TWI280398B - Power circle period testing device and method for testing power circle period thereof - Google Patents

Power circle period testing device and method for testing power circle period thereof Download PDF

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Publication number
TWI280398B
TWI280398B TW94103014A TW94103014A TWI280398B TW I280398 B TWI280398 B TW I280398B TW 94103014 A TW94103014 A TW 94103014A TW 94103014 A TW94103014 A TW 94103014A TW I280398 B TWI280398 B TW I280398B
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Taiwan
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power
power supply
signal
electronic product
cycle
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TW94103014A
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Chinese (zh)
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TW200628821A (en
Inventor
I-Lin Liang
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Mitac Int Corp
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Abstract

A power circle period testing device and a method for testing power circle period are provided. The power circle period testing device comprises a controlling unit, a switch unit, and a power supply. And the power circle period testing device is used for testing power circle period of an electrical produce coupling with an AC power. The switch unit is coupled with the controlling unit. A power button simulating signal is outputted into the electrical produce from the controlling unit. A controlling signal is outputted into the switch unit from the controlling unit. The switch unit is used for coupling and turning on/off the AC power according to the controlling signal from the controlling unit. The power supply is coupled to the controlling unit. And the power supply is used for providing a driving power to the controlling unit.

Description

1280398 15020twfl.doc/006 95-9-4 九、發明說明: 【發明所屬之技術領域】 本發明是有關於-種電源循環週期測 環週期測試方法,且特別是有關於—種電子^。及電源循 環週期的電源循環週期測試裝置及雷、、^ 阳之電源循 法。 电/雄循環週期測試方 【先前技術】 φ 隨著電子科技的突飛猛進,各種電子產口 ^ 地應用於我們的工作及生活當中’尤其是目;最 I訊及家電等電子產品。這些電子產品在岐 經過一連串的測試項目,以確保產品可正常運/ =肩 測試項目也包括測試電子產品在長時間操作 二 -就電駐機而言’在組裝完成後’通常會對電腦行 開關機的電賴環職職,以確認電腦域可 習知的電源循環週期測試大致上分為_,其中: 係週期性地輸入訊號至電腦主機,以使電腦主機^ 關機,以核擬使用者在開、關機時手動按壓電腦主機之恭 源鍵(P_button)的情況。另一種電源循環週期測試貝^ 週期性地輸入交流電壓訊號至電腦主機,以模擬使用. 拔電腦主機之電源插頭的情況。其中,習知輸入交流電壓 訊號的方法,將-開關控制裝置搞接於電腦主機與交流電 源之間,以藉由此開關控制裝置來控制交流電源與電腦主 機之間的導通與否。 眾所周知,在電腦主機的實際操作情況中,使用者係 似0398 15020twfl.d〇c/〇〇(5 95-9-4 先將電腦主機耦接至交流電 插頭插入插座),然後再按下、將電腦主機的電源 機時則係先按下電_,進行開機動作。關 之間的電性通路(也就是將電:主主機與交流電源 拔除)。然而,習知_試方 從插座上1280398 15020twfl.doc/006 95-9-4 IX. Description of the invention: [Technical field to which the invention pertains] The present invention relates to a method for testing a power cycle cycle cycle, and particularly relates to an electron. And the power cycle test equipment of the power cycle, and the power supply of Ray, and Yang. Electric / male cycle test side [previous technology] φ With the rapid advancement of electronic technology, various electronic products are used in our work and life, especially the most important products; These electronic products are passed through a series of test projects to ensure that the product can be transported normally / / shoulder test items also include testing electronic products in long-term operation two - in the case of electric parking, 'after assembly is completed' usually on the computer line The power cycle of the switch machine is used to confirm that the computer domain can be known as the power cycle test. It is roughly divided into _, where: the signal is periodically input to the host computer to shut down the computer host to verify the use. When you turn on and off, manually press the P_button of the computer. Another type of power cycle test is to periodically input the AC voltage signal to the host computer to simulate the use. Pull the power plug of the computer host. Wherein, the conventional method of inputting an AC voltage signal connects the switch control device between the host computer and the AC power source to control whether the AC power source and the computer host are turned on or off by the switch control device. As we all know, in the actual operation of the computer mainframe, the user is like 0398 15020twfl.d〇c/〇〇 (5 95-9-4 first connect the computer host to the AC plug into the socket), then press and When the power supply of the host computer is pressed, the power is turned on first. Electrical path between the off (ie, power: main host and AC power). However, the conventional _ tester from the socket

源作電源循環週期測試,因而;;=,電源鍵或交流電 作而達到完全的電源循環週期測^據电腦主機的實際操 【發明内容】 期測電的就是在提供-種電源循環週 產品的實際操作方法谁其可依據待測電子 循環週期測試。㈣電子產品進行開、關機的電源 一恭種電源循環週期測試裝置,其適於測試 、古^產口口之电源循環週期’且此電子產品係轉接至一交 錢源:此電源循環週期測辦置主要係由—控制單^The source is used for the power cycle test, thus; =, the power button or the AC power to achieve a complete power cycle test. According to the actual operation of the computer host [invention] The test is to provide a kind of power cycle products The actual operation method can be tested according to the electronic cycle period to be tested. (4) The power supply for the electronic product to be turned on and off. A power supply cycle test device is suitable for testing, the power cycle of the mouth of the ancient product port and the electronic product is transferred to a money source: this power cycle The main function of the test is to control the control unit ^

在4 j單元j及電源供應器所構成。其中,開關單元 幻工制單元,控制單元則係用以輸出一電源鍵模擬 汛狁至電子產品,以及輸出一控制訊號至開關單元。而且, 單元適於麵接至交流電源,並依據此控制訊號而決定 父流電源的開啟與否。電源供應器減至控制單元 ,適於 提供控制單元驅動電源。 在本發明的較佳實施例中,上述之控制單元的電路設 计,如是完全配置在單晶片(singlechip)上,且控制單元例 如是一微處理器(micro_controller)。在一實例中,控制單元 6 95-9-4 3見._6 較佳的是一可程式微控制器(pr〇grammable microcontroller),其例如是8051微控制器。此外,上述之 開關單元例如是一繼電器(relay),且其較佳係為一固態繼 電器(solid state relay,SSR)。It consists of 4 j unit j and power supply. The switch unit is a magic unit, and the control unit is configured to output a power button to simulate the electronic product, and output a control signal to the switch unit. Moreover, the unit is adapted to be connected to the AC power source, and the parental power source is turned on or not according to the control signal. The power supply is reduced to the control unit and is adapted to provide control unit drive power. In a preferred embodiment of the invention, the circuit design of the control unit described above is fully configured on a single chip, and the control unit is, for example, a microprocessor (micro_controller). In one example, control unit 6 95-9-4 3 see ._6 is preferably a pr〇grammable microcontroller, such as an 8051 microcontroller. Further, the above switching unit is, for example, a relay, and is preferably a solid state relay (SSR).

本發明還提出一種電源循壤週期測試方法,其適於測 试電子產品的電源循環週期。此電源循環週期測試方法係 先輸入交流電壓訊號及電源鍵模擬訊號至電子產品,經過 一段時間後再停止輸人交流龍訊號及模擬訊^ 電子產品。之後不斷重複上述兩個步驟,以模擬此電子°產 品開關機的實際操作程序。 在本發明的較佳實施例中,上述之電源循環週期測試 方法例如是將電源鍵模擬訊號與交流賴訊朗時輸入至 中。而且’其例如是同時停止輸人電源鍵模擬訊 號,、交流電壓訊號至電子產品中。 、β ^發明雜佳實施财,上叙好產品例如是具 是在幹人源’且輸人電賴顯訊朗步驟例如 號二:第一時序輸入-第-脈衝訊 外广^ ^擬手動按下電源鍵之開機動作。此 流電號的步驟例如是在停止輸入交 動按下電源鍵之關‘二輸入弟二脈衝訊號,以模擬手 猶環週期測試,=達中完成電子產品的兩種電源 凡王軼擬使用者在實際狀況下對電 1280398 15020^ 5020twfl.doc/006 95-9-4 子產品的開、關機操作程序之目的,進而提高测試址 可靠性。 ^ 為讓本發明之上述和其他目的、特徵和優點能更明顯 易懂,下文特舉較佳實施例,並配合所附圖式,作詳細說 明如下。 【實施方式】 本毛明係元全依知電子產品的實際操作程序來進行電 源循環週期測4 ’以提〶測試結果的可靠性。以下將舉實 施例說明本發明,但其並非用以限定本發明,熟習此技^ 者可依照本發明之精神對下述實施例稍做修飾,惟其仍^ 於本發明之範圍。 〃 圖^緣示為本發明之實施例中電源循環週期測試裝置 的方塊不意圖。請參照圖!,電源循環週期測試裝置_ 系用以測4電子產品1〇2的電源循環週期,而電子產品 =2例如疋藉由父流電源刚提供所需之交流賴。在此, =產品搬例如是電腦主機或是其他家電及資訊產品, 本表明並未對其加以限定。 *請繼續參照圖1,電源循環週期測試裝置100主要係 H早Γ10以及_單元12G所構成。其中,控制單 試時,控制單元110係摘至電子產品102產並 及二:源鍵模擬訊號PBss至電子產品102,以 進==用者藉由電源鍵⑷會示)對電子產品102 進订開、關機的動作。 1280398 15020twfl.d〇c/006 95-9-4 iΪ知、提的疋’控制單^ 120例如是—微控制器,且 ς、又係為-可程式微控㈣,以便於雜地更改測試次 以及輸出電源鍵模擬訊號pBSS的週期。以目前常見的 ^呈式微控㈣來說,控制單元12Q可叹漏微控制 :而圖丨之電源供應器13G即是心提供控制單元12〇 作動所需之電源。 ^外’,單元12G在職過財_接至交流電源 而鬥關控制早MW將輸出控制訊號^至開關單元120, =關單元膨卩是依據控制單元11Q所輸出之控制訊號 0腦FF的訊紅錢f源刚,叫定是否開 源刚。換言之,控制單元11G村控制交流電 的開關時間。其中,關單元120例如是一繼電器, 且其較佳係為固態繼電器。 使熟習此技藝者更加瞭解本發明之電_環週期測 =置的作動過程,以下將舉實施例酬 測試裝置對電子產品進行電源循環週期測試= 但其並非用以限定本發明。 圖2!會示為本發明之實施例中電源循環週期測試方法 _ =驟流程圖。請同時參照圖1及圖2,當電_環 3測趣置⑽據至待測之電子產品1〇2後,輸入電 源鍵模擬訊號PBSS與交流電壓訊號Acvs至電子產品 如步驟S2GG所述。值得-提的是’由於本發明可以 曰由早晶片的控制單元11G來輸出電源鍵模擬訊號pBss 1280398 15020twfl.doc/006 95-9-4 以及^以控侧關單元12()的控制訊號cs,因此能夠將電 源鍵核擬訊號PBSS與交流電壓訊號ACVS同時輸入至電 子產品,二以避免在測試過程中發生訊號延遲的問題。 值侍注意的是,本實施例之電子產品102例如是具有 ATX規格之電源。換言之,當使用者按下電子產品搬之 電源鍵後,電源鍵係輪出訊號至電子產品1〇2内部的電源 供應I置,進而開啟或關閉此電源供應裝置。而且,由於 φ 電子產品102的貫際開機程序係先將電子產品102與交流 包源104轉接後,再由使用者按下電源鍵以進行開機。因 ,,在本發明中,輸入電源鍵模擬訊號pBSS的步驟例如 是在輸入交流電壓訊號入(^^後,於第一時序u輸入一第 -脈衝訊號PS1 (如圖3所示),以模擬使用者手動按下 電源鍵的開機動作。 請繼續參照圖1及圖2,在經過一段時間後,停止輸 入電源鍵模擬訊號PBSS與交流電壓訊號ACVS至電子產 瞻品102,如步驟S202所述。然後再不斷重複步驟S2〇〇至 步驟S202,直到測試結束為止。在本實施例之步驟2〇2中, 其例如是同時停止輸入電源鍵模擬訊號PBSS與交流電壓 訊號ACVS至電子產品1〇2。 承上所述,由於電子產品102的實際關機程序係先由 使用者按下電源鍵以進行關機後,再切斷電子產品1〇2與 交流電源104的電性通路。因此,在本發明中,停止輸入 電源鍵模擬§fl號PBSS的步驟例如是在停止輸入交流電壓 Ϊ280398 twfl.doc/〇〇6 95-9-4 7號ACVS之别,於第二時序t2輸入第二脈衝訊號ps2 ^口圖3所示)’簡擬使用者手動按下電源鍵之關機動 值传提的是,在實際情況下,若使用者欲藉由電源 鍵關閉電腦主機,必須按住電源鍵約4秒至8秒才能使電 ^機義電源。因此,當本發明之電源循環週期測試方 於電腦主機的電源循環週期測試時,第二脈衝訊號 ^頻率例如是介於〇·125Ηζ至〇·25Ηζ之間。 上所述’本發㈣在同—測試循環中完成電子產品 的兩種電源循環週_試,以達到完全模擬使用者在實際 狀況下對電子產品關、襲操作 測試結果的可靠性。 延而徒回 此外,由於本發明之電源循環週期測試褒置可以使用 微控制H作為控制單元,因此㈣㈣達撕數 避免產生訊號延遲的_。而且 測試裝置更可以使用可程式微控制器作為控 =有較佳之擴紐,並且能_性地變更 關時間以及測試次數。 电原的開 雖然本發明已以較佳實施例揭露如上,然其並 限定本發明,任何熟習此賴者,在不麟 = 和範圍内,當可作些許之更動與潤飾,因此本發明 範圍當視後附之申請專利範圍所界定者為準。 保邊 【圖式簡單說明】 ’ 圖1繪示為本發明之實施例中電源循環週期測試裝置 1280398 15020twf 1 .doc/006 95-9-4 的方塊不意圖。 圖2繪示為本發明之實施例中電源循環週期測試方法 的貫施步驟流程圖。 圖3繪示為本發明之實施例中電源鍵模擬訊號PBSS 以及交流電壓訊號ACVS的訊號波形不意圖。 【主要元件符號說明】 100 :電源循環週期測試裝置 102 :電子產品 104 :交流電源 110 :控制單元 120 :開關單元 130 :電源供應器 S200 :輸入交流電壓訊號與電源鍵模擬訊號至電子產 品 S202 :停止輸入交流電壓訊號與電源鍵模擬訊號至電 子產品 ACVS :交流電壓訊號 CS :控制訊號 PBSS :電源鍵模擬訊號 PS1 :第一脈衝訊號 PS2 :第二脈衝訊號 tl :第一時序 t2 :第二時序 12The present invention also provides a power supply cycle test method suitable for testing a power cycle of an electronic product. The power cycle test method is to input the AC voltage signal and the power button analog signal to the electronic product, and then stop inputting the AC signal and the analog signal electronic product after a period of time. The above two steps are then repeated to simulate the actual operating procedure of the electronic product switch. In a preferred embodiment of the present invention, the power cycle test method described above is, for example, inputting a power button analog signal and an AC signal to the medium. Moreover, for example, the input power signal analog signal and the AC voltage signal are simultaneously stopped in the electronic product. , β ^ invented the good implementation of the financial, the above-mentioned good products, for example, is in the source of the people's and the input of the people's electricity, such as the number two: first time input - the first pulse of the external ^ ^ Manually press the power button to turn it on. The step of the galvanic number is, for example, stopping the input and pressing the power button to turn off the 'two-input two-pulse signal to simulate the hand loop test, and the two power sources that complete the electronic product are used. In the actual situation, the purpose of the opening and closing operation procedures of the 1280398 15020^ 5020twfl.doc/006 95-9-4 sub-product is improved, thereby improving the reliability of the test site. The above and other objects, features, and advantages of the present invention will become more apparent from the aspects of the appended claims. [Embodiment] The Maoming system is based on the actual operating procedure of the electronic product to perform the power cycle measurement 4' to improve the reliability of the test result. The invention is illustrated by the following examples, which are not intended to limit the invention, but may be modified by the following examples in light of the spirit of the invention. The illustration is not intended to be a block diagram of the power cycle tester in the embodiment of the present invention. Please refer to the picture! The power cycle test device _ is used to measure the power cycle of the electronic product 1〇2, while the electronic product =2, for example, just provides the required communication by the parent flow power supply. Here, = product is for example a computer host or other home appliances and information products, and this statement does not limit it. *Continuously referring to Fig. 1, the power cycle test apparatus 100 is mainly composed of H early 10 and _ unit 12G. Wherein, when controlling the single test, the control unit 110 extracts the electronic product 102 and the second: the source key analog signal PBss to the electronic product 102, so that the user can enter the electronic product 102 by using the power button (4). The action of ordering and shutting down. 1280398 15020twfl.d〇c/006 95-9-4 i know, mention 疋 'control list ^ 120 is for example - microcontroller, and ς, and is - programmable micro control (four), in order to change the test Times and the output power key analog signal pBSS cycle. In the current common micro-control (4), the control unit 12Q can sneak the micro-control: and the power supply 13G of the figure is the power supply required for the control unit 12 to operate. ^外', unit 12G is in service _ connected to the AC power supply and the control of the early MW will output the control signal ^ to the switch unit 120, = the unit expansion is based on the control signal output from the control unit 11Q 0 brain FF The red money f source just called, whether it is open source or not. In other words, the control unit 11G controls the switching time of the alternating current. The off unit 120 is, for example, a relay, and is preferably a solid state relay. A person skilled in the art will be more aware of the operation process of the present invention, and the power regeneration cycle test of the electronic product will be exemplified below. However, it is not intended to limit the present invention. Figure 2! shows the power cycle test method in the embodiment of the present invention _ = step flow chart. Referring to FIG. 1 and FIG. 2 simultaneously, after the electric_ring 3 is placed on the electronic product 1〇2 to be tested, the power key analog signal PBSS and the AC voltage signal Acvs are input to the electronic product as described in step S2GG. It is worth mentioning that 'because the present invention can output the power key analog signal pBss 1280398 15020twfl.doc/006 95-9-4 and the control signal cs of the control side off unit 12() by the control unit 11G of the early wafer. Therefore, the power key verification signal PBSS and the AC voltage signal ACVS can be simultaneously input to the electronic product, and the problem of signal delay during the test can be avoided. It is noted that the electronic product 102 of the present embodiment is, for example, a power supply having an ATX specification. In other words, when the user presses the power button of the electronic product, the power button turns the signal to the power supply I inside the electronic product 1〇2, thereby turning the power supply device on or off. Moreover, since the φ electronic product 102 is initially turned on, the electronic product 102 and the AC packet source 104 are transferred first, and then the user presses the power button to turn on the power. Therefore, in the present invention, the step of inputting the power key analog signal pBSS is, for example, inputting a first-pulse signal PS1 (shown in FIG. 3) at the first timing u after inputting the alternating voltage signal input (^^, To simulate the user's power-on action by manually pressing the power button. Please continue to refer to FIG. 1 and FIG. 2, after a period of time, stop inputting the power button analog signal PBSS and the AC voltage signal ACVS to the electronic product 102, as in step S202. Then, step S2 is continuously repeated until step S202 until the end of the test. In step 2〇2 of the embodiment, for example, the input power key analog signal PBSS and the AC voltage signal ACVS are simultaneously stopped to the electronic product. 1〇2 As described above, since the actual shutdown procedure of the electronic product 102 is performed by the user pressing the power button to turn off the power, the electrical path of the electronic product 1〇2 and the AC power source 104 is cut off. In the present invention, the step of stopping the input power key to simulate the §fl PBSS is, for example, stopping the input AC voltage Ϊ280398 twfl.doc/〇〇6 95-9-4 7 ACVS, and inputting the second at the second timing t2. pulse No. ps2 ^ port shown in Figure 3) 'The simple user manually presses the power button to turn off the power value. In the actual situation, if the user wants to turn off the computer host by the power button, you must press and hold the power button. It takes about 4 seconds to 8 seconds to make the power supply. Therefore, when the power cycle test of the present invention is tested in the power cycle of the host computer, the second pulse signal frequency is, for example, between Ηζ·125Ηζ and 〇·25Ηζ. The above-mentioned (4) in the same-test cycle complete the two power cycle weeks of the electronic product, in order to fully simulate the reliability of the user's test results of the electronic product in the actual situation. In addition, since the power cycle test device of the present invention can use the micro control H as the control unit, (4) (4) the tear number avoids the signal delay _. Moreover, the test device can use the programmable microcontroller as a control = a better expansion, and can change the off time and the number of tests. 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 This is subject to the definition of the scope of the patent application. [Brief Description] FIG. 1 is a block diagram of a power cycle test apparatus 1280398 15020twf 1 .doc/006 95-9-4 according to an embodiment of the present invention. 2 is a flow chart showing the steps of the power cycle test method in the embodiment of the present invention. FIG. 3 is a schematic diagram showing the signal waveforms of the power button analog signal PBSS and the AC voltage signal ACVS in the embodiment of the present invention. [Main component symbol description] 100: Power cycle test device 102: Electronic product 104: AC power supply 110: Control unit 120: Switch unit 130: Power supply S200: Input AC voltage signal and power key analog signal to electronic product S202: Stop inputting AC voltage signal and power button analog signal to electronic product ACVS: AC voltage signal CS: Control signal PBSS: Power button analog signal PS1: First pulse signal PS2: Second pulse signal tl: First timing t2: Second Timing 12

Claims (1)

Ϊ2,80398 15〇2〇twfi.d〇c/〇〇6 95-9-4 十、申請專利範園: 品 之電源猶if^料週期測試裝置,適於賴—電子產a -電,;期 品,乂電源鍵模擬訊號至該電子產 元所輪制=== 口 :適於接收該控制單 電源,並依^广 Μ開關早兀適於耦接至該交流 以及 〜制峨而決定該交流電源㈣啟與否; 2·如申凊專利範圍第丨項 置,其中該控制單元為單晶片·。相&週期測試裝 置,1項所述之電源循環週期測試裝 >、甲4&制早几包括一微控制器。 置,環週期測試裝 "中控制器為一可程式微控制器。、 置 5.如申請專利範圍第3項所述之電源循環 其中該微控制器為一 8051微控制器。 、π、 置 5= 範Τ項所述之電源循環週期職裝 具Τ忒開關早70包括一繼電器。 置 7.如申請專利範圍第6項所述之電_環 其中该繼電|§為一固態繼電器。 ,、衣 13 i23〇mfl._6 95-9-4 8.—種電源循琿 之電源循環週期,該^剛試方法,適於測試-電子產品 (a) 輸入—交、、& · ”料週期測試方法包括: 電子產品; 壓巩號以及一電源鍵模擬訊號至該 以及 (b) 停止輪出該交流電壓訊號與該電源鍵模擬訊號; 參 (0重複執行步驟(a)至步驟(b)。 法,9盆如中㈣8項所述之電源循環週期測試方 至該電子產品號與該交流電壓訊號係同時輪出 範㈣8項所狀電_環週期測試 /、、中在步驟(b)中係_亭止輸人該€ S 與該交流電壓訊號。 虎 11.如申請專利範圍第8項所狀電源循環週 方法,其巾該電子產品具有ATX規格之電源,且輪入二 電源鍵模擬訊號至該電子產品的步驟包括在輸入該交流^ 壓訊號後,於一第一時序輸入一第一脈衝訊號,以模擬手 動按下電源鍵之開機動作。 12·如申請專利範圍第8項所述之電源猶環週期测試 方法,其中該電子產品具有ATX規格之電源,且停止輪 入該電源鍵模擬訊號至該電子產品的步驟包括在停止輸入 该父流電虔訊號前’於一第二時序輸入一第二脈衝訊號, 以模擬手動按下電源鍵之關機動作。 14 1280398 ' 15020twfl.doc/006 95-9-4 power supply is used for providing a driving power to the controlling unit. 七、指定代表圖: (一) 本案指定代表圖為:圖(1)。 (二) 本代表圖之元件符號簡單說明: 100 :電源循環週期測試裝置 102 :電子產品 104 ·交流電源 110 ··控制單元 120 :開關單元 130 :電源供應器 ACVS :交流電壓訊號 CS :控制訊號 PBSS :電源鍵模擬訊號 • 八、本案若有化學式時,請揭示最能顯示發明特徵 的化學式:無Ϊ2,80398 15〇2〇twfi.d〇c/〇〇6 95-9-4 X. Application for patent garden: The power supply of the product is a material cycle test device, suitable for Lai-electronic production a-electricity; The product, 乂 power button analog signal to the electronic production unit is rotated === port: suitable for receiving the control unit power supply, and according to the ^ Μ switch is suitable for coupling to the communication and ~ system The AC power supply (4) is turned on or not; 2. The application unit is a single chip. The phase & period test device, the power cycle test package > described in 1 item, the A4 & system includes a microcontroller. Set, the ring cycle test device " the controller is a programmable microcontroller. 5. The power cycle as described in claim 3, wherein the microcontroller is an 8051 microcontroller. , π, set 5 = the power cycle as described in the article 职 职 Τ忒 早 早 早 早 早 早 早 早 早 早 早 早 早 早 早7. The electric_ring as described in claim 6 of the patent scope wherein the relay|§ is a solid state relay. , clothing 13 i23〇mfl._6 95-9-4 8. - Power cycle cycle of the power cycle, the ^ test method, suitable for testing - electronic products (a) input - exchange,, & · " The material cycle test method includes: an electronic product; a pressure ring and a power button analog signal to the and (b) stopping the output of the AC voltage signal and the power button analog signal; (0 repeating steps (a) to ( b). Method, 9 pots, such as the power cycle test described in item 8 (4), to the electronic product number and the AC voltage signal system, the round-up (4) 8 items of electricity _ ring cycle test /,, in the step ( b) The middle _ 亭 亭 输 该 € € € € € € € 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 11 The step of the power button analog signal to the electronic product includes inputting a first pulse signal at a first timing after inputting the AC voltage signal to simulate a power-on action of manually pressing the power button. Power supply loop test as described in item 8 The method, wherein the electronic product has a power supply of the ATX specification, and the step of stopping the driving of the power key analog signal to the electronic product includes: inputting a second pulse signal in a second timing before stopping the input of the parent current signal In order to simulate the power-off action of manually pressing the power button. 14 1280398 '15020twfl.doc/006 95-9-4 power supply is used for providing a driving power to the controlling unit. VII. Designated representative map: (1) The representative figure is: Figure (1). (2) The symbol of the representative figure is briefly described: 100: Power cycle test device 102: Electronic product 104 • AC power supply 110 • Control unit 120: Switch unit 130: Power supply ACVS: AC voltage signal CS: Control signal PBSS: Power button analog signal • Eight, if there is a chemical formula in this case, please reveal the chemical formula that best shows the characteristics of the invention: None
TW94103014A 2005-02-01 2005-02-01 Power circle period testing device and method for testing power circle period thereof TWI280398B (en)

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Publication number Priority date Publication date Assignee Title
TWI399550B (en) * 2007-11-30 2013-06-21 Hon Hai Prec Ind Co Ltd Testing system and method

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CN104267358B (en) * 2014-10-09 2017-07-07 湖南崧顺科技有限公司 Power supply automatic detecting equipment
CN113740627A (en) * 2020-05-28 2021-12-03 仁宝电脑工业股份有限公司 Test architecture and test method thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI399550B (en) * 2007-11-30 2013-06-21 Hon Hai Prec Ind Co Ltd Testing system and method

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