1330317 * .•九、發明說明： 【發明所屬之技術領域】 本發明係有關於一種參數資料測試技術，詳而言之， 係有關於一種可得知基板管理控制器對用以儲存參數資 料之儲存單元讀寫正4性及讀取穩定性之參數資料測試 方法。 【先前技術】 目前應用於伺服器的基板管理控制器（Baseboard1330317 *.•9, invention description: [Technical field of the invention] The present invention relates to a parameter data testing technique, and more particularly, to a substrate management controller for storing parameter data. The storage unit reads and writes the positive data and the reading stability parameter data test method. [Prior Art] Baseboard Management Controller (Baseboard) currently applied to servers
Management Controller ; BMC)的參數資料係分別儲存於 各種可替換式硬體組件單元（Field Replaceable Unit， FRU)及 SDR (Sensor Data Record)式記憶體單元，而 該參數資料對基板管理控制器來說具有相當的重要性，當 伺服器在休眠或關機的狀態下，可透過該參數資料協助基 板官理控制器繼續進行工作，例如遠端訊息的接收、伺服 器内部訊號傳遞等等，讓伺服器在休眠或關機狀態下還可 籲以進行部份工作，不因伺服器進入休眠或關機狀態而閒 -置。 - 由於目前的伺服器製造商在基板管理控制器的各種 可替換式硬體組件單元（Field Repiaceabie Unit，FRU ) 及SDR ( Sensor Data Record )式記憶體單元在各種平台 的開發上，有可能無法百分之百完全無誤的寫入參數資料 或將該參數資料穩定的讀出，若參數資料無法正確自各種 可替換式硬體組件單元（Field Replaceable Unit，FRU) 及SDR ( Sensor Data Record )式記憶體單元穩定的讀寫， 5 19895 1330317 會使該基板管理控制器在工作時 枓’而以餘相誤的參㈣料 、=數貝 舰器運作不穩或是當機，進而產乍;題亦::能使 服器製造商的商。弗㈣全 訴問碭’故對於伺 J耵冏叩形象及口碑影響相當大。 因此，如何提供一種參數 .測試m為料料料確及穩定之 【發明内容】 鑒於上述習知技術之缺點，本發明主 -種對參數資料的讀寫測試是 =於提供 测試方法。 崔及％疋之參數資料 法^^述之目的，本發明提供—種參數資料測試方 二::用於具，管理控制器、參數資料儲存單元以 驟置，該參數資料測試方法包括以下步 元内板Λ理控制器將健存於該參數資料儲存單 儲二二八將該參數資料傳送至該暫存單元 存，（2)々該基板管理控制器清除該參數資料儲存單元 内之參數資料·，（3)令該基板管理控制器自該暫存單元a ”參數資料，並將該參數資料重新寫入該參數資料儲： ^，以及（4)令該基板管理控制器比對該參數資料儲 存單元與該暫存單元内之參數資料是否相符。 另該參數資料測試方法復包括輸入一迴圈數值，若該 電腦裝置執行該步驟⑴至步驟（4)的次數未達該迴圈/ 數值，則重複執行該步驟⑴至步驟⑷；若執行該步 驟（1)至步驟（4)的次數已達該迴圈數值則結束該參數 19895 6 1330317The parameter data of the Management Controller (BMC) are stored in various replaceable hardware replacement unit (FRU) and SDR (Sensor Data Record) type memory unit, and the parameter data is for the substrate management controller. It is of considerable importance. When the server is in a sleep or shutdown state, the parameter information can be used to assist the substrate controller to continue the work, such as receiving the remote message, transmitting the internal signal of the server, etc., and letting the server In the sleep or shutdown state, some work can be called, and the server is not idle because the server enters the sleep state or the shutdown state. - Due to the current server manufacturer's development of various platform hardware controllers (Field Repiaceabie Units, FRUs) and SDR (Sensor Data Record) memory units on various platforms, it may not be possible 100% complete error-free writing of parameter data or stable reading of the parameter data, if the parameter data cannot be correctly obtained from various replaceable hardware replacement unit (FRU) and SDR (Sensor Data Record) memory unit Stable reading and writing, 5 19895 1330317 will cause the baseboard management controller to work while 而 ', while the residual phase error (4) material, = number of shells operating unstable or crash, and then calving; : A business that can make a server manufacturer. Eve (four) all complained about the situation, so the impact on the image and reputation of the J. Therefore, how to provide a parameter. Test m is stable and stable. [Invention] In view of the above-mentioned shortcomings of the prior art, the main reading and writing test of the parameter data of the present invention is to provide a test method. The purpose of the parameter data method of Cui and %疋, the present invention provides a parameter data test method 2: for the tool, the management controller, the parameter data storage unit to be set, the parameter data test method includes the following steps The in-plane board controller will be stored in the parameter data storage unit storage 28 28 to transfer the parameter data to the temporary storage unit, and (2) the substrate management controller clears the parameters in the parameter data storage unit. Data ·, (3) the baseboard management controller from the temporary storage unit a "parameter data, and re-write the parameter data into the parameter data storage: ^, and (4) the baseboard management controller Whether the parameter data storage unit and the parameter data in the temporary storage unit match. The parameter data test method includes inputting a circle value, and if the computer device performs the steps (1) to (4), the number of times does not reach the loop. / Value, the step (1) to the step (4) are repeated; if the number of times the step (1) to the step (4) is performed has reached the value of the loop, the parameter is ended: 1989 5 6 1330317
資料測試方法D 在上述步驟（1)中’該暫存單元所提供的儲存空間 至乂寺於用以儲存該參數資料的大小’或者該暫存單元所 提供的儲存空間可等於或大於該參數資料儲存單元所提 供的儲存空間。 上述步驟（2 )中，该清除方式係以電性抹除或填 〇〇h、FFh方式清除該參數資料儲存單元内之參數資料。 士述步驟⑷中，係比對該參數資料儲存單元與該 暫存早兀之參數資料之長度大小及内容是否一致 對後之資料訊息記錄並輸出，以供查詢。 該之參數資料測試方法的另-實施例中，於執行 步驟⑷的次數已達該迴圈數值時，則輸 息，而該資料訊息係指該參數資料儲， 比值。 U貝科比對-致及比對不—致之 综上所述，本發明之參數資料 夢數資料儲存單元讀寫參數資料是否正確L Μ列斷 基板管理控制器將參數資料 釔疋，Μ確保 的正確性以及穩定性。 〜I料儲存單元讀寫 【實施方式】 以下係藉由特定的具體 式，熟悉此技藝之人士可由本說；;查明本發明之實施方 瞭解本發明之其他優點與功效。"所揭不之内容輕易地 請參閲第1圖，传Α ^ 係為運作本發明之參數⑽測試方法 7 19895 1330317 -·之系統架構方塊示意圖’如圖所示，該測試方法係應用於 •電腦裝置1，該電腦裝置1包含有基板管理控制器 (Baseboard Management Controller > BMC) 11、參數資 料儲存單元12以及暫存單元13，其中，該參數資料儲存 單元12係由各種可替換式硬體組件單元（FieldThe data test method D is in the above step (1), 'the storage space provided by the temporary storage unit is sized to store the parameter data' or the storage space provided by the temporary storage unit may be equal to or greater than the parameter The storage space provided by the data storage unit. In the above step (2), the cleaning method is to erase the parameter data in the parameter data storage unit by electrically erasing or filling h and FFh. In the step (4), the data message is recorded and outputted for comparison with the length and size of the parameter data storage unit and the parameter data of the temporary storage. In another embodiment of the parameter data test method, when the number of times of performing step (4) has reached the value of the loop, the data is transmitted, and the data message refers to the parameter data storage ratio. U Becco comparison-to-and comparison--in view of the above, the parameter data of the present invention has a read/write parameter data of the parameter data storage unit, and the parameter data is 钇疋, Μ Correctness and stability. 〜I material storage unit reading and writing [Embodiment] The following is a specific embodiment, and those skilled in the art can understand the other advantages and effects of the present invention. "What is not disclosed is easy to refer to Figure 1, which is the parameter for operating the invention (10) Test method 7 19895 1330317 - System architecture block diagram 'As shown, the test method is applied The computer device 1 includes a baseboard management controller (BMC) 11, a parameter data storage unit 12, and a temporary storage unit 13, wherein the parameter data storage unit 12 is replaced by various types. Hardware component unit (Field
Replaceable Unit，FRU)121 及 SDR( Sens〇r Data Record) •式記憶體單元122所組成，而該暫存單元丨3係可為電性 抹除式可程式化唯讀記憶體（EEPR〇M)或快閃記憶體 馨（Flash RAM)等記憶體。 该基板官理控制器Π工作所需的參數資料係儲存於 該^數資料儲存單元12，因此，為了確保該基板管理控 制器11由該參數資料儲存單元12讀寫出的參數資料完全 正確及穩定，故利用一測試程式對該基板管理控制器U 至該參數資料儲存單元12讀寫所需的參數資料是否正確 及穩定進行測試，且使用一暫存單元13配合測試，將讀 籲出勺 > 數貝料儲存於該暫存單元13，以確保該參數資料 .自該參數資_存單元12讀Μ會產生錯誤。 勃式係令該基板f理控㈣11將儲存於該參 ”料儲存單元12内的參數資料讀^傳送至該暫存單 儲存。亥暫存單元13所提供的儲存空間至少需等於 該參數㈣的大小，或者該暫存單元 供或大於該參數資料儲存單元12所提 器n 該參數資料内容，該基板管理控制 ^生抹除或填⑽h、FFh方式清除原先儲存於該 19895 8 i33〇317 :’翏數資料儲存單元12的參數資料’再自該暫存單元 讀出儲存的參數資料，並重新寫人該參數資料儲存單元 12,且令該純管理㈣器η *對該參數㈣儲 12與該暫存單元13㈣參數資料長度大小及内容是否相 同’以破認該參數資料無誤。 請參閱第2圖並配合參考第！圖，第2圖係為 .之參數資料測試方法之流程示意圖，如圖所示’該參數資 =測試方法係應用於電腦裝置卜該電腦裝置！具有美二 營理控制器U、參數資料儲存單元12以及暫存單元， 該電腦裝置1執行本發明之參數資料測試方法包括 步驟： ^ 。首先於該步驟S1中，輪入一迴圈數值n，例如輸入 迴圈數值η為6 ’該迴圈數值n係用以增加測試的精確 度，可依精確度需求增減該迴圈數值η，接著進至步驟S2。 於該步驟S2中，判斷該迴圈數值η是否等於零，若 鲁是，則進至步驟S8 ;若否，則進至步驟S3。 於該步驟S3中，令該基板管理控制器u將儲存於該 .參數資料儲存單元12内之參數資料讀出，且將該所讀取^ 的參數資料儲存至該暫存單元13，接著進至步驟S4。 於該步驟S4中’令該基板管理控制器1丨以電性抹除 或填00h、FFh方式清除該參數資料儲存單元12内之參數 資料’接著進至步驟S5。 於該步驟S5中，令該基板管理控制器n自該暫存單 元13讀取該參數資料，並將該參數資料重新寫入該參數 19895 9 ^330317 資料儲存單元12，接著進至步驟如。 於該步驟S6中，令該基板管理 資料儲存單元11比對該參數 L 與該暫存早兀13内之表 及内容是否-致，並記錄比對的*果，=貝抖長度大小 為一致，則果亦即，若比對結果 '表不該參數貧料儲存 讀寫正確，且#蚌耵於麥數貧料的 為不對結果為正確；反之，若比對社果 :致’縣示該參數資料儲存單元^ 的讀寫錯誤，且守锑贫★ #本从田 、乡數貝料 S7〇 s己錄該比對結果為錯誤’接著進至步驟 於該步驟SH，遞朗迴圈數值n，”設定迴圈 =n:(迴圈數值H)’例如該迴圈數值。若， 於執仃该步驟S7後，即變A ，b π门止咖 俊I7又為5且返回步驟S2，直到該 、圈數值η等於零為止。 I二該步驟S8中，將比對後的結果予以顯示，並結束 、測忒私式。於本實施例中，所顯示的比對結果係例如正確 #，錯誤的比值’藉此可供測試者可參考該輸出的正確及錯 吳比值大小，作為該參數資料儲存單元1 2對於參數資料 的讀寫正確性之判斷。 在本實施例中，所輸入的迴圈數值η為6，測試程式 判斷。亥迴圈數值6是否等於零，若否，則該測試程式重複 執行步驟S2至S7,每當迴圈執行完一次，該迴圈數值η 則會遞減1，直到該迴圈數值η符合步驟S2之條件，則 執行步驟S8將比對後的正確及錯誤結果的比值輸出給測 試者知道並結束測試程式，且該迴圈數值則視測試者欲想 19895 10 而定’以確保該參數資 基板管理控制器的運;;寫^正確無誤，進而不會影響到 斷模式則依測試者的^ 而該迴圈數值n的迴圈判 、 的而求而有不同的實施方式，例如，可 ^二驟S1/步驟S2及步驟S7 (在此未^關示），具 來動：’ Γ:步驟S1中新增設定一參數值m，且設定該 ^ :令執仃步驟S3至S6後，將步驟S7改為遞 數值m’亦即設定該參數值m=(參數值㈣），且 耸〆乂驟S2改為判斷該參數值^與迴圈數值〇是否相 η若相等則進至步驟S8，若不相等則持續進行步驟幻 山、、’直到該參數值m與迴圈數值“目等為止，亦即， =迴圈判斷需求而有不同的設計方式，故在此不再詳細 因此，本發明之參數資料測試方法是利用測試程式對 :板s理控制裔（BMC )參數資料讀寫至參數資料儲存單 凡的正確性及穩定性進行測試，測試結束產生測試報告， 以=據5亥測試報告得知該基板管理控制器（跳）對該灸 數貝料儲存單元12的讀寫正確性及讀取穩定性。 上述之實施例僅為例示性說明本發明之特點及其功 j而非用於限制本發明之實質技術内容的範圍。任何熟 習此技藝之人士均可在不違背本發明之精神及範缚下對 上述實施例進行修飾與變化。因此，本發明之# 圍，應如後述之申請專利範圍所列。 呆4辄 【圖式簡單說明】 19895 11 1330317 .· 第1圖係為運作本發明之參數資料測試方法之系統 架構方塊示意圖；以及 第2圖係為本發明之參數資料測試方法之流程示意 圖。 【主要元件符號說明】 I 電腦裝置 II 基板管理控制器 12 參數資料儲存單元 • 13 暫存單元 S1〜S8 步驟 12 19895Replaceable Unit (FRU) 121 and SDR (Sensor Data Record) • The memory unit 122 is composed of the memory unit 122, and the temporary memory unit 丨3 can be an electrically erasable programmable read only memory (EEPR〇M). ) or memory such as flash memory (Flash RAM). The parameter data required for the operation of the substrate controller is stored in the data storage unit 12, so that the parameter data read and written by the parameter data storage unit 12 is completely correct in order to ensure that the substrate management controller 11 reads and writes Stable, so use a test program to test whether the required parameter data of the substrate management controller U to the parameter data storage unit 12 is correctly and stably tested, and use a temporary storage unit 13 to cooperate with the test, and the reading will be read out. > The number of materials is stored in the temporary storage unit 13 to ensure that the parameter data. Reading from the parameter storage unit 12 generates an error. The Bosch system causes the substrate f to control (4) 11 to transfer the parameter data stored in the reference material storage unit 12 to the temporary storage list. The storage space provided by the temporary storage unit 13 must be at least equal to the parameter (4). The size, or the temporary storage unit is provided for or greater than the parameter data of the parameter data storage unit 12, and the substrate management control is erased or filled (10)h, and the FFh mode is originally stored in the 19895 8 i33〇317: The parameter data of the parameter data storage unit 12 reads the stored parameter data from the temporary storage unit, and rewrites the parameter data storage unit 12, and causes the pure management (4) device η* to store the parameter (4). And the temporary storage unit 13 (four) parameter data length size and content is the same 'to confirm the parameter data is correct. Please refer to Figure 2 and with reference to the figure! Figure 2, is the flow chart of the parameter data test method, As shown in the figure, the parameter test method is applied to the computer device, the computer device, the U.S. management controller U, the parameter data storage unit 12, and the temporary storage unit. The parameter data testing method of the invention comprises the steps of: ^. Firstly, in the step S1, a circle value n is entered, for example, the input loop value η is 6', and the loop value n is used to increase the accuracy of the test. The loop value η is increased or decreased according to the accuracy requirement, and then proceeds to step S2. In the step S2, it is determined whether the loop value η is equal to zero, and if YES, the process proceeds to step S8; if not, the process proceeds to step S3, in the step S3, the substrate management controller u reads the parameter data stored in the parameter data storage unit 12, and stores the read parameter data into the temporary storage unit 13, Then, the process proceeds to step S4. In step S4, the substrate management controller 1 is caused to erase the parameter data in the parameter data storage unit 12 by electrically erasing or filling 00h and FFh. Then, the process proceeds to step S5. In the step S5, the substrate management controller n reads the parameter data from the temporary storage unit 13, and rewrites the parameter data into the parameter 19875 9^330317 data storage unit 12, and then proceeds to steps such as In the step S6, the substrate tube is made The data storage unit 11 compares the table L and the contents of the parameter L with the temporary storage 13 and records the result of the comparison, and the length of the comparison is the same, that is, if the comparison result 'The table does not store the correct reading and reading of the poor material, and #蚌耵在麦数低料 is not correct for the result; otherwise, if the comparison is fruitful: the county shows the reading and writing error of the parameter data storage unit ^ , and keep the poor ★ #本田,乡数贝料S7〇s has recorded the comparison result is wrong 'then proceed to the step SH, hand in the circle value n," set the loop = n: (Circle value H) 'For example, the loop value. If, after the step S7 is executed, the change A, the b π gate stop I7 is again 5 and the process returns to the step S2 until the circle value η is equal to zero. In the second step S8, the result of the comparison is displayed, and the private mode is ended. In this embodiment, the displayed comparison result is, for example, correct #, the wrong ratio 'by which the tester can refer to the correct and wrong Wu ratio of the output as the parameter data storage unit 1 2 for the parameter data. The judgment of the correctness of reading and writing. In the present embodiment, the input loop value η is 6, which is judged by the test program. Whether the value of the circle of the sea circle is equal to zero, if not, the test program repeatedly performs steps S2 to S7, and the loop value η is decremented by one every time the loop is executed, until the loop value η meets the step S2. If the condition is met, step S8 is executed to output the ratio of the correct and wrong results after the comparison to the tester to know and end the test program, and the loop value is determined according to the tester's desire to use 19895 10 to ensure the management of the parameter substrate. The operation of the controller;; write ^ correct, and thus will not affect the break mode, according to the tester's ^ and the loop value n of the loop judgment, and different implementations, for example, can ^ Step S1/Step S2 and Step S7 (not shown here), with the following action: ' Γ: Step S1 newly sets a parameter value m, and sets the ^: after performing steps S3 to S6, Step S7 is changed to the value m', that is, the parameter value m=(parameter value (4)) is set, and step S2 is changed to determine whether the parameter value ^ and the loop value 〇 are equal if the phase η is equal to the step S8. If it is not equal, continue the steps of the magic mountain, 'until the parameter value m and the circle value" That is, the = loop determines the demand and has different design methods, so it is not detailed here. Therefore, the parameter data test method of the present invention utilizes the test program pair: the board control state (BMC) parameter data Read and write to the correctness and stability of the parameter data storage unit for testing, and the test report is generated at the end of the test, so that the baseboard management controller (jump) is known to the moxibustion data storage unit 12 according to the 5H test report. </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> <RTIgt; The above embodiments are modified and changed without departing from the spirit and scope of the present invention. Therefore, the present invention should be as listed in the scope of the patent application described below. Stay 4辄 [Simple Description] 19895 11 1330317 . 1 is a block diagram of a system architecture for operating a parameter data test method of the present invention; and FIG. 2 is a flow chart showing a method for testing a parameter data of the present invention. REFERENCE SIGNS member I II computer means BMC parameter data storage unit 12 • 13 temporary storage unit S1~S8 step 1,219,895