TWI348595B - Coating compositions for use with an overcoated photoresist - Google Patents

Coating compositions for use with an overcoated photoresist

Info

Publication number
TWI348595B
TWI348595B TW096103127A TW96103127A TWI348595B TW I348595 B TWI348595 B TW I348595B TW 096103127 A TW096103127 A TW 096103127A TW 96103127 A TW96103127 A TW 96103127A TW I348595 B TWI348595 B TW I348595B
Authority
TW
Taiwan
Prior art keywords
coating compositions
overcoated photoresist
overcoated
photoresist
compositions
Prior art date
Application number
TW096103127A
Other languages
English (en)
Other versions
TW200741351A (en
Inventor
Vaishali Raghu Vohra
James W Thackeray
Gerald B Wayton
Original Assignee
Rohm & Haas Elect Mat
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rohm & Haas Elect Mat filed Critical Rohm & Haas Elect Mat
Publication of TW200741351A publication Critical patent/TW200741351A/zh
Application granted granted Critical
Publication of TWI348595B publication Critical patent/TWI348595B/zh

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
    • G03F7/11—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers having cover layers or intermediate layers, e.g. subbing layers
    • C—CHEMISTRY; METALLURGY
    • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
    • C09D5/00—Coating compositions, e.g. paints, varnishes or lacquers, characterised by their physical nature or the effects produced; Filling pastes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
    • G02B1/10—Optical coatings produced by application to, or surface treatment of, optical elements
    • G02B1/11—Anti-reflection coatings
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
    • G03F7/091—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers characterised by antireflection means or light filtering or absorbing means, e.g. anti-halation, contrast enhancement

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Architecture (AREA)
  • Structural Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Materials Engineering (AREA)
  • Wood Science & Technology (AREA)
  • Organic Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Materials For Photolithography (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Paints Or Removers (AREA)
TW096103127A 2006-01-29 2007-01-29 Coating compositions for use with an overcoated photoresist TWI348595B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US76326606P 2006-01-29 2006-01-29

Publications (2)

Publication Number Publication Date
TW200741351A TW200741351A (en) 2007-11-01
TWI348595B true TWI348595B (en) 2011-09-11

Family

ID=38120654

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096103127A TWI348595B (en) 2006-01-29 2007-01-29 Coating compositions for use with an overcoated photoresist

Country Status (6)

Country Link
US (1) US7919222B2 (zh)
EP (1) EP1813986A3 (zh)
JP (1) JP5313452B2 (zh)
KR (2) KR101339765B1 (zh)
CN (1) CN101017326B (zh)
TW (1) TWI348595B (zh)

Families Citing this family (38)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW591341B (en) * 2001-09-26 2004-06-11 Shipley Co Llc Coating compositions for use with an overcoated photoresist
TWI358613B (en) * 2006-03-10 2012-02-21 Rohm & Haas Elect Mat Compositions and processes for photolithography
EP1845416A3 (en) 2006-04-11 2009-05-20 Rohm and Haas Electronic Materials, L.L.C. Coating compositions for photolithography
JP4786636B2 (ja) * 2007-12-26 2011-10-05 Ａｚエレクトロニックマテリアルズ株式会社 反射防止膜形成用組成物およびそれを用いたパターン形成方法
JP5746824B2 (ja) * 2009-02-08 2015-07-08 ローム アンド ハース エレクトロニック マテリアルズ エルエルシーＲｏｈｍ ａｎｄ Ｈａａｓ Ｅｌｅｃｔｒｏｎｉｃ Ｍａｔｅｒｉａｌｓ ＬＬＣ 上塗りフォトレジストと共に使用するのに好適なコーティング組成物
KR101668505B1 (ko) * 2009-02-19 2016-10-28 브레우어 사이언스 인코포레이션 산-민감성, 현상제-용해성 바닥부 반사방지 코팅
TWI442453B (zh) * 2009-11-19 2014-06-21 羅門哈斯電子材料有限公司 形成電子裝置之方法
JP5820676B2 (ja) 2010-10-04 2015-11-24 ローム アンド ハース エレクトロニック マテリアルズ エルエルシーＲｏｈｍ ａｎｄ Ｈａａｓ Ｅｌｅｃｔｒｏｎｉｃ Ｍａｔｅｒｉａｌｓ ＬＬＣ 下層組成物および下層を像形成する方法
JP6035017B2 (ja) 2010-10-04 2016-11-30 ローム アンド ハース エレクトロニック マテリアルズ エルエルシーＲｏｈｍ ａｎｄ Ｈａａｓ Ｅｌｅｃｔｒｏｎｉｃ Ｍａｔｅｒｉａｌｓ ＬＬＣ 下層組成物および下層を像形成する方法
KR20120035995A (ko) * 2010-10-07 2012-04-17 동우 화인켐 주식회사 착색 감광성 수지 조성물, 컬러필터 및 액정표시장치
EP2472328B1 (en) * 2010-12-31 2013-06-19 Rohm and Haas Electronic Materials LLC Coating compositions for use with an overcoated photoresist
JP5453361B2 (ja) * 2011-08-17 2014-03-26 信越化学工業株式会社 ケイ素含有レジスト下層膜形成用組成物、及びパターン形成方法
US8883023B2 (en) * 2011-09-29 2014-11-11 Jsr Corporation Method for forming pattern
US9171720B2 (en) * 2013-01-19 2015-10-27 Rohm And Haas Electronic Materials Llc Hardmask surface treatment
US9017934B2 (en) 2013-03-08 2015-04-28 Taiwan Semiconductor Manufacturing Company, Ltd. Photoresist defect reduction system and method
US9354521B2 (en) 2013-03-12 2016-05-31 Taiwan Semiconductor Manufacturing Company, Ltd. Photoresist system and method
US9543147B2 (en) 2013-03-12 2017-01-10 Taiwan Semiconductor Manufacturing Company, Ltd. Photoresist and method of manufacture
US9175173B2 (en) 2013-03-12 2015-11-03 Taiwan Semiconductor Manufacturing Company, Ltd. Unlocking layer and method
US9502231B2 (en) 2013-03-12 2016-11-22 Taiwan Semiconductor Manufacturing Company, Ltd. Photoresist layer and method
US9245751B2 (en) 2013-03-12 2016-01-26 Taiwan Semiconductor Manufacturing Company, Ltd. Anti-reflective layer and method
US9256128B2 (en) 2013-03-12 2016-02-09 Taiwan Semiconductor Manufacturing Company, Ltd. Method for manufacturing semiconductor device
US8932799B2 (en) 2013-03-12 2015-01-13 Taiwan Semiconductor Manufacturing Company, Ltd. Photoresist system and method
US9110376B2 (en) 2013-03-12 2015-08-18 Taiwan Semiconductor Manufacturing Company, Ltd. Photoresist system and method
US9117881B2 (en) 2013-03-15 2015-08-25 Taiwan Semiconductor Manufacturing Company, Ltd. Conductive line system and process
US9341945B2 (en) 2013-08-22 2016-05-17 Taiwan Semiconductor Manufacturing Company, Ltd. Photoresist and method of formation and use
US10036953B2 (en) 2013-11-08 2018-07-31 Taiwan Semiconductor Manufacturing Company Photoresist system and method
US10095113B2 (en) 2013-12-06 2018-10-09 Taiwan Semiconductor Manufacturing Company Photoresist and method
US9761449B2 (en) 2013-12-30 2017-09-12 Taiwan Semiconductor Manufacturing Company, Ltd. Gap filling materials and methods
US9599896B2 (en) 2014-03-14 2017-03-21 Taiwan Semiconductor Manufacturing Company, Ltd. Photoresist system and method
KR101917406B1 (ko) * 2014-03-21 2018-11-09 동우 화인켐 주식회사 고색재현이 가능한 착색 광경화성 수지조성물, 컬러필터 및 이를 구비한 액정표시장치
JP6509496B2 (ja) * 2014-04-08 2019-05-08 アーゼッド・エレクトロニック・マテリアルズ（ルクセンブルグ）ソシエテ・ア・レスポンサビリテ・リミテ 下層膜形成用組成物
US9581908B2 (en) 2014-05-16 2017-02-28 Taiwan Semiconductor Manufacturing Company, Ltd. Photoresist and method
US10133178B2 (en) * 2014-09-19 2018-11-20 Nissan Chemical Industries, Ltd. Coating liquid for resist pattern coating
CN115058175A (zh) * 2015-08-31 2022-09-16 罗门哈斯电子材料有限责任公司 与外涂布光致抗蚀剂一起使用的涂料组合物
TWI646397B (zh) * 2015-10-31 2019-01-01 南韓商羅門哈斯電子材料韓國公司 與外塗佈光致抗蝕劑一起使用的塗料組合物
US10203602B2 (en) 2016-09-30 2019-02-12 Rohm And Haas Electronic Materials Korea Ltd. Coating compositions for use with an overcoated photoresist
US11500291B2 (en) * 2017-10-31 2022-11-15 Rohm And Haas Electronic Materials Korea Ltd. Underlying coating compositions for use with photoresists
JP7125476B2 (ja) * 2018-03-30 2022-08-24 富士フイルム株式会社 感活性光線性又は感放射線性樹脂組成物、感活性光線性又は感放射線性膜、パターン形成方法、及び電子デバイスの製造方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08316121A (ja) * 1995-05-17 1996-11-29 Fujitsu Ltd レジストパターン形成方法
JPH1172925A (ja) * 1997-07-03 1999-03-16 Toshiba Corp 下層膜用組成物およびこれを用いたパターン形成方法
CN1182440C (zh) * 1997-09-30 2004-12-29 西门子公司 用于深紫外线光刻的层状结构以及形成光刻层状结构的方法
TWI244495B (en) * 2000-08-14 2005-12-01 Ciba Sc Holding Ag Process for producing coatings siloxane photoinitiators
TW576949B (en) * 2000-08-17 2004-02-21 Shipley Co Llc Antireflective coatings with increased etch rates
JP2002328476A (ja) * 2001-04-26 2002-11-15 Toshiba Corp パターン形成方法
TW591341B (en) * 2001-09-26 2004-06-11 Shipley Co Llc Coating compositions for use with an overcoated photoresist
US6844131B2 (en) * 2002-01-09 2005-01-18 Clariant Finance (Bvi) Limited Positive-working photoimageable bottom antireflective coating
US6797456B1 (en) * 2002-08-01 2004-09-28 Integrated Device Technology, Inc. Dual-layer deep ultraviolet photoresist process and structure
JP4179116B2 (ja) * 2003-09-11 2008-11-12 Ｊｓｒ株式会社 反射防止膜形成組成物及び反射防止膜の製造方法
EP1742108B1 (en) * 2005-07-05 2015-10-28 Rohm and Haas Electronic Materials, L.L.C. Coating compositions for use with an overcoated photoresist

Also Published As

Publication number Publication date
JP2007256928A (ja) 2007-10-04
US7919222B2 (en) 2011-04-05
CN101017326B (zh) 2011-10-12
EP1813986A3 (en) 2008-11-05
TW200741351A (en) 2007-11-01
EP1813986A2 (en) 2007-08-01
KR20070078804A (ko) 2007-08-02
KR101506159B1 (ko) 2015-03-26
CN101017326A (zh) 2007-08-15
US20070178406A1 (en) 2007-08-02
KR20130133714A (ko) 2013-12-09
KR101339765B1 (ko) 2013-12-11
JP5313452B2 (ja) 2013-10-09

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