TWI312415B - An examining apparauts for a component - Google Patents

An examining apparauts for a component Download PDF

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Publication number
TWI312415B
TWI312415B TW95148718A TW95148718A TWI312415B TW I312415 B TWI312415 B TW I312415B TW 95148718 A TW95148718 A TW 95148718A TW 95148718 A TW95148718 A TW 95148718A TW I312415 B TWI312415 B TW I312415B
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Taiwan
Prior art keywords
unit
detecting
component
conveying
image capturing
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TW95148718A
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Chinese (zh)
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TW200827705A (en
Inventor
Yi-Hong Lin
Chun-Hsia Hsu
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Nat Pingtung University Of Science & Technolog
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  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Geophysics And Detection Of Objects (AREA)

Description

1312415 九、發明說明: 【發明所屬之技術領域】 本發明係關於一種螺固元件之檢測裝置,特別是關於 利用一光源模組及數個反射單元反射一待測元件之一通孔 内部及二端面之完整影像,以檢測該待測元件之表面瑕疵 之螺固元件之檢測裝置。 【先前技術】1312415 IX. Description of the Invention: [Technical Field] The present invention relates to a detecting device for a screw-solid component, and more particularly to reflecting a inside and a second end of a through-hole of a device to be tested by using a light source module and a plurality of reflecting units A complete image to detect the screwing element of the surface of the component to be tested. [Prior Art]

習用螺固元件之檢測裝置,如中華民國公告第 M299294號「螺帽篩選機」新型專利,其包含一螺帽輸送 機、一檢測輸送機、一内外徑檢測裝置、一螺紋檢測裝置 、一排料裝置及一儲存台。該螺帽輸送機及檢測輸送機分 別設有二導片及一輸送帶,該二導片及輸送帶係共同形成 一輸送執道,該螺帽輸送機選擇與該檢測輸送機形成一傾 斜角度,且該檢測輸送機之輸送軌道係銜接於該螺帽輸送 機之輸送軌道的後端,以便將一待測元件自該螺帽輸送機 導引及輸送至該檢測輸送機。 該檢測輸送機設有一第一調整座及一第二調整座,該 内外徑檢測裝置對應設置於該第一調整座上方,該螺紋檢 測裝置則對應設置於該第二調整座上方,且該内外徑檢測 裝置及螺紋檢測裝置分別設有一影像感測器及一光源產生 器。該排料裝置之一端係對應設置於該第一調整座或第二 調整座之後序部位,其另一端則連接該儲存台,以便將該 待測元件排離該檢測輸送機。 當習用螺固元件之檢測裝置進行檢測動作時,首先利A detection device for a conventional screw-solid component, such as the new patent of the "nut-screening machine" of the Republic of China Announcement No. M299294, which comprises a nut conveyor, a detecting conveyor, an inner and outer diameter detecting device, a thread detecting device, and a row Material device and a storage table. The nut conveyor and the detecting conveyor are respectively provided with two guiding pieces and a conveying belt, and the two guiding pieces and the conveying belt system jointly form a conveying way, and the nut conveying machine selects to form an inclined angle with the detecting conveyor. And the conveying rail of the detecting conveyor is coupled to the rear end of the conveying rail of the nut conveyor to guide and convey a component to be tested from the nut conveyor to the detecting conveyor. The detecting conveyor is provided with a first adjusting seat and a second adjusting seat. The inner and outer diameter detecting devices are correspondingly disposed above the first adjusting seat, and the thread detecting device is correspondingly disposed above the second adjusting seat, and the inner and outer portions are respectively arranged inside and outside The diameter detecting device and the thread detecting device are respectively provided with an image sensor and a light source generator. One end of the discharging device is disposed corresponding to the rear portion of the first adjusting seat or the second adjusting seat, and the other end is connected to the storage table to discharge the device to be tested from the detecting conveyor. When the detecting device of the screw-solid element performs the detecting action, the first advantage

Ιι·,(Π·Ι Ltnilir.rk iloc —6 — (ΙΓ,. !.··* n [| AU 1312415 震動方式將該待測元件依序排列至該螺帽 輸送軌道送;該待測元件係經由該螺帽輸送機之 應通過錢剛輸;機。當該待測元件對 外徑檢剛裝置或螺紋檢測裝置二=二,整台時’該内 在該待剛元件上,該 ς生讀、投射一光源 像感測器相對位於該翁置或螺紋檢測裝置之影 ,並以傾斜方Γ產生斋之另—侧以取得充足光源 ,以進-步檢射待:j7L件之通孔影像及内外徑尺寸 -妒而 件之觀完整度及尺寸正確性。 外徑檢測裝置或螺紋檢職置之,例如.由於該内 r、 咬之完整性,糾ϋ 卩分觀影像,以判別螺 生;吳差H1取影像會因傾斜拍攝角度不同而產 生決呈〜成热法使用該影像進行檢測。另外,該 檢測裝置賴域姆置之影像感咖魏_待測元; 之其中-端面進行檢測,而無法檢_待測元件之另1山 面’造成制品質域。基於上述相,有必要進—步= 良上述習用螺固元件之檢測裝置。 有鑑於此’本發明改良上述之缺點,其係藉由在—夺 像掘取單元及-發光元件之間設置—反射單元,同時利用 -輸送單元使-待;収件it過該發光元件麟反射元件之 間’以便該影像#|取單元直接取得該待測元件之其中—端 面的影像,及間接自該反射單元取得該待測元件之通孔: 部的螺紋影像,以進行檢測動作。藉此,避免傾斜角度的 ϋ vOl-l Uml.,vPK Pi.f !,l:t02.u- die 1312415Ιι·,(Π·Ι Ltnilir.rk iloc —6 — (ΙΓ,. !.··* n [| AU 1312415 vibration mode arranges the components to be tested in sequence to the nut transport track; the component to be tested Passing through the nut conveyor, the machine should pass through the machine; when the component to be tested is on the outer diameter detecting device or the thread detecting device 2=two, the whole unit is 'inside the inner member, the twin reading Projecting a light source image sensor relative to the shadow or the thread detecting device, and generating the sufficient light source by tilting the square to obtain a sufficient light source to further detect the through hole image of the j7L piece. And the inner and outer diameter dimensions - the integrity and dimensional correctness of the piece. The outer diameter detecting device or the thread inspection position, for example, due to the integrity of the inner r, bite, ϋ 卩 卩 影像 image, to determine the snail Health; Wu difference H1 image will be produced due to the different angles of tilting shooting ~ use the image to detect the heat method. In addition, the detection device Lai Mim set the image sense Wei Wei _ to be tested; Detecting, but unable to check _ another hill surface of the component to be tested 'causes the product quality domain. Based on the above In view of the above, the present invention improves the above-mentioned disadvantages by providing a reflection unit between the image capturing unit and the light emitting element. Simultaneously using the -transporting unit to make a standby; the receiving unit passes between the light-emitting elements and the reflective element between the light-emitting elements, so that the image-taking unit directly obtains an image of the end surface of the detecting element, and indirectly obtains the image from the reflecting unit. Through hole of the component to be tested: Thread image of the part for detecting action. Thereby, avoiding the tilt angle ϋ vOl-l Uml., vPK Pi.f !, l:t02.u- die 1312415

不同而減低影像尺寸之誤差,進而提升整體檢測精確性及 品質。 【發明内容】 本發明之主要目的係提供一種螺固元件之檢測裝置 ,其係藉由在一影像擷取單元及一發光元件之間設置一反 射單元,同時利用一輸送單元使一待測元件通過該發光元 件與該反射元件之間,以進行檢測動作,使得本發明具有 提升檢測精確性之功效。 本發明之次要目的係提供一種螺固元件之檢測裝置 ,其係分別設有一第一輸送單元及一第二輸送單元,該第 二輸送單元與該第一輸送單元留有一檢測間隙,以供一影 像擷取單元擷取一待測元件的端面影像,使得本發明具有 提升檢測完整性之功效。 根據本發明之螺固元件之檢測裝置,其包含二輸送單 元及二檢測組件。該輸送單元分別設有一輸送軌道,且其 中一輸送單元設有一檢測孔。該二輸送單元分別對應傾斜 設置於一基座之二端,該其中一輸送單元與該另一輸送單 元之間留有一檢測間隙及一高度差。藉由在該其中一檢測 組件之一影像擷取單元與一待測元件之間設置一反射單元 ,以便當該待測元件通過該檢測孔時擷取該待測元件之内 螺紋及一端面影像;同時利用該另一檢測組件之影像擷取 單元在該待測元件通過該檢測間隙時取該待測元件之另 一端面的影像,以提升檢測的精確度及完整性。 【實施方式】Differently, the error of image size is reduced, thereby improving the overall detection accuracy and quality. SUMMARY OF THE INVENTION The main object of the present invention is to provide a detecting device for a screw-solid component, which is provided with a reflecting unit between an image capturing unit and a light-emitting element, and simultaneously uses a conveying unit to make a component to be tested. The detection operation is performed between the light-emitting element and the reflective element, so that the present invention has the effect of improving the detection accuracy. A secondary object of the present invention is to provide a detecting device for a screw-solid component, which is respectively provided with a first conveying unit and a second conveying unit, and the second conveying unit and the first conveying unit leave a detection gap for An image capturing unit captures an end image of a component to be tested, so that the invention has the effect of improving detection integrity. A detecting device for a screw-solid element according to the present invention comprises two conveying units and two detecting assemblies. The conveying unit is respectively provided with a conveying rail, and one of the conveying units is provided with a detecting hole. The two conveying units are respectively disposed obliquely on the two ends of a base, and a detecting gap and a height difference are left between the one conveying unit and the other conveying unit. Providing a reflection unit between the image capturing unit and the device under test in one of the detecting components, so as to capture the internal thread and the end face image of the device to be tested when the device to be tested passes through the detecting hole At the same time, the image capturing unit of the other detecting component takes an image of the other end surface of the detecting component when the detecting component passes the detecting gap to improve the accuracy and integrity of the detecting. [Embodiment]

—8 一 卟.US. 11 :11 W 1312415 為讓本《明之上核其他目的、特徵及優點能更明 f重’下文特舉本發明之較佳實施例,並配合所附圖式Ϊ 作詳細說明如下: 件之檢測裝㈣包含-基座i、—第—輸送單元2、_:= 輸运早几3、一第一檢測組件4及一第二檢 座〗設有二固定架u、—第一調整座12及一二= 13。嗜筮一鈐1 乐一5周整座 於該固定加iTt 70 ^第二輸送單元3係可調整的設置 ' 木 ,且该第—輸送單元2及第二輸送單元3 2對水平方向傾斜—適當角度,以便-待測元件9藉由重 力下滑移動。另外,該第_輸送單元2與該第二輸送單元 ,間留有-檢測間隙a,且其二者之間具有—適當高 息。亥第-调整座12及第二調整座13係用以分別承二 -檢測組件4及第二檢測組件5,並調整該第_檢⑽且^ 及第二=組件5與-待測⑽9間之檢測角度與距 该:-檢測組件4及第二檢測組件5係分 一輸送單元2與該第二輸送單 又於。亥弟 測元件9之不同端面的景^之™1WX_該待 請再錢第i及2 _示,本發龍佳實施例 輪运早7C 2設有-底板21及二導引片22,該導引片 ,應設置於該底板21上,以共同形成-輸送軌道23。^ ^軌道23之寬度較佳略等於該待測元件9之外押: 輸送該待測元件9通過該第—檢測:便 5。該輪送軌道23之-端係形成-一 .ΠΙ-Ι (ιιιΛι·.η m >hn .« 1312415 231之寬度係逐漸縮減至相同於該輸送軌道23之寬度,並 ^ 與該輸送軌道23相連通,以藉由該擴徑部231容置該大量 ' 之待測元件9。另外,在鄰近該擴徑部231之輸送軌道23 的一侧設置一震動盤〔未繪示〕,以輔助推進該待測元件 9。再者,該底板21開設有一檢測孔211,其寬度較佳略 小於該待測元件9之外徑,以避免該待測元件9自該檢測 孔211掉離該第一輸送單元2。 請再參照第1及2圖所示,本發明較佳實施例之第二 • 輸送單元3設有一底板31及二導引片32,該導引片32係 對應設置於該底板31上,以共同形成一輸送軌道33。該 輸送執道33之寬度較佳略等於該待測元件9之外徑,以便 輸送該待測元件9通過該第一檢測組件4及第二檢測組件 5。該輸送軌道33靠近該第一輸送單元2之一端係形成一 擴徑部331,其用以提供該待測元件9 一較大之輸送空間 。該擴徑部331之寬度逐漸縮減至相同於該輸送軌道33 之寬度,並與該輸送執道33相連通。該輸送執道33之末 ® 端則連通一排料單元〔未繪示〕,以輸送該待測元件9進 入該排料早元置放儲存。 請再參照第1及2圖所示,本發明較佳實施例之第一 檢測組件4設有一第一影像擷取單元41、一第一發光元件 42、一反射單元43及一第一感應開關44。該第一影像擷 取單元41與該第一發光元件42係分別對應設置於該檢測 . 孔211之二側,該反射單元43對應設置於該第一影像擷取 單元41與該第一輸送單元2之間。該反射單元43較佳係 一 10 —- 1312415 由數個反射鏡面構成。該弟—感應開關44較佳係選自一紅 外線感應裝置,其具有,開啟端441及一關閉端442,該 開啟端441對應設於該檢測孔211靠近該擴徑部231的一 端’而該關閉端442則對應設於該檢測孔211之另一端, 其用以控制該第一影像擷取單元41及第一發光元件42之 開啟及關閉動作。 請再參照第1及2圖所示,本發明較佳實施例之第二 檢測組件5設有一第二影像擷取單元51、一第二發光元件 52及一第二感應開關53,該第二影像擷取單元51與該第 一發光元件52係設置於該檢測間隙a之同一侧。該第二感 應開關53較佳係選自一紅外線感應装置,其具有一開啟端 531及一關閉端532,該開啟端531對應設於該檢測間隙a p之一端,且位於該第一輸送單元2上;該關閉端532則對 應設於該檢測間隙a之另一端,且位於該第二輸送單元3 上,该第二感應開關53用以控制該第二影像擷取單元51 及第一發光元件52之開啟及關閉動作。 另外,該第—影像擷取單元41.及第二影像擷取單元 42較佳係逛自感光耦合元件型〔Charge c〇邱丨“ Device, CCD〕或補充性氧化金屬半導體型〔町- 8 卟.US. 11:11 W 1312415 In order to make the other objects, features and advantages of the present invention clearer, the following is a preferred embodiment of the present invention, and with reference to the drawings The detailed description is as follows: The test device (4) includes - the base i, the first - the transport unit 2, the _: = the transport 3, the first test assembly 4 and the second check seat are provided with two mounts u - the first adjustment seat 12 and one two = 13.筮一筮1 乐一五周全在在固定固定ITt 70 ^第二输送单元3 is an adjustable setting '木, and the first-conveying unit 2 and the second conveying unit 3 2 are inclined to the horizontal direction- The angle is appropriate so that the component to be tested 9 is moved downward by gravity. In addition, a -detection gap a is left between the first transport unit 2 and the second transport unit, and there is an appropriate high interest rate therebetween. The Haidi-adjusting seat 12 and the second adjusting seat 13 are respectively configured to respectively carry the second detecting component 4 and the second detecting component 5, and adjust the first detecting (10) and the second=component 5 and the to-be-tested (10) 9 The detection angle and the distance: the detecting component 4 and the second detecting component 5 are divided into a conveying unit 2 and the second conveying sheet. The different end faces of Haidi's measuring component 9 are TM1WX_ The waiting for the money is i and 2 _, the hairpin embodiment of the present invention is provided with a bottom plate 21 and two guiding pieces 22, The guide sheets should be disposed on the bottom plate 21 to collectively form a transport track 23. ^ ^ The width of the track 23 is preferably slightly equal to the outside of the device under test 9: The component to be tested 9 is transported through the first detection: 5. The end of the wheel track 23 is formed - a. ΠΙ - Ι (ιιιΛι·. η m > hn . « 1312415 231 width is gradually reduced to the same width as the transport track 23, and ^ with the transport track 23 is connected to receive the large number of the components to be tested 9 by the enlarged diameter portion 231. Further, a vibrating plate (not shown) is disposed on a side of the conveying track 23 adjacent to the enlarged diameter portion 231 to The bottom plate 21 is provided with a detection hole 211. The width of the bottom plate 21 is preferably smaller than the outer diameter of the component to be tested 9 to prevent the component to be tested 9 from falling off the detection hole 211. The first transport unit 2. Referring to the first and second embodiments, the second transport unit 3 of the preferred embodiment of the present invention is provided with a bottom plate 31 and two guiding pieces 32, and the guiding piece 32 is correspondingly disposed on The bottom plate 31 is formed to form a conveying rail 33. The width of the conveying lane 33 is preferably slightly equal to the outer diameter of the component to be tested 9 for conveying the component to be tested 9 through the first detecting component 4 and the second a detecting component 5. The conveying rail 33 forms an enlarged diameter portion 331 near one end of the first conveying unit 2, A larger conveying space is provided for the component to be tested 9. The width of the enlarged diameter portion 331 is gradually reduced to the same width as the conveying rail 33, and communicates with the conveying lane 33. The conveying lane 33 The last end is connected to a discharge unit (not shown) for conveying the element to be tested 9 into the discharge and storing it in the early stage. Referring to Figures 1 and 2, the preferred embodiment of the present invention The first detecting component 4 is provided with a first image capturing unit 41, a first light emitting component 42, a reflecting unit 43, and a first sensing switch 44. The first image capturing unit 41 and the first light emitting component 42 are The reflection unit 43 is disposed between the first image capturing unit 41 and the first conveying unit 2. The reflecting unit 43 is preferably a 10-1312415. The inductive switch 44 is preferably selected from an infrared sensing device, and has an opening end 441 and a closing end 442. The opening end 441 is correspondingly disposed on the detecting hole 211 adjacent to the expanding diameter. One end of the portion 231' and the closed end 442 are correspondingly provided The other end of the detecting hole 211 is configured to control the opening and closing operations of the first image capturing unit 41 and the first light emitting element 42. Referring to Figures 1 and 2, the preferred embodiment of the present invention The second detecting component 5 is provided with a second image capturing unit 51, a second light emitting component 52, and a second sensing switch 53. The second image capturing unit 51 and the first light emitting component 52 are disposed in the detecting gap. The second inductive switch 53 is preferably selected from an infrared sensing device, and has an opening end 531 and a closing end 532. The opening end 531 is correspondingly disposed at one end of the detecting gap ap, and is located at the same end. The second inductive switch 53 is configured to control the second image capturing unit 51. The second inductive switch 53 is configured to control the second image capturing unit 51. The second inductive switch 53 is configured to control the second image capturing unit 51. And opening and closing operations of the first light-emitting element 52. In addition, the first image capturing unit 41. and the second image capturing unit 42 are preferably stored in a photosensitive coupling element type (Charge c〇 Qiuyi “Device, CCD” or a supplementary oxidized metal semiconductor type [machi

Metal-CMde SemiC〇nductor,CM〇s〕之數位影像擷取元件Digital image capture component of Metal-CMde SemiC〇nductor, CM〇s]

。該第一發光元件41及第二發光元件42較佳選自一發光 二極體〔LED〕。 X 請茶照第2至4圖所示,當本發明較佳實施例用於檢 測該待測元件9時,首先將該待測元件9堆置於該第一輸 11 — 1312415 送單兀2之擴徑部231上,並啟動該震動盤,以便該待測 元件9藉由震動及重力平穩的自該擴徑部231對應進入該 輸廷執道23内。該待測元件9經由該輸送軌道23通過該 第一感應開關44之開啟端441後,係快速啟動該第一影像 揭取單元41及第-發光元件42。當該待測元件9恰對應 位於該檢測孔211上時’該第一發光元件42投射一光源於. The first light-emitting element 41 and the second light-emitting element 42 are preferably selected from a light-emitting diode (LED). X Please refer to the photo of Figures 2 to 4, when the preferred embodiment of the present invention is used to detect the component to be tested 9, first stack the component to be tested 9 in the first input 11-1312415 The vibrating plate is activated on the enlarged diameter portion 231, so that the element to be tested 9 smoothly enters the channel 23 from the enlarged diameter portion 231 by vibration and gravity. After the device under test 9 passes through the opening end 441 of the first inductive switch 44 via the transport track 23, the first image extracting unit 41 and the first light emitting element 42 are quickly activated. When the device under test 9 is located on the detection hole 211, the first light-emitting element 42 projects a light source.

。亥待測元件9上,以便該光源部分通過該待測元件9之通 孔〔未標示〕,使該第一影像擷取單元41取得充足之光源 。同%,该另一部份之光源則經由該待測元件9之通孔的 喊面反射至該反射單元43 ±,以便利用該反射單元43 將該待測it件9之通孔_紋影像傳遞至該第—影像操取 單元41内。藉此’該第—影像擷取單元41可清楚的取得 該待測元件9之内職及頂面的影像〔如第4圖所示〕。 言月再參照第2至4圖所示,完成上述影像揭取動作後 T待測元件9係、經由該輸送執道23通過該第一感應開關 之關閉端442,以關閉該第一影像操取單元4ι及第一發 光元件42。接著,該待測元件9係經由該輸送軌道^ ^ 過感應開關53之開啟端531,並啟動該第二影像操 外早 弟—發光兀件52。由於該第一輸送單元2盥 早兀3留有該檢測間隙a,且其二者間具有該適 測元件9通過該檢測_時係處於 二該第二發光林52投射—光源於該待 便該光源部分反射至該第二影像揭取 早兀51内,叫提供該第二影_取單元η取得充足之 1312415 光源。 最後,請再參照第2至4 過該第二感應開闕53之闕藉由該待剛元件9 影像擷取單元51及第二發光元件52,=進而關閉該第二 之輸道=亦導_寺測元件9進入=&輸送單元3 存。藉此,該第二影像擷取單元^ 早兀置砍儲 件,之底面的端面影像,配合上述取取:該,元 该待測兀件9之頂、底面是5^ °同日寸檢剛 否完整,故本發明確實可有’及其内螺软是 如上所述’相較於制螺固元件之 ^ 方式自-待測元件之通孔内部 p J用鴻斜 對-待測元件之紋象’且僅能 l! 提升檢測精確度及品質等缺點。 ^致,心务有致 該第-影像擷取單元:二:3^ 及¥ ♦先兀件42之間設置該反 射早 叫錯由該第—輸送單W輸送該待測元件9 通過該第-發光Tt件42與該第-反射耕41之間,以掏 取該待測元件9之-端面及内螺紋之影像,再利用第二影 像擷取單元51及第二發光元件52擷取該待測元件9之另 而面的衫像,以進行檢測動作。藉此,本發明確實可有 效提升檢測品質及精確度。 雖然本發明已利用上述較佳實施例揭示,然其並非用 以限定本發明,任何熟習此技藝者在不脫離本發明之精神 和範圍之内,相對上述實施例進行各種更動與修改仍屬本 發明所保護之技術範疇,因此本發明之保護範圍當視後附. The first image capturing unit 41 obtains a sufficient light source by passing the light source portion through the through hole (not shown) of the element to be tested 9. In the same portion, the light source of the other portion is reflected to the reflecting unit 43± via the shouting surface of the through hole of the device to be tested 9, so as to use the reflecting unit 43 to image the through hole image of the workpiece 9 to be tested. It is transmitted to the first image capturing unit 41. Thereby, the first image capturing unit 41 can clearly obtain the image of the inner and top surfaces of the device under test 9 (as shown in Fig. 4). Referring to FIGS. 2 to 4 again, after the image removal operation is completed, the T device 9 to be tested passes through the delivery end 23 through the closing end 442 of the first inductive switch to close the first image. The unit 4i and the first light-emitting element 42 are taken. Then, the device under test 9 passes through the opening end 531 of the sensing switch 53 via the transport track, and activates the second image-external-light-emitting element 52. Since the first transport unit 2 has the detection gap a, and the test element 9 passes between the two detections, the second light-emitting forest 52 projects. The light source is partially reflected into the second image-receiving early 51, and the second image-taking unit η is provided to obtain a sufficient 1312415 light source. Finally, please refer to the second inductive opening 53 after referring to the second to fourth openings. The image capturing unit 51 and the second light emitting element 52 are further closed by the to-be-rigid element 9 and then the second channel is turned off. The _ Temple measuring element 9 enters the =& transport unit 3. Thereby, the second image capturing unit ^ preliminarily cuts the storage device, and the end face image of the bottom surface is matched with the above-mentioned extraction: the top and bottom surfaces of the element 9 to be tested are 5^° on the same day. Whether it is complete or not, the present invention may indeed have 'and its inner screw is as described above' compared to the method of manufacturing the screw-solid element. From the inside of the through-hole of the element to be tested, the j-pair is diagonally-to-be-tested. The image is 'and can only l! Improve the detection accuracy and quality and other shortcomings. ^致, the mind has the first - image capturing unit: two: 3^ and ¥ ♦ the first element 42 is set between the reflection and the early warning is sent by the first conveying sheet W to the element to be tested 9 through the first Between the illuminating Tt member 42 and the first reflecting cultivating 41, the image of the end face and the internal thread of the device under test 9 is captured, and the second image capturing unit 51 and the second illuminating component 52 are used to capture the image. The other side of the component 9 is tested for the detection action. Thereby, the present invention can effectively improve the quality and accuracy of detection. While the invention has been described in connection with the preferred embodiments described above, it is not intended to limit the scope of the invention. The technical scope of the invention is protected, and therefore the scope of protection of the present invention is attached

13 «. Ί.1 ΧΊΙ.Π HS 1312415 之申請專利範圍所界定者為準。13 «. Ί.1 ΧΊΙ.Π The definition of the patent scope of HS 1312415 shall prevail.

Ιΐ!·,(1,ι'ί'Κ Γηι !·Κ1ΓΙ'2.Τ2 rinc 14 •ill I ' --Η 1312415 【圖式簡單說明】 • 第1圖:本發明較佳實施例之螺固元件之檢測裝置之組 ' 合側視圖。 第2圖:本發明較佳實施例之螺固元件之檢測裝置之組 合上視圖。 第3圖:本發明較佳實施例之螺固元件之檢測裝置進行 待測元件檢測動作之示意圖。 第4圖:本發明較佳實施例之第一影像擷取單元所擷取 ® 之影像之示意圖。 【主要元件符號說明】 1 基座 11 固定架 12 第一調整座 13 第二調整座 2 第一輸送單元 21 底板 211 檢測孔 22 導引片 23 輸送軌道 231 擴徑部 • 3 第二輸送單元 31 底板 32 導引片 33 輸送軌道 331 擴徑部 4 第一檢測組件 41 第一影像擷取單元 42 第一發光元件 43 反射單元 44 第一感應開關 雌 441 開啟端 442 關閉端 > 5 弟二檢測組件 51 第二影像擷取單元 52 第二發光元件 53 第二感應開關 1312415 531開啟端 532 9 待測元件 a 關閉端 檢測間隙Ιΐ!·,(1,ι'ί'Κ Γηι !·Κ1ΓΙ'2.Τ2 rinc 14 •ill I ' --Η 1312415 [Simplified illustration] • Figure 1: The screw of the preferred embodiment of the invention A set of detecting devices of components is shown in a side view. Fig. 2 is a top view of a combination of detecting devices for a screw-solid component of a preferred embodiment of the present invention. FIG. 3 is a view showing a detecting device for a screw-solid component of a preferred embodiment of the present invention. FIG. 4 is a schematic diagram of an image captured by a first image capturing unit according to a preferred embodiment of the present invention. [Main component symbol description] 1 pedestal 11 fixing frame 12 first Adjustment seat 13 second adjustment seat 2 first conveying unit 21 bottom plate 211 detection hole 22 guide piece 23 conveying track 231 diameter expansion portion • 3 second conveying unit 31 bottom plate 32 guiding piece 33 conveying track 331 diameter expanding portion 4 first Detection component 41 first image capturing unit 42 first light-emitting element 43 reflection unit 44 first sensor switch female 441 open end 442 closed end > 5 second detection component 51 second image capturing unit 52 second light-emitting element 53 Second sense 1312415531 end switch 5329 is turned on to close a test element of the detector gap

L,n.1a l'i. I'a! 16L,n.1a l'i. I'a! 16

Claims (1)

^415 、申請專利範圍: 1、一種螺固元件之檢測裝置,其包含 一弟一輪送單元,:Ml Μ古 ΑΛ 第二輪送單元,其設有 八5又有—輪送軌道及一檢測孔; 輪送軌道,該第二輪送單元 設置於一基座之 輸送單S分闕職 ,該第一輸送單元與該第— ☆而 隙及一高度差;弟—如早凡之間留有-檢測間 第铋,組件,其設有一影像揭取單元、一發光單元^415, the scope of application for patents: 1. A detecting device for a screw-solid component, comprising a brother-and-wheel-feeding unit, M1 Μ古ΑΛ, a second wheel-feeding unit, which is provided with eight and five-wheeled tracks and a detection a wheel; the second wheel-feeding unit is disposed on a pedestal of the transporting single S, the first transporting unit is separated from the first ☆ ☆ and the height difference; a detection unit, an assembly, an image removal unit, and an illumination unit 單元與該發光元件分別對應 ;W 雨送單元之檢測孔的二側,且該反射單元 ^ 置於該影像掏取單元與該第一輸送單元之間;及 -第二檢·件,其設有—影像擷取單元及—發光元件 ,且該第二檢測組件之影像練單元與該第二檢測組件 之發光7C件相對位於該檢測間隙之同—侧。 依申明專利範圍第1項所述之螺固元件之檢測裝置,其 中該第-輸送單元及第二輪送單元之輸送執道的一端 係分別形成一擴徑部。 依申請專利範圍第1或2項所述之螺固元件之檢測裝置 4 ,其中該檢測孔之寬度略小於一待測元件之外徑。 依申請專利範圍第2項所述之螺固元件之檢測裝置,其 中5亥第一檢測組件設有一第一感應開關,該第一感應開 關叹有一開啟端及一關閉端,該第一感應開關之開啟端 ,應没於該檢測孔靠近該擴徑部的一端,而該第一感應 崎關之關閉端則對應設於該檢測孔之另一端。 • Ι'λ 一 fi<_i I;; mil π —]7 —- 1312415 5、 依申請專利範圍第1、2或4項所述之螺固元件之檢測 裝置,其中該第二檢測組件設有一第二感應開關,該第 二感應開關設有一開啟端及一關閉端,該第二感應開關 之開啟端對應設於該檢測間隙之一端,且設於該第一輸 送單元上;該第二感應開關之關閉端則對應設於該檢測 間隙之另一端,且位於該第二輸送單元上。 6、 依申請專利範圍第3項所述之螺固元件之檢測裝置,其The unit and the light-emitting element respectively correspond to; two sides of the detection hole of the rain-fed unit, and the reflection unit is disposed between the image capturing unit and the first conveying unit; and - the second detecting piece is provided The image capturing unit and the light emitting component are disposed, and the image sensing unit of the second detecting component and the light emitting component 7C of the second detecting component are located on the same side of the detecting gap. The apparatus for detecting a screw-solid element according to claim 1, wherein one end of the conveying path of the first conveying unit and the second conveying unit forms an enlarged diameter portion. The detecting device 4 of the screw-solid element according to the first or second aspect of the patent application, wherein the width of the detecting hole is slightly smaller than the outer diameter of a member to be tested. According to the detecting device of the screw-solid component according to the second aspect of the patent application, wherein the first detecting component of the 5H is provided with a first inductive switch, the first inductive switch has an open end and a closed end, and the first inductive switch The opening end of the sensing hole is not adjacent to the end of the enlarged diameter portion, and the closing end of the first sensing surface is correspondingly disposed at the other end of the detecting hole.检测 λ fi fi fi fi λ λ λ λ ] ] ] ] ] ] ] ] ] 螺 螺 螺 螺 螺 螺 螺 螺 螺 螺 螺 螺 螺 螺 螺 螺 螺 螺 螺 螺 螺 螺 螺 螺 螺 螺 螺 螺 螺 螺 螺 螺 螺 螺 螺a second inductive switch, the second inductive switch is provided with an opening end and a closing end, and the opening end of the second inductive switch is correspondingly disposed at one end of the detecting gap and disposed on the first conveying unit; the second sensing The closed end of the switch is correspondingly disposed at the other end of the detecting gap and located on the second conveying unit. 6. A detecting device for a screw-solid component according to item 3 of the patent application scope, 中該第二檢測組件設有一第二感應開關,該第二感應開 關設有一開啟端及一關閉端,該第二感應開關之開啟端 對應設於該檢測間隙之一端,且設於該第一輸送單元上 ;該第二感應開關之關閉端則對應設於該檢測間隙之另 一端,且位於該第二輸送單元上。 7、 依申請專利範圍第1項所述之螺固元件之檢測裝置,其 中另設有一排料單元,其連接於該第二輸送單元之輸送 執道之末端,以置放儲存完成檢測之一待測元件。 8、 依申請專利範圍第1項所述之螺固元件之檢測裝置,其The second detecting component is provided with a second sensing switch, the second sensing switch is provided with an opening end and a closing end, and the opening end of the second sensing switch is correspondingly disposed at one end of the detecting gap, and is disposed at the first The closing end of the second inductive switch is correspondingly disposed at the other end of the detecting gap and located on the second conveying unit. 7. The detecting device for a screw-solid component according to claim 1, wherein a discharge unit is further connected to the end of the conveying lane of the second conveying unit to store one of the storage completion detections. The component to be tested. 8. A detecting device for a screw-solid component according to claim 1 of the patent application scope, 中該第一檢測組件及第二檢測組件之影像擷取單元係 選自CCD型及CMOS型數位影像擷取單元之其中一種 9、依申請專利範圍第6項所述之螺固元件之檢測裝置,其 中該第一感應開關及第二感應開關係選自一紅外線感 應裝置。 isndH'n 4oc 18 mti ii.it ω 1312415 七、指定代表圖: (一) 本案指定代表圖為:第(3 )圖。 (二) 本代表圖之元件符號簡單說明: 1 基座 11 固定架 12 第一調整座 13 第二調整座 2 第一輸送單元 21 底板 211 檢測孔 22 導引片 3 第二輸送單元 31 底板 32 導引片 4 第一檢測組件 41 第一影像擷取單元 42 第一發光元件 43 反射單元 44 第一感應開關 441 開啟端 442 關閉端 Μ 5 ύ 第二檢測組件 51 第二影像擷取單元 52 第二發光元件 53 第二感應開關 531 開啟端 532 關閉端 9 待測元件 a 檢測間隙 八、本案若有化學式時,請揭示最能顯示發明特徵的化學 式··The image capturing unit of the first detecting component and the second detecting component is selected from one of a CCD type and a CMOS type digital image capturing unit. 9. The detecting device of the screwing component according to claim 6 of the patent application scope The first inductive switch and the second inductive opening relationship are selected from an infrared sensing device. isndH'n 4oc 18 mti ii.it ω 1312415 VII. Designated representative map: (1) The representative representative of the case is: (3). (2) Brief description of the components of the representative diagram: 1 Base 11 Fixing frame 12 First adjusting seat 13 Second adjusting seat 2 First conveying unit 21 Base plate 211 Detection hole 22 Guide piece 3 Second conveying unit 31 Floor 32 Guide piece 4 first detecting component 41 first image capturing unit 42 first light emitting element 43 reflecting unit 44 first sensing switch 441 open end 442 closed end Μ 5 ύ second detecting component 51 second image capturing unit 52 Second light-emitting element 53 Second sensor switch 531 Open end 532 Close end 9 Test element a Detection gap 8. If there is a chemical formula in this case, please reveal the chemical formula that best shows the characteristics of the invention··
TW95148718A 2006-12-25 2006-12-25 An examining apparauts for a component TWI312415B (en)

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