TWI267641B - Measuring module suitable for all kind of electric characteristics and small measuring point - Google Patents

Abstract

The present invention relates to a measuring module suitable for all kinds of electrical characteristics and small measuring point, which comprises of a carrier plate, a guide correction layer, a clamp pin layer, linear probes, first buffer components, second buffer components, stroke adjustment rods, guide posts, and a base, in which the carrier plate, the guide correction layer, and the clamp pin layer are capable of vertically lifting and descending along the same axis applying the guide posts. The linear probes are inserted into the carrier plate, the guide correction layer, and the clamp pin layer such that their inner ends are fixed at the clamp pin layer and their outer ends are located at the carrier plate position. The first buffer components and the stroke adjustment rods are disposed between the guide correction layer and the clamp pin layer, while the second buffer components are disposed between the base and the clamp pin layer such that the carrier board, the guide correction layer, and clamp pin layer all are having an elastic force, and the elastic force exerts a force of equal magnitude to each linear probe. Therefore, the measuring module creates a very small gap between the outer ends of adjacent linear probes, so that it can test micro measured objects and the testing pressure and contact resistance for each measured point is identical, further to increase the measuring stability, and similarly effectively improve damage to the measured object.

Description

1267641

[Technical Field] The present invention relates to a suitable test module, especially one that can provide higher test density and lighter measurement and can be applied to various circuit boards or [prior art] Electrical characteristics and small features Various electrical characteristics of various electronic products, test pressure and more stable test results, test modules for through-board test operations. In the way of testing, the following is a few of the following types of circuit boards for electronic products: As shown in the second and second figures of the right brother, the main system is set on the base 11 of the fixture 1 and reversed. The splint 1 3, the top plate 14 and a plurality of probes 2. Wherein, the needle plate is pre-equipped with a pinhole 21 corresponding to the point 31 to be tested of the object to be tested 3 (such as a printed circuit board), and the plurality of probes 2 are composed of a probe sleeve 21, a syringe 22, and an magazine 23 And the needle body 24 is composed. 〃 In the above, the probe sleeve 2 1 of the probe 2 is inserted into the pinhole 1 2_1 preset in the needle plate ' 2, and one end of the probe 2 is provided with a wire 4 for transmitting signals to the testing machine (Fig. The spring 23 is received in the barrel 22, and the needle 24 is inserted into the barrel 22. The elastic force of the spring 23 causes the needle body 24 to have an elastic expansion and contraction force in the barrel 22. The syringe 22 is fixed in the probe sleeve 21, and the probe 2 can be positioned on the needle plate 12. Φ The above 'the splint 13 and the top plate 14 are respectively provided with perforations 13ι, 14ι corresponding to the pinholes 121 of the needle plate 12, and the needle 24 is passed through the splint 13 and the perforations 131 of the top plate 14, [41, and protruded from the top! 4. If the object to be tested 3 is placed above the top plate 14 and the point to be tested 3 1 of the object to be tested 3 is brought into contact with the needle body 24 of the probe 2 by the test tool, the electrical signal is

1267641: Invention Description (2) Five can be sequentially transmitted to the magazine 23, the probe sleeve 21, and transmitted to the testing machine by the wire 4 connected to the bottom of the probe sleeve 21 to complete the test operation. As described above, the conventional test fixture has the following disadvantages: 1. Since the probe 2 is in contact with the point 31 to be tested of the object to be tested 3, it is necessary to have an elastic recovery elastic force to prevent damage to the point to be measured. Therefore, the needle body 24 must be disposed in the syringe 22 having the spring 23, so that the needle body can be automatically rebounded and restored after being compressed. If the structure is composed, the volume of the entire probe 2 cannot be made relatively small. Or it can be made into a relatively small hour, and its relative cost is very high, resulting in an increase in test cost and inability to increase density. (2) 2. Since the probe sleeve 21 needs to be matched with the size design of the probe 2, the size of the hairpin is limited, so that the pinhole 丨2 i of the needle plate 丨 2 can not be questioned, which will result in failure. Test the high-density to-be-measured point 3 of the object to be tested 3. 3. Because the signal to be tested of the object to be tested 3 is transmitted by the needle 24, the 7L piece 2 3, the syringe 2 2, the probe sleeve 2 J篝, and then The contact between 道, 腾 & 牛, 一,和, and a 接 _ b > a contact transmission will cause signal transmission and agricultural reduction phenomenon, which will affect the quality of the test, especially in j 迸When the point to be measured is further, the effect is better. The 8^ pin 2^ pin is a vertical type of contact with the object to be tested 3, therefore, the distance d for the adjacent probe must not be effectively reduced. Next, for the test object 3 with the measured point (that is, the point to be tested 宓wur, there will be completely impossible to implement. The mountain is more ambiguous), there is a test in the above, and there is a test fixture in this chapter. The main output is as shown in Fig. 3 and Fig. 4, and the σ is equipped with a dial 5, a reel 6, and several

Page 7 1267641 V. INSTRUCTIONS (3) 'The main components such as the linear probe 7 and several elastic elements 8. Wherein, the dial 5' and the reel 6 are stacked on each other, and the dial 5 is provided with a plurality of layers of guiding plates 5 j and a top plate 52, and the top plate 52 is provided with the object to be tested 3 to be tested. The corresponding perforation 521 of the point 31, and the perforation 511 corresponding to the top plate perforation 521 is provided on the guiding plate 51 in a vertical or oblique shape; the reel 6 is provided with upper, middle,

The lower three layers of the clamping plates 61, 62, 63 are respectively drilled with perforations 611, 621, 631 corresponding to the guiding plate perforations 511 of the dial 5, wherein the perforations 621 of the intermediate cooling plate 62 are accommodated. The elastic member 8 has a through hole 631 of the lower plate 63 for the wire 4* connected between the testing machine (not shown) and the bottom end of the elastic member 8; the linear probe 7 is along the dial 5 The top plate perforation 521, the guide plate perforation 51 and the upper plate ply perforation 6丨i are placed, and the inner end is supported by the elastic member 8 and the outer end is exposed to the dial top plate 52. The object to be tested 3 is disposed above the top plate 52 of the dial 5, and the test point 31 of the object to be tested 3 is brought into contact with the linear probe 7 by the test tool, and the electrical signal can be sequentially transmitted to the elastic state. The component 8, the wire 4, and the tester complete the test for & and the ί2? is set to 'before the above-mentioned probe needle 24 is required to be smashed, the needle 22, and the probe sleeve 21 are combined with each other. It is more simplistic and simple, and the oblique 爿 爿 ^ ^ ^ ^ ^ 线 的 线 线 虽 虽 虽 虽 虽 虽 虽 虽 虽 线 线 线 线 线 线 31 31 31 31 31 31 31 31 31 31 31 31 31 31 31 31 31 31 31 31 The scope of the Zhizhi tool has a range of 0. Because of the large application density of the Querrey; Fangkou_Shiren people, the volume needs to be smaller and smaller, and the required test is more in question, the test pressure needs to be lighter and 1, due to The linear probes 7 are vertically 盥· 。 , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , Shaped on the dial

Page 8 1267641 V. 'Inventive Note (4) 5 and let the inner end bear the corresponding elastic element 8, the complex is different from each other (the vertical probe is higher at the outer end, and the inclined probe end & Degree system 'When the object to be tested 3 is pressed, the linear probes 7 are in contact with the lower end of the sample end') However, in the case of different joints, the object to be tested is extremely dusty, and the damage or test is unstable. The situation, and this is also the most unbalanced and Mao. 7 killer rickets 2, because each of the linear probes 7 need to cooperate with an elastic f-linear probe 7 is extremely thin, and the elastic element 8 is also 'small, so the numerous small elastic elements, 35 The pair of clothing systems are also extremely troublesome, inconvenient and expensive, and the elastic force of the linear probe 7 assembled in the same way, and also causes the elastic force of each pair to be presented. A comparison test, #1 A 吏 each line probe 7 obtained test pressure with unevenness, u::J test points received ^ t r """ ^ so the test signal will still be transferred The connection a is transmitted to the test machine by the ¥4, and the transmission failure and attenuation are caused by more than 44, and there is a flaw in the quality stability of the police. Hey, in view of the above-mentioned use of the lack of care, the specials will be carefully studied and cooperated with the students. With the improvement of ° and leaves, the present invention is finally provided. [Inventive content] That is, the main eye-catching characteristics of the present invention and the measurement of the micro-measurement point are provided in the interior end system which is suitable for various types of electricity. The needle-like fruit, and, wherein, the linear probes 曰' and the pin layer is subjected to the second buffer element 1267641 5. The invention description (5) - the top bearing 'the linear probes will The test object can be tested, and the test can be carried out to improve the test. The elastic force is measured. 1 The inner end of the linear probe is configured with a bomb:::: soil. At the same time, the test is required to make the whole fixture and component of the test fixture. The way can also make it convenient, fast and economical. , the clothing repair has a more simple and simple, another object of the present invention, is a test module with a small measuring point, wherein ^ is suitable for all kinds of electrical special after the pin layer, its outer end High sound ^=The linear probes are fixed as the base, then when the test operation is carried out, the 兮蠄 and the measured objects correspond to the points to be measured at the points to be measured, naturally, 俾; :=Needle, touch and pair, contact resistance can be the same, and then: 'two, again, when the test pressure is stable: can also effectively reduce the test to be tested: the nature of the test and the small measurement point The test module, the 匕-type electric special test signal can be transmitted directly through the wire to the linear probe system, without the need to pass the JL# mediator, the quality of the test can be greatly improved. Another effect of owing to ft! is to provide higher test density and lighter test pressure and more stable test results for various electrical characteristics of various electronic products, and can be applied to various circuits. Test module for empty board or mounted board test operations. In order to enable the review committee to have a better understanding and approval of the purpose, features and functions of the present invention, the following detailed description will be given with the following figures: [Embodiment] 'First, please refer to the fifth and sixth figures' for clear display. , the invention one

1267641 V. INSTRUCTIONS (6) - A test module suitable for various electrical characteristics and with small measuring points, mainly including carrier board 1 导, guiding layer 20, pin layer 30, linear probe The main components such as the needle 7, the first cushioning member 40, the stroke adjusting column 50, the second cushioning member 6A, the guide post 7A, and the base 11 are composed. Wherein, the guiding column 7 can be connected to the four end angles of the base u, and the carrier 10, the guiding layer 20, and the pin layer 30 can be vertically raised on the same axis based on the guiding column 7 , reduce the displacement. That is, the carrier 10 is used for positioning the object to be tested 3, and the corresponding points of the to-be-measured points 3 1 of the object to be tested 3 are respectively preset with a line probe 7 Except for the jack 1 〇1; the guiding layer 20 is provided with a plurality of guiding plates 2〇1, and the guiding plates 2〇1 are mutually spaced at appropriate intervals and the positioning pin 2 1 and the carrier 1 are The tamping is integrated, and each of the guiding plates 201 is provided with a guiding hole 2 0 1 1 which is perpendicular or obliquely corresponding to the insertion hole 1〇 of the carrier 1〇; It is located on the inner side of the guiding layer 2〇, and is mainly provided with a clamping frame seat 3 〇1 and a plurality of pinch plates 3 〇2. Wherein, the positioning frame base 1 has a central portion and a receiving portion 3 〇丨丨 is disposed at the periphery; the plurality of pins J and the needle plates 302 are stacked on each other at the receiving portion 3〇11 of the positioning frame base 3〇1. And the clamping screw 32 is fixed, and the outermost pin 2 of the adjacent guiding layer 2 is fixed on the positioning frame 3, and the guiding layer is arranged on the same Μ 导 孔 孔 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 Each of the pin plates 30 2 (302,) is inserted into the guide hole 2011 of each of the guide plates 201 of the positive layer 20 and the hole 10 1 of the carrier plate 10 so that the outer end corresponds to the outer end DUT 3 to be tested 3 1, etc.

Page 11 1267641

5. Inventive Note (7) - jr is fixed on the wire 4 of the clip-on machine (not shown); the set is connected to the test and the Shuangyuan: 4Γ is provided with a plurality of Press according to the guiding layer 2. Force; 俾v positive layer 20 and the carrier 10 system has an elastic effect, and the 仃 ' '周周柱5G, according to the length between the guiding layer 2G and the pin layer 3 = = reserved Setting the spacing b, the outer end of the linear probe 7 is extended to the carrier 1 to control the pressure of the linear probe 7 to be applied to the point to be tested 31, and the ft cushioning element 60 can be It is set to be larger than the first cushioning element 40; the following: 2 = according to the elastic force provided between the pin layer 3〇 and the base 11, 俾; the straight line-shaped slave needle 7; 7 implementation The invention of the present invention is assembled by assembling one scoop of the above-mentioned smear, wherein the linear probes are: , guiding layer 2. , pin layer 3. The guiding column 7〇^ makes the stroke measuring object 杈 block 9, and the pin layer 30 is pressed down to the high sound of the one, ', grinding ± grinding plate, 俾 applied to the object to be tested 3 The points to be measured are determined to be "3"; or the surface of the object to be tested is 9 can be made strong; 7 is the position and height of the point 31 to be measured. Then, the 1 2: Each of the perforations 302 1 preset by the pin layer 30 is inserted one by one, and the corresponding guiding system tops 1, which are preset by the guiding plates 201 of the guiding layer 2, are inserted. The corresponding jack 101 of the carrier board 1 and the surface of the analog dummy block 9 and the linear probes 7 are inserted.

Page 12 1267641 V. INSTRUCTIONS (8) After positioning, the technician fixes the inner end of the electrode to the pin layer 3 〇, and the wire probe 7 can easily complete the assembly operation. " As described above, after the linear probes 7 have completed the assembly operation, the technician only needs to dispose the assembled carrier 10, the guiding layer 2, the pinch layer 3, the guiding column 70, and the like. And press the 丨丨 to the predetermined position of the pedestal, the test module of the Ming can complete the overall assembly work. ^ As described above, since the inner ends of the linear probes 7 are inserted into the corresponding through holes 302 1 of the pin layer 3, they are positioned in a fixed position instead of being self-aligned, so The fixing method is not limited, as long as it is ensured that there is no displacement phenomenon, and the surface of the pinch plate 302 of the pin layer 30 is thermally coated with a non-conductive solution or a layer of adhesive, and after the non-conductive solution or the glue is solidified, The solid linear probes 7 can be fixed; or as shown in the seventh and eighth figures, corresponding holes can be drilled at predetermined positions of the respective pin plates 3 〇 2 of the clip and the needle layer 30. To the perforations 3 0 22a, 3022b, and by the rotation of the wheel center positioning screws 32 and the mating nut 33, the pin plates 3 of the receiving portion 301 1 of the positioning frame holder 3〇 are folded. 2, can be forced to lateral displacement and the perforations 22a 30 22b correspond to the same axis, and further, when the pin plates are laterally displaced, the perforations 302 1 through which the linear probes 7 are originally provided can be caused. When the deflection is generated, the inserted linear probes 7 can be firmly bitten together to achieve a firm positioning along with the deviation of the perforations 302 1 . (As in the eighth FIG). The seniors' please cooperate with the ninth figure. The invention is to measure the object to be tested, and the object 3 is placed at the predetermined position of the carrier 10, and the test is pressed. When measuring object 3, the carrier plate 1 〇 导 guiding layer 20 will be subject to

Page 13 1267641 ... 丨 丨丨 ! 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明(4) Cap W “ • Two measuring points 31, 俾 directly measure the gas, > touch the corresponding i tiger to the test machine via the wire 4. < Tian Hao board 10, the guiding layer 20 is subjected to the test pressure遝枓 遝枓 行程 行程 行程 行程 行程 行程 50 50 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程 行程The inside of the pinhole layer 3〇 and the outer end are all connected to the open-line J:7 of the object to be tested 3, not only can be protected from damage, the force is 7 wide, and the H-line probe 7 is more In order to obtain the same elastic effect, since the linear probes 7 are assembled, the analog blocks 9 are the bases of the outer ends thereof, so that the objects are vertically or obliquely inserted into the object to be tested, and the beans are laughing. ^ μ荨次的针针7, regardless of the timing of the point μ, ";; Ί Ί ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( When the object to be tested 3 and the carrier board are 1 〇, and the guide is moved inwardly, 'these ones are smashed one by one and the bullets are coped with the test Ζ ^ I needle can be touched at the same time, upper: ―1:: mother waiting Measuring point 31 The pressures are all the same. If the test pressures are the same, the contact resistance values generated by J will be equal, and the test stability is high. The fact that the damage rate of the measured object is low is expected to be due to the fact that there is only 尨1 between the guiding layer 20 and the pin layer 30. Whole column 5. And the stroke adjusts the column 5. In addition, the distance between the transfer board 10 and the guide layer 2 is reserved, and the distance between b and the guide layer 2 is set to be: J: the above-mentioned 14th page placed on the carrier 10. 5. Description of the invention (10) • If the distance between the test object and the test object is shifted, the distance to be measured is set. In addition, the measured point to be tested 31 can be found in the same way as the above-mentioned system. In addition to the effect of high contact stability and low damage rate of the object to be tested, in particular, the distance of the inward movement of the object to be tested 3 is accurately set, and the measurement point 31 will not be caused. The internal shift distance is too large, and the damage caused by the excessive pressure contact by the linear probe 7 occurs, or the internal shift distance is too small to cause the linear probe 7 to contact and the test is poor, and further, It improves the stability of the test and achieves the effect of protecting the test object. In other words, with the stroke adjustment column 50, the distance of the object 3 to be measured can be accurately set, and the outer end of the special line probe 7 is extended and touches the distance corresponding to the point to be measured 3 1 In the case where the connection is accurately set, naturally, the pressure and contact resistance of the waiting point 3 1 will not only be identical, but also have a very high test stability. At the same time, the pressure can be moderated. Therefore, the object to be tested can be better protected and more accurate and more reliable. In the above, since the linear probes 7 are fixed to the pin layer 30, and the lost pin layer 30 is directly supported by the second cushioning member 6〇, the linear probes 7 can be identical. The elastic force is applied to each of the to-be-measured points 3 1 of the object to be tested 3, and the quality and effect of the test are further improved. In particular, the linear probes 7 do not need to be separately configured as an elastic member. In this case, the density of its phase I inter-configuration will not be affected by the specifications of the elastic element (spring) at all, but may be more densely arranged. Accordingly, the micro-measurement point (ie, to be Tests with a very small distance between adjacent points can be used to achieve full and effective use. In other words, the arrangement of the linear probes 7 is not at all limited by the elastic component specifications of the top bearing, but may be more

Page 15 1267641 V. Description of the invention (10. In the case of dense fabric: 'The size is as large as 10 m in diameter. The microprobe to diameter 3 m/m will be directly applicable to the present invention. The test module can be directly applied to each surface with micro-measurement points; slab test or mounting plate; test and other tests], 俾 (four) group value test) 竺 竺八别 i曰# & female 4 /, 耠 耠 , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , 9 and ί ̄ degrees are easy to control, in terms of assembly and maintenance, ~ / Ν疋 2 has more convenient, convenient and fast effects. Sexual element 5 $ for:::The linear probes 7 do not need to pass through the bullets separately and do not need to pass through other mediators. Therefore, for the test, it is difficult to attenuate the problem. 'In turn, it can provide 2 more accurate and accurate high quality effects. 'The present invention is applicable to all kinds of electrical characteristics and has a slight hair 'apparently with better test performance to provide 'there is a progressive and progressive patent element, I hope that the reviewer Hui Yi despise the Asian patents 'nothing Pray.

Page 16 1267641 Figure or simple description _ [Simple description of the diagram] The first diagram is a schematic diagram of the conventional test fixture (1). The second diagram is a schematic plan view of the probe configuration shown in the first figure. The third figure is a schematic diagram of a conventional test fixture (2). The fourth figure is a schematic plan view of the test operation performed in the third figure. The fifth drawing is a schematic plan view of an embodiment of the invention. Figure 6 is a schematic plan view of an embodiment of the assembled linear probe of the present invention. Figure 7 is a plan view showing an embodiment of a needle layer assembly linear probe of the present invention. Figure 8 is a plan view showing the embodiment of the fixed linear probe shown in Figure 7 . The ninth drawing is a plan view showing an embodiment of the test operation of the present invention. [Main component symbol description] Description of the conventional figure: d: distance 1 21: pinhole 13: splint 23: spring 24: needle body 1: jig 1 1 : base 12: needle plate 1 3 1 , 1 4 1 ·•Perforation 1 4 : Top probe 21 : Sleeve 2 2 : Syringe test object 31 : Point conductor to be tested 5 2 · Top plate 5 : Dial 51 : Guide plate 511 · Perforation 5 2 1 : Perforation 6 8 reel 61 linear probe elastic element 6 2, 6 3 : splint 6 1 1 , 6 2 1 , 6 3 1 : perforated

Page 17 1267641 Brief description of the diagram The description of the case number b: Spacing 3: Object to be tested 31: Point to be tested 7: Linear probe 9 ·· Dummy to be tested 10 Carrier board 1 0 1 : Jack 11 base Block 20 Guide layer 201: Guide plate 2011: Guide hole 21 Locating pin 30 Pin layer 301: Positioning frame holder 3011: Bearing portion 302, 3 0 2 ': Pin plate 30 2 1 : Perforation 3022a 32 Set screw 33 : : Nut 40 First cushioning element 50 Stroke adjustment column 60 Second cushioning element 70 Guide post 3022b : Perforation Φ

Page 18

Claims (1)

1267641 A test module S having a plurality of measuring points for various electrical characteristics and having a small measuring point, a carrier layer, a guiding layer, a pin layer, a line probe, a first buffering adjustment column, a second buffering element, The guide post, the wire and the base are composed of parts. ' Among them, the guide column is pressed against the base and can be used for the vertical rise and fall of the same axis of the carrier plate and the pin layer; the linear probe group is flushed The main part of the component temple is guided by the needle machine. The positive layer is fixed or straightened to the first part. The needle is placed at the point to be measured and a guide layer is placed. The wire-shaped test machine is used for testing the object to be tested; the wire is used for transmitting the test signal, and the wire is used for measuring: the plate is pre-set with the corresponding socket according to the point to be tested of the object to be tested; a plurality of guiding plates are arranged at an appropriate height and are integrated with each other] a guiding hole corresponding to the insertion hole of the carrier is arranged on each of the guiding plates; the pin layer is located at the guide The inner side of the positive layer, there is a perforation corresponding to the vertical or oblique direction of the guiding hole of the guiding layer; According to the 2 正 $ positive layer of the guiding layer and the pin layer, the force of the carrier plate is raised and lowered; the point to be measured of the linear probe has a plurality of branches, which are respectively inserted in the pinhole layer The positive guide hole of the positive layer and the position of the insertion hole of the carrier plate and the inner end are fixed. The second end is in the test of the object to be tested, and the corresponding end can be touched at the same time. Between the positive layer and the pin layer; 5 Γ '俾 制定 制定 制定 制定 制定 制定 制定 制定 制定 制定 制定 制定 制定 制定 制定 制定 制定 制定 制定 制定 制定 制定 制定 制定 制定 制定 制定 线 线 线 线 线 线 线 线 线 线 线 线 线 线Connected to the device: ϊί Install and fix the inner end of the linear probe; ) Shell 11' shell, test the object and press the test object on the carrier I267641_ VI. · When applying for a patent range, the carrier and the leading end are extended to a set length point, and the measured signal is transmitted to the test machine. The layer will be movable in the elastic direction, and the same elastic force can be used to directly touch the wire corresponding to the inner end of the probe to be tested simultaneously in the line shape. 2, according to the patent application scope The test module of the micro measuring point, the bit frame seat and the plurality of pin plate, the bezel is set at the periphery, and the plurality of seat supports can be secured by the outermost pin plate of the positioning screw. The electroless solution is provided after the perforation of the pinning layer is determined by the test hole having the first gas characteristic according to the first gas characteristic of the patent application and having a micro measuring point according to the patented range. Fixed. Wherein, the lost pin layer is provided with a positioning frame seat, the center is set to pass through and the pin plate is superposed on each other in the positioning frame, and the adjacent guiding layer frame is placed on the pin plate The corresponding perforator is vertically or obliquely placed. Or the two items are applicable to various types of electric groups, wherein the linear probe is disposed on the surface of the pin layer and is thermally covered with a layer 4, which is applicable to various types according to the first or second aspect of the patent application scope. A test module having electrical characteristics and having a small measuring point, wherein the linear probe is disposed on the surface of the pin layer and is covered with a layer of adhesive on the surface of the pin layer. ^ Product 5, according to the scope of claim 1 or 2 of the test module applicable to various electrical characteristics and has a small measuring point, wherein the pin plate of the pin layer can be drilled at a predetermined position Corresponding and different hole spacing deviation perforation, and = wheel center positioning screw is threaded one by one and the matching nut is locked, the pin plates on the clamping frame seat will be laterally displaced, and the wire is supplied Probe Page 20