TWI290228B - Method for measuring insulation resistance - Google Patents

Abstract

A method for measuring insulation resistance. The method is used for measuring insulation resistance between M conducting wires. The method includes the steps of: (a) the M must be satisfied 2<n> < M ≤ 2<N+1> and the n is positive integer; (b) the M conducting wires are separated into nearly 2<i> groups, and the initial value of i is 1, and the conducting wires of the groups are N1 and N2, then N1 >= N2; (c) the conducting wires of odd groups are shorted and the conducting wires of even groups are also shorted; (d) measuring insulation resistance between the odd groups and even groups; (e) if i < n+1 then i+1, and if i >= 1 then over the method. (f) M conducting wires are separated into nearly 2<i> groups, and the conducting wires of the groups are N1, N2, ..., N2<i>, and N1 >= N2 >= ... >= N2<i>, and repeating to the step (c).

Description

Ϊ290228

达248号: TW2483PA IX. Description of the invention: [Technical field of the invention] The present invention relates to an insulation resistance test method, and in particular to an insulation resistance test method for a test film circuit board lead [Prior Art] Traditionally, the instrument for testing the insulation resistance of a thin-film circuit board is generally an electric meter. The test rod of the electric meter is used for the wire on the thin-film circuit board, but the wire and the wire are required to be used. The insulation of the board is good. Taking 24 wires as an example, the combination of 24 wires is a combination of μ, which is quite time-consuming and laborious to test, and is very inconvenient, so it is not suitable for testing on products. SUMMARY OF THE INVENTION In view of the above, the object of the present invention is to provide an insulation resistance test method, which combines a complex test combination, first deducting the part of the repeated test, and then simplifies the test by dividing the group and the number of times. Therefore, the present invention can effectively test the insulation resistance of all the wires with each other with a minimum of the number of measurements - the number of people. In accordance with the purpose of the present invention, an insulation resistance test method for testing the insulation resistance of the purlin wires to each other is proposed. The insulation resistance test method includes: (a) for the wires of the first to the μth, defining the conditions of the crucible Satisfy: 2η &lt; Μ ~2 ' and η is a positive integer; (b) The slats are sequentially divided into 21 groups with the closest number of wires, the initial value of i is 1, and the number of wires of each group is respectively Ν1, Ν2, and Ν1-Ν2; (c) short-circuit the wires of the 21 groups with the odd-numbered groups and the even-numbered groups; (d) test the insulation resistance values between the wires of the odd-numbered group and the even-numbered group; When i is less than η+ι, i is incremented by 1; when i is greater than or equal to 1, knot 6 1290228

Sanda number: TW2483PA beam insulation resistance test method; and (f) the string wires are sequentially divided into the nearest 21 groups, the number of wires of each group is Ν1, Ν2, ... Ν21, and Ν1-Ν2-··· and repeat step (c). The above described objects, features, and advantages of the present invention will become more apparent from the aspects of the invention. The test combination, which deducts the part of the repeated test, and then simplifies the number of tests in a group-by-group manner, ensuring that all wires are insulated from each other with a minimum number of tests. Please refer to FIG. 1 , which is a flow chart of a method for testing an insulation resistance according to a preferred embodiment of the present invention. First, as shown in step 2〇1, the “strip wire to be tested defines 2\Mg2w, and “a positive integer, and n+1 represents the number of tests required to insulate the wires from each other. Then, as shown in step 2〇3, the stringer wires are sequentially divided into groups with the closest number of wires, the initial value of 丨 is 1′ and the number of wires of each group is N1 and N2, respectively, and N1 ^n2. Next, as shown in step 205, the wires numbered as odd groups in the 21 groups are shorted to each other, and the wires numbered in the even group are short-circuited to each other. Then, as shown in step 2〇7, the wires of the odd-numbered group after the short-circuit and the wires of the even-numbered group after the short-circuit are measured, whether the two are insulated, and if not, a short circuit occurs between the wires, and the end is required. test. Then, as shown in step 2〇9, if the above insulation resistance meets the requirements, it is judged whether i is smaller than η + 1, and if not, the generation and the lead wires are measured and insulated from each other, and the test can be ended. Following step 211, if i is less than η + 1, 丨 is incremented by 1. Then, as shown in step 213, the stringer wires are sequentially divided into the 21 groups whose number of wires is the closest, and the number of wires of each group is Nl, N2, N2i, and 7 1290228, respectively.

Sanda number: TW2483PA Step 205, and complete N1-N2-...-N21 according to the relevant steps mentioned above. Finally, enter the insulation resistance test of the wire. Please refer to Figure 2, which shows the arrangement of 24 wires. (4) As shown in Fig. 2, there is a Μ #, and the insulation resistance measurement method of the present invention uses the number of times to complete the above-mentioned arrangement, so as to ensure that the 24 wires are insulated from each other. For example, if the number of wires _ 24' is 2n &lt; 24f ′ and η +1 = 5 ′, therefore, the insulation resistance test method of the present invention is used to test whether or not the 24 wires are insulated from each other, only f 5

Finished test.丨』王口丨 When the first measurement, 24 wires need to be divided into 21 groups, and i=i. Therefore: 24 wires are divided into a group of groups and a group of two. The fifth group includes the first to the twelfth wires, and the second group includes the thirteenth to the twentyth wire. The first to second wires in the first group are short-circuited to each other and the thirteenth to twenty-fourth wires in the second group are short-circuited to each other. And test the insulation resistance value between the third group and the second group. If the measured insulation resistance value is greater than 1 〇〇 μω, it means that the first group and the second group are insulated from each other. That is, the wires representing the respective combinations in the region 1-1 are insulated from each other. When the second measurement is made, i=2. Therefore, 24 wires are divided into a work group, a second group, a third group, and a fourth group. The first group includes the third to the sixth wire, the second group includes the seventh to the twelfth wire, the third group includes the 13th to the 18th wire, and the fourth group includes the 19th. ~ 24th wire. All the wires in the first group and the third group are short-circuited to each other, and all the wires in the second group and the fourth group are short-circuited to each other. And measure the insulation resistance between the two. If the measured insulation resistance value is greater than 100 ΜΩ, it means that the two are mutually insulated. That is, the wires representing the respective combinations in the region 103 are insulated from each other. 8 1290228

^ Sanda number: TW2483PA • By analogy, after the third measurement, the fourth measurement, and the fifth measurement, it is known that the 24 wires are insulated from each other. That is, the wires representing the respective combinations of the regions 1 to 5, the regions 107, and the regions 109 are insulated from each other. Further, the present invention is applied to a thin film circuit board because the thin film circuit board itself has static electricity, so the insulation resistance value is limited to an experimental range of at least more than 100 Ω. In addition, the number of wires to be tested may be other, for example, 25 or 34 wires, and the film circuit board can also be applied to, for example, a digital personal assistant (PDA), a mobile phone, a notebook computer, or the like. _ A method for testing the insulation resistance disclosed in the above embodiments of the present invention, which combines the repeated test parts with the complicated test combination, and then simplifies the test by means of group division, with the least number of test times. Effectively test the insulation resistance of all the wires between each other. In quality control (QualityC〇ntr〇i), it can reduce manpower and improve product testing efficiency, which makes the product more convenient for mass production or R&D experiments. In the above, the present invention has been disclosed in the above-described preferred embodiments, and is not intended to limit the present invention. Any one skilled in the art can make various changes and modifications without departing from the invention. Therefore, the scope of the invention is defined by the scope of the appended claims. 9 1290228

Sanda No.: TW2483PA _ [Simple Description of the Drawing] FIG. 1 is a flow chart showing a method for testing an insulation resistance according to a preferred embodiment of the present invention. Figure 2 is a diagram showing the arrangement and arrangement of 24 wires. [Main component symbol description] 101, 103, 105, 107, 109: area

Claims (1)

1290228—达达· TW2483PA X. Patent application scope·· ^ %—Insulation resistance measurement method, the relationship between the wires of the poems, and the 'bar edge impedance'. The insulation resistance test method includes: Foot: II: : To the wires of the rafter, the conditions for defining Μ are required to be full of JVU2, and η is a positive integer; • () is to divide the four guides and lines into the nearest number of wires, 2 The initial value is 1, and the number of wires of each group is Ν1, Ν2, and Nd are respectively short (:). The number of the wires in the 21 groups is the odd-numbered group and the even-numbered group; (4) the test section and the The conductance of the even group, (4) the insulation resistance + 1 R 士 U) When 1 is less than 11+1, 1 is incremented by 1; when i is greater than or equal to η + 1, the insulation resistance test method is terminated; (H) The secret M wires are sequentially divided into the closest group of wire materials, and the number of wires of each wire is committed, committed, ... N2i, and repeats step (c). =N2 'Asian use two or two: The insulation resistance test method described in item 1 of the patent scope is used for measuring a thin film circuit board. Medium test:::: Patent scope 2 The insulation resistance test method has the insulation resistance value of at least 100 Μ Ω. 4. The insulation resistance test method described in the second item of the patent scope is used to measure 24 wires of the film circuit board. Please refer to the insulation resistance test method described in item 2 (4) for the measurement of the 34 wires of the film board. ', Film 2::: The insulation resistance test method described in item 2 of the patent scope, The circuit board is a thin film circuit board of a phase computer keyboard.