九、發明說明： 【發明所屬之技術領域】 本發明與-種電源測試方法有關，特別是關於一種用 門測裝置中電源元件之耐受度與其老化程度之電源 開關電路板及其測試方法。 【先前技術】 各類日新月異的今天，電子、電機、通訊及資訊等 、的電态產品，已成為人們目前曰常生活中不可或缺的 品。電器產品在使用過程中，必然會有電壓與電流 =與及作用’因而導致電場與磁場的建立，而最終形成 t擾（1merference)之現象。而提供給電器產品的電力負 、’亦會受到許多外在的因素，如斷電、雷擊、供壓不足、 線路過載等，而使輸入的負載不穩，造成電器元件老化、 扣毀或失效。有鑑於此，許多國家都已要求產品須通過電 磁相容性（Electr。Magnetic C()mpatibUity，EMC)的測試，才 能進入市場銷售。電磁相容性是指設備或系統在其運行 時’其產生之電磁環境要符合要求，即對所在周遭環境產 (Electro Magnetic Interference, EMI)^ 過-定的限值，而電器設備對所在之周遭環境中存在的電 磁干擾亦需具有-定程度忍受能力，即所謂的即電磁耐受 性（Electro Magnetic Susceptibility, EMS)。 目月j各國的電磁相谷法規都是源自國際通用法規（ΙΕ。 Standard) ’其令詳細制訂了各種電器用品的電磁標準與規 範身又而δ ’與電源系統有關的電磁干擾有：開關感應 1354804 (Switched inductance)、雷擊或開關動作產生的*波 (s零）、電愿中斷（Voltage Dips，sh〇rt interrupti〇ns)^；立 成因都是因為不穩定、不正常的電力負載所造成。為了測 試與此類問題相關之電器元件耐受度，—般測試者會模擬 ^正常的供祕件來作為其測試環境並加以強化來測試電 态用品。對各電器用品而言，内部電源元件是最容易受到 電力空載負載（即電源的開關）所影響的部位，故一般業界 在電器產品出廠前都會先將電器產品經過頻繁的開二測 試來測試此產品元件對於負載變化之耐受度。由於此類測 試需要頻繁的電源開關切換（可能超過一千次），再加上受 測產品的數量眾多’實難以一般人工操作的方法來二于： 試。再者:—般的_機測試並無法立即得知並記錄受測 裝置的動態訊息細節’如開機時間變化、測試通過與否。 故目前業界需要-發明來改善上述缺點並增加開關機測試 之便利。 φ 【發明内容】 本發明之目的，在於提供一種電源測試切換裝置以及 其測試方法。該電源測試切換装置包含一電路板，其上有 •配置複數個電源輸出入埠可分別連接至複數個電源供岸器 以及複數個受測裝置（贿，equipmem _)。透過與 電源仏應器連接’该切換電路板可同時將電源負載提供給 多個受測裝置。—外部電腦經由LPT連接4(Line Prin°t Termmal)以及其連接線來與電路_合。該電腦上搭載有 -特定的測試軟體來控制電路板以㈣與其連接之複數個 1354804 受測裝置的電源間關。該測試軟體可記錄受測裝置開機所 而之起振時間（start-up time)並設定測試可允許之延遲時 間（f ng delay time)與重開時間…如如6)。經由讓受測裝 置知電源負載空載不斷地循環切換，以此測試受測裝置中 •各電路元件（特別是電源元件）之耐受度及老化程度Γ並檢 驗其電路設計_重開機（⑽⑽起振（stan_up)相關 :。該外部電腦另外經由複數條RJ45線與各受測裝置連 ，可在测試期間内傳送受測裝置所發出之肀丨& 證受測裝置是否正常動作。 發出之測相戒以驗 本^明的優點之―，在於提供電源測試切換裝置 試受測裝置，可省掉電：…二的電源開關切換以測 作。 ’掉電源與待測裝置之間連結線插拔的動 ^發明的另一優點，在於使用一特 ，源的開關切換，其好處在 ：末： 速地進行電源的切換j ^人自動、快 本發明之另-at人力無法達成之自動測試。 數個電源連接缚，可—^電源測試切換裝置有提供複 件測試，以節省測試的時間與次數。裝置_進行元 隨著之後較佳實施例 利請求項，本發明的 ^者圖式與附上之專 【實施方式】的優點將愈加明顯。 現在請參照圖示， 較佳實施例，而非侷限不係只為了說明本發明之 1354804 如圖:所示，其為本發明實施例中一電源測試切換裝 置、構之不思圖。在本實施例中，—電源供應器⑼可透 過電源線Η)2將電源提供到電源開關切換板1〇3。電源開 關切換板103上具有複數個電源輸出蜂可經由複數條電源 線1〇4連接到複數個受測裝置1〇5a、1〇5b、i〇5c。一外部 電腦1 06透過LPT i皐107與電源開關切換板J 〇3搞合並控 制其上複數個電源輸出埠之開關。夕卜部電腦⑽並透過複 數條RJ45線路108與受測裝置1〇5a、1〇5卜1〇兄連接。 此外，外部電腦106中還搭載了一測試軟體，並由該測試 軟體來設定測試相關之參數並控制測試之進行。 參照至圖一。其為本發明實施例中一電源開關切換板 之頂視圖。如圖所示，電源開關切換板2〇1為一 pcB板結 構，其上設置有一電源輸入蟑202以及複數個電源輸出蟑 203a、203b、203c及203d。電源輸入埠2〇2可經由電源線 接收外部電源供應器所提供之電力負載，而電源輸出淳 203a、203b、203C及203d可將電源供應器所提供之負載 分別傳送至所對應之複數個受測裝置端。電源開關切換板 201上還a又置有一 LPT埠2〇2，經由該LPT埠搬，電源 開關切換板2〇1可與一外部電腦連接，並接受外部電腦2 指令進行電源輸出埠203a、203b、2〇3c及2〇3d開關切換 的動作。在本發明實施例甲’ f源開關切換板2〇ι上亦可 依測試需求選擇性地配置複數個電源輸入璋以接收不同大 小的電源負載。 圖二為本發明實施例甲測試流程之方塊圖。在確定圖 1354804 中的裝置各部位之間的連結正常後，首先，在步驟則 中，使用者需開啟外部電腦上所搭载的LpT蜂控制程式（即 測试程式）。再來，於步驟302中，使用者需設定-可延遲 時間（Ping delay Ume)及-重開機時間（⑽t “e)。可延遲 時間為外部電腦發出訊息給受測褒置到外部電腦接收到受 測裝置回應之訊息所經過的時間。假如受測裝置在可延遲 日:間内成功回覆訊息給外部電腦，即代表受測裝置通過測 试’右其未在可延遲時間内回覆訊息，即代表受測裝置未 通過測試。重開機時間則為負載切斷後到再開所經過的時 間。時間參數設定後，測試軟體會通過外部電腦發出一開 啟指令給電源開關切換板並開始讀秒。接收該開啟指令的 電，開關切換板會開通其上複數個電源輸出淳，讓電源供 應為所提供之電力負載能傳到與電源開關切換板連接之複 測裝置。接著，在步驟3〇3中，承受到負載的受測 、置會進仃開機的動作。此時受測裝置需要一段起振時間 ⑼⑽哪time)使流經其内部電路之電壓電流達到轉定讓 其内部各功能模組開始運作。起振完成後，受測裝置會透 過RJ45、線回應一訊息給外部電腦，接收到回應訊息的外 部電腦會停止讀秒。此時，在㈣3()4，軟體會比較訊號 回應時間（response time)以及初始設定之可延遲時間。當回 應時間小於可延遲時間，則受測裝置通過測試；當回時 間大於可延料間m丨裝置測試失敗。在此步驟^， 搭載之測試軟體會將此次測試之結果（如回應時間、測試成 功與失敗等）記錄在外部電腦中紐的路徑上。在電腦記錄 s 1354804 此次測試數據後，於笋 外部電腦發出—關門#八7 305令，測試軟體會通過 指令的電源開關切：二…電源開關切換板。接收該關閉 並在經過重開機時間後再發二=體會開始計時’ 板使其開啟電源輸出埠，讓受給電源開關切換 測試。在本▲ 裝置承Μ载並再次接受 可重複二=:2到步驟305之間的流程是 血外部電r的二：忍即’複數個受測裝置可在測試軟體 的控制下進行自動且多次的測試，使用者可自 開機=項Γ式參數’如電源開關次數、可延遲時間、重 〜斤二曰* j用負載之大小等。測試系統並會自動記錄測 6式所付之數據供使用者分析與參考。 眚^t之描述是本發明的特別實施例。須注意者係為本 用以做—說明’在不違背本發明之精神與範圍 下’凡熟悉此領域之技藝者對於其可能實行之許多變更與 >文* 4修改與變更將被涵蓋於本發明之專利主張 與均^(equivalent)的範缚内。 【圖式簡單說明】 本發明在某些部份與配置會以物理的方式呈現，其較 佳實施例在說明書中會有詳細的描述與圖示，其中： 圖一為根據本發明實施例一電源測試切換裝置之結構 示意圖； 圖一為根據本發明實施例一電源開關切換板之頂視 圖； c s 10 1354804 圖三為根據本發明實施例一測試流程方塊圖。 【主要元件符號說明】 101 電源供應器 102 電源線 103 電源開關切換板 104 電源線 105a 受測裝置 105b 受測裝置 ® 105c受測裝置 106 電腦 107 LPT i皐 108 RJ45 線 201 電源開關切換板 202 電源輸入淳 203a 電源輸出埠 φ 203b 電源輸出埠 203c 電源輸出璋 203d 電源輸出埠 301 步驟 302 步驟 303 步驟 304 步驟 305 步驟IX. INSTRUCTIONS OF THE INVENTION: TECHNICAL FIELD The present invention relates to a power supply test method, and more particularly to a power switch circuit board and a test method thereof for using a power supply component in a gate test device to withstand the degree of aging. [Prior Art] Today, all kinds of electronic products, such as electronics, motors, communications and information, have become indispensable in people's daily life. In the process of using electrical products, there will inevitably be voltage and current = and interactions, thus leading to the establishment of electric and magnetic fields, and eventually forming a phenomenon of t-spot. The power supply to the electrical products is negative, 'will also be subject to many external factors, such as power outages, lightning strikes, insufficient supply pressure, line overload, etc., and the input load is unstable, causing the electrical components to age, buckle or fail. . In view of this, many countries have required products to pass the test of Electromagnetic Compatibility (Electr. Magnetic C() mpatibUity, EMC) before they can enter the market. Electromagnetic compatibility means that the electromagnetic environment generated by the equipment or system during its operation is required to meet the requirements, that is, the limits of the Electro Magnetic Interference (EMI), and the electrical equipment is located. Electromagnetic interference in the surrounding environment also needs to have a certain degree of tolerance, the so-called Electro Magnetic Susceptibility (EMS). The electromagnetic phase valley regulations of all countries are derived from the international general regulations (ΙΕ. Standard) 'It has detailed the electromagnetic standards and specifications of various electrical appliances and δ 'electromagnetic interference related to the power system: switch Inductive 1354804 (Switched inductance), lightning strike or switching action *wave (s zero), power interruption (Voltage Dips, sh〇rt interrupti〇ns) ^; stand-up causes are due to unstable, abnormal electrical load Caused. In order to test the electrical component tolerance associated with such problems, the tester will simulate the normal supply of the secrets as a test environment and strengthen it to test the electrical supplies. For each electrical appliance, the internal power supply component is the most susceptible to the impact of the power no-load load (ie, the switch of the power supply). Therefore, the general industry will first test the electrical products after frequent shipments of the electrical products. The tolerance of this product component to load changes. Since such tests require frequent power switch switching (possibly more than a thousand times), plus the large number of products under test, it is difficult to use manual methods. Furthermore: the general _ machine test does not immediately know and record the dynamic message details of the device under test' such as the change of boot time, whether the test passed or not. Therefore, the industry needs to invent to improve the above disadvantages and increase the convenience of the switch test. φ [ SUMMARY OF THE INVENTION] It is an object of the present invention to provide a power supply test switching device and a test method therefor. The power test switching device includes a circuit board having a plurality of power supply ports for being connected to a plurality of power supply ports and a plurality of devices to be tested (bribe, equipmem _). By connecting to the power supply connector, the switching board can simultaneously supply the power supply to multiple devices under test. - The external computer is connected to the circuit via the LPT connection 4 (Line Prin°t Termmal) and its connection line. The computer is equipped with a specific test software to control the board to (iv) the power supply of a plurality of 1354804 devices under test connected to it. The test software records the start-up time of the device under test and sets the allowable delay time (f ng delay time) and reopen time... as shown in 6). By letting the device under test know that the power supply load is idling continuously and cyclically, to test the tolerance and aging of each circuit component (especially the power supply component) in the device under test Γ and verify its circuit design _ restart ((10)(10) Start-up (stan_up) related: The external computer is connected to each device under test via a plurality of RJ45 lines, and can transmit the test device issued by the device under test during the test period to verify whether the device under test is operating normally. The principle of measuring the phase to verify the advantages of this is to provide a test device for the power test switching device, which can save power: ... the power switch of the second switch to test. 'The link between the power supply and the device under test Another advantage of the invention is that it uses a special, source switching switch, and its benefits are as follows: End: Speed power supply switching j ^ person automatic, fast invented by the other -at manpower can not be achieved Automatic test. Several power supply connections, can be - ^ power test switching device provides a copy test to save the time and number of tests. Device _ proceeding with the preferred embodiment of the preferred request, the hair The advantages of the embodiment and the attached embodiments will become more apparent. Referring now to the drawings, the preferred embodiments, and not limitation, are only for the purpose of illustrating the 1354804 of the present invention. In the embodiment of the present invention, a power supply test switching device is constructed. In the present embodiment, the power supply (9) can supply power to the power switch switching board 1〇3 through the power line Η2. The power switch switching board 103 has a plurality of power output bees that can be connected to a plurality of devices under test 1〇5a, 1〇5b, i〇5c via a plurality of power lines 1〇4. An external computer 106 is combined with the power switch switch board J 〇3 through the LPT i皋 107 to control the switch of the plurality of power output ports. The computer (10) is connected to the device under test 1〇5a, 1〇5卜1〇 through a plurality of RJ45 lines 108. In addition, the external computer 106 is also equipped with a test software, and the test software sets the test related parameters and controls the test. Refer to Figure 1. It is a top view of a power switch switching board in the embodiment of the present invention. As shown, the power switch switching board 2〇1 is a pcB board structure having a power input port 202 and a plurality of power output ports 203a, 203b, 203c and 203d. The power input port 〇2〇2 can receive the power load provided by the external power supply via the power line, and the power output ports 203a, 203b, 203C, and 203d can respectively transmit the load provided by the power supply to the corresponding plurality of received Test device end. The power switch switching board 201 is further provided with an LPT 埠 2 〇 2, through which the power switch switching board 2 〇 1 can be connected to an external computer, and receives an external computer 2 command for power output 埠 203a, 203b , 2〇3c and 2〇3d switch switching action. In the embodiment of the present invention, the A' source switch panel 2 can also selectively configure a plurality of power inputs to receive power loads of different sizes according to test requirements. FIG. 2 is a block diagram of a test procedure of an embodiment of the present invention. After determining that the connections between the various parts of the device in Figure 1354804 are normal, first, in the step, the user needs to turn on the LpT bee control program (ie, the test program) carried on the external computer. Then, in step 302, the user needs to set a ping delay Ume and a reboot time ((10)t "e). The delay time is for the external computer to send a message to the tested device to receive the external computer. The elapsed time of the message that the device under test responds. If the device under test successfully responds to the external computer within the delay time: the device under test passes the test 'right' and does not reply the message within the delay time. The test device fails the test. The restart time is the time elapsed after the load is cut off and then turned on. After the time parameter is set, the test software will send an open command to the power switch switch board through the external computer and start the countdown. The power of the command, the switch switch board will open a plurality of power output ports 淳, so that the power supply can be transmitted to the retest device connected to the power switch switch board. Then, in step 3〇3, When the load is tested, the action will be turned on. At this time, the device under test needs a period of start-up time (9) (10) and time to make the voltage flowing through its internal circuit. After the flow is reached, the internal functional modules will start to operate. After the start-up is completed, the device under test will respond to a message via the RJ45 and the line to the external computer. The external computer that receives the response message will stop the countdown. At this time, at (4) 3 () 4, the software will compare the signal response time (response time) and the initial settable delay time. When the response time is less than the delay time, the device under test passes the test; when the return time is greater than the extendable device, the device test fails. In this step ^, the test software is loaded on the path of the test (such as response time, test success and failure, etc.) on the path of the external computer. After the computer records s 1354804 this test data, The external computer of the bamboo shoots is issued - close the door #8 7 305, the test software will cut through the power switch of the command: two... the power switch switch board. Receive the shutdown and send the second time after the restart time to start the timing 'board Turn on the power output 埠, let the power switch switch the test. In this ▲ device load and accept the process between repeatable two =: 2 to step 305 It is the second of the blood external electricity r: forbearance that 'multiple devices under test can be tested automatically and repeatedly under the control of the test software, the user can self-start = item parameter" such as the number of power switches, delay time The weight of the load is the size of the load, etc. The test system will automatically record the data paid by the type 6 for analysis and reference by the user. The description of 眚^t is a special embodiment of the present invention. The present invention is intended to be illustrative of the various changes and modifications that may be made by those skilled in the art, and the modifications and variations will be encompassed by the present invention. The patent claims are within the scope of the equivalent. [Simplified description of the drawings] The present invention will be physically presented in some parts and configurations, and the preferred embodiment will be described in detail in the specification. 1 is a schematic structural view of a power test switching device according to an embodiment of the present invention; FIG. 1 is a top view of a power switch switchboard according to an embodiment of the present invention; cs 10 1354804 FIG. Test Example a process flow diagram. [Main component symbol description] 101 Power supply 102 Power supply line 103 Power switch switching board 104 Power line 105a Device under test 105b Device under test® 105c Device under test 106 Computer 107 LPT i皋108 RJ45 Line 201 Power switch switch board 202 Power supply Input 淳203a Power output 埠φ 203b Power output 埠203c Power output 璋203d Power output埠301 Step 302 Step 303 Step 304 Step 305 Step