TWI376174B - - Google Patents

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Publication number
TWI376174B
TWI376174B TW097134379A TW97134379A TWI376174B TW I376174 B TWI376174 B TW I376174B TW 097134379 A TW097134379 A TW 097134379A TW 97134379 A TW97134379 A TW 97134379A TW I376174 B TWI376174 B TW I376174B
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Taiwan
Prior art keywords
copper
surface treatment
copper foil
peel strength
treated
Prior art date
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TW097134379A
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Chinese (zh)
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TW200934330A (en
Inventor
Fujisawa Satoshi
Suzuki Yuuji
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Furukawa Electric Co Ltd
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Publication of TW200934330A publication Critical patent/TW200934330A/en
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Publication of TWI376174B publication Critical patent/TWI376174B/zh

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Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/20Layered products comprising a layer of metal comprising aluminium or copper
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/01Layered products comprising a layer of metal all layers being exclusively metallic
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/04Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
    • B32B15/08Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2311/00Metals, their alloys or their compounds
    • B32B2311/12Copper
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2311/00Metals, their alloys or their compounds
    • B32B2311/20Zinc
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2311/00Metals, their alloys or their compounds
    • B32B2311/22Nickel or cobalt
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2457/00Electrical equipment
    • B32B2457/08PCBs, i.e. printed circuit boards
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B37/00Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding
    • B32B37/06Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding characterised by the heating method

Description

丄:WOi /4 九、發明說明: 【發明所屬之技術領域】 本發明是有關於一種表面處理銅箔,特別是有關於一 種與聚醯亞胺向溫接著使用以作為層積電路基板而能夠形 成正確電路的表面處理銅箔、其表面處理方法,並且使用 該銅落的層積電路基板。 【先前技術】 3 T刷電路板用銅箱是將該銅落與樹脂基板接合,但必 項提昇〃接著強度,並滿足印刷電路板所需要的電特性、 •钱福11、耐熱性、耐藥品性。因此,製羯後的銅羯(以後 有時亦稱為未處理㈣)的與樹脂基板的接合表面 ’摊化▲理,進一步於經粗糙化處理的表面上施行咚銲⑽ 減是料(Ni)等,而且更於該已施行鑛Zn或锻νΓ的表面 上施行鉻酸處,等一,而施行有種種的處理方法。 φ 隨著近年來用來驅動作為個人電腦、行動電話或pda 的顯示部的液晶顯示器的IC封裝基板的高密度化,於其製 ia過%中要求於尚温處理而構成正確的電路。 於印刷電路板所製造的層積電路板中,對於在高温正 確的處理而構成電路的要求’形成導電銅落的電解銅绪與 7為可於高溫使用的樹脂基板的聚醯亞胺此兩者的接著, _數百度的问狐進行熱接著。例如是如圖^的具體例所 不,於33(TC、12 MP進行熱接著處理。 於此兩溫的接著處採φ ;栏^曰 慝理中 梃幵銅诒於高溫與聚醯亞胺丄: WOi /4 IX. Description of the Invention: [Technical Field of the Invention] The present invention relates to a surface-treated copper foil, and more particularly to a substrate which can be used as a laminated circuit substrate with a polyimine. A surface-treated copper foil forming a correct circuit, a surface treatment method thereof, and a laminated circuit substrate using the copper drop. [Prior Art] 3 The copper box for the T-brush circuit board is to bond the copper drop to the resin substrate, but it must increase the strength of the squeezing and meet the electrical characteristics required for the printed circuit board. • Qianfu 11, heat resistance, and drug resistance Sex. Therefore, the joint surface of the copper ruthenium (hereinafter sometimes referred to as untreated (four)) and the resin substrate is mixed, and the surface of the roughened surface is further subjected to soldering (10). And the like, and the chromic acid is applied to the surface on which the Zn or wrought iron has been applied, and the like, and various treatment methods are performed. φ In recent years, the density of IC package substrates used to drive liquid crystal displays, which are display units for personal computers, mobile phones, or pdas, has been required to be processed at a temperature to form a correct circuit. In the laminated circuit board manufactured by the printed circuit board, the requirements for constructing the circuit for the correct processing at a high temperature 'the electrolytic copper forming the conductive copper drop and the polyimine which is the resin substrate which can be used at a high temperature are both Then, _ hundreds of degrees of foxes go hot. For example, as shown in the specific example of Fig. 2, heat treatment is carried out at 33 (TC, 12 MP. The φ of the two temperatures is followed by φ; column 曰 慝 慝 梃幵 诒 诒 诒 诒 诒 诒 诒 诒 诒 诒 诒 诒

2197-9984-PF 5 1376174 的接著強度成為課題 專利文獻1所揭示的 術0 ,做為解決此課題的手段,例如是如 以含Zn合金粗糙化處理銅箔表面的技 而且’作為鋼落與聚酿亞脸古 …皿接者而使用的層積電 路基板,&出了-種表面處理銅荡,對未處理銅箱的盘聚 醯亞胺基板的接著表面,以含有钥、鐵、钻、錄、鶴;的 .·至少一種的電解液進行表面處理,更於此鑛層上設置Μη 鲁層或鍍Nl層亦或是鑛Zn層+鍍Νι層(請參照專利文獻2)。 【專利文獻1】特開2〇〇〇-269637號公報 【專利文獻2】特開平U—256389號公報 【發明内容】 [發明所要解決的課題] 别述專利文獻所記載的含Zn層的粗糖化處理層,於高 溫具有提昇銅箔與樹脂基板間的接著強度的效果。但是, 在銅箔與樹脂基板接著後以酸溶液進行蝕刻處理以形成電 路,此時由於辞容易溶於酸而使得由接著在銅箔與樹脂基 板間的Zn層溶出,使得電路形成後的銅箔與樹脂基板的接 著強度極端的降低’具有在電路基板使用中發生銅箔由樹 脂基板剝落的事故的疑慮。為了防止此事故,必須縮短餘 刻時間以將Zn層的溶解流出限制在最小限度,此使得蝕刻 處理必須要高度的技術與管理體制’從而使得層積電路基 板的生產性降低,並產生成本提高所導致的沒有利益。 依此’前述專利文獻所揭示的粗糖化處理,如同前述 2197-9984-PF 6 1376174 的無法全部滿足與聚酿亞胺的接著強度、耐酸性、姓刻性 而無法提供滿足此些特性的表面處理銅箔。 本發月的目的在提供—種能夠全部滿足與聚酿亞胺的 接著強度、耐酸性,性的表面處理鋼荡、該表面處理 銅落的處理方法以及使用該表面處理的鋼落層積電路板。 [用以解決課題的手段] .. 纟發明的表面處理銅荡’在未處理鋼落的至少一側的 _面上施加有由Ni_p_Zn合金所構成的表面處理層。 本發明的銅0的表面處理方法,S未處理銅箔的至少 -側的面上,以含有 Ni: g/L、p: 〇 〇i〜5〇 g/L、The bonding strength of 2197-9984-PF 5 1376174 is the technique disclosed in Patent Document 1, and is a means for solving the problem, for example, a technique of roughening a copper foil surface with a Zn-containing alloy and 'as a steel drop and The laminated circuit substrate used by the squash, the surface of the slab, and the surface of the untreated copper box, which contains the key, the iron, Drilling, recording, and crane; at least one type of electrolyte is subjected to surface treatment, and a layer of Μn or a layer of N1 or a layer of Zn or ruthenium is provided on the layer (refer to Patent Document 2). [Patent Document 1] Japanese Laid-Open Patent Publication No. H-256389 (Patent Document 2) [Problems to be Solved by the Invention] The Zn-containing layer-containing raw sugar described in the patent document The treatment layer has an effect of improving the adhesion strength between the copper foil and the resin substrate at a high temperature. However, after the copper foil and the resin substrate are followed by etching treatment with an acid solution to form a circuit, at this time, since the acid is easily dissolved in the acid, the Zn layer which is next between the copper foil and the resin substrate is eluted, so that the copper after the circuit formation is formed. The extreme decrease in the bonding strength between the foil and the resin substrate has a fear that the copper foil is peeled off from the resin substrate during use of the circuit board. In order to prevent this accident, it is necessary to shorten the time required to minimize the dissolution and discharge of the Zn layer, which makes the etching process require a high degree of technology and management system, thereby reducing the productivity of the laminated circuit substrate and increasing the cost. There is no benefit caused. According to the above-mentioned patent document, the crude saccharification treatment, like the above-mentioned 2197-9984-PF 6 1376174, cannot fully satisfy the adhesion strength, acid resistance, and surname of the styrene, and cannot provide a surface satisfying such characteristics. Handle copper foil. The purpose of this month is to provide a surface treatment steel which can satisfy all of the adhesive strength and acid resistance of the brewed imine, a treatment method for the surface treatment of copper falling, and a steel lamination circuit using the surface treatment. board. [Means for Solving the Problem] The surface treatment of the invention is performed by applying a surface treatment layer composed of a Ni_p_Zn alloy on at least one side of the untreated steel. In the surface treatment method of copper 0 of the present invention, at least the side surface of the S untreated copper foil contains Ni:g/L, p: 〇 〇i~5〇 g/L,

Zn: 0.01〜1。〇 g/L的電解浴,形成由Ni_p_zn合金所構 成的表面處理層。 本發明的層積電路基板,是將表面處理銅羯的表面處 f層的面與樹脂基板接著而形成,其中前述表面處理銅荡 是在未處理銅箔的至少一側的面上設置有由合金 I 所構成的表面處理層而構成。 依照本發明的泰^,能夠提供一種滿足與聚 醯亞胺的接著強度、耐酸性、蝕刻性的表面處理銅箔。 而且’依照本發明的銅箔的表面處理方法,提供—種 滿足與聚醯亞胺的接著強度、耐酸性、蝕刻性的銅落的表 面處理方法。 而且,依照本發明的層積電路基板,能夠提供其樹脂 基板特別是聚醯亞胺與銅箔的接著強度強、具有形成電路 時的耐酸性,且滿足蝕刻性的層積電路基板。 . 2197-9984-PF 7 1376174 【實施方式】 本發明的施行表面處理的銅箔(未處理銅箔)可以是電 解銅笛或壓延銅箱的其中之…而且,在沒有必要特別區 分,,有時亦單純表示為銅羯或未處理㈣。未處理銅; 的厚度較佳為5 //πϋ ”。銅箔的厚度比5㈣薄的 話在製造時例如是會產生敵摺,而且薄銅箱的 耗費 成本而在現實上不存在。 粍費 而且’在銅箔的箔厚比12 "m厚的情況下,由於超出 了用於驅動個人電腦、行動電話或m的表示部的 :器的K:封裝基板等薄型、小型化的規格而較為不佳,: 疋在具有此些用途以外的恶炎66每· + 度無關的厚銅落。 、…亦可以採用與上述厚 發明中’施行在銅羯的表面設置錄⑻)-磷(P)-辛(Zn)的二元合金層的表面處理。 作為汉置於銅箔表面的表面處理層,由 夠防止銅由銅落向表面處理層 、3 1能 9。…佳為6〇·75·含量;;為/“t%〜 酸性差,…上則㈣性差。里為5〇㈣以下則耐 在設置於銅箱表面的表面處理層中,由於含有 夠均勻化Ni-Zii合金層以及抑 ㈣以下則沒有添加p的效果,l5wt%以 的含里為〇·! 在設置於鋼表面的表面處理層 ^強度降低。 提昇對樹脂基板(特別是聚酿亞胺)的接著二有Zn,能夠 / π接者強度,並防止接Zn: 0.01 to 1. An electrolytic bath of 〇 g/L forms a surface treatment layer composed of a Ni_p_zn alloy. The laminated circuit board of the present invention is formed by laminating a surface of the f layer on the surface of the surface-treated copper crucible with a resin substrate, wherein the surface treatment copper is provided on at least one side of the untreated copper foil. It is composed of a surface treatment layer composed of Alloy I. According to the present invention, it is possible to provide a surface-treated copper foil which satisfies the adhesion strength, acid resistance and etching property with polyimine. Further, the surface treatment method of the copper foil according to the present invention provides a surface treatment method which satisfies the copper drop of the adhesion strength, acid resistance and etching property of the polyimide. Further, according to the laminated circuit board of the present invention, it is possible to provide a laminated circuit board in which the resin substrate, particularly the polyimide and the copper foil, has high adhesion strength, has acid resistance when forming a circuit, and satisfies etching properties. 2197-9984-PF 7 1376174 [Embodiment] The surface-treated copper foil (untreated copper foil) of the present invention may be one of an electrolytic copper flute or a rolled copper box... and, without special distinction, there is It is also simply expressed as copper matte or untreated (four). The thickness of the untreated copper is preferably 5 // π ϋ ”. If the thickness of the copper foil is thinner than 5 (four), for example, an enemy fold is generated at the time of manufacture, and the cost of the thin copper box does not exist in reality. When the foil thickness of the copper foil is thicker than 12 "m, it is thinner and smaller than the K: package substrate for driving the display unit of a personal computer, a mobile phone, or m. Poor,: 厚 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有 具有) - Surface treatment of bis (Zn) binary alloy layer. As a surface treatment layer placed on the surface of copper foil, it is enough to prevent copper from falling from copper to surface treatment layer, 3 1 energy 9 .... 75·content;; is / "t% ~ acidity is poor, ... is (4) poor. In the case of 5 〇 (4) or less, it is resistant to the surface treatment layer provided on the surface of the copper box, and since it contains the effect of homogenizing the Ni-Zii alloy layer and suppressing (4) or less, the effect of adding p is not included, and the content of 5% by weight is 〇· ! The surface treatment layer set on the steel surface has a reduced strength. Improve the adhesion of the resin substrate (especially the poly-imine) to Zn, capable of / π bond strength, and prevent the connection

2197-9984-PF 8 1376174 著時因熱而使接著強度劣化,其含量為5 wt%〜60 wt%, 較佳為1 0 wt%〜35 wt%。含量為5 wt%以下則沒有添加Zn 的效果’ 60 wt%以上則耐酸性差。圖2所示為Ni-P-Zn合 金層中的Zn含量與剝離強度(kN/m)的關係圖,圖2(1)所 不為在聚醯亞胺貼附表面處理銅箔之後的初期剝離強度與 Zn含量的關係的測定結果,圖2(丨丨)所示為在聚醢亞胺貼 - 附表面處理銅箔後並經由熱處理後的剝離強度與Zn含量 的關係的測定結果’圖2 ( Π I )所示為在聚醯亞胺貼附表面 籲處理銅箔後,並經由酸處理蝕刻以構成電路後的剝離強度 與Zn含量的關係的測定結果。由於銅箔與聚醯亞胺的層積 板的初期剝離強度、酸處理後的剝離強度為〇. 6 kN/m以上 的話在工業上能實用化,且熱處理後的剥離強度為熱處理 前(初期)的剝離強度的80%以上、最低亦為〇.5 kN/m以上 的話在工業上能實用化,因此判斷基準為0. 6 kN/m以上或 疋初期剝離強度的8〇%以上的話,初期剝離強度由圖2(工) φ來看以含量不會影響剝離強度,熱處理後的剝離強度由圖 來看Zn含量減少的話則剝離強度降低,但是含量在 50/〇以上的話則不影響其實用性,酸處理後的剝離強度由圖 2(ΠΙ)來看以含量超過6〇%以上的話則剥離強度極端的降 低、-申此結果來看Ζη的含量較佳為5 wt%〜60 wt%。 於本發明中’表面處理側的銅箔的表面粗糙度,較佳 依川規定匕為〇.2㈣〜U n .子鋼V自表面的Nl_卜Zn合金層的形成是藉由電解處理2197-9984-PF 8 1376174 The strength of the bond is deteriorated by heat, and the content thereof is from 5 wt% to 60 wt%, preferably from 10 wt% to 35 wt%. When the content is 5 wt% or less, there is no effect of adding Zn. When the content is 60 wt% or more, the acid resistance is poor. Fig. 2 is a graph showing the relationship between the Zn content and the peel strength (kN/m) in the Ni-P-Zn alloy layer, and Fig. 2 (1) is not the initial stage after the surface treatment of the copper foil with the polyimide. The measurement result of the relationship between the peeling strength and the Zn content, FIG. 2 (丨丨) shows the measurement result of the relationship between the peel strength and the Zn content after heat treatment after the polyimide-attached surface-treated copper foil. 2 ( Π I ) shows the measurement result of the relationship between the peeling strength and the Zn content after the copper foil was applied to the surface of the polyimide. The initial peel strength of the laminated plate of the copper foil and the polyimide and the peeling strength after the acid treatment is 〇 6 kN/m or more, and it is industrially practical, and the peeling strength after the heat treatment is before the heat treatment (initial When the peeling strength is 80% or more and the minimum is 〇5 kN/m or more, it can be put into practical use in the industry. Therefore, if the criterion is 0. 6 kN/m or more, or 8〇% or more of the initial peel strength, The initial peel strength is not affected by the peeling strength as shown in Fig. 2 (work) φ. If the peel strength after heat treatment is reduced as shown in the figure, the peel strength is lowered. However, if the content is 50/〇 or more, the peel strength is not affected. Practicality, the peeling strength after the acid treatment is as shown in Fig. 2 (ΠΙ). When the content exceeds 6% by weight, the peel strength is extremely lowered, and the Ζη content is preferably 5 wt% to 60 wt. %. In the present invention, the surface roughness of the surface-treated copper foil is preferably 依.2(4)~U n . The formation of the Nl_b Zn alloy layer from the surface of the sub-steel V is by electrolytic treatment.

2197-9984-pF 9 1376174 電解處理浴的Ni、p、Zn的組成如同下述。2197-9984-pF 9 1376174 The composition of Ni, p, and Zn in the electrolytic treatment bath is as follows.

Ni成分.做為Ni金屬含有〇i g/L〜200 g/L,較佳 為含有25 g/L〜55 g/L。 P成分.做為P金屬含有001 g/L〜5〇 g/L,較佳為 含有 〇. 2 g/L〜1. 〇 g/L。Ni composition. As the Ni metal, 〇i g/L 〜 200 g/L is contained, preferably 25 g/L to 55 g/L. P component. As P metal, it contains 001 g/L~5〇 g/L, preferably contains 〇. 2 g/L~1. 〇 g/L.

Zn成分:做為Zn金屬含有〇 〇1 g/L〜1〇〇 g/L,較佳 為含有 0. 5 g/L〜1. 〇 g/L。Zn component: as Zn metal containing 〇 g 1 g / L ~ 1 〇〇 g / L, preferably containing 0. 5 g / L ~ 1. 〇 g / L.

電解浴的溫度為3(TC〜7(rc,較佳為4〇&lt;t〜6〇它。 尚且’在對銅箔表面形成Ni-p—Zn合金層後,較佳是 在該合金層表面設置鉻酸處理層、耦合處理層。 本發明以實施例進行更具體的說明。 〈實施例1、2〉 銅泊(未處理鋼箔):古河Circuit F〇u(股)的耽鋼 箔、Rz : 1_ 〇 作為Νι金屬成分添加使成為4〇 g/L的. 6H2〇 作為P金屬成分添加使成為〇 6 g/L的NaH㈣「 作為Zn金屬成分添加使成為〇 5 §几的zns⑴· 做為其他成分添加I 〇 g/L的H3B〇3 45〇C 3. 5 0.5 A/dm2 10秒 浴溫度The temperature of the electrolytic bath is 3 (TC~7 (rc, preferably 4 〇&lt;t~6〇. It is still after the formation of the Ni-p-Zn alloy layer on the surface of the copper foil, preferably in the alloy layer The surface is provided with a chromic acid treatment layer and a coupling treatment layer. The present invention will be more specifically described by way of examples. <Examples 1 and 2> Copper poise (untreated steel foil): Furukawa foil of Furukawa Circuit F〇u (stock) Rz: 1_ 〇 is added as a Νι metal component to 4 〇g/L. 6H2 添加 is added as a P metal component to be NaH (4) of 〇6 g/L. "As a Zn metal component, zns(1) is added as 〇5 § Add H 〇g/L to other ingredients as H3B〇3 45〇C 3. 5 0.5 A/dm2 10 second bath temperature

pH 電流密度 處理時間 於上述未處理銅综Π μ、+. 、、 W ▲成的電解浴與條件實施Z 久表面處理。以第1次兔音始办丨, 人為貫.施例1、第2次為實施例2,對pH current density treatment time Z-long surface treatment was carried out on the above-mentioned untreated copper helium Π μ, +., W ▲ electrolytic bath and conditions. Start with the first rabbit sound, human beings. Example 1, second time is Example 2, right

2197-9984-PF 10 r4 經表面處理的銅箔進行下述測定,測定結果作為實施例丄、 2而表示於表1。 (1)銅箔的表面析出的表面處理層的合金組成:以螢光 X線進行分析。 ^ (2)初期剝離強度:將實施例1、2的經表面處理的銅 箔與聚醯亞胺(宇部製25VT)接著。接著條件如圖ι所示。 測疋接著後剝離強度。由於初期剝離強度要求〇 6 以 上,因此0.6 kN/m以上為合格,其判定基準如表i所示。 (3 )熱處理後剝離強度:與聚醯亞胺接著後,測定以 C 168小時加熱處理後的剝離強度。熱處理後的剝離 強度的判定基準為初期剝離強度的8〇%以上者為合格。而 且,判定基準(計算方法)如表1所示。 (4) 酸處理後剝離強度:表面處理銅箔與聚醯亞胺接著 後於ffr恤於稀鹽酸溶液浸泡1小時,其後測定剝離強度。 (5) 蝕刻性:表面處理銅箔與聚醯亞胺接著後,以氣化 銅/合液切割出寬度i職的電路以SEM測定底部寬度與頂 部寬度,求其差值。判定基準如表i所示。 〈實施例3、4 &gt; 鋼治古河Clrcuit Foil (股)的WZ銅箔、Rz : 1· 0 作為Nl金屬成分添加使成為40 g/L的NiS〇4 · H2〇 作為P金屬成分添加使成為〇·6 g/L的㈣孤· 6H2〇 作為Zn成分添加1. 〇 g/L的ZnSCh . 7H2〇 做為其他成分添加1.0 g/L的議32197-9984-PF 10 r4 The surface-treated copper foil was subjected to the following measurement, and the measurement results are shown in Table 1 as Examples 2 and 2. (1) Alloy composition of the surface treated layer deposited on the surface of the copper foil: analysis by fluorescent X-ray. (2) Initial peel strength: The surface-treated copper foils of Examples 1 and 2 were then laminated with polyimine (25 VT manufactured by Ube). Then the condition is as shown in Figure ι. The peel strength after the measurement was measured. Since the initial peel strength is required to be 〇 6 or more, 0.6 kN/m or more is acceptable, and the judgment criteria are as shown in Table i. (3) Peel strength after heat treatment: After the polyimine, the peel strength after heat treatment at 168 hours was measured. The criterion for determining the peel strength after the heat treatment was 8 % or more of the initial peel strength. Moreover, the criterion (calculation method) is shown in Table 1. (4) Peel strength after acid treatment: Surface-treated copper foil and polyimide were then immersed in a dilute hydrochloric acid solution for 1 hour in a ffr-shirt, and then the peel strength was measured. (5) Etchability: After the surface-treated copper foil and the polyimide were bonded, the circuit of the width i was cut with vaporized copper/liquid to measure the bottom width and the top width by SEM, and the difference was obtained. The judgment criteria are shown in Table i. <Examples 3 and 4> WZ copper foil and Rz: 1·0, which are added as N1 metal components, and added as 40 mass/L of NiS〇4·H2〇 as P metal component 〇·6 g/L (4) 孤·6H2〇 is added as Zn component 1. 〇g/L ZnSCh. 7H2 〇 is added as 1.0 g/L for other components.

. : 45»C 2197-9984-pp PH : 3.5 電流密度 :(K 5 A/dm2 處理時間 :15秒 於上述未處理銅箱以上述組成的電解浴與條件實施2 人表面處理。對經表面處理的銅箔進行與實施例丨相同的 剛疋,以第1次為實施例3、第2次為實施例4,其結果作 為貫施例3、4而表示於表1。: 45»C 2197-9984-pp PH : 3.5 Current density: (K 5 A/dm2 treatment time: 15 seconds in the above untreated copper box with the above-mentioned electrolytic bath and conditions for 2 person surface treatment. The treated copper foil was the same as that of Example 疋, and the first time was Example 3 and the second time was Example 4, and the results are shown in Table 1 as Examples 3 and 4.

〈實施例5、6〉 銅箔:古河Circuit Foil (股)的wz銅箔、Rz : 1〇 作為Ni金屬成分添加使成為4〇 g/L的NiS〇4 . 6Ih〇 作為p金屬成分添加使成為〇. 6 g/L的NaH2p〇2. h2〇 作為Zn金屬成分添加使成為〇.丨g/L的ZnS〇4 . 7H2〇 做為其他成分添加1. 〇 g/L的h3B〇3 浴溫度<Examples 5 and 6> Copper foil: wz copper foil of Furukawa Circuit Foil (R): Rz: 1〇 NiSi〇4 which is added as a Ni metal component to be 4〇g/L. 6Ih〇 is added as a p metal component. 6 g/L of NaH2p〇2. h2〇 is added as a Zn metal component to become 〇.丨g/L of ZnS〇4. 7H2〇 is added as other ingredients 1. 〇g/L of h3B〇3 bath temperature

pHpH

45它 3. 5 0.5 A/dm2 ά *1' 度 間 電流密 處理時 於上选未處理銅4以上述組成的電解浴與條件實施2 次表面處理。對經表面處理的銅箔進行與實施例丨相同的 測定,以第1次為實施例5、第2次為實施例6,其結果作 為實施例5、6而表示於表1。 〈實施例7、8〉45 It 3. 5 0.5 A/dm2 ά *1' Interval Current-tight treatment The surface treatment was carried out twice with the untreated copper 4 and the above-mentioned electrolytic bath and conditions. The surface-treated copper foil was subjected to the same measurement as in Example ,, and the first time was Example 5 and the second time was Example 6, and the results are shown in Table 1 as Examples 5 and 6. <Examples 7, 8>

銅箔:古河Circuit Foil (股)的wz銅箔、Rz : L 〇 作為Ni金屬成分添加使成為4〇 .g/L的NiS〇4 . 6H2O 2197-9984-PF 12 g/L 的 NaH2P〇2 H2〇 7H2〇 作為P金屬成分添加使成為 作為Ζπ金屬成分添加使成失9 η τCopper foil: wz copper foil of Rukoi Circuit Foil (R): Rz: L 〇 is added as Ni metal component to make Ni〇4. 4H2O 2197-9984-PF 12 g/L of NaH2P〇2 H2〇7H2〇 is added as a P metal component so that it is added as a Ζπ metal component to lose 9 η τ

尺成為2. 0 g/L的ZnSO 做為其他成分添加1.0 g/L的H3B〇3 浴溫度 pH 電流密度 處理時間 :45〇C :3. 5 :0. 5 A/dffi2 :20秒 ^於上述未處理銅羯以上述組成的電解浴與條件實施2 人=面處理。對經表面處理的銅箔進行與實施合&quot;相同的 測疋,以第1次為實施例7、第2次為實施例8,其結果作 為實施例7、8而表示於表1。 〈比較例1、2 &gt; 銅箔:古河Circuit Foil (股)的銅箔、Εζ : ι 〇 作為Ni金屬成分添加使成為4〇 g/L的Nis〇4 . 6H2〇 作為P金屬成分添加使成為〇. 6 g/L的NaH2p〇2 · h2〇 作為Zn金屬成分添加使成為5 g/L的zns〇4 · 7Hz〇 做為其他成分添加1 〇 g/L的h3B〇3 浴溫度 pH 電流密度 處理時間 45〇C 3. 5 0.5 A/dm2 16秒 於上述未處理銅箔以上述組成的電解浴與條件實施2 次表面處理。以第1次為比較例1、第2次為比較例2 ’對 經表面處理的銅箔進行與實施例1相同的測定,.其結果作 2197-9984-PF 13 丄碼174 為比較例1、2而一併表示於表lc 〈比較例3、4〉 45〇C 3. 5The ruler becomes 2.0 g/L of ZnSO as the other component to add 1.0 g/L of H3B〇3 bath temperature pH current density processing time: 45 〇C: 3. 5:0. 5 A/dffi2: 20 seconds ^ The above untreated copper crucible was subjected to a two-person surface treatment under the above-described electrolytic bath and conditions. The surface-treated copper foil was subjected to the same measurement as in the case of the first embodiment, and the first time was the seventh embodiment and the second time was the eighth embodiment. The results are shown in Table 1 as Examples 7 and 8. <Comparative Example 1, 2 &gt; Copper foil: Furukawa Circuit Foil (copper) copper foil, Εζ: ι 〇 is added as Ni metal component to be 4 〇g / L of Nis 〇 4 . 6H2 〇 is added as a P metal component 6 g/L of NaH2p〇2 · h2〇 is added as a Zn metal component to become 5 g/L of zns〇4 · 7 Hz 〇 as other components, adding 1 〇g/L of h3B 〇 3 bath temperature pH current Density treatment time 45 〇 C 3. 5 0.5 A/dm 2 16 seconds The surface treatment was carried out twice on the above untreated copper foil in an electrolytic bath having the above composition and conditions. The surface-treated copper foil was subjected to the same measurement as in Example 1 with the first comparative example and the second comparative example 2'. The result was 2197-9984-PF 13 weight 174 was Comparative Example 1. 2, together with the table lc <Comparative Example 3, 4> 45〇C 3. 5

銅 '冶:古河Circuit Foil (股)的WZ銅箔、Rz : 1. 0 作為Ni金屬成分添加使成為4〇 g/L的NiS〇4 . 6H2〇 作為p金屬成分添加使成為〇. 6 g/L的NaH2P〇2 . HzO 作為Zn金屬成分添加使成為i〇 g/L的zns〇4 · 7H2〇 做為其他成分添加1.0 g/L的H3B〇3 浴溫度Copper 'metallurgy: WZ copper foil of Fukui Foil (share), Rz: 1. 0 NiSi〇4 which is added as a Ni metal component to be 4〇g/L. 6H2〇 is added as a p metal component to become 〇. 6 g /L of NaH2P〇2 . HzO is added as a Zn metal component to make i〇g/L zns〇4 · 7H2〇 as other components to add 1.0 g/L of H3B〇3 bath temperature

pH 0. 5 A/dm2 15秒 電流密度 處理時間 於上述未處理鋼箔以上述組成的電解浴與條件實施2 次表面處理。以第1次為比較例3、第2次為比較例4,對 經表面處理的銅箔進行與實施例1相同的測定,其結果作 為比較例3、4而一併表示於表1。 〈比較例5、6〉 銅箔:古河Circuit Foil (股)的WZ銅箔、Rz : 1. 〇 作為Ni金屬成分添加使成為4〇 g/L的NiSCh. 6H2〇 作為P金屬成分添加使成為〇. 6 g/L的NaH2P〇2 . HzO 做為其他成分添加1 · 〇 g/L的HsBCh 浴溫度 pH 電流密度 處理時間 45〇C 3. 5 0.5 A/dm 3.·5 秒 14pH 0. 5 A/dm2 15 sec. Current density Treatment time The surface treatment was carried out twice in the above-mentioned untreated steel foil under the above-described electrolytic bath and conditions. The surface-treated copper foil was subjected to the same measurement as in Example 1 in the first comparative example 3 and the second time in the comparative example 4. The results are shown in Table 1 as Comparative Examples 3 and 4. <Comparative Examples 5 and 6> Copper foil: WZ copper foil of Furukawa Circuit Foil (R): Rz: 1. Ni was added as Ni metal component to be 4 〇g/L of NiSCh. 6H2 〇 was added as a P metal component. g. 6 g / L of NaH2P 〇 2 . HzO as other components added 1 · 〇g / L HsBCh bath temperature pH current density processing time 45 〇 C 3. 5 0.5 A / dm 3. · 5 seconds 14

2197-9984-PF 1376174 於上述未處理銅箔以上述組成的電解浴與條件實施2 次表面處理。以第1次為比較例5、第2次為比較例6,對 經表面處理的銅箔進行與實施例2相同的測定,其結果作 為比較例5、6而一併表示於表i。 〈比較例7、8 &gt; 45 C 3. 5 1.0 A/dm2 1 G 冬 I·、 銅箔:古河Circuit Foil (股)的WZ銅箔、RZ : 1. 〇 作為Zn金屬成分添加使成為1. 5 g/L的ZnSCh · 7H2〇 做為其他成分添加! · 〇 g/L的HAL 浴溫度2197-9984-PF 1376174 Two surface treatments were carried out on the above untreated copper foil in the same manner as in the electrolytic bath of the above composition. The surface-treated copper foil was subjected to the same measurement as in Example 2, with the first comparative example 5 and the second comparative example 6, and the results are shown in Table i as Comparative Examples 5 and 6. <Comparative Example 7, 8 &gt; 45 C 3. 5 1.0 A/dm2 1 G Winter I·, Copper Foil: WZ Copper Foil of Ryogo Circuit Foil (R): RZ: 1. 〇 is added as a Zn metal component to become 1 . 5 g/L of ZnSCh · 7H2〇 is added as other ingredients! · 〇 g / L HAL bath temperature

pH 電流密度 處理時間 於上述未處理鋼笛以上述組成的電解浴與條件實施2 次表面處理。以第1次為比較例7、第2次為比較例8,對 經表面處理的㈣進行與實施例i相同的敎,其結果作 為比較例7、8而一併表示於表工。 2197-9984-PF 15 1376174 表1pH Current Density Treatment time The surface treatment was carried out twice in the above-mentioned untreated steel flute with the above-described electrolytic bath and conditions. The first time was Comparative Example 7, and the second time was Comparative Example 8, and the surface treated (4) was subjected to the same enthalpy as in Example i, and the results were shown in Tables as Comparative Examples 7 and 8. 2197-9984-PF 15 1376174 Table 1

離No_ 電解浴中的 Zn量 銅箔表面的合金组成 剝離強度 總合判定 上段(mg/dm2) (g/L) 下段(wt?〇 初期 熱處理後 酸處理後 鞋刻性 Ni P Zn 實施例1 0.5 0.35 0.03 0.11 ◎ ◎ ◎ ◎ ◎ 71.7 6.6 21.8 實施例2 0.5 0. 35 0.03 0.10 ◎ ◎ ◎ ◎ ◎ 72.6 6.6 20.7 實施例3 1 0.36 0.03 0.19 ◎ ◎ ◎ ◎ ◎ 61.9 5.5 32.6 實施例4 1 0.35 0.03 0,19 ◎ ◎ ◎ ◎ ◎ 61.1 5.2 33.7 實施例5 0.1 0. 34 0.03 0. 03 〇 〇 〇 〇 〇 84.0 7.9 8.1 實施例6 0.1 0.33 0.03 0.03 〇 〇 〇 〇 〇 84.2 8.2 7.7 實施例7 2 0. 38 0.03 0.30 ◎ ◎ 〇 〇 〇 53.8 4.2 42.0 實施例8 2 0. 35 0. 03 0.29 ◎ ◎ 〇 〇 〇 52.0 4.4 43.6 比較例1 5 0.35 0.01 0. 95 ◎ ◎ X X X 26.6 0.5 73.0 比較例2 5 0.33 0.01 0.90 ◎ ◎ X X X 26.8 0.5 72.7 比較例3 10 0.31 0. 01 1.07 ◎ ◎ X X X 22.0 0.7 77.3 比較例4 10 0.31 0.01 1.10 ◎ ◎ X X X 22.0 0.7 77.3 比較例5 0 0.32 0. 02 0.00 〇 X 〇 〇 X 95.0 5.0 0.0 比較例6 0 0.32 0.02 0.00 〇 X 〇 〇 X 95.5 4.5 0.0 比較例7 僅有Zn 0.00 0.00 0.31 ◎ 〇 X X X 0.0 0.0 100.0 比較例8 僅有Zn 0.00 0. 00 0. 31 ◎ 〇 X X X 0.0 0.0 100.0 判定基準 初期剝離強度(單位kN/m) -0. 6x 0.6-0.80 0. 8-® 耐熱性實驗後剝離強度(單位kN/m)* ~0. 48x 0.48-0. 640 0. 64-© 耐酸性實驗後剝離強度(單位kN/m) -0. 6x 0. 6-0. 80 0. 8&quot;·© 蝕刻性(由寬度1顏的減少寬度單位//m) -4. 0® 4. 0-6. 0〇 6. 0~x *耐熱剝離強度(%)=[1-(初期剝離強度-熱處理後剝離強度)/初期剝離強度]X100 2197-9984-PF 16 1376174 如表1所示,實施例1〜4的…為6〇 wt%〜75村%、 P為5 Wt%〜7 wt%、^為20 wt%〜35 wt%,通過了各測定 的滿足值(總合評價◎)。 實施例5〜6的Ni為80 wt%以上、以為1〇㈣以下, 由於仏的含量少,初期以及熱處理後的剝離強度略低於滿 足值,關㈣刻性則由於Ni的含量多而略微不佳,整體而 言是可以滿足要求的(總合評價〇)。 實施例7〜8的Ni為50 wt%、Zn為45 wt%,由The alloy composition of the surface of the Zn amount of copper foil in the No_ electrolytic bath is determined by the upper part of the peel strength (mg/dm2) (g/L). The lower part (wt?〇 after the initial heat treatment after the acid treatment, the shoe-etched Ni P Zn Example 1 0.5 0.35 0.03 0.11 ◎ ◎ ◎ ◎ ◎ 71.7 6.6 21.8 Example 2 0.5 0. 35 0.03 0.10 ◎ ◎ ◎ ◎ ◎ 72.6 6.6 20.7 Example 3 1 0.36 0.03 0.19 ◎ ◎ ◎ ◎ ◎ 61.9 5.5 32.6 Example 4 1 0.35 0.03 0,19 ◎ ◎ ◎ ◎ ◎ 61.1 5.2 33.7 Example 5 0.1 0. 34 0.03 0. 03 〇〇〇〇〇 84.0 7.9 8.1 Example 6 0.1 0.33 0.03 0.03 〇〇〇〇〇 84.2 8.2 7.7 Example 7 2 0 38 0.03 0.30 ◎ ◎ 〇〇〇 53.8 4.2 42.0 Example 8 2 0. 35 0. 03 0.29 ◎ ◎ 〇〇〇 52.0 4.4 43.6 Comparative Example 1 5 0.35 0.01 0. 95 ◎ ◎ XXX 26.6 0.5 73.0 Comparative Example 2 5 0.33 0.01 0.90 ◎ ◎ XXX 26.8 0.5 72.7 Comparative Example 3 10 0.31 0. 01 1.07 ◎ ◎ XXX 22.0 0.7 77.3 Comparative Example 4 10 0.31 0.01 1.10 ◎ ◎ XXX 22.0 0.7 77.3 Comparative Example 5 0 0.32 0. 02 0.00 〇X 〇〇 X 95.0 5.0 0.0 Compare 6 0 0.32 0.02 0.00 〇X 〇〇X 95.5 4.5 0.0 Comparative Example 7 Zn 0.00 0.00 0.31 ◎ 〇 XXX 0.0 0.0 100.0 Comparative Example 8 Only Zn 0.00 0. 00 0. 31 ◎ 〇 XXX 0.0 0.0 100.0 Initial judgment base Peel strength (unit: kN/m) -0. 6x 0.6-0.80 0. 8-® Peel strength after heat resistance test (unit: kN/m)* ~0. 48x 0.48-0. 640 0. 64-© Acid resistance test After peeling strength (unit: kN/m) -0. 6x 0. 6-0. 80 0. 8&quot;·© Etching (by width 1 color reduction width unit / / m) -4. 0® 4. 0- 6. 0〇6. 0~x * Heat-resistant peel strength (%) = [1 - (initial peel strength - peel strength after heat treatment) / initial peel strength] X100 2197-9984-PF 16 1376174 As shown in Table 1, Examples 1 to 4 were 6 〇 wt% to 75 5%, P was 5 Wt% to 7 wt%, and ^ was 20 wt% to 35 wt%, and the satisfaction value of each measurement was passed (total evaluation ◎). In Examples 5 to 6, Ni is 80 wt% or more, and is not more than 1 〇 (4). Since the content of bismuth is small, the peel strength at the initial stage and after the heat treatment is slightly lower than the satisfying value, and the (four) etchability is slightly due to the high content of Ni. Poor, on the whole, can meet the requirements (summary evaluation). Ni of Examples 7 to 8 was 50 wt%, and Zn was 45 wt%.

_ -- w L/u, ttf &gt;7;' Zili 的含量多’因此通過了初期以及熱處理後的剝離強度,但 是酸處理後的剝離強度略低於滿足值H,關於餘刻性 則由於Zn的含量多而略微不佳,整體而言是可以滿足要求 的(總合評價〇)。_ -- w L/u, ttf &gt;7; 'the content of Zili is large', so the peel strength after the initial stage and after the heat treatment is passed, but the peel strength after the acid treatment is slightly lower than the satisfying value H, and the The content of Zn is somewhat poor and is generally satisfactory (total evaluation 〇).

平父1夕1J ^ * υ ννττί»以上, 由於ζη的含量多’因此通過了初期以及熱處理後的剥離強 度,但是酸處理後的剝離強度、_性無法通過滿足值。 比較例5、6由於不含Ζη,所以剝離強度差,比較例7、 8由於财Ζη’因此酸處理性、㈣性差,並不適用於電 路基板。 銅箔能夠滿足對聚醯 而為工業上優良的表 亞 面 如上所述,本發明的表面處理 胺的接著強度、耐酸性、蝕刻性, 處理銅箱。 能夠提供 餘刻性的 而且,如依本發明的銅箔的表面處理方法 在工業上滿足對聚醯亞胺的接著強度、耐酸性 銅箔的表面處理方.法。 17In the case of the above-mentioned 以及 的 J 的 ζ 以上 以上 以上 以上 以上 以上 以上 以上 以上 以上 以上 以上 以上 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 In Comparative Examples 5 and 6, since Ζη was not contained, the peel strength was inferior, and Comparative Examples 7 and 8 were not suitable for the circuit board because of the acidity η' and thus the acid treatment property and the (4) property. The copper foil can satisfy the industrially excellent surface area for the polyfluorene. As described above, the surface treatment amine of the present invention has the adhesive strength, acid resistance, and etching property, and the copper box is treated. Further, the surface treatment method of the copper foil according to the present invention is industrially satisfactory for the adhesion strength of the polyimide and the surface treatment of the acid-resistant copper foil. 17

2197-9984-PF /〇 丄 74 進而如依本發明的層積電路基板,能夠提供一種層積 電路基板,其樹脂基板特別是聚醯亞胺與鋼箔的接著強度 強、具有形成電路時的耐酸性,且滿足蝕刻性,而具有優 【圖式簡單說明】 的說明圖。 合金層中的Zn 圖1所不為測定剝離強度時的施壓條件2197-9984-PF/〇丄74 Further, according to the laminated circuit substrate of the present invention, it is possible to provide a laminated circuit substrate in which the resin substrate, in particular, the polyimide and the steel foil have high bonding strength and have a circuit formation. It is acid-resistant and meets etchability, and has an explanatory diagram of excellent [schematic description]. Zn in the alloy layer Figure 1 is not a pressure condition for measuring the peel strength.

圖2所示為銅箔表面處理層的Ni-P-Zn 含量與剝離強度的關係圖。 【主要元件符號說明】Fig. 2 is a graph showing the relationship between the Ni-P-Zn content of the copper foil surface treatment layer and the peel strength. [Main component symbol description]

2197-9984-PF 182197-9984-PF 18

Claims (1)

1376174 第097134379號 川〇年12月12曰修正替換頁1376174 No. 097134379, December 12, 2003 十、申請專利範圍: 上乂:Γ面處理銅荡’在未處理銅二^-側的面 上把加有”卜卜Zn合金所構成的表面處理層, .n , 甩惑.,且成為,Ni為50〜90wt%、P 為0.1〜15wu與仏為5〜43 6wt%,且 u。二表面處理層之前述2„之含…。'。3〜X. The scope of application for patents: Shangyu: The surface treatment of the copper surface is added to the surface of the untreated copper II-- side with a surface treatment layer composed of "Bu Bu Zn alloy, .n, confuse. Ni is 50 to 90% by weight, P is 0.1 to 15 wu, and ytterbium is 5 to 43 6 wt%, and u. The surface of the second surface treatment layer is contained. '. 3~ .-種銅箱的表面處理方法,在未處理銅猪的至少 則的面上,以含有Nl:25〜55g/L、p:〇 2〜i 〇g/L、Zn ㈠〜^几的電解^形成由^^^^為^ 與Zl^5〜43.6wt%且前述zn之含有量為n •SOmg/dm2的Ni-P-Zn合金所構成的表面處理層。 3.-種層積電路基板’將表面處理銅羯的表面處理層 的面與樹職板接著而形成,其中前述表面處理㈣是在 未處理鋼fl的至少一側的面上設置有φ Ni_p_zn合金所構 成的表面處理層而構成,前述表面處理銅箱的前述表面處 理層的面與前述樹脂基板接著,又 前述表面處理層之組成為,…為5〇〜9〇^%、1&gt;為〇 i 〜與Zn為5〜43. 6wt%,且前述表面處理層之前述&amp; 之 3 有置為 〇 〇3〜〇. 3〇mg/dni2。 .如申明專利範圍第3項所述之層積電路基板,其中 月’J述表面處理銅箔與前述樹脂基板的接著面的初期剝離強 度為〇.6kN/ra以上,且進行空氣加熱試驗後的剝離強度維 持初期剝離強度的80%以上的強度。 2197'9984-ppi 19- The surface treatment method of the copper box, on the surface of at least the untreated copper pig, with the electrolysis containing Nl: 25~55g / L, p: 〇 2~i 〇g / L, Zn (a) ~ ^ A surface-treated layer composed of a Ni-P-Zn alloy having a content of z·5 to 43.6 wt% and a content of zn of n·SOmg/dm 2 was formed. 3.-Laminating a circuit substrate 'The surface of the surface-treated layer of the surface-treated copper mat is formed in tandem with the tree board, wherein the surface treatment (4) is that φ Ni_p_zn is provided on at least one side of the untreated steel fl a surface treatment layer formed of an alloy, wherein a surface of the surface treatment layer of the surface-treated copper box is further connected to the resin substrate, and a composition of the surface treatment layer is 5 〇 9 9 、 1%, 1 gt; 〇i~ and Zn are 5~43. 6wt%, and the aforementioned &amp; 3 of the surface treatment layer is set to 〇〇3~〇. 3〇mg/dni2. The laminated circuit board according to the third aspect of the invention, wherein the initial peeling strength of the surface of the surface-treated copper foil and the resin substrate is 〇6 kN/ra or more, and after the air heating test The peel strength maintains the strength of 80% or more of the initial peel strength. 2197'9984-ppi 19
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