TWI350577B - Semiconductor testing apparatus and method for controlling the same - Google Patents
Semiconductor testing apparatus and method for controlling the sameInfo
- Publication number
- TWI350577B TWI350577B TW097100477A TW97100477A TWI350577B TW I350577 B TWI350577 B TW I350577B TW 097100477 A TW097100477 A TW 097100477A TW 97100477 A TW97100477 A TW 97100477A TW I350577 B TWI350577 B TW I350577B
- Authority
- TW
- Taiwan
- Prior art keywords
- controlling
- same
- testing apparatus
- semiconductor testing
- semiconductor
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2896—Testing of IC packages; Test features related to IC packages
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Manufacturing Of Electrical Connectors (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070054986A KR100889819B1 (en) | 2007-06-05 | 2007-06-05 | Semiconductor inspecting apparatus and control method thereof |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200849456A TW200849456A (en) | 2008-12-16 |
TWI350577B true TWI350577B (en) | 2011-10-11 |
Family
ID=40233286
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW097100477A TWI350577B (en) | 2007-06-05 | 2008-01-04 | Semiconductor testing apparatus and method for controlling the same |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP4980870B2 (en) |
KR (1) | KR100889819B1 (en) |
TW (1) | TWI350577B (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5187188B2 (en) * | 2008-12-26 | 2013-04-24 | 富士通株式会社 | Method for installing semiconductor integrated circuit package and method for manufacturing electronic component |
KR102000950B1 (en) * | 2012-02-29 | 2019-07-17 | (주)제이티 | Semiconductor device inspection apparatus |
JP7239474B2 (en) * | 2017-01-13 | 2023-03-14 | ベックマン コールター, インコーポレイテッド | Motion system for tip loading |
CN111771120B (en) | 2018-02-22 | 2023-09-05 | 国立大学法人大阪大学 | Chip for evaluating substrate and substrate evaluating device |
KR102190485B1 (en) * | 2019-05-14 | 2020-12-15 | 주식회사 탑 엔지니어링 | Array Tester |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3407192B2 (en) * | 1998-12-31 | 2003-05-19 | 株式会社ダイトー | Test hand control method and measurement control system |
JP4327335B2 (en) * | 2000-06-23 | 2009-09-09 | 株式会社アドバンテスト | Contact arm and electronic component testing apparatus using the same |
JP2002011684A (en) * | 2000-06-26 | 2002-01-15 | Daito:Kk | Heat radiation mechanism of ic suction hand |
JP2002257899A (en) * | 2001-02-27 | 2002-09-11 | Ando Electric Co Ltd | Automatic handler |
JP4510679B2 (en) * | 2005-03-30 | 2010-07-28 | 株式会社テセック | Teaching method of contact head working position |
-
2007
- 2007-06-05 KR KR1020070054986A patent/KR100889819B1/en not_active IP Right Cessation
- 2007-12-18 JP JP2007326309A patent/JP4980870B2/en not_active Expired - Fee Related
-
2008
- 2008-01-04 TW TW097100477A patent/TWI350577B/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
TW200849456A (en) | 2008-12-16 |
KR20080107098A (en) | 2008-12-10 |
JP4980870B2 (en) | 2012-07-18 |
JP2008304447A (en) | 2008-12-18 |
KR100889819B1 (en) | 2009-03-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |