TWI346206B - Conductive contacts unit - Google Patents

Conductive contacts unit

Info

Publication number
TWI346206B
TWI346206B TW096129931A TW96129931A TWI346206B TW I346206 B TWI346206 B TW I346206B TW 096129931 A TW096129931 A TW 096129931A TW 96129931 A TW96129931 A TW 96129931A TW I346206 B TWI346206 B TW I346206B
Authority
TW
Taiwan
Prior art keywords
conductive contacts
contacts unit
unit
conductive
contacts
Prior art date
Application number
TW096129931A
Other languages
English (en)
Other versions
TW200813442A (en
Inventor
Yuka Ooyashiki
Takahiro Motegi
Original Assignee
Nhk Spring Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nhk Spring Co Ltd filed Critical Nhk Spring Co Ltd
Publication of TW200813442A publication Critical patent/TW200813442A/zh
Application granted granted Critical
Publication of TWI346206B publication Critical patent/TWI346206B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Geometry (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Measuring Leads Or Probes (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Liquid Crystal (AREA)
TW096129931A 2006-08-18 2007-08-14 Conductive contacts unit TWI346206B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2006223386A JP4781938B2 (ja) 2006-08-18 2006-08-18 導電性接触子ユニット
PCT/JP2007/065659 WO2008020565A1 (fr) 2006-08-18 2007-08-09 Unité contacteur conducteur

Publications (2)

Publication Number Publication Date
TW200813442A TW200813442A (en) 2008-03-16
TWI346206B true TWI346206B (en) 2011-08-01

Family

ID=39082090

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096129931A TWI346206B (en) 2006-08-18 2007-08-14 Conductive contacts unit

Country Status (5)

Country Link
JP (1) JP4781938B2 (zh)
KR (1) KR20090045347A (zh)
CN (1) CN101506665A (zh)
TW (1) TWI346206B (zh)
WO (1) WO2008020565A1 (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105719730B (zh) * 2016-02-05 2017-09-22 燕山大学 一种内嵌直线段式马蹄形柔性电子器件交联导体结构
CN111033273B (zh) * 2018-01-11 2022-04-26 欧姆龙株式会社 探针、检查工具、检查单元和检查装置
KR20230032064A (ko) * 2021-08-30 2023-03-07 (주)포인트엔지니어링 캔틸레버형 프로브 핀

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11133060A (ja) * 1997-10-31 1999-05-21 Tani Denki Kogyo Kk テスト用端子
JP4905872B2 (ja) * 2005-02-18 2012-03-28 日本発條株式会社 導電性接触子ユニット
JP4884753B2 (ja) * 2005-11-22 2012-02-29 日本発條株式会社 導電性接触子ユニットおよび導電性接触子
JP4907191B2 (ja) * 2006-02-17 2012-03-28 日本発條株式会社 導電性接触子ユニット

Also Published As

Publication number Publication date
TW200813442A (en) 2008-03-16
JP4781938B2 (ja) 2011-09-28
KR20090045347A (ko) 2009-05-07
CN101506665A (zh) 2009-08-12
WO2008020565A1 (fr) 2008-02-21
JP2008046045A (ja) 2008-02-28

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees