TWI309541B - Method for fabricating punch type leadless ic packages - Google Patents

Method for fabricating punch type leadless ic packages Download PDF

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Publication number
TWI309541B
TWI309541B TW95142008A TW95142008A TWI309541B TW I309541 B TWI309541 B TW I309541B TW 95142008 A TW95142008 A TW 95142008A TW 95142008 A TW95142008 A TW 95142008A TW I309541 B TWI309541 B TW I309541B
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pins
semi
manufacturing
type
lead frame
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TW95142008A
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Chinese (zh)
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TW200822821A (en
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Hung Tsun Lin
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Chipmos Technologies Inc
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•1309541 * 睿 九、發明說明: 【發明所屬之技術領域] 本發明係有關於半導體封裝技術之單體化分離 Ο—),特別係有關於—種沖裁式無外引腳封裝構造 之製造方法。 【先前技術】 在目刖的半導體封裝製造技術中,先將複數個載體單元 _ 集成在—基材以供進行封裝製程,是相當常見的且符合經濟 效率。當大部份的封裝製程完成之後,方進行單體分離^ 分離出複數個半導體封裝構造。譬如說,使用導線架作為基 材製作出無外引腳封裝構造(leadless IC㈣―)亦是: 匕在I程最後進行單體分離。就已知的分離種類,無外^ — ㈣裝構造可進-步區別為沖裁式(p_hing⑽)與鑛切式 (咖ing type)。其中在沖裁式無外引腳封裝構造中,複數個 ^ /體係個別形成’以沖裁導線架引腳之方法便可達到單體 鲁分離之效果。而鑛切式則是以—封膠體連續覆蓋所有載體單 70必須以高速旋轉的鋸切刀同時切斷封膠體與引腳,對於 刀具的磨損影響較大且較耗時。 八如第1圖所不,習知沖裁式無外引腳封裝構造是以一次 王裁切的動作完成單體分離,導線架1]〇固定在一沖裁設備 之載A ! ! ° 上,並以沖裁刀12 —次切斷該導線架11 〇之引腳 ’而不會切到預定形狀之封膠體13〇。配合參閱第2圖, 知冲裁式無外引腳封裝構造100主要包含該導線架110之 ° 、—晶片120、以及一封膠體130。該晶片120係設 :1309541• 1309541 * Rui Nine, invention description: [Technical Field of the Invention] The present invention relates to a singularization of semiconductor packaging technology, and in particular to the manufacture of a punched external lead package structure. method. [Prior Art] In the semiconductor package manufacturing technology that has been witnessed, it is quite common and economical to integrate a plurality of carrier units _ on a substrate for a packaging process. After most of the packaging process is completed, the cell separation is performed to separate a plurality of semiconductor package structures. For example, the use of a lead frame as a substrate to create an external lead package structure (leadless IC (4) -) is also: 匕 at the end of the I process for monomer separation. As far as the known separation type is concerned, the structure can be further differentiated into a punching type (p_hing (10)) and a mine cutting type. In the blanking type external lead package structure, a plurality of ^ / systems are individually formed to achieve the effect of separate separation of the lead wires by punching the lead pins of the lead frame. In the case of the cut-off type, the sealant is continuously covered with all the carrier sheets. 70 The saw blade must be cut at the same time to cut the sealant and the pins at the same time, which has a great influence on the wear of the cutter and is time consuming. As shown in Figure 1, the conventional blanking type external package structure is a single-cutting operation to complete the unit separation. The lead frame 1] is fixed on a punching device A! ! ° And the punching blade 12 is used to cut the lead of the lead frame 11 ' without cutting the sealing body 13 预定 of a predetermined shape. Referring to FIG. 2, the punched external lead package structure 100 mainly includes the lead frame 110, the wafer 120, and a gel 130. The wafer 120 is set: 1309541

置於該導線架110並藉 错由複數個銲線121電性連接至該些 腳1。模封形成該封膠體13 : 合該些引腳⑴,但 :應:片:並結 沖裁。該些引腳U i之 ^ 合。在沖裁之前,面亦=為顯露狀’可供表面接 補露出y下^以1御先形成㈣些㈣⑴之 接。然而如第;圖所亍’:避免引W化並有助於薛 圖所不,在習知的沖裁過程中,沖 對腳U1之沖切力量會導致引腳U1容易由該封膠體 130剝離,甚至掉落的問題發生。此外,如第2圖所示,在 該些引腳⑴之沖裁面會有毛邊現象,容㈣傷人體或電子 元件。 【發明内容】 土本發明之主要目的係在於提供一種沖裁式無外引腳封裝 構造之製造方法,用以解決習知單程沖裁的製程中會引起沖 裁式無外引腳封裝構造之引腳剝離、掉落與毛邊等問題,故 能提昇製程良率,更可增加引腳之電鍍面積。 本發明的目的及解決其技術問題主要是採用以下 技術方案來實現的。依據本發明揭示一種沖裁式無外弓丨 腳封装構造之製造方法。首先,提供一具有複數個載體單元 之導線架,每一載體單元内係形成有複數個引腳,在相鄰载 體單元之間係可形成有一堵住桿(dam bar)。再將複數個晶片 没置至該導線架,並以適當方式使該些晶片電性連接至該此 引腳。之後,個別形成複數個封膠體於對應之該些載體單 元,以結合該些引腳但顯露該些堵住桿。在封膠之後,進行 1309541 一半沖裁㈣,沿著該些封«之外周緣形成複數個半凹缺 口於該些引腳。之後’進行-電鑛步驟,形成一電鑛層於該 些弓丨聊包含該些半凹缺口之外露表面。最後,進行一全沖裁 步驟’沿著該些半凹缺口切斷該些引腳,而分離成個別之封 膠體。另揭示依上述製程所製成之沖裁式無外引腳 造。 再 在前述的製造方法中 些引腳之上表面。 在前述的製造方法中 些引腳之下表面。 在前述的製造方法中 線以電性連接至該些引 ,該些半凹缺口係可形成於該 ,該些半凹缺口係可形成於該 該些晶片係可藉由複數個 銲 腳 在前述的製造方法中,贫此坐 τ °亥些+凹缺口之深度可約Α 該些引腳之厚度三分之—$_人 ^ 土 一刀之一 0 在前述的製造方法中,上述 4之電鍍步驟係為化學雷 鍍或是電解電鍍。 4 在前述的製造方法中,該 锡 ^ ^ 電鍍層係可選自於錫、 鉛、錫-祕之其中之—。 【實施方式】 在本發明之第一具體實 3G圖,揭示一種沖裁文益认中’配合參閱第3Α至 第4圖則為製程中使^卜引㈣裝構造之製造方法, 、,本如笔之—導線架之了員面示意圖。 f先,如第3Α及4圖所 貝职 線架21G係具有複數個载:' ’提供1線架21G ’該導 早7^ 21〇a,每〆載體單元21〇八 1309541 内係形成有複數個引腳211,且在相鄰載體單元21〇A之間 係形成有一堵住桿212(dam bar),以連接該些引腳2 11。在 本實施例中’每一載體單元21 0A内可另形成有至少一晶片 承座213。通常該導線架210係為全金屬材質並具有約〇2 毫米(mm)之厚度。但該些引腳211係不具有習知可形成j、j 或海鷗形外引腳之長度。每一引腳211係具有一上表面2Ua 與一下表面211B。The lead frame 110 is placed on the lead frame 110 and is electrically connected to the legs 1 by a plurality of bonding wires 121. The encapsulant forms the encapsulant 13 : the pins (1) are combined, but: should: the sheet: the junction is punched. The combination of these pins U i . Before the blanking, the surface is also = exposed. It can be used to expose the surface to form a y y ^ to form a first (four) (4) (1) connection. However, as shown in the figure; Fig. :': avoiding the W and contributing to the Schematic, in the conventional blanking process, the punching force of the punching U1 will cause the pin U1 to be easily used by the encapsulant 130. Peeling, even falling problems occur. In addition, as shown in Fig. 2, there is a burr phenomenon on the punched surface of the pins (1), and the body (4) is injured in the human body or electronic components. SUMMARY OF THE INVENTION The main object of the present invention is to provide a manufacturing method of a punched external lead package structure, which is used to solve the problem of a conventional one-way blanking process which causes a punched external lead package structure. Problems such as pin peeling, dropping and burrs can improve the process yield and increase the plating area of the pins. The object of the present invention and solving the technical problems thereof are mainly achieved by the following technical solutions. According to the present invention, a method of manufacturing a punched outer bowless package structure is disclosed. First, a lead frame having a plurality of carrier units is provided, each of which is formed with a plurality of pins, and a dam bar is formed between adjacent carrier units. A plurality of wafers are then not placed on the leadframe and the wafers are electrically connected to the pins in a suitable manner. Thereafter, a plurality of encapsulants are individually formed on the corresponding carrier units to bond the pins but the blocking rods are exposed. After the sealant, 1309541 is half-punched (four), and a plurality of semi-recessed openings are formed along the outer circumference of the seals. Thereafter, the electro-penetration step is performed to form an electro-mineral layer in which the exposed surfaces of the semi-concave notches are included. Finally, a full blanking step is performed to cut the pins along the semi-concave notches and separate into individual encapsulants. Further, a blanking type external lead made by the above process is disclosed. In the foregoing manufacturing method, the upper surface of the pins is used. In the aforementioned manufacturing method, the lower surface of these pins. In the foregoing manufacturing method, the wires are electrically connected to the leads, and the semi-concave notches may be formed therein, and the semi-concave notches may be formed in the plurality of solder pads in the foregoing In the manufacturing method, the depth of the τ °H + recessed notch can be about 三 the thickness of the pins is three-thirds - $ _ people ^ one of the soil knife 0 in the aforementioned manufacturing method, the above 4 plating The steps are chemical lightning plating or electrolytic plating. 4 In the foregoing manufacturing method, the tin plating layer may be selected from the group consisting of tin, lead, and tin. [Embodiment] In the first concrete 3G diagram of the present invention, a method for manufacturing a structure in which a embossing (four) is constructed in a process is disclosed in the context of the embossing of the text. Such as the pen - lead frame diagram of the staff. f First, as shown in Figures 3 and 4, the 21G line has a plurality of loads: ''1 line frame 21G' is provided. The guide is 7^21〇a, and each carrier unit 21〇18130954 is formed. A plurality of pins 211 are formed, and a dam bar 212 is formed between adjacent carrier units 21A to connect the pins 2 11. In the present embodiment, at least one wafer holder 213 may be additionally formed in each carrier unit 207A. Typically, the leadframe 210 is of all metal and has a thickness of about 2 millimeters (mm). However, the pins 211 do not have the length of a conventional j, j or seagull-shaped outer pin. Each pin 211 has an upper surface 2Ua and a lower surface 211B.

如第3B圖所示,設置複數個晶片22〇至該導線架21〇, 可利用已知的黏晶技術將該些晶片22〇之一表面黏貼至該導 線架210之該些晶片承座213。此外,在不同類型的導線架 中’其引腳亦可供黏晶之用。 為使該些晶片220可電性連接至該些引腳211。如第3C 圖所示’利用打線技術形成複數個銲線2 2 1,該此曰η 220係藉由該些銲線221以電性連接至該些引腳2ιι之上表 面211A。此外,亦可利用内引腳接合與覆晶接合等技術達 到晶片220與導線架2 1 〇之電性互連。 之後,如第3D圖所示,可利用壓模、印刷或點膠方式 形成複數個封膠體230於對應之該些載體單元21〇A,以結 ^該些引腳2U但顯露該些堵住桿212。換言之,每—裁體 單元2l〇A冑可對應到一個封膠體230。在本實施例中,該 一封膠體23G係為壓模形成,通常該些封膠體係為絕緣 材料匕3可固化樹脂、無機填充劑、固化促進劑與色料等 等。每-封膠體230除了密封對應載體單元應上的晶片 更畨封該些引腳211之大部份的上表面2UA。但在本 ;Γ309541 實施例中’該導線架21〇之堵住桿212、引腳211之下表面 211B、晶片承座213之下表面以及引腳211之些許上表面 211A係不被該些封膠體23〇所覆蓋。 如第3E圖所示’在該些封膠體23〇形成之後方進行一半 沖裁步驟。將該導線架21〇固定在一沖裁設備之載台2ι上。 利用複數個沖裁刀22沿著該些封膠體23〇之外周緣23丨形 成複數個半凹缺口 211C於該些引腳211,值得注意的是,As shown in FIG. 3B, a plurality of wafers 22 are disposed to the lead frame 21A, and one of the wafers 22 can be adhered to the wafer holders 213 of the lead frame 210 by a known die bonding technique. . In addition, in different types of lead frames, its pins are also available for die bonding. The wafers 220 are electrically connected to the pins 211. As shown in FIG. 3C, a plurality of bonding wires 2 2 1 are formed by a wire bonding technique, and the wires 220 are electrically connected to the upper surface 211A of the pins 2 ι by the bonding wires 221 . In addition, the electrical interconnection of the wafer 220 and the lead frame 2 1 can be achieved by techniques such as internal pin bonding and flip chip bonding. Then, as shown in FIG. 3D, a plurality of encapsulants 230 may be formed by using a stamper, a printing or a dispensing method to correspond to the carrier units 21A, to form the pins 2U but reveal the plugs. Rod 212. In other words, each of the body units 2l〇A胄 can correspond to one sealant 230. In the present embodiment, the one of the gels 23G is formed by a stamper. Usually, the sealant system is an insulating material 匕3 curable resin, an inorganic filler, a curing accelerator, a colorant, and the like. Each of the encapsulants 230 seals most of the upper surface 2UA of the pins 211 in addition to the wafers on the corresponding carrier unit. However, in the embodiment Γ309541, the lead frame 21 堵 blocking rod 212, the lower surface 211B of the lead 211, the lower surface of the wafer holder 213, and the upper surface 211A of the pin 211 are not sealed. The colloid is covered by 23 inches. As shown in Fig. 3E, a half-punching step is performed after the formation of the sealant 23 is formed. The lead frame 21 is fixed to the stage 2 of the punching apparatus. A plurality of semi-concave notches 211C are formed on the outer leads 23 of the sealant 23 by a plurality of punching blades 22, and it is noted that

於半沖裁步驟後所形成的該半凹缺σ 211C,其开績並不限 定,可以是凹型或者是U型等其他幾何形狀。在本實施例 中,該些半凹缺口 211C係形成於該些引腳211之上表面 211A。該些半凹缺口 2nc之深度約為該些引腳之厚度 二分之一至二分之一。即是在半沖裁步驟中不可切斷該些引 腳211,以利電鍍。 一 F圖所示,進行一電鍍步驟,其係形成一電鑛 謂於該些引腳211包含該些半凹缺口 2nc之外露表面 其中在本實施例中,該些引腳2i i可供電錢層⑽形成 外露表面係包含上述顯露在該些封膠冑23 212、引腳m之下表面211B、晶片承座213之=者住 日曰月承座213之下表面以 引腳川之些許上表面211A及半凹缺口 2uc。此外該 ^步驟係可為化學電鑛或是電解電鍍等其他方式。而該電 層240之材質係可選自於锡、錫-錯、錫-祕之其中之一。 最後,如第30 W所示,進行_全沖裁步驟,經過到 與電鍍之導線架21〇係固定在另 ㈣二目“ # U疋在另-冲裁設備之載台上 具有沖切槽道以提供沖裁刀32之全沖裁行程。並 :Γ309541 用該些沖裁刀32沿著該些半凹缺口 2UC切斷該些引腳 2 1卜而分離成個別的封膠體230。在本實施例中,該些引腳 211係被該些封膠體230結合而與該些堵住桿212分離。在 本發明並不局限沖裁設備之種類,在半沖裁步驟與全沖裁步 驟中使用的沖裁設備可為相同或不相同。 如第5圖所不,稽田琢全沖裁步驟可得到複數個沖裁式 無外引腳封裝構造’利用上述半沖裁步驟實施在封膠步The semi-recess σ 211C formed after the half-punching step is not limited in its development, and may be concave or U-shaped or other geometric shapes. In this embodiment, the semi-recessed notches 211C are formed on the upper surface 211A of the pins 211. The depth of the semi-concave notches 2nc is about one-half to one-half the thickness of the pins. That is, the pins 211 cannot be cut in the half-punching step to facilitate plating. As shown in FIG. F, an electroplating step is performed to form an electro-depositor. The pins 211 include the semi-concave notches 2nc exposed surfaces. In the embodiment, the pins 2i i can supply power. The exposed surface of the layer (10) comprises the above-mentioned exposed surface of the sealant 23 212, the surface 211B of the pin m, and the wafer holder 213. The surface of the holder 213 is placed on the lower surface of the seat 213. Surface 211A and semi-recessed notch 2uc. In addition, the ^ step can be other methods such as chemical ore or electrolytic plating. The material of the electric layer 240 may be selected from one of tin, tin-displacement, and tin-secret. Finally, as shown in the 30th W, the _ full-cutting step is carried out, and the ferrule is fixed to the electroplated lead frame 21 in the other (four) two-head "# U疋 on the stage of the other-punching device. The road is provided with a full punching stroke of the punching blade 32. And: Γ309541 is used to cut the pins 2 1 along the semi-recessed notches 2UC to separate the individual sealing bodies 230. In this embodiment, the pins 211 are combined with the sealing bodies 230 to be separated from the blocking rods 212. The invention is not limited to the type of punching equipment, in the semi-punching step and the full blanking step. The punching equipment used in the punching equipment may be the same or different. As shown in Fig. 5, the all-punching step of the 稽田琢 can obtain a plurality of punched external lead package constructions using the above-mentioned half blanking step in the sealing step

驟與電鍍步驟之間並在全沖裁步驟之前,以降低全沖裁步驟 時對引腳211和封膠體230結合處所造成破壞性的沖切應 力。故能防止該些引腳211由與封膠體230結合界面產生裂 縫’不會有習知因-次全沖裁造成引腳剝離與引腳掉落之問 題,並進—步解決了引腳毛邊問題。並且,如第6圖所示, 原广半凹缺口 2UC内之電鍍層“Ο可增加產品中引腳211 ::側緣之電鍵面積’減少該㈣腳2ii之鱗化以及增加上 板時對焊球或錫膏的接合能力。 因此,在本發明之第— 兩段式沖裁方… 例中另揭示了上述包含 6圖所- 沖裁式無外引腳封裝構造。如第5及 圖所不,該沖裁式I外 架no之複數個: 裝構造200主要包含-導線 <複數個W腳21】、— -電鍍層240。每—引腳曰曰片22〇、-封膠體230以及 以兩段式沖裁形成之顯露於封膠體外之外端係具有 其中該第-切面2UD4 —切面2UD與一第二切面211E, 2UC< —側·彳a^料沖裁步卿成之半凹缺口 所覆蓋(如第3F(S|成(如第3E圖所示),且被該電鍍層240 ^ t圖所示)。兮贫 )6亥第二切面211E係為由前述全沖 1309541Between the step of plating and the plating step and before the full blanking step, the destructive punching stress on the joint of the pin 211 and the sealant 230 at the full blanking step is reduced. Therefore, it is possible to prevent the pins 211 from being cracked at the interface with the sealing body 230. There is no problem that the pin is peeled off and the pins are dropped due to the conventional full-punching, and the problem of the pin burr is further solved. . Moreover, as shown in Fig. 6, the plating layer in the original wide concave notch 2UC "can increase the pin area of the lead 211:> side edge of the product" reduces the scaling of the (4) foot 2ii and increases the upper plate. The bonding ability of the solder ball or the solder paste. Therefore, in the first-stage two-stage blanking method of the present invention, the above-mentioned 6-frame-out blank-out package structure is disclosed. No, the plurality of punching type I outer frames no: the mounting structure 200 mainly includes a - wire < a plurality of W feet 21], - a plating layer 240. Each of the - pin pieces 22 〇, - sealant And the outer end of the outer surface of the sealant formed by the two-stage punching has the first-cut surface 2UD4-cut surface 2UD and a second cut surface 211E, 2UC<-side·彳a^ Covered by a semi-recessed notch (such as 3F (S| into (as shown in Figure 3E), and shown by the plating layer 240 ^ t). The poor second) 6 Hai second section 211E is the aforementioned Rushing 1309541

所形成之引腳外露端面。在本實施例中,該料腳211 之第一切面211D係與對應引腳211之上表面2uA相連接。 在不同實施例中,該些引腳2U之第-切面211D亦可與對 應引腳之下表面相連接。該晶片22()係設置於該導線架 之日日片承座213並以形成複數個銲線22ι之打線技術或 疋覆日日接α方式使该晶片22〇與該些引腳叫電性連接。該 封膠體230係形成於該導線架2Η)上並與該些引腳211 ;; 口較佳地’該些引腳211亦可具有一稍突出於該封膠體㈣ 侧邊之上表面2ΐιΑ以及下表面2UB。該電鑛層州係至少 形成於該些引腳211之該些第一切面2UD,更可形成在該 1稍突出於該封膠體23〇侧邊之引腳2ιι之上表面211入與 引腳下表面211B以及該晶片承座213之下表面。 、 在本發明之第二具體實施例中,揭示另—種沖裁式無外 引腳封裝構造之製造方法。在半沖裁步驟之前的封裝步驟,The exposed end face of the formed pin. In this embodiment, the first cut surface 211D of the foot 211 is connected to the upper surface 2uA of the corresponding pin 211. In various embodiments, the first slice 211D of the pins 2U may also be connected to the lower surface of the corresponding pin. The wafer 22() is disposed on the sunday support 213 of the lead frame and is electrically connected to the pins by a wire bonding technique or a plurality of bonding wires 22i. connection. The sealing body 230 is formed on the lead frame 2 and is connected to the pins 211; preferably, the pins 211 may have a surface slightly protruding from the side of the side of the sealing body (4) and Lower surface 2UB. The electric ore layer is formed at least on the first cut surface 2UD of the pins 211, and may be formed on the surface 211 of the pin 2 ιι which protrudes slightly from the side of the sealant 23 The lower surface 211B and the lower surface of the wafer holder 213. In a second embodiment of the present invention, another method of fabricating a blanked external lead package structure is disclosed. The packaging step before the half-punching step,

如導線架提供、黏晶與封膠等等,其係大致與第一具體實施 例相同,不再贅述。 之後,進行一半沖裁步驟。如第7A圖所示,在半沖裁步 驟之前,複數個晶片320已設置於一導線架31〇,並以複數 個銲線321電性連接至該導線架310之複數個引腳311。一 封膠體330係形成於該導線架3 1〇之對應載體單元,以結合 該些引腳3 11但顯露該導線架3丨〇之複數個堵住桿3 2。在 半沖裁步驟中,該導線架310係可反向固定於—沖裁設備之 栽台3 1,並利用複數個沖裁刀42沿著該些封膠體之外 周緣331形成複數個半凹缺口 3UC於該些引腳31丨。在本 11 1309541 實施例中’該導線架310係反向設置於該载台31,而該些半 凹缺口 311C係形成於該些引腳311之下表面3Ub。 如第7B圖所示,在半沖裁之後進行—電鍍步驟其係形 成一電鍍層340於該些引腳311包含該些半凹缺口 3nc之 外露表面,即該些引腳311之部分上表面3Ua、下表面Ha 以及該些半凹缺口 311C。 —一 /外,软守蜾罘3 10可2For example, the lead frame is provided, the die bond and the sealant are the same as the first embodiment, and will not be described again. After that, half the punching step is performed. As shown in Fig. 7A, a plurality of wafers 320 are disposed on a lead frame 31A and electrically connected to a plurality of pins 311 of the lead frame 310 by a plurality of bonding wires 321 before the half-punching step. A sealing body 330 is formed on the corresponding carrier unit of the lead frame 3 1 , to combine the pins 3 11 but expose the plurality of blocking rods 3 2 of the lead frame 3 。. In the semi-punching step, the lead frame 310 can be reversely fixed to the table 3 1 of the punching device, and a plurality of semi-concavees are formed along the outer periphery 331 of the sealant by a plurality of punching blades 42. The gap 3UC is at the pins 31丨. In the embodiment of the present invention, the lead frame 310 is reversely disposed on the stage 31, and the semi-concave notches 311C are formed on the lower surface 3Ub of the pins 311. As shown in FIG. 7B, after the half-punching, the electroplating step is performed to form a plating layer 340 on the pins 311 including the exposed surfaces of the semi-concave notches 3nc, that is, a part of the upper surface of the pins 311. 3Ua, lower surface Ha, and semi-recessed notches 311C. - one / outside, soft guard 3 3 can 2

為正向放置於-沖裁設備之載台51,並利用複數個沖裁; 52沿著該些半凹缺口 3UC切斷該些引腳3",而分離成4 = 此’本發明之半凹缺口無論是形成在〗 沖裁…皆能解決習知單程沖裁的製程中们 藉腳封裝構造之引腳剝離、掉落與毛邊等問題 '昇製程良率,更可增加引腳之電鑛面積。 明作二所二’上僅是本發明的較佳實施例而已’並非對本每 上,然而雖然本發明已以較佳實施例揭露女 脫離本發明之申請==,任何熟悉本項技術者,在不 性變化與㈣料的任打間早修改、等M 【圖式簡單發料技術範圍内。 習头冲裁式無外引腳封裝構造在沖裁單 不意圖。 〜m如 第2圖:@ i 第3A至3G圖裁式無外引腳封裝構造之截面示意圖。 式無外封本::…一具體實施例,—種沖裁 5丨腳封裝構造在製造過程中之截面示意 12 :1309541 圖。 依據本發明之第一具體實施例,使用於該沖裁式無 第$ 外引腳封裝構造之導線架 之俯視示意圖。 依據本發明之第一具體實施例,該沖裁式無外引 Λ 封裝構造之載面示意圖。 +圖.依據本發明之第一具體實施例,該沖裁式無外弓I聊 第 封裝構造:之側面示意圖。 至7C圖:依據本發明之第二具體實施例,另—種沖 裁式無外引腳封裝構造在製造過程之兩沖裁步驟 • 中之截面示意圖。 主要元件符號說明】 11 載台 12 21 載台 22 31 載台 32 41 栽台 42 51 載台 52 沖裁刀 沖裁刀 100沖裁式無外引腳封裝構造 110導線架 ill引腳 120晶片 121銲線 130封膠體 140電鍍層 211引腳 211 C半凹 體草元 表面 二切面 200沖裁式無外引腳封裝構造 21〇導線架 210Α載 211Α上表面 211Β下 211D第一切面 211Ε第 13 :1309541 212 堵住桿 213 晶片承座 220 晶片 221 銲線 230 封膠體 231 外周緣 240 電鍍層 310 導線架 311 引腳 311B下表面 311C半凹缺口 312 堵住桿 320 晶片 321 銲線 330 封膠體 331 外周緣 340 電鍍層 311A上表面Is placed on the stage 51 of the punching device in the forward direction, and utilizes a plurality of punches; 52 cuts the pins 3" along the semi-recessed notches 3UC, and separates into 4 = this half of the invention The concave notch is formed in the 〗 〖Curving... It can solve the problems of the one-way blanking process, such as the peeling, falling and burrs of the foot package structure, and the increase of the lead yield. Mine area. The present invention is merely a preferred embodiment of the present invention and is not intended to be used in the present invention. However, although the present invention has been disclosed in its preferred embodiments, the application of the present invention is ??? Early modification between the non-sexual change and (4) material, etc., within the scope of the simple material delivery technology. The head-punched external lead package construction is not intended. ~m as shown in Figure 2: @ i Section 3A to 3G diagram of the outline of the external lead package structure. No outer seal:: a specific embodiment, a type of punching 5 foot package structure in the manufacturing process of the cross-section schematic 12: 1309541 figure. In accordance with a first embodiment of the present invention, a top plan view of a leadframe for use in the blanked outer package structure is omitted. According to a first embodiment of the present invention, a schematic view of a carrier surface of the punched type outer package structure is omitted. + Fig. In accordance with a first embodiment of the present invention, the blanking type without outer bow I. Figure 7C is a cross-sectional view of another blanking package without the outer lead package construction in the two blanking steps of the manufacturing process in accordance with the second embodiment of the present invention. Main component symbol description] 11 Stage 12 21 Stage 22 31 Stage 32 41 Table 42 51 Stage 52 Punching knife punching knife 100 punching type No external lead package structure 110 Lead frame ill pin 120 wafer 121 Bonding wire 130 encapsulant 140 plating layer 211 pin 211 C semi-concave grass surface two-section 200 punching type external lead package structure 21 〇 lead frame 210 Α Α Α upper surface 211 Β 211D first section 211 Ε 13 :1309541 212 blocking rod 213 wafer holder 220 wafer 221 bonding wire 230 sealing body 231 outer circumference 240 plating layer 310 lead frame 311 pin 311B lower surface 311C semi-recessed notch 312 blocking rod 320 wafer 321 bonding wire 330 sealing body 331 Outer periphery 340 plating layer 311A upper surface

1414

Claims (1)

1309541 十、申請專利範圍: k h月 卜厂種沖裁式無外㈣封麵造之製 提供-導線架’其係具有複數個載體單元 元内係形成有複數個引腳; 載體早 設置複數個晶片至該導線架,並使該些晶片電性連接至 該些引腳; 电注連接至 形成複數個封膠體於該迆截體罝分,,v a人 、隹> , —戟體単兀,以結合該些引腳; 進仃一半沖裁步驟,沿著該此封膠體 個半凹缺口於該些引腳; 卜周緣形成複數 進行-電鐘步驟,形成—電鍍層於該些引腳包含該 凹缺口之外露表面;以及 進行—全沖裁步驟’沿著該些半凹缺口切斷該些引腳, 而分離成個別之封膠體。 2、 如申請專利範圍第1項所述之、.Φ共斗—· 造之盤Μ》1…引腳封裝構 -之製地方法’其中在相鄰載體單元之間係形成 住桿(dam bar),該些封膠體在形成時係顯露該些堵奸 3、 如申請專利範圍第i項所述之沖裁式無外引腳封裝干構 造之製造方法’其中該些半凹缺口係形成於該些引腳之 上表面 ° 4、 如申請專利範圍第i項所述之沖裁式無外引腳封 造之製造方法,其中該些半凹缺口係形成於該 下表面。 芝 5、 如申請專利範圍第i項所述之沖裁式無外引腳 造之製造方法,其中該些晶片係藉由複數個銲線以電性 15 '1309541 連接至該些引腳。 6、如申請專利範圍第ι項所述之 造之製造太土 式…、外弓丨腳封襄槿 製、方法,其中該些半凹缺口之展構 之厚度三分之一至二分之 冰又約為該些引腳 —— 〇 7、 如申請專利範圍第丨項所述之沖 造之製造方法,其中上^##+式…外弓丨腳封裝構 電解電鍍。…鍍步驟係為化學電鑛或是 8、 如申請專利範圍第"員所述 造之製造方本裁式無外引腳封裝構 “造方法’其中該電鍍層係選自於構 秘之其中之—。 踢-氣、錫_ 9、 -種沖裁式無外引腳封裝構造,包含· :=::==:::_一段 體ST置於該導線架並與該些引腳電性連接,· 以及冑,其係形成於該導線架上並與該些引腳結合; /電鍍層,其係至少形成於該些弓丨腳之該些第一 10、如申請專利範圍第9項所述 。 造,其中_ —切Jit: 外引腳封袭構 切面係與對應引腳之下表面相連接。 '如Π專利範圍第9項所述之沖裁式無外引腳封裝構 造,其中該些第-切面係與對應引腳之上表面相連接。 12、如申請專利範圍第9項所述之沖裁式無外引腳封裝構 $ /、中每弓I腳係具有一猶突出於該封膠體側邊之上 表面。 16 13〇9541 j 13 14 ~~—-如申請專利範圍$ 12 、斤返之沖裁式益外弓丨 構造,其中該電鍍層係亦形成於該些引聊之突出封裝 、如申請專利範圍第9項所述之:中栽,,其中該……:S中裁式無外引腳封裳構 -月 1叫a热外3丨腳封奘楳’其中該晶片係以打線或是覆晶接合方式電性連接至 tb Θ RSP。 丈设王 造该竣引腳 15、如申請專利範圍第9項所述之沖裁式無外引腳封裝構 造,其中該導線架係具有一晶片承座,以供該晶片之設 % 0 φ 丨6、如申請專利範圍第15項所述之沖裁式無外引腳封裝 構造’其中該電鍍層係形成於該晶片承座之下表面。1309541 X. Patent application scope: kh Yuebu plant type punching type no (4) cover manufacturing system - lead frame 'the system has a plurality of carrier unit elements formed by a plurality of pins; the carrier is set a plurality of early Wafer to the lead frame, and electrically connecting the chips to the pins; electrically connecting to form a plurality of sealants in the scorpion, va, 隹> To join the pins; to enter a half-punching step, along the sealing body, a semi-concave notch is formed on the pins; the peripheral edge forms a plurality of-electric clock steps to form a plating layer on the pins Including the concave notch exposed surface; and performing a full-punching step to cut the pins along the semi-concave notches and separating into individual encapsulants. 2. As described in the first paragraph of the patent application, the Φ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ Bar), the sealant is formed during the formation of the smear 3, as in the manufacturing method of the punched type external lead-free package dry structure described in the scope of claim [i] wherein the semi-recessed notches are formed The method of manufacturing the punched type outer lead-free sealing method according to the above-mentioned item, wherein the semi-concave notches are formed on the lower surface. 5. A method of manufacturing a blanking type external lead as described in claim i, wherein the wafers are connected to the pins by a plurality of bonding wires electrically 15 '1309541. 6. The method of manufacturing the terracotta..., the outer bow and the shackle, and the method for the construction of the semi-concave notch, wherein the thickness of the semi-concave notch is one-third to two-half of the ice. And about these pins - 〇 7, as described in the scope of the application of the scope of the manufacturing process, wherein the upper ^ # # + type ... outer bow and foot package structure electrolytic plating. ...the plating step is a chemical ore or 8 , as claimed in the patent application, the manufacturer has a manufacturing method, and the method of manufacturing the method is as follows: Among them - kick-gas, tin _ 9, - a type of blanking no-outer package structure, including: :=::==:::_ a segment of ST placed on the lead frame and with these pins Electrically connected, and 胄, formed on the lead frame and combined with the leads; / electroplated layer, which is formed at least in the first 10 of the arches, as claimed in the patent scope 9, described, in which _-cut Jit: the outer pin seals the tangential surface to be connected to the lower surface of the corresponding pin. 'The lapped external lead package as described in the ninth patent scope The structure, wherein the first-cut surface is connected to the upper surface of the corresponding pin. 12. The blanking type external lead package structure according to claim 9 of the patent application scope has a One is judging from the upper surface of the side of the sealant. 16 13〇9541 j 13 14 ~~—-If the patent application scope is $12, the weight of the punch is a bow structure, wherein the plating layer is also formed in the prominent package of the chat, as described in item 9 of the patent application: in the middle plant, wherein the:: S cut-out type has no outer pin seal The structure-month 1 is called a hot outer 3 foot-foot seal. The wafer is electrically connected to tb Θ RSP by wire bonding or flip chip bonding. 9. The blanking type outer lead package structure according to claim 9, wherein the lead frame has a wafer holder for the wafer to be set to 0 0 φ 丨6, as described in claim 15 of the patent scope. An external lead package construction 'where the plating layer is formed on the lower surface of the wafer holder. 1717
TW95142008A 2006-11-14 2006-11-14 Method for fabricating punch type leadless ic packages TWI309541B (en)

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