TWI298791B - - Google Patents
Download PDFInfo
- Publication number
- TWI298791B TWI298791B TW95122152A TW95122152A TWI298791B TW I298791 B TWI298791 B TW I298791B TW 95122152 A TW95122152 A TW 95122152A TW 95122152 A TW95122152 A TW 95122152A TW I298791 B TWI298791 B TW I298791B
- Authority
- TW
- Taiwan
- Prior art keywords
- test
- circuit board
- tested
- plate
- clamping plate
- Prior art date
Links
- 238000012360 testing method Methods 0.000 claims description 101
- 239000004020 conductor Substances 0.000 claims description 13
- 239000000853 adhesive Substances 0.000 claims description 3
- 230000001070 adhesive effect Effects 0.000 claims description 3
- 229910000679 solder Inorganic materials 0.000 claims description 3
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims 1
- 239000000523 sample Substances 0.000 description 9
- 241000251468 Actinopterygii Species 0.000 description 1
- 241000283153 Cetacea Species 0.000 description 1
- 238000012356 Product development Methods 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Insertion, Bundling And Securing Of Wires For Electric Apparatuses (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW095122152A TW200712511A (en) | 2005-09-15 | 2006-06-20 | Test fixture improved structure of circuit board |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW94131855 | 2005-09-15 | ||
| TW95116458 | 2006-05-09 | ||
| TW095122152A TW200712511A (en) | 2005-09-15 | 2006-06-20 | Test fixture improved structure of circuit board |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200712511A TW200712511A (en) | 2007-04-01 |
| TWI298791B true TWI298791B (enExample) | 2008-07-11 |
Family
ID=45069498
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW095122152A TW200712511A (en) | 2005-09-15 | 2006-06-20 | Test fixture improved structure of circuit board |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TW200712511A (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI464687B (zh) * | 2011-12-14 | 2014-12-11 | Fujitsu Ltd | 治具之指定支援裝置、治具之指定支援方法、及記錄媒體 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI598606B (zh) * | 2016-05-24 | 2017-09-11 | 中華精測科技股份有限公司 | 球閘陣列測試裝置 |
-
2006
- 2006-06-20 TW TW095122152A patent/TW200712511A/zh not_active IP Right Cessation
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI464687B (zh) * | 2011-12-14 | 2014-12-11 | Fujitsu Ltd | 治具之指定支援裝置、治具之指定支援方法、及記錄媒體 |
Also Published As
| Publication number | Publication date |
|---|---|
| TW200712511A (en) | 2007-04-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN100582788C (zh) | 具有双显示器的钳式计量器 | |
| JPH04230866A (ja) | Ｉｃアダプタ | |
| TW200922011A (en) | Socket adaptor apparatus | |
| TW200801527A (en) | Probe, testing head having a plurality of probes, and circuit board tester having the testing head | |
| TWI264548B (en) | Electronic component/interface interposer | |
| US7525329B2 (en) | Electrical connecting apparatus | |
| TW201100811A (en) | Probe card | |
| CN102043074A (zh) | 高频探针卡 | |
| TWI298791B (enExample) | ||
| US5314342A (en) | Universal probe adapter | |
| JP2011179866A (ja) | 測定用アダプタ | |
| US6459287B1 (en) | Attachable/detachable probing point | |
| US6281692B1 (en) | Interposer for maintaining temporary contact between a substrate and a test bed | |
| TW201025748A (en) | ZIF connectors and semiconductor testing device and system using the same | |
| TW201134030A (en) | Socket, socket board, and electronic component testing apparatus | |
| US7148713B1 (en) | Algoristic spring as probe | |
| CN101726635A (zh) | 探针卡 | |
| JP6105832B2 (ja) | 抵抗プロービング・チップ装置及びロジック・アナライザ・プロービング装置 | |
| TWI724482B (zh) | 探針模組 | |
| CN206832861U (zh) | 测试探针及印刷电路板测试装置 | |
| TWI572873B (zh) | 測試用連接器 | |
| WO1999010748A1 (en) | Checker head | |
| JP2002207049A (ja) | 四探針測定用コンタクトピンと、コンタクト機器と、被測定物側装置と、測定回路側装置 | |
| TWM598945U (zh) | 探針模組 | |
| TWI278639B (en) | Memory test tool |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |