TWI384196B - An apparatus for detecting the X-axis positioning error and the Y-axis positioning error by applying a single light source in the pick-and-place mechanism - Google Patents

An apparatus for detecting the X-axis positioning error and the Y-axis positioning error by applying a single light source in the pick-and-place mechanism Download PDF

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TWI384196B
TWI384196B TW97130546A TW97130546A TWI384196B TW I384196 B TWI384196 B TW I384196B TW 97130546 A TW97130546 A TW 97130546A TW 97130546 A TW97130546 A TW 97130546A TW I384196 B TWI384196 B TW I384196B
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axis
error
sensor
positioning
pick
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TW201007120A (en
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Univ Nat Formosa
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一種應用單光源於取放機構檢測X軸定位誤差與Y軸定位誤差之裝置Device for detecting X-axis positioning error and Y-axis positioning error by using single light source in pick-and-place mechanism

本發明係關於一種應用單光源於取放機構檢測X軸定位誤差與Y軸定位誤差之裝置,係採用光學非接觸式檢測模式,以達成得到取放機構機構誤差之高精確度的要求為創新技術。The invention relates to a device for detecting an X-axis positioning error and a Y-axis positioning error by using a single light source in a pick-and-place mechanism, and adopting an optical non-contact detection mode to achieve the high precision requirement of obtaining the mechanism error of the pick-and-place mechanism for innovation. technology.

按,一般所使用的晶圓封裝機為例,其精度大約在10μm左右,若要提高取放機構的動作速度或是縮小晶圓尺寸時,取放機構就會產生極大的影響,其可能是取放機構之鋼性不足,若要提高其鋼性卻會造成取放機構太重的可能,而在進行夾(吸)取或放置時的動作也會有精度不準的情形發生,且目前所運用的量測儀器價格昂貴精確度也不太夠。For example, the wafer packaging machine generally used has an accuracy of about 10 μm. If the speed of the pick-and-place mechanism is to be increased or the wafer size is reduced, the pick-and-place mechanism may have a great influence. The steel of the pick-and-place mechanism is insufficient. If the steel is to be improved, the pick-and-place mechanism may be too heavy, and the movement when the clip is taken or placed may be inaccurate. The measuring instruments used are not expensive enough.

此外,若是利用接觸性量測可能會因為取放機構在進行夾(吸)取與放置的動作時,碰觸到物件而產生的反作用力,而使得量測結果不準確。In addition, if the contact measurement is used, the reaction force generated by the pick-and-place mechanism touching the object during the pick-and-place action may cause the measurement result to be inaccurate.

就目前業界普遍是運用高速攝影機來進行量測取放機構之誤差,但此高速攝影機所存在的問題如下:(1)精度不足:當利用高速攝影機在進行量測時,因攝影機是架在機台外部進行拍攝,但當機台在運作時都會產生振動,故攝影機分不清楚是取放機構相對於地面的振動,還是取放機構相對於物件的振動;(2)量測數據少:高速攝影機每秒所能擷取的資料數據太 少,其精確度差;(3)高成本:高速攝影機的價格偏高,價格普遍在一百萬以上;(4)量測訊號不足:高速攝影機所拍攝到的影像是Z軸與Y軸的誤差,而原本的需求是要量測X軸與Y軸的誤差。At present, the industry generally uses high-speed cameras to measure the error of the pick-and-place mechanism. However, the problems of this high-speed camera are as follows: (1) Insufficient accuracy: when using a high-speed camera for measurement, because the camera is on the machine The outside of the station is photographed, but when the machine is in operation, vibration will occur. Therefore, the camera is unclear whether the pick-and-place mechanism vibrates relative to the ground or the vibration of the pick-and-place mechanism relative to the object; (2) less measurement data: high speed The data that the camera can capture every second is too Less, its accuracy is poor; (3) high cost: the price of high-speed cameras is high, the price is generally more than one million; (4) the measurement signal is insufficient: the images captured by the high-speed camera are Z-axis and Y-axis The error, and the original requirement is to measure the error of the X-axis and the Y-axis.

緣此,本案發明人有鑒於上述取放機構機構之技術,仍有無法解決的問題深入探討,乃亟思加以改良創新,並經多年苦心孤詣潛心研究後,終於成功研發完成一種應用單光源於取放機構檢測X軸定位誤差與Y軸定位誤差之裝置,利用感測器與光源來進行的非接觸性量測,就不用擔心會產生反作用力的問題而使的量測結果更為準確。Therefore, in view of the above-mentioned technology of the pick-and-place mechanism, the inventor of the present case has in-depth discussions on the unsolvable problems. It is the improvement and innovation of the thoughts, and after years of painstaking research, he finally succeeded in research and development to complete the application of a single source. The device that detects the X-axis positioning error and the Y-axis positioning error uses the non-contact measurement of the sensor and the light source, so that the measurement result is more accurate without worrying about the reaction force.

本發明之目的即在於提供一種應用單光源於取放機構檢測X軸定位誤差與Y軸定位誤差之裝置,係針對適用晶圓封裝機、機器手臂等夾取機構,可同時量測取放機構或搬運手臂機構其多個自由度的誤差。The object of the present invention is to provide a device for detecting an X-axis positioning error and a Y-axis positioning error by using a single light source in a pick-and-place mechanism, which is suitable for a pick-and-place mechanism such as a wafer packaging machine and a robot arm, and can simultaneously measure the pick-and-place mechanism. Or carry the error of multiple degrees of freedom of the arm mechanism.

本發明之次一目的係在於提供一種低成本、高精確度、體積小、攜帶方便的應用單光源於取放機構檢測X軸定位誤差與Y軸定位誤差之裝置。A second object of the present invention is to provide a device for detecting X-axis positioning error and Y-axis positioning error in a pick-and-place mechanism by using a single light source with low cost, high precision, small size, and convenient carrying.

本發明之另一目的係在於提供一種架設簡易以及檢測迅速的應用單光源於取放機構檢測X軸定位誤差與Y軸定位誤差之裝 置。Another object of the present invention is to provide a simple installation and rapid detection of a single light source for detecting the X-axis positioning error and the Y-axis positioning error in the pick-and-place mechanism. Set.

本發明之又一目的係在於提供一種應用單光源於取放機構檢測X軸定位誤差與Y軸定位誤差之裝置,其具有高頻擷取數據資料的感測器,以有效的改善量測精度不足的問題。Another object of the present invention is to provide a device for detecting an X-axis positioning error and a Y-axis positioning error by using a single light source in a pick-and-place mechanism, which has a sensor for capturing data data at a high frequency to effectively improve measurement accuracy. Insufficient problems.

可達成上述發明目的之一種應用單光源於取放機構檢測X軸定位誤差與Y軸定位誤差之裝置,包括有:一光源,係固定於取放機構的第一軸,用以射出一光束;一準直透鏡,係配置在該光源前且在該光束的光路上,以將該光束修正為平行光,並照射到該第一感測器或該第二感測器;一第一感測器,為四象限感測器係配置在接收該光束的位置上,對該取放機構的第一軸或第二軸進行感測其多軸空間自由度之動作,以產生一感測訊號;一第二感測器,為四象限感測器係配置在接收該光束的位置上,對該取放機構的第二軸或第一軸進行感測其多軸空間自由度之動作,以產生一感測訊號;一訊號處理單元,係與第一感測器或第二感測器耦接,該訊號處理單元接收該感測器之輸出訊號,並進行運算處理,以將其轉換成系統處理訊號。A device for detecting an X-axis positioning error and a Y-axis positioning error by using a single light source in a pick-and-place mechanism, comprising: a light source fixed to a first axis of the pick-and-place mechanism for emitting a light beam; a collimating lens disposed in front of the light source and on the optical path of the light beam to correct the light beam into parallel light and irradiated to the first sensor or the second sensor; a first sensing The fourth quadrant sensor is configured to receive the beam at a position where the beam is received, and sense a multi-axis spatial degree of freedom of the first axis or the second axis of the pick-and-place mechanism to generate a sensing signal; a second sensor configured to receive a position of the four-quadrant sensor at a position at which the beam is received, and to sense a multi-axis spatial degree of freedom of the second axis or the first axis of the pick-and-place mechanism to generate a sensing signal; a signal processing unit coupled to the first sensor or the second sensor, the signal processing unit receiving the output signal of the sensor, and performing arithmetic processing to convert the system into a system Processing the signal.

上述所量測到的處理訊號,使用者能依照需求,再利用快速傅利葉轉換(Fast Fourier Transform,FFT)計算過後,就能得到取放機構之振動頻率。The above-mentioned measured processing signals can be obtained by the user using the Fast Fourier Transform (FFT) calculation according to the requirements, and then the vibration frequency of the pick-and-place mechanism can be obtained.

請參閱圖一至圖三,本發明所提供之一種應用單光源於取放機構檢測X軸定位誤差與Y軸定位誤差之裝置,主要包括有:一光源(2)、一第一感測器(3)以及一第二感測器(4)所構成。Referring to FIG. 1 to FIG. 3 , the present invention provides a device for detecting an X-axis positioning error and a Y-axis positioning error by using a single light source in a pick-and-place mechanism, which mainly includes: a light source (2) and a first sensor ( 3) and a second sensor (4).

該光源(2)係固定於取放機構(1)的第一軸(11),用以射出一光束(21);該第一感測器(3)係配置在取放機構(1)的第一軸(11)其接收該光束(21)的位置上,對該取放機構(1)的第一軸(11)或第二軸(12)進行感測其多軸空間自由度之動作,以產生一感測訊號;該第二感測器(4)係配置在取放機構(1)的第二軸(12)其接收該光束(21)的位置上,對該取放機構(1)的第二軸(12)或第一軸(11)進行感測其多軸空間自由度之動作,以產生一感測訊號。The light source (2) is fixed to the first shaft (11) of the pick-and-place mechanism (1) for emitting a light beam (21); the first sensor (3) is disposed in the pick-and-place mechanism (1) The first axis (11) receives the light beam (21), and senses the multi-axis spatial degree of freedom of the first axis (11) or the second axis (12) of the pick-and-place mechanism (1) To generate a sensing signal; the second sensor (4) is disposed at a position where the second axis (12) of the pick-and-place mechanism (1) receives the light beam (21), and the pick-and-place mechanism ( The second axis (12) or the first axis (11) of 1) performs an action of sensing its multi-axis spatial freedom to generate a sensing signal.

請參閱圖二本發明之一種應用單光源於取放機構檢測X軸定位誤差與Y軸定位誤差之裝置,更包括有:一光源(2)、一準直透鏡(5)、一第一感測器(3)、一第二感測器(4)以及一訊號處理單元(圖中未顯示)所構成;其中該準直透鏡(5)係配置在該光源(2)前且在該光束(21)的光路上,以將該光束(21)修正為平行光,並照射到該第一感測器(3)或該第二感測器(4);而該訊號處理單元係與第一感測器(3)或第二感測器(4)耦接,該訊號處理單元接收該第一感測器(3)或該第二感測器(4)之輸出電流後,並進行運算處理,以將其感測器的輸出電流轉 換成系統處理訊號。Referring to FIG. 2, a device for detecting X-axis positioning error and Y-axis positioning error by using a single light source in a pick-and-place mechanism includes: a light source (2), a collimating lens (5), and a first sense. a detector (3), a second sensor (4) and a signal processing unit (not shown); wherein the collimating lens (5) is disposed in front of the light source (2) and in the light beam (21) on the optical path, the beam (21) is corrected to parallel light, and is irradiated to the first sensor (3) or the second sensor (4); and the signal processing unit is a sensor (3) or a second sensor (4) is coupled, and the signal processing unit receives the output current of the first sensor (3) or the second sensor (4), and performs Operation processing to turn the output current of its sensor Switch to system processing signal.

接續,將說明本發明應用於取放機構(1)時,其取放機構(1)的第一軸(11)(即為物件夾(吸)取端)以及第二軸(12)(即為物件放置端)應用本發明的移動說明,當上述量測原理為取放機構(1)進行夾(吸)取或放置的動作,會因X軸之定位誤差、Y軸之定位誤差影響而產生前、後方向的微小位移,進而帶動光源(2)移動的時候,該光源(2)隨著取放機構(1)進行夾(吸)取或放置而上、下移動時,其中,該第一感測器(3)分別固定於第一軸(11)(即為物件夾(吸)取端),而該第二感測器(4)分別固定於第二軸(12)(即為物件放置端);當該取放機構(1)在進行夾(吸)取或放置時,設置於第一軸(11)位置的第一感測器(3)會接收到光源(2)入射的光束(21),同時由第一感測器(3)檢測到取放機構(1)於第一軸(11)的X軸之定位誤差、Y軸之定位誤差、或X軸之定位誤差與Y軸之定位誤差;若當該取放機構(1)在進行夾(吸)取或放置時,設置於第二軸(12)位置的第二感測器(4)會接收到光源(2)入射的光束(21),同時由第二感測器(4)檢測到取放機構(1)於第二軸(12)的X軸之定位誤差、Y軸之定位誤差、或X軸之定位誤差與Y軸之定位誤差;其後再由訊號處理單元接收該第一感測器(3)或該第二感測器(4)之輸出電流後,並進行運算處理,以將其感測 器的輸出訊號轉換成系統處理訊號,供使用者讀取或判讀。Next, the first shaft (11) of the pick-and-place mechanism (1) (that is, the object clip (suction) take-up end) and the second shaft (12) will be described when the present invention is applied to the pick-and-place mechanism (1) (ie, Applying the movement description of the present invention to the object placement end, when the above-mentioned measurement principle is that the pick-and-place mechanism (1) performs the action of clamping (sucking) or placing, the positioning error of the X-axis and the positioning error of the Y-axis may be affected. When a slight displacement in the front and rear directions is generated, and then the light source (2) is moved, the light source (2) moves up and down as the pick-and-place mechanism (1) is clamped (sucked) or placed, wherein The first sensors (3) are respectively fixed to the first shaft (11) (ie, the object clip (suction) take-up end), and the second sensors (4) are respectively fixed to the second shaft (12) (ie For the object placement end); when the pick-and-place mechanism (1) is being clamped or sucked, the first sensor (3) disposed at the position of the first axis (11) receives the light source (2) The incident light beam (21) is simultaneously detected by the first sensor (3) by the positioning error of the pick-and-place mechanism (1) on the X-axis of the first axis (11), the positioning error of the Y-axis, or the positioning of the X-axis. Error between the error and the Y-axis; if the pick-and-place mechanism (1) is being clamped When (sucking) is taken or placed, the second sensor (4) disposed at the position of the second axis (12) receives the light beam (21) incident by the light source (2) while being controlled by the second sensor (4) Detecting the positioning error of the X-axis of the second axis (12), the positioning error of the Y-axis, or the positioning error of the X-axis and the positioning error of the Y-axis of the pick-and-place mechanism (1); and then receiving the signal by the signal processing unit After the output current of the first sensor (3) or the second sensor (4), and performing arithmetic processing to sense the current The output signal of the device is converted into a system processing signal for the user to read or interpret.

其中,當取放機構(1)進行夾(吸)取或放置時產生X軸之定位誤差,光源(2)入射至感測器所產生的誤差會使光源在感測器的光點會如圖四所示。再者,該取機構進行夾(吸)取或放置時產生Y軸之定位誤差,光源(2)入射至感測器所產生的誤差會使光源在感測器的光點會如圖五所示。Wherein, when the pick-and-place mechanism (1) is clamped (sucked) or placed, the X-axis positioning error is generated, and the error caused by the light source (2) incident on the sensor causes the light source to be at the spot of the sensor. Figure 4 shows. Moreover, the positioning mechanism generates a Y-axis positioning error when the pick-up mechanism is clamped or placed, and the error caused by the light source (2) incident on the sensor causes the light source to be at the light spot of the sensor as shown in FIG. Show.

因此,將訊號處理單元進行運算處理,使用者能依照需求,將其轉換成的處理訊號利用快速傅利葉轉換(Fast Fourier Transform,FFT)計算過後,就能得到取放機構(1)之振動頻率。 如此一來,本發明可有效達成確具有低成本、高精確度、體積小、攜帶方便、架設簡易及檢測迅速等之實質效益。Therefore, the signal processing unit performs arithmetic processing, and the user can convert the processed signal into a Fast Fourier Transform (FFT) according to the demand, and then the vibration frequency of the pick-and-place mechanism (1) can be obtained. In this way, the invention can effectively achieve the substantial benefits such as low cost, high precision, small size, convenient carrying, simple erection and rapid detection.

經由上述,本發明所設計之一種應用單光源於取放機構檢測X軸定位誤差與Y軸定位誤差之裝置,於上列詳細說明係針對一可行實施例為具體之代表,惟該實施例並非用以限制本發明之專利範圍,凡未脫離本發明之技藝精神所為之等效實施或變更,均應包含於本發明所訴求專利之範圍中。Through the above, the device designed to detect the X-axis positioning error and the Y-axis positioning error by using the single light source in the pick-and-place mechanism is specifically represented in the above detailed description, but the embodiment is not The equivalents of the invention are intended to be limited to the scope of the invention.

綜上所述,本發明所設計一種應用單光源於取放機構檢測X軸定位誤差與Y軸定位誤差之裝置,不但在目前工業型態上確屬創新,其整體結構特徵及技術應用為完全創新,未見同類物品,為具創新且具有產業充分利用的價值,實已符合發明專利之要件,爰依法提出申請,懇請 貴局核准本發明專利,讓本 發明得以早日嘉惠廣大之社會大眾。In summary, the present invention provides a device for detecting the X-axis positioning error and the Y-axis positioning error by using a single light source in the pick-and-place mechanism, which is not only innovative in the current industrial type, but also has an overall structural feature and technical application. Innovation, no similar items, value for innovation and full use of the industry, has already met the requirements of the invention patent, 提出 file an application according to law, and ask your office to approve the invention patent, let this The invention was able to benefit the broad masses of the community at an early date.

1‧‧‧取放機構1‧‧‧ pick-and-place mechanism

11‧‧‧第一軸11‧‧‧First axis

12‧‧‧第二軸12‧‧‧second axis

2‧‧‧光源2‧‧‧Light source

21‧‧‧光束21‧‧‧ Beam

3‧‧‧第一感測器3‧‧‧First sensor

4‧‧‧第二感測器4‧‧‧Second sensor

5‧‧‧準直透鏡5‧‧‧ Collimating lens

圖一係本發明之一種應用單光源於取放機構檢測X軸定位誤差與Y軸定位誤差之裝置其量測光路構造圖。1 is a structural diagram of a measuring optical path of a device for detecting an X-axis positioning error and a Y-axis positioning error by a single light source in a pick-and-place mechanism according to the present invention.

圖二係本發明量測光路增加準直透鏡之量測示意圖。FIG. 2 is a schematic diagram showing the measurement of the collimating lens of the measuring optical path of the present invention.

圖三係本發明量測光路前側構造之量測示意圖。Figure 3 is a schematic diagram showing the measurement of the front side structure of the measuring optical path of the present invention.

圖四係本發明感測器其X軸定位誤差之示意圖。Figure 4 is a schematic diagram of the X-axis positioning error of the sensor of the present invention.

圖五係本發明感測器其Y軸之定位誤之示意圖。Figure 5 is a schematic diagram of the positioning error of the Y-axis of the sensor of the present invention.

1‧‧‧取放機構1‧‧‧ pick-and-place mechanism

11‧‧‧第一軸11‧‧‧First axis

12‧‧‧第二軸12‧‧‧second axis

2‧‧‧光源2‧‧‧Light source

21‧‧‧光束21‧‧‧ Beam

3‧‧‧第一感測器3‧‧‧First sensor

4‧‧‧第二感測器4‧‧‧Second sensor

Claims (5)

一種應用單光源於取放機構檢測X軸定位誤差與Y軸定位誤差之裝置,包括:一光源,係固定於取放機構的第一軸,用以射出一光束;一準直透鏡,係配置在該光源前且在該光束的光路上,以將該光束修正為平行光,並照射到該第一感測器或該第二感測器;一第一感測器,為四象限感測器係配置在接收該光束的位置上,對該取放機構的第一軸或第二軸進行感測其多軸空間自由度之動作,以產生一感測訊號;一第二感測器,為四象限感測器係配置在接收該光束的位置上,對該取放機構的第二軸或第一軸進行感測其多軸空間自由度之動作,以產生一感測訊號;一訊號處理單元,該訊號處理單元係與第一感測器或第二感測器耦接,該訊號處理單元接收該感測器之輸出訊號,並進行運算處理,以將其轉換成系統處理訊號。 A device for detecting an X-axis positioning error and a Y-axis positioning error by using a single light source in a pick-and-place mechanism, comprising: a light source fixed to a first axis of the pick-and-place mechanism for emitting a light beam; a collimating lens configured Before the light source and on the optical path of the light beam, correcting the light beam into parallel light and illuminating the first sensor or the second sensor; a first sensor for four-quadrant sensing The device is configured to receive the multi-axis spatial degree of freedom of the first axis or the second axis of the pick-and-place mechanism to generate a sensing signal; a second sensor, Configuring a four-quadrant sensor system to receive a position of the light beam, and sensing a multi-axis spatial degree of freedom of the second axis or the first axis of the pick-and-place mechanism to generate a sensing signal; The processing unit is coupled to the first sensor or the second sensor. The signal processing unit receives the output signal of the sensor and performs an arithmetic process to convert the signal into a system processing signal. 如申請專利範圍第1 項所述之一種應用單光源於取放機構檢測X軸定位誤差與Y軸定位誤差之裝置,其中該第一感測器係可感測第一軸之X軸之定位誤差與Y軸之定位誤差。An item of the first patent application on a single light source to take an X-axis positioning means for positioning the detection error of the Y axis error and the discharge mechanism, wherein the first sensor system can sense the positioning of the X-axis of the first shaft Error and positioning error of the Y-axis. 如申請專利範圍第1 項所述之一種應用單光源於取放機構檢測X軸定位誤差與Y軸定位誤差之裝置,其中該第一感測器係可感測第二軸之X軸之定位誤差與Y軸之定位誤差。An item of the first patent application a single light source to take an X-axis positioning means for positioning the detection error of the Y axis error and the discharge mechanism, wherein the first sensor system can sense the positioning of the X-axis of the second shaft Error and positioning error of the Y-axis. 如申請專利範圍第1 項所述之一種應用單光源於取放機構 檢測X軸定位誤差與Y軸定位誤差之裝置,其中該第二感測器係可感測第二軸之X軸之定位誤差與Y軸之定位誤差。An item of the first patent application a single light source to take an X-axis positioning means for positioning the detection error of the Y axis error and the discharge mechanism, wherein the second sensor system can sense the positioning of the X-axis of the second shaft Error and positioning error of the Y-axis. 如申請專利範圍第1 項所述之一種應用單光源於取放機構檢測X軸定位誤差與Y軸定位誤差之裝置,其中該第二感測器係可感測第一軸之X軸之定位誤差與Y軸之定位誤差。An item of the first patent application a single light source to take an X-axis positioning means for positioning the detection error of the Y axis error and the discharge mechanism, wherein the second sensor system can sense the positioning of the X-axis of the first shaft Error and positioning error of the Y-axis.
TW97130546A 2008-08-11 2008-08-11 An apparatus for detecting the X-axis positioning error and the Y-axis positioning error by applying a single light source in the pick-and-place mechanism TWI384196B (en)

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TWI274139B (en) * 2006-03-14 2007-02-21 Univ Nat Formosa Optical measurement unit for real-time measuring angular error of platform and the method thereof
TWI283736B (en) * 2006-06-26 2007-07-11 Univ Nat Formosa Device for measuring rotation axis error using cat's-eye reflector
TWI287616B (en) * 2006-07-14 2007-10-01 Univ Nat Formosa Measuring error method for high precision and nano-scale rotation axis and the apparatus thereof

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4792228A (en) * 1987-08-20 1988-12-20 Cincinnati Milacron Inc. Position error sensing and feedback apparatus and method
TWI270663B (en) * 2005-12-30 2007-01-11 Ind Tech Res Inst Displacement measurement system of quasi common path heterodyne interferometry
TWI274139B (en) * 2006-03-14 2007-02-21 Univ Nat Formosa Optical measurement unit for real-time measuring angular error of platform and the method thereof
TWI283736B (en) * 2006-06-26 2007-07-11 Univ Nat Formosa Device for measuring rotation axis error using cat's-eye reflector
TWI287616B (en) * 2006-07-14 2007-10-01 Univ Nat Formosa Measuring error method for high precision and nano-scale rotation axis and the apparatus thereof

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