TWI316605B - Passive test fixture, method of fabricating the same and test machine - Google Patents

Description

1316605 IX. Description of the invention: [Technical field to which the invention pertains] ‘Specially, the present invention relates to a test fixture, a test fixture manufacturing method, and a tester. The passive test fixture of the tester is provided with an elastic component member. [Prior technology] - generally have the need to reduce Lintai _ in the completion of the line, in order to determine ==: = conduction 'usually must be tested, after passing the test, ί tit f know the test fixture, is _ 容 饼 test The rule has a gambling _read _ (such as a frequency package or c #), and it is clear whether the signal line of the product can be normally turned on. Narrow traditional measuring surface can not increase the density of the probe _ measuring high-density to-be-measured point and the point to be measured: the production potential of 4, 'other-side, can not make the volume of the sputum fixture quite fine two = on the volume limit When the fixture is forced to be miniaturized, the relative cost of mold opening will also increase the cost. In order to solve this problem, Taiwan Patent No. 3 Difficult No. 0 and No. Milk No. disclose the improvement of the structure of the test fixture for circuit boards, and the Taiwan Patent No. 5 and No. 530945 propose a kind of fixture that can improve the job. After that, Taiwan specializes in 57221 〇娜--a test can be repeated. Fine, although the foregoing prior art is successful, the 4 fixture has the disadvantage of opening the mold or increasing the test density of the point to be tested, but it does not solve the problem of how to improve the probe density. Therefore, how to increase the density of the probes on the test fixtures, and to respond to the increasingly small trend of the multiple points of the industry, is an industry-critical problem. 6 1316605 SUMMARY OF THE INVENTION In order to solve the above problems of the prior art, the present invention provides a passive test fixture which can be used to test a plurality of signal inputs/outputs (Input/〇u_, such as an integrated circuit package, a semiconductor IC, etc. Then the production of the point, and Longlin hand debugging machine. Further said that this type of squad is equipped with a wealthy - upper domain, - lower plate device, multiple probes, a bottom plate device and elastic components. The upper plate device is stacked by the ghost between the multi-layer plate and the plate, and the pin-hole is pre-positioned at a plurality of dot positions corresponding to the object to be tested on the upper plate device. The needle is placed in a position with a through hole. In addition, a plurality of probes are disposed respectively, which are respectively accommodated in the pinholes of the upper plate device, and further each probe is provided with a -th-end point and a second end point, and having the second end thereof threaded into the through-hole towel of the lower plate device and the n-bottom device and the elastic member, the bottom plate device being disposed on the side of the lower plate device different from the upper plate device And the miscellaneous component is disposed between the lower plate device and the bottom plate device The steel object is placed on the upper plate device to be subjected to a plurality of probe buffers by the deflection displacement of the miscellaneous components. Therefore, the main object of the present invention is to provide a passive test fixture having an elastic component for lifting The configuration density of the test probe is tested. Another object of the present invention is to provide a passive test fixture having an elastic component, which is required for testing the pitch pitch and high wiring density. Another object of the present invention is to provide a method for manufacturing a passive test fixture having an elastic component for improving the configuration density of the test fixture probe. Another object of the present invention is to provide a passive test fixture having an elastic component. The method is required to test the distance between the object to be tested (Finepitch) and the high wiring density. .1316605 • Sexual component〗 5. The elastic component can be composed of a plurality of springs or a plurality of shrapnel. Of course, the flexural properties of the rubber can also be utilized as components of such an elastic component 15. In addition, the bottom plate device further There are a plurality of perforations 142 is set, also for the above-mentioned plurality of conductors 16 disposed through.

The gift of the Society; the gift of the Society, and the rights of the Society, and the scope of the invention are defined by the experts in the technical field of the present invention, which should be understood and implemented in the following patent scope: The equivalent changes or modifications completed should be included

13 -1316605 [Simplified description of the drawings] The first figure is a schematic diagram, which is a passive test fixture proposed by the present invention. The second figure is a schematic diagram showing a method for manufacturing a passive test fixture proposed by the present invention. The third figure is a schematic diagram of a test machine with a passive test fixture proposed by the present invention. [Main component symbol description]

Passive test fixture 10 Upper plate device 11 Pinhole 111 Copper column spacer block 112 Lower plate device 12 Through hole 121 Lower plate device bottom recess 122 Probe 13 First end point 131 Second end point 132 Base plate device 14 Base plate device top Recessed hole 141 Perforation 142 Elastic component 15 Conductor 16 Upper end point 161 Guide element 162 Test machine 30

Claims (1)

1316605 ί舞石月修 (more) 正本10, the scope of application for patents: 1. - Passive test miscellaneous, used to test the object with a plurality of points to be tested, the signal is transmitted to the test machine, the passive test fixture includes The upper plate device is formed by stacking at least three pieces of plate and the copper column spacer between the plates, and the upper plate device is provided with pinholes corresponding to the plurality of points to be tested of the object to be tested; Corresponding to the pinhole position of the upper plate device, a through hole is pre-positioned; a plurality of probes, each probe is integrally formed and formed into a single-piece probe, respectively, is received in the pinhole of the upper plate device Each of the probes is provided with a first end point and a second end point, the second end of the second end is inserted into the through hole of the lower plate device; and a bottom plate device is disposed on the lower plate device different from the upper plate a side of the device; and an elastic component disposed between the lower plate device and the bottom plate device, whereby when the object to be tested is placed under pressure of the upper plate device, the flexural displacement of the elastic member is given The plurality of probes are buffered. 2. According to the towel, please refer to the 15th item. The H step contains a plurality of wire valleys (4) lower plate|set, each __ wire has an upper end point, and the upper end point is electrically connected to The second end of the probe. Φ 3' according to the passive test fixture of claim 2, wherein the lead is electrically connected to the end point - a guiding member having a recess for guiding the second end of the probe . 4. According to the middle of the article, the third aspect of the passive view fixture is designed. The electrical connection between the end point of the wire and the guiding element is welded. 5. According to the towel 4, the pass-through device is a vertical through hole. 6. The passive test fixture of claim 1, wherein the through hole of the lower plate device has an inclined angle. 7. The passive test fixture of claim 1, wherein the pinhole of the upper plate device is a vertical through hole. 15 1316605 8. The passive test fixture of claim 1, wherein the pinhole of the upper plate device has an oblique angle. 9. The passive test fixture of claim 1, wherein the plate hole of the upper plate device is concentric. 10. The passive test fixture of claim 1, wherein the plate pinhole of the upper plate device has an offset setting. 11. The passive test fixture of claim 1, wherein the plate pinholes of the upper plate device have the same aperture. 12. The passive test fixture of claim 1, wherein the plate pinhole of the upper plate device has a pinhole aperture that is closer to the lower plate device than the plate pinhole aperture away from the lower plate device. 13. The passive test fixture of claim 1, wherein the plate pinhole of the upper plate device has a pinhole aperture that is closer to the lower plate device than the plate pinhole aperture away from the lower plate device. 14. The passive test fixture of claim 1, wherein the object to be tested is selected from the group consisting of a printed circuit board bare board, a printed circuit board to which an electrical component has been bonded, a semiconductor component, and a wafer. 15. The passive test fixture of claim 1, wherein the lower plate device is provided with a plurality of recessed holes for automatically guiding and positioning the elastic component. 16. The passive test fixture of claim 2, wherein the bottom plate device is provided with a plurality of recessed holes for automatically positioning the elastic component. 17. The passive test fixture of claim 3, wherein the elastic component is a plurality of springs. 18. A passive test fixture according to the scope of the patent application, wherein the elastic component is a plurality of elastic pieces. 19. The passive test fixture of claim 1, wherein the elastic component is 1316605 rubber. 20. The passive test fixture of claim 3, wherein the bottom plate device further provides a plurality of perforations for the plurality of wires to pass through. 21. A passive test fixture manufacturing method, comprising: providing - an upper plate device is formed by stacking at least two sheets of sheet metal and a copper column of a plate, the upper plate device corresponding to the plurality of objects to be tested a pinhole is pre-positioned at a position to be measured; a lower plate device is provided, and a through hole is pre-positioned corresponding to a pinhole position of the upper plate device; Providing a plurality of probes, each probe is integrally formed into a single-piece probe, which is respectively received in a pinhole of the upper plate device, and each probe is provided with a first end point and a second end An end point, the second end is inserted into the through hole of the lower plate device; a bottom plate device is disposed, the lower plate device is disposed on a side of the upper plate device; and the providing-elastic component is disposed under the Between the plate device and the bottom plate device, thereby, when the object to be tested is buffered by the deflection bit probe of the Yulin's borrowing component. '•Double-like connection to the second end of the probe 22. According to the method for manufacturing a passive test fixture according to claim 21 of the patent application, a person having a plurality of wires is accommodated in the τ plate device Each wire is provided with up-turning, the upper end is ^3 electric 3 23. 雠 _ material __ 22 readings and picking &gt; rhyme making branches on the end of the step - step electrical connection - with a concave portion of the guiding element The probe is connected to the end point. 24. According to the method for manufacturing a passive test fixture according to claim 23, the electrical connection between the political end point and the guiding member is soldering. The through hole of the wire </ RTI> in which the lower plate </ RTI> the lower plate 25 is in accordance with the scope of the patent application is a vertical through hole. 26. Passive test fixture manufacturing method according to the scope of the patent application The through hole of the device has an inclined angle. / 17 1316605 27. The passive test fixture manufacturing method according to claim 21, wherein the pinhole of the upper plate device is a vertical through hole. 28. Passive test according to claim 21 of the patent application scope The jig manufacturing method, wherein the pinhole of the upper plate device has an inclined angle. The method of manufacturing a passive test fixture according to claim 21, wherein the plate hole of the upper plate device is concentric. The method of manufacturing a passive test fixture according to claim 21, wherein the plate pinhole of the upper plate device has an offset setting. The method of manufacturing a passive test fixture according to claim 21, wherein the plate hole of the upper plate has the same aperture. The method for manufacturing a passive test fixture according to claim 21, wherein the pinhole of the plate of the upper plate device is close to the pinhole of the plate of the lower plate device is slightly smaller than the hole diameter of the plate hole away from the lower plate device. . The method for manufacturing a passive test fixture according to claim 21, wherein the pinhole of the plate of the upper plate device is close to the pinhole of the plate of the lower plate device is slightly larger than the hole diameter of the plate hole away from the lower plate device. . The method for manufacturing a passive test fixture according to claim 21, wherein the object to be tested is selected from the group consisting of a bare printed circuit board, a printed circuit board of a component, a semiconductor component, and a wafer. Any one. The passive test fixture manufacturing method according to claim 21, wherein the bottom of the lower plate device is provided with a plurality of concave holes for automatically guiding and positioning the elastic component. 36. The method of manufacturing a passive work tool according to claim 21, wherein the bottom of the bottom plate device is provided with a plurality of concave holes for automatically guiding and positioning the elastic component. 37. The passive test fixture manufacturing method according to claim 21, wherein the elastic component is a plurality of springs. 38. The passive test fixture manufacturing method according to claim 21, wherein the elastic 1316605 component is a plurality of elastic pieces. 39. A method of making a passive test fixture according to claim 21, wherein the elastic component is rubber. 4. The passive test fixture manufacturing method according to claim 21, wherein the bottom plate device further comprises a plurality of perforations for a plurality of wires to pass through. 41. A test machine for testing at least one passive test fixture to test a test object having a plurality of points to be tested, wherein the passive test fixture comprises: an upper plate device comprising at least three pieces a copper column spacer between the plate and the plate is stacked, the upper plate device is provided with a pinhole corresponding to a plurality of points to be tested of the object to be tested; a lower plate device corresponding to the pinhole position of the upper plate device a plurality of through-holes are provided; a plurality of probes are formed by integrally forming a single-piece probe, which are respectively received in pinholes of the upper plate device, and each probe is provided with a first end a second end point, the first end point is inserted into the through hole of the lower plate device; a bottom plate device disposed on the side of the lower plate device different from the upper plate device; The upper plate device is subjected to the measurement of the cake, and the buffer is repeatedly buffered by the components. The electrical connection is soldering. 45. Test machine through-hole according to item 41 of the patent application. The through hole of the lower plate device is a vertical angle. The test machine according to claim 41, wherein the through hole of the lower plate device has an inclined angle. 47. The test machine of claim 41, wherein the pinhole of the upper plate device is a vertical through hole. 48. The test machine of claim 41, wherein the pinhole of the upper plate device has an oblique angle. 49. The test machine of claim 41, wherein the plate pinholes of the upper plate device are concentric. The test machine according to claim 41, wherein the plate pinhole of the upper plate device has an offset setting. 51. The test machine of claim 41, wherein the plate pinhole of the upper plate device has the same aperture. 52. The testing machine of claim 41, wherein the plate pinhole of the upper plate device is adjacent to the lower plate device and the pinhole aperture of the plate is slightly smaller than the pinhole aperture of the plate away from the lower plate device. 53. The testing machine of claim 41, wherein the plate pinhole of the upper plate device is adjacent to the lower plate device and the pinhole aperture of the plate is slightly larger than the pinhole aperture of the plate away from the lower plate device. The testing machine of claim 41, wherein the object to be tested is selected from the group consisting of a bare printed circuit board, a printed circuit board to which an electrical component has been bonded, a semiconductor component, and a wafer. 55. The testing machine of claim 41, wherein the bottom of the lower plate device is provided with a plurality of recessed holes for automatically guiding and positioning the elastic component. The testing machine of claim 41, wherein the bottom of the bottom plate device is provided with a plurality of recessed holes for automatically guiding and positioning the elastic component. 57. The test machine of claim 41, wherein the elastic component is a plurality of springs. 58. The test machine of claim 41, wherein the elastic component is a plurality of elastics. The test machine of claim 41, wherein the elastic component is rubber. 60. The test machine of claim 41, wherein the bottom plate device is further provided with a plurality of perforations for a plurality of wires to be threaded through. twenty one