display device 7 for display or transmission to the display device 7 via the current value drawn by the current detecting device 4. Backplane output point.
然後’進行第二測試群組之高壓測試S5〇，該第二測Ί 群組的主步驟測試流程皆與第一測試群組相同，差異處在; 係由通道二21c、通道六21f及通道九2Π輸出高電壓，而彳 ^一 21b、通道五2le及通道八21h輸出低電壓，藉以判| f組變壓器的次級83對鐵心82為良品或不良品；若為不 品，同樣會自動進入副步驟測試程序S51，該副步驟測試; 序的測試流程皆與第一測試群組相同，差異處在於通道· 21c輸出高壓，而通道二21b輸出低壓，肖以判斷第一組< =器=之次級83對鐵心82為良品或不良品；接著通道六2 •J出同壓，通道五2ie輸出低壓，藉以斷定第二組變壓器 2級83對鐵心82為良品或不良品；接著通道九2U^ ^ 通道八21h輸出低壓，藉以斷定第三組變壓器8之: 83;對鐵82為良品或不良品；其他流程皆與第一測試^ ，且測試流程相同，於此不在贅述。 最後’進行第三測試群組之高壓測試漏，該 群組的主步驟測試流程皆诳笛— n° 係由一”與第測喊群組相同，差異處在为 系由通道- 2U、通道四21d及通道七21§輸出高電壓y 12 201211553Then, 'the high voltage test S5〇 of the second test group is performed, and the main step test process of the second test group is the same as the first test group, and the difference is in; the channel 21c, the channel 6 21f and the channel are 9 2 Π output high voltage, and 彳 ^ 21b, channel 5 2le and channel 8 21h output low voltage, so that the secondary 83 pairs of cores of the f group transformers are good or defective; if not, the same will automatically Enter the sub-step test program S51, the sub-step test; the sequence test process is the same as the first test group, the difference is that the channel · 21c output high voltage, and the channel two 21b output low voltage, Xiao to determine the first group < The secondary 83 of the device = the core 82 is a good or defective product; then the channel 6 2 • J is the same pressure, the channel 5 2ie output low voltage, thereby determining that the second group of transformers 2 level 83 pairs of core 82 is good or defective; Channel 9 2U ^ ^ Channel 8 21h output low voltage, in order to determine the third group of transformers 8: 83; the iron 82 is good or defective; other processes are the same as the first test ^, and the test process is the same, not repeated here. Finally, 'the high-voltage test leak of the third test group, the main step test process of the group is the flute-n° system is the same as the first test group, the difference is in the channel- 2U, channel Four 21d and channel seven 21 § output high voltage y 12 201211553
，道三21c、通道六21£及通道九2Η輸出低電壓，藉以判斷 三，變壓器8的初級81對次級83為良品或不良品·，若為不 良品’同樣會自動進入副步驟測試程序S61，該副步驟測試 程序的測試流程皆與第一測試群組相同，差異處在於通道一 21a。。輸出高壓，而通道三21c輸出低壓，藉以判斷第一組變 壓器8之初級81對次級83為良品或不良品；接著通道四 輸出高壓，通道六21f輸出低壓，藉以斷定第二組變壓器8 ^初級81對次級83 $良品或不良品；接著通道七輸出 尚壓，通道九21i輸出低壓，藉以斷定第三組變壓器8之初 級81對次級83為良品或不良品；其他流程皆與第_測試 組測試流程相同，於此不在贅述。 上述變壓器8之高壓測試僅為本案之較佳實施方式，並 侷限本案之申請專利範圍’若曰後無論何種產品僅要 主、副步驟之高壓測試模式，應該皆納人本案之申請 更具有以下的優 本發明與其他習用產品相互比較時， 點： . 明係以主、副測試步驟分離模式測試待測物， 以達到減少測試時間，提高測試速度之目的。 2. 當主步驟測試程序判定測試待測物群組發 ::::進:::動程序，針對個 3· 讓操作人員極易將不良品剔除。 4 ·本發明係將真正的不良往 接點上，囍Λ ά &良寺1物位置訊號輸出在背板 接點上藉由自動設備將不良品剔除。 5· ^發明係壓測試前先進行與 查，以避免測試失誤。 』ν任蜩檢 【圖式簡單說明】 13 201211553 圖一為本發明具主副步驟高壓多點測試設備及方法之 方塊圖； 圖二為本發明具主副步驟高壓多點測試設備及方法之 設備示意圖；以及 圖三為本發明具主副步驟高壓多點測試設備及方法之 操作流程圖。 【主要元件符號說明】 1 高/低壓切換裝置 SH 高壓開關 SL 低壓開關 2 測試通道組 2 1 a〜2 1 η 測試通道 3 高壓產生裝置 31 高壓端 32 低壓端 4 電流偵測裝置 5 中央控制單元 6 輸入裝置 7 顯示裝置 8 變壓器 81 初級 82 鐵心 83 次級, Road 3 21c, channel 6 21 £ and channel 9 2 Η output low voltage, to judge three, transformer 8 primary 81 to the secondary 83 for good or defective products, if the defective product 'will also automatically enter the sub-step test procedure S61, the test procedure of the sub-step test program is the same as the first test group, and the difference lies in channel one 21a. . The output high voltage, and the channel three 21c output low voltage, thereby judging the primary 81 of the first group of transformers 8 to the secondary 83 as a good or defective product; then the channel four output high voltage, the channel six 21f output low voltage, thereby determining the second group of transformers 8 ^ Primary 81 pairs of secondary 83 $ good or bad; then channel 7 output is still pressed, channel 9 21i output low voltage, to conclude that the third group of transformer 8 primary 81 to secondary 83 is good or defective; other processes are the same The test process of the test group is the same and will not be described here. The high-voltage test of the above-mentioned transformer 8 is only the preferred embodiment of the present case, and the scope of the patent application in this case is limited. If the product is only subjected to the high-voltage test mode of the main and sub-steps, it should be applied to the application of the case. When the following superior inventions are compared with other conventional products, the point: The Ming system tests the test object in the separation mode of the primary and secondary test steps to achieve the purpose of reducing the test time and increasing the test speed. 2. When the main step test program determines that the test object group sends :::: into::: move the program, for the 3 · let the operator easily remove the defective products. 4 · The present invention removes the defective product by the automatic device on the backplane contact at the true bad contact point, 囍Λ ά & 5· ^ Invent the pressure test before conducting and checking to avoid test errors. ν 蜩 蜩 【 图 图 图 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 The device schematic diagram; and FIG. 3 is a flow chart of the operation of the high-voltage multi-point testing device and method with the main and auxiliary steps of the present invention. [Main component symbol description] 1 High/low voltage switching device SH High voltage switch SL Low voltage switch 2 Test channel group 2 1 a~2 1 η Test channel 3 High voltage generator 31 High voltage terminal 32 Low voltage terminal 4 Current detecting device 5 Central control unit 6 Input device 7 Display device 8 Transformer 81 Primary 82 Core 83 Secondary
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