TWI372254B - Chip tester and method for chip test - Google Patents

Chip tester and method for chip test

Info

Publication number
TWI372254B
TWI372254B TW097128345A TW97128345A TWI372254B TW I372254 B TWI372254 B TW I372254B TW 097128345 A TW097128345 A TW 097128345A TW 97128345 A TW97128345 A TW 97128345A TW I372254 B TWI372254 B TW I372254B
Authority
TW
Taiwan
Prior art keywords
chip
tester
test
chip test
chip tester
Prior art date
Application number
TW097128345A
Other languages
English (en)
Other versions
TW201005312A (en
Inventor
Chin Kuang Wen
Original Assignee
King Yuan Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by King Yuan Electronics Co Ltd filed Critical King Yuan Electronics Co Ltd
Priority to TW097128345A priority Critical patent/TWI372254B/zh
Publication of TW201005312A publication Critical patent/TW201005312A/zh
Application granted granted Critical
Publication of TWI372254B publication Critical patent/TWI372254B/zh

Links

TW097128345A 2008-07-25 2008-07-25 Chip tester and method for chip test TWI372254B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW097128345A TWI372254B (en) 2008-07-25 2008-07-25 Chip tester and method for chip test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW097128345A TWI372254B (en) 2008-07-25 2008-07-25 Chip tester and method for chip test

Publications (2)

Publication Number Publication Date
TW201005312A TW201005312A (en) 2010-02-01
TWI372254B true TWI372254B (en) 2012-09-11

Family

ID=44826220

Family Applications (1)

Application Number Title Priority Date Filing Date
TW097128345A TWI372254B (en) 2008-07-25 2008-07-25 Chip tester and method for chip test

Country Status (1)

Country Link
TW (1) TWI372254B (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9423451B2 (en) * 2013-06-04 2016-08-23 Marvell World Trade Ltd. Method and apparatus for testing a semiconductor package having a package on package (PoP) design
TWI494577B (zh) * 2014-05-09 2015-08-01 Chroma Ate Inc Test device for image sensor and test method thereof

Also Published As

Publication number Publication date
TW201005312A (en) 2010-02-01

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