TWI256468B - Defect source identifier - Google Patents
Defect source identifierInfo
- Publication number
- TWI256468B TWI256468B TW090124340A TW90124340A TWI256468B TW I256468 B TWI256468 B TW I256468B TW 090124340 A TW090124340 A TW 090124340A TW 90124340 A TW90124340 A TW 90124340A TW I256468 B TWI256468 B TW I256468B
- Authority
- TW
- Taiwan
- Prior art keywords
- defect
- information
- source identifier
- defect source
- client
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US23729700P | 2000-10-02 | 2000-10-02 | |
US09/905,607 US6701259B2 (en) | 2000-10-02 | 2001-07-13 | Defect source identifier |
Publications (1)
Publication Number | Publication Date |
---|---|
TWI256468B true TWI256468B (en) | 2006-06-11 |
Family
ID=26930528
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW090124340A TWI256468B (en) | 2000-10-02 | 2001-10-02 | Defect source identifier |
Country Status (5)
Country | Link |
---|---|
EP (1) | EP1322941A2 (zh) |
KR (1) | KR20020063582A (zh) |
CN (1) | CN1398348A (zh) |
TW (1) | TWI256468B (zh) |
WO (1) | WO2002029392A2 (zh) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI386643B (zh) * | 2009-04-17 | 2013-02-21 | Chipmos Technologies Inc | 晶圓缺陷標示系統 |
TWI709182B (zh) * | 2017-01-18 | 2020-11-01 | 荷蘭商Asml荷蘭公司 | 用於知識推薦及缺陷分類之伺服器及其方法 |
TWI757907B (zh) * | 2020-10-07 | 2022-03-11 | 財團法人國家實驗研究院 | 一種在真空環境中叢集式即時線上製程暨分析傳輸系統 |
TWI793128B (zh) * | 2017-05-17 | 2023-02-21 | 以色列商應用材料以色列公司 | 用於偵測製造製程缺陷之方法、電腦程式產品及系統 |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004031690A (ja) * | 2002-06-26 | 2004-01-29 | Agilent Technologies Japan Ltd | データ解析装置 |
US6885977B2 (en) * | 2002-12-20 | 2005-04-26 | Applied Materials, Inc. | System to identify a wafer manufacturing problem and method therefor |
US7208328B2 (en) * | 2004-03-16 | 2007-04-24 | Macronix International Co., Ltd. | Method and system for analyzing defects of an integrated circuit wafer |
CN103439346B (zh) * | 2004-10-12 | 2017-10-20 | 恪纳腾技术公司 | 用于分类样品上的缺陷的计算机实现的方法和系统 |
US7570796B2 (en) | 2005-11-18 | 2009-08-04 | Kla-Tencor Technologies Corp. | Methods and systems for utilizing design data in combination with inspection data |
JP4882505B2 (ja) * | 2006-05-19 | 2012-02-22 | 東京エレクトロン株式会社 | 異物分布パターンの照合方法及びその装置 |
US9659670B2 (en) | 2008-07-28 | 2017-05-23 | Kla-Tencor Corp. | Computer-implemented methods, computer-readable media, and systems for classifying defects detected in a memory device area on a wafer |
US8775101B2 (en) | 2009-02-13 | 2014-07-08 | Kla-Tencor Corp. | Detecting defects on a wafer |
JP5570530B2 (ja) * | 2009-02-13 | 2014-08-13 | ケーエルエー−テンカー コーポレイション | ウェハー上の欠陥検出 |
US8781781B2 (en) | 2010-07-30 | 2014-07-15 | Kla-Tencor Corp. | Dynamic care areas |
US9170211B2 (en) | 2011-03-25 | 2015-10-27 | Kla-Tencor Corp. | Design-based inspection using repeating structures |
US9087367B2 (en) | 2011-09-13 | 2015-07-21 | Kla-Tencor Corp. | Determining design coordinates for wafer defects |
US8831334B2 (en) | 2012-01-20 | 2014-09-09 | Kla-Tencor Corp. | Segmentation for wafer inspection |
US8826200B2 (en) | 2012-05-25 | 2014-09-02 | Kla-Tencor Corp. | Alteration for wafer inspection |
US9189844B2 (en) | 2012-10-15 | 2015-11-17 | Kla-Tencor Corp. | Detecting defects on a wafer using defect-specific information |
US9053527B2 (en) | 2013-01-02 | 2015-06-09 | Kla-Tencor Corp. | Detecting defects on a wafer |
US9134254B2 (en) | 2013-01-07 | 2015-09-15 | Kla-Tencor Corp. | Determining a position of inspection system output in design data space |
US9311698B2 (en) | 2013-01-09 | 2016-04-12 | Kla-Tencor Corp. | Detecting defects on a wafer using template image matching |
WO2014149197A1 (en) | 2013-02-01 | 2014-09-25 | Kla-Tencor Corporation | Detecting defects on a wafer using defect-specific and multi-channel information |
US9865512B2 (en) | 2013-04-08 | 2018-01-09 | Kla-Tencor Corp. | Dynamic design attributes for wafer inspection |
US9310320B2 (en) | 2013-04-15 | 2016-04-12 | Kla-Tencor Corp. | Based sampling and binning for yield critical defects |
US10114368B2 (en) * | 2013-07-22 | 2018-10-30 | Applied Materials Israel Ltd. | Closed-loop automatic defect inspection and classification |
CN103606529B (zh) * | 2013-10-23 | 2016-08-24 | 上海华力微电子有限公司 | 一种提升缺陷分类准确度的方法及装置 |
US9286675B1 (en) * | 2014-10-23 | 2016-03-15 | Applied Materials Israel Ltd. | Iterative defect filtering process |
US10620135B2 (en) * | 2017-07-19 | 2020-04-14 | Kla-Tencor Corp. | Identifying a source of nuisance defects on a wafer |
TWI815195B (zh) * | 2021-10-13 | 2023-09-11 | 瑞霸生技股份有限公司 | 電化學檢測之起始時間判斷方法 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5761064A (en) * | 1995-10-06 | 1998-06-02 | Advanced Micro Devices, Inc. | Defect management system for productivity and yield improvement |
US6542830B1 (en) * | 1996-03-19 | 2003-04-01 | Hitachi, Ltd. | Process control system |
US6408219B2 (en) * | 1998-05-11 | 2002-06-18 | Applied Materials, Inc. | FAB yield enhancement system |
-
2001
- 2001-10-02 TW TW090124340A patent/TWI256468B/zh active
- 2001-10-02 CN CN01802992A patent/CN1398348A/zh active Pending
- 2001-10-02 KR KR1020027007062A patent/KR20020063582A/ko active IP Right Grant
- 2001-10-02 EP EP01977451A patent/EP1322941A2/en not_active Ceased
- 2001-10-02 WO PCT/US2001/031029 patent/WO2002029392A2/en active Application Filing
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI386643B (zh) * | 2009-04-17 | 2013-02-21 | Chipmos Technologies Inc | 晶圓缺陷標示系統 |
TWI709182B (zh) * | 2017-01-18 | 2020-11-01 | 荷蘭商Asml荷蘭公司 | 用於知識推薦及缺陷分類之伺服器及其方法 |
US11650576B2 (en) | 2017-01-18 | 2023-05-16 | Asml Netherlands B.V. | Knowledge recommendation for defect review |
TWI793128B (zh) * | 2017-05-17 | 2023-02-21 | 以色列商應用材料以色列公司 | 用於偵測製造製程缺陷之方法、電腦程式產品及系統 |
TWI757907B (zh) * | 2020-10-07 | 2022-03-11 | 財團法人國家實驗研究院 | 一種在真空環境中叢集式即時線上製程暨分析傳輸系統 |
Also Published As
Publication number | Publication date |
---|---|
WO2002029392A3 (en) | 2002-06-06 |
EP1322941A2 (en) | 2003-07-02 |
CN1398348A (zh) | 2003-02-19 |
WO2002029392A2 (en) | 2002-04-11 |
KR20020063582A (ko) | 2002-08-03 |
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