TWI227034B - Substrate processing apparatus and method - Google Patents

Substrate processing apparatus and method Download PDF

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Publication number
TWI227034B
TWI227034B TW090113578A TW90113578A TWI227034B TW I227034 B TWI227034 B TW I227034B TW 090113578 A TW090113578 A TW 090113578A TW 90113578 A TW90113578 A TW 90113578A TW I227034 B TWI227034 B TW I227034B
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Taiwan
Prior art keywords
processing
substrate
processing unit
units
unit
Prior art date
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TW090113578A
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Chinese (zh)
Inventor
Kiyohisa Tateyama
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Tokyo Electron Ltd
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Publication date
Priority claimed from JP2000169191A external-priority patent/JP3732388B2/en
Priority claimed from JP2000172338A external-priority patent/JP2001351852A/en
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
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Publication of TWI227034B publication Critical patent/TWI227034B/en

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    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1303Apparatus specially adapted to the manufacture of LCDs
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/16Coating processes; Apparatus therefor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/6704Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/673Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/30Imagewise removal using liquid means

Abstract

Processing apparatus 100 for applying a predetermined process to a substrate G comprises a first process unit group 2a having a plurality of process units for applying a first process, a second process unit group 2b having a plurality of process units for applying a second process, and common transfer means 42, 44, 46, 48, 50 for transferring the substrate to each process unit of the first and second process unit groups 2a and 2b.

Description

1227034 A7 B7 經濟部智慧財產局員工消費合作社印製 五、發明說明( [發明之目的] [發明所屬之技術領域及其領域之習知技術] 本發明’係關於例如對於LCD玻璃基板等之基板施予 抗敍劑塗佈,露光及顯像處理等多數處理的,處理装置及 處理方法。 [習知技術] 在製造液晶顯示裝置LCD時,對於基板即LCD玻璃基 板,成膜給定膜之後,塗佈光致抗蝕劑以形成抗蝕劑膜, 並與電路圖案對應地將抗蝕劑膜露光,將之予以顯像處理 等’易言之,藉所謂之光刻技術來形成電路圖案。 依照此光刻技術,被處理體即LCD基板,乃經過附著 (疏水化)處理—抗蝕劑塗佈—預烘烤—露光—顯像—後烘 烤等之一連系處理,以在抗蝕劑層形成給定之電路圖案。 以往,這種處理,係將用來進行各處理之處理單元, 在意識處理流程之形態下配置在運送路之兩側,將藉由可 行走於運送路之運送裝置來進行基板之搬入•搬出於各單 兀之處理方框,配置多數個而成一處理系統,藉由此處理 系統來進行處理。這種處理系統,係沿著用來運送基板之 運送路,而_行地並設有用來進行洗淨處理,抗蝕劑塗佈 處理,顯像處理的液處理系統單元,以及進行加熱•冷卻 處理或附著處理之熱處理系統單元。 然而,近來,對於LCD基板強烈地要求大型化,以致 出現了一邊大到lm之巨大者。由於具有如上一般之平面 配置之處理系統會導致覆蓋區(f00tprint)變成極大者, 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) ---^-----^------- (請先閱讀背面之注意事項再本頁) II衣 太 線 4 1227034 A7 經濟部智慧財產局員工消費合作社印製 - ------------- ----— 瓜 __五、發明說明(2 ) 以從有效地利用每單位面積之製造。維持管理成本極高之 淨化室的觀點觀之,強烈地要求覆蓋區之縮小。 又,如最近所顯示,電路之高積體化。微細化之要求 高漲起來,工程變成複雜化,以致單元增加,為此處理系 統之覆蓋區也正在變大,但若依照各單元單純沿運送路並 設之習知構成的話,欲將覆蓋區縮小時,單元數之增加卻 受限,一方面,當增加單元數以期提高生產率時,覆蓋區 即變大。就是說,單元數之增加與覆蓋區之削減雖說相反 者仁可同時滿足相反之兩個條件,才可充份對應於高度 化複雜化之基板處理的要求,且,強烈地盼離那種裝置 之出現。 [發明應達成之技術性課題] 本發明係鑑於這種事情而做者,#目的係在於,提供 -種可使覆蓋區變小而且備有多數個處理單元之基板處理 裝置、及其基板處理方法。 又,其他目的係在於提供一種,一面將覆蓋區抑低, 一面同時使單元數增加的基板處理裝置。 按照本發明之第一觀點,提供一基板處理裝置,其係 用來對基板施予給定處理者,包含有: 第處理單元群,其係備有用來施行由多數工程所成 之連串第一處理的多數個處理單元; 第一處理單几群,其係備有用來施行由多數工程所成 之連串第二處理的多數個處理單元;及 同之運送手段,其係用以進行對於前述第一及第二 ---.-----訂------- (請先閱讀背面之注意事項再^!^本頁) -衣 線1227034 A7 B7 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs. 5. Description of the invention ([Purpose of the invention] [Technical field to which the invention belongs and its known technology] The present invention is related to substrates such as LCD glass substrates Apparatuses and methods for applying anti-repellent agent coating, exposure, and development processing, etc. [Known Technology] When manufacturing a liquid crystal display device LCD, for a substrate, ie, the LCD glass substrate, a given film is formed. , Coating a photoresist to form a resist film, exposing the resist film to light corresponding to a circuit pattern, and developing it, etc., in other words, the circuit pattern is formed by a so-called photolithography technique According to this photolithography technology, the object to be processed, namely the LCD substrate, is subjected to one of the following processes: adhesion (hydrophobization) treatment-resist coating-pre-baking-exposure-development-post-baking, etc. The etching layer forms a given circuit pattern. In the past, this type of processing used the processing units for each processing to be arranged on both sides of the transportation path in the form of a conscious processing flow. Carrying of substrates on the road by a transporting device • It is moved out of the processing boxes of each unit, and a plurality of processing systems are arranged to form a processing system, and processing is performed by the processing system. This processing system is used to transport substrates along Conveyor roads are equipped with a liquid processing system unit for cleaning processing, resist coating processing, and development processing, and a thermal processing system unit for heating, cooling, or adhesion processing. However, recently, The LCD substrate is strongly required to be large, so that one side is as large as lm. Due to the processing system with the general planar configuration as described above, the coverage area (f00tprint) becomes extremely large. This paper size applies the Chinese national standard (CNS ) A4 size (210 X 297 mm) --- ^ ----- ^ ------- (Please read the precautions on the back before this page) II Clothing Line 4 1227034 A7 Intellectual Property Bureau, Ministry of Economic Affairs Printed by employee consumer cooperatives-------------- ----_ Melon __ V. Description of the invention (2) To make efficient use of per unit area of manufacturing. Maintenance management costs are extremely high From the viewpoint of the clean room, It is strongly demanded that the coverage area be reduced. Also, as shown recently, the circuit is highly integrated. The requirements for miniaturization have risen, the engineering has become complicated, and the number of units has increased. For this reason, the coverage area of the processing system is also increasing. However, according to the conventional structure of each unit simply set up along the conveying path, when the coverage area is to be reduced, the increase in the number of units is limited. On the one hand, when the number of units is increased in order to increase productivity, the coverage area becomes larger. That is to say, although the increase in the number of units and the reduction in the coverage area can satisfy the opposite two conditions at the same time, they can fully meet the requirements for highly complicated substrate processing, and strongly hope to leave that device. [Technical problem to be achieved by the invention] The present invention has been made in view of such a matter, and the purpose is to provide a substrate processing apparatus which can reduce a coverage area and is provided with a plurality of processing units, and Its substrate processing method. Still another object is to provide a substrate processing apparatus that can increase the number of units while suppressing a low coverage area. According to a first aspect of the present invention, there is provided a substrate processing apparatus for applying a given processor to a substrate, including: a first processing unit group, which is provided for performing a series of A plurality of processing units for one process; a group of first processing orders, which are provided with a plurality of processing units for performing a series of second processes made by a majority of projects; and a transportation means for performing the same The aforementioned first and second ---.----- order ------- (Please read the precautions on the back before ^! ^ This page)-clothing line

227034227034

、發明說明 經濟部智慧財產局員工消費合作社印製 處理單元群之各處理單元的基板之運送。用來1;:,發明之第二觀點,提供一基板處理裝置,其令 子基板施予給定處理者,包含有: ^處理單元群,其係備有絲施行衫數工程所4 、串第一處理的多數個處理單元; 处里單元群,其係備有用來施行由多數工程所4 之連串第二處理的多數個處理單元; /、同之運送手段,其係用以進行對於前述第一及第二 處理單元群之各處理單元的基板之運送;及 、、擇手4又其係用以選擇該用第一處理單元群及第二 <理單元群中之那_個’來處理前述基板。按照本發明之第三觀點,提供一基板處理裝置,其% 用來對基板施予給定處理者,包含有: 第處理單疋群,其係備有用來施行由多數工程所治 之連串第一處理的多數個處理單元; 第二處理單元群,其係備有用來施行由多數工程所治 之一連串第二處理的多數個處理單元;共同之運送手段,其係用以進行對於前述第一及第二處理單元群之各處理單元的基板之運送;及 前述第一及第二處理單元群,分別備有:水平處理方框,其係水平地配置有多數個處理單元; 及 垂直處理方框,其係將多數個處理單元配置成向垂崖 方向推起來; 本紙張尺錢财0目家標準(CNS)A4規格⑵0 X 297公董) (請先閱讀背面之注意事項再 --- 〔再本頁一 訂---------線Description of the invention The substrates of each processing unit of the processing unit group printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs are transported. Used for 1;:, the second aspect of the invention, to provide a substrate processing device that allows a sub-substrate to be given to a given processor, including: ^ a processing unit group, which is equipped with a silk-manipulation number engineering institute 4, and A plurality of processing units for one process; a virgin unit group provided with a plurality of processing units for performing a series of second processes performed by the majority of engineering institutes 4; The substrate transport of each processing unit of the first and second processing unit groups; and, and the pick 4 are used to select the first processing unit group and the second < processing unit group. To process the aforementioned substrate. According to a third aspect of the present invention, a substrate processing apparatus is provided, which is used to give a given processor to a substrate, and includes: a first processing unit group, which is used to execute a series of first A plurality of processing units for one processing; a second processing unit group provided with a plurality of processing units for performing a series of second processing performed by a majority of projects; a common transportation means for performing the first and Substrate transportation of each processing unit of the second processing unit group; and the aforementioned first and second processing unit groups are provided with: a horizontal processing block which is horizontally arranged with a plurality of processing units; and a vertical processing block , It is the configuration of the majority of processing units to push up the cliff; this paper rule money 0 standard (CNS) A4 specifications ⑵ 0 X 297 public director) (Please read the precautions on the back before --- 〔 Book again on this page-line

6 1227034 A7 五、發明說明(4 ) 前述運送手段,備有: 水平方向運送裝置,其係向水平方向可移動地設置著 ,以便對於前述水平處理方框進行基板之交接;及 垂直方向運送裝置,其係向垂直方向可移動地設置著 ,以便對於前述垂直處理方框進行基板之交接。 按照本發明之第四觀點,提供一基板處理方法,其係 藉基板處理襞置對於基板施行給定處理之方法者,就是, 對於各基板,選擇用第一處理單元群及第二處理單元群中 之那一個來處理,各基板即用其所選擇的一方之處理單元 群來處理; 該基板處理裝置,包含有: 第一處理單元群,其係備有用來施行由多數工程所成 之一連串第一處理的多數個處理單元; 第二處理單元群,其係備有用來施行由多數工程所成 之一連串第二處理的多數個處理單元; 共同之運送手段,其係用以進行對於前述第一及第二 處理單元群的基板之運送。 按照上述本發明之第一乃至第四觀點,由於設置_對 於第一及第二處理單元群(其分別用以進行獨立的一連串 處理)進行基板運送的共同運送手段,所以較之每一系统 設置運送手段之習知構成,更可使運送手段減少,同時' 可使裝置之覆蓋區變小。 此時,若設置一用來選擇應該用第一處理單元群及第 二處理單元中之那一個來處理基板的選擇手段,對於各基 本纸張尺度適用中國國家標準(CNS)A4規格(2〗0 X 297公釐) (請先閱讀背面之注意事項再 —.-----訂-------- 頁) .線 經濟部智慧財產局員工消費合作社印製 7 12270346 1227034 A7 V. Description of the invention (4) The above-mentioned conveying means are provided with: a horizontal-direction conveying device which is movably arranged in a horizontal direction so as to transfer substrates to the aforementioned horizontal processing frame; and a vertical-direction conveying device It is movably arranged in the vertical direction so as to transfer the substrates to the aforementioned vertical processing frame. According to a fourth aspect of the present invention, a substrate processing method is provided, which is a method for performing a given process on a substrate by using a substrate processing apparatus, that is, for each substrate, a first processing unit group and a second processing unit group are selected for use. Each substrate is processed by the processing unit group of the selected one. The substrate processing device includes: a first processing unit group, which is used to execute a series of processes formed by most processes; The plurality of processing units of the first processing; the second processing unit group is provided with a plurality of processing units for performing a series of second processing formed by a plurality of processes; and the common transportation means is used to perform the above-mentioned first processing. The substrates of the first and second processing unit groups are transported. According to the first to fourth aspects of the present invention described above, since a common transportation means is provided for the first and second processing unit groups (which are used to perform an independent series of processes), the substrate transportation is performed, so it is set more than each system. The conventional structure of the transportation means can reduce the transportation means, and at the same time, can reduce the coverage area of the device. At this time, if a selection means is selected to select which of the first processing unit group and the second processing unit should be used for processing the substrate, the Chinese National Standard (CNS) A4 specification (2) is applied to each basic paper size (2) 0 X 297 mm) (Please read the precautions on the back before — — — — — — — — — — ——————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————————— Please read the notes on the back of the page.

經濟部智慧財產局員工消費合作社印製Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs

板,選擇應該第一處理群及第二處理群之那一個來声王 然後對於各基板用其所選擇的一方之處理單元群來, 理,則可分別獨立地對於基板用第一處理單元群及=二處 理單元群施行給定之處理。 一處 按照本發明之第五觀點,提供一基板處理裝置, 將塗佈液塗佈於基板以形成薄膜,同時將與電路圖案對= 地露光之前述薄膜予以顯像之處理装置者,包含有Y -.多數個旋轉系統單元,其係使基板旋轉以用來處理者 多數個熱處理系統單元,其係在不使基板旋轉下予以 加熱•冷卻處理; 運送袭置其係用以運送基板,將之搬出•搬入於前 述各單元;及 運送路,其係形成前述裝置之移動徑路;其中: 前述旋轉系統單元,係沿著前述運送路而並設著;前 述f處理系統單元係堆起成多段以構成熱系處理單元方框 刖m理單元方框,係多數配置在前述運送路上或 其延長線上之給定部分的周圍。 、按照本發明之第六觀點,提供_基板處理裝置,其係 將塗佈液塗佈於基板以形成薄膜,同時,將與電路圖案對 應地露光之前述薄膜予以顯像之處理裝置者,包含有: 夕數個液處理系統單元,其係將給定液供給基板上以 進行處理; 夕數個熱處理系統單元,其係對於基板進行熱處理;Board, select one of the first processing group and the second processing group, and then use the processing unit group of the selected one for each substrate. The first processing unit group can be used for the substrate independently. And = two processing unit groups perform the given processing. According to a fifth aspect of the present invention, there is provided a processing device for processing a substrate by applying a coating solution on a substrate to form a thin film, and simultaneously developing the aforementioned thin film that is opposite to a circuit pattern = ground dew, including Y-. Most rotating system units are used to rotate the substrate for processing. Most heat treatment system units are used to heat and cool without rotating the substrate. It is moved out and moved into each of the aforementioned units; and a conveying path, which forms the moving path of the aforementioned device; wherein: the rotating system units are arranged along the conveying path; the f processing system units are stacked into A plurality of sections constitute a thermal processing unit block and a physical unit block, most of which are arranged around a given part of the aforementioned transportation path or its extension line. According to a sixth aspect of the present invention, there is provided a substrate processing device, which is a processing device that applies a coating solution to a substrate to form a thin film, and simultaneously develops the aforementioned thin film exposed in correspondence with a circuit pattern, including: There are: several liquid processing system units that supply a given liquid to the substrate for processing; several thermal processing system units that perform thermal processing on the substrate;

本紙張尺度賴t目目豕標準(CNS)A4規格⑵g X 297公爱) ί請先閱讀背面之注意事項 ΒΙ衣.丨丨 再^^本頁) L-----^---------^The size of this paper is standard (CNS) A4 size (g X 297). Ί Please read the precautions on the back first. 丨 丨 ^^ This page) L ----- ^ ---- ----- ^

8 1227034 A7 ^—--—-2Z____ — 五、發明說明(6) 運送I置,其係用以運送基板,將之搬出•搬入於前 述各單元;及 運送路,其係形成前述裝置之移動徑路;其中: 前述液處理系統單元係沿著前述運送路而並設著;前 述熱處理系統單元係堆起成多段以構成熱系處理單元方框 :前述熱系處理單元方框,係多數配置在前述運送路上或 j 其延長線上之給定部分的周圍。 按照本發明之第七觀點,提供一基板處理裝置,其係 對於基板施予包括多數之液處理及附隨於該液處理之熱處 理在内之一連串處理的處理裝置者,包含有: 多數個液處理系統單元,其係對於基板進行液處理; 多數個液處理系統單元,其係對於基板進行附隨於前 述多數液處理之熱處理; 運送裝置,其係用以運送基板,將之搬出•搬入於前 述各單元;及 運送路,其係形成前述裝置之移動彳i路;其中: 前述液處理系統單元係沿著前述運送路而並設著;前 述熱處理系統單元係堆起成多段以構成熱處理單元方框; 前述熱系處理單元方框,係多數配置在前述運送路上或其 延長線上之給定部分的周圍。 、 如第五觀點乃至第七觀點所顯示,由於沿著運送路設 置旋轉系單元乃至液處理系單元,將熱處理系單元堆起成 多段以構成熱系處理單元方框,使這種熱系單元方框多數 配置在運送路上或其延長線上之給定部分的周圍,所以可 本紙張尺度適用中國國家標準(CNS)A4規------ (請先閱讀背面之注意事項再本頁) I#衣 再 訂---------線 經濟部智慧財產局員工消費合作社印製 9 1227034 A7 B7 五、發明說明(7 一面抑低覆蓋區,一面,使單元數增加。 按照本發明之第八觀點,提供一基板處理裝置,其係 對於被處理基板施行由包含液處理及熱處理在内之多數工 程所成的處理之處理裝置者,包含有: 第一處理部,其係配置有沿著一向水平延伸之水平運 送路而對被處理基板施行液處理之多數個液處理系處理單 元’並藉由移動於前述水平運送路之第一運送裝置,對於 沿著前述水平運送路而設的各處理單元進行被處理基板之 運送;及 第二處理部,其係配置有沿著一向垂直延伸之垂直運 送路而向上下方向對被處理基板施行熱處理之多數個熱處 理單元’並藉由移動於前述垂直運送路之第二運送裝置, 對於沿著前述垂直運送路而設的各處理單元進行被處理基 板之運送。 像這樣,由於備有:沿著水平運送路設有多數處理單 元,並藉由一移動於水平運送路之第一運送裝置,對於沿 著水平運送路而設的各處理單元進行被處理基板之運送的 第一處理部;及沿著水平運送路來設置多數個處理單元, 並藉由移動於垂直運送路之第二運送裝置,對沿著垂直運 送路而設的各處理單元進行處理基板之運送; 所以可將不妨礙重疊成上下之處理單元配置於第二處 理部’藉此使覆蓋區變小,而且,一如將第一運送裝置沿 著水平運送路向水平移動,將第二運送裝置沿著垂直運送 送路向垂直移動那樣,可達成運送裝置之機能分離,因而 本紙張尺度適用中國國家標準(CNS)A4規格(2】0 X 297公釐) (請先閱讀背面之注意事項再本頁) -L-----訂---------線 經濟部智慧財產局員工消費合作社印製 10 [227034 A7 B7 經濟部智慧財產局員工消費合作社印製 五、發明說明(11 ) 蝕劑塗佈處理單元(CT)24b,在那裡實施抗蝕劑液塗佈, 其後藉由抗蝕劑處理方框27b内之子臂(未圖示),將其運 送至減壓乾燥單元(VD)25b進行減壓乾燥,進行藉由子臂 運送至周緣抗蝕劑除去單元(ER)26b,在那裡除去基板G 周緣之多餘坑蝕劑,其後藉由垂直方向運送裝置46從抗蝕 劑處理方框27b搬出基板G。 處理方框33,係設在垂直運送路43及45之間,從下依 次在垂直方向運送裝置44及46間交接基板G,且,堆起用 來冷卻基板G之擴展冷卻單元(EXT · COL),用來加熱處 理基板G之兩個熱板單元(HP)、及對於基板G施行疏水化 處理之附著處理單元(AD),而成。 在第一處理區域36與第二處理區域37之間,配置有將 共同之四個熱處理單元向上下堆起於第一及第二處理單元 群2a、2b而成之處理方框32。處理方框32,係從下依次在 水平方向運送裝置42與垂直方向運送裝置44間交接基板G ’且堆起用來冷卻G之擴展冷卻單元(EXT · COL),兩個 熱板單元(HP),及附著處理單元(ad),而成。 第一處理單元2a之處理方框28a,及第二處理單元群2b 之處理方框28b,係對向地設置者,在它們之間沿著垂直 方向而形成有垂直運送路47,而且,沿著垂直運送路47而 設有可移動的垂直方向運送裝置48,藉此構成第三處理區 域38。又,此第三處理區域38係配置成,使共同於第一及 第二處理單元群2a、2b之兩個處理方框34、35 ,沿著與處 理方框28a及28b之對向著之方向正交之方向,夾著垂直運 --------訂--------- (請先閱讀背面之注意事項再本頁)8 1227034 A7 ^ ----- 2Z____ — V. Description of the invention (6) Transport I set, which is used to transport the substrate and move it out and into the aforementioned units; and the transport path, which forms the movement of the aforementioned device Pathway: Among them: the aforementioned liquid processing system units are juxtaposed along the aforementioned conveying path; the aforementioned heat treatment system units are stacked into a plurality of sections to form a thermal processing unit block: the aforementioned thermal processing unit block is a majority configuration Around a given part of the aforementioned transportation path or its extension. According to a seventh aspect of the present invention, there is provided a substrate processing apparatus that applies a series of processing apparatuses including a plurality of liquid processes and a heat treatment accompanying the liquid process to a substrate, and includes: a plurality of liquids The processing system unit is used to perform liquid processing on the substrate; most of the liquid processing system units are used to perform the heat treatment accompanying the above-mentioned most liquid processing on the substrate; the transport device is used to transport the substrate and carry it out and in Each of the aforementioned units; and a conveying path forming a moving path of the aforementioned device; wherein: the aforementioned liquid processing system units are juxtaposed along the aforementioned conveying path; the aforementioned heat treatment system units are stacked into a plurality of sections to constitute a heat treatment unit Box; The above-mentioned thermal processing unit block is mostly arranged around a given part of the aforementioned transportation path or its extension line. As shown in the fifth to seventh viewpoints, since the rotation system unit and the liquid processing system unit are provided along the conveying path, the heat treatment system unit is stacked into a plurality of sections to form a thermal system processing unit block, so that this thermal system unit Most of the boxes are arranged around a given part of the transportation road or its extension line, so the Chinese paper standard (CNS) A4 can be applied to this paper size ------ (Please read the precautions on the back before this page) I # clothing re-ordering --------- Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 9 1227034 A7 B7 V. Description of the invention (7 While reducing the coverage area, the number of units is increased. According to the invention According to an eighth aspect, a substrate processing apparatus is provided, which is a processing apparatus for processing a substrate to be processed by a plurality of processes including liquid processing and heat treatment, and includes: a first processing section configured with A plurality of liquid processing system processing units that perform liquid processing on a substrate to be processed along a horizontal conveying path extending horizontally and by moving the first conveying device on the horizontal conveying path, Each processing unit provided along the aforementioned horizontal transport path transports the substrate to be processed; and the second processing section is provided with a plurality of heat-treatments for the substrate to be processed along the vertical transport path extending vertically in one direction and upward and downward. The heat treatment unit 'also transports the substrate to be processed by each of the processing units provided along the vertical conveyance path by the second conveying device moved along the vertical conveyance path. A first processing unit that is provided with a plurality of processing units and that transports a substrate to be processed for each processing unit provided along the horizontal transport path by a first transport device that moves on a horizontal transport path; and horizontal transport Multiple processing units are arranged along the path, and the second substrate is moved along the vertical conveying path, and the processing substrates are conveyed along the vertical conveying path. Therefore, the processing can be superposed without interfering with each other. The unit is arranged in the second processing section, thereby reducing the coverage area, and, as the first conveying device moves along the horizontal conveying path, The horizontal movement and vertical movement of the second conveying device along the vertical conveying path can achieve the separation of the functions of the conveying device. Therefore, this paper size applies the Chinese National Standard (CNS) A4 specification (2) 0 X 297 mm. (Please (Please read the notes on the back first, then this page) -L ----- Order --------- Printed by the Consumers ’Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 10 [227034 A7 B7 Employee Consumption of the Intellectual Property Bureau of the Ministry of Economic Affairs Cooperative prints 5. Description of the invention (11) Etchant coating processing unit (CT) 24b, where the resist solution is applied, and then the sub-arm (not shown) in the block 27b is processed by the resist Then, it is transported to a reduced-pressure drying unit (VD) 25b for reduced-pressure drying, and carried to a peripheral resist removal unit (ER) 26b by a sub-arm, where excess etchants on the periphery of the substrate G are removed, and thereafter borrowed The substrate G is carried out from the resist processing block 27b by the vertical conveyance device 46. The processing block 33 is provided between the vertical conveying paths 43 and 45, and transfers the substrate G between the vertical conveying devices 44 and 46 in order from the bottom, and piles up extended cooling units (EXT · COL) for cooling the substrate G. It is formed by two hot plate units (HP) for heating and processing the substrate G, and an attachment processing unit (AD) that performs a hydrophobic treatment on the substrate G. Between the first processing region 36 and the second processing region 37, there is disposed a processing block 32 formed by stacking four common thermal processing units on the first and second processing unit groups 2a and 2b. The processing block 32 transfers the substrate G ′ between the horizontal conveying device 42 and the vertical conveying device 44 in order from the bottom, and stacks an extension cooling unit (EXT · COL) for cooling G, and two hot plate units (HP). And attached processing unit (ad). The processing block 28a of the first processing unit 2a and the processing block 28b of the second processing unit group 2b are installed facing each other, and a vertical transport path 47 is formed along the vertical direction between them. A movable vertical conveying device 48 is provided along the vertical conveying path 47, thereby constituting a third processing area 38. The third processing area 38 is arranged so that the two processing blocks 34 and 35 that are common to the first and second processing unit groups 2a and 2b are in a direction facing the processing blocks 28a and 28b. Orthogonal direction, sandwich vertical transport -------- Order --------- (Please read the precautions on the back before this page)

14 1227034 A7 B7 五、發明說明(l2 ) 經濟部智慧財產局員工消費合作社印製 送路47而對向。處理方框28a、28b,均為將用來加熱處理 基板之4個熱板單元(HP)堆起而成者。又,處理方框34、35 ,均為從下依次,將擴展冷卻單元(EXTCOL)、冷卻單元 (COL)及二個熱板單元(Hp)堆起而成者。而且,於處理方 框34之擴展•冷卻單元(Εχτ · c〇L),在垂直方向運送裝 置46及48間進行基板g之交接,並於處理方框35之擴展· 冷卻單元(EXT · COL),在垂直方向運送裝置48及後述之 水平方向運送裝置50間進行基板G之交接。 第一處理單元群2a之顯像處理單元(DEV)29a、3〇a、 31&及第二處理單元群21)之顯像處理單元(£^¥)296、3仳 、3 lb,係對向地設置著,而在它們之間沿著水平方向而 形成水平運送路49,更且沿著此水平運送49而設置可移動 之水平方向運送裝置5〇,藉此構成第四處理區域39。又, 水平方向運送裝置50,係設成可在與介面站3間進行基板 G之交接。 如第1圖所示,包含運送路及運送裝置之運送系統, 係形成直線狀;第一處理單元群2a及第二處理單元群2b, 係以同一順序排列完全同一之單元,並失著直線狀之運送 系統,對稱地設置著。因此,第一處理單元群2a及第二 理單元群2b,可使用共同之處理單元來進行完全同一内 之處理。不用說,也可進行不同内容之處理。 又,在各處理單元,一如第2圖所示,設有搬出· 入口 10,其係藉各處理方框之運送裝置來取出和放入者 此搬出•搬入口 10,可藉未圖示之光閘來開閉。 處容 搬 (請先閱讀背面之注意事項 ---- <再55|:本頁) 訂---------線14 1227034 A7 B7 V. Description of the Invention (l2) Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. The processing blocks 28a and 28b are formed by stacking four hot plate units (HP) for heat-treating the substrate. In addition, processing blocks 34 and 35 are formed by stacking an extension cooling unit (EXTCOL), a cooling unit (COL), and two hot plate units (Hp) in this order. The extension and cooling unit (Exτ · col) in processing block 34 transfers the substrate g between the vertical conveying devices 46 and 48, and the extension and cooling unit (EXT · COL) in processing block 35. ), The substrate G is transferred between the vertical transfer device 48 and a horizontal transfer device 50 described later. The development processing units (DEV) 29a, 30a, 31 & and the second processing unit group 21) of the first processing unit group 2a (£ ^ ¥) 296, 3 仳, and 3 lb. It is installed on the ground, and a horizontal conveyance path 49 is formed between them in the horizontal direction, and a movable horizontal conveyance device 50 is provided along this horizontal conveyance 49, thereby forming a fourth processing area 39. The horizontal transport device 50 is provided so that the substrate G can be transferred to and from the interface station 3. As shown in Fig. 1, the transportation system including the transportation path and the transportation device is formed in a straight line; the first processing unit group 2a and the second processing unit group 2b are arranged in exactly the same unit in the same order and are not straight. The transport system is shaped symmetrically. Therefore, the first processing unit group 2a and the second processing unit group 2b can use a common processing unit to perform processing within the same unit. Needless to say, different contents can be processed. In addition, as shown in FIG. 2, each processing unit is provided with a carry-out / inlet 10, which is taken out and put in by a transport device of each processing box. The carry-in / outlet 10 can be borrowed (not shown). Light shutter to open and close. Handling (Please read the precautions on the back ---- < then 55 |: this page) Order --------- line

15 122703415 1227034

五、發明說明(i3 經濟部智慧財產局員工消費合作社印製 楚- Γ上,處理站2 ’第一處理單元群2"之各處理單元, 处里早7L群2b之各處理單元,由共同之處理單元所成 之處理方框32、33、34、、S # w⑽ 抑一 J5(共通處理單元群2C)之各處理 早' 及運运裝置42、44、46、48、%,係如第3圖所示 ’被叹成#由控制器來控制。此控制器7〇更作為選擇手段 來作用纟係用以選擇應藉第一處理單元群^及第二群以 中之那一個來處理基板G。 水平方向運送裝置42、50,係具有同一構造,而如第 4圖所示,包含有··⑨著運送路而可移動之裝置本體71 ; 對於虞置本體71可上下移動及旋迴動之基座構件72 ;及沿 著水平方向分別獨立地可移動於基座構件72上之上下二張 基板支持構73a。而且,基座構件72之中央部與裝置本體71 ,係藉連結部74來連結起來。藉由内裝於裝置本體71之驅 動源(例如馬達),透過連結部74來旋迴動基座構件72。在 這種機構下,可用兩速度來進行基板G之水平方向之移動 及旋迴動。又,基座構件72也被設成可藉内裝於裝置本體 71内之驅動源(例如馬達),而向垂直方向移動,並可進行 運送位置之上下方向之微調整。 垂直方向運送裝置44、46及48,係具有同一構造,而 一如第5圖所示,包含有:筒狀支持體81,其係向垂直方 向延伸,並且有垂直壁81a、8 lb及它們之間的側面開口部 81c ;及晶圓交接部82,其係沿著筒狀支持體81,向垂直 方向升降自如地設在其内側。筒狀支持體81,係在馬達等 驅動源83之施轉驅動力下成為可旋轉,並隨著其旋轉而一 (請先閱讀背面之注意事項再^||^本頁) I I I I I 訂1111111- *^V. Description of the invention (i3 printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs, Chu- Γ, each processing unit of processing station 2 'first processing unit group 2', each processing unit of the early 7L group 2b, by the common The processing blocks formed by the processing units 32, 33, 34, and S # w⑽ each processing of the J5 (common processing unit group 2C) and the transportation devices 42, 44, 46, 48, and% are as follows As shown in Figure 3, '被 沉 成 #' is controlled by the controller. This controller 70 serves as a selection means, and is used to select which one of the first processing unit group and the second group should be borrowed. Process substrate G. The horizontal transport devices 42 and 50 have the same structure, and as shown in FIG. 4, they include a device body 71 that can be moved along the transport path; The base member 72 that rotates and two substrate supporting structures 73a that are independently movable above and below the base member 72 in the horizontal direction. Further, the central portion of the base member 72 and the device body 71 are borrowed. It is connected by the connection part 74. By the drive source built in the apparatus main body 71 (For example, a motor), the base member 72 is rotated back and forth through the connecting portion 74. In this mechanism, the horizontal movement and rotation of the substrate G can be performed at two speeds. The base member 72 is also provided. It can be moved in the vertical direction by a drive source (such as a motor) built in the device body 71, and fine adjustment can be made in the up and down direction of the transport position. The vertical transport devices 44, 46, and 48 have the same structure. As shown in FIG. 5, it includes: a cylindrical support 81 that extends in the vertical direction, and has vertical walls 81 a and 8 lb and side openings 81 c therebetween; and a wafer transfer portion 82 It is provided along the cylindrical support 81 in a vertical direction and is provided on the inside thereof. The cylindrical support 81 is rotatable under the driving force of a driving source 83 such as a motor, and rotates with it. And one (Please read the precautions on the back before ^ || ^ this page) IIIII Order 1111111- * ^

本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 16 1227034 A7 B7 五、發明說明(Η ) 體地旋轉晶圓交接部82。 晶圓交接部82,包含有··運送基台90 ;及沿著運送基 σ 90而可向刖後移動的兩條晶圓保持臂91、92。此等臂91 、92 ’具有可通過筒狀支持體81之側面開口部81e的大小 ’此晶圓交接部82,係藉馬達84使皮帶85驅動,藉此升降 。又,符號86為驅動滑輪;87為從動滑動。可藉由此種機 構’以南速度來進行基板G之垂直方向的移動及旋迴動。 其次,就如此構成的抗蝕劑塗佈顯像處理裝置1〇〇中 之處理動,說明之。 若於第一處理單元群2a及第二處理單元群2b進行同一 内容之處理時,例如一如第6圖所示,首先,從卡式站 入基板G於處理站2(步驟S1)。其次,於第一處理單元群2a 及第二處理單元群2b之中檢出可運送基板G之一方,藉由 作為選擇手段工作之控制器7〇來控制水平方向運送裝置42 以便根據此檢出結果搬入基板G於可運送之處理單元群 ,其後,藉所選擇之處理單元群來進行一連串之處理。具 體言之,判斷第一處理單元群以是否容許基板G之搬入(步 驟S2);若容許搬入時,搬入基板G於第一處理單元群2a( v驟83) ’在苐一處理單元群2&進行基板〇之處理(步驟μ) 。一方面,若第一處理單元群2a沒空,不容許基板α之搬 入時,判斷第二處理單元群孔是否容許基板G之搬入(步 驟S5);若容許搬入時,搬入基板於第二處理單元群沘(步 驟),於第一處理單元群2b進行基板G之處理(步驟§7)。 若於第一處理單元群2a及第二處理單元群2b進行不 本紙張尺度·㈣國家標準(CNS]A4規格⑵Qx 297公爱) (請先閱讀背面之注意事項再本頁) 訂---------線This paper size is in accordance with Chinese National Standard (CNS) A4 (210 X 297 mm) 16 1227034 A7 B7 5. Description of the invention (Η) Rotating wafer transfer unit 82 in bulk. The wafer transfer unit 82 includes a transfer base 90 and two wafer holding arms 91 and 92 that can be moved rearwardly along the transfer base σ 90. These arms 91, 92 'have a size capable of passing through the side opening portion 81e of the cylindrical support body 81.' The wafer transfer portion 82 is driven by a motor 84 to drive the belt 85, thereby raising and lowering. In addition, reference numeral 86 denotes a driving pulley; 87 denotes driven sliding. The vertical movement and rotation of the substrate G can be performed by such a mechanism 'at a south speed. Next, the processing operation in the resist coating development processing apparatus 100 configured as described above will be described. When the same processing is performed in the first processing unit group 2a and the second processing unit group 2b, for example, as shown in FIG. 6, first, the substrate G is loaded into the processing station 2 from the cassette station (step S1). Next, one of the transportable substrates G is detected among the first processing unit group 2a and the second processing unit group 2b, and the horizontal transport device 42 is controlled by the controller 70, which works as a selection means, to detect based on this As a result, the substrate G is carried into a processing unit group that can be transported, and thereafter, a series of processing is performed by the selected processing unit group. Specifically, it is determined whether the first processing unit group is allowed to carry in the substrate G (step S2); if the loading is allowed, the substrate G is carried in the first processing unit group 2a (vstep 83) 'in the first processing unit group 2 & Processing of substrate 0 (step μ). On the one hand, if the first processing unit group 2a is not available and the substrate α is not allowed to be carried in, it is determined whether the holes of the second processing unit group allow the substrate G to be carried in (step S5); if the loading is allowed, the substrate is moved in the second processing In the unit group (step), the substrate G is processed in the first processing unit group 2b (step §7). If you do not use this paper size in the first processing unit group 2a and the second processing unit group 2b: ㈣National Standard (CNS) A4 size⑵Qx 297 public love) (Please read the precautions on the back before this page) Order --- ------line

經濟部智慧財產局員工消費合作社印製 17 五、發明說明(!5 ) 谷之處理時,例如隨處理之内容而預先標示於基板G, 將之檢出藉此選擇要搬入之處理單元。例如,如第撃 :’首先’從卡式站搬人基板G於處理站2(步驟sn)。其 次,檢出基板G之標示(步驟S12)。判斷所檢出之標示是否 對應於第-處理單元群㈣(步驟S13);若對應於第—處 理早,群’搬人基板G於第—處理單元群&(步驟si4) ,於第處理單元群2a進行基板g之處理(步驟S15)。一方 面,若標示不對應於第一處理單元群2a時,判斷標示是否 對應於第二處理單元群21)者(步驟⑽);^對應於第二處 理單元群2b時,搬人基板G於第二處理單元群⑪(步驟叫 ,於第二處理單元群孔進行基板G之處理(步驟Μ”。 如此進行之後,為了在任一處理單元群進行一連串之 處理,而藉控制器70來控制各運送裝置,以便可在最初投 入之處理單元進行一連串之處理。 經濟部智慧財產局員工消費合作社印製 其次,就具體處理例,一邊參考第8圖一邊說明之。 在此,說明第一處理單元2a之處理。首先,藉卡式站1中 之運送機構11來取出卡匣C之基板G ,並交接於水平方向 運送裝置42,進而搬入於第一處理區域36(步驟S21)。在 第一處理區域36,最初藉紫外線照射單元(Uv)21a來進行 表面改質•洗淨處理(步驟S22);其次,藉擦洗淨單元 (SCR)22a、23a來施行擦洗洗淨(步驟S23)。 其後’藉水平方向運送裝置42,將基板G運送至處理 方框32之擴展•冷卻單元(Εχτ · COL),接著藉第二處理 區域37之垂直方向運送裝置44來運送至處理方框32或處理 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 18 1227034 A7 B7 五、發明說明(16) 經濟部智慧財產局員工消費合作社印製 方框33之熱板單元(HP)以施行脫水焙烤(步驟S24);藉由 處理方框32或處理方框33之擴展•冷卻單元(EXT · COL) 冷卻成給定溫度(步驟S25)。接著將基板G運送至處理方框 32或處理方框33之附著處理單元(AD),並為了提高抗蝕 劑之固定性而施行疏水化處理(HMOS處理)(步驟S26)。其 後,將基板G運送至擴展•冷卻單元(ΕΧΊΓ · c〇L),冷卻 成給定溫度(步驟S27);接著,藉垂直運送裝置44來運送 至抗蝕劑處理方框27a。於抗蝕劑處理方框27a,首先藉抗 姓劑塗佈處理單元(CT)24a,對於基板G實施抗蝕劑液塗 佈,接著,藉抗|虫劑處理方框27a内之子臂(未圖示)來運 送至減壓乾燥單元(VD)25a而加以減壓乾燥,進而由子臂 運送至周緣抗餘劑除去單元(ER)26a以除去基板G周緣之 多餘抗蝕劑(步驟S28)。待周緣抗蝕劑之除去終了之後, 藉由垂直方向運送裝置46從抗蝕劑處理方框27a搬出基板 G °其所以像這樣在抗蝕劑塗佈處理單元(CT)24a之後面 設置減壓乾燥單元(VD)25a,是因為:雖在預烘處理一塗 佈有抗蝕劑之基板之後和顯像處理後之後烘烤處理之後, 有時候會將升降銷,固定銷等之形狀復製於基板G,但若 不像這樣用減壓乾壓單元(VD)來加熱而直接進行減壓乾 燥’藉此慢慢地放出抗蝕劑中之溶劑時,即不會產生如加 熱乾燥時一般之急遽的乾燥,在不給不良影響於抗蝕劑之 狀態下可使抗蝕劑之乾燥促進,可有效地防止基板上產生 複製之故。 像這樣塗佈處理終了之後,藉由垂直方向運送裝置46 本紙張尺度適用中國國家標準(CNS)A4規格(21〇 x 297公釐) 19 經濟部智慧財產局員工消費合作社印製 1227034 A7 B7 五、發明說明(17) ,將基板G運送至第三處理區域38中之處理方框34的擴展 冷卻單元(EXT · COL)。將配置在擴展•冷卻單元(EXT · COL)之基板G,藉垂直方向運送裝置48來運送至處理方框 28a或處理方框34、35之任一熱板單元(HP),加以預烘烤 處理(步驟S29);其後,運送至處理方框34、35之任一冷 卻單元(COL),加以冷卻成給定溫度(步驟S30)。 其後,藉由垂直方向運送裝置48,將基板G運送至處 理方框35之擴展•冷卻單元(Εχτ · COL)。將配置在擴展 •冷卻單元(EXT · COL)之基板G,藉第四處理區域39之 水平方向運送裝置50來運送至介面站3,而配置在擴展台61 。然後,藉由運送機構64,將擴展台61上之基板G運送到 路光裝置200(步驟S3 1),在那裡露光給定之圖案。 露光終了後,藉由運送機構64再度送回基板G至介面 站3(步驟S32),進而藉由運送機構64將之搬入於處理站2 。具體言之,藉由第四處理區域39之水平方向運送裝置5〇 從介面站3之擴展台61接收基板g。然後,藉由水平方向 運送裝置50,將基板g運送至顯像處理單元(DEV)29a、3〇a 、3 1 a之任一,在那裡加以顯像處理,形成給定之電路圖 案(步驟S33)。 藉由水平方向運送裝置50 ,將所顯像處理之基板〇運 送至第三處理區域38中之處理方框35的擴展•冷卻單元 (EXT · COL),並藉由垂直方向運送裝置48運送至處理方 框28a或處理方框28a或處理方框34、35中之任一熱板單元 (HP)後,進行後烘烤處理(步驟S34);其後被運送至Printed by the Employees' Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 17 V. Invention Description (! 5) When processing the valley, for example, it is marked on the substrate G in advance with the content of the processing, and it is checked out to select the processing unit to be moved in. For example, as in step 撃: 'First', the substrate G is transferred from the cassette station to the processing station 2 (step sn). Next, the label of the substrate G is detected (step S12). Determine whether the detected label corresponds to the first processing unit group (step S13); if it corresponds to the first processing, the group 'moves the substrate G to the first processing unit group & (step si4), The cell group 2a performs processing of the substrate g (step S15). On the one hand, if the labeling does not correspond to the first processing unit group 2a, it is determined whether the labeling corresponds to the second processing unit group 21) (step ;); when it corresponds to the second processing unit group 2b, the substrate G is moved to The second processing unit group (the step is called, the substrate G is processed in the second processing unit group hole (step M). After doing so, in order to perform a series of processing in any processing unit group, the controller 70 is used to control each Transport the device so that a series of processing can be performed in the processing unit that was initially put in. Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs. Second, the specific processing example will be described with reference to FIG. Process 2a. First, the substrate G of the cassette C is taken out by the conveying mechanism 11 in the cassette station 1, and transferred to the horizontal conveying device 42, and then carried into the first processing area 36 (step S21). The processing area 36 is firstly subjected to surface modification and cleaning treatment by the ultraviolet irradiation unit (Uv) 21a (step S22); secondly, the scrubbing and cleaning unit (SCR) 22a and 23a is used to perform scrubbing and cleaning ( Step S23). Thereafter, the substrate G is conveyed to the expansion / cooling unit (Exτ · COL) of the processing block 32 by the horizontal conveyance device 42, and then conveyed to the vertical conveyance device 44 of the second processing area 37. Processing box 32 or processing this paper size applies the Chinese National Standard (CNS) A4 specification (210 X 297 mm) 18 1227034 A7 B7 V. Description of the invention (16) Printed in box 33 of the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs The hot plate unit (HP) is subjected to dehydration baking (step S24); the extension / cooling unit (EXT · COL) of the processing block 32 or processing block 33 is cooled to a given temperature (step S25). Then, the substrate G The substrate G is transferred to the attachment processing unit (AD) in the processing block 32 or the processing block 33, and a hydrophobic treatment (HMOS treatment) is performed to improve the fixation of the resist (step S26). Thereafter, the substrate G is transferred to The expansion / cooling unit (E × ΊΓ · col) is cooled to a predetermined temperature (step S27); then, it is transported to the resist processing block 27a by the vertical transfer device 44. In the resist processing block 27a, first, Coating by anti-surname agent (CT) 24a, the substrate G is coated with a resist solution, and then is transported to a vacuum drying unit (VD) 25a by a sub-arm (not shown) in the anti-insectant processing block 27a. It is pressure-dried, and then transported from the sub-arm to the peripheral anti-resistance removing unit (ER) 26a to remove excess resist on the periphery of the substrate G (step S28). After the removal of the peripheral resist is completed, the device 46 is transported in a vertical direction. The substrate G ° is carried out from the resist processing block 27a. The reason why the vacuum drying unit (VD) 25a is provided behind the resist coating processing unit (CT) 24a is as follows: After the substrate is coated with a resist and after the baking process after the development process, the shape of the lifting pin, the fixing pin, etc. is sometimes copied to the substrate G, but if this is not the case, a reduced pressure dry pressing unit (VD) is used. To heat and directly dry under reduced pressure ', so that when the solvent in the resist is slowly released, it does not cause the rapid drying as in heating and drying, and it can be used without adversely affecting the resist. Promote the drying of the resist, which can effectively prevent Therefore, replication of a board. After finishing the coating process in this way, the paper is transported in a vertical direction by 46 pieces of paper. Applicable to the Chinese National Standard (CNS) A4 (21 × 297 mm). 19 Printed by the Intellectual Property Bureau of the Ministry of Economic Affairs and Consumer Cooperatives. 1227034 A7 B7 7. Description of the Invention (17), the substrate G is transported to the extended cooling unit (EXT · COL) of the processing block 34 in the third processing area 38. The substrate G disposed in the extension / cooling unit (EXT · COL) is transported to the hot plate unit (HP) of the processing block 28a or the processing blocks 34 and 35 by the vertical conveying device 48 and pre-baked. Processing (step S29); thereafter, it is transported to one of the cooling units (COL) in the processing blocks 34 and 35, and is cooled to a predetermined temperature (step S30). Thereafter, the substrate G is transported to the expansion / cooling unit (Exτ · COL) of the processing block 35 by the vertical transport device 48. The substrate G arranged in the extension cooling unit (EXT · COL) is transported to the interface station 3 by the horizontal transfer device 50 in the fourth processing area 39, and is arranged on the extension stage 61. Then, the substrate G on the expansion stage 61 is transported to the light-emitting device 200 by the transport mechanism 64 (step S31), and a predetermined pattern is exposed there. After the exposure is finished, the substrate G is returned to the interface station 3 again by the transport mechanism 64 (step S32), and then it is carried into the processing station 2 by the transport mechanism 64. Specifically, the substrate g is received from the extension stage 61 of the interface station 3 by the horizontal-direction conveying device 50 of the fourth processing area 39. Then, the substrate g is transported to any of the development processing units (DEV) 29a, 30a, and 3a by the horizontal transport device 50, and development processing is performed there to form a predetermined circuit pattern (step S33). ). The developed substrates 0 are conveyed by the horizontal conveying device 50 to the extension / cooling unit (EXT · COL) of the processing block 35 in the third processing area 38, and are conveyed to the vertical conveying device 48 to After the processing block 28a or the processing block 28a or any of the hot plate units (HP) in the processing blocks 34 and 35, a post-baking process is performed (step S34); thereafter, it is transported to

-20 - 1227034 A7 B7 五、發明說明(l8 ) 方框34、35之任一冷卻單s(c〇L),冷卻成給定溫度(步驟 S35) 〇 其後,基板G,經過處理方框34之擴展•冷卻單元(ΕχΐΓ • COL) ’處理方框33之擴展•冷卻單元(Εχτ · c〇l卜及 處理方框32之擴展•冷卻單元(Εχτ · c〇L)後,被第一處 理方框36之水平方向運送裝置42向卡式Mi運送,藉由運 送機構11將之搬出收容在卡式站丨上之給定卡匣(步驟S36)。 關於藉第二處理單元群來進行之處理,也可與上述第 處理單元群2a之處理完全同樣地進行。但,省略處理之 一部等,進行與第一處理單元群2&來進行之處理不同之處 理也可。 若依如上述之本實施形態,則由於在進行分別獨立的 一連串處理之第1及第二處理單元群2a、2b之間,設置對 於此等各處理單元進行基板(}之運送的共同運送裝置42、 44、46、48、50,所以較之每一系統設置運送裝置之習知 裝置構成,更可使運送裝置減少,從而可使抗蝕劑塗布顯 像處理裝置之覆蓋區變小。又,如果把本實施形態之系統 視為一個系統的話,由於設有多數液處理系統之單元,而 可顯著地提高生產率。 又,由於作成藉由當做選擇手段作用之控制器7〇,選 擇應由第一處理單元群2a及第二處理單元群孔之那一個來 處理基板G,並作成用其所選擇的一方之處理單元群,對 於各基板進行處理,所以可用第一處理單元群“及第二處 理單元群2b ,分別獨立地對於基板G施行抗蝕劑塗佈顯像 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐)-20-1227034 A7 B7 V. Description of the invention (18) Any cooling sheet s (c0L) in boxes 34 and 35, cooled to a given temperature (step S35). After that, the substrate G passes through the processing block. Expansion and Cooling Unit of 34 (Ex • Γ • COL) 'After processing the expansion and cooling unit of Box 33 (Exτ · c0l and processing box 32 of the Expansion and Cooling Unit (Exτ · c0L), it is first The horizontal direction conveying device 42 of the processing block 36 conveys to the cassette Mi, and the transport mechanism 11 carries it out of a given cassette accommodated in the cassette station 丨 (step S36). About the second processing unit group The processing may be performed in exactly the same manner as the processing of the first processing unit group 2a. However, a part of the processing is omitted, and a processing different from the processing performed by the first processing unit group 2 & may be performed. In this embodiment described above, since the first and second processing unit groups 2a and 2b that perform a series of processes independently are provided, common transport devices 42 and 44 for transporting substrates () to these processing units are provided. , 46, 48, 50, so compared to each system The structure of a conventional device equipped with a conveying device can further reduce the number of conveying devices, thereby reducing the coverage area of the resist coating developing processing device. If the system of this embodiment is considered as a system, There are many units of the liquid processing system, and the productivity can be significantly improved. Also, since the controller 70, which functions as a selection means, is created, one of the holes of the first processing unit group 2a and the second processing unit group should be selected. The substrate G is processed, and a processing unit group selected by the processing unit is used to process each substrate. Therefore, the first processing unit group and the second processing unit group 2b can be used to separately apply a resist to the substrate G. Coated imaging This paper is sized for China National Standard (CNS) A4 (210 X 297 mm)

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、發明說明(19 ) 經濟部智慧財產局員工消費合作社印製 處理。 直線:者所包含運送路及運送裝置之運送系統係形4 Ϊ Γ二Γ徑路單純,能以高生產率來進行處理。 由於第-處理單元群2a及第二 :::排列完全同-之單元,並被設置成夾著直線 达=形成對稱,所以可用第—處理單群域第二處理單 70 ’以並行且高成產率來進行同-内容之處理。又, 也I用第一處理單元群2a及第二處理單元群2b來進行不同 内今之處理,同時可實現高變化之處理。 m又依照上述之例,雖在第—處理單元群2a及第二處 理早70群2b以完全同一之順序排列完全同一之處理單元, 但處理單元之種類可以不同,其排列順序相異也可。又, 雖將第-處理單元群2a及第二處理單元群2b分開配置在運 送系統之兩側,但配置成混雜之狀態也可。再者,依照上 述之例#在第-處理單元群2a及第二處理單元群^之處 理内容為同-時,檢出第一處理單元群23及第二處理單元 群2b之處理内容為同一時,檢出第一處理單元群2a及第二 處理單元群中可運送基板G之—方,根據此檢出結果搬入 基板G於可運送之處理單元群,而在第一處理單元&及第 二處理單元群2b之處理内為不同時,隨處理之内容而在基 板G預先加以標示’然後選擇藉著檢出該標示而搬入之處 理早兀,但並不限於此,例如將只收容有藉第一處理單元 群2a來進行處理之基板G的卡£c,及只收容有藉第二處 理單元群2b來進行基板G的卡匣c ’分開設置,從此 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱) --------t---------^ (請先閱讀背面之注意事項再本頁)2. Description of invention (19) Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs. Straight line: The conveying system of the conveying path and the conveying system is 4 4 Γ 2 Γ The path is simple and can be processed with high productivity. Since the first processing unit group 2a and the second ::: are arranged in exactly the same unit, and are set to form a straight line sandwiched by = to form a symmetry, the second processing single 70 'of the first processing single group domain can be used in parallel and high. The yield is used for the same-content treatment. In addition, the first processing unit group 2a and the second processing unit group 2b are used to perform different internal and external processes, and at the same time, highly variable processes can be realized. m According to the above example, although the same processing units are arranged in the same order in the first processing unit group 2a and the second processing early 70 group 2b, the types of processing units may be different, and the order of arrangement may be different. . The first processing unit group 2a and the second processing unit group 2b are separately arranged on both sides of the transport system, but they may be arranged in a mixed state. Furthermore, according to the above example #, when the processing contents of the first processing unit group 2a and the second processing unit group ^ are the same, it is detected that the processing contents of the first processing unit group 23 and the second processing unit group 2b are the same. At the time, one of the first processing unit group 2a and the second processing unit group capable of transporting the substrate G is detected, and the substrate G is moved into the transportable processing unit group according to the detection result, and the first processing unit & and When the processing in the second processing unit group 2b is different, the substrate G is labeled in advance with the content of the processing, and then the processing to be carried in by checking out the label is early, but it is not limited to this. There is a card £ c for the substrate G borrowed by the first processing unit group 2a, and a cassette c 'containing only the substrate G borrowed by the second processing unit group 2b is set separately. From this time on, this paper standard applies Chinese national standards (CNS) A4 specifications (210 X 297 public love) -------- t --------- ^ (Please read the precautions on the back before this page)

22 1227034 經濟部智慧財產局員工消費合作社印製 A7 五、發明說明(20 ) 基板G交替地搬入於處理站2也可。 (第二實施形態) 其次,就本發明之第三實施形態說明之。 第9圖為一平面圖,係顯示本發明第二實施形態之[CD 基板的抗蝕劑塗佈顯像處理裝置。此抗蝕劑塗佈顯像處理 裝置300,係對於LCD基板塗佈抗蝕劑液之後,一旦交接 於露光裝置400,接收由此露光裝置4〇〇所露光處理後之基 板,進行顯像處理。 為了進行這種一連串之處理,而此抗蝕劑塗佈顯像處 理裝置300包含有:搬入·搬出部1〇3,其係用以進rLcd 基板G之搬入•搬出(負載/卸載);第一液處理系統處理部 104,其係使基板g旋轉以用來進行洗淨處理;第一熱處 理系統處理部105,其係對於基板G主要進行加熱•冷卻 處理等之熱處理;第二液處理系統處理部丨〇6,其係一面 使基板G旋轉,一面進行抗蝕劑液之塗佈(c〇ating)、減壓 乾燥及周緣抗蝕劑除去處理,且,一面使基板〇旋轉一面 進行顯像處理;第二熱處理系統處理部丨〇7,其係對於基 板進行加熱•冷卻處理;及介面部(1下)1〇8,其係在與露 光裝置之間進行基板G之交接。 搬入·搬出部103,包含有卡匣載置台11〇及運送部 (CS)lll。在卡匣載置台11〇上,載置有二種之卡匣ei、 。例如,在第一卡匣C1收納有處理前之基板G ,而在第二 卡HC2則收納有處理後之基板g。 又,在運送部ill,設有第一子臂機構113,此臂113 本紙張尺度適用中關家標準(CNS)A4規格⑵Q χ 297公爱) (請先閱讀背面之注意事項再本頁) I.-----訂---------線22 1227034 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs A7 V. Description of Invention (20) Alternately, substrate G can be moved to processing station 2. (Second Embodiment) Next, a third embodiment of the present invention will be described. FIG. 9 is a plan view showing a [CD substrate resist coating development processing apparatus according to a second embodiment of the present invention. This resist-coating development processing device 300 is that after applying a resist solution to an LCD substrate, once it is handed over to the exposure device 400, it receives the substrate processed by the exposure device 400 and performs development processing. . In order to perform such a series of processing, the resist coating development processing apparatus 300 includes a loading / unloading unit 103 for loading / unloading (loading / unloading) the rLcd substrate G into the substrate. A liquid processing system processing unit 104 is configured to rotate the substrate g for cleaning processing; a first thermal processing system processing unit 105 is configured to perform heat treatment such as heating and cooling processing on the substrate G; a second liquid processing system The processing unit 〇〇6 is for the substrate G to be rotated, while the resist solution is applied (coating), reduced pressure drying and peripheral resist removal treatment, and while the substrate 0 is rotated, the display is developed. Image processing; the second heat treatment system processing unit 〇07, which is to heat and cool the substrate; and the mesial surface (1 bottom) 108, which is the transfer of the substrate G with the exposure device. The loading / unloading unit 103 includes a cassette mounting table 110 and a transport unit (CS) 111. On the cassette mounting table 11, two kinds of cassettes ei and. For example, the substrate G before processing is stored in the first cassette C1, and the substrate g after processing is stored in the second card HC2. In addition, the conveying section ill is provided with a first sub-arm mechanism 113, and the paper size of this arm 113 is applicable to the Zhongguanjia Standard (CNS) A4 specification ⑵Q χ 297 public love) (Please read the precautions on the back before this page) I .----- Order --------- Line

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經濟部智慧財產局員工消費合作社印製 五、發明說明(21 ) 備有可保持基板之臂114,且,使該臂114旋轉,進退,上 下移動,藉此取出第一卡匣c丨所收納之基板,交接於第 一液處理系統處理部104側。又一完成所有處理的基板, 即藉该第一子臂機構丨丨3,例如從第一液處理系統處理部 104側,被收納於第二卡匣c2。 第一液處理系統處理部1〇4,係備有從第一子臂機構 113接收基板〇之第一主臂機構115。此主臂機構115包含 有·基座117 ’其係行走於沿著γ方向延設的第一中央運 送路116 ;及臂118,其係在該基座U7上旋轉、進退、上 下驅動。 在第一主臂機構115之一方側,並設有沿著中央運送 116’例如用電刷來進行擦洗洗淨之兩個洗淨單元(8(:11)119 ,及洗淨單元(SCR)119。 第一主臂機構115,係將接收自搬入·搬出部ι〇3之基 板G搬入於處理單元112、119之任一,從處理單元112、119 之任一取出施有必要處理之基板G,同時,將所取出之基 板G搬入於其他外理單元,或運送至第一熱處理系統處理 部 105。 第一熱處理系統處理部105係配置成第一中央運送路 116串聯(在中央運送路116之延長線上)。在第一熱處理系 統處理部105 ’設有第二子臂機構113A該第二子臂機構 113A ’備有用來保持基板之臂114 ’使該臂114旋迴、進 退、上下移動,藉此將基板交接於後述周圍之處理單元的 給定裝置。 (請先閱讀背面之注意事項 · _ 再本頁 ------訂---------線Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. 5. Description of the Invention (21) An arm 114 capable of holding the substrate is provided, and the arm 114 is rotated, moved forward and backward, and moved up and down to remove the first cassette c. The substrate is transferred to the processing unit 104 side of the first liquid processing system. Another substrate that has completed all processing, that is, the first sub-arm mechanism 3, for example, from the first liquid processing system processing unit 104 side, is stored in the second cassette c2. The processing unit 104 of the first liquid processing system is provided with a first main arm mechanism 115 which receives the substrate 0 from the first sub-arm mechanism 113. This main arm mechanism 115 includes a base 117 'which travels on a first central transport path 116 extending along the γ direction; and an arm 118 which rotates, advances and retreats on the base U7, and drives up and down. On one side of the first main arm mechanism 115, there are provided two cleaning units (8 (: 11) 119 and SCR) for transporting 116 'along the center, for example, scrubbing and washing with a brush. 119. The first main arm mechanism 115 is to carry the substrate G received from the carrying-in and carrying-out section ι3 into any one of the processing units 112 and 119, and take out the substrate to which the necessary processing is performed from any of the processing units 112 and 119. At the same time, the taken-out substrate G is carried into another external processing unit, or is transported to the first heat treatment system processing unit 105. The first heat treatment system processing unit 105 is arranged in series with the first central transport path 116 (on the central transport path The extension line of 116). In the first heat treatment system processing section 105 ', a second sub-arm mechanism 113A is provided. The second sub-arm mechanism 113A is provided with an arm 114 for holding the substrate.' The arm 114 is rotated back, forward, and backward. Move to transfer the substrate to the given device of the surrounding processing unit. (Please read the precautions on the back first.

表纸張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 24 經濟部智慧財產局員工消費合作社印製 l227〇34 _ 之、發明說明(22 ) 一在第二子臂機構113A之周圍,設有第一熱系處理單 疋方框120、第二熱系處理單元方框121、第三熱系處理單 兀方框122及第四熱系處理單元方框123,以便包圍第二子 ’機構113A。在此等之中,第一熱系處理單元方框12〇, 包含有:擴展•冷卻單元(Εχτ · c〇L),纟係從下方依次 I ,在上述第一液處理系統處理部104與第一熱處理系統處 | 心卩105之間進行基板G之交接時,|備作為中繼部用之 機能及基板冷卻機能;及兩脫水烘烤單元(Hp),其係將基 板加熱後進行脫水烘烤處理。而用此等單元堆起而成。第 | 二熱系統理單元方框丨2卜係將擴展•冷卻單元(EXT.c〇l) 、冷卻單元(EXT· C0L)、冷卻單元c〇L、及用來進行疏 水化處理之附著處理單元(AD)堆起三段而成者;其中擴 展冷卻單^(Εχτ· COL)係被設成夾著第二子臂機構U3A 而與第一熱系處理單元方框120朝丫方向,並從下方依次 在第一液處理系統處理部106與第一熱處理系處理部1 〇5 之間進行基板G之交接時,兼備作為中繼部用之機能及基 板冷卻機能。又,第三及第四熱系處理單元方框122及123 ,均為將三個後烘烤處理用熱板單元(p〇ST)堆起三段而 成者;此第單元乃被設置成夾著第二子臂機構U3A而互 相朝X方向相向。又,第一熱系處理單元方框12〇,係連 接於第一液處理系統處理部104之第一中央運送路116,•第 一熱系處理單元方框121,係被作成第二液處理系統處理 部106之後述的第二中央運送路124。 第二子臂機構U3A係構成為··藉第一液處理系統處 (請先閱讀背面之注意事項再本頁) -I n 訂--------線The paper size of the table applies the Chinese National Standard (CNS) A4 specification (210 X 297 mm). 24 Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. Around it, there are a first thermal processing unit block 120, a second thermal processing unit block 121, a third thermal processing unit block 122, and a fourth thermal processing unit block 123 to surround the first Second child 'agency 113A. Among these, the first thermal processing unit block 120 includes: an expansion and cooling unit (Exτ · c0L), which is in order from the bottom, and in the first liquid processing system processing unit 104 and At the first heat treatment system | When the substrate G is transferred between the cores 105, the function as a relay section and the substrate cooling function are prepared; and two dehydration baking units (Hp) are used to dehydrate the substrate after heating it Baking treatment. And these units are piled up. The second | second thermal system physical unit box 丨 2 will expand the cooling unit (EXT.c0l), cooling unit (EXT · C0L), cooling unit c0L, and the attachment treatment for hydrophobic treatment The unit (AD) is a stack of three sections; the extended cooling unit ^ (Εχτ · COL) is set to sandwich the second sub-arm mechanism U3A and face the first thermal system processing unit box 120 in the direction of Y, and When the substrate G is transferred between the first liquid processing system processing unit 106 and the first heat treatment system processing unit 105 in this order from below, it has both the function of a relay unit and the cooling function of the substrate. In addition, the third and fourth thermal processing unit blocks 122 and 123 are formed by stacking three post-baking processing hot plate units (p0ST) in three stages; this second unit is provided as The second sub-arm mechanism U3A faces each other in the X direction. The first thermal processing unit block 120 is connected to the first central conveyance path 116 of the first liquid processing system processing unit 104, and the first thermal processing unit block 121 is used for the second liquid processing. The system processing unit 106 is a second central transport path 124 described later. The second sub-arm mechanism U3A is composed of the first liquid processing system (please read the precautions on the back before this page) -I n order -------- line

本紙張尺度適用中國國家標準(CNS)A4規格(21〇χ 297公釐) 25 經濟部智慧財產局員工消費合作社印製 1227034 A7 _B7 五、發明說明(23 ) 理部104之第一主臂機構115來接收交接於第一熱系處理單 元方框120之擴展•冷卻單元(EXT · COL)之基板G,將之 搬入於其周圍之第一乃至第四熱系處理單元方框12〇〜123 之各單兀,同時從第一乃至第四熱系處理單元方框12〇〜 123之各處理單元取出施有必需處理之基板G,依次運送 至第一乃至第四熱系處理單元方框12〇〜123之另外處理單 兀或第三熱系處理單元方框122之擴展•冷卻單元(Εχτ· COL) ’或者,進行此之反操作。 又,於第10圖中例示:被設置成夾著第二子臂機構 113 A而互相在γ方向相向的第一熱系理單元方框;第 二熱系處理單元方框121之處理單元的堆起狀態;及子臂 機構113A。 一方面,第二液處理系統處理部1〇6,備有第二主臂 機構125,其係行走於沿著其係行走於沿著γ方向延設的 第二中央運送路124上者。此第二主臂機構125,備有:與 第主臂機構115同樣地構成之基座126 ;及臂127。 又,在此第二主臂機構125之一方側,設有抗蝕劑處 理方框130。此抗钱劑處理方框13〇,包含有:抗姓劑液塗 佈處理單元(CT) ’其係用以塗佈抗餘劑液於基板;減壓乾 燥處理早70 (VD),其係用以乾燥處理塗佈有抗蝕劑液之 基板;及邊緣除去器_,其係用以去除乾燥後之基板周 緣部的無用抗餘劑。此等互相成為一體,沿著第二中央運 送路m而排列著。又,在第二主臂機構125之另—方側, 則〜著第一中央運送路124,而並設有用來顯像處理露光 本紙張尺度ΪΙ用中國國家標準(cks)A4規格⑵ο X 297 ---^-----訂---------線 (請先閱讀背面之注意事項再^^本頁)This paper size applies the Chinese National Standard (CNS) A4 specification (21 × χ297 mm) 25 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 1227034 A7 _B7 V. Description of the invention (23) The first main arm mechanism of the management department 104 115 to receive the substrate G of the extension / cooling unit (EXT · COL) transferred to the first thermal processing unit block 120, and move it into the first to fourth thermal processing unit blocks 12 to 123 around it Each of the units is simultaneously taken out from each of the first to fourth thermal processing unit blocks 12 to 123, and the substrate G to which the necessary processing is applied is sequentially transported to the first to fourth thermal processing unit block 12 〇 ~ 123 additional processing unit or the third thermal processing unit block 122 extension · cooling unit (Eχτ · COL) 'or vice versa. Also illustrated in FIG. 10 are: a first thermal system unit block arranged to face each other in the γ direction with a second sub-arm mechanism 113 A interposed therebetween; Stacked state; and sub-arm mechanism 113A. On the other hand, the second liquid processing system processing unit 106 is provided with a second main arm mechanism 125 which travels along the second central transport path 124 extending along the γ direction. The second main arm mechanism 125 includes a base 126 and an arm 127, which are configured in the same manner as the first main arm mechanism 115. On one side of the second main arm mechanism 125, a resist processing block 130 is provided. The anti-money agent processing block 13 includes: an anti-surrogate agent liquid coating processing unit (CT), which is used to coat the anti-agent liquid on the substrate; and a vacuum drying process as early as 70 (VD), which is It is used to dry-process the substrate coated with the resist solution; and the edge remover is used to remove the unnecessary anti-remainder on the periphery of the substrate after drying. These are integrated with each other and are aligned along the second central transport path m. On the other side of the second main arm mechanism 125, there is a first central transport path 124, and a paper sheet for image processing and exposure is provided. This paper uses the Chinese National Standard (cks) A4 specification. X 297 --- ^ ----- Order --------- line (Please read the precautions on the back before ^^ this page)

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1227034 五、發明說明(24) 後之LCD基板的三個顯像處理單元(DvD)丨3]1。 第二主臂機構125,係用以搬入接收自第一熱處理系 統處理部105之基板G於抗蝕劑處理方框13〇,然後從抗姓 劑處理方框130取出施過處理之基板,將之運送至 處理系統處理部107側。又,將接收自第二熱處理系統處 理部107之基板搬入於顯像處理單元131,然後從顯像處理 單元131取出施過處理之基板,將之運送至第一熱處理系 統處理部105側。 第一熱處理糸統處理部10 7 ’係配置成與第二中央運 送路124串聯。在此第二熱處理系統處理部丨〇7,設有第二 子臂機構113B。此第三子臂機構113B,係與第二子臂機 構113A同樣,具有用來保持基板G之臂114,使此臂ιΐ4旋 迴、後退、上下移動,藉此可交接基板於後述周圍之處理 單元的給定裝置。 在第三子臂機構113B之周圍,設有第五熱系處理單 元方框132,第六熱系處理單元方框133,及第七熱系處理 單元方框134,以便包圍第三子臂機構113B。在此等熱系 處理單元方框之中,第五熱系處理單元方框132,係將擴 展單元(EXT),及用來進行預烘烤處理的兩個預烘烤單元 (PRE)堆起三段而成,其與第二液處理系統處理部1〇6之第 二中央運送路124連接同時,被設置成夾著第三子臂機構 113B而與介面部(l.F.)l〇8在Y方向相向;其中擴展單元 (EXT),係從下方依次,在上述第三液處理系統處理部 與第二熱處理系統處理部1〇7之間進行基板G之交換時, 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱) --------訂---------線 (請先閱讀背面之注意事項再本頁) (再太 經濟部智慧財產局員工消費合作社印製 27 1227034 五、發明說明(25 作為中繼部作用。又’第六及第七熱系處理單元方框133 經濟部智慧財產局員工消費合作社印制π 及,均為從下方价皮 ;〜丄干兀万框133 卻單元(COU ΓΓ 將用來進行基板〇之冷卻的冷 來進行預烘烤處理的二個 =起…成。然後,將此"六及二::: 早兀方框133及134,配讯忐十朴够 相在X方向相向。 成夹者第三子臂機構⑽而互 ★第三子臂機構113B,係藉第二液處料、統處理部106 之第二主臂機構125來接收_交接於第四熱系處理單元方 框132之擴展單元(EXT)的基板G,將之搬入於其周圍之第 五及至第七之熱系處理單元方框132〜134的各單元同時, 從第五及至第七熱系處理單元方框132〜134之各處理單元 取出一轭過必要處理之基板G,並移送至露光裝置4〇〇 侧之介面部(I_F.)108。又,第三子臂機構U3B,係透過介 面部(I.F.) 108從露光裝置4〇〇接收露光完成之基板G,將之 再運送至第二液處理系統處理部1 〇6。 介面部108(I.F·)係由運送·待機部137及交接部138所 成。運送•待機部137包含有:擴展•冷卻單元(EXT · COL) 台136,其係在第二熱處理系統處理部1〇7與介面部 (I.F.)l〇8間進行基板G之交接時,兼備作為中繼部用之機 能及基板冷卻機能;緩衝卡匣(BUT)l 35 ;及未圖示之第 四子臂機構。又,交接部138,備有交接台(未圖示),其 係在前述第四子臂機構與露光裝置400之間進行基板之交 接者。 其次,參考第11圖之平面圖及第12圖之側面圖,說明1227034 V. Description of the invention (24) Three development processing units (DvD) of the LCD substrate 3] 1. The second main arm mechanism 125 is used to carry in the substrate G received from the processing unit 105 of the first heat treatment system in the resist processing block 13 and then take out the processed substrate from the anti-agent processing block 130, It is transported to the processing system processing unit 107 side. In addition, the substrate received from the second heat treatment system processing unit 107 is carried into the development processing unit 131, and the processed substrate is taken out from the development processing unit 131 and transported to the first heat treatment system processing unit 105 side. The first heat treatment system processing unit 107 'is arranged in series with the second central transport path 124. The second heat treatment system processing unit 007 is provided with a second sub-arm mechanism 113B. The third sub-arm mechanism 113B is similar to the second sub-arm mechanism 113A, and has an arm 114 for holding the substrate G, so that the arm 4 can be rotated, retracted, and moved up and down, so that the substrate can be transferred to the surrounding processing described later. The given device of the unit. Around the third sub-arm mechanism 113B, a fifth thermal processing unit block 132, a sixth thermal processing unit block 133, and a seventh thermal processing unit block 134 are provided to surround the third sub-arm mechanism. 113B. Among these thermal processing unit blocks, the fifth thermal processing unit block 132 stacks the extension unit (EXT) and two pre-baking units (PRE) for pre-baking processing. It is formed in three stages, and is connected to the second central conveying path 124 of the processing unit 106 of the second liquid processing system. At the same time, it is arranged to sandwich the third sub-arm mechanism 113B with the interface portion (1F) 108 at Y. The directions are opposite; the extension unit (EXT) is in order from below, when the substrate G is exchanged between the third liquid processing system processing unit and the second heat processing system processing unit 107, the paper size applies the Chinese national standard (CNS) A4 specification (210 X 297 public love) -------- Order --------- line (Please read the precautions on the back before this page) Printed by the Bureau ’s Consumer Cooperatives 27 1227034 V. Description of the invention (25 functions as a relay department. It ’s also the sixth and seventh thermal processing unit box 133 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs The lower valence skin; ~ 丄 dried frame 133 but the unit (COU ΓΓ will be used to cool the substrate 0 Let's do two pre-baking treatments .... Then, this " Six and Two ::: Early Wood Boxes 133 and 134, with the distribution of 忐 Shi Park is enough to face each other in the X direction. The three sub-arm mechanisms are mutually connected. The third sub-arm mechanism 113B is the second main arm mechanism 125 of the second liquid processing and processing unit 106 to receive and transfer the expansion of the fourth thermal processing unit block 132. The substrate G of the unit (EXT) is moved into the surrounding fifth to seventh thermal processing unit blocks 132 to 134, and at the same time, from the fifth to seventh thermal processing unit blocks 132 to 134. Each processing unit takes out a substrate G that has been yoke-treated, and transfers it to the mesial surface (I_F.) 108 on the exposure side of the device 400. Furthermore, the third sub-arm mechanism U3B is driven from the mesial surface (IF) 108 from The exposure device 400 receives the exposed substrate G and transports it to the second liquid processing system processing section 106. The interface 108 (IF ·) is formed by the transportation and standby section 137 and the transfer section 138. Transportation The standby unit 137 includes an extension and cooling unit (EXT · COL) stage 136, which is located at the second heat treatment system. When the substrate G is transferred between the unit 107 and the interface surface (IF) 108, it has both the function of the relay unit and the cooling function of the substrate; the buffer cassette (BUT) 135; and the fourth (not shown) Sub-arm mechanism. Also, the transfer unit 138 is provided with a transfer table (not shown) for transferring substrates between the aforementioned fourth sub-arm mechanism and the exposure apparatus 400. Next, refer to the plan view of FIG. 11 and Figure 12 is a side view illustrating

(請先閱讀背面之注意事項再本頁)(Please read the notes on the back before this page)

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本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 28 1227034 A7 B7 五、發明說明(26) 經濟部智慧財產局員工消費合作社印製 有關配5又在熱處理系統處理部1〇5、107的第二及第三子臂 機構113A、113B之構造。第二及第三子臂機構U3A、U3B ’係具有同―構造之水平定標型機器人,而-如第11圖及 第12圖所示,包含有:施迴板14〇 ,其係繞未圖示之旋迴 軸旋迴且上下移動;及上下兩個手142、144,其係用以保 持基板,向前後移動者。 又在上側之手142的基端部兩側,設有:一對第一 臂152、152,其係設有朝上方之支軸⑼、15〇,並可回動 地連結於此等支軸150、15〇 ;及一對第二臂i56、156,其 係透過支軸157、157可回動地連結於此等第一臂152、152 。第一臂152、152係設在第二臂156、156之下側,手142 即被吊下支持於第一臂152、152。一對第二臂156、156, 係可回動地連結於從上述旋迴板14〇向上方延伸之一對第 一旋轉軸155、155。 一方面,在下側之手144的基端部兩側,備有:一對 第三臂162、162,其係設有朝下方之支軸16〇、16〇,並可 回動地連結於此等支軸160、160;及一對第四臂166、166 ,其係透過支軸167、167可回動地連結於此等第三臂162 、162。第三臂162、162係設在第四臂166、166之上側; 即,藉第三臂162、162從下側支持手144。一對第四臂166 、166係可回動地連結於從上述旋迴板14〇向延伸之一對第 二旋轉驅動軸16 5、16 5。 如圖所示,第一旋轉驅動軸155及第二旋轉驅動軸165 係同軸地配置著;其中第一旋轉驅動軸155即向第二旋轉 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 請 先- 閱 讀 背· 之 注 意 事 訂 線This paper size is in accordance with Chinese National Standard (CNS) A4 (210 X 297 mm) 28 1227034 A7 B7 V. Description of the invention (26) Printed by the Consumers ’Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 5 〇5, 107 structure of the second and third sub-arm mechanism 113A, 113B. The second and third sub-arm mechanisms U3A, U3B are horizontal calibration robots with the same structure, and as shown in Figures 11 and 12, they include: a return plate 14o, which is not wrapped around The rotation axis shown in the figure rotates and moves up and down; and the two upper and lower hands 142 and 144 are used to hold the substrate and move forward and backward. On both sides of the base end portion of the upper hand 142, a pair of first arms 152, 152 are provided, which are provided with supporting shafts ⑼, 150, which can be reversibly connected to these supporting shafts. 150, 15〇; and a pair of second arms i56, 156, which are reversibly connected to these first arms 152, 152 through the support shafts 157, 157. The first arms 152 and 152 are disposed below the second arms 156 and 156, and the hand 142 is suspended and supported by the first arms 152 and 152. A pair of second arms 156, 156 are rotatably connected to a pair of first rotating shafts 155, 155 extending upward from the swing plate 14o. On the one hand, on both sides of the base end portion of the lower hand 144, a pair of third arms 162, 162 are provided, which are provided with supporting shafts 16 and 16 facing downward, and can be reversibly connected thereto. The equal support shafts 160, 160; and a pair of fourth arms 166, 166 are rotatably connected to the third arms 162, 162 through the support shafts 167, 167. The third arms 162, 162 are provided on the upper side of the fourth arm 166, 166; that is, the third arm 162, 162 supports the hand 144 from the lower side. A pair of fourth arms 166 and 166 are rotatably connected to a pair of second rotary drive shafts 16 5 and 16 5 extending in a direction extending from the swivel plate 140. As shown in the figure, the first rotation driving shaft 155 and the second rotation driving shaft 165 are coaxially arranged; among them, the first rotation driving shaft 155 rotates toward the second rotation. The paper size applies the Chinese National Standard (CNS) A4 specification (210 X 297 mm) Please first-Read the back · Notes · Thread

29 1227034 五、發明說明(27) 驅動軸165之上方延伸。又,此等旋轉驅動軸155、165, 係設在子臂機構113A、113B之旋迴半徑内側且手142、144 之外側。又,在各旋轉驅動軸155、165,安裝有滑輪(未 圖示),其係安裝成藉由掛在此滑輪之定時皮帶,使各臂152 、156、162、166回動。 其次,一面參考第13圖之流程圖,一面說明前述構成 之塗佈顯像處理系統300的處理步驟之一例。 首先,將載置台110上之第一卡匣C1r所收納的未處 理基板G,從搬入•搬出部103透過運送部(cs)lu,交接 於第一液處理糸統處理部104之第一主臂機構115(步驟S41) 。其次,藉由激發物單元112,將此基板G有機物洗淨(步 驟S42);其後,藉由例如第一熱處理系統處理部1〇5第一 熱糸統系處理早元方框120之擴展•冷卻單元(ext · cOL) 來施行冷卻處理(步驟S43)。 其次,將施過冷卻處理之基板G,藉擦洗洗淨單元 (SCR)l 19來施行借助電刷之擦洗洗淨(步驟S44);其處理 終了後’在借助第二子臂機構113A之搬出•搬入動作下 ’用第一熱處理系統處理部105之第一熱系處理單元方框 120之熱板單元(HP),來施行脫水烘烤處理(步驟S45);接 著,用第二熱系處理單元方框121之冷卻單元(COL)來施 予冷卻處理(步驟S46)。其後,為了提高抗蝕劑之固定性 ,而用附著處理單元(AD)對於基板施行表面之疏水化處 理(步驟S47);用第二熱系處理單元方框121之擴展•冷卻 單元(EXT · COL)來冷卻成給定之溫度(步驟S48)。 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 請 先· 閱 讀 背, 面 之 注 意 事29 1227034 V. Description of the invention (27) The drive shaft 165 extends above. In addition, these rotary drive shafts 155 and 165 are provided inside the turning radius of the sub-arm mechanisms 113A and 113B and outside the hands 142 and 144. A pulley (not shown) is attached to each of the rotary drive shafts 155 and 165, and the arms 152, 156, 162, and 166 are revolved by a timing belt hanging on the pulley. Next, an example of the processing steps of the coating and developing processing system 300 configured as described above will be described with reference to the flowchart of FIG. 13. First, the unprocessed substrate G stored in the first cassette C1r on the mounting table 110 is transferred from the carry-in and carry-out section 103 through the conveying section (cs) lu to the first master of the first liquid processing system processing section 104. The arm mechanism 115 (step S41). Next, the substrate G organic matter is cleaned by the exciter unit 112 (step S42); thereafter, the extension of the early element block 120 is processed by, for example, the first thermal processing system processing unit 105 and the first thermal system. The cooling unit (ext · cOL) performs a cooling process (step S43). Next, the substrate G that has undergone the cooling treatment is scrubbed and cleaned by means of a scrubbing and cleaning unit (SCR) 119 (step S44); after the processing is completed, it is removed by the second sub-arm mechanism 113A • In the loading operation, the hot plate unit (HP) of the first thermal processing unit block 120 of the first thermal processing system processing unit 105 is used to perform the dehydration baking process (step S45); then, the second thermal processing is performed The cooling unit (COL) of the unit block 121 performs a cooling process (step S46). Thereafter, in order to improve the fixability of the resist, the surface of the substrate is hydrophobized by an attachment processing unit (AD) (step S47); the extension and cooling unit (EXT) of the second thermal processing unit block 121 is used. · COL) to cool to a given temperature (step S48). This paper size is in accordance with Chinese National Standard (CNS) A4 (210 X 297 mm). Please read it first, note the following.

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經濟部智慧財產局員工消費合作社印製 30 1227034Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 30 1227034

經濟部智慧財產局員工消費合作社印製 五、發明說明(28) 接著,藉由第二主臂機構125,將疏水化處理後之基 板導入於第二液處理系統處理部106,藉由抗蝕劑處理方 框130之抗蝕劑液塗佈處理單元(CT),減壓乾燥處理單元 (VD),及邊緣除去器(ER),依次進行抗蝕劑塗佈、減壓 乾燥處理,及基板周緣之無用抗蝕劑液之去除(步驟S49)。 像這樣,透過第四熱系處理單元方框132之擴展單元 (EXT),藉第三子臂機構113B,將抗蝕劑處理後之基板g 導入於第二熱處理系統處理部丨〇7,用該第二熱處理系統 處理部107之第五及至第七熱處理系統單元方框丨32、133 、134之任一預烘烤單元(pre),來施行預烘烤處理(步驟 S50)。藉此揮發含在塗佈於基板g之抗蝕劑液的溶劑。接 著,用第二熱處理系統處理部107之第六或第七熱系處理 單元方框133、134之任一冷卻單元(COL),將該基板G冷 卻至略室溫為止(步驟S51)。其後,藉由第三子臂機構ii3B ,將該基板G搬入於介面部108之擴展•冷卻台(EXT· COL) 136,同時透過介面部108來交接於露光裝置400(步驟S52) ;在那裡露光給定之圖案。 將進行露光處理後之基板G,插入於標題器(Titler)139 以進行標題處理(步驟S53)。其後,將基板G,透過介面部 108及第二熱處理系統處理部107,導入於第二液處理系統 處理部106,進而用給定之顯像處理單元(DEV)l 31進行顯 像處理(步驟S54)。在此顯像處理單元131,即以旋轉基板 之狀態,將顯像液供給於基板上來進顯像。又,用漂洗液 洗掉顯像液之後,進行挣開乾燥。 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) --------訂---------線 (請先閱讀背面之注意事項再本頁)Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. 5. Description of the invention (28) Next, the substrate after the hydrophobization treatment is introduced into the processing unit 106 of the second liquid processing system through the second main arm mechanism 125, and The resist liquid coating processing unit (CT), the reduced pressure drying processing unit (VD), and the edge remover (ER) of the resist processing block 130 sequentially perform the resist coating, the reduced pressure drying processing, and the substrate. Removal of unnecessary resist liquid on the periphery (step S49). In this way, through the extension unit (EXT) of the fourth thermal processing unit block 132, the third sub-arm mechanism 113B is used to introduce the resist-processed substrate g into the second heat treatment system processing unit. Any of the fifth and seventh heat treatment system unit blocks 32, 133, and 134 of the second heat treatment system processing unit 107 performs a pre-bake process (step S50). Thereby, the solvent contained in the resist liquid applied on the board | substrate g is volatilized. Next, the substrate G is cooled to a room temperature by using one of the sixth or seventh thermal processing unit blocks 133 and 134 of the second thermal processing system processing unit 107 (step S51). Thereafter, the third sub-arm mechanism ii3B is used to carry the substrate G into the extension and cooling stage (EXT · COL) 136 of the mesial portion 108, and transfer it to the exposure device 400 through the mesal portion 108 (step S52); Dew there is given the pattern. The substrate G subjected to the exposure processing is inserted into a titler (Titler) 139 to perform a title processing (step S53). Thereafter, the substrate G is introduced into the second liquid processing system processing unit 106 through the mesial portion 108 and the second heat treatment system processing unit 107, and further subjected to development processing using a given development processing unit (DEV) 131 (step S54). Here, the development processing unit 131 supplies the development liquid to the substrate in a state of rotating the substrate to perform development. The developing solution was washed away with a rinsing solution, and then dried. This paper size applies to China National Standard (CNS) A4 specification (210 X 297 mm) -------- Order --------- line (Please read the precautions on the back before this page)

31 1227034 A7 ___B7 五、發明說明(29 ) 將顯像處理後之基板G,導入於第一熱處理系統處理 #105内,用第二或第四熱系處理單元方框之後 烘烤單元(POST)施行後烘烤處理(步驟S55);接著用第二 熱系處理單元方框121之冷卻單元(c〇l)或第一或第二熱 系處理單元方框120、121之擴展•冷卻單元(Εχτ · c〇L) 冷卻或給定溫度(步驟S56)。 | 將完全施行了以上之處理後之基板G,從第二子臂機 構113A,透過第一主臂機構115交接於設在運送部Ul(c/S) 之第一子臂機構113,進而,藉第一子臂機構113來收容於 該載置在搬入•搬出部103之第二卡匣C2内(步驟S57)。 如上所示’於本實施形態之塗佈顯像處理系統3 〇〇, 包含有成為較大型旋轉系統單元即擦洗洗淨單元 (SCR)l 19,抗蝕劑處理方框130之抗蝕劑液塗佈處理單元 (CT) ’及顯像處理單元(dev) 131之液處理系統單元,係 沿中央運送路116,124而並設著,而比此等單元更小型之 熱處理系統單元,也就是脫水烘烤單元,預烘烤單元,後 烘烤單元(HP、PRE、POST)、冷卻單元(c〇L)、附著單元 (AD)等,係配置在位置於中央運送路116、124之延長線 上的子臂機構113A、113B之周圍,堆起三段而成。像這 樣’只要總滙熱處理系統之單元加以一體化,即可謀求省 空間化及處理之效率化,同時可配置多數之單元。即,可 一邊將覆蓋區抑低,一邊同時使單元數增加。又,將熱處 理系統之單元總滙起起來加以一體化的話,可在此處使電 配線和配管集中,所以可將各種線路配置成小型化。 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再本頁) 訂---------線 辞 經濟部智慧財產局員工消費合作社印製 32 122703431 1227034 A7 ___B7 V. Description of the invention (29) The substrate G after the development process is introduced into the first heat treatment system process # 105, and the second or fourth heat system processing unit is used to frame the baking unit (POST). Perform post-baking treatment (step S55); then use the cooling unit (c0l) of the second thermal processing unit block 121 or the expansion / cooling unit (120 or 121 of the first or second thermal processing unit) Eχτ · COL) is cooled or given a temperature (step S56). The substrate G, which has been completely processed as described above, is transferred from the second sub-arm mechanism 113A to the first sub-arm mechanism 113 provided in the transport section Ul (c / S) through the first main arm mechanism 115, and further, The first sub-arm mechanism 113 is housed in the second cassette C2 placed in the carry-in / out unit 103 (step S57). As shown above, the coating development processing system 300 in this embodiment includes a resist liquid, which is a scrubbing and washing unit (SCR) 19, which is a larger rotating system unit, and a resist processing block 130. The coating processing unit (CT) 'and the development processing unit (dev) 131 are liquid processing system units, which are arranged along the central transportation path 116, 124, and are smaller than these units, which is a heat treatment system unit, that is, Dehydration baking unit, pre-baking unit, post-baking unit (HP, PRE, POST), cooling unit (c0L), attachment unit (AD), etc., are arranged in the extension of the central conveying path 116, 124 Around the sub-arm mechanisms 113A and 113B on the line, three sections are piled up. In this way, as long as the units of the convergent heat treatment system are integrated, space saving and processing efficiency can be achieved, and a large number of units can be arranged at the same time. That is, it is possible to increase the number of cells while suppressing the coverage area. In addition, if the units of the heat treatment system are integrated and integrated, the electric wiring and piping can be concentrated here, so that various circuits can be arranged in a small size. This paper size applies to China National Standard (CNS) A4 (210 X 297 mm) (Please read the precautions on the back before this page) Co-operative printed 32 1227034

五、發明說明(3〇) 又,依照本實施職、,以旋轉系統之單元作為主構成 要素之液處理系統處理部,及由熱處理系統單元所成之熱 處理系統處理部,係透過中央運送路串行地連接起來,藉 此互相被區分。因此,可將自熱處理系統單元給與液處理 系統單元之熱性影響,抑制至最小限度。 再者,由於備有··液處理系統處理部1〇4、1〇6,其係 沿著向水平延伸之中央運送路116、124而配置有對於基板 G施行液處理之多數個液處理系統單元,藉由用來移動於 中央運送路116、124之主臂機構115、125,對於沿中央運 送路116、124而設的各處理單元,進行基板^之運送;及 熱理系統處理部1〇5、107,其係沿著向垂直延伸之垂直運 送路而配置有向上下方向層合之多數個熱系處理單元,藉 由用來移動於垂直運送路之子臂機構113A、113B,對於 垂直地層合之各熱系處理單元,進行基板G之運送; 而且,由於將不礙於上下重疊之熱系處理單元上下重 且同時,在子臂機構113A、113B之周圍配置重疊有處 理單元之熱系處理單元方框; 所以其份兒可顯著使覆蓋區變小同時,將礙於上下重 疊之液處理系統處理單元配置成水平,用主臂機構115、125 來運送,因此可使用能以高速度準行水平方向之移動者作 為主臂機構115、125,以及可使用能以高速度進行垂直方 向之移動者作為子臂機構113A、113B,從而可達成運送 裝置之機能分離,可維持高生產率。 更且又’於本實施形態,作為設在熱處理系統處理部 本纸張尺度適用中國國家標準(CNS)A4規格(2]〇 X 297公釐) (請先閱讀背面之注意事項 訂---------線V. Description of the invention (30) In addition, according to this implementation, the liquid processing system processing section with the rotating system unit as the main constituent element, and the heat treatment system processing section formed by the heat treatment system unit are through the central transportation path. They are connected in series so as to be distinguished from each other. Therefore, the thermal influence of the self-heat treatment system unit to the liquid treatment system unit can be minimized. In addition, since the liquid processing system processing units 104 and 106 are provided, a plurality of liquid processing systems for performing liquid processing on the substrate G are arranged along the central conveyance paths 116 and 124 extending horizontally. A unit that transports substrates ^ to the processing units provided along the central transport path 116, 124 by the main arm mechanisms 115, 125 for moving on the central transport path 116, 124; and a thermal system processing unit 1 〇5, 107 are a plurality of thermal processing units laminated along the vertical conveying path extending vertically, and the sub-arm mechanisms 113A and 113B for moving the vertical conveying path are used for the vertical conveying path. The ground-based thermal processing units carry the substrate G. Moreover, since the thermal processing units that do not hinder the upper and lower layers are heavy and heavy, at the same time, the heat of the processing unit is arranged around the sub-arm mechanisms 113A and 113B. It is a processing unit block; therefore, it can significantly reduce the coverage area. At the same time, the processing unit of the liquid processing system that is obstructed by the top and bottom can be arranged horizontally and transported by the main arm mechanism 115, 125. High-speed quasi-horizontal movers are used as main arm mechanisms 115 and 125, and high-speed traversers can be used as high-speed movers as sub-arm mechanisms 113A and 113B, thereby achieving functional separation of the transport device and maintaining it. High productivity. In addition, in this embodiment, as the paper size set in the heat treatment system processing department, this paper applies the Chinese National Standard (CNS) A4 specification (2) × 297 mm (please read the precautions on the back first --- ------line

經濟部智慧財產局員工消費合作社印製 33 1227034Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 33 1227034

五、 發明說明(31 經濟部智慧財產局員工消費合作社印製 05 107之基板運送裝置用之第二及第三子臂機構⑴A 、U3B,係因都是分別藉兩個臂152、i52及臂μ]、Μ〕 從兩邊支持用來保持基板G之兩手142、144,而能以高速 度且穩定地支持,高難,大型且矩形之⑽基板。又, 第一旋轉驅動軸155及第二旋轉驅動軸165,係互相配置於 同軸同時,位置在子臂機構丨丨3A、丨丨3B之旋迴半徑内側 且手142、144之外側,所以一邊防止手142、144與旋轉驅 動軸155、165之干擾,一邊可謀求臂機構之水型化。 像這種構造之基板運送用子臂機構113A、U3B,係 在如本貫施形悲那樣之抗餘劑塗佈顯像處理裝置3〇〇,特 別有益。即,依照本實施形態之抗蝕劑塗佈顯像處理裝置 300,如上所述,將熱系之單元總滙成一體化,藉此可謀 求省空間化及處理之效率化(一邊壓低覆蓋區,一邊使單 元數增加)。因此,如果可藉如第丨丨圖,第12圖所示之特 有構成來謀求子臂機構113A、113B之小型化的話,可更 促進具有前述構成之塗佈顯像處理系統300的覆蓋區之削 減’同時隨子臂機構113A、113B之高剛性,而可高速度 運送。如此,藉由使單元數之增加變為可能的抗蝕劑塗佈 顯像處理裝置300,更加促進生產率之提高。 第14圖係顯示第二及第三子臂機構ιΐ3Α、113B之變 形例。於本變形例,用以使下側之手144動作之第二旋轉 驅動軸165、165,係偏置於比用以使上側之手142動作之 第一旋轉驅動軸155、155更為前方側(沿X方向或Y方向偏 移之位置)以及第一旋轉驅動軸15 5、15 5之外側(對於旋迴 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再本頁) 再 士 訂---------線 辞 34 1227034 A7 經濟部智慧財產局員工消費合作社印制衣 五、發明說明(32 ) 台140之中心,直徑方向之外側)。又,其以外之構成係與 第11圖及第12圖之構成同一,所以附諸同一符號而省略其 說明。若依本變形例之構成,則除了可獲得與第n圖及第 12圖之構成同樣之作用效果以外,更因為第二旋轉驅動轴 165、165偏置於第一旋轉驅動軸155、155之外側,而呈現 更可確實地防止手142、144與旋轉驅動軸155、165之干 等效果。第15圖為一面圖,係顯示本發明之第二實施形態的變 形例。又,於第15圖中,關於與第9圖共同之部分,即附 加同一符號。 關於本變形例之抗蝕劑塗佈顯像處理裝置3〇〇A,包 含有:搬入·搬出部103,其係用以進行LCD基板〇之搬 入•搬出(負載及卸載”第一液處理系統處理部1〇4,其 係使基板G旋轉以用來進行洗淨處理;第一熱處理系統處 理部105 A,其係主要用以進行加熱•冷卻處理;第二液 處理系統處理部106A,其係使基板G旋轉以用來進行抗蝕 劑液之塗佈(coating)及周緣抗餘劑除去處理等;第二熱處 理系統處理部107A,其係用以進行加熱•冷卻處理,液 處理糸統/熱處理糸統用處理部109 ;及介面部(I ·ρ·) 1 〇8, 其係與露光裝置400之間,用以進行基板〇之交接。又, 液處理系統/熱處理系統兼用處理部1 〇9 ,包含有··第三熱 處理系統109A,其係用以進行加熱•冷卻處理;及第三 液處理系統處理部109B,其係使基板旋轉以用來進行顯 像處理。又,此等之中,搬入•搬出部1〇3,第一液處理 本紙張尺度適用中國國家標準(CNS)A4規格(2]〇χ 297公釐 (請先閱讀背面之注意事項 1^^ I :再本頁 訂---------線 辞 -35 經濟部智慧財產局員工消費合作社印制农 1227034 A7 ~^--- 五、發明說明(33 ) 系統處理部104,介面部(LF.)1〇8之構成,係與第9圖之例 完全相同,所以省略其說明。 第一熱處理系統處理部105A,備有第二子臂機構U3A ,其被配置成與第一中央運送路116串行(在中央運送路 116之延長線上)。在第二子臂機構113a之周圍,設有第一 熱系處理單元方框170,第二熱系處理單元方框171,第三 熱系處理單元方框172,俾從外側包圍第二子臂機構U3A 。在此之中,第一熱系處理單元方框17(),係從下方依次 將擴展•冷卻單元(EXT· C0L),進行脫水烘烤處理之兩 個脫水烘烤單元(HP)、及進行疏化處理之附著處理單元 (AD)堆起四段而成,其中該擴展•冷卻單元(EXT · COL) 兼備:在上述第一液處理系統處理部1〇4與第一熱處理系 統處理部之間進行基板G之交接時作為中繼部作用之機能 ;及基板冷卻機能。第二熱系處理單元方框171,係從下 依次將用以冷卻基板之兩個冷卻單元(c〇L),及附著處理 單元(AD)堆起三段而成。第三熱處理單元方框172,係將 擴展•冷卻單元(EXT · C0L),冷卻單元(c〇L),及進行 預烘烤處理之兩個預烘烤單元(PRE)堆起四段而成,其中 該擴展•冷卻單元(EXT · COL)兼備··在第一熱處理系統 處理部105A與第二熱處理系處理部1〇7A之間進行基板G 之交接時作為中繼部作用之機能;及基板冷卻機能。又, 第一熱系處理單元方框170,係連接於第一液處理系統處 理部104之第一中央運送路116,其被設置成夾著第二子臂 機構113A而在Y方向與第三熱系處理單元172相向。 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) --------訂---------線 (請先閱讀背面之注意事項再本頁)V. Description of the invention (31 The second and third sub-arm mechanisms ⑴A and U3B for the substrate conveying device printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs and the Ministry of Economic Affairs printed 05 107, because the two arms 152, i52 and arm μ], M] Supports the two hands 142 and 144 for holding the substrate G from both sides, and can support it at high speed and stability, with high difficulty, large and rectangular cymbals. Also, the first rotary drive shaft 155 and the second The rotation drive shaft 165 is arranged coaxially with each other, and is located inside the rotation radius of the sub-arm mechanism 丨 丨 3A, 丨 丨 3B and outside the hands 142, 144, so while preventing the hands 142, 144 and the rotation drive shaft 155, The interference of 165 can make the arm mechanism water-type. The sub-arm mechanisms 113A and U3B for substrate transportation with this structure are based on the anti-residue-coating imaging processing device 3 as in this example. 〇, which is particularly beneficial. That is, as described above, the resist coating development processing apparatus 300 according to this embodiment integrates the units of the thermal system as described above, thereby achieving space-saving and processing efficiency ( While pushing down the coverage area, The number of elements increases). Therefore, if the sub-arm mechanisms 113A and 113B can be miniaturized by the special structure shown in Figures 丨 丨 and 12, the coating development processing system with the aforementioned structure can be further promoted The reduction of the coverage area of 300 'can be transported at high speed with the high rigidity of the sub-arm mechanisms 113A and 113B. In this way, the resist coating development processing apparatus 300 which makes it possible to increase the number of units becomes even more Promote productivity improvement. Fig. 14 shows modified examples of the second and third sub-arm mechanisms ι3A and 113B. In this modified example, the second rotary drive shafts 165 and 165 are used to move the lower hand 144. Offset to the front side (position shifted in the X direction or the Y direction) of the first rotary drive shafts 155 and 155 for moving the upper hand 142 and the outer sides of the first rotary drive shafts 15 5 and 15 5 (For the size of this paper, the Chinese National Standard (CNS) A4 (210 X 297 mm) applies) (Please read the precautions on the back before this page)) 1227034 A7 Printing of clothing by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs Explanation of the invention (32) The center of the stage 140, the outer side in the diameter direction). The other structures are the same as those in FIG. 11 and FIG. 12, so the same symbols are used and the description is omitted. The structure of the example is the same as that of the nth and twelfth figures, and the second rotary drive shafts 165 and 165 are offset from the outer sides of the first rotary drive shafts 155 and 155. It is possible to more surely prevent the effects of the hands 142, 144 and the rotary drive shafts 155, 165, etc. Fig. 15 is a side view showing a modified example of the second embodiment of the present invention. In Fig. 15, the same parts as those in Fig. 9 are assigned the same symbols. The resist coating development processing apparatus 300A of the present modification includes a loading / unloading unit 103 for loading / unloading (loading and unloading) the first liquid processing system of the LCD substrate 0. The processing unit 104 rotates the substrate G for cleaning processing; the first heat treatment system processing unit 105 A is mainly used for heating and cooling processing; the second liquid processing system processing unit 106A is The substrate G is rotated to perform coating of the resist solution and removal of peripheral anti-reagent. The second heat treatment system processing unit 107A is used to perform heating and cooling treatments and liquid treatment systems. / The heat treatment system processing unit 109; and the mesial surface (I · ρ ·) 1 08, which is used to transfer the substrate 0 to the exposure apparatus 400. In addition, the liquid processing system / the heat treatment system also serves as the processing unit. 1 009 includes a third heat treatment system 109A for heating and cooling processing, and a third liquid processing system processing unit 109B for rotating the substrate for development processing. Also, this Waiting in, moving in / out 1〇3, the first liquid treatment The size of this paper is applicable to the Chinese National Standard (CNS) A4 specification (2) 〇χ 297 mm (please read the precautions on the back 1 ^^ I: Order on this page ----- ---- Information -35 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs, Printed Agriculture 1227034 A7 ~ ^ --- V. Description of the invention (33) The system processing unit 104, the face (LF.) 108 structure, The system is completely the same as the example in FIG. 9, so its description is omitted. The first heat treatment system processing unit 105A is provided with a second sub-arm mechanism U3A, which is arranged in series with the first central transport path 116 (in the central transport path 116 on the extension line). Around the second sub-arm mechanism 113a, a first thermal processing unit block 170, a second thermal processing unit block 171, and a third thermal processing unit block 172 are provided. The outer part surrounds the second sub-arm mechanism U3A. Among them, the first thermal processing unit block 17 () is the dehydration and cooling unit (EXT · C0L) in order from the bottom to perform two dehydration and dehydration processes. The baking unit (HP) and the adhesion treatment unit (AD) for dehydration are stacked in four stages, of which the extension The cooling unit (EXT · COL) also has the function of acting as a relay unit when transferring the substrate G between the first liquid processing system processing unit 104 and the first heat processing system processing unit; and the substrate cooling function. The second heat treatment unit block 171 is formed by stacking three cooling units (c0L) and the attachment treatment unit (AD) for cooling the substrate in order. The third heat treatment unit block 172 , It is formed by stacking four sections of the extension · cooling unit (EXT · C0L), the cooling unit (c0L), and the two pre-baking units (PRE) for pre-baking treatment. (EXT · COL) Combines the function of acting as a relay when transferring the substrate G between the first heat treatment system processing unit 105A and the second heat treatment system processing unit 107A; and the substrate cooling function. The first thermal processing unit block 170 is connected to the first central transport path 116 of the processing unit 104 of the first liquid processing system, and is provided to be in the Y direction and third to sandwich the second sub-arm mechanism 113A. The thermal processing units 172 face each other. This paper size applies to China National Standard (CNS) A4 specification (210 X 297 mm) -------- Order --------- line (Please read the precautions on the back before this page)

36 1227034 A7 一 B7 經濟部智慧財產局員工消費合作社印製 五、發明說明(34) 第一熱處理糸處理部107A,係配置成與液處理系統丨 熱處理系統兼用處理部109之後述第二中央運送路124八串 行(在中央運送路124A之延長線上),且備有第三子臂機構 113B 〇 在第三子臂機構113B之周圍,設有第三熱系處理單 元方框172,第四熱系處理單元方框173,及第五熱系處理 單元方框174,俾從外側包圍第三子臂機構113B。即,第 三熱系處理單元方框172,係配置在第二子臂機構ι13Α與 第三子臂機構113B之間,而在第一熱處理系統處理部i〇5a 與第二熱處理系統處理部107A間被兼用。第四熱系處理 單元方框173,係將用來進行預烘烤處理之四個預烘烤單 元(PRE)堆起四段而成。又,第五熱系處理單元方框174, 係將下方依次,將擴展•冷卻單元(EXT · COL)、冷卻單 元(COL),及用來進行後烘烤處理之後烘烤單元(p〇ST)堆 起上下三段而成,其中該擴展•冷卻單元(EXT · COL)兼 備:在第二熱處理系處理部107A與液處理系統/熱處理系 統兼用處理部10 9之間進行基板G之交接時作為中繼部作 用之機能;及基板冷卻機能。又,第五熱系處理單元方框 方框174,係連接於液處理系統/熱處理系統兼用處理部1〇9 之後述第二中央運路124A,其被設置成夾著第三子臂機 構113B而在Y方向與第三熱系處理單元方框172相向。 第二液處理系統處理部106A,係由抗|虫劑處理方框 130所成,並沿著第二及第三子臂機構ii3A、113B,及其 間之第三熱系處理單元方框172而並行地設置著,以成為 本紙張尺度適用中國國家標準(CNS)A4規格(2】0 X 297公釐) (請先閱讀背面之注意事項再:本頁)36 1227034 A7-B7 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 5. Description of the invention (34) The first heat treatment and treatment unit 107A is configured to be used with the liquid treatment system 丨 the heat treatment system and the treatment unit 109. Road 124 eight serial (on the extension line of the central transport road 124A), and equipped with a third sub-arm mechanism 113B 〇 Around the third sub-arm mechanism 113B, there is a third thermal processing unit block 172, the fourth The thermal processing unit block 173 and the fifth thermal processing unit block 174 surround the third sub-arm mechanism 113B from the outside. That is, the third thermal processing unit block 172 is disposed between the second sub-arm mechanism ι13A and the third sub-arm mechanism 113B, and the first thermal processing system processing unit 105a and the second thermal processing system processing unit 107A It was dual-use. The fourth thermal processing unit block 173 is formed by stacking four pre-baking units (PRE) for pre-baking processing in four stages. In addition, the fifth thermal processing unit block 174 is an extension / cooling unit (EXT · COL), a cooling unit (COL), and a post-baking unit (post-bake unit) for performing post-baking processing. ) Stacked up and down three sections, where the extension and cooling unit (EXT · COL) also has: when the transfer of the substrate G between the second heat treatment system processing unit 107A and the liquid processing system / heat treatment system combined processing unit 10 9 Function as a relay; and substrate cooling function. The fifth thermal processing unit block 174 is connected to the liquid processing system / heat processing system combined processing unit 109 and the second central transport path 124A described later, and is provided to sandwich the third sub-arm mechanism 113B. In the Y direction, the third thermal processing unit block 172 faces. The second liquid processing system processing unit 106A is formed by the anti-insectant processing block 130, and along the second and third sub-arm mechanisms ii3A, 113B, and the third thermal processing unit block 172 therebetween Set in parallel so that this paper size applies the Chinese National Standard (CNS) A4 specification (2) 0 X 297 mm (Please read the precautions on the back first: this page)

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37 [227034 A7 B7 五、發明說明(36) 經濟部智慧財產局員工消費合作社印製 其說明。 如上所述’於關於本例之抗蝕劑塗佈顯像處理裝置 300A中,包含成為較大型之旋轉系統單元即擦洗洗淨單 元(SCR)119,抗蝕劑處理方框13〇之抗蝕劑液塗佈處理單 元(ct),及顯像處理單元(DEV)131在内之液處理系統單 元’也同樣沿著中央運送路116、12A並行地設置著,且 ,熱系處理單元(HP、Pre、p〇ST、COL、AD)係在位置 於中央運送路116、124A之延長線上之子臂機構113A、113B 之周圍,被配置成堆起多段,所以可獲得與第9圖所示之 實施形態同樣之效果。 第16圖為一平面圖,係顯示本發第二實施形態之其他 實施例。又,於第16圖中,關於與第9圖共同之構成部分 ’即附加同一符號。 關於本例之抗蝕劑塗佈顯像處理裝置3〇〇B,包含有 •搬入•搬出部103,其係用以進行LCD基板G之搬入· 搬出(負載及卸載);第一液處理系統處理部1〇4A,其係使 基板G旋轉以用來進行洗淨處理;第一熱處理系統處理部 105B,其係主要用以進行加熱•冷卻處理;第二液處理 統處理部106B,其係使基板G旋轉以用來進行抗蝕劑液 塗佈(coating),並用來進行周緣抗蝕劑除去處理等,·第 熱處理系統處理部職,其係用以進行加熱•冷卻處 第三液處理系統處理部10%,其係使基板旋轉以用來進 > ”、、員像處理,及η面部(I F )1〇8,其係在與露光裝置糊 之間進行基板G之交接。又,搬入•搬出部1〇3及介面部 之 二 理 (請先閱讀背面之注意事項再本頁) il衣 再士 -----訂---------線 39 1227034 A7 B7 經濟部智慧財產局員工消費合作社印製 五、發明說明(37) (I.F.)108之構成,係與第9圖之例完全同一,所以省略其 說明。 第一液處理糸統處理部1 〇4A,備有從第一子臂機構 113接收基板之第一主臂機構115,在第一主臂機構115之 一方侧’沿著中央運送路1丨6A並行地設有:例如由電刷 擦洗器所成之洗淨單元(SCR)i 19 ;及用來進行有機物洗 淨之激發物單元(Excimer) 112。 第一熱處理系統處理部1〇5,係配置成與第一中央運 送路116A串行(在中央運送路16之延長線上),在該第一熱 處理系統處理部105B,設有第二子臂機構113A。此第二 子臂機構113A,係基本上與第9圖所示者同樣地構成,並 具有可保持基板G之臂114,即,使該臂旋轉、進退及上 下移動,藉此可將基板交接於後述周圍之處理單元的給定 位置。 在第二子臂機構113A之周圍,設有第一熱系處理單 元方177、第二熱系處理單元方框178、及第三熱系處理單 元方框179,俾從外側包圍第二子臂機構U3A。在此等之 中’第一熱系處理單元方框177,係從下方依序將擴展· 冷卻單元(EXT · COL),及用來進行脫水烘烤處理的兩個 脫水烘烤單元(HP)堆起三段而成,其中該擴展•冷卻單元 (EXT · COL)兼備:在上述第一液處理系統處理部1〇4A與 第一熱處理系統處理部105B之間進行基板G之交接時作為 中繼部作用之機能;及基板冷卻機能。第二熱系處理單元 方框178 ’係能下方依次將用來冷卻基板之兩個冷卻單元 本紙張尺度適用中國國家標準(CNS)A4規格⑵Q x 29<7公釐) (請先閱讀背面之注意事項 -^衣_丨卜 再本頁) ------訂---------線37 [227034 A7 B7 V. Description of the invention (36) The description is printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. As described above, the resist coating development processing apparatus 300A of this example includes a large-scale rotating system unit, namely a scrubbing and cleaning unit (SCR) 119, and a resist processing block 130. The liquid processing system units including the agent liquid coating processing unit (ct) and the development processing unit (DEV) 131 are also provided in parallel along the central conveying paths 116 and 12A, and the thermal processing unit (HP (, Pre, pST, COL, AD) are located around the sub-arm mechanisms 113A, 113B on the extension lines of the central transport path 116, 124A, and are configured to be stacked in multiple sections, so it can be obtained as shown in Figure 9 The same effect is obtained in the embodiment. Fig. 16 is a plan view showing another embodiment of the second embodiment of the present invention. In Fig. 16, the same components as in Fig. 9 are denoted by the same reference numerals. The resist coating development processing apparatus 300B of this example includes a loading / unloading unit 103 for loading / unloading (loading and unloading) the LCD substrate G; a first liquid processing system The processing section 104A rotates the substrate G for cleaning processing; the first thermal processing system processing section 105B is mainly used for heating and cooling processing; the second liquid processing system processing section 106B is The substrate G is rotated for resist liquid coating and peripheral resist removal processing, etc., and the third heat treatment system processing department is responsible for the third liquid treatment of the heating and cooling places. The system processing unit is 10%, which rotates the substrate for processing of the "", image processing, and η face (IF) 108. It transfers the substrate G between the substrate and the exposure device paste. , Moving in and out of the department 103 and the second part of the interface (please read the precautions on the back first and then this page) il clothes re-order ----- order --------- line 39 1227034 A7 B7 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs V. Composition of Invention (37) (IF) 108 The system is completely the same as the example in FIG. 9, so its description is omitted. The first liquid processing system processing unit 104A is provided with a first main arm mechanism 115 that receives a substrate from a first sub-arm mechanism 113. One side of the main arm mechanism 115 is provided in parallel along the central transport path 1 丨 6A: for example, a cleaning unit (SCR) i 19 formed by a brush scrubber; and an exciter unit for cleaning organic matter (Excimer) 112. The first heat treatment system processing unit 105 is arranged in series with the first central transportation path 116A (on the extension line of the central transportation path 16). The first heat treatment system processing unit 105B is provided with The second sub-arm mechanism 113A. This second sub-arm mechanism 113A is basically configured in the same manner as that shown in FIG. 9 and has an arm 114 that can hold the substrate G, that is, the arm can be rotated, moved forward and backward, and moved up and down. In this way, the substrate can be transferred to a given position of a processing unit around the later described. Around the second sub-arm mechanism 113A, a first thermal processing unit square 177, a second thermal processing unit block 178, and Box 179 of the third thermal processing unit, which is enclosed from the outside Two-arm mechanism U3A. Among them, the first thermal processing unit block 177 is an extension · cooling unit (EXT · COL) in order from the bottom, and two dehydration bakes for dehydration bake processing. The baking unit (HP) is formed by stacking three sections, and the extension and cooling unit (EXT · COL) has both: substrate G is performed between the first liquid processing system processing unit 104A and the first heat processing system processing unit 105B. The function of acting as a relay part during the handover; and the cooling function of the substrate. The second thermal processing unit block 178 'the two cooling units used to cool the substrate in order below the energy can be used in accordance with Chinese National Standards (CNS) A4 size ⑵Q x 29 < 7 mm) (Please read the precautions on the back-^ 衣 _ 丨 卜 on this page) ------ Order --------- Line

40 1227034 A7 B7 五、發明說明(38 經濟部智慧財產局員工消費合作社印製 (COL)及用來進行疏水化處理之附著處理單元(AD)堆起 二奴而成。第二熱系處理單元方框179,係將兩個擴展· 冷卻單元(EXT · C0L),附著處理單元(AD)堆起三段而成 ’其中該擴展•冷卻單_χτ · c〇L)兼備:在第一熱處 理系統處理部105B與第二液處理系統處理部l〇6B間進行 基板G之交接時作為中繼部作用之機能;及基板冷卻機能 。又,第一熱系處理單元方框177係連接於第一液處理系 統處理部104A之第一中央運送路116A;第三熱系處理單 元方框179即連接於第二液處理系統處理部1〇6B之第二中 央運送路124B。此等第一及第三熱系處理單元方框177、 179,係設置成夾著第二子臂機構U3a而在γ方向互相相 向。 一方面’第二液處理系統處理1〇犯備有第二主臂機 構125 ’其係行走於沿著γ方向延設的第二中央運送路124B 上。此第二主臂機構125係與第一主臂機構115同樣地構成 ’而具基本上與第9圖所示者同樣構成之基座126及臂127 。又,在此第二主臂機構125之一方侧,設有抗蝕劑處理 方框130。 第二熱處理系統處理部107B,係配置成與第二中央 運送路124B串行(在中央運送路24之延長線上)。在此第二 熱處理系統處理部107B,設有第三子臂機構113B。該第 三子臂機構113B,係與第二子臂機構U3A同樣地構成, 並具有可保持基板G之臂114,使此臂114旋迴,進退及上 下移動,藉此可將基板交接於後述周圍之處理單元的給定 請 先- 閱 讀 背- 面 之 注 意 事40 1227034 A7 B7 V. Description of the invention (38 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs (COL) and attached to the processing unit (AD) for hydrophobic treatment. The second thermal processing unit Box 179 is formed by stacking two extension and cooling units (EXT · C0L) and the attachment processing unit (AD) in three stages. 'The extension and cooling unit _ττ · coL) has both: in the first heat treatment The function of the system processing unit 105B and the second liquid processing system processing unit 106B as the relay unit when transferring the substrate G; and the substrate cooling function. The first thermal processing unit block 177 is connected to the first central transport path 116A of the first liquid processing system processing unit 104A; the third thermal processing unit block 179 is connected to the second liquid processing system processing unit 1 〇6B is the second central transport path 124B. These first and third thermal processing unit blocks 177, 179 are arranged to face each other in the γ direction with the second sub-arm mechanism U3a interposed therebetween. On the one hand, the second liquid processing system is equipped with a second main arm mechanism 125 for processing 10 criminals, and it travels on a second central transport path 124B extending along the γ direction. This second main arm mechanism 125 is configured in the same manner as the first main arm mechanism 115, and has a base 126 and an arm 127 having basically the same configuration as that shown in FIG. On one side of the second main arm mechanism 125, a resist processing block 130 is provided. The second heat treatment system processing unit 107B is arranged in series with the second central transport path 124B (on the extension line of the central transport path 24). The second heat treatment system processing unit 107B is provided with a third sub-arm mechanism 113B. The third sub-arm mechanism 113B is configured in the same manner as the second sub-arm mechanism U3A, and has an arm 114 that can hold the substrate G. The arm 114 can be rotated back, forward and backward, and moved up and down, so that the substrate can be transferred to the later described. The surrounding processing unit is given first-read the back-the top notes

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本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 41 1227034This paper size applies to China National Standard (CNS) A4 (210 X 297 mm) 41 1227034

經濟部智慧財產局員工消費合作社印製Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs

裝置。 在第二之子臂機構113B之周圍’設有第四熱系處理 單元方框180,第五熱系處理單元方框181、第六熱系處理 單元方框182 ’及第七熱系理單元方框183,俾從外側成圓 弧狀地包圍第三子臂機構i 13B。第四熱系處理單元方框 180,係從下方依次將擴展•冷卻單元(Εχτ · c〇L),及 用來進行預烘烤處理之兩個預烘烤單元(PRE)堆起三段而 成,其中該擴展•冷卻單元(PRE)兼備:在第二液處理系 統處理部106B與第二熱處理系統處理部丨〇7B之間進行基 板G之交接時作為中繼部作用之機能;及基板冷卻機能。 又,第五熱系處理單元方框181,係將用來進行預烘烤處 理之三個預烘烤單元(PRE)上下堆起三段而成者。第六熱 系處理單元方框182,係將用來進行後烘烤處理之三個後 烘烤單元(POST)上下堆起而成者。第七熱系處理單元方 框1 83 ,係將下方依次將擴展•冷卻單元(Εχτ · c〇L), 及用來進行後烘烤處理的兩個後烘烤單元(p〇ST)上下堆 起二段而成,其中該擴展•冷卻單元(Εχτ · c〇L)*備·· 在第二熱處理系統處理部107B與第三液處理系統處理部 109C間進行基板G之交接時作為中繼部作用之機能;及基 板冷卻機能。又,第四熱系處理單元方框18〇係連接於第 二液處理系統處理部106B之第二中央運送路124B ;第七 ”、、系處理|元183係連接於第三液處王里系統處理部1〇9C之 後述第二中央運送路191 ;此等第四及第七熱系處理單元 方框180、183係配設成夾著第三子臂機構ιΐ3Β互相在γ方 (請先閱讀背面之注意事項再 轉,: ------^---------線Device. A fourth thermal processing unit block 180, a fifth thermal processing unit block 181, a sixth thermal processing unit block 182 ', and a seventh thermal processing unit are provided around the second child arm mechanism 113B. The frame 183 surrounds the third sub-arm mechanism i 13B in an arc shape from the outside. The fourth thermal processing unit block 180 is a stack of three expansion and cooling units (Exτ · c0L) and two pre-baking units (PRE) used for pre-baking in order from below. The expansion and cooling unit (PRE) also has the function of acting as a relay unit when transferring the substrate G between the second liquid processing system processing unit 106B and the second thermal processing system processing unit 07B; and the substrate Cooling function. The fifth thermal processing unit block 181 is formed by stacking three pre-baking units (PRE) for pre-baking processing in three stages. The sixth heat processing unit block 182 is a stack of three post-baking units (POST) used for post-baking processing. The seventh thermal system processing unit, box 1 83, stacks the expansion and cooling unit (Exτ · c0L) and the two post-baking units (p〇ST) for post-baking in order. It consists of two sections, where the expansion / cooling unit (Exτ · c〇L) * prepared ·· acts as a relay when the substrate G is transferred between the second heat treatment system processing unit 107B and the third liquid treatment system processing unit 109C. External function; and substrate cooling function. In addition, the fourth thermal processing unit block 180 is connected to the second central conveyance path 124B of the second liquid processing system processing unit 106B; the seventh "," system processing | yuan 183 series is connected to the third liquid department Wangli The system processing unit 109C will describe the second central transport path 191 later; the fourth and seventh thermal processing unit blocks 180 and 183 are arranged so as to sandwich the third sub-arm mechanism ιΐ3Β on the γ side (please first Read the notes on the back before turning: ------ ^ --------- line

本紙張尺度翻中^巧標準(CNS)A4規格⑵0 X 297公爱了 42 經濟部智慧財產局員工消費合作社印製 1227034 Λ7 ' --------—-— _ 五、發明說明(4l ) 框130與顯像處理單元(DEV)131間之第二熱處理系統處理 部107B,所以可縮短從預烘烤處理經由露光處理到後烘 烤處理之基板運送時間。 又,本發明並不限定於前述實施形態,在不逸離其要 曰之範圍内可做各種變形實施。例如,依照上述實施形態 ,雖例示了將本發明適用於]LCD基板之抗蝕劑顯像處理裝 I 置之實施例,但並不限於此,也可適用於濾色器等其他基 板之塗佈•顯像•顯像處理系統,又也可適用於抗蝕劑塗 佈顯像處理裝置以外之其他基板處理裝置。 又,於上述第一實施形態,也與第二實施形態同樣, 具有將多段地堆起熱處系統單元而成之熱系處理單元方框 ,多數個配置在運送路延長線上之給定剖周圍的構造,所 以可奏呈與第二實施形態同樣之效果。 [發明之效果] 如上所說明,若依本發明,由於設置了對於第一及第 一處理單元群(用來進行各獨立的一連串處理)進行基板之 運送的共同運送手段,所以較之每系統均設置之習知裝置 構成,更可減少運送手段,可使裝置之覆蓋區(f00tprint) 變小。 若依本發明之其他觀點,由於沿著運送路而設置旋轉 系統單元或液處理系統單元,並將熱系處理單元堆起成多 ’又以構成熱系處理單元方框,且將這種熱系處理單元方框 多數個配置在運送路上或其延長線上之給定部分周圍,所 以一面可壓低覆蓋區,一面可使單元數增加。 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再本頁) 訂---------線This paper is a medium-sized standard (CNS) A4 specification ⑵0 X 297 public love 42 printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 1227034 Λ7 '---------------- 4l) The second heat treatment system processing unit 107B between the frame 130 and the development processing unit (DEV) 131 can shorten the substrate transportation time from the pre-baking process through the exposure process to the post-baking process. The present invention is not limited to the foregoing embodiments, and various modifications can be made without departing from the scope of the present invention. For example, according to the above-mentioned embodiment, an example in which the present invention is applied to a resist development processing device for an LCD substrate has been exemplified, but it is not limited to this, and may be applied to coating of other substrates such as color filters. It can also be applied to substrate processing equipment other than resist coating development processing equipment. Also, in the first embodiment described above, similarly to the second embodiment, the heat processing unit block is formed by stacking the heat treatment system units in a plurality of stages, and a plurality of heat treatment unit blocks are arranged around a given section of the transport path extension line. Structure, it can play the same effect as the second embodiment. [Effects of the Invention] As described above, according to the present invention, since a common transporting means for transporting substrates to the first and first processing unit groups (for each independent series of processes) is provided, it is less than each system. The structure of the conventional known devices can reduce the transportation means and make the device's coverage area (f00tprint) smaller. According to another aspect of the present invention, since a rotating system unit or a liquid processing system unit is provided along the conveying path, and the thermal processing unit is stacked in multiples to form a thermal processing unit block, and this heat Most of the processing unit blocks are arranged around a given part of the transportation path or its extension line, so the coverage area can be reduced while the number of units can be increased. This paper size applies to China National Standard (CNS) A4 (210 X 297 mm) (Please read the precautions on the back before this page) Order --------- line

44 1227034 A7 B7 五、發明說明(42 [圖式之簡單說明] 請 先- 閱 讀 背· 面 之 注 意 事 第1圖為平面圖,係顯示本發明第一實施形態之LCD 基板的抗餘劑塗佈顯像處理裝置。 第2圖為一側面圖,係顯示本發明第一實施形態之[CD 基板的抗蝕劑塗佈顯像處理裝置之内部。 第3圖為一方塊圖,係顯示本發明第一實施形態之[CD 基板的抗餘劑塗佈顯像處理裝置中處理台之控制系統。 第4圖為一側面圖,係顯示水平方向運送裝置之概略 構成。 I I 訂 第5圖為一斷面圖’係顯示水平方向運送裝置之概略 構成。 第6圖為一流程圖,係顯示本發明第一實施形態之lcd 基板的抗蝕劑塗佈顯像處理裝置中之選擇性基板搬入動作 例0 第7圖為一流程圖,係顯示本發明第一實施形態之lcd44 1227034 A7 B7 V. Description of the invention (42 [Simplified description of the drawing] Please-Read the back and side notes first. Figure 1 is a plan view showing the anti-residue coating of the LCD substrate of the first embodiment of the present invention. Development processing device. FIG. 2 is a side view showing the inside of the [CD substrate resist coating development processing device of the first embodiment of the present invention. FIG. 3 is a block diagram showing the present invention. The control system of the processing table in the anti-residue coating development processing device for the CD substrate of the first embodiment. Fig. 4 is a side view showing the schematic configuration of the horizontal conveying device. II Order 5 is a The cross-sectional view 'shows a schematic configuration of the horizontal transport device. FIG. 6 is a flowchart showing a selective substrate loading operation in the resist coating development processing device of the LCD substrate according to the first embodiment of the present invention. Example 0 Figure 7 is a flowchart showing the LCD of the first embodiment of the present invention.

基板的抗姓劑塗佈顯像處理裝置的,選擇性基板搬入動作 之其他例。 經濟部智慧財產局員工消費合作社印製 第8圖為一流程圖,係顯示本發明第一實施形態之[CD 基板的抗蝕劑塗佈顯像處理裝置之處理動作例。 第9圖為一平面圖,係顯示本發明第二實施形態之lcD 基板的抗餘劑塗佈顯像處理裝置。 第10圖為一側面圖,係顯示第9圖之抗蝕劑塗佈顯像 處理裝置之一部分。 第11圖為一平面圖,係顯示適用於第9圖之抗蝕劑塗 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公璧) 45 1227034 A7 _B7_五、發明說明(43 ) 佈顯像處理裝置的基板運送裝置。 第12圖為一正面圖,係顯示適用於第9圖之抗蝕劑塗 佈顯像處理裝置的基板運送裝置。 第13圖為一流程圖,係顯示適用了第9圖之抗蝕劑塗 佈顯像處理裝置的處理工程。 第14圖為一流程圖,係顯示第11圖、第12圖中所示之 基板運送裝置的變形例。 第15圖為一平面圖,係顯示本發明第二實施形態之 LCD基板的抗蝕劑塗佈顯像處理裝置之變形例。 第16圖為一平面圖,係顯示本發明第二實施形態之 LCD基板的抗蝕劑塗佈顯像處理裝置之其他變形例。 (請先閱讀背面之注意事項再本頁) -----訂---------線Another example of the selective substrate carrying-in operation in the case where the anti-agent of the substrate is applied to the development processing device. Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs. FIG. 8 is a flowchart showing an example of the processing operation of the [CD substrate resist coating development processing device] according to the first embodiment of the present invention. FIG. 9 is a plan view showing an anti-residue coating development processing device for an lcd substrate according to a second embodiment of the present invention. Fig. 10 is a side view showing a part of the resist coating developing processing apparatus of Fig. 9; Figure 11 is a plan view showing the size of the resist coated paper suitable for Figure 9 and the applicable Chinese National Standard (CNS) A4 specification (210 X 297 cm) 45 1227034 A7 _B7_ V. Description of the invention (43) Substrate transfer device for cloth development processing device. Fig. 12 is a front view showing a substrate transfer apparatus suitable for the resist coating developing processing apparatus of Fig. 9; Fig. 13 is a flowchart showing a processing process to which the resist coating developing apparatus of Fig. 9 is applied. Fig. 14 is a flowchart showing a modified example of the substrate transfer apparatus shown in Figs. 11 and 12; Fig. 15 is a plan view showing a modified example of a resist coating development processing apparatus for an LCD substrate according to a second embodiment of the present invention. FIG. 16 is a plan view showing another modified example of the resist coating development processing apparatus for the LCD substrate according to the second embodiment of the present invention. (Please read the notes on the back before this page) ----- Order --------- Line

經濟部智慧財產局員工消費合作社印製 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 46 1227034 A7 B7 五、發明說明(44) 元件標號對照 1…卡式站 2…處理站 2a…第一處理單元群 2b…第二處理單元群 3…介面站 21a,21b···紫外線照射單 元(UV) 22a,22b,23a,23b···擦洗洗 淨單元(SCR) 24a,24b…抗蝕劑塗佈處 理單元 27a,27b…抗蝕劑處理方框 28a,28b,32,33,34,35 … 處理方框 29a,29b,30a,30b,31a,31b …顯像處理單元 42,44,46,48,50 …運送裝 置(運送手段) 70…控制器(選擇手段) 100,300,300A,300B …抗 蝕劑塗佈顯像處理裝置 104,106,106A,106B,109B, 109C···液處理系統處理部 105,105A,105B,107,107A, 107B,109A…熱處理系統 處理部 113,113A,113B…子臂機構 115,125,190···主臂機構 116,124,191…中央運送 路(運送路) G…LCD基板 請 閱 讀 背-, 之 注 意 事 項Printed by the Employees' Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs, the paper size is applicable to the Chinese National Standard (CNS) A4 (210 X 297 mm) 46 1227034 A7 B7 V. Description of the invention (44) Component label comparison 1 ... Cassette station 2 ... Processing station 2a ... First processing unit group 2b ... Second processing unit group 3 ... Interface stations 21a, 21b ... Ultraviolet irradiation units (UV) 22a, 22b, 23a, 23b ... Scrubbing and washing unit (SCR) 24a , 24b ... resist coating processing units 27a, 27b ... resist processing blocks 28a, 28b, 32, 33, 34, 35 ... processing blocks 29a, 29b, 30a, 30b, 31a, 31b ... development processing Units 42,44,46,48,50… Transportation devices (transportation means) 70… Controllers (selection means) 100,300,300A, 300B… Resist coating development processing devices 104, 106, 106A, 106B, 109B, 109C ··· liquid processing system processing sections 105, 105A, 105B, 107, 107A, 107B, 109A ... heat treatment system processing sections 113, 113A, 113B ... sub-arm mechanisms 115, 125, 190 ... main arms mechanisms 116, 124, 191 ... Central transportation path (transportation path) G ... Please read the back of LCD substrate, Item

頁I I I I 訂 線Page I I I I Order

經濟部智慧財產局員工消費合作社印製 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 47Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs This paper is sized to the Chinese National Standard (CNS) A4 (210 X 297 mm) 47

Claims (1)

1227034 六、申請專利範圍 種基板處理裝置,其係相對基板施^給定處理者 ’包含有: 第處理單疋群,其係備有用來施行由多數工程 所成之—料第—處理的多數個處理單元; 第一處理單70群,其係備有用來施行由多數工程 斤成之_連串第二處理的多數個處理單元;及 共同之運送手段,其係用以進行對於前述第一及 第二處理單元群之各處理單元的基板之運送。 如申叫專利|巳圍第!項所述之基板處理裝置,其中用前 述第一處理單元群及第二處理單元群來施行處理之内 容,係同一。 tj 3·如申請專利範圍第2項所述之基板處理裝置,其中前述 第一及第二處理單元群,係設置成夾著運送手段而對 稱。 4·如申請專利範圍第丨項所述之基板處理裝置,其中用前 述第一處理單元群及第二處理單元群來施行處理之内 心",係互不相同。 5·如申請專利範圍第1項所述之基板處理裝置,其中前述 運送手段備有:向水平方向延伸之水平運送路;及水 平運送機構’其係沿著該水平運送路移動,在與各處 理單元之間交接基板。 6·如申請專利範圍第1項所述之基板處理裝置,其中前述 運送手段備有:向垂直方向延伸之垂直運送路;及垂 直運送機構,其係沿著該垂直運送路移動,在與各處 本紙張尺度適用中國國家標準(CNS)A4規格(21Q χ 297公髮 48 理單元之間交接基板。 1227034 、申請專利範圍 I如申請專利範圍第1項所述之基板處理裝置,其中更備 用Χ載置可收納基板之基板收納容器的收納容器 載置^,及用以進行基板之搬入•搬出的搬入•搬出 部。 I 一種基板處理裝置,其係用以對基板施予給定處理者 ’包含有: 第處理單疋群,其係備有用來施行由多數工程 所成之一連串第一處理的多數個處理單元; 第二處理單元群,其係備有用來施行由多數工程 所成之一連串第二處理的多數個單元; 同之運送手段,其係用以進行對於前述第一及 第二處理單元群之各處理單元的基板之運送;及 選擇手"ί又,其係用以選擇該用第一處理單元群及 第二處理單元群中之那一 ^,來處理_述基板。 9. 如申請專利範圍第8項所述之基板處理裝置,其中用前 述第處理單几群及第二處理單元群來施行處理之内 容,係同一。 10. 如申請專利範圍第9項所述之基板處理裝置,其中前述 選擇手段,係用來檢出前述第一處理單元及第二處理 單7L群中可運送基板之一方,根據此檢出結果來控制 it運送手#又,以便將基板搬入於可運送之處理單元 11 ·如申凊專利範圍第8項所述之基板處理裝置,其中用 (210 X 297 公釐) 意 事 項 頁 群。 前 49 經濟部智慧財產局員工消費合作社印製 1227034 厂 C8 ^ $帛4理單70群及第二處理單元群來施行處理之内 容’係互不相同。 12.如中請專利範圍第η項所述之基本處理裝置,其中前 4選擇手段’係用以判別基板究竟要進行前述第一 I 處理單兀群及第二處理單元群中之那一個處理,並根 «其結來控制前述運送手段,以便將基板搬入於所判 別之處理單元群。 | 如巾π專利範圍第8項所述之基板處理裝置,其中更備 用·用以載置可收納基板之基板收納容器的收納容器 | 載置及用以進行基板之搬入•搬出的搬入•搬出 部。 種基板處理裝置,其係用來對基板施予給定處理者 ’包含有: 第一處理單元群,其係備有用來施行由多數工程 所形之一連串第一處理的多數個處理單元; 第二處理單元群,其係備有用來施行由多數工程 所幵y之連串第一處理的多數個處理單元;及 共同之運送手段,其係用以進行對於前述第一及 第一處理單元群之各處理單元的基板之運送;其中 前述第一及第二處理單元群,分別備有: 水平處理方框,其係水平地配置有多數個處理單 元;及 垂直處理方框,其係將多數個處理單元配置成向 垂直方向堆起來; 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐)1227034 6. Various types of substrate processing devices for patent application, which are applied to a substrate. A given processor 'includes: a first processing unit group, which is prepared to perform a majority of the processing-material first-processed by most projects. 70 processing units; a first processing order of 70 groups, which are provided with a plurality of processing units for performing a series of second processing performed by a majority of projects; and a common transportation means for performing the first processing And the substrates of each processing unit of the second processing unit group. If applied for a patent | The substrate processing apparatus according to the item, wherein the processing contents are performed by the first processing unit group and the second processing unit group, are the same. tj 3. The substrate processing apparatus according to item 2 of the scope of patent application, wherein the first and second processing unit groups are arranged symmetrically with a transport means interposed therebetween. 4. The substrate processing apparatus according to item 丨 of the scope of the patent application, wherein the processing center " is performed by using the first processing unit group and the second processing unit group, which are different from each other. 5. The substrate processing apparatus according to item 1 of the scope of the patent application, wherein the aforementioned transport means includes: a horizontal transport path extending in a horizontal direction; and a horizontal transport mechanism 'which moves along the horizontal transport path, and The substrates are transferred between the processing units. 6. The substrate processing apparatus according to item 1 of the scope of patent application, wherein the aforementioned conveying means includes: a vertical conveying path extending in a vertical direction; and a vertical conveying mechanism that moves along the vertical conveying path, and The paper size applies to the Chinese National Standard (CNS) A4 specification (21Q x 297 Gongfa 48 processing unit transfer substrates. 1227034, patent application scope I as described in the patent application scope of the substrate processing device, which is more spare XY A storage container placement ^ on which a substrate storage container capable of storing a substrate is placed, and a carry-in and carry-out section for carrying in / out of a substrate. I A substrate processing apparatus for applying a given processor to a substrate 'Contains: The first processing unit group is provided with a plurality of processing units for performing a series of first processes formed by a plurality of processes; the second processing unit group is provided for performing a plurality of processes with a plurality of processes. A plurality of units of a series of second processing; and a transportation means for performing processing on each processing unit of the first and second processing unit groups The transportation of the substrate; and the selection hand, which is used to select which one of the first processing unit group and the second processing unit group should be used to process the substrate. 9. If the scope of application for patent No. 8 The substrate processing apparatus described in the above item, wherein the processing contents are performed by using the aforementioned first processing unit group and the second processing unit group. 10. The substrate processing device according to item 9 in the scope of patent application, wherein the aforementioned selection Means are used to detect one of the substrates that can be transported in the first processing unit and the second processing order 7L group, and control the it transporter according to the detection result, so that the substrate can be transported into the transportable processing unit 11 · The substrate processing device as described in item 8 of the application scope of the patent, which uses the (210 X 297 mm) intention page group. Former 49 Printed by the Consumer Property Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 1227034 Factory C8 ^ $ 帛 4 理The contents of the single 70 group and the second processing unit group to perform processing are different from each other. 12. The basic processing device described in item η of the patent scope, in which the first 4 selection means are used to judge The board should perform one of the first I processing unit group and the second processing unit group, and control the aforementioned transportation means according to the knot, so as to move the substrate into the identified processing unit group. The substrate processing apparatus described in Item 8 of the π patent scope is further reserved. A storage container for placing a substrate storage container that can store a substrate | a loading and unloading unit for loading and unloading a substrate. A substrate processing apparatus for applying a given processor to a substrate includes: a first processing unit group provided with a plurality of processing units for performing a series of first processes performed by a plurality of projects; a second A processing unit group is provided with a plurality of processing units for performing a series of first processing performed by a majority of projects; and a common transportation means is used for performing the processing on the first and first processing unit groups. The substrates of each processing unit are transported; the first and second processing unit groups are provided with: a horizontal processing box, which is configured with a plurality of processes horizontally Element; vertical processing block and which system the processing unit is configured a plurality of piled up in a vertical direction; suitable for the present scale paper China National Standard (CNS) A4 size (210 X 297 mm) :丨丨:-----------訂-------- (請先閱讀背面之注意事項再本頁) 辞 線 50 1227034: 丨 丨 : ----------- Order -------- (Please read the precautions on the back before this page) Line 50 1227034 經濟部智慧財產局員工消費合作社印製Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 剷述運送手段,備有: 水平方向運送裝置,其係水平方向可移動地設置 著,以便對於前述水平處理方框進行基板之交接; 垂直方向運送裝置,其係向垂直方向可移動地設 置著,以便對於前述垂直處理方框進行基板之交接。 15.如申請專利範圍第14項所述之基板處理裝置,其中: 前述水平處理方框,具有將液處理施予基板之多 數個液處理單元;前述垂直處理方框,具有將熱處理 施予基板之多數個熱處理單元。 16·如申請專利範圍第14項所述之基板處理裝置,其中: 前述水平處理方框係設置多數個,供對應於此等 水平方向運送裝置移動之運送路係配置成直線狀。 17. 如申請專利範圍第14項所述之基板處理裝置,其係對 於基板進行抗蝕劑塗佈及露光後之顯像的基板處理裝 置者;其中前述水平處理方框具有:對於基板塗佈抗 触劑之抗蝕劑塗佈處理單元;及/或用來進行顯像處理 之顯像處理單元。 18. 如申請專利範圍第17項所述之基板處理裝置,其中, 前述水平處理方框更具有用來洗淨基板之洗淨處理單 元。 19. 如申請專利範圍第17項或第18項所述之基板處理裝置 ,其中更具有介面部,其係在塗佈抗蝕劑於基板後在 與用來施行露光處理之露光裝置間交接基板。 20·如申請專利範圍第14項所述之基板處理裝置,其中更 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 訂---------線 (請先閱讀背面之注意事項再^本頁) y 辞 經濟部智慧財產局員工消費合作社印製 1227034 /、申Μ專利範圍 具有·用以載置可收納基板之基板收納容器的收納容 器载置部;及用以進行基板之搬入·搬出的搬入·搬 出部。 21·種基板處理方法,其係藉基板處理裝置對於基板施 行給定處理之方法者,就是: 對於各基板,選擇該用第一處理單元群及第二處 理單元群之那一個來處理,各基板即用其所選擇的一 方之處理單元群來處理; 前述基板處理裝置,包含有: 第一處理單元群,其係備有用來施行由多數工程 所成一連串第一處理的多數個處理單元; 第二處理單元群,其係備有用來施行由多數工程 所成一連串第二處理的多數個處理單元;及 共同之運送手段,其係用以進行對於前述第一及 第二處理單元群的基板之運送。 22. —種基板處理裝置,其係將塗佈液塗佈於基板以形成 薄膜’同時將與電路圖案對應地露光之前述薄膜予以 顯像之處理裝置者,包含有: 多數個旋轉系統單元,其係使基板旋轉以用來處 理; 多數個熱處理系統單元,其係在不使基板旋轉下 予以加熱•冷卻處理; 運送裝置,其係用以運送基板,將之搬出•搬入 於前述各單元;及 ^紙張尺度適用家標準(CNS)A4規格(210 X 297公釐) 52 ---^-----訂---------線 (請先閱讀背面之注意事項再9本頁) 太The conveying means includes: a horizontal conveying device which is movably installed in the horizontal direction so as to transfer the substrates to the horizontal processing frame; a vertical conveying device which is movably installed in the vertical direction. In order to transfer the substrate to the aforementioned vertical processing block. 15. The substrate processing apparatus according to item 14 of the scope of patent application, wherein: the horizontal processing block has a plurality of liquid processing units for applying liquid processing to the substrate; and the vertical processing block has a thermal processing for applying the substrate. Most heat treatment units. 16. The substrate processing apparatus according to item 14 of the scope of application for a patent, wherein: the horizontal processing box is provided in a plurality, and the transportation path corresponding to the horizontal direction transportation device is arranged in a straight line. 17. The substrate processing apparatus according to item 14 of the scope of application for a patent, which is a substrate processing apparatus that performs resist coating on a substrate and develops an image after exposure; wherein the horizontal processing box has: A resist coating processing unit for an anti-corrosive agent; and / or a developing processing unit for developing processing. 18. The substrate processing apparatus according to item 17 of the scope of patent application, wherein the horizontal processing block further includes a cleaning processing unit for cleaning the substrate. 19. The substrate processing apparatus according to item 17 or 18 of the scope of application for a patent, which further has a mesial portion, which is a substrate that is transferred between the substrate and the exposure apparatus for performing exposure treatment after the resist is applied to the substrate. . 20 · The substrate processing device as described in item 14 of the scope of patent application, wherein the paper size is applicable to the Chinese National Standard (CNS) A4 specification (210 X 297 mm). Order --------- line (please Read the precautions on the back before ^ this page) y Printed 1227034 / printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs, the scope of the patent application has a storage container placement section for placing substrate storage containers that can store substrates; And a loading / unloading unit for loading / unloading the substrate. 21 · A substrate processing method, which is a method for performing a given processing on a substrate by a substrate processing device, is: for each substrate, select which one of the first processing unit group and the second processing unit group should be used for processing, each The substrate is processed by the processing unit group selected by the one; the substrate processing device includes: a first processing unit group equipped with a plurality of processing units for performing a series of first processing by a plurality of projects; The second processing unit group is provided with a plurality of processing units for performing a series of second processing by a plurality of processes; and a common transportation means is used for carrying out the substrates for the first and second processing unit groups. Its shipping. 22. A substrate processing device, which is a processing device that applies a coating liquid to a substrate to form a thin film, and simultaneously develops the aforementioned thin film exposed in correspondence with a circuit pattern, including: a plurality of rotating system units, It is used to rotate the substrate for processing; many heat treatment system units are heated and cooled without rotating the substrate; and a transport device is used to transport the substrate and carry it out and into the aforementioned units; And ^ paper size applies the home standard (CNS) A4 specification (210 X 297 mm) 52 --- ^ ----- order --------- line (please read the precautions on the back before 9 (This page) too 1227034 六 申清專利範圍 中 運送路,其係形成前述前述裝置之移動徑路; 其 經 濟 部 智 慧 財 產 局 員 工 消 費 合 作 社 印 製 前述旋轉系統單元,係沿著前述運送路而並行地 設置著;前述熱處理系統單元係堆起成多段以構成熱 系處理單元方框;前述熱系處理單元方框,係多數配 置在前述運送路上或其延長線上之給定部分的周圍。 •如申%專利範圍第22項所述之基板處理裝置,其中·· 包含有由旋轉系統單元所成之旋轉系統處理部,及由 熱處理系統單元所成之熱處理系統處理部;前述旋轉 系統處理部及前述熱處理系統處理部,係透過運送路 串行地連接起來,藉此互相被區分。 24. 如申请專利範圍第22項所述之基板處理裝置,其中 前述旋轉系統單元至少包含有:薄膜形成單元, 其係將塗佈液塗佈於基板以形成薄膜;及顯像處理單 疋,其係用以顯像跟電路圖案露光之前述薄膜;又 前述熱處理系統單元,包含有多數個烘烤處理 ^其係於顯像處理之前及後對於基板進行供烤處 25. 如申請專利範圍第24項所述之基板處理裝置,其中前 述多數個烘烤處理單元,係集中地設在前述薄膜形成 單元與前述顯像處理單元之間。 26·如申請專利範圍第22項所述之基板處理裝置,其中 前述旋轉系統單元,至少包含有:洗淨處理裝置 ’其係用以進行基板之洗淨處理;薄膜形成單元,其 意 養 單 理1227034 The transportation path in the scope of the six claims of the Shenshen patent, which forms the movement path of the aforementioned device; the consumer cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs printed the aforementioned rotating system unit, which is arranged in parallel along the aforementioned transportation path; The heat treatment system units are stacked into a plurality of sections to form a heat treatment unit block; the heat treatment unit blocks are mostly arranged around a given part of the transportation path or an extension line thereof. • The substrate processing device as described in Item 22 of the patent scope, which includes a rotating system processing section formed by a rotating system unit and a thermal processing system processing section formed by a thermal processing system unit; the aforementioned rotating system processing The heat treatment system and the heat treatment system treatment unit are connected in series through a transportation path, thereby being distinguished from each other. 24. The substrate processing apparatus according to item 22 of the scope of the patent application, wherein the aforementioned rotation system unit includes at least: a thin film forming unit that applies a coating liquid to the substrate to form a thin film; and a development processing unit, It is used to develop the aforementioned thin film with the circuit pattern exposed; and the aforementioned heat treatment system unit includes a plurality of baking treatments ^ which are used for baking the substrate before and after the development processing 25. The substrate processing apparatus according to item 24, wherein the plurality of baking processing units are collectively provided between the thin film forming unit and the developing processing unit. 26. The substrate processing device according to item 22 of the scope of the patent application, wherein the aforementioned rotation system unit includes at least: a cleaning processing device 'which is used for cleaning the substrate; a thin film forming unit, which is intended to support Reason 丨X 297公釐) 53 ^227034 經濟部智慧財產局員工消費合作社印製丨 X 297 mm) 53 ^ 227034 Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs (請先閱讀背面之;^意事項再_本頁) * / n I §8S A' _請專利翻 ^ — 係將塗佈液㈣於基板以形成薄膜;及顯像處理單元 ,其係用以顯像同電路圖案對應地露光之前述薄膜· 前述熱處理系統單元,至少包含有··多數個供烤 處理單元,其係於洗淨處理後及顯像處理之前及後分 別對於基板進行烘烤處理;冷卻處理單元,其係對Z 基板進行冷卻處理;及附著單元,其係對於基板進行 附著處理。 27·如申請專利範圍第22項所述之基板處理裝置,其中前 述紅轉糸統早元只設在運送路之^_側。 28_如申凊專利範圍第22項所述之基板處理裝置,其中在 前述給定部分配置有子臂機構,其係用以對於前述多 數個熱系處理單元方框之各單元進行基板之取出和放 入0 29.—種基板處理裝置,其係將塗佈液塗佈於基板以形成 薄膜’同時,將與電路圖案對應地露光之前述薄膜予 以顯像之基板處理裝置者,包含有: 多數個液處理系統單元,其係將給定液供給基板 上以進行處理; 多數個熱處理系統單元,其係對於基板進行熱處 理; 運送裝置,其係用以運送基板,將之搬出•搬入 於前述各單元;及 運送路,其係形成前述裝置之移動徑路;其中: 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱) 訂 線(Please read the back; ^ Matters before _ this page) * / n I §8S A '_Please turn the patent ^ — the coating liquid is applied to the substrate to form a thin film; and the development processing unit, which is used for The aforementioned film exposed in correspondence with the circuit pattern of the development image · The aforementioned heat treatment system unit includes at least a plurality of baking processing units, which are respectively baked after the cleaning process and before and after the development process Processing; cooling processing unit, which performs cooling processing on the Z substrate; and attachment unit, which performs adhesion processing on the substrate. 27. The substrate processing apparatus according to item 22 of the scope of application for a patent, wherein the above-mentioned red transfer system is only provided on the side of the transportation path. 28_ The substrate processing apparatus according to item 22 of the scope of Shenying's patent, wherein the given part is provided with a sub-arm mechanism, which is used to take out the substrate for each unit of the aforementioned plurality of thermal processing unit blocks And 29. A substrate processing apparatus, which is a substrate processing apparatus that applies a coating liquid to a substrate to form a thin film, and simultaneously develops the aforementioned thin film exposed in correspondence with a circuit pattern, including: Most of the liquid processing system units supply a given liquid to the substrate for processing; most of the heat treatment system units perform heat treatment of the substrate; and the transport device is used to transport the substrate and carry it out and into the aforementioned area. Each unit; and a conveying path, which forms the moving path of the aforementioned device; of which: this paper size applies to China National Standard (CNS) A4 (210 X 297 public love) 54 1227034 A8 B8 C8 D8 六、申請專利範圍 經濟部智慧財產局員工消費合作社印製 月,J述液處理系統單元係沿著前述運送路而並行地 設置著;前述熱處理系統單元係堆起成多段以構成熱 系處=單元方框;前述熱系處理單元方框,係多數配 置在剛述運送路上或其延長線上之給定部分的周圍。 30·如申明專利範圍第29項所述之基板處理裝置,其中在 前述給定部分配置有子臂機構,其係用對於前述多數 個熱系處理單元方框之各單元進行基板之取出和放入 〇 31·-種基板處理裝置’其係對於基板施行含多數之液處 理及附隨於該液處理之熱處理在内之一連串處理的基 板處理裝置者,包含有: 多數個液處理系統單元 理; 多數個熱處理系統單元 於前述多數液處理之熱處理 運送裝置,其係用以運送基板,將之搬出•搬入 於前述各單元;及 運送路,其係形成前述裝置之移動徑路;其中: 前述液處理系統單元,係沿著前述運送路而並行 地設置著;前述熱處理系統單元,係堆起成多段以構 成熱系處理單元方框;前述熱系處理單元方框,係多 數配置在則述運送路上或其延長線上之給定部分的周 圍。 32·—種基板處理裝置,其係對於被處理基板施行由包 其係對於基板進行液處 其係對於基板進行附隨 (請先閱讀背面之注意事項再1^|本頁) l 訂---------線 辞 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 55 經濟部智慧財產局員工消費合作社印製 1227034 __ C8 六、申請專利範圍 《處理及熱處理在内之多數工程所成的處理之基板處 I 理襞置者,包含有: ^第一處理部,其係配置有沿著一向水平延伸之水 平運送路,而對被處理基板施行液處理之多數個液處 I 糸先處理單元,並藉由移動於前述水平運送路之第 一運送裝置,對於沿著前述水平運送而設的各處理單 元進行被處理基板之運送;及 第二處理部,其係配置有沿著一向垂直延伸之垂 | 運4路而向上下方向對被處理基板施行熱處理之 多數個熱處理單元,並藉由移動於前述垂直運送路之 第一運送裝置,對於沿著前述垂直運送路而設的各處 理單元進行被處理基板之運送。54 1227034 A8 B8 C8 D8 VI. Patent Application Scope Printed by the Intellectual Property Bureau Employee Consumer Cooperative of the Ministry of Economic Affairs, printed month, J liquid processing system units are installed in parallel along the aforementioned transport path; the aforementioned heat treatment system units are stacked into multiple sections The thermal system unit = unit box is formed; most of the thermal system processing unit boxes are arranged around a given part of the transportation path just described or on its extension line. 30. The substrate processing apparatus according to item 29 of the declared patent scope, wherein a sub-arm mechanism is arranged in the given portion, and the substrate is taken out and placed by each unit of the aforementioned plurality of thermal processing unit blocks. 〇31 · -A kind of substrate processing device is a substrate processing device that performs a series of processing on the substrate including a large number of liquid processing and heat treatment accompanying the liquid processing, including: a plurality of liquid processing system unit management The heat treatment transport device of the plurality of heat treatment system units in the aforementioned majority of liquid treatment is used to transport the substrate and carry it out and into the aforementioned units; and the transport path is to form the movement path of the aforementioned device; of which: The liquid processing system units are installed in parallel along the transportation path; the heat treatment system units are stacked into multiple sections to form a thermal processing unit block; most of the thermal processing unit blocks are arranged in the description Around a given part of a transport road or its extension. 32 · —A kind of substrate processing device, which executes the liquid treatment of the substrate for the substrate to be processed, and it accompanies the substrate (please read the precautions on the back first, then 1 ^ | this page) l Order- ------- The line size of the paper is applicable to the Chinese National Standard (CNS) A4 (210 X 297 mm) 55 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 1227034 __ C8 VI. Scope of Patent Application Those who process substrates processed by most processes, including heat treatment, include: ^ The first processing section is configured with a horizontal transport path extending horizontally along one direction, and performs liquid processing on the substrate to be processed Most of the liquid processing units include a first processing unit, and a substrate to be processed for each processing unit provided along the horizontal transportation by the first transportation device moved on the horizontal transportation path; and a second processing unit. , Which is provided with a plurality of heat treatment units that perform heat treatment on the substrate to be processed in the up and down directions along a vertical extending vertical transport | transport 4 path, and is moved by the aforementioned vertical transport path The first conveying device conveys the substrate to be processed to each processing unit provided along the vertical conveying path. ^-----訂---------線 (請先閲讀背面之注意事項再本頁)^ ----- Order --------- Line (Please read the precautions on the back before this page) 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 56This paper size applies to China National Standard (CNS) A4 (210 X 297 mm) 56
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