TWM463843U - Switching on/off test system for electronic device - Google Patents

Switching on/off test system for electronic device Download PDF

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Publication number
TWM463843U
TWM463843U TW102210474U TW102210474U TWM463843U TW M463843 U TWM463843 U TW M463843U TW 102210474 U TW102210474 U TW 102210474U TW 102210474 U TW102210474 U TW 102210474U TW M463843 U TWM463843 U TW M463843U
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Taiwan
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power
tested
relay
test
electrically connected
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TW102210474U
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Chinese (zh)
Inventor
hong-ji Lin
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Avalue Technology Inc
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Description

電子裝置之開關機測試系統Electronic device switch test system

本創作係有關於一種開關機治具,尤指一種電子裝置之開關機測試系統。This creation is about a switch fixture, especially an on-off test system for electronic devices.

一般電腦主機、伺服器或其他單體機器等電子裝置在研發、生產及測試過程中,都需要經由重複性的電源開關機測試以確保其硬體及韌體的可靠度。In general, electronic devices such as computer mainframes, servers, or other single devices need to be tested by repeating power on/off tests during development, production, and testing to ensure the reliability of their hardware and firmware.


配合參閱第一圖,為一習知之電子裝置之開關機測試系統之電路方塊圖。電子裝置之開關機測試系統10電連接於一交流電源ACP及一待測機電源TP,待測機電源TP電連接於一待測機TM,用以提供待測機TM開機時所需的電力。電子裝置之開關機測試系統10接收交流電源ACP,並控制導通電力至待測機電源TP與否,藉以達成待測機TM重複性開關機測試。

Referring to the first figure, it is a circuit block diagram of a conventional switching device test system for an electronic device. The switch test system 10 of the electronic device is electrically connected to an AC power supply ACP and a test machine power supply TP, and the test machine power supply TP is electrically connected to a test machine TM to provide power required for the test machine TM to be powered on. . The on/off test system 10 of the electronic device receives the AC power supply ACP and controls whether the conduction power is to the test machine power supply TP or not, thereby achieving the repeatability switch test of the test machine TM.


電子裝置之開關機測試系統10包含一計時器100、一繼電器110、一計數器120及一交流電源輸出端AC-OUT。計數器120及交流電源輸出端AC-OUT分別電連接於繼電器110,交流電源ACP電連接於計時器100及繼電器110。

The electronic device on/off test system 10 includes a timer 100, a relay 110, a counter 120, and an AC power output AC-OUT. The counter 120 and the AC power output terminal AC-OUT are electrically connected to the relay 110, respectively, and the AC power source ACP is electrically connected to the timer 100 and the relay 110.


計時器100用以設定繼電器110開啟及關閉的時間,藉以切斷或導通經由交流電源輸出端AC-OUT傳遞至待測機電源TP的電力,使達成待測機TM的開關機測試。

The timer 100 is used to set the time when the relay 110 is turned on and off, so as to cut off or turn on the power transmitted to the power supply to be tested TP via the AC power output terminal AC-OUT, so that the on/off test of the device to be tested TM is achieved.


計數器120用以累計電力導通至待測機電源TP的次數,計數器120可於測待機TM完成測試時,達成歸零設定。

The counter 120 is used to accumulate the number of times that the power is turned on to the power source to be tested TP, and the counter 120 can reach the zero setting when the standby TM is completed.


前述之電子裝置之開關機測試系統10具有結構簡單之優點,但只能針對交流電源進行斷電及復電的功能,故使用上的方便性不足。其次,計數器120是連接在繼電器110及交流電源輸出端AC-OUT之間,故繼電器110在切換過程中產生的火花將影響計數器120的計數準確度。

The above-mentioned electronic device switching machine test system 10 has the advantages of simple structure, but can only perform the functions of powering off and re-energizing the AC power source, so the convenience in use is insufficient. Secondly, the counter 120 is connected between the relay 110 and the AC power output terminal AC-OUT, so the spark generated by the relay 110 during the switching process will affect the counting accuracy of the counter 120.


配合參閱第二圖,為另一習知之電子裝置之開關機測試系統之電路方塊圖。電子裝置之開關機測試系統20電連接於一第一交流電源ACP1及一待測機TM,待測機TM電連接於一待測機電源TP,待測機電源TP電連接至一第二交流電源ACP2,待測機電源TP電連接於一待測機TM,用以提供待測機TM開機時所需的電力。電子裝置之開關機測試系統20控制待測機TM重複性的開關機,藉以達成待測機TM的開關機測試。

Referring to the second figure, it is a circuit block diagram of another conventional electronic device on-off test system. The switchgear test system 20 of the electronic device is electrically connected to a first AC power source ACP1 and a device to be tested TM. The device to be tested TM is electrically connected to a power source TP to be tested, and the power source TP to be tested is electrically connected to a second AC. The power supply ACP2, the power supply to be tested TP is electrically connected to a to-be-tested machine TM, and is used to provide power required for the to-be-tested machine TM to be powered on. The on/off switch test system 20 of the electronic device controls the switch machine of the test machine TM repeatability, thereby achieving the on/off test of the test machine TM.


待測機TM內建有開機次數程式,並可接收由電子裝置之開關機測試系統20傳遞之開關機信號及傳遞開機完成信號至電子裝置之開關機測試系統。

The test machine TM has a built-in number program, and can receive the switch signal transmitted by the switch test system 20 of the electronic device and the switch test system that transmits the start completion signal to the electronic device.


電子裝置之開關機測試系統20包含一測試機200,測試機200可例如為一個人電腦,且內建有測試用程式及計時及計數功能程式,同時可以接收待測機TM所傳遞之一開機完成之檢測信號。

The switch test system 20 of the electronic device includes a test machine 200. The test machine 200 can be, for example, a personal computer, and has a built-in test program and a timing and counting function program, and can receive one of the devices to be tested and can be turned on. Detection signal.


測試機200係送出開機信號或關機信號至待測機TM,以控制待測機TM達成開機或關機動作。待測機TM在接收到開機信號後,係執行開機程序,並於開機程序執行完成後,傳遞開機完成信號至測試機200。

The testing machine 200 sends a power-on signal or a shutdown signal to the device to be tested TM to control the device to be tested to achieve a power-on or power-off action. After receiving the power-on signal, the device to be tested TM executes a booting process, and after the booting process is completed, transmits a boot-up completion signal to the testing machine 200.


同時,測試機200可進行開機時間及關機時間的設定,並依據所設定的開機時間及關機時間傳遞開機信號或關機信號至待測機,以達成待測機TM的開關機測試。

At the same time, the testing machine 200 can set the power-on time and the shutdown time, and transmit the power-on signal or the power-off signal to the device to be tested according to the set power-on time and the power-off time, so as to achieve the switch-on test of the machine to be tested TM.


電子裝置之開關機測試系統20具有測試程式設計容易、開機時間或關機時間設定簡易及可明確接收開機完成信號之優點,然而,測試機200的設置增加成本的支出,且只能透過開機信號及關機信號模擬待測機TM在交流電源ACP導通或斷開時的開關機狀態,無法針對待測機TM電源進行測試(即無法得知待測機TM實際於交流電源操作下的結果),導致整體可靠度下降。

The switch test system 20 of the electronic device has the advantages that the test program design is easy, the boot time or the shutdown time is easy to set, and the start completion signal can be clearly received. However, the setting of the test machine 200 increases the cost, and only through the boot signal and The shutdown signal simulates the state of the on/off tester TM when the AC power supply ACP is turned on or off, and cannot test the power supply of the test machine TM (ie, the result of the test machine TM actually under the AC power supply operation cannot be known), resulting in Overall reliability is declining.

鑒於先前技術所述,本揭示內容之一技術態樣,在於提供一種電子裝置之開關機測試系統,電子裝置之開關機測試系統針對待測機進行開關機測試及斷電和復電測試,可有效地提高待測機的可靠性。In view of the prior art, one aspect of the present disclosure is to provide an on-off test system for an electronic device. The on-off test system of the electronic device performs on-off test and power-off and re-power test for the device to be tested. Effectively improve the reliability of the machine under test.


本技術態樣一實施方式提供一種電子裝置之開關機測試系統,電子裝置之開關機測試系統電連接於一交流電源、一待測機電源及一待測機,電子裝置之開關機測試系統包含:一控制單元;一第一繼電器,電連接於控制單元及交流電源;一第二繼電器,電連接於控制單元;一電源開關,電連接於控制單元及待測機;一交流電源輸出端,電連接於第一繼電器;一直流電源輸出端,電連接於第二繼電器,其中,待測機電連接於交流電源輸出端或直流電源輸出端,控制單元藉由控制第一繼電器或第二繼電器以使待測機進行斷電及復電測試,控制單元係藉由控制電源開關以使待測機進行開關機測試。

An embodiment of the present invention provides an on-off test system for an electronic device. The on-off test system of the electronic device is electrically connected to an AC power source, a power supply to be tested, and a test machine. The switch test system of the electronic device includes a control unit; a first relay electrically connected to the control unit and the AC power source; a second relay electrically connected to the control unit; a power switch electrically connected to the control unit and the device to be tested; and an AC power output terminal, Electrically connected to the first relay; the DC power output end is electrically connected to the second relay, wherein the electromechanical device to be tested is connected to the AC power output end or the DC power output end, and the control unit controls the first relay or the second relay by The test unit is powered off and re-tested, and the control unit controls the power switch to enable the test machine to perform the on-off test.


根據本揭示內容之一實施方式,電子裝置之開關機測試系統更包含一用以接收待測機發出的開機完成信號之信號輸入端,信號輸入端電連接於控制單元及待測機。

According to an embodiment of the present disclosure, the switch test system of the electronic device further includes a signal input end for receiving a power-on completion signal sent by the test machine, and the signal input end is electrically connected to the control unit and the device to be tested.


根據本揭示內容之一實施方式,電子裝置之開關機測試系統更包含一顯示器,電連接於控制單元。

According to an embodiment of the present disclosure, the on-off test system of the electronic device further includes a display electrically connected to the control unit.


根據本揭示內容之一實施方式,其中控制單元更包含一計數器,電連接於信號輸入端。

According to an embodiment of the present disclosure, the control unit further includes a counter electrically connected to the signal input end.


根據本揭示內容之一實施方式,其中第一繼電器及第二繼電器分別為有接點繼電器或無接點固態繼電器。

According to an embodiment of the present disclosure, the first relay and the second relay are respectively a contact relay or a contactless solid state relay.


根據本揭示內容之一實施方式,電子裝置之開關機測試系統更包含一直流電源輸入端,電連接於第二繼電器及待測機電源。

According to an embodiment of the present disclosure, the on-off test system of the electronic device further includes a DC power input terminal electrically connected to the second relay and the power supply of the device to be tested.


根據本揭示內容之一實施方式,其中交流電源輸出端電連接於待測機電源,待側機電連接於待測機電源。

According to an embodiment of the present disclosure, the output end of the alternating current power source is electrically connected to the power source of the device to be tested, and the side is electrically connected to the power source of the device to be tested.


電子裝置之開關機測試裝置不但可以就由控制第一繼電器或第二繼電器以對待測機進行斷電及復電測試,還可以藉由電源開關進行待測機的開關機測試,使整個測試過程更貼近待測機於使用者端的使用狀態,並可確保消費者購買到硬體或韌體可靠度不佳的電子裝置。其次,電子裝置之開關機測試裝置係利用控制單元以控制第一繼電器或第二繼電器的開關狀態,同時在接收到待測機回傳的開機完成信號後利用設置於控制單元內之計數器進行開機次數的計數,可以有效地避免第一繼電器或第二繼電器在開啟及關閉時產生的火花造成誤動作之情形,進而增加計數結果的準確性。

The switching device test device of the electronic device can not only perform the power-off and re-power test of the device to be tested by controlling the first relay or the second relay, but also can perform the test of the switch of the device to be tested by the power switch, so that the whole test process It is closer to the state of use of the device under test and ensures that consumers can purchase electronic devices with poor reliability of hardware or firmware. Secondly, the on/off test device of the electronic device controls the switch state of the first relay or the second relay by using the control unit, and simultaneously starts up by using a counter set in the control unit after receiving the power-on completion signal returned by the device to be tested. The counting of the number of times can effectively avoid the situation that the spark generated by the first relay or the second relay when the opening or closing is caused to cause a malfunction, thereby increasing the accuracy of the counting result.

10、20、30、40‧‧‧電子裝置之開關機測試系統
100‧‧‧計時器
110‧‧‧繼電器
120、3020‧‧‧計數器
200‧‧‧測試機
300‧‧‧顯示器
302‧‧‧控制單元
304‧‧‧第一繼電器
306‧‧‧電源開關
308‧‧‧信號輸入端
310‧‧‧第二繼電器
AC-OUT‧‧‧交流電源輸出端
ACP‧‧‧交流電源
ACP1‧‧‧第一交流電源
ACP2‧‧‧第二交流電源
DC-IN‧‧‧直流電源輸入端
DC-OUT‧‧‧直流電源輸出端
TM‧‧‧待測機
TP‧‧‧待測機電源
10, 20, 30, 40‧‧‧Electronic device switch test system
100‧‧‧Timer
110‧‧‧ relay
120, 3020‧‧‧ counter
200‧‧‧Tester
300‧‧‧ display
302‧‧‧Control unit
304‧‧‧First Relay
306‧‧‧Power switch
308‧‧‧Signal input
310‧‧‧Second relay
AC-OUT‧‧‧AC power output
ACP‧‧‧AC power supply
ACP1‧‧‧First AC power supply
ACP2‧‧‧Second AC power supply
DC-IN‧‧‧DC power input
DC-OUT‧‧‧DC power supply output
TM‧‧‧Detering machine
TP‧‧‧Tester power supply

第一圖為一習知之電子裝置之開關機測試系統之電路方塊圖。
第二圖為另一習知之電子裝置之開關機測試系統之電路方塊圖。
第三圖為本揭示內容之電子裝置之開關機測試系統之電路方塊圖。
第四圖為本揭示內容之電子裝置之開關機測試系統與交流操作之待測機連接之電路方塊圖。
第五圖為本揭示內容之電子裝置之開關機測試系統於直流操作之待測機連接之電路方塊圖。
The first figure is a circuit block diagram of a conventional on-off test system for an electronic device.
The second figure is a circuit block diagram of another conventional electronic device on/off test system.
The third figure is a circuit block diagram of the on-off test system of the electronic device of the present disclosure.
The fourth figure is a circuit block diagram of the connection between the on-off test system of the electronic device and the test device of the AC operation.
The fifth figure is a circuit block diagram of the connection of the test machine of the electronic device of the electronic device according to the disclosure of the present invention.

請參考隨附圖示,本創作之以上及額外目的、特徵及優點將透過本創作之較佳實施例之以下闡釋性及非限制性詳細描敘予以更好地理解。The above and other objects, features, and advantages of the present invention will be better understood from the following description and appended claims.


配合參閱第三圖,為本揭示內容之電子裝置之開關機測試系統之電路方塊圖。電子裝置之開關機測試系統30電連接於一交流電源ACP、一待測機電源TP及一待測機TM(如第四圖及第五圖所示),待測機TM電連接於待測機電源TP,用以取得操作時所需的電力。電子裝置之開關機測試系統30接收交流電源ACP提供之電力,並控制導通電力至待測機電源TP與否,藉以達成待測機TM重複性開關機測試。交流電源ACP係依據待測機TM的操作電源而例如(但不限定)為市電110伏特(Voltage)或市電220伏特,待測機TM可例如(但不限定)為個人電腦(personal computer,PC)、工業電腦(industrial personal computer,IPC)或其他單體機器等電子裝置。

Referring to the third figure, a circuit block diagram of a switch test system for an electronic device of the present disclosure is provided. The switch test system 30 of the electronic device is electrically connected to an AC power supply ACP, a test machine power supply TP, and a test machine TM (as shown in the fourth and fifth figures), and the test machine TM is electrically connected to the test device. The machine power supply TP is used to obtain the power required for operation. The on/off test system 30 of the electronic device receives the power provided by the AC power source ACP, and controls the conduction power to the power source to be tested TP or not, thereby achieving the repeatability switch test of the device to be tested TM. The AC power supply ACP is based on, for example, but not limited to, a commercial power supply of 110 volts or a commercial power of 220 volts, and the test machine TM can be, for example, but not limited to, a personal computer (PC). ), an electronic device such as an industrial personal computer (IPC) or other single machine.


電子裝置之開關機測試系統30包含一顯示器300、一控制單元302、一第一繼電器304、一電源開關306、一信號輸入端308、一第二繼電器310、一交流電源輸出端AC-OUT、一直流電源輸入端DC-IN及一直流電源輸出端DC-OUT。

The switch test system 30 of the electronic device includes a display 300, a control unit 302, a first relay 304, a power switch 306, a signal input terminal 308, a second relay 310, an AC power output terminal AC-OUT, A DC power input DC-IN and a DC power output DC-OUT.


顯示器300電連接於控制單元302,控制單元302電連接於第一繼電器304、電源開關306、信號輸入端308及第二繼電器310,第一繼電器304電連接於交流電源輸出端AC-OUT,第二繼電器310電連接於直流電源輸入端DC-IN及直流電源輸出端DC-OUT。交流電源ACP電連接於控制單元302及第一繼電器304。

The display unit 300 is electrically connected to the control unit 302. The control unit 302 is electrically connected to the first relay 304, the power switch 306, the signal input terminal 308 and the second relay 310. The first relay 304 is electrically connected to the AC power output terminal AC-OUT. The second relay 310 is electrically connected to the DC power input DC-IN and the DC power output DC-OUT. The AC power source ACP is electrically connected to the control unit 302 and the first relay 304.


控制單元302包含一計數器3020。控制單元302可供設定傳遞至交流電輸出端AC-OUT或直流電輸出端DC-OUT之電力的導通時間和切斷時間,以及電源開關306的開啟時間和關閉時間;控制單元302還可以通過信號輸入端308接收由待測機TM所發出的開機完成信號,並利用計數器3020計數待測機TM的開機次數。其次,控制單元302也可以提供斷電記憶功能並驅使顯示器300顯示資訊,前述資訊包含:傳遞至待測機TM之電力的導通時間和切斷時間、電源開關306的開啟時間和關閉時間、待測機TM的開機次數、待測機TM測試狀態及電子裝置之開關機測試系統30即時狀態。

Control unit 302 includes a counter 3020. The control unit 302 can be used to set the on time and the off time of the power transmitted to the alternating current output terminal AC-OUT or the direct current output terminal DC-OUT, and the on time and the off time of the power switch 306; the control unit 302 can also input through the signal The terminal 308 receives the power-on completion signal sent by the device under test TM, and counts the number of power-on times of the device to be tested TM by using the counter 3020. Secondly, the control unit 302 can also provide a power-off memory function and drive the display 300 to display information. The foregoing information includes: an on-time and a cut-off time of the power transmitted to the device under test TM, an on-time and a turn-off time of the power switch 306, to be The number of power-on of the measuring machine TM, the test state of the machine to be tested TM, and the instant state of the on-off test system 30 of the electronic device.


第一繼電器304依據控制單元302之設定以開啟或關閉,藉以切斷或導通傳遞至交流電源輸出端AC-OUT的電力,第二繼電器310依據控制單元302之設定以開啟或關閉,藉以切斷或導通傳遞至直流電源輸出端DC-OUT的電力。第一繼電器304及第二繼電器310可分別例如(但不限制)為一般有接點繼電器或無接點固態繼電器,且第一繼電器304及第二繼電器310較佳地係使同相同類型繼電器。在本實施例中,當第一繼電器304受控制單元302控制而開啟時,將切斷導通至交流電源輸出端AC-OUT的電力,反之,當第一繼電器304受控制單元302控制而關閉時,將導通傳遞至交流電源輸出端AC-OUT的電力。當第二繼電器310受控制單元302控制而開啟時,將切斷導通至直流電源輸出端DC-OUT的電力;反之,當第二繼電器310受控制單元302控制而關閉時,將導通傳遞至直流電源輸出端DC-OUT的電力。

The first relay 304 is turned on or off according to the setting of the control unit 302, thereby cutting off or conducting the power transmitted to the AC power output terminal AC-OUT, and the second relay 310 is turned on or off according to the setting of the control unit 302, thereby cutting off Or turn on the power that is transmitted to the DC power output DC-OUT. The first relay 304 and the second relay 310 can be, for example, but not limited to, a general contact relay or a contactless solid state relay, and the first relay 304 and the second relay 310 are preferably the same type of relay. In the present embodiment, when the first relay 304 is turned on by the control unit 302, the power turned on to the AC power output terminal AC-OUT will be cut off, and when the first relay 304 is turned off by the control unit 302. , the power that is transmitted to the AC power output AC-OUT. When the second relay 310 is turned on by the control unit 302, the power that is turned on to the DC power output terminal DC-OUT will be cut off; otherwise, when the second relay 310 is controlled to be turned off by the control unit 302, the conduction is transmitted to the DC. Power at the output of the power supply DC-OUT.


於操作時,電子裝置之開關機測試系統30除了可以檢測利用交流電驅動的待測機TM,也能檢測利用直流電驅動的待測機TM,第四圖所示為電子裝置之開關機測試裝置30與交流操作之待測機TM連接之電路方塊圖,五圖所示為電子裝置之開關機測試裝置30與直流操作之待測機TM連接之電路方塊圖。

In operation, the on/off test system 30 of the electronic device can detect the test machine TM driven by the direct current, and can also detect the test machine TM driven by the direct current. The fourth figure shows the on/off test device 30 of the electronic device. A block diagram of a circuit connected to the AC operation tester TM, and FIG. 5 is a circuit block diagram showing the connection between the electronic device switch test device 30 and the DC operation test device TM.


在第四圖中,待測機電源TP電連接於交流電源輸出端AC-OUT,待測機TM電連接於待測機電源TP。電源開關306電連接於待測機TM,用以送出一開機信號至待測機TM,以驅使待測機TM執行開機程序。信號輸入端308電連接於待測機TM,用以接收待測機TM於完成開機程序後發出的一開機完成信號。

In the fourth figure, the power supply to be tested TP is electrically connected to the AC power output terminal AC-OUT, and the device to be tested TM is electrically connected to the power source to be tested TP. The power switch 306 is electrically connected to the device to be tested TM for sending a power-on signal to the device to be tested TM to drive the device to be tested TM to perform a booting process. The signal input terminal 308 is electrically connected to the device to be tested TM for receiving a power-on completion signal sent by the device to be tested TM after completing the booting process.


於實際進行待測機TM的開關機測試時,控制單元302藉由控制第一繼電器304開啟或關閉以選擇切斷或導通電力至交流電源輸出端AC-OUT,進而關閉或開啟待測機電源TP。其次,控制單元302係藉由電源開關306送出一開機信號至待測機TM。當待測機TM接收到開機信號的同時,待測機電源TP是被開啟的,則待測機TM開始執行開機程序,並於完成開機程序後發送開機完成信號。信號輸入端308接收開機完成信號並將開機完成信號傳遞至控制單元302,控制單元302通過計數器3020累計待測機TM完成開機的次數並使計數結果及待測機TM狀態顯示於顯示器300。

When the on/off test of the device under test TM is actually performed, the control unit 302 selects to cut off or conduct power to the AC power output terminal AC-OUT by controlling the first relay 304 to be turned on or off, thereby turning off or turning on the power of the device to be tested. TP. Next, the control unit 302 sends a power-on signal to the device under test TM through the power switch 306. When the device to be tested TM receives the power-on signal and the power of the device to be tested TP is turned on, the device to be tested TM starts to execute the booting process, and sends a power-on completion signal after completing the booting process. The signal input terminal 308 receives the power-on completion signal and transmits the power-on completion signal to the control unit 302. The control unit 302 accumulates the number of times the device to be tested TM is turned on by the counter 3020 and displays the count result and the state of the device to be tested TM on the display 300.


在此要說明的是,當控制單元302尚未驅使第一繼電器304以開啟待測機電源TP或者控制單元302尚未藉由電源開關306送出開機信號,則待測機TM無法執行開機程序。

It should be noted that, when the control unit 302 has not driven the first relay 304 to turn on the power to be tested TP or the control unit 302 has not sent the power-on signal by the power switch 306, the device under test TM cannot perform the booting process.


綜合以上所述,電子裝置之開關機測試裝置30不但可以就由控制第一繼電器304以對待測機TM進行斷電及復電測試,還可以藉由電源開關306進行待測機TM開關機測試,使整個測試過程更貼近待測機TM於使用者端的使用狀態,並可確保消費者購買到硬體或韌體可靠度不佳的電子裝置。

In summary, the on/off test device 30 of the electronic device can perform the power-off and re-power test of the device to be tested TM by controlling the first relay 304, and can also perform the test of the device to be tested by the power switch 306. The whole test process is closer to the use state of the device under test TM at the user end, and the consumer can purchase electronic devices with poor reliability of hardware or firmware.


其次,電子裝置之開關機測試裝置30係利用控制單元302以控制第一繼電器304的開關狀態,同時在接收到待測機TM回傳的開機完成信號後利用設置於控制單元302內的計數器3020進行待測機TM的開機次數的計數,可以有效地避免第一繼電器304在開啟及關閉時產生的火花造成誤動作之情形,進而增加計數結果的準確性。

Secondly, the on/off test device 30 of the electronic device controls the switch state of the first relay 304 by using the control unit 302, and utilizes the counter 3020 provided in the control unit 302 after receiving the power-on completion signal returned by the device under test TM. The counting of the number of power-on times of the device to be tested TM can effectively avoid the situation that the spark generated by the first relay 304 is turned on and off, causing a malfunction, thereby increasing the accuracy of the counting result.


復參閱在第五圖,待測機電源TP電連接於一直流電源DCP及直流電源輸入端DC-IN,待測機TM電連接於直流電源輸出端DC-OUT,直流電源DCP可例如(但不限定)為直流5伏特或直流-5伏特。電源開關306電連接於待測機TM,用以送出一開機信號至待測機TM,以驅使待測機TM執行開機程序。信號輸入端308電連接於待測機TM,用以接收待測機TM於完成開機程序後發出的一開機完成信號。

Referring to the fifth figure, the power supply to be tested TP is electrically connected to the DC power supply DC-DC and the DC power supply input terminal DC-IN. The test machine TM is electrically connected to the DC power supply output terminal DC-OUT, and the DC power supply DCP can be, for example (but Not limited to) 5 volts DC or dc - 5 volts. The power switch 306 is electrically connected to the device to be tested TM for sending a power-on signal to the device to be tested TM to drive the device to be tested TM to perform a booting process. The signal input terminal 308 is electrically connected to the device to be tested TM for receiving a power-on completion signal sent by the device to be tested TM after completing the booting process.


待測機電源TP係接收直流電源DCP所提供的電力,並將前述電力透過直流電源輸入端DC-IN傳遞至電子裝置之開關機測試系統30。控制單元302藉由控制第二繼電器310開啟或關閉以選擇切斷或導通電力至直流輸出端DC-OUT,進而關閉或開啟待測機電源TP。

The power supply to be tested TP receives the power provided by the DC power supply DCP, and transmits the aforementioned power through the DC power input terminal DC-IN to the power on/off test system 30 of the electronic device. The control unit 302 turns off or turns on the power to be tested TP by controlling the second relay 310 to be turned on or off to selectively cut off or conduct power to the DC output terminal DC-OUT.


其次,控制單元302藉由電源開關306送出一開機信號至待測機TM,當待測機TM接收到開機信號的同時,待測機電源TP是被開啟的,則待測機TM開始執行開機程序,並於完成開機程序後發送開機完成信號。信號輸入端308接收開機完成信號並將開機完成信號傳遞至控制單元302,控制單元302係利用計數器3020累計待測機TM完成開機的次數並使計數結果及待測機TM狀態顯示於顯示器300。

Next, the control unit 302 sends a power-on signal to the device to be tested TM through the power switch 306. When the device to be tested receives the power-on signal and the power of the device to be tested TP is turned on, the device to be tested TM starts to be turned on. The program sends a power-on completion signal after the boot process is completed. The signal input terminal 308 receives the power-on completion signal and transmits the power-on completion signal to the control unit 302. The control unit 302 uses the counter 3020 to accumulate the number of times the device to be tested TM completes the power-on and displays the count result and the state of the device to be tested TM on the display 300.


在此要說明的是,當控制單元302尚未驅使第二繼電器310以開啟待測機電源TP或者控制單元302尚未藉由電源開關306送出開機信號,則待測機TM無法執行開機程序。

It should be noted that when the control unit 302 has not driven the second relay 310 to turn on the power to be tested TP or the control unit 302 has not sent the power-on signal by the power switch 306, the device under test TM cannot perform the booting process.


綜合以上所述,電子裝置之開關機測試裝置30不但可以藉由控制第二繼電器310以對待測機TM進行斷電及復電測試,還可以藉由電源開關306進行待測機TM開關機測試,使整個測試過程更貼近待測機TM於使用者端的使用狀態,並可確保消費者購買到硬體或韌體可靠度不佳的電子裝置。

In summary, the on/off test device 30 of the electronic device can perform the power-off and re-power test of the device to be tested TM by controlling the second relay 310, and can also be tested by the power switch 306. The whole test process is closer to the use state of the device under test TM at the user end, and the consumer can purchase electronic devices with poor reliability of hardware or firmware.


其次,電子裝置之開關機測試裝置30係利用控制單元302控制第二繼電器310的開關狀態,同時在接收到待測機TM回傳的開機完成信號後利用設置於控制單元302內的計數器3020進行待測機TM的開機次數的計數,可以有效地避免第二繼電器310在開啟及關閉時產生的火花造成誤動作之情形,進而增加計數結果的準確性。

Next, the on/off control device 30 of the electronic device controls the switching state of the second relay 310 by using the control unit 302, and simultaneously performs the startup completion signal returned by the device under test TM by using the counter 3020 provided in the control unit 302. The counting of the number of power-on times of the device to be tested TM can effectively avoid the situation in which the spark generated by the second relay 310 during the opening and closing causes a malfunction, thereby increasing the accuracy of the counting result.


然以上所述者,僅為本揭示內容之較佳實施例,當不能限定本創作實施之範圍,即凡依本創作申請專利範圍所作之均等變化與修飾等,皆應仍屬本創作之專利涵蓋範圍意圖保護之範疇。

However, the above description is only a preferred embodiment of the present disclosure, and the scope of the present invention cannot be limited, that is, the equivalent changes and modifications made by the scope of the patent application of the present invention should remain the patent of the present invention. Covers the scope of intent to protect.

30‧‧‧電子裝置之開關機測試系統 30‧‧‧Electronic device switch test system

300‧‧‧顯示器 300‧‧‧ display

302‧‧‧控制單元 302‧‧‧Control unit

3020‧‧‧計數器 3020‧‧‧ counter

304‧‧‧第一繼電器 304‧‧‧First Relay

306‧‧‧電源開關 306‧‧‧Power switch

308‧‧‧信號輸入端 308‧‧‧Signal input

310‧‧‧第二繼電器 310‧‧‧Second relay

ACP‧‧‧交流電源 ACP‧‧‧AC power supply

AC-OUT‧‧‧交流電源輸出端 AC-OUT‧‧‧AC power output

DC-IN‧‧‧直流電源輸入端 DC-IN‧‧‧DC power input

DC-OUT‧‧‧直流電源輸出端 DC-OUT‧‧‧DC power supply output

Claims (7)

一種電子裝置之開關機測試系統,電連接於一交流電源、一待測機電源及一待測機,該電子裝置之開關機測試系統包含:
一控制單元;
一第一繼電器,電連接於該控制單元及該交流電源;
一第二繼電器,電連接於該控制單元;
一電源開關,電連接於該控制單元及該待測機;
一交流電源輸出端,電連接於該第一繼電器;以及
一直流電源輸出端,電連接於該第二繼電器,
其中,該待測機電連接於該交流電源輸出端或該直流電源輸出端,該控制單元藉由控制該第一繼電器或該第二繼電器以使該待測機進行斷電及復電測試,該控制單元係藉由控制該電源開關以使該待測機進行開關機測試。
An on-off test system for an electronic device is electrically connected to an AC power source, a power supply to be tested, and a test machine to be tested. The switch test system of the electronic device comprises:
a control unit;
a first relay electrically connected to the control unit and the alternating current power source;
a second relay electrically connected to the control unit;
a power switch electrically connected to the control unit and the device to be tested;
An AC power output end electrically connected to the first relay; and a DC power output end electrically connected to the second relay
The electric machine to be tested is connected to the output end of the alternating current power source or the output end of the direct current power source, and the control unit controls the first relay or the second relay to perform power-off and re-power test of the device to be tested. The control unit controls the power switch to cause the test machine to perform a power on/off test.
如請求項1所述之電子裝置之開關機測試系統,更包含一用以接收該待測機發出的開機完成信號之信號輸入端,該信號輸入端電連接於該控制單元及該待測機。The switch test system of the electronic device of claim 1, further comprising a signal input end for receiving a power-on completion signal sent by the device to be tested, the signal input end being electrically connected to the control unit and the device to be tested . 如請求項2所述之電子裝置之開關機測試系統,更包含一顯示器,電連接於該控制單元。The switch test system of the electronic device of claim 2, further comprising a display electrically connected to the control unit. 如請求項3所述之電子裝置之開關機測試系統,其中該控制單元更包含一計數器,電連接於該信號輸入端。The switch test system of the electronic device of claim 3, wherein the control unit further comprises a counter electrically connected to the signal input end. 如請求項4所述之電子裝置之開關機測試系統,其中該第一繼電器及該第二繼電器分別為有接點之繼電器或無接點之固態繼電器。The switch-on test system of the electronic device of claim 4, wherein the first relay and the second relay are respectively a relay with contacts or a solid state relay without contacts. 如請求項5所述之電子裝置之開關機測試系統,更包含一直流電源輸入端,電連接於該第二繼電器及該待測機電源。The switch test system of the electronic device according to claim 5, further comprising a DC power input end electrically connected to the second relay and the power supply of the test device. 如請求項5所述之電子裝置之開關機測試系統,其中該交流電源輸出端電連接於該待測機電源,該待側機電連接於該待測機電源。The switchgear test system of the electronic device of claim 5, wherein the AC power output is electrically connected to the power of the device to be tested, and the to-be-side is electrically connected to the power source of the device to be tested.
TW102210474U 2013-06-04 2013-06-04 Switching on/off test system for electronic device TWM463843U (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105700985A (en) * 2016-01-15 2016-06-22 合肥联宝信息技术有限公司 Notebook computer loop test tool
TWI675293B (en) * 2018-11-02 2019-10-21 神雲科技股份有限公司 A host boot detection method and its system

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105700985A (en) * 2016-01-15 2016-06-22 合肥联宝信息技术有限公司 Notebook computer loop test tool
CN105700985B (en) * 2016-01-15 2018-12-28 合肥联宝信息技术有限公司 Loop test jig for laptop
TWI675293B (en) * 2018-11-02 2019-10-21 神雲科技股份有限公司 A host boot detection method and its system

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