TWI230571B - Reference hole boring machine, and method for estimating guide mark coordinates for multilayer printed circuit board - Google Patents

Reference hole boring machine, and method for estimating guide mark coordinates for multilayer printed circuit board Download PDF

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Publication number
TWI230571B
TWI230571B TW092128690A TW92128690A TWI230571B TW I230571 B TWI230571 B TW I230571B TW 092128690 A TW092128690 A TW 092128690A TW 92128690 A TW92128690 A TW 92128690A TW I230571 B TWI230571 B TW I230571B
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Taiwan
Prior art keywords
coordinate
mark
wiring board
printed wiring
observation
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TW092128690A
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Chinese (zh)
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TW200415976A (en
Inventor
Masatoshi Araki
Tsutomu Saito
Original Assignee
Muraki Kk
Seiko Precision Kk
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Publication of TW200415976A publication Critical patent/TW200415976A/en
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Publication of TWI230571B publication Critical patent/TWI230571B/en

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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0011Working of insulating substrates or insulating layers
    • H05K3/0044Mechanical working of the substrate, e.g. drilling or punching
    • H05K3/0047Drilling of holes
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B26HAND CUTTING TOOLS; CUTTING; SEVERING
    • B26FPERFORATING; PUNCHING; CUTTING-OUT; STAMPING-OUT; SEVERING BY MEANS OTHER THAN CUTTING
    • B26F1/00Perforating; Punching; Cutting-out; Stamping-out; Apparatus therefor
    • B26F1/16Perforating by tool or tools of the drill type
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0266Marks, test patterns or identification means

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Forests & Forestry (AREA)
  • Mechanical Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)
  • Perforating, Stamping-Out Or Severing By Means Other Than Cutting (AREA)
  • Control Of Cutting Processes (AREA)
  • Drilling And Boring (AREA)

Abstract

The objective of the present invention is to estimate true coordinates for a guide mark, with the effect of altitude removed out of a guide mark X-ray image formed on a multilayer printed circuit board conductor layer. To solve the problem, a guide mark M formed in a conductor layer in a multilayer printed circuit board 60 is irradiated with X-rays emitted radially and linearly from an X-ray source A which is virtually a point. An image Z is formed on a fluorescent plane of an X-ray camera positioned directly under the guide mark M, and an x-coordinate c1 and a y-coordinate d1 are determined for the image Z. Relative to the X-ray camera, the wiring board is moved by L1 in the x-direction and by L2 in the y-direction for the guide mark M to move to the position M2. Then an x-coordinate c2 and a y-coordinate d2 are determined for the image Z2 of the guide mark M2. The coordinates (Lx, Ly) estimated for the guide mark M, which are calculated by using the guide mark coordinates estimation formulas [Lx=L1xc1/(c2-c1), Ly=L2xd1/(d2-d1)] in reference to (c), (d), are not affected by the distance between the guide mark M and the X-ray camera fluorescent plane.

Description

1230571 (1) 玖、發明說明 【發明所屬之技術領域】 本發明是關於一種由將形成在構成多層印刷配線板內 層的各導體層的標記藉由X線照射所形成的像的觀測値推 定多層印刷配線板的配線圖案的配置,形成基準孔的基準 孔開孔機。 【先前技術】 Φ 最近,隨著1C晶片、電阻、電容器等的表面安裝用的 電子零件的小型化,也高密度化被要求安裝這些的印刷配 線板,而很多被多層化者。在民生用也使用著導體層數多 達四層或六層等的多層印刷配線板,而在產業用則使用著 更多層數的高多層印刷配線板的趨勢。 多層印刷配線板是由露出於表背兩層的外部的導體層 ,及數層未露出的內層的導體層所構成,絕緣性的基板被 插入在各導體層之間,藉由該基板而成爲導體層被黏接的 0 構造。 作爲多層印刷配線板的導體層,例如使用著厚度J 8 μ m左右的銅箔。 作爲基板材料,使用熱硬化性的玻璃、環氧樹脂成爲 主流,在局多層配線板也使用著玻璃、聚醯亞胺樹脂、玻 璃BT樹脂等的耐熱樹脂。 多層印刷配線板是六層以上者僅是內層的導體數較多 之故,因而作爲多層印刷配線板的製造法,以下參照第i 〇 »5- (2) 1230571 圖及第1 1圖,簡單地說明六層的多層印刷配線板的製造法 〇 第1 0 ( a )圖是模式地表示六層配線板之構成的立體 圖;第1 〇 ( b )圖是模式地表示形成於成爲內層的兩面配 線板的導體部分的印刷圖案的俯視圖。第1 〇 ( C )圖是表 示被使用在下述結層之際的工模板的側視圖。第1 1圖是表 示六層配線板的斷面的(a )是熱壓製工程前的狀態,(b )是表示藉著熱壓製經熱硬化經熱硬化黏接而成爲一枚多 層配線板的狀態。 如第1 〇 ( a )圖所示地,六層的多層配線板6 0是在雙 層露出的導體層6 2、6 2,及成爲內層的兩枚兩面印刷配線 板6 1、6 1之間夾著基板材料6 4、6 4 a、6 4所形成。 在構成內層的兩面印刷配線板6 1、6 1,通常藉由蝕刻 形成有成爲最終製品(在圖中爲六個的)單一配線板圖案 61a,.........6 la等形成在表背銅箔面。 定位用的至少兩個導孔6 5、6 5事先開設在上述的兩面 配線板6 1、6 1,而以該導孔6 5、6 5作爲基準形成有表背兩 面的圖案6 1 a,.........6 1 a等之故,因而兩面印刷配線板6 1 、6 1的表背的圖案,是平面上互相地保持其位置。如此地 在兩枚的兩面配線板6 1、6 1使用相同座標位置的導孔6 5、 65形成有圖案61a,.........61a等。 在形成於作爲內層板的兩面印刷配線板6 1的圖案,除 了單一配線板的圖案6 1 a,.........6 1 a之外,準備有複數個 使用於後續工程的基準孔用的標記66、66 (中央部兩部位 -6- (3) 1230571 )或是標記66b,.........66b (在各角四個部位),及 表背識別用的基準孔的位置的標記66a,以鈾刻工程 成此等標S己。 重疊複數枚的經蝕刻的內層用兩面印刷配線板, 確排齊形成在各該配線板的導體部的圖案的位置關係 結層(Layup)。 準備設置兩支銷6 8 a、6 8 a的工模板6 8。管腳6 8 a 的中心距離是相等於將圖案6 1 a,.........6 1 a等形成在 印刷配線板6 1時所使用的導孔6 5、6 5的中心距離。 在一枚經蝕刻的兩面基板6 1的導孔6 5、6 5插通工 68的銷68a、68a而放置在工模板68上。在其上面載置 導孔6 5、6 5的加熱前的基板材料6 4 a。又,在另一枚 面基板6 1的導孔6 5、6 5插通工模板6 8的銷6 8 a、6 8 a而 在工模板6 8上。在該階段暫時固定兩枚兩面基板6 }、 其中間的基板材料6 4 a的外周而完成結層。 如第1 1 ( a )圖的剖視圖所示地,在經結層的兩 面印刷配線板6 1、6 1的兩側隔著基板材料6 4、6 4與導 料的銅范62、62而以熱壓製施以加壓加熱,則被插入 箔62或兩面基板61之間的基板材料64、64a、64被熱 而變化成(絕緣)基板6 3,而也完成各導體間的黏接 爲表示於第1 1 ( b )圖的一枚多層印刷配線板6 〇。 之後’開設對應多層印刷配線板60的內層圖案的 準孔’以該新基準孔作爲基準進行最外層的導體配線 的蝕刻通孔的開孔加工。又,施以鍍工程,防銹處理 表示 也形 並正 稱爲 、6 8 a 兩面 模板 開設 的兩 重疊 61與 枚兩 體材 在銅 硬化 ,成 新基 圖案 工程 (4) !23〇571 等,以機械加工分割成單一配線板,並切成所需外形形狀 即完成多層印刷配線板。 爲了避免混亂,將使用於結層用的定位用孔稱爲導孔 ’而在熱壓製以後的工程所使用的定位用孔稱爲基準孔。 如上所述地,在形成於內層板的圖案,除了單一配線 板的圖案6 1 a,.........6 1 a之外,準備基準孔所用的複數個 標記66、66、6 6a等而在蝕刻工程中該標記也被蝕刻。此 些標記的座標是與單一配線板的圖案6 1 a,.........6 1 a定位 保持成某一位置關係之故,因而若測定此些標記的位置, 就可判明構成電路的圖案的座標。 爲了開設對應於形成在上述多層基板60的內層的標記 66、66的新基準孔,通常是使用X線基準孔開孔機。 如上所述,在熱壓製被加壓加熱的多層基板的表背兩 外面是以無垢的導體層所覆蓋,不可能明瞭地透視以肉眼 使用可視光線形成於內層的標記。 現在一般以微弱X線透視多層基板,測定形成在內層 板的標記位置的方式。 通常,標記是最少形成在結層的一組內層板的任一枚 的導體層。以具體地數値表示內層板的變形程度的方式, 標記是在互相隔開的位置至少形成兩個。 在最近,爲了捕捉內層板的各處變形有增加標記的個 數的趨勢’如在弟10圖以記號作爲66b,.........66b所示地 ,在一導體層的四角隅形成標記,在平面正交的二方向可 測定變形程度。(例如,第1 〇圖中表示四個標記的例子) -8- 1230571 在製造多層基板爲了在熱壓製被加壓加熱,無法避免 內層板的多少變形’內層板的標記也與當初所設定的座標 有所不同。標記間的距離也與設計値不相同的情形較多: 但是,在後續工程所使用的基準孔是被插通在設於工 模板的銷加以使用之故’因而將基準孔的中心距離,亦即 基準孔間隔與工模板的銷的間隔作成相等在實用上較方便 。如此地,基準孔的中心距離作成所定的基準孔間隔地打 開基準孔的方式是被稱爲篩分方式。同時地所使用的基準 孔數是任意地選擇兩個以上也可以。 又,藉由在後續工程所使用的工模板的特性,設於內 層板的標記與實際上被穿孔的基準孔,是位置、個數均大 都不相同。又,基準孔爲兩個時,在表背識別用也可再追 加一個基準孔,而爲了插入在工模板的銷的基準孔的摩耗 變形,依後續的工程數也有預先開設好幾組基準孔的情形 〇 現在將設計多層印刷配線板的導體層的圖案時所使用 的座標系稱爲設計座標系統。形成於導體層的標記的座標 値是以該設計座標系統分別表示。 又,假設被固定在開孔機的框體等的不動部,且具有 平行於主構成要素的運動方向的座標軸的機械座標系統。 第2(d)圖是表示座標軸爲Vd與Ud,座標原點爲〇d的設 計座標系統,及設定於開孔機的機械座標系統(座標軸 Xm,Ym,原點Om )的關係的一例子。在這裏,在觀測裝 置的視野又設定有(局部)座標系(X,Y,Ο )。 -9- (6) 1230571 在第2 ( d )圖中,形成基準孔的多層印刷配線板6 〇被 設定在開孔機。形成於內層板的複數個標記是被收容於形 成在配線板6 0的角隅的標記框2 1內。內部導體層的配線圖 案是與配線板6 0的外形無關,而在該狀態下,設計座標系 統的原點〇 d的位置與座標軸的傾斜(0 )是未知。 例如,當以X線透視標記而使用X線攝影機來觀測標 記的像,則作爲各標記的開孔機上的位置,得到以機械座 標系統所表示的座標値。統計學地處理該座標値,求出設 計座標系統的座標原點的座標與座標軸的方向的最正確數 値,則以設計座標系統所表示的基準孔座標也可換算成機 械座標系統的座標。基準孔的位置以機械座標系統顯示, 則移動裝設基準孔用鑽頭的心軸,就可進行基準孔的開孔 〇 基準孔開孔機是從標記的像的座標的測定値,內設推 測上述設計座標系統的要素(原點〇d與座標軸的傾斜度 Θ )的計算手段,也提案爲此的各種計算方式。 最近的多層印刷配線板是能記錄各層狀態的方式,分 別將標記配置於各內層的所有導體層,形成有該標記被集 合在一框內的標記群,而以觀測裝置的一次觀測,取進各 層的資訊的情形較多。 通常,此種標記群合計四部位以上(至少三部位)設 於內層板的四角隅等。開孔機是觀測此些的標記群,能將 所有內層板的整個圖案作成最少失常的狀態下,來決定內 層板的座標(設計座標系統的原點位置與座標軸的傾斜度 -10- 7 1230571 在第1 〇圖、第1 1圖所例示的多層印刷配線板是僅具有 六層左右的層數。現實上所使用的多層印刷配線板的層數 是有增加趨勢,主流的層數也達到1 〇數層以上的狀況。 增加層數,則增加多層印刷配線板的厚度,而形成在 各層的標記的厚度方向的位置的相差也變大。 被使用在觀測標記的X線是通常從視爲點光源的光源 出射,一面放射狀地擴散一面透過多層印刷配線板,而將 標記影子的像形成在X線攝影機的螢光面。 攝影機正下方以下是X線傾斜地碰到標記,而標記的 像是大小與位置被放大。 螢光面與標記的距離是在內層的厚度方向的位置不相 同,若該位置的相差較大,則所觀測的標記的座標誤差變 大。 作爲一例子,第3 ( a )圖是模式地表示X線源的X線 發生管4a與X線攝影機6及多層印刷配線板60的關係;形成 於X線螢光增倍管30的螢光膜31的標記的像被取進CCD攝 影元件3 5。 像是被放大成L2/L1,而座標値也以同一比率被放大 。該趨勢是表不於第3(b)圖的角度α愈大,表示於第3 (c)圖的標記(Β1 .........Β4 )間的厚度方向的距離(tl 及12 )愈大則表示誤差會增加。 本發明人是對於如圖示於第1 2圖、第1 3圖的標記框內 的標記的配置提案日本特開2 0 0 1 - 1 6 8 5 3 7號。 (8) 1230571 第1 2圖是表示標記框內的標記框內的標記的配置而斷 裂標記框附近的一部分並除去基板,基板材料等的立體圖 ;第1 3圖是表示標記框附近的模式剖視圖,及標記的俯視 圖c 標記的形狀是如第1 3 ( C )圖所示地,使用將正方形 的中央圓形地除去導體的中空標記nE與圓形地留下導體的 中實標記nM的兩種類。在這裏n是表示所屬的導體層的順 序添字。 設計導體層的圖案時,在相鄰接的導體層配置成中實 標記nM與中空標記(η+1 ) Ε的重心一致。 又,中空標記nE的實體是刪除形成導體層的銅箔所形 成的中空圓形部分;中空標記nE的重心是中空圓形部分的 重心。外周的正方形是未具有作爲標記的功能。 第1 3 ( a )圖是表示從厚度方向觀看經基板材料6 3將 銅箔導體62載置於五枚兩面配線61-1、61-2、.........61-5 的表背所結層的1 2 層的多層印刷配線板6 0的剖視圖;表 示標記的配置。 例如配置使得形成於從上方第二層的導體層的中實標 記2M,及形成於第三層的導體層的中空標記3E形成兩標 記的重心位置成爲一致。 之後,配置使得形成於第三層的導體層的中實標記 3M,及形成於第四層的導體層的中空標記4E仍形成重心 位置成爲一致。 如此地在相鄰接層形成有重心一致的中實標記nM與 (9) 1230571 中空標記(η + 1 ) E,而連續地形成一直到形成於第1 0層 與第1 1層的中實標記1 0 Μ與中空標記1 1 E。 這些標記是通常在形成於多層印刷配線板的四角隅的 標記框中’作爲一例,配置成如第1 3 ( b )圖所示。 標記框是將內部分割成9個正方形,並將重心成爲一 致的中實標記η Μ與中空標記(n + 1 ) E的各一個配置在各 該正方形。作爲經實用化的大小,標記框2 1的一邊F爲大 約1 0 m m方形左右。 在被分割的各正方形內形成有各一個中實標記η Μ與 中空標記(η+ 1 ) Ε,而此以外的銅箔是全部被除去。 因此,當以X線照射標記框2 1內的標記群20,則在暗 部中,在第1 3 ( b )圖配置成三行三列的外徑d 2,內徑D 1 的圓形的(圖中爲九個的)環被觀測作爲明部。 環的外徑相當於中空標記E,而環的內徑相當於中實 標記Μ。 求出中實標記η Μ的重心座標與中空標記(^ + 1 ) Ε的 圓(明部分)的重心座標。 共通重心位置所配置的一組中實、中空標記是形成於 相鄰接的導體層之故,因而如第3 ( c )圖所示地,標記的 高度差是兩面配線板的絕對基板的厚度,或是基板材料的 厚度,該位置的χ線的照射角度[第3 ( b )圖的α ]也大約 相等。因此,中實標記ηΜ與中空標記(η+1 ) ε間的誤寒 是極少。 在每一相鄰接的層依次連續地進行該操作,則在要求 -13- (10) 1230571 精度內可得到形成於整體導體層的各標記的座標値。1230571 (1) Description of the invention [Technical field to which the invention belongs] The present invention relates to an estimation of an image formed by irradiating a mark formed on each conductor layer constituting an inner layer of a multilayer printed wiring board by X-ray irradiation. The layout of the wiring pattern of the multilayer printed wiring board is a reference hole punching machine that forms a reference hole. [Prior art] Φ Recently, with the miniaturization of 1C chips, resistors, capacitors, and other surface-mounted electronic components, higher density has been required to install these printed wiring boards, and many have been multilayered. Multi-layer printed wiring boards with up to four or six layers of conductors are also used in people's livelihoods, while high-layer printed wiring boards with more layers are used in industrial applications. The multilayer printed wiring board is composed of an outer conductor layer exposed on two front and back layers, and several inner conductor layers that are not exposed. An insulating substrate is interposed between the conductor layers. It becomes a 0 structure where a conductor layer is adhered. As a conductor layer of a multilayer printed wiring board, for example, a copper foil having a thickness of about J 8 μm is used. As the substrate material, thermosetting glass and epoxy resin have become the mainstream, and heat-resistant resins such as glass, polyimide resin, and glass BT resin have also been used in local multilayer wiring boards. The multilayer printed wiring board has six or more layers and has only a large number of conductors. Therefore, as a method for manufacturing a multilayer printed wiring board, reference is made to i 〇 »5- (2) 1230571 and Figure 11 below. The manufacturing method of a six-layer multilayer printed wiring board will be briefly explained. FIG. 10 (a) is a perspective view schematically showing the structure of the six-layer wiring board. FIG. 10 (b) is a diagram showing the formation of the inner layer. A plan view of a printed pattern of the conductor portion of the double-sided wiring board. Fig. 10 (C) is a side view showing a formwork used in the following layer formation. FIG. 11 shows (a) the cross-section of the six-layer wiring board before the hot pressing process, and (b) shows that it becomes a multi-layer wiring board by hot pressing and thermosetting and thermosetting bonding. status. As shown in FIG. 10 (a), the six-layer multilayer wiring board 60 is a conductor layer 6 2, 6 2 exposed on the double layer, and two double-sided printed wiring boards 6 1 and 6 1 which become the inner layer. The substrate materials 6 4, 6 4 a, and 6 4 are interposed therebetween. The printed wiring boards 6 1 and 61 on both sides constituting the inner layer are usually formed by etching with a single wiring board pattern 61 a, which is a final product (six in the figure), ... 6 la And so on on the front and back copper foil surfaces. At least two guide holes 6 5 and 6 5 for positioning are opened in the above-mentioned two-sided wiring boards 6 1 and 6 1 in advance, and the front and back patterns 6 1 a are formed on the basis of the guide holes 6 5 and 6 5. ......... 6 1 a etc., so the patterns on the front and back of the printed wiring boards 6 1 and 6 1 on both sides keep their positions on the plane. In this way, patterns 61a, ..., 61a, etc. are formed in the two double-sided wiring boards 6 1, 6 1 using the guide holes 6 5, 65 having the same coordinate position. A pattern of printed wiring board 6 1 is printed on both sides of the inner layer board. In addition to the patterns of single wiring board 6 1 a, ......... 6 1 a, a plurality of patterns are prepared for use in subsequent processes. 66, 66 (two parts of the central part-6- (3) 1230571) or 66b (... four parts at each corner) for the reference hole, and the front and back identification The reference mark 66a of the position of the reference hole is engraved with uranium to make these marks. A plurality of etched inner layers are printed on both sides of the printed wiring board, and the positions of the patterns formed on the conductor portions of the wiring boards are aligned to form a layer (Layup). Prepare a work template 6 8 with two pins 6 8 a and 6 8 a. The center distance of the pins 6 8 a is equal to the center of the guide holes 6 5, 6 5 used when the patterns 6 1 a, ..., 6 1 a, etc. are formed on the printed wiring board 6 1. distance. The pins 68a and 68a of the work 68 are inserted into the guide holes 65 and 65 of one of the etched two-sided substrates 61 and placed on the work template 68. A substrate material 6 4 a before heating, in which the via holes 6 5 and 65 are heated, is placed thereon. Further, pins 6 8 a and 6 8 a of the die plate 6 8 are inserted into the guide holes 6 5 and 6 5 of the other surface substrate 6 1 and the die plate 6 8. At this stage, the outer periphery of the two double-sided substrates 6} and the intermediate substrate material 6 4 a is temporarily fixed to complete the lamination. As shown in the cross-sectional view of FIG. 1 1 (a), the printed wiring boards 6 1 and 6 1 on both sides of the junction layer are sandwiched by the substrate materials 6 4 and 6 4 and the copper foils 62 and 62 of the lead. The substrate material 64, 64a, 64 inserted between the foil 62 or the two-sided substrate 61 is heated to change the (insulating) substrate 6 3 by hot pressing and pressure heating, and the bonding between the conductors is also completed as One multilayer printed wiring board 60 shown in Fig. 11 (b). After that, "the hole corresponding to the inner layer pattern of the multilayer printed wiring board 60 is opened", and the new reference hole is used as a reference to perform the opening processing of the etched through hole of the outermost conductor wiring. In addition, the plating process is applied, and the rust prevention treatment is also shaped and is called, 6 8 a. The two overlaps 61 and 2 bodies opened by the two-sided template are hardened in copper to form a new base pattern project (4)! 23〇571, etc. , Multi-layer printed wiring board is completed by cutting into a single wiring board by machining and cutting into a desired external shape. In order to avoid confusion, the positioning hole used for the bonding layer is called a guide hole, and the positioning hole used in a process after hot pressing is called a reference hole. As described above, in the pattern formed on the inner layer board, in addition to the patterns 6 1 a, ..., 6 1 a of the single wiring board, a plurality of marks 66, 66 for preparing the reference holes are prepared. , 6 6a, etc. and the mark is also etched in the etching process. The coordinates of these marks are related to the pattern of the single wiring board 6 1 a, ......... 6 1 a, and the positioning is maintained in a certain positional relationship. Therefore, if the positions of these marks are measured, it can be determined The coordinates of the pattern that makes up the circuit. In order to open new reference holes corresponding to the marks 66 and 66 formed on the inner layer of the multilayer substrate 60, an X-ray reference hole puncher is usually used. As described above, the outer surfaces of the front and back surfaces of the multi-layered substrate that is pressurized and hot-pressed are covered with a scale-free conductive layer, and it is impossible to see through the marks formed on the inner layer with visible light using the naked eye. Generally, a multi-layer substrate is seen through a weak X-ray, and the method of measuring the position of the mark formed on the inner layer is generally measured. Generally, a mark is a conductor layer of any one of a group of inner-layer boards formed at least in the junction layer. In order to specifically express the degree of deformation of the inner layer plate, at least two marks are formed at mutually spaced positions. Recently, in order to capture the deformation of the inner layer board, there is a tendency to increase the number of marks. As shown in Figure 10, the marks are 66b, ... 66b, The four corners form a mark, and the degree of deformation can be measured in two directions orthogonal to the plane. (For example, an example of four marks is shown in Figure 10.) -8- 1230571 In the manufacture of multilayer substrates, pressure is applied to heat press, and it is impossible to avoid the deformation of the inner layer board. The set coordinates are different. The distance between the marks is also different from the design: In many cases, however, the reference hole used in subsequent works is inserted through the pin provided on the work template. Therefore, the center distance of the reference hole is also That is, it is convenient in practice to make the interval between the reference holes equal to the interval between the pins of the working plate. In this way, the method of creating a predetermined reference hole at a center distance from the reference hole and opening the reference holes at intervals is called a screening method. The number of reference holes to be used simultaneously may be arbitrarily selected from two or more. In addition, due to the characteristics of the work template used in subsequent projects, the positions and numbers of the marks provided on the inner layer plate and the reference holes that are actually perforated are largely different. In addition, when there are two reference holes, an additional reference hole may be added for the front and back identification. In order to wear and deform the reference hole inserted into the pin of the work template, several sets of reference holes are preliminarily set according to the number of subsequent works. Case 0 The coordinate system used when designing the pattern of the conductor layer of a multilayer printed wiring board is now referred to as a design coordinate system. Coordinates 标记 of the marks formed on the conductor layer are represented by the design coordinate system. Also, a mechanical coordinate system that is fixed to a fixed part such as a housing of a hole punch and that has a coordinate axis parallel to the movement direction of the main component is assumed. Figure 2 (d) shows an example of the relationship between a design coordinate system with coordinate axes Vd and Ud and a coordinate origin of 0d, and a mechanical coordinate system (coordinate axes Xm, Ym, origin Om) set in a hole punching machine. . Here, the (local) coordinate system (X, Y, 0) is set in the field of view of the observation device. -9- (6) 1230571 In Figure 2 (d), the multilayer printed wiring board 60 for forming the reference hole is set in a hole punch. A plurality of marks formed on the inner layer board are housed in a mark frame 21 formed in a corner of the wiring board 60. The wiring pattern of the inner conductor layer has nothing to do with the shape of the wiring board 60, and in this state, the position of the origin d of the design coordinate system and the inclination (0) of the coordinate axis are unknown. For example, when an X-ray camera is used to observe the mark through X-ray perspective markers, the position on the hole punch of each mark is used to obtain the coordinate 値 represented by the mechanical coordinate system. The coordinate 値 is processed statistically, and the most accurate number 的 of the coordinate origin of the coordinate system of the design coordinate system and the direction of the coordinate axis is obtained. The reference hole coordinate indicated by the design coordinate system can also be converted into the coordinate of the mechanical coordinate system. The position of the reference hole is displayed by a mechanical coordinate system. The mandrel of the reference hole drill can be moved to open the reference hole. The reference hole drilling machine is based on the measurement of the coordinates of the marked image. Various calculation methods have been proposed for the calculation means of the above-mentioned design coordinate system elements (the origin θd and the inclination Θ of the coordinate axis). The most recent multilayer printed wiring board is a way to record the status of each layer. Marks are arranged on all the conductor layers of each inner layer, and a mark group is formed in which the marks are collected in a frame. There are many cases of information entering each layer. Generally, a total of four or more (at least three) such marker groups are located on the corners of the inner plate. The hole drilling machine is to observe these mark groups, and can determine the coordinates of the inner layer plate (the origin position of the design coordinate system and the inclination of the coordinate axis -10- 7 1230571 The multilayer printed wiring boards illustrated in Figures 10 and 11 have only about six layers. The number of layers of multilayer printed wiring boards used in reality is increasing, and the number of mainstream layers It also has a condition of more than 10 layers. Increasing the number of layers increases the thickness of the multilayer printed wiring board, and the difference in the thickness direction of the marks formed on each layer also becomes larger. The X-rays used to observe the marks are usually Emitted from a light source that is considered as a point light source, it diffuses radially while transmitting through a multilayer printed wiring board to form the image of the shadow on the fluorescent surface of the X-ray camera. Below the camera, the X-ray is obliquely touching the mark, and The size and position of the mark are enlarged. The distance between the fluorescent surface and the mark is different at the position in the thickness direction of the inner layer. If the difference between the positions is large, the observed mark ’s The scale error becomes larger. As an example, Fig. 3 (a) schematically shows the relationship between the X-ray generating tube 4a of the X-ray source, the X-ray camera 6 and the multilayer printed wiring board 60; The labeled image of the fluorescent film 31 of the tube 30 is taken into the CCD imaging element 35. The image is enlarged to L2 / L1, and the coordinate 値 is also enlarged at the same ratio. This trend is not shown in section 3 (b) The larger the angle α in the figure, the larger the distance (tl and 12) in the thickness direction between the marks (B1 ......... B4) shown in Figure 3 (c) indicates that the error will increase. The inventor proposes the arrangement of the marks in the mark boxes as shown in FIG. 12 and FIG. 13 Japanese Patent Laid-Open No. 2 0 0 1-1 6 8 5 3 7 (8) 1230571 No. 12 It is a perspective view showing the arrangement of the marks in the mark frame, and a part of the vicinity of the mark frame is broken, and the substrate and the substrate material are removed; FIG. 13 is a schematic sectional view showing the vicinity of the mark frame, and a plan view of the mark. As shown in Fig. 13 (C), the hollow mark nE, which removes the conductor from the center of the square, is used to leave the conductor circularly. There are two types of solid mark nM. Here n is the sequential addition of the conductor layer to which it belongs. When designing the pattern of the conductor layer, the solid mark nM and the hollow mark (η + 1) Ε are arranged on adjacent conductor layers. The center of gravity of the hollow marker nE is a hollow circular portion formed by removing the copper foil forming the conductor layer; the center of gravity of the hollow marker nE is the center of gravity of the hollow circular portion. The square on the outer periphery has no function as a marker. Figure 1 3 (a) shows the copper foil conductor 62 placed on five two-sided wirings 61-1, 61-2, .........- 5 is a cross-sectional view of a 12-layer multilayer printed wiring board 60 with a layer formed on the front and back of 5; the arrangement of marks is shown. For example, it is arranged so that the positions of the centers of gravity of the two marks formed by the solid mark 2M in the conductor layer of the second layer and the hollow mark 3E of the conductor layer in the third layer are the same. Thereafter, the positions of the center of gravity of the solid mark 3M formed on the conductor layer of the third layer and the hollow mark 4E of the conductor layer formed on the fourth layer are arranged to be the same. In this way, the solid mark nM and (9) 1230571 hollow mark (η + 1) E with the same center of gravity are formed on the adjacent junction layers, and the solid mark is continuously formed until the solid mark is formed on the 10th and 11th layers. Marker 1 0 M and hollow marker 1 1 E. These marks are usually placed in a mark frame 'formed on the corners of a multilayer printed wiring board as an example, and are arranged as shown in Fig. 13 (b). The marker frame is divided into 9 squares, and the solid center η M and the hollow marker (n + 1) E are arranged in the squares. As a practical size, one side F of the marker frame 21 is approximately 10 mm square. A solid mark η M and a hollow mark (η + 1) E are formed in each divided square, and all other copper foils are removed. Therefore, when the marker group 20 inside the marker frame 21 is irradiated with X-rays, in the dark part, the outer diameter d 2 and the inner diameter D 1 of the three rows and three columns are arranged in a circle in FIG. 13 (b). The ring (nine in the picture) is observed as the bright part. The outer diameter of the ring corresponds to the hollow mark E, and the inner diameter of the ring corresponds to the solid mark M. Find the center of gravity coordinates of the center of gravity η Μ and the circle (bright part) of the hollow marker (^ + 1) Ε. A group of solid and hollow marks arranged at a common center of gravity position are formed on adjacent conductive layers. Therefore, as shown in FIG. 3 (c), the height difference of the marks is the thickness of the absolute substrate of the two-sided wiring board , Or the thickness of the substrate material, the x-ray irradiation angle [α in FIG. 3 (b)] at this position is also approximately the same. Therefore, there are very few false colds between the solid mark ηM and the hollow mark (η + 1) ε. This operation is performed successively on each adjacent layer, and the coordinate 値 of each mark formed on the overall conductor layer can be obtained within the required accuracy of -13- (10) 1230571.

由該標記的座標値精度優異地求得導體圖案的設計座 標系統。依本發明人以最小平方法的設計座標系統的推斷 方法是在日本特開2 0 0 1 - 1 8 5 8 6 3號加以說明C 但是,在上述標記的構成中,X線攝影機的螢光面的 大小限制之故,因而可形成於一個標記框的一組標記是三 分割標記框的各邊的九組變爲限度而很難增加該以上。 因此,如第13(a)圖所示地,變爲內層1〇層,而相 加表背導體層的多層印刷配線板的層數是1 2層成爲限度 〇 如此地,依次地比較形成於相鄰接的層的標記的方法 ,是在精度上能大約滿足者,惟在各導體層必須設置兩個 標記之故,因而增加多層印刷配線板的層數而使標記的層 數增加,則在一個標記框並無法收容所有標記,而在多層 印刷配線板的各該四角隅成爲兩個以上標記框。 在內層板的配線圖案的外周部記載著內層板的名稱, 各種的識別號碼,各種標記或基準孔等,特別是其四角隅 是過密’有難以取得重新設置標記框的空間的缺點問題。 又’形成多數標記的作業,也成爲增加設計工數而有 容易增加成本的缺點問題。 又’該方法是將起因於標記的多層印刷配線板的厚度 方向的高度的誤差抑制成最少,惟很難將構成多層印刷配 線板的基板或基板材料的厚度變動等影響到標記位置的測 定値變動的程度數値式地處理。也產生將本方法顯示給使 -14- (11) 1230571 用者之際的說服力欠缺的銷售上問題ε 【發明內容】 本發明之目的是在於排除因標記與螢光面的距離變化 或平面性配置的不同所產生的標記的像的不規則移動,以 相同個數的標記框對應於更多層數的多層印刷配線板’而 能推斷各導體層的設計座標。 本發明是爲了解決如上述的問題點’提供一種基準孔 Φ 開孔機,針對於具備: 固定於基準孔開孔機的框體的架台; 具備將照射形成於多層印刷配線板的構成要件的兩面 印刷配線板的導體層的標記的χ線加以出射的χ線源’及 觀測照射標記的X線的透過所形成的標記的像的χ線攝影 機,並以架台所支撐的觀測裝置; 在多層印刷配線板開設基準孔的開孔裝置; 相對地變換多層印刷配線板與觀測裝置及開孔裝置的 φ 移送裝置;以及 由藉由觀測裝置所觀測的標記的像的觀測座標値推斷 標記的真座標値,及多層印刷配線板的設計座標系統的配 置,且控制移送裝置的控制裝置;其特徵爲: 控制裝置是具有從比被固定在觀測裝置的座標系統所 表示的第一次的標記的像的觀測座標値,及相對地移動多 層印刷配線板所定量之後所觀測的第二次的標記的像的觀 測座標値,及移動多層印刷配線板的所定量,推斷標記的 -15- (12) 1230571 真座標値的標記座標値推斷功能。 又’本發明的基準孔開孔機的標記座標値推斷功能是 將被固定於觀測裝置的座標系統的座標値所表示的第一次 的標記的像的觀測座標値的X座標作爲c 1,將y座標作 爲d 1 ;將第二次標記的像的觀測座標値的X座標作爲c 2, 將y座標作爲d2 ;並將移動移送裝置的所定量的X軸成分 作爲L1,將Y軸成分作爲L2時, 具備將上述第一次觀測時的標記的真座標値的X 座 φ 標作爲Lx,及將y座標作爲Ly,則推斷作爲Lx = Ll X c 1 / (c2-cl )及Ly = L2 X dl/ ( d2-dl )的標記的真的座標値 算出運算手段。 又,本發明是提供一種多層印刷配線板的標記座標値 的推斷方法,其特徵爲: 藉由X線源及從具備X線攝影機的觀測裝置的X線源所 出射的X線照射形成在多層印刷配線板的構成要件的印刷 配線板的導體層的標記,以X線攝影機觀測標記的像,作 φ 爲被設定在觀測裝置的座標系統的座標値得到標記的像的 座標値的第一工程; 相對地進行載置於移送裝置上的多層印刷配線板移動 所定量的第二工程; 藉著觀測裝置觀測第二工程的移動後的標記的像,並 得到第二次的標記的像的座標値的第三工程;以及 從比被固定在觀測裝置的座標系統所表示的第一次的 標記的像的觀測座標値,及相對地移動多層印刷配線板所 -16- (13) 1230571 定量之後所觀測的第二次的標記的像的觀測座標値,及移 動多層印刷配線板的所定量,推斷觀測第一次標記時的標 記的座標値的第四工程所構成。 又’本發明的多層印刷配線板的標記座標値的推斷方 法的第四工程是將被固定於觀測裝置的座標系統的座標値 所表示的第一次的標記的像的觀測座標値的X座標作爲 c 1,將y座標作爲d 1;將第二次的標記的像的觀測座標値 的X座標作爲c2,將y座標作爲d2 ;並將多層印刷配線 板的相對地移動的所定量的X軸成分作爲L 1,將Y軸成分 作爲L 2時; 將第一次觀測時的標記的真座標値的X座標作爲Lx ’及將y座標作爲L y,則推斷作爲L X = L 1 X c 1 / ( c 2 - c 1 ) 及 Ly=L2 xdl/(d2-dl)。 【實施方式】 使用以下的項目說明本發明的實施形態。 1.基準孔開孔機的構成。 2 .裝載於開孔機的觀測裝置的特徵。 3.本發明的實施形態的標記的座標値推斷式的說明 1 .基準孔開孔機的構成 觀測將標記群配置在內部的標記框,配置在配線板的 四角隅等的多層印刷配線板而形成基準孔的所謂多點篩分 -17- (14) 1230571 方式的基準孔開孔機,參照第6圖至第8圖加以說明。 第6圖是表示透視框體2的上述開孔機1的外觀的 圖。第7 ( a )圖是表示開孔機1的前視圖;第7 ( b ) 表示側視圖。第8 ( a ) ( b )圖是表示變更開孔機1的 台1 2的位置的俯視圖;第7圖及第8圖均透視框體2表 部。 又,被記入在各圖的機械座標系統(原點Ο m、 軸Xm、Ym、Zm )是被固定在開孔機1的不動部分( 框體1或架台3 )的座標系統,而移送裝置的各種機械 的移動方向是平行於該座標軸。在X線攝影機觀測多 板的標記所得到的座標値或基準孔的開孔座標基本上 用該座標系統被算出。 又,第6圖的空白箭頭17是作業人員的定位量, 人員是朝箭頭方向(Ym軸的正方向)站著,投入進 記觀測’開設基準孔的多層印刷配線板(未圖示), 工程則從開孔機1取出。 在以下說明作爲工件的多層印刷配線板是如第2 圖所示地,作爲觀測四角隅的標記框2 1.........2 1內的 群,並在從觀測値所決定的所定位置開設基準孔者。 在開孔機1的框體2內部,固定有架台3。左右一 移動架台1 〇、1 〇是大約通道狀地形成,在左右作成鏡 係的形狀。該X移動架台10、10是藉由被配置在架兰 端的直線導件l〇a、10a被支撐。藉由球形螺絲10b與 裝於與此卡合的X移動架台1 0的下面球形螺帽(未圖 立體 圖是 可動 示內 座標 例如 部分 層基 也使 作業 行標 終了 (d ) 標記 對X 像關 ί 3上 被安 示) •18- (15) 1230571 ’依照開設基準孔的配線板的大小,事先在χ m軸平行地 移動使得標記待機在可觀測的位置。 又’爲了個別地驅動X移動架台1 〇、1 〇,球形螺絲 l〇b是配置在每一各X移動架台1〇。 在X移動架台10、10的上部固定有X線發生裝置4、4 ’而在下部安裝有直線導件11a、11a。又,γ移動架台11 、1 1以該直線導件1 1 a所支撐。藉由球形螺絲1丨b及被安裝 於與此卡合的Y移動架台1 1下面的球形螺帽(未圖示), Y移動架台1 1、1 1是在Y m軸可平行地移動。 Y移動架台11、11是通道狀地形成。在上部配置有X 線防護管5,如第7圖所示地,與此並排地設有夾盤9與上 下’移動夾盤9的氣缸9 a。在下部固定有心軸7與X線攝影 機6。 藉由與Ym軸平行地配置且被固定在框體中央部分的 直線導件12a與球形螺絲12b被支撐,並被驅動而裝載多層 印刷配線板的可動台1 2是在Y m軸平行地運動。 可動台12是在12 A的位置,裝載開設基準孔的工件的 多層印刷配線板,沿著Ym軸移動到達標記測定,開設基 準孔位置。 又’驅動球形螺絲丨〇 b、丨I b、1 2 b,並控制X移動架 台10、10與Y移動架台;Π、Η及可動台12的移動的控制裝 置是並未圖示。 在這裏,作爲開孔機的主要構成要件,以X線發生裝 置9與X線防護管5及X線攝影機6形成標記的觀測裝置;以 -19- (16) 1230571 心軸7與夾盤9形成開孔裝置;以X移動架台1 Q與Y移動架 台1 1及可動台12及支撐這些,並驅動的直線導件10a、1 la 、1 2 a,球形螺絲1 0 b、1 1 b、1 2 b等形成驅動裝置。 又,未圖示的控制裝置,通常是由CPU ,記憶裝置, 序列器等所構成,依照一連串的作業順序,進行上述的各 種裝置的控制。又,從在觀測裝置所觀測的標記的X線像 算出座標値,並從該座標値與事先所輸入的基準孔的設計 座標,也進行開設基準孔位置的計算。依下述的本發明的 實施形態的標記的座標値推斷式的運算也在控制裝置內進 行。 說明將四個標記框2 1.........2 1形成在四角隅的表示於 第2 ( d )圖的多層印刷配線板60的觀測方法。 首先,從欲開孔的配線板的外形尺寸與(設計上的) 標記框2 1.........2 1的座標値決定X移動架台1 〇、1 0的沿著From the coordinates of the mark, the design coordinate system of the conductor pattern is obtained with excellent accuracy. The inference method of designing a coordinate system by the inventor using the least square method is described in Japanese Patent Application Laid-Open No. 2 0 0 1-1 8 5 8 6 3 However, in the structure of the above mark, the fluorescent light of the X-ray camera Because the size of the surface is limited, a set of marks that can be formed in one mark frame is a limit of nine groups on each side of a three-division mark frame, and it is difficult to increase the above. Therefore, as shown in FIG. 13 (a), the number of layers is 10 for the inner layer, and the number of layers of the multilayer printed wiring board with the front and back conductor layers added is 12 and the limit becomes 0. In this way, the comparison is made sequentially The method for marking on adjacent layers can meet the requirements in accuracy, but two markers must be provided for each conductor layer. Therefore, the number of layers of the multilayer printed wiring board is increased to increase the number of layers. However, not all marks can be accommodated in one mark frame, and each of the four corners of the multilayer printed wiring board becomes two or more mark frames. On the outer periphery of the wiring pattern of the inner layer board, the name of the inner layer board, various identification numbers, various marks or reference holes are recorded, especially the corners are too dense. There is a problem that it is difficult to obtain space for resetting the marking frame. . Moreover, the operation of forming a large number of marks also has the disadvantage of increasing the number of design work and increasing the cost easily. Also, this method minimizes the error in the thickness direction of the multilayer printed wiring board due to the mark, but it is difficult to affect the measurement of the mark position due to variations in the thickness of the substrate or substrate material constituting the multilayer printed wiring board. The degree of change is handled numerically. It also creates a sales problem that shows that this method is inadequate for the user -14- (11) 1230571. [Summary of the Invention] The object of the present invention is to eliminate the change in the distance or the plane due to the distance between the mark and the fluorescent surface. The irregular movement of the mark image generated by the difference in the configuration may correspond to a multilayer printed wiring board with a higher number of layers with the same number of mark frames, and the design coordinates of each conductor layer can be inferred. The present invention is to solve the above-mentioned problems, and to provide a reference hole Φ hole punching machine, which is provided with: a frame fixed to the frame body of the reference hole punching machine; An X-ray camera for observing the X-ray source of the conductor layer of the printed wiring board on both sides, and an X-ray camera for observing the image of the mark formed by the transmission of the X-ray of the irradiation mark, and an observation device supported by a stand; Opening device for opening a reference hole on a printed wiring board; φ transfer device for relatively changing the multilayer printed wiring board to the observation device and the opening device; and inferring the trueness of the mark from the observation coordinates of the image of the mark observed by the observation device The arrangement of the coordinate system and the design coordinate system of the multilayer printed wiring board, and a control device that controls the transfer device; It is characterized in that the control device has the first mark indicated by the coordinate system fixed to the observation device Observation coordinates 値 of the image, and observation of the second mark image observed after moving relative to the multilayer printed wiring board Zhi coordinate, and moves the multilayer printed wiring board quantitative, inferred labeled -15- (12) 1230571 true coordinates of the marker coordinate Zhi Zhi estimating function. In addition, the mark coordinate 标记 estimation function of the reference hole punching machine of the present invention is to set the X coordinate of the observation coordinate 値 of the first marked image represented by the coordinate 値 of the coordinate system fixed to the observation device as c 1, Let the y-coordinate be d 1; the X-coordinate of the observation coordinate 値 of the second-labeled image be c 2, and the y-coordinate be d2; and the quantitative X-axis component of the mobile transfer device be L1 and the Y-axis component When it is L2, it is assumed that the X coordinate φ of the true coordinate 値 of the mark at the first observation is Lx, and the y coordinate is Ly, and it is inferred as Lx = Ll X c 1 / (c2-cl) and Ly = L2 X dl / (d2-dl) The true coordinates of the mark. In addition, the present invention provides a method for estimating a mark coordinate 値 of a multilayer printed wiring board, which is characterized in that an X-ray source and an X-ray source emitted from an X-ray source of an observation device including an X-ray camera are formed on a multilayer. The first step of the marking of the conductor layer of the printed wiring board, which is a component of the printed wiring board, is to observe the marked image with an X-ray camera, and set φ to the coordinates of the coordinate system of the observation device. ; Relatively perform the second project determined by the movement of the multilayer printed wiring board mounted on the transfer device; Observe the coordinates of the second labeled image by the observation device after the movement of the second project The third process of ;; and from the observation coordinates 比 of the first marked image which is fixed to the coordinate system of the observation device, and the multilayer printed wiring board is moved relative to -16- (13) 1230571 after quantitative Observed coordinate 値 of the image of the second mark to be observed, and the measured amount of the moving multilayer printed wiring board, to estimate the position of the coordinate 値 of the mark when the first mark was observed. Project posed. The fourth process of the method for estimating the mark coordinate 値 of the multilayer printed wiring board of the present invention is the X coordinate of the observation coordinate 値 of the first mark image represented by the coordinate 値 of the coordinate system fixed to the observation device. Let c be the y coordinate as d 1; the X coordinate of the observation coordinate 値 of the second labeled image be c2 and the y coordinate as d2; and the relative X of the multilayer printed wiring board to move relative to each other. When the axis component is L 1 and the Y axis component is L 2; the X coordinate of the marked true coordinate 标记 at the first observation is Lx 'and the y coordinate is L y, it is inferred as LX = L 1 X c 1 / (c 2-c 1) and Ly = L2 xdl / (d2-dl). [Embodiment] An embodiment of the present invention will be described using the following items. 1. The structure of the reference hole drilling machine. 2. Features of an observation device mounted on a hole punch. 3. Explanation of Coordinates and Inferred Formulas of Marks in the Embodiment of the Present Invention 1. Observation of the structure of the reference hole punching machine The mark frame in which the mark group is arranged and the multilayer printed wiring board such as the corners of the wiring board The so-called multi-point screening -17- (14) 1230571 method of forming a reference hole is described with reference to FIGS. 6 to 8. Fig. 6 is a view showing the appearance of the above-mentioned hole punching machine 1 of the casing 2. Fig. 7 (a) is a front view showing the punching machine 1; Fig. 7 (b) shows a side view. Figures 8 (a) (b) are plan views showing the positions of the stage 12 of the hole punching machine 1 are changed; Figures 7 and 8 both see through the surface of the housing 2. In addition, the mechanical coordinate system (origin 0 m, axis Xm, Ym, Zm) recorded in each figure is a coordinate system fixed to the fixed part (frame 1 or stand 3) of the hole punching machine 1, and the transfer device The movement direction of the various machines is parallel to the coordinate axis. The coordinate 値 or the opening coordinate of the reference hole obtained by observing the marks of the multi-plates on the X-ray camera is basically calculated using this coordinate system. In addition, the blank arrow 17 in FIG. 6 is the positioning amount of the operator. The staff is standing in the direction of the arrow (the positive direction of the Ym axis), and is put into the observation of a multilayer printed wiring board (not shown) with a reference hole. The project is taken out of the punching machine 1. It will be described below that the multilayer printed wiring board as a workpiece is a group within the marker frame 2 1 ......... 2 1 for observing the corners 隅 as shown in FIG. 2 and is determined from the observation 値The reference hole is opened at the predetermined position. A stand 3 is fixed inside the housing 2 of the hole punch 1. The left and right moving platforms 10 and 10 are formed approximately in a channel shape, and are formed in a mirror shape on the left and right. The X-moving gantry 10, 10 is supported by linear guides 10a, 10a arranged at the end of the gantry. The spherical screw 10b is attached to the lower spherical nut of the X-moving gantry 10 which is engaged with it (the unillustrated perspective view is a movable internal coordinate, such as a part of the base, which also causes the end of the operation line mark (d) to mark the X image. ί is shown on 3) • 18- (15) 1230571 'According to the size of the wiring board where the reference hole is opened, move in parallel on the χ m axis in advance so that the mark stands by at an observable position. In addition, in order to individually drive the X moving stages 10 and 10, the ball screws 10b are arranged at each of the X moving stages 10. X-ray generators 4 and 4 'are fixed to the upper portions of the X moving frames 10 and 10, and linear guides 11a and 11a are attached to the lower portions. The γ moving stages 11 and 11 are supported by the linear guide 1 1 a. With the ball screw 1 丨 b and a ball nut (not shown) mounted below the engaged Y moving stand 11, the Y moving stand 1 1 and 1 1 can move in parallel on the Y m axis. The Y moving stages 11 and 11 are formed in a channel shape. An X-ray protective tube 5 is arranged on the upper part. As shown in Fig. 7, a chuck 9 and an air cylinder 9a for moving the chuck 9 are provided side by side. A mandrel 7 and an X-ray camera 6 are fixed to the lower portion. A linear guide 12a and a ball screw 12b, which are arranged in parallel to the Ym axis and fixed to the center of the frame, are supported and driven to move the movable stage 12 on which the multilayer printed wiring board is mounted. . The movable table 12 is a multilayer printed wiring board on which a workpiece having a reference hole is mounted at a position of 12 A, and moves along the Ym axis to reach a mark measurement to open a reference hole position. The control devices for driving the ball screws 丨 〇 b, 丨 I b, and 1 2 b and controlling the movement of the X-moving stage 10, 10, and Y; and the movement of the Π, Η, and the movable stage 12 are not shown. Here, as the main components of the hole-opening machine, an X-ray generating device 9 and an X-ray protective tube 5 and an X-ray camera 6 form an observation device; and -19- (16) 1230571 spindle 7 and chuck 9 Form a hole-opening device; X moving gantry 1 Q and Y moving gantry 11 and movable stage 12 and support these and drive linear guides 10a, 1 la, 1 2 a, ball screws 1 0 b, 1 1 b, 1 2 b and the like form a driving device. In addition, a control device (not shown) is generally composed of a CPU, a memory device, a sequencer, and the like, and performs control of the above-mentioned various devices in accordance with a series of operation sequences. In addition, the coordinate 値 is calculated from the X-ray image of the marker observed by the observation device, and the position of the reference hole is also calculated from the coordinate 値 and the design coordinates of the reference hole input in advance. The calculation of the coordinate and inference expression of the marker according to the embodiment of the present invention described below is also performed in the control device. A method of observing the multilayer printed wiring board 60 shown in Fig. 2 (d) by forming four marker frames 2 1 ......... 2 1 at four corners will be described. First, the dimensions of the wiring board to be opened and the (design) coordinates of the marker frame 2 1 ......... 2 1 determine the X moving platform 1 0, 10 along the

Xm軸的位置,X移動架台10、10是事先移動至該處並在那 裏待機。 可動台1 2在(第6圖的)1 2 A的位置,作業人員是將 多層印刷配線板60載置在可動台12上的所定位置。配線板 6〇是暫時被固定在可動台12。可動台12是前方的左右兩個 標記框21、21移動至內設於X線攝影機4的X線發生管4a 下面的位置。 如下述地,以X線透視標記框2 1.........2 1而以X線攝影 機6、6觀測,來測定框內的各導體層的標記nM、nE等所 形成的(X線攝影機的螢光面上的)像的座標値。座標値 -20- (17) 1230571 是被記憶在未圖示的控制裝置的記憶裝置。 後方標記框2 1.........2 1到達X線發生管4 a下方的距離 ’僅朝Y m方向移動可動台1 2。之後照射X線,以X線攝影 機6、6觀測標記框2 1、2 1。記憶各導體層的標記η Μ、η E 的像的座標値。 之後’在控制裝置內,從四組標記框2 I.........2 1內的 標記的像的座標算出設計座標系統的配置,計算由此所形 成的基準孔的座標。 可動台1 2朝Y m方向移動而達到基準孔的位置,使得 心軸7、7移動至基準孔的座標,開設基準孔。又,基準 孔是未予圖示。 可動台一直移動至投入位置1 2 A,作業人員取出經開 孔的配線板6 0則終了基準孔加工工程。 參照第9圖說明在上述加工時裝載於X、γ移動架台的 機器類如何動作。 第9 (a)圖是表示從作業人員位置觀看左邊的X移動 架台10,Y移動架台11的前視圖;第9(b)圖是表示其俯 視Η ’去掉X移動架台10的上半部,表不Y移動架台Η的 上面。第9(C) (d)圖是表示從Xm軸的正方向觀看的χ 移動架台1 0,第9 ( c )圖是模式地表示依X線攝影機6的標 點的觀測時,第9 ( d )圖是模式地表示心軸7的開孔時。 標記框2 1.........2 1的觀測,是在表示於第9 ( c )圖的 X線觀測位置進行。X線防護管5與χ線攝影機6來到χ線發 生管4a的正下方。 (18) 1230571 藉由未圖示的控制裝置的指令使得X線發生裝置起動 從X線發生管4a所放射的X線是經開設X線防護管的中心 的孔5 a (未圖示)內,未圖示地透視被載置於可動台〗2上 的配線板60內層的一個標記框而以X線攝影機6捕捉作爲 畫像,該畫像是被送至控制裝置內的計算機來計算各標記 的像的座標,並加以記憶。在適用標記的座標値推定式, 將標記框朝xy方向相對地移動所定量之後,來觀測相同的 標記框。從移動所定量前後的標記的像的座標値可推定標 記本身的座標値。 從標記的座標値推斷設計座標系統的配置,(作爲機 械座標値)決定開設的基準孔的座標。 開設基準孔是在心軸前端的鑽頭7 b進行。在開設時, 依照所計算的基準孔的座標値使得可動台;[2移動,當X 移動架台10移動至基準孔的Xm軸座標,並進行γ移動架 台1 1移動至基準孔的Ym軸座標的微調整。 Y移動架台1 1是經常地以X線攝影機6的中心作爲基準 而動作所設定之故,因而實際上如第9 ( c )圖所示地,γ 軸移動架台11是僅多移動X線攝影機6的中心與心軸7的中 心的距離S。心軸7是將空氣輪機或高頻電動機作爲旋轉源 的商速電動機,經由安裝於旋轉軸的夾頭7 a,通常裝設超 硬合金製的鑽頭7b而在配線板開設基準孔。又未予圖示, 惟藉由上下移動心軸7的氣缸或伺服馬達來進行鑽頭7b的 切入進給。 配置於心軸7正上方的夾頭9是安裝於氣缸9的致動器 (19) 1230571 ’若下降則推壓被載置在可動台1 2的配線板60,而防止開 孔時的配線板60的移動。 以上爲觀測標記群’依據其觀測結果來開設基準孔的 開孔機的機械式順序。 以下’由標記群的觀測結果說明多層印刷配線板6 〇內 層的導體層的位置的算出方法。 已經說明了在設計多層印刷配線板60內層的導體層的 導體圖案之際’設定以共通於所有內層的導體層的正交的 U d ’ V d作爲座標軸的設計座標系統。投入開孔機時,決 定例如U d軸是與機械座標系統的X m軸大約平行,而v d軸 是同樣與Y m軸大約平行。又,與導體圖案同時地將作爲 四部位的標記群的構成要件的標記表示於所定標記位置。 通常,在一個標記群對於每一導體層配置一個標記。 若標記框在配線板的四角隅,則在一導體層形成四個標記 。由四個標記的像的兩次觀測結果,可計算在四個標記的 機械座標系統所表示的座標値 又,標記群的形狀,是如表示於第5 ( b )圖者。 由形成在一導體層的四角隅的四個標記的測定値推斷 U d,V d的設計座標系統位在那裏,而視爲該導體層的配 置。亦即’可得到以機械座標系統表示設計座標系統的原 點的座標値,及Vd軸對於Xm軸的傾斜就可以。 統計學上,有從測定値推算正確値的各種手法,惟常 使用著以觀測點(中實標記22 )假設爲單位質點,求出其 重心’重心是作爲不動,由設計上的標記的座標値與所測 •23- (20) 1230571 定的標記的座標値,求出以該距離的平方和作爲最小的 Ud軸的對於Xm軸的傾斜的方法等。 g十算順序的具體例,是由同一申請人在日本特開 2 0 0 1 - 1 8 5 8 6 3號等加以說明之故,因而省略。 由形成在特定導體層的(至少三個的)標記,可計算 該層的設計座標系統的配置(原點位置與座標軸的傾斜) 。又,使用形成於所有導體層的全標記也可得到整體均句 的一個設計座標系統的配置。通常是推斷以平均等按分後 者整體的一個設計座標系統,來決定基準孔的座標。 又,特定層的設計座標系統的配置與平均整體的設計 座標系統的相差是被稱爲特定的內層的層間偏離的資料。 各導體層的層間偏離的數値是被記憶於開孔機的記憶 體,視需要也可提出客戶。又,廠商側的品質管理用也成 爲有用的資料。 熱壓製加工後的開設基準孔,是在表面導體層的圖案 蝕刻’通孔等的開孔,在單一配線的外形切出等的後續工 程上,必須的工程;在該開設基準孔工程中,內層導體層 的層間偏差在不增加加工時間下可加以測定。 以上作爲基準孔開孔機加以說明,惟由開孔機僅拆下 開孔功能,則成爲觀測標記而記憶資料的測定器。大容量 的記憶裝置,以高速度測定作爲特徵的測定器,也爲獨立 的成品領域,惟X線攝影機等的測定手段是幾乎與開孔機 共通,在上述開孔機的說明,也包含測定器的功能說明者 -24- (21 ) 1230571 2.裝載於開孔機的觀測裝置的特徵(X線源及X線攝影機 ) 通常開孔機的觀測裝置,是以X線透視標記,並觀測 該像而作爲標記的座標。參照第3圖說明觀測裝置的主要 構成要件的X線發生管與X線攝影機。第3 ( a )圖是表示X 線攝影機的槪要略圖;第3 ( b )圖是表示說明標記的位置 與X線攝影機的輸出像的形狀的模式圖;第3 ( c )圖是表 0 示依被照體的厚度的像的位置變化的模式圖。 通常在X線攝影機6,作爲其受像部內設有X線螢光增 倍管3 0。如第3 ( a )圖所示地,X線螢光增倍管3 0是內設 螢光膜31與光電面32所構成的輸入靶,收歛電極S,陽極 A,輸出螢光膜3 3等。 從X線發生管4a所放射的X線是透過被照體的多層印 刷配線板60的標記66等所形成的內層的導體層,入射於螢 光膜3 1的螢光面,發生螢光膜3 1而被變換成光學像3 6。藉 φ 由該光,光電子從密接於螢光膜3 1內面所配置的光電面3 2 被放出。上昇加速電壓等增倍輸出光束,而在輸出螢光膜 33連結像。將該像經由光學透鏡系34取進電荷結合元件(For the position of the Xm axis, the X-moving gantry 10, 10 is moved there in advance and is waiting there. The movable table 12 is at a position of 12 A (of FIG. 6), and the worker places the multilayer printed wiring board 60 at a predetermined position on the movable table 12. The wiring board 60 is temporarily fixed to the movable table 12. The movable table 12 is a position where the two left and right marker frames 21, 21 in the front move to a position below the X-ray generating tube 4a which is built in the X-ray camera 4. As shown below, the marker frames 2 1 ......... 21 are seen through the X-rays and observed with the X-ray cameras 6, 6 to measure the marks formed by the conductor layers nM, nE, etc. in the frame. The coordinates of the image (on the fluorescent surface of the X-ray camera). Coordinate 値 -20- (17) 1230571 is a memory device stored in a control device (not shown). The rear marker frame 2 1 ......... 2 1 reaches the distance below the X-ray generating tube 4 a ′ and moves the movable stage 12 only in the direction of Y m. After that, X-rays are irradiated, and the marker frames 2 1 and 21 are observed with the X-ray cameras 6 and 6. The coordinates 値 of the images of the markers η M and η E of each conductor layer are memorized. After that, in the control device, the arrangement of the design coordinate system is calculated from the coordinates of the marked images in the four sets of marker frames 2 I ...... 21, and the coordinates of the reference hole formed thereby are calculated. The movable table 12 moves in the direction of Y m to reach the position of the reference hole, so that the mandrels 7 and 7 move to the coordinates of the reference hole, and the reference hole is opened. The reference holes are not shown. The movable table moves all the way to the input position 1 2 A, and the operator removes the wiring board 60 which has been perforated, and ends the reference hole processing project. With reference to Fig. 9, the operation of the equipment mounted on the X and γ moving gantry during the above processing will be described. Fig. 9 (a) is a front view showing the X-moving gantry 10 and Y-moving gantry 11 on the left when viewed from the position of the operator; Fig. 9 (b) is a plan view showing the top half of the X-moving gantry 10, Shows the top of the Y moving table. Fig. 9 (C) (d) shows the χ moving stage 10 viewed from the positive direction of the Xm axis, and Fig. 9 (c) shows the observation of the punctuation point according to the X-ray camera 6 schematically. ) Is a diagram schematically showing the opening of the mandrel 7. The observations of the marker boxes 2 1 ...... 21 are performed at the X-ray observation positions shown in Fig. 9 (c). The X-ray protective tube 5 and the X-ray camera 6 come directly below the X-ray generating tube 4a. (18) 1230571 The X-ray generator is activated by an instruction from a control device (not shown). The X-rays emitted from the X-ray generator tube 4a are located in the hole 5a (not shown) through the center of the X-ray protective tube. A marker frame on the inner layer of the wiring board 60 mounted on the movable table 2 is shown in the drawing, and the X-ray camera 6 captures it as an image. The image is sent to a computer in the control device to calculate each marker. Coordinates of the image, and memorize them. After applying the coordinates of the marker to the estimation formula, move the marker frame relative to the xy direction for a certain amount, and then observe the same marker frame. The coordinates 値 of the mark itself can be estimated from the coordinates 値 of the marked image before and after the quantitative movement. The configuration of the design coordinate system is inferred from the marked coordinates 値 (as the mechanical coordinates 値) to determine the coordinates of the reference hole to be opened. The reference hole is opened by a drill 7b at the front end of the mandrel. At the time of opening, the movable stage is made according to the calculated coordinates of the reference hole; [2 moves, when the X moving stage 10 moves to the Xm axis coordinate of the reference hole, and the γ moving stage 1 1 moves to the Ym axis coordinate of the reference hole Fine-tuning. The Y moving stage 11 is often set to operate with the center of the X-ray camera 6 as a reference. Therefore, as shown in FIG. 9 (c), the γ-axis moving stage 11 is a multi-moving X-ray camera only. The distance S between the center of 6 and the center of the mandrel 7. The mandrel 7 is a commercial-speed motor that uses an air turbine or a high-frequency motor as a rotation source, and a reference hole is opened in the wiring board through a chuck 7a mounted on the rotating shaft, and a drill 7b made of cemented carbide is usually installed. Although not shown in the figure, the cutting bit 7b is fed by moving the cylinder or servomotor of the spindle 7 up and down. The chuck 9 disposed directly above the mandrel 7 is an actuator (19) 1230571 mounted on the cylinder 9 'When it is lowered, the wiring board 60 placed on the movable table 12 is pushed to prevent wiring when opening the hole. The movement of the board 60. The above is a mechanical sequence of a hole punching machine for opening a reference hole based on the observation mark group '. The method of calculating the position of the inner conductor layer of the multilayer printed wiring board 60 will be described below based on the observation results of the marker group. In the case of designing the conductor pattern of the inner conductor layer of the multilayer printed wiring board 60, a design coordinate system using orthogonal U d 'V d common to all inner conductor layers as a coordinate axis has been described. When the hole punch is put into use, it is determined that, for example, the U d axis is approximately parallel to the X m axis of the mechanical coordinate system, and the v d axis is also approximately parallel to the Y m axis. In addition, the mark which is a constituent element of the four-point mark group is displayed at a predetermined mark position simultaneously with the conductor pattern. Usually, one mark is arranged for each conductor layer in one mark group. If the marker frame is at the corners of the wiring board, four markers are formed on a conductor layer. From the two observations of the four labeled images, the coordinates represented by the four labeled mechanical coordinate system can be calculated. Also, the shape of the labeled group is as shown in Figure 5 (b). From the measurement of the four marks formed at the four corners of a conductor layer, the design coordinate system of U d and V d is inferred, and it is regarded as the configuration of the conductor layer. That is, the coordinates 表示, which represent the origin of the design coordinate system by a mechanical coordinate system, and the tilt of the Vd axis with respect to the Xm axis can be obtained. Statistically, there are various methods to calculate the correctness from the measurement, but often use the observation point (neutral mark 22) as the unit mass point to find its center of gravity. The center of gravity is regarded as fixed, and the coordinates of the design mark are used.値 and the coordinates of the mark determined by • 23- (20) 1230571, and how to calculate the tilt of the Xm axis with the sum of the square of the distance as the minimum Ud axis. The specific example of the order of g ten counts is explained by the same applicant in Japanese Patent Application Laid-Open Nos. 2 0 1-1 8 5 8 6 and the like, and is therefore omitted. From (at least three) marks formed on a specific conductor layer, the configuration of the design coordinate system (the origin position and the tilt of the coordinate axis) of that layer can be calculated. In addition, by using the full marks formed on all the conductor layers, it is also possible to obtain a configuration of a design coordinate system as a whole. It is usually a design coordinate system that infers the average of the latter as a whole to determine the coordinates of the reference hole. In addition, the difference between the arrangement of the design coordinate system of a specific layer and the average overall design coordinate system is the data of the inter-layer deviation called a specific inner layer. The number of deviations between the layers of each conductor layer is memorized in the memory of the hole puncher, and can be provided to the customer as required. In addition, quality management for the manufacturer is also useful information. The opening of the reference hole after hot pressing is necessary for subsequent processes such as etching of through-holes in the pattern of the surface conductor layer and the cut-out of the shape of a single wiring. In the opening of the reference hole, The interlayer deviation of the inner conductor layer can be measured without increasing the processing time. The above is explained as the reference hole punching machine. However, only the hole punching function is removed by the hole punching machine, and it becomes a measuring device for observing marks and memorizing data. A large-capacity memory device, a measuring device characterized by high-speed measurement, is also an independent product field. However, the measuring methods such as X-ray cameras are almost the same as the hole punching machine. -24- (21) 1230571 2. Features of the observation device (X-ray source and X-ray camera) mounted on the hole drilling machine The observation device of the usual hole drilling machine is marked with X-ray perspective and observed This image is used as the coordinate of the mark. The X-ray generating tube and the X-ray camera of the main components of the observation device will be described with reference to Fig. 3. Figure 3 (a) is a schematic diagram showing the X-ray camera; Figure 3 (b) is a schematic diagram showing the position of the mark and the shape of the output image of the X-ray camera; Figure 3 (c) is Table 0 A schematic diagram showing the change in the position of an image according to the thickness of the subject. The X-ray camera 6 is usually provided with an X-ray fluorescent multiplier tube 30 in its image receiving section. As shown in FIG. 3 (a), the X-ray fluorescent doubler tube 30 is an input target composed of a fluorescent film 31 and a photoelectric surface 32, a convergent electrode S, an anode A, and an output fluorescent film 3 3 Wait. X-rays emitted from the X-ray generating tube 4a are inner conductor layers formed by marking 66 of the multilayer printed wiring board 60 of the subject, etc., and are incident on the fluorescent surface of the fluorescent film 31 to generate fluorescence. The film 31 is converted into an optical image 36. By this light, the photoelectrons are emitted from the photoelectric surface 3 2 arranged in close contact with the inner surface of the fluorescent film 31. The output beam is multiplied by increasing the acceleration voltage and the like, and an image is connected to the output fluorescent film 33. This image is taken into a charge-bonding element via the optical lens system 34 (

Charge Coupled Device)的 CCD 攝景多元件 35 〇 第3 ( a )圖中,L1是X線源至多層印刷配線板60的距 離;L2是X線源至X線增倍管的螢光膜3 1的螢光面的距離 。與可視光線不相同,X線是不能使用光學透鏡之故,因 而螢光膜3 1的螢光面的像3 6是照成作爲形成在多層印刷配 •25- (22) 1230571 線板的標記的大約相似形狀的影繪,其大小是比例於來自 光源的距離而被放大成[(L2 ) / ( L 1 )]。 最近,因CCD攝影元件35的感度被提高,因此密接於 螢光膜3 1的後面而配置CCD攝影元件3 5,直接將螢光膜3】 的螢光面的像取進CCD攝影元件,而也使用省略增倍管30 的X線攝影機,惟上述關係是同樣地成立。 參照第3 ( b )圖,說明螢光面上的像的位置與被照體 及像的形狀的關係。對於在攝影機的視野中央有圖形重心 的標記B 1,由X線發生管所出射的X線所形成的正下方的 像Z 1是與原來的標記B 1相似形,其重心(圖形中心)也 位在與原來的標記B 1相同位的視野中央。這時候,與L 1 、L 2無關地,沒有重心位置的變化。 X線以角度α的角度入射的標記B2的像Z2是因前項的 比例式而大小有變化,以角度α的微少變化,標記Β2與像 Ζ2的形狀是嚴密地並不相似,例如標記Β2的輪廓形狀爲 圓形,則像Ζ2是成爲橢圓。但是,圓的中心是射影在橢圓 的中心,而重心位置是在角度α的線上。標記的重心不是 視野的中心時,也利用上述重心位置位在角度α的線上, 以單純的比例計算就可修正。 如此地,若上述比例式的L 1爲一定,可避免因X線入 射角α的像的變形影響。 又,X線螢光增倍管30的螢光膜也有球面的情形,會 有些不準被加算,惟該誤差的增加分量極少。 如第3 ( c )圖所放大所示,若在被照體的多層印刷配 -26- (23) 1230571 線板60的表背面有標記,則因標記間的距離(配線板的厚 度)t 1、12使得位置有所不同。實際上表背面的標記B 1、 Β 2是同心地配置,推X線具有α的入射角時,該像Ζ 1、Ζ 2 是不會成爲同心。若厚度11較小,則如表不在上半部地不 準量Q 1較小,若厚度t 2較大,則如表示在下半部地不準量 Q2變極大,如放大表示,若兩標記重疊,作爲兩個標記 無法認識,成爲無法推斷。 作爲一例,配置在第5 ( b )圖的角隅部的標記是L 1相 差爲大約〇.5mm (厚度t2爲〇.5mm),則不準量Q2是大約 0.0 1 m m而接近於使用界限。 3.標記的座標値推斷方法 進行本發明的實施形態的一例的標記的座標値推斷方 法的說明。該座標値推斷方法是適用在已說明的基準孔開 孔機者,在開孔機的觀測裝置作爲使用上述X線源與X線 攝影機者。 本標記的座標値推斷方法,是從前後兩次的標記的觀 測結果來推斷標記的座標値者,觀測第一次的標記像之後 ,進行所定量的多層印刷配線板的相對性移動,進行第二 次的標記像的觀測。由第一次、第二次的觀測結果與所定 的多層印刷配線板的移動量,可數學式地完全推斷標記的 真座標値。 參照第1圖說明本發明的實施一形態的標記的真座標 値的推斷式的說明。第1 ( a )圖是表示開孔機的觀測裝置 -27- (24) 1230571 周邊的立體略圖;表示藉由多層印刷配線板的相對性移動 使得標記移動的狀況與隨著該移動的螢光面上的標記的像 變位的關係。 將開孔的觀測裝置的X線攝影機的螢光膜的螢光面的 大約中心作爲座標原點〇,設定在螢光膜膜上載置正交座 標軸的觀測裝置的X y 座標系統。在座標原點〇的正上方 (在Z軸上)的一點固定X線源A。 觀測形成於載置於未圖示的可動台並被固定的多層印 0 刷配線板6 0的內層的導體層的標記Μ。標記μ是作爲多層 印刷配線板6 0的標記框內的一個特定者。 可動台的多層印刷配線板載置面是作成平行於X y平面 ,而可動台是平行地移動在xy平面者。因此,形成在載置 於可動台且被固定的多層印刷配線板6 0的標記μ是移動在 平行於X y平面的平面內。 將平行於xy平面且存有標記Μ的平面與連結a · 〇的 一點鏈線所表示的直線(與Z軸一致)的交點作爲p ;將Α φ • P的距離作爲a ;將P · Ο的距離作爲b。 在這裏,X線源A與X線攝影機的螢光面上的座標原點 0的距離是在a + b被固定。 將第一次觀測的標記的位置作爲Μ ;將可動台朝x,y 方向移動所定量之後的第二次觀測的位置作爲M2。標記 是以任意路徑從Μ到達至Μ 2就可以,惟在此作爲μ、Μ 1、 Μ 2的路徑,從Μ至Μ 1是平行於χ軸移動l 1的距離;而從 Ml至M2是平行於y軸移動L2的距離者。 -28- (25) 1230571 隨著標記的移動,螢光面上的該像是移動至Z、Z 1、 Z2。如上所述地X線是直進之故,因而A · Μ · Z、A · Ml • Z1、A · M2 · Z2是分別在一條直線上。 第1 (b)圖是表示對於xy平面的Α· Μ· Z、A· Ml · Ζ1、Α· Μ2· Ζ2的投影圖;第1 (c)圖是表示包含平行於 χ軸且位在X y平面上的基線X X投影於平行於X z平面的投影 面[B ]的投影圖;第1 ( d )圖是表示包含平行於y軸且位在 xy平面上的基線YY投影於平行於yz平面的投影面[C]的投 影圖。 又,第1(b) 、 ( c ) 、 (d)圖的配置是以第一角法 表示。 在這裏,作爲投影法,使用所謂前視圖法。前視圖法 是使用直角於投影面的投影線爲其特徵者。 例如,在投影於平行於xz平面的投影面[B]使用平行 於y軸的光線,而在投影於平行於yz平面的投影面[c]使用 平行於X軸的光線。 現在,將具有座標(X、y、z )的點朝X軸平行地移動 至座標(z 1、y、z ),並投影至平行於X z平面的投影面 [8],具有座標(\、2)的點移動至座標(\1、2)。移動 量是成爲(xl-X)的實尺寸。 又,將具有座標(X、y、Z)的點移動至座標(X、yl 、z ),投影面[B ]上的投影圖是兩者均成爲座標(X、z ) 的點而點的座標並沒有變化而移動量是0。 以第一次的觀測可得到標記Μ的螢光面上的像2的x座 (26) 1230571 標c 1及y 座標d 1。 之後,平行於x軸地僅移動L 1的所定量,並平行於},軸 地僅移動L2的所定量來移動可動台而移動標記的位置。如 上所述地,圖示著從Μ至Μ 2的移動路是移動L】之後達到 Ml,藉從Ml移動至L2並移動至M2。 又,該關係是與向量Z2的X成分爲L 1,y成分爲L2相 同意義。 移動後的第二次的觀測可得到標記Μ 2的螢光面上的 像Ζ2的X座標c2及y座標d2。 投影面[B ]上的三角形A · P · Μ與三角形a · 〇 · z相 似,由對應的邊長度的比率是a : ( a + b ),成立下式。 a/(a + b) = (Ρ· Μ) /(0· Ζ ) =Lx/cl 同樣地,三角形A · Μ · Μ 2與三角形A · Ζ · Ζ 2是相似 ,對應的邊長度的比率仍爲a: ( a + b )。由此成立下式。 a/(a + b) = (Μ· M2) / (Ζ· Ζ2) =L 1 / ( c2-c 1 ) 由此,可得到均刪除a與b的Lx/cl=Ll / ( c2-cl )。 因此,可得到 Lx = Llxcl / ( c2-cl)。 同樣地,如第1 ( d )圖所示地’由於通過A · 0的直 線平行於投影面[C],因此在投影面[c]上也是AP = a、 PO = b。 因此,投影面[C]上的三角形A · P · Μ與三角形A · Ο • Z相似而邊的比率是a: ( a + b ),成立下式 a/ ( a + b )=(Ρ·Μ)/(〇·Ζ) =Ly/dl 三角形Α· Μ· M2與三角形Α· Ζ· Z2也同樣的關係, (27) 1230571 成立下式 a/(a + b) = (Μ· M2) / (Ζ· Z2) =L2/(d2-dl) 而得到Charge Coupled Device) CCD multiviewer 35. In Figure 3 (a), L1 is the distance from the X-ray source to the multilayer printed wiring board 60; L2 is the fluorescent film from the X-ray source to the X-ray multiplier tube 3 1 distance of the fluorescent surface. Unlike visible light, X-rays cannot use optical lenses, so the image 3 of the fluorescent surface of the fluorescent film 3 1 is illuminated as a mark formed on a multilayer printed board. 25- (22) 1230571 Line board The shadows of approximately similar shapes are enlarged to [(L2) / (L1)] in proportion to the distance from the light source. Recently, since the sensitivity of the CCD imaging element 35 has been improved, the CCD imaging element 35 is arranged in close contact with the fluorescent film 31, and the image of the fluorescent surface of the fluorescent film 3] is directly taken into the CCD imaging element, and An X-ray camera in which the doubling tube 30 is omitted is also used, but the above relationship is the same. The relationship between the position of the image on the fluorescent surface and the shape of the subject and the image will be described with reference to FIG. 3 (b). For the mark B 1 with a graphic center of gravity in the center of the field of view of the camera, the image Z 1 formed directly by the X-rays emitted by the X-ray generating tube is similar to the original mark B 1, and its center of gravity (graphic center) is also It is located in the center of the field of view at the same position as the original mark B 1. At this time, regardless of L 1 and L 2, there is no change in the position of the center of gravity. The image Z2 of the marker B2 incident on the X-ray at an angle of α is changed in size due to the proportional expression of the preceding term. With a slight change in the angle α, the shape of the marker B2 and the image Z2 are strictly not similar. For example, the marker B2 If the outline shape is circular, the image Z2 becomes an ellipse. However, the center of the circle is projected on the center of the ellipse, and the position of the center of gravity is on the line of the angle α. When the center of gravity of the marker is not the center of the field of view, the position of the center of gravity is also used to position the line on the angle α, and it can be corrected by a simple ratio calculation. In this way, if L 1 in the above-mentioned proportional expression is constant, the influence of distortion of the image due to the X-ray incident angle α can be avoided. In addition, the fluorescent film of the X-ray fluorescent doubling tube 30 also has a spherical surface, and it may not be allowed to be added, but the increase component of the error is very small. As shown in Fig. 3 (c), if there are markings on the front and back of the multi-layer printed layout of the subject -26- (23) 1230571 wire plate 60, the distance between the marks (thickness of the wiring board) t 1, 12 make the position different. In fact, the marks B 1 and B 2 on the back of the table are arranged concentrically. When the X-ray is pushed to have an incident angle α, the images Z 1 and Z 2 do not become concentric. If the thickness 11 is small, if the surface is not accurate, the amount of Q1 is small. If the thickness t2 is large, if it is large, the amount of Q2 is extremely large in the lower half. If it is enlarged, if two marks Overlapping, as two marks cannot be recognized, and cannot be inferred. As an example, the mark arranged in the corner of the figure 5 (b) is that the difference between L1 is about 0.5mm (thickness t2 is 0.5mm), and the inaccuracy Q2 is about 0.01 mm, which is close to the use limit. . 3. Coordinate Coordinate Estimation Method for Markers A description will be given of a method for coordinating the marker coordinate data as an example of the embodiment of the present invention. This coordinate 値 estimation method is applicable to the reference hole puncher described above, and the observation device of the hole puncher is to use the aforementioned X-ray source and X-ray camera. The method of estimating the coordinates of this mark is to estimate the coordinates of the mark from the observation results of the two previous and next marks. After observing the first mark image, the relative movement of the multilayer printed wiring board is carried out to perform Observation of secondary marker images. From the first and second observation results and the predetermined amount of movement of the multilayer printed wiring board, the true coordinates 値 of the mark can be completely inferred mathematically. A description will be given of an inferred expression of a true coordinate 値 of a mark according to an embodiment of the present invention with reference to FIG. Fig. 1 (a) is a schematic perspective view showing the observation device of a hole punching machine-27- (24) 1230571; showing the status of the marker moving by the relative movement of the multilayer printed wiring board and the fluorescent light accompanying the movement The relationship of the mark image displacement on the surface. An approximate center of the fluorescent surface of the fluorescent film of the X-ray camera of the apertured observation device is used as the origin of the coordinates, and an X y coordinate system of the observation device on which the orthogonal coordinate axis is placed on the fluorescent film is set. The X-ray source A is fixed at a point directly above the coordinate origin 0 (on the Z axis). Observe the mark M formed on the conductor layer of the inner layer of the multi-layer printed circuit board 60 mounted on the movable table (not shown) and fixed. The mark µ is a specific one within the mark frame of the multilayer printed wiring board 60. The multilayer printed wiring board mounting surface of the movable stage is made parallel to the X y plane, and the movable stage is moved in parallel on the xy plane. Therefore, the mark µ formed on the fixed multilayer printed wiring board 60 mounted on the movable table is moved in a plane parallel to the X y plane. Let p be the intersection point of the plane (parallel to the Z axis) indicated by the plane parallel to the xy plane with the mark M and a point chain linking a · 〇; p; let the distance of A φ • P be a; Distance as b. Here, the distance between the X-ray source A and the coordinate origin 0 on the fluorescent surface of the X-ray camera is fixed at a + b. Let the position of the first observation mark be M; and the position of the second observation after the movable platform moves in the x, y direction for a certain amount as M2. The mark can be reached from M to M 2 by an arbitrary path, but here is the path of μ, M 1, and M 2, from M to M 1 is a distance of 1 parallel to the χ axis; and from M1 to M2 is Those who move a distance of L2 parallel to the y-axis. -28- (25) 1230571 As the marker moves, the image on the fluorescent surface moves to Z, Z 1, Z2. As described above, the X line is straight, so A · M · Z, A · Ml · Z1, A · M2 · Z2 are on a straight line, respectively. Figure 1 (b) is a projection diagram showing A · M · Z, A · Ml · Z1, A · M2 · Z2 for the xy plane; Figure 1 (c) is a diagram showing Baseline XX on the y-plane is projected onto the projection plane [B] parallel to the X-z plane; Figure 1 (d) shows the baseline YY that is parallel to the y-axis and is located on the xy-plane is projected on parallel to yz A projection of a plane projection plane [C]. The arrangement of Figs. 1 (b), (c), and (d) is represented by the first angle method. Here, as the projection method, a so-called front view method is used. The front view method uses a projection line orthogonal to the projection surface as its feature. For example, a light plane parallel to the y-axis is used on the projection plane [B] which is parallel to the xz plane, and a light beam parallel to the x-axis is used on the projection plane [c] which is parallel to the yz plane. Now, move the point with coordinates (X, y, z) parallel to the X axis to the coordinates (z 1, y, z), and project to a projection plane [8] parallel to the X z plane, with coordinates (\ , 2) moves to the coordinates (\ 1, 2). The amount of movement is a real size which becomes (xl-X). In addition, when a point having coordinates (X, y, Z) is moved to the coordinates (X, yl, z), the projection on the projection plane [B] is a point where both become the points of the coordinates (X, z). The coordinates have not changed and the amount of movement is zero. By the first observation, the x-coordinate of image 2 on the fluorescent surface labeled M (26) 1230571 coordinate c 1 and y-coordinate d 1 can be obtained. Thereafter, only the measured amount of L 1 is moved parallel to the x-axis, and parallel to}, the measured amount of L 2 is moved only parallel to the x-axis to move the movable table to move the position of the mark. As described above, it is shown that the moving path from M to M 2 is mobile L], and then M1 is reached, and then M1 is moved to L2 and then M2. This relationship has the same meaning as the X component of the vector Z2 is L1 and the y component is L2. The second observation after the movement can obtain the X coordinate c2 and the y coordinate d2 of the image Z2 on the fluorescent surface labeled M 2. The triangle A · P · M on the projection plane [B] is similar to the triangle a · 0 · z. The ratio of the side lengths is a: (a + b), and the following formula is established. a / (a + b) = (ρ · M) / (0 · Z) = Lx / cl Similarly, triangle A · M · M 2 is similar to triangle A · Z · Z 2 and the ratio of corresponding side lengths Still a: (a + b). The following formula is established. a / (a + b) = (Μ · M2) / (Z · Z2) = L 1 / (c2-c 1) Thus, Lx / cl = Ll / (c2-cl ). Therefore, Lx = Llxcl / (c2-cl) is obtained. Similarly, as shown in Fig. 1 (d), since the straight line passing through A · 0 is parallel to the projection plane [C], the projection plane [c] is also AP = a and PO = b. Therefore, the triangle A · P · Μ on the projection plane [C] is similar to the triangle A · Ο • Z and the ratio of the sides is a: (a + b), and the following formula a / (a + b) = (P · Μ) / (〇 · Z) = Ly / dl Triangle A · M · M2 and triangle A · Z · Z2 have the same relationship. (27) 1230571 The following formula a / (a + b) = (Μ · M2) / (Z · Z2) = L2 / (d2-dl)

Ly二L2 x d1/ ( d 2 -d 1 ) 亦即,藉由標記M的螢光面上的像Z的第一次的觀測 値x座標c 1,y座標d 1與多層印刷配線板的移動量L 1、 L 2 ’及標記Μ的螢光膜上的像Z的第二次的觀測値X座標 c2,y座標d2,第一次觀測時的標記Μ的真座標値Lx、Ly 胃以下式求得。Ly 2 L2 x d1 / (d 2-d 1), that is, the first observation of the image Z on the fluorescent surface of the mark M, the x-coordinate c 1, y-coordinate d 1 and the multilayer printed wiring board The amount of movement L 1, L 2 ′ and the second observation of the image Z on the fluorescent film labeled M (X coordinate c2, y coordinate d2, the true coordinates of labeled M at the first observation) Lx, Ly stomach It is obtained by the following formula.

Lx = L 1 xc 1 / ( c2-c 1 ) 、L y = L 2 x d 1 / ( d 2 - d 1 ) 將推斷上述的標記的真座標値Lx、Ly的式稱爲標記 的座標値推斷式,被裝載於開孔機的控制裝置的座標値算 出運算手段。 上述的式是暗示無關於一直到標記的X線源的距離a及 一直到螢光面的距離b的測定法者’增加多層印刷配線板 的層數,即使在配置於各內層的標記使得厚度方向的位置 差變大,也能理論上排除其影響者。 在以上說明所使用的xy座標系統是被固定於X線攝 影機的座標系統,通常是使用於1 〇 m m四方左右的攝影機 的視野內的像。參照第2圖說明設定在基準孔開孔機的座 標系統。第2 ( a )圖是表示從上方觀看基準孔開孔機的座 標系統的說明圖。 如上所述地,在對於基準孔開孔機的地面未移動的機 械架台或框體等的固定部分,將座標原點設定作爲〇m, -31 - (28) 1230571 並將座標軸設定作爲Xm、Ym的機械座標系統。 以設定於觀測裝置的X線攝影機的原點0,座標軸X、 y的(局部)座標系統觀測標記的像。亦即,標記的像的 座標値c 1、d 1、c 2、d 2是在局部座標所讀出的座標値。 局部座標軸的X軸是設定成與Xm軸平行,而y軸是設 定成與Ym軸平行,局部座標原點〇的座標値是機械座標系 統的座標値而爲既知。由此可將在局部座標系統所表示的 點的座標簡單地換算成機械座標系統的座標。 例如,欲比較形成在多層印刷配線板的四角隅的標記 群,則將標記的座標値換算成機械座標系統來進行。 又,可動台的動作Tx、Ty也設定成平行於機械座標 系統的座標軸。 觀測裝置未移動時,則局部座標的原點Ο也未動。如 第1 ( a )圖所示地,在該狀態下,若將載置多層印刷配線 板的工作台平行於Xm、Ym地移動,則可移動標記的所定 量的移動。 上式的說明是載置多層印刷配線板的工作台平行於機 械座標系統的Xm、Ym軸朝X、Y兩方向進行Ty、Tx的移 動,而X線源與X線攝影機是對於機械座標系統作成固定 者加以說明。 這時候,工作台是平行於機械座標系統的Xm、Ym軸 而遞增地移動,標記Μ是移動至Ml、M2。工作台的移動 方向的記號是以局部座標系統所觀測的標記的座標値有增 加時作爲正。亦即,工作台的移動方向的正負是與機械座 -32- (29) 1230571 標系統的正負一致。 如上所述地,通常的開孔機是爲了機械構成上的方便 ,載置多層印刷配線板的可動台是僅朝一方向移動,而在 與該方向呈直角方向作成觀測裝置移動並移動標記的座標 的構造。 如此地,即使移動可動台以外的裝置等,作爲觀測裝 置的X線攝影機也認識爲標記的移動之故,因而成爲將其 他裝置相對於可動台加以移動而移動標記。 又,由於容易進行座標變換時的計算,通常各座標系 統的座標軸是平行地設定較多,惟基本上座標軸或運動方 向是任意。例如,未決定方向地而任意地移動載置多層印 刷配線板的可動台,也以設定在X線攝影機的座標系統可 知X軸方向及y軸方向的移動量就充分。 如第2 ( b )圖所示地,例示的基準孔開孔機是工作台 (多層印刷配線板)朝機械座標系統的Ym軸方向移動, 而在機械座標系統觀看,則標記Μ是隨著工作台的Ty的移 動而移動至M2,在Xm方向未移動。 在Xm方向,包括X線源與X線攝影機的整體觀測裝置 對於機械架台移動,變更與多層印刷配線板的位置。這時 候,整體觀測裝置會移動之故,因而被固定在觀測裝置的 局部座標系統也朝機械座標系統的Xm軸方向移動。 觀測裝置本身會移動之故,因而對於投影面[B]上的 投影是如第2 ( c )圖所示地,Μ ( Μ 1 )的位置未變化,X 線源Α移動至A 1,攝影機中心Ο移動至Ο 1,局部座標是 -33- (30) 1230571 由Ο 1被計測。X線源的位置有變更之故’因而標記的像投 影是由Ζ移動Ζ2。 在第2(C)圖,三角形Α· Ρ· Μ與三角形Α· 0· Ζ是 相似而對應的邊長的比率是a: ( a + b },同樣地三角形 A 1 · P 1 · Μ與三角形A · 0 1 · Z 2是相似而對應的邊長的比 率是 a: ( a + b )。 由此,成爲 a/(a + b) = (Ρ· Μ) / (0· Z) =Lx/cl、 及 a/ ( a + b ) = ( PI · M2) /(01- Z2 ) = ( Ll+Lx) /c2 ,而得到L x / c 1 = ( L 1 + L x ) / c 2。整理該式,得到L x = L 1 x cl/(c2-cl)。 將該式與觀測裝置未移動時的Lx = Ll x cl/ ( c2-cl ) 相比較則完全相同形狀。 由當初的假設,Lx、cl及c2均爲正,而爲了成立該式 ,觀測裝置的移動量L 1也必須爲正的數値。亦即,若觀測 裝置朝機械座標系統的Xm軸的負方向移動時定義爲採取 正値,則在第2 ( a ) 、 ( b )圖的任何狀態,也經常地成 XL Lx = L 1 xcl / ( c2-cl)。 又’局部座標系統的x軸是朝其延長方向移動之故, 因而投影面[C]上的像是不變化。因此Ly = L2 xdl / ( d2-dl)是工作台朝二方向移動時,或工作台朝Ym方向,觀 測裝置朝X m方向互相地正交方向移動時的任何情形均不 變化,而可使用相同式。 又’沿著與上例相反的座標軸,觀測裝置朝Ym方向 -34- (31) 1230571 移動而工作台朝X m方向移動,將依局部座標系統移動時 的方向的正負定義也與上例作成同樣,則標記的座標値推 斷式仍可使用。 如此地,移動工作台或觀測裝置的任一方或兩者,藉 由對於設定在觀測裝置的局部座標系統相對於(X軸與y軸 方向地)移動標記的像,使用標記的座標値推斷式而可將 標記的真座標値計算作爲局部座標系統的座標値。 上述的標記的座標値推斷式是在分母具有(c2-cl) 、(d 2 - d 1 )的減算項,而依c 1、c 2、d 1、d 2的數値,在 C P U的運算中,有減掉相同程度的數値而殘差的誤差變大 的所謂位數差之虞。 由使用於g十算的位數來類推,(c2-cl) 、 (d2-dl) 的數値具有意思的方式必須決定各數値的下限,而將式的 變形等運算形式適當地變更也有效。 如此地,數處的標記框內的所有標記的座標精度優異 地得到,如第2 ( d )圖所示地,考量此些所有標記的座標 ,決定被載置於開孔機的可動台的多層印刷配線板的設計 座標系統(原點〇 d、座標U d、V d )的開孔機上的位置, 亦即決定依機械座標系統(〇m、Xm、Ym )的原點〇d的 位置,座標軸Ud的傾斜(0 )。由此決定在開孔機所形 成的基準孔的位置,惟該計算方法等是本發明的目的以外 之故,因而省略。 參照第4圖及第5圖說明使用本發明的實施一形態的標 記的座標値推斷式時的標記的形態的一例。 -35- (32) 1230571 第4圖是表不標記框內的標記的配置的立體圖 僅觀察標記,作成除去周邊的基板’基板材料等的 。第5 ( a )圖是表示從多層印刷配線板的厚度方向 標記框附近的模式剖視圖;第5 ( b )圖是表示標記 標記配置例;第5 ( c )圖是表示標記單體的形狀。 4、5圖是相當於習知例的第1 2、1 3圖。 標記的形狀是如第5 ( c )圖所示地,使用將 中央圓形地除去導體的中空標記nE與圓形地留下導 實標記nM的兩種類。在這裏η是表示導體層的號碼 〇 在設計圖案時,配置成任意的中實標記Μ與中 Ε的重心成爲一致。在圖中,配置成相鄰接的導體 記作成一組,惟並不一定特別地配置成相鄰接的導 標記作成一組。 又,中空標記Ε是除去形成導體層的銅箔所形 空圓形部分,中空標記Ε的重心是中空圓形部分的 外周正方形是未具有作爲標記的功能。 第5 (a)圖是表示厚度方向觀看在九枚兩個配 的表背面經由基板材料裝載導體(銅箔)被結層的 刷配線板60的剖視圖;表示標記的配置。在圖中, 多層印刷配線板6 0的兩面配線板6 1上側的導體層形 標記Μ,成爲將中空標記E重心位置一致於下側導體 不必依次比較相鄰的導體層的標記之故,因而 體層形成有一個標記也可以。 ,爲了 剖視圖 觀看的 框內的 又,第 正方形 體的中 的數字 空標記 層的標 體層的 成的中 重心。 線板6 1 多層印 在構成 成中實 層。 在各導 -36- (33) 1230571 此些標記是通常在形成於多層印刷配線板的四角隅旳 標記框中’作爲一例子’配置成如第5 ( b )圖所示。 將標記框2 1內部分割成九個正方形,配置將重心分別 一致其正方形的中實標記Μ與中空標記E各一個,形成標 記群2 0。 作爲經實用化的大小的一例子,參照第1 3 ( b )圖的 記號,標記框2 1的一邊F爲大約1 0mm方形;標記的間隔A 爲大約3 m m ;中實標記的外徑D 1爲1 . 4 m m,中空標記2 3的 直徑D2爲大約2.4mm。 標記框2 1的大小F是定成稍小於X線攝影機的有效視 野,終了熱壓製工程的多層印刷配線板稍微變形,即使各 個標記位置有變化也作成充分收納在X線攝影機的視野內 〇 標記框是在所有內層設在相同位置。如上所述地’在 被分割的各正方形內形成有各一個的中實標記Μ與中空標 記Ε,在上述的正方形內未存在此以外的導體層。 · 因此,以X線照射標記框2 1內的標記群2 0,則在暗部 中,在第1 3 ( b )圖中,觀測到三行三列地配置的外徑D 2 ,內徑D 1的九個圓形的明部。 環的外徑相當於中空標記E的圓周部分,環的內徑相 當於中實標記Μ的圓周部分。 以適當的臨界値取進二値化的畫像,求出中實標記Μ 的重心的座標與中空標記Ε的圓(明部分)的重心的座標 •37- (34) 1230571 中實標記Μ的重心是僅計數環的明部中的暗點所求得 ;中空標記Ε的重心,是例如將中實標記Μ的所有暗部軟 體式地置換成明部之後,僅計數明點。 使用標記的座標値推斷式的標記的觀測是以如下的順 序來進行。首先,將觀測的多層印刷配線板載置於可動台 ,並將標記放在觀測裝置的視野內。 以第一工程的第一次觀測,得到配置於一個標記框中 的1 8個標記的重心的(相當於c 1、d 1的)座標値。 作爲第二工程,相對地移動多層印刷配線板,進行所 定量的LI、L2的X、y成分的移動。 以第三工程的第二次觀測,得到配置於一個標記框中 的1 8個標記的重心的(相當於c2、d2的)座標値。 以上利用二次觀測値,在各該標記施以先前的標記的 座標値推定式 Lx = Ll xcl / ( c2-cl) 、Ly = L2xdl/ ( d2-dl )的運算。算出進行各標記的第一次的測定的位置的座標 的推斷値。在以上終了一部位的標記框的觀測。 該標記的座標値推斷式的計算是在開孔機的控制裝置 內的座標値算出運算手段,其結果也被記憶在控制裝置內 的記憶裝置。以上爲在開孔機進行標記觀測的順序。 比較第5 ( a )圖與第1 3 ( a )圖,習知是藉由一標記 框內的1 8個標記對應於具有1 2層導體層的多層印刷配線 板,惟使用標記的座標値推斷式時,藉著同一標記群可對 應至具有2 0層導體層的多層印刷配線板。 設計導體層的配線圖案時,配置標記等的配線圖案的 -38- (35) 1230571 外周部的配置下,仍可對應於導體層的層數增加之故,因 而不必變更標準圖,有助於設計的省力化。 在本發明中,形成標記的導體層與X線攝影機的螢光 面的距離差是本質上被消除之故,因而可避免X線攝影機 的視野的外周部與中心附近的精度差。亦即,也沒有第3 (b )圖的α的影響。 又,如放大地表示在第3 (c)圖的Ζ3、Ζ4,若兩個標 記的像未重疊,則可測定各該重心座標。若有通常的基板 或基板材料的厚度,及例示程度的標記的大小,則組合任 意層的標記也可使用。 〔發明的效果〕 如上所述地本發明的標記的座標値推斷式,是在觀測 時抵銷內層板的厚度方向的位置不同,而可推斷真標記的 標記位置。原理上即使在多層印刷配線板的任一層有標記 都可以,可期待提高標記的測定精度,可成爲具有比以往 更廣視野的X線攝影機的使用。 藉著導入本發明的標記的座標推斷式,以控制在通常 的開孔機的攝影機的視野的九組(1 8個)標記就可對應於 最大2 0層爲止的多層印刷配線板,而可對應於通常所製 造的大多數的多層印刷配線板。 導體層的配線圖案是依其狀況變更內部的電路部分’ 惟名稱、批量記號,標記框其他所存在的周邊部大都作成 標準設計的情形。因此,多層印刷配線板的配線圖案的周 -39- (36) 1230571 邊部是仍爲現在的標準設計而不必加以變更’具有不增加 使用者的配線圖案設計工數的優點。 爲了裝載本發明的標記的座標値推斷式,不必變更基 準孔開孔機的硬體面的變更。僅追加標記測定工程的順序 與實行標記的座標値推斷式的軟體就可對應。對於習知機 種也以變更或重換軟體就可作成具有本發明的功能的開孔 機。在不大幅度地增加製造原價就可裝載新功能’而對於 作爲提高已販售的製品的功能服務上並不需要很大的對價 而可服務的效果也大。 【圖式簡單說明】 第1 ( a ) 、 ( b )是表示說明推斷本發明的實施形態 的標記的真座標的計算法的標記與其螢光面的像的立體圖 ,及依一角法的正投影圖。 第2 (a)圖至第2(d)圖是表示設定於本發明的實施 形態的基準孔開孔機的機械座標系統等的各種座標系統, 及多層印刷配線板的設計座標系統的關係的說明圖。 第3 ( a )圖至第3 ( c )圖是表示依X線的標記觀測方 法的模式圖,及說明標記像的失真的原理圖。 第4圖是表示形成在標記框內的標記的配置的一例的 立體圖。 第5 (a)圖至第5(c)圖是表示形成在標記框內的標 記框內的標記的形狀的模式圖。 第6圖是表示進行開設基準孔的基準孔開孔機的立體 -40- (37) 1230571 圖。 第7 (a)圖及第7(b)圖是表不基準扎開扎機的則視 圖及側視圖。 第8 ( a )圖及第8 ( b )圖是表示基準孔開孔機的可動 台的俯視圖。 第9 ( a )圖及第9 ( d )圖是表示基準孔開孔機的X移 動架台的各方向的投影圖。 第1 〇 ( a )圖至第1 0 ( c )圖是表示多層印刷配線板的 構成的立體圖與俯視圖,及在熱壓製工程所使用的工模板 的簡圖。 第1 1 ( a )圖及第1 1 ( b )圖是表示多層印刷配線板的 構成的剖視圖。 第1 2圖是表示減少依標記的高度所產生的誤差的標記 群的習知配置例的立體圖。 第13 (a)圖至第13(c)圖是表示圖示於第12圖的標 記的形狀的模式圖。 【符號說明】 1 開孔機 2 框體 3 架台 4 X線發生裝置 4a X線發生管 5 X線防護管 -41 - 1230571 ι38) 5a 孔 6 X線攝影機 7 心軸 7 a 夾頭 7b 鑽頭 7 c、9 a 氣缸 8 心軸架台 9 夾具 10 X移動架台 11 γ移動架台 12 可動台 10a、11a、12a 直線導件(LM導件) 1 0 b、1 1 b、1 2 b 球形螺絲 16 開孔位置(1、2孔) 16a開孔位置(3、4孔) 17 作業人員位置(空白箭號) 20 標記群 2 1 標記框 η Μ 中實標記 ηΕ 中空標記 30 X線螢光增倍管 3 1 螢光膜 3 2 光電面 3 3 輸出螢光膜 -42- (39) (39)1230571 34 光學透鏡系統 3 5 CCD攝影元件(電荷結合元件) 36 像 A 陽極 S 收欽電極 5 0 機械座標系統(X m、Y m、Z m,機械原點Ο m ) 5 1 設計座標系統(Ud、Vd,原點Od ) 60 多層印刷配線板 6 1 兩面配線板 6 1 a單一配線板的圖案 62 導體 63 (絕緣)基板 64 基板材料 64a基板材料(具有導孔) 65 導孔Lx = L 1 xc 1 / (c2-c 1), L y = L 2 xd 1 / (d 2-d 1) The inference of the true coordinates of the above-mentioned mark 値 The formula of Lx, Ly is called the mark's coordinates 値 inference Coordinate calculation method for the coordinates of the control device installed in the hole punching machine. The above-mentioned formulas imply that there is no measurement method concerning the distance a to the X-ray source of the mark and the distance b to the fluorescent surface 'increasing the number of layers of the multilayer printed wiring board, even if the marks arranged on each inner layer make The position difference in the thickness direction becomes larger, and the influencers can be excluded theoretically. The xy coordinate system used in the above description is a coordinate system fixed to an X-ray camera, and is usually an image in the field of view of a camera of about 10 square meters. The coordinate system set in the reference hole punching machine will be described with reference to FIG. 2. Fig. 2 (a) is an explanatory diagram showing the coordinate system of the reference hole punching machine as viewed from above. As described above, in the fixed part of the mechanical stand or frame that is not moved on the ground of the reference hole puncher, the coordinate origin is set to 0m, -31-(28) 1230571, and the coordinate axis is set to Xm, Ym's mechanical coordinate system. The mark image is observed with the (local) coordinate system of the origin X of the X-ray camera set at the observation device and the coordinate axes X and y. That is, the coordinates 値 c1, d1, c2, and d2 of the marked image are the coordinates 读 出 read out at the local coordinates. The X axis of the local coordinate axis is set to be parallel to the Xm axis, and the y axis is set to be parallel to the Ym axis. It is known that the coordinate 既 of the local coordinate origin 0 is the coordinate of the mechanical coordinate system. In this way, the coordinates of the points represented by the local coordinate system can be simply converted into the coordinates of the mechanical coordinate system. For example, to compare the group of marks formed on the four corners of the multilayer printed wiring board, the coordinate system of the mark is converted into a mechanical coordinate system. The movements Tx and Ty of the movable table are also set to be parallel to the coordinate axis of the mechanical coordinate system. When the observation device is not moved, the origin 0 of the local coordinates is not moved. As shown in FIG. 1 (a), in this state, if the table on which the multilayer printed wiring board is placed is moved parallel to Xm and Ym, a predetermined amount of the movable mark can be moved. The description of the above formula is that the table on which the multilayer printed wiring board is placed is parallel to the Xm and Ym axes of the mechanical coordinate system to move Ty and Tx in the X and Y directions. Create a fixed one and explain it. At this time, the table moves incrementally parallel to the Xm and Ym axes of the mechanical coordinate system, and the mark M is moved to M1 and M2. The mark of the moving direction of the table is positive when the coordinate of the mark observed by the local coordinate system increases. That is, the positive and negative directions of the moving direction of the table are the same as those of the mechanical base -32- (29) 1230571 standard system. As mentioned above, the conventional punching machine is for the convenience of mechanical structure. The movable stage on which the multilayer printed wiring board is placed moves only in one direction, and an observation device is moved at a right angle to the direction to move and move the coordinate of the mark. The construction. In this way, even if a device other than the movable table is moved, the X-ray camera as the observation device recognizes the movement of the marker, and thus moves the other device relative to the movable table to move the marker. In addition, since the calculation at the time of coordinate conversion is easy, the coordinate axes of each coordinate system are usually set in parallel in a large number, but basically the coordinate axis or the movement direction is arbitrary. For example, if the movable stage on which the multilayer printed wiring board is placed is arbitrarily moved without determining the direction, the coordinate system set in the X-ray camera shows that the movement amount in the X-axis direction and the y-axis direction is sufficient. As shown in Fig. 2 (b), the illustrated reference hole opening machine is a table (multilayer printed wiring board) moving in the Ym axis direction of the mechanical coordinate system, and when viewed in the mechanical coordinate system, the mark M is followed by The movement of Ty on the table moves to M2, and it does not move in the Xm direction. In the Xm direction, an overall observation device including an X-ray source and an X-ray camera is used to move the mechanical stage and change the position of the multilayer printed wiring board. At this time, because the overall observation device moves, the local coordinate system fixed to the observation device also moves in the direction of the Xm axis of the mechanical coordinate system. Because the observation device itself moves, the projection on the projection plane [B] is as shown in Fig. 2 (c), the position of M (M 1) does not change, the X-ray source A moves to A 1, and the camera Center 0 moves to 0, and the local coordinates are -33- (30) 1230571. Measured from 0. There is a change in the position of the X-ray source 'so the marked image projection is moved by Z2. In Fig. 2 (C), the triangle A · P · M is similar to the triangle A · 0 · Z and the corresponding side length ratio is a: (a + b). Similarly, the triangle A 1 · P 1 · M and The triangle A · 0 1 · Z 2 is similar and the corresponding side length ratio is a: (a + b). From this, it becomes a / (a + b) = (Ρ · M) / (0 · Z) = Lx / cl and a / (a + b) = (PI · M2) / (01- Z2) = (Ll + Lx) / c2, and we get L x / c 1 = (L 1 + L x) / c 2. Sort the formula to get L x = L 1 x cl / (c2-cl). Compare this formula with Lx = Ll x cl / (c2-cl) when the observation device is not moving. The shape is exactly the same. The original assumption was that Lx, cl, and c2 were all positive, and in order to establish this formula, the movement amount L 1 of the observation device must also be a positive number. That is, if the observation device is in the negative direction of the Xm axis of the mechanical coordinate system When moving is defined as taking positive unitary, then in any state of Figure 2 (a), (b), it often becomes XL Lx = L 1 xcl / (c2-cl). Also, the x-axis of the local coordinate system is As it moves in its extension direction, the image on the projection plane [C] does not change. Therefore, Ly = L2 xdl / (d2-dl) is When the stage moves in two directions, or when the table moves in the direction of Ym, the observation device moves in the direction orthogonal to each other in the direction of Xm does not change, and the same formula can be used. The coordinate axis, the observation device moves in the direction of Ym -34- (31) 1230571 and the table moves in the direction of X m. The positive and negative definitions of the direction when the local coordinate system is moved are also made the same as the above example, then the marked coordinates 的 inference formula In this way, either or both of the mobile table or the observation device can be used to move the image of the marker relative to (the X-axis and y-axis directions) the local coordinate system set on the observation device, using the marker's Coordinate 値 inference can be used to calculate the true coordinate 标记 of the mark as the coordinate 局部 of the local coordinate system. The above-mentioned inference formula for marked coordinates 値 is a subtraction term with (c2-cl) and (d 2-d 1) in the denominator. According to the numbers of c 1, c 2, d 1, and d 2, in the calculation of the CPU, there may be a so-called difference in the number of bits in which the number of errors of the same degree is subtracted and the residual error becomes large. Decimal digits and so on, (c2- cl), (d2-dl) has an interesting way to determine the lower limit of each number, and it is also effective to change the operation form of the formula appropriately, such as the transformation of the formula. In this way, the Coordinates are obtained with excellent accuracy. As shown in Figure 2 (d), considering the coordinates of all these marks, the design coordinate system of the multilayer printed wiring board placed on the movable table of the punching machine (origin 0d) , Coordinates U d, V d) on the hole-cutting machine, that is, the inclination (0) of the coordinate axis Ud according to the position of the origin θd of the mechanical coordinate system (〇m, Xm, Ym). The position of the reference hole formed by the hole puncher is determined by this, but the calculation method and the like are not the purpose of the present invention and are omitted. An example of the form of a mark when the coordinate 値 inference formula of the mark according to the embodiment of the present invention is used will be described with reference to Figs. 4 and 5. -35- (32) 1230571 Fig. 4 is a perspective view showing the arrangement of the markers in the marker frame. Only the markers are observed, and substrates such as substrates and substrates are removed. Fig. 5 (a) is a schematic cross-sectional view showing the vicinity of the marking frame from the thickness direction of the multilayer printed wiring board; Fig. 5 (b) is an example of the arrangement of the marking marks; and Fig. 5 (c) is the shape of a single mark. Figures 4 and 5 are equivalent to Figures 1, 2, and 3 of the conventional example. As shown in Fig. 5 (c), two types of marks are used: a hollow mark nE in which a conductor is circularly removed from the center and a conductive mark nM is left in a circular shape. Here, η is a number indicating the conductor layer. When designing a pattern, the arbitrary solid mark M and the center of gravity of the middle E are aligned. In the figure, conductors arranged adjacent to each other are described as a group, but it is not necessary to specifically configure adjacent conductors as a group. The hollow mark E is an empty circular portion formed by removing the copper foil forming the conductor layer. The center of gravity of the hollow mark E is a hollow circular portion, and the outer square does not have a function as a mark. Fig. 5 (a) is a cross-sectional view showing the brush wiring board 60, which is formed by laminating the conductors (copper foils) on the front and back surfaces of the nine two mating substrates through the substrate material in the thickness direction; In the figure, the conductor layer mark M on the upper side of the two-sided wiring board 61 of the multilayer printed wiring board 60 is the same as the mark of the center of gravity of the hollow mark E and the conductor on the lower side. It is not necessary to sequentially compare the marks of adjacent conductor layers. The body layer may be formed with a mark. For the cross-sectional view of the frame, the number in the square body is the center of gravity of the body layer of the empty mark layer. The wire plate 6 1 is printed in multiple layers to form a solid layer. In each guide -36- (33) 1230571, these marks are usually arranged in the four corners of a multilayer printed wiring board 标记 mark box as an example, and are arranged as shown in Fig. 5 (b). The marker frame 21 is internally divided into nine squares, and a solid marker M and a hollow marker E each having the same center of gravity are arranged to form a marker group 20. As an example of the practical size, referring to the mark in Fig. 13 (b), one side F of the marker frame 21 is approximately 10 mm square; the interval A between the marks is approximately 3 mm; the outer diameter D of the solid mark 1 is 1.4 mm, and the diameter D2 of the hollow mark 23 is approximately 2.4 mm. The size F of the marker frame 21 is set to be slightly smaller than the effective field of view of the X-ray camera. The multilayer printed wiring board that ends the hot pressing process is slightly deformed. Even if the position of each mark is changed, it is fully stored in the field of view of the X-ray camera. 0 Mark The frame is set in the same position on all inner layers. As described above, the solid mark M and the hollow mark E are formed in each of the divided squares, and no other conductive layer exists in the squares. · Therefore, when the marker group 20 in the marker frame 21 is irradiated with X rays, the outer diameter D 2 and the inner diameter D arranged in three rows and three columns are observed in the dark part in FIG. 13 (b). Nine circular bright parts of 1. The outer diameter of the ring is equivalent to the circumferential portion of the hollow mark E, and the inner diameter of the ring is equivalent to the circumferential portion of the solid mark M. Take the dichotomized image with an appropriate threshold, and find the coordinates of the center of gravity of the solid mark M and the center of gravity of the circle (bright part) of the hollow mark E. 37- (34) 1230571 The center of gravity of the solid mark M It is obtained by counting only the dark points in the bright part of the ring. The center of gravity of the hollow mark E is, for example, after replacing all the dark parts of the solid mark M with the bright part, and counting only the bright points. Observation of markers using the coordinates of the markers 値 inferred is performed in the following order. First, the observed multilayer printed wiring board is placed on the movable table, and the mark is placed in the field of view of the observation device. Based on the first observation of the first project, the coordinates 値 (equivalent to c 1 and d 1) of the center of gravity of 18 marks arranged in a mark frame are obtained. As a second process, the multilayer printed wiring board is relatively moved to move the X and y components of LI and L2 in a predetermined amount. Based on the second observation of the third project, the coordinates 値 (equivalent to c2 and d2) of the center of gravity of 18 marks arranged in a mark frame are obtained. In the above, the second observation is used, and the coordinates of the previous mark are applied to each of the marks. The estimation formula Lx = Ll xcl / (c2-cl) and Ly = L2xdl / (d2-dl) are performed. The estimated coordinates of the position where the first measurement of each mark was performed are calculated. Observation of the marked frame at the last part above. The calculation of the coordinates of the mark 値 inference formula is a calculation method of the coordinates 在 in the control device of the punching machine, and the results are also stored in the storage device in the control device. The above is the sequence of marking observation on the hole punch. Comparing Fig. 5 (a) and Fig. 13 (a), it is known that 18 marks in a mark frame correspond to a multilayer printed wiring board with 12 conductor layers, but the coordinates of the mark are used. In the inference formula, the same mark group can correspond to a multilayer printed wiring board having 20 conductor layers. When designing the wiring pattern of the conductor layer, the layout of the -38- (35) 1230571 layout of wiring patterns such as markers can still correspond to the increase in the number of layers of the conductor layer. Therefore, it is not necessary to change the standard diagram, which helps Labor-saving design. In the present invention, the difference in distance between the conductive layer forming the mark and the fluorescent surface of the X-ray camera is essentially eliminated, so that the difference in accuracy between the outer periphery of the field of view of the X-ray camera and the vicinity of the center can be avoided. That is, there is no influence of α in FIG. 3 (b). In addition, if Z3 and Z4 shown in Fig. 3 (c) are enlarged, if the two marks do not overlap, the respective coordinates of the center of gravity can be measured. If the thickness of an ordinary substrate or a substrate material and the size of an exemplary mark are exemplified, a combination of marks of an arbitrary layer may be used. [Effects of the Invention] As described above, the coordinate 値 inference formula of the mark of the present invention offsets the position in the thickness direction of the inner layer plate during observation, and can infer the mark position of the true mark. In principle, even if there is a mark on any layer of the multilayer printed wiring board, it is expected to improve the measurement accuracy of the mark, and it can be used as an X-ray camera with a wider field of view than before. By introducing the coordinate inference formula of the marker of the present invention, nine sets (18) of markers controlled in the field of view of the camera of a conventional punching machine can correspond to a multilayer printed wiring board up to 20 layers, and can be Corresponds to most multilayer printed wiring boards that are generally manufactured. The wiring pattern of the conductor layer is changed in accordance with the condition of the internal circuit part ’, but the name, batch mark, and other peripheral parts of the marker frame are mostly designed as standard designs. Therefore, the periphery of the wiring pattern of the multilayer printed wiring board -39- (36) 1230571 is still the current standard design and does not need to be changed ', which has the advantage of not increasing the number of wiring pattern design users. It is not necessary to change the hardware surface of the reference hole punching machine in order to load the coordinate 値 inference formula of the mark of the present invention. Only the order of adding the marker measurement process can be supported by software that implements the marker coordinate estimation method. The conventional machine can also be made into a punching machine with the function of the present invention by changing or re-changing the software. New functions can be loaded without significantly increasing the original cost of production ', and there is no need for a large price for functional services that increase the already sold products, and the effect of serviceability is also great. [Brief description of the drawings] The first (a) and (b) are three-dimensional views showing the image of the mark and the image of its fluorescent surface, which illustrate the calculation method of the true coordinates of the mark according to the embodiment of the present invention, and an orthographic projection according to the angle method Illustration. Figures 2 (a) to 2 (d) show the relationship between various coordinate systems such as the mechanical coordinate system of the reference hole punching machine set in the embodiment of the present invention, and the design coordinate system of the multilayer printed wiring board. Illustrating. Figs. 3 (a) to 3 (c) are schematic diagrams showing a marker observation method according to X-rays, and a schematic diagram illustrating distortion of a marker image. Fig. 4 is a perspective view showing an example of the arrangement of markers formed in a marker frame. 5 (a) to 5 (c) are schematic diagrams showing the shape of a mark formed in a mark frame inside the mark frame. Fig. 6 is a perspective -40- (37) 1230571 view of a reference hole punching machine for opening a reference hole. Figures 7 (a) and 7 (b) are a plan view and a side view of a standard tying machine. Figures 8 (a) and 8 (b) are plan views showing the movable table of the reference hole punching machine. Figures 9 (a) and 9 (d) are projection views showing the X-movement stage of the reference hole punching machine in each direction. Figures 10 (a) to 10 (c) are a perspective view and a plan view showing the structure of a multilayer printed wiring board, and schematic diagrams of a work template used in a hot pressing process. Figures 11 (a) and 11 (b) are cross-sectional views showing the structure of a multilayer printed wiring board. Fig. 12 is a perspective view showing an example of a conventional arrangement of a marker group that reduces errors due to the height of the marker. 13 (a) to 13 (c) are schematic diagrams showing the shape of the mark shown in Fig. 12. [Symbol description] 1 Hole machine 2 Frame 3 Stand 4 X-ray generating device 4a X-ray generating tube 5 X-ray protective tube -41-1230571 ι38) 5a hole 6 X-ray camera 7 spindle 7 a chuck 7b drill 7 c, 9 a Cylinder 8 Mandrel stand 9 Fixture 10 X mobile stand 11 γ mobile stand 12 Movable stand 10a, 11a, 12a Linear guide (LM guide) 1 0 b, 1 1 b, 1 2 b Ball screw 16 open Hole position (1, 2 holes) 16a Opening position (3, 4 holes) 17 Operator position (blank arrow) 20 Marking group 2 1 Marking frame η Medium solid mark η Hollow mark 30 X-ray fluorescent doubler tube 3 1 Fluorescent film 3 2 Photoelectric surface 3 3 Output fluorescent film -42- (39) (39) 1230571 34 Optical lens system 3 5 CCD photographic element (charge-coupled element) 36 Image A anode S receiving electrode 5 0 Mechanical Coordinate system (X m, Y m, Z m, mechanical origin 0 m) 5 1 Design coordinate system (Ud, Vd, origin Od) 60 Multilayer printed wiring board 6 1 Double-sided wiring board 6 1 a Single wiring board pattern 62 conductor 63 (insulation) substrate 64 substrate material 64a substrate material (with via hole) 65 via hole

66、 66a、 66b、 P 標記 6 7、Η 基準孑L 6 8 結層工模板 6 8 a定位銷 69 最大配線板外形 69a最小配線板外形 70 影響範圍66, 66a, 66b, P mark 6 7, 孑 Reference 孑 L 6 8 Laminating die 6 8 a Locating pin 69 Maximum wiring board shape 69a Minimum wiring board shape 70 Scope of influence

Ha 表背識別用標記 -43-Ha Case Identification Mark -43-

Claims (1)

(1) 1230571 拾、申請專利範圍 1 · 一種基準孔開孔機,針對於具備: 固定於基準孔開孔機的框體的架台; 具備將照射形成於多層印刷配線板的構成要件的兩面 印刷配線板的導體層的標記的X線加以出射的X線源,及 觀測照射上述標記的X線的透過所形成的上述標記的像的 X線攝影機,並以上述架台所支撐的觀測裝置; 在上述多層印刷配線板開設基準孔的開孔裝置; 相對地變換上述多層印刷配線板與上述觀測裝置及上 述開孔裝置的移送裝置;以及 由藉由上述觀測裝置所觀測的上述標記的像的觀測座 標値推斷上述標記的真座標値,及上述多層印刷配線板的 設計座標系統的配置,且控制上述移送裝置的控制裝置; 其特徵爲: 上述控制裝置是具有從比被固定在上述觀測裝置的座 標系統所表示的第一次的上述標記的像的觀測座標値,及 相對地移動上述多層印刷配線板所定量之後所觀測的第二 次的上述標記的像的觀測座標値,及移動上述多層印刷配 線板的上述所定量,推斷上述標記的真座標値的標記座標 値推斷功能。 2 ·如申請專利範圍第1項所述的基準孔開孔機,其中 ’上述標記座標値推斷功能是將被固定於上述觀測裝置的 座標系統的座標値所表示的上述第一次的標記的像的觀測 座標値的X座標作爲c 1,將y座標作爲d 1 ;將上述第二 -44- (2) 1230571 次標記的像的觀測座標値的X 座標作爲C 2,將y 座標作 爲d2;並將移動上述移送裝置的上述所定量的X軸成分作 爲L1,將Y軸成分作爲L2時, 具備將上述第一次觀測時的標記的上述真座標値的X 座標作爲Lx,及將y座標作爲Ly,則推斷作爲Lx = Ll X c 1 / ( c 2 - c 1 )及L y = L 2 X d 1 / ( d 2 - d 1 )的標記的真的座標 値算出運算手段。 3 · —種多層印刷配線板的標記座標値的推斷方法,其 特徵爲: 藉由X線源及從具備X線攝影機的觀測裝置的上述X線 源所出射的X線照射形成在多層印刷配線板的構成要件的 印刷配線板的導體層的標記,以X線攝影機觀測上述標記 的像,作爲被設定在上述觀測裝置的座標系統的座標値得 到上述標記的像的座標値的第一工程; 相對地進行載置於移送裝置上的上述多層印刷配線板 移動所定量的第二工程; 藉著上述觀測裝置觀測上述第二工程的移動後的上述 標記的像,並得到第二次的上述標記的像的座標値的第三 工程;以及 從比被固定在觀測裝置的座標系統所表示的第一次的 上述標記的像的觀測座標値,及相對地移動上述多層印刷 配線板所定量之後所觀測的第二次的上述標記的像的觀測 座標値,及移動上述多層印刷配線板的上述所定量,推斷 觀測第一次標記時的上述標記的座標値的第四工程所構成 -45- (3) 1230571 4 .如申請專利範圍第3項所述的多層印刷配線板的標 記座標値的推斷方法,其中 上述第四工程是將被固定於上述觀測裝置的座標系統 的座標値所表示的上述第一次的標記的像的觀測座標値的 X座標作爲c 1,將y座標作爲d 1 ;將上述第一次標記的 像的觀測座標値的X座標作爲c2,將y 座標作爲d2 ;並 將上述多層印刷配線板的相對地移動的上述所定量的X軸 成分作爲L1,將Y軸成分作爲L2時; 將上述第一次觀測時的上述標記的上述真座標値的X 座標作爲L X,及將y座標作爲l y,則推斷作爲L X = L 1 X cl/ ( c 2 - c 1 )及 Ly = L2 x d 1 / ( d 2 - d 1 )。(1) 1230571 Patent application scope 1 · A reference hole punching machine is provided with: a gantry fixed to the frame body of the reference hole punching machine; two-sided printing provided with constituent elements for irradiation to be formed on a multilayer printed wiring board An X-ray source that emits the marked X-rays of the conductor layer of the wiring board, and an X-ray camera that observes the image of the mark formed by the transmission of the marked X-rays, and an observation device supported by the stand; An opening device for opening a reference hole in the multilayer printed wiring board; a transfer device that relatively changes the multilayer printed wiring board with the observation device and the opening device; and observation of the marked image observed by the observation device The coordinate 値 infers the true coordinate 上述 of the mark, and the configuration of the design coordinate system of the multilayer printed wiring board, and controls the transfer device. The control device is characterized in that: the control device is provided with a slave fixed to the observation device. The coordinate of the first observation of the marked image indicated by the coordinate system, and the relative movement The second observation coordinate 値 of the marked image observed after the multi-layer printed wiring board is measured, and the real coordinate 座 mark coordinate 値 estimation function of the mark is estimated by moving the multi-layer printed wiring board. 2 · The reference hole drilling machine according to item 1 of the scope of the patent application, wherein the above-mentioned mark coordinate 値 inference function is the first mark indicated by the coordinates 値 of the coordinate system fixed to the observation device. The X coordinate of the observation coordinate 値 of the image is c 1 and the y coordinate is d 1; the X coordinate of the observation coordinate 値 of the second-44- (2) 1230571 labeled image is C 2 and the y coordinate is d2 Let the X-axis component of the quantitative movement of the transfer device be L1 and the Y-axis component be L2, including the X coordinate of the true coordinate 标记 of the mark at the first observation as Lx, and y If the coordinates are Ly, it is inferred that the real coordinates of the marks Lx = Ll X c 1 / (c 2-c 1) and L y = L 2 X d 1 / (d 2-d 1) are calculated. 3. A method for estimating the marking coordinates 多层 of a multilayer printed wiring board, which is characterized in that an X-ray source and an X-ray emitted from the X-ray source of an observation device including an X-ray camera are formed on the multilayer printed wiring The marking of the conductor layer of the printed wiring board, which constitutes the requirements of the board, is to observe the image of the mark with an X-ray camera as the first step of obtaining the coordinates of the mark image by setting the coordinates of the coordinate system of the observation device; Relatively perform the second process quantitatively determined by the movement of the multilayer printed wiring board placed on the transfer device; observe the image of the mark after the second process is moved by the observation device, and obtain the second mark The third process of the coordinate 値 of the image; and the observation coordinate 値 of the image of the above-mentioned mark for the first time indicated by the coordinate system fixed to the observation device, and the relative movement of the multilayer printed wiring board Observe the observation coordinates 値 of the marked image for the second time, and move the multilayer printed wiring board as described above to estimate the view. The fourth process of the above-mentioned marked coordinate 时 at the time of the first marking -45- (3) 1230571 4. The method of inferring the marked coordinates 値 of the multilayer printed wiring board according to item 3 of the patent application scope, wherein the above The fourth project is to use the X coordinate of the observation coordinate 値 of the first labeled image indicated by the coordinate 値 of the coordinate system fixed to the observation device as c 1 and the y coordinate as d 1; When the X-coordinate of the observation coordinate 値 of the sub-labeled image is c2, and the y-coordinate is d2; and the relative X-axis component of the above-mentioned relative movement of the multilayer printed wiring board is L1, and the Y-axis component is L2; Let the X-coordinate of the above-mentioned true coordinate 値 of the above-mentioned mark at the first observation be LX, and the y-coordinate be ly, it is inferred as LX = L 1 X cl / (c 2-c 1) and Ly = L2 xd 1 / (d 2-d 1). -46--46-
TW092128690A 2002-10-16 2003-10-15 Reference hole boring machine, and method for estimating guide mark coordinates for multilayer printed circuit board TWI230571B (en)

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JP4542046B2 (en) * 2006-01-30 2010-09-08 セイコープレシジョン株式会社 Drilling method and drilling device
KR101184231B1 (en) 2011-05-03 2012-09-19 이오에스(주) Take advantage of imagines simulation land portion of pcb drill process method
KR101825832B1 (en) * 2016-09-23 2018-02-05 가부시키가이샤 무라키 Automatic handling device for applied in a multilayer circuit board drill machine
CN108712826B (en) * 2018-08-09 2023-12-01 深圳凯世光研股份有限公司 PCB Mark point identification device and identification method thereof
TWI742641B (en) * 2020-04-30 2021-10-11 寶翔精密有限公司 X-ray target machine circuit board target position automatic alignment method and its feeding device
CN113419485B (en) * 2021-06-25 2022-07-15 吉安砺芯半导体有限责任公司 Positioning and punching method, equipment, storage medium and device
TWI772188B (en) * 2021-09-24 2022-07-21 健鼎科技股份有限公司 Perforation forming method of a multilayer circuit board, manufacturing method of a multilayer circuit board, multilayer circuit board and multilayer circuit board manufacturing system

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