TWI224731B - Method and device for manufacturing display device - Google Patents

Method and device for manufacturing display device Download PDF

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Publication number
TWI224731B
TWI224731B TW091136828A TW91136828A TWI224731B TW I224731 B TWI224731 B TW I224731B TW 091136828 A TW091136828 A TW 091136828A TW 91136828 A TW91136828 A TW 91136828A TW I224731 B TWI224731 B TW I224731B
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data
display device
manufacturing
aforementioned
test data
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TW091136828A
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TW200307869A (en
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Tomio Makino
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Toshiba Corp
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    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306Details
    • G02F1/1309Repairing; Testing
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00Programme-control systems
    • G05B19/02Programme-control systems electric
    • G05B19/04Programme control other than numerical control, i.e. in sequence controllers or logic controllers
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F2202/00Materials and properties
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F2203/00Function characteristic
    • G02F2203/69Arrangements or methods for testing or calibrating a device

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Mathematical Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Liquid Crystal (AREA)
  • Controls And Circuits For Display Device (AREA)
  • Liquid Crystal Display Device Control (AREA)

Abstract

The present invention is a method to write E-EDID information into the ROM 18 of the liquid crystal display device 12, and provides a method to proceed the writing operation steps continuously after the image check is completed using the same device. The present invention comprises: a test data selection step to select the image test data for proceeding the image check of the liquid crystal display device 12; a reading step of manufacturing serial number to read the manufacturing serial number; an E-EDID information writing step to find the specified manufacturing data in the E-EDID information of the corresponding image test data from the image checking device, and write the found specified manufacturing data, the read manufacturing serial number, and the current manufacturing year/week counted by the timer into ROM 18 as the E-EDID information; and an image checking step to proceed the image check by the selected image test data.

Description

12247311224731

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玖、發明說明 (發明說明應敘明:發明所屬之技術領域、先前技術、内容、實施方式及圖式簡單說明) 發明所屬之技術領域 本發明是關於液晶顯示裝置,有機EL顯示裝置,CRT等 顯示裝置之E-EDID資訊寫入的製造方法。 先前技術 存在推進圖像關聯技術的標準化和進行畫報畫刊標準 的制定和支援的電子圖像規格制定委員會(Video Electronics Standards Association; VESA) 〇 該VESA在2000年2月1日重新明確關於電腦顯示器的四 種標準規格。 第一種標準規格為增強延伸識別資料(Enhanced Extended Identification Date (E-EDID))。該 E-EDID 是規定顯示器的功能 和ID等為傳輸給主電腦的資料格式,資料由1 2 8個位元組 組成。 第二種標準規格為增強顯示器資料通道(Enhanced Display Date Channel (E-DDC))。該 E-DDC 是規定顯示器和主 電腦之間的通信通道規格及資料的互相傳送的規定。因此 組態的設定和控制都是使用該通道進行,是為了能處理大 的資料量而擴充已有的DDC。 第三種標準規格為VESA —般化時序公式(VESA Generalized Timing Formula (GTF))。該 GTF 是決定關於形成顯 示器時序方式的標準,固定顯示器的更新率,不再需要預 先設定的標準。 第四種標準規格為視頻信號標準(Video Signal Standard O:\82\82616-920721. DOC\5\WCK -5- 1224731说明 Description of the invention (The description of the invention should state: the technical field to which the invention belongs, the prior art, the content, the embodiments, and the drawings are briefly explained) The technical field to which the invention belongs The invention relates to liquid crystal display devices, organic EL display devices, CRTs Manufacturing method for writing E-EDID information of display device. The prior art includes the Video Electronics Standards Association (VESA), which promotes the standardization of image-related technology and the development and support of standards for graphic magazines. The VESA re-clarified computer monitors on February 1, 2000. Of four standard specifications. The first standard specification is Enhanced Extended Identification Date (E-EDID). The E-EDID is a data format that specifies the functions of the display and the ID to be transmitted to the host computer. The data consists of 128 bytes. The second standard specification is the Enhanced Display Date Channel (E-DDC). This E-DDC is a regulation that specifies the specifications of the communication channel between the monitor and the host computer and the mutual transmission of data. Therefore, the setting and control of the configuration are carried out using this channel, which is to expand the existing DDC in order to handle a large amount of data. The third standard specification is VESA-Generalized Timing Formula (GTF). The GTF is a standard that determines the timing of the display. It fixes the update rate of the display and no longer requires a preset standard. The fourth standard specification is the video signal standard (Video Signal Standard O: \ 82 \ 82616-920721. DOC \ 5 \ WCK -5- 1224731

(2) (VSIS)),該VSIS是把類比視頻信號樣準化之標準,對應顯 示器和圖表卡之發展的標準。 [發明所欲解決之問題] 最近,出現了把上述說明過的E-EDID資訊寫入液晶顯示 裝置後銷售的廠商。這是因為寫入該E-EDID資訊後可以判 別該液晶顯示裝置的履歷。 因此,為了讓液晶顯示裝置能記憶該E-EDID資訊,在液 晶顯示裝置-的驅動電路設置了 ROM 1C。 : 使之記憶的方法為,對已完成並且圖像檢查合格的液晶 顯示裝置寫入該E-EDID資訊。 但是同時,為了寫入該E-EDID資訊需要重新連接到寫入 裝置上,並且還需要增加重新輸入該液晶顯示裝置種類等 資料的步驟,因而有需要增加作業步驟的缺點。 發明内容 因此,本發明是鑒於上述之缺點,在顯示裝置中寫入製 造履歷資料時並不需要增加作業步驟,而是提供可以寫入 的顯示裝置的製造方法。 [解決問題之手段] 申請項1的發明是關於在液晶顯示裝置,有機EL顯示裝 置,C RT等的顯示裝置中設置的記錄媒體中能夠寫入包括 製造編號、製造年週以及顯示裝置的規格資料的製造履歷 資料的顯示裝置的製造方法,其特徵為具有:測試資料選 擇步驟,其係為進行前述顯示裝置的圖像檢查,選擇被記 憶在圖像檢查裝置中適用前述顯示裝置的圖像測試資 O:\82\82616-920721 DOC\6\WCK -6- 1224731(2) (VSIS)). This VSIS is a standard for standardizing analog video signals and corresponds to the standards for the development of displays and graphics cards. [Problems to be Solved by the Invention] Recently, there have been manufacturers who sell the E-EDID information described above in a liquid crystal display device. This is because the history of the liquid crystal display device can be discriminated after the E-EDID information is written. Therefore, in order for the liquid crystal display device to memorize the E-EDID information, a ROM 1C is provided in the driving circuit of the liquid crystal display device. : The method of making it memorize is to write the E-EDID information to the liquid crystal display device which has completed and passed the image inspection. However, at the same time, in order to write the E-EDID information, it is necessary to reconnect to the writing device, and it is necessary to add a step of re-entering information such as the type of the liquid crystal display device. Therefore, there is a disadvantage that it requires an increase in operation steps. In view of the above-mentioned disadvantages, the present invention does not need to increase the number of work steps when writing manufacturing history data into a display device, but provides a method for manufacturing a display device that can be written. [Means for Solving the Problem] The invention of claim 1 relates to a specification in which a recording medium provided in a display device such as a liquid crystal display device, an organic EL display device, or a CRT can include a manufacturing number, a manufacturing year, and a specification of the display device. Manufacturing method of display material The manufacturing method of the display device of the history data includes a test data selection step for performing an image inspection of the display device, and selecting an image to be stored in the image inspection device to which the display device is applied. Test fund O: \ 82 \ 82616-920721 DOC \ 6 \ WCK -6- 1224731

(3)(3)

料;製造編號讀取步驟,其係讀取前述顯示裝置的製造編 號;製造履歷資料寫入步驟,其係把有關前述選擇的圖像 測試資料對應的顯示裝置的製造履歷資料中,由前述圖像 檢查裝置讀取前述規格資料,該讀取的規格資料、前述讀 取的製造編號和前述圖像檢查裝置的計時器所計測的現 在製造年週作為製造履歷資料寫入前述記錄媒體;圖像檢 查步驟,其係藉由前述選擇的圖像測試資料由前述圖像檢 查裝置而進行前述顯示裝置的圖像檢查。 : 如申請項1之顯示裝置的製造方法,申請項2的發明是若 前述對應選擇的圖像測試資料的顯示裝置的種類為製造 履歷資料可寫入的種類時則進行前述讀取步驟;若為製造 履歷資料不可寫入的種類時則進行前述圖像檢查步驟。 如申請項1之顯示裝置的製造方法,申請項3的發明是製 造履歷資料讀取步驟,其係當製造履歷資料已經被寫入前 述記錄媒體中時則讀取前述記錄媒體中記錄的製造履歷 資料;判別步驟,其係判別前述讀取的製造履歷資料是否 正常;當前述製造履歷資料正常時把前述圖像檢查裝置計 測的現在之製造年週保存至前述讀取的製造履歷資料中 進行前述圖像檢查步驟,及當前述製造履歷資料為異常時 則進行前述製造履歷資料寫入步驟。 申請項4的發明是有關顯示裝置的製造裝置,其特徵為 具有:第一記憶部,其係對應每一種顯示裝置具有多個圖 像測試資料以及保存前述多個圖像測試資料各自對應的 前述顯示規格(大小)資料;記憶前述製造編號之第二記憶Step of reading the manufacturing number, which reads the manufacturing number of the aforementioned display device; writing step of manufacturing history information, which includes the manufacturing history information of the display device corresponding to the aforementioned selected image test data, from the aforementioned figure The inspection specification device reads the aforementioned specification data, the read specification data, the previously read manufacturing number, and the current manufacturing year and week measured by the timer of the image inspection device are written into the recording medium as manufacturing history data; image The inspection step is to perform an image inspection of the display device by the image inspection device through the selected image test data. : As in the method for manufacturing the display device of claim 1, the invention of claim 2 is to perform the aforementioned reading step if the type of the display device corresponding to the selected image test data is a type that can be written by the manufacturing history data; if When the manufacturing history data is a type that cannot be written, the aforementioned image inspection step is performed. For example, the manufacturing method of the display device of claim 1, and the invention of claim 3 is a step of reading manufacturing history data, which reads the manufacturing history recorded in the aforementioned recording medium when the manufacturing history data has been written in the aforementioned recording medium. The judgment step is to judge whether the previously read manufacturing history data is normal; when the aforementioned manufacturing history data is normal, save the current manufacturing year and week measured by the image inspection device to the previously read manufacturing history data and perform the foregoing The image checking step, and the manufacturing history data writing step is performed when the manufacturing history data is abnormal. The invention of claim 4 relates to a manufacturing device for a display device, and is characterized in that it has a first memory section, which has a plurality of image test data corresponding to each display device, and stores the foregoing corresponding to the plurality of image test data. Display specifications (size) data; second memory to remember the aforementioned manufacturing number

O:\82\82616-92072l D0C\6\WCIC 1224731 (4)O: \ 82 \ 82616-92072l D0C \ 6 \ WCIC 1224731 (4)

部;計測年週資料之計時器;連接於前述顯示裝置之介面 部;及控制部,其係將存儲在前述第一記憶部及第二記憶 部之各資料及前述年週資料送入前述介面。 本發明是關於製造履歷資料的寫入和圖像檢查使用相 同的圖像檢查裝置能進行連續的處理的方法,可以使生產 率飛躍性的提高。 本發明中製造履歷資料包含顯示裝置的製造編號資 料、製造毛週資料以及識別該顯示裝置種類的規格資料i。; 製造編號資料是在本發明之製造步騾之前預先以條碼標 貼等形式賦予顯示裝置的序列號碼。但是除此方法外也可 以採用在顯示裝置的ROM-IC中儲存序列號碼的方法。 製造年週資料由西元製造年資料和製造週資料(1〜5 3 週,閏年為5 4週)組成,本發明在進行製造履歷資料寫入 步驟時在顯示裝置的記錄媒體中寫入檢查裝置計時器計 測的年週資料。 關於規格資料是顯示裝置畫面的長寬尺寸資料,各種推 薦時序(水平顯示期間,水平空白期間,垂直顯示期間, 垂直空白期間等)的資料等,在各種規格資料中由可以識 別該顯示裝置種類(顯示裝置廠商用來管理顯示裝置的型 號)的資料組合構成。該規格資料的組合雖然根據用戶的 需要可以改變,但通常以E-EDID標準等已規格化的機種編 碼為標準。並且如前所述該E-EDID標準一般都可獲得。 另外圖像測試資料由驅動顯示裝置的各種時序信號和 圖像資料等構成,畫面的尺寸及動作時序及不同驅動電壓 O:\82\82616-920721. DOC\6\ WCK. -8- 1224731A timer for measuring year-of-week data; an interface section connected to the aforementioned display device; and a control section which sends each of the data stored in the first and second memory sections and the year-of-week data to the aforementioned interface . The present invention relates to a method for writing continuous manufacturing history data and performing image inspection by using the same image inspection device to enable continuous processing, which can greatly improve productivity. The manufacturing history data in the present invention includes the manufacturing serial number data of the display device, the manufacturing hair week data, and the specification data i identifying the type of the display device. The manufacturing number data is a serial number given to the display device in the form of a bar code label or the like before the manufacturing steps of the present invention. However, in addition to this method, a method of storing the serial number in the ROM-IC of the display device may be adopted. The manufacturing year and week data is composed of the manufacturing year data and the manufacturing week data (1 to 53 weeks, and the leap year is 54 weeks). The present invention writes an inspection device into the recording medium of the display device when the manufacturing history data writing step is performed. Year and week data measured by a timer. The specification data is the data of the length and width of the display device screen, and various recommended timings (horizontal display period, horizontal blank period, vertical display period, vertical blank period, etc.), etc. Among the various specifications, the type of display device can be identified (The display device manufacturer manages the model of the display device). Although the combination of the specifications can be changed according to the needs of the user, it is usually based on the standardized model codes such as the E-EDID standard. And as mentioned earlier, the E-EDID standard is generally available. In addition, the image test data is composed of various timing signals and image data driving the display device, the size and timing of the screen and different driving voltages O: \ 82 \ 82616-920721. DOC \ 6 \ WCK. -8- 1224731

種類妁各自對應的多個種類的測試資料則儲存在檢查裝 置内置硬碟等驅動器的第一記憶部中。檢查裝置的操作人 員以貼附在顯示裝置上的標貼等確認檢查對象的顯示裝 置的種類(型號),從檢查裝置顯示器上顯示的測試資料的 檔案名(以與型號相同形式的檔案名顯示)中選擇與檢查 對象的型號相同的檔案名。 選擇該測試資料的檔案名後,在同一檢查裝置内置硬碟 驅動器等的儲存在第一記憶部的規格資料中,設置了可自 動選擇與該被選擇的測試資料檔案名相同檔案名(即是與 檢查對象的顯示裝置型號一致的檔案名)的規格資料的程 式。該被選擇的規格資料是在製造履歷寫入步驟中,已經 輸入由檢查裝置内置的RAM (隨機存取記憶體)等記憶裝 置構成的第二記憶部之製造編號資料以及計時器計測的 年周資料組合後送到介面部後,送進顯示裝置的記憶媒 體。另外,測試資料與規格資料亦可分別儲存於檢查裝置 内置之個別的硬碟裝置内。 然後在圖像檢查步驟中,藉由被選擇的測試資料驅動顯 示裝置,它的點亮狀態用目視或者照相機觀察以檢查是否 存在顯示上的缺陷。測試資料中包含的圖像資料對應檢查 中用的圖像圖案(全部點亮,部分點亮顯示等)的種類和顯 示順序等可以為任意的圖像資料。而且構成檢查裝置系統 的各個硬體自身(控制裝置,記憶裝置,介面部)可以使用 各個廠商都熟知的硬體構成,在不超出本發明主旨的範圍 内可以採各種各樣的構成。 O:\82\82616-920721. DOC\6\WCK -9 - 1224731 ⑹The test data corresponding to a variety of types: each type is stored in the first memory of a drive such as a built-in hard disk of the inspection device. The operator of the inspection device confirms the type (model) of the display device to be inspected, such as a sticker attached to the display device, and the file name of the test data displayed on the display of the inspection device (displayed in the same form as the model name) ) Select the same file name as the model to be checked. After selecting the file name of the test data, in the specification data stored in the first memory section of the same inspection device with a built-in hard disk drive, etc., it is set to automatically select the same file name as the selected test data file name (that is, Program file name file that matches the display device model to be checked). In the manufacturing history writing step, the selected specification data has been inputted with the manufacturing number data of the second memory unit composed of a memory device such as a RAM (random access memory) built in the inspection device and the year and week measured by the timer. After the data is combined, it is sent to the interface, and then sent to the storage medium of the display device. In addition, test data and specification data can also be stored in separate hard disk devices built into the inspection device. Then, in the image inspection step, the display device is driven by the selected test data, and its lighting state is observed visually or by a camera to check whether there are defects in the display. The image data included in the test data corresponds to the type and display order of the image patterns (all lit, partially lit, etc.) used in the inspection and can be any image data. In addition, each piece of hardware (control device, memory device, interface) that constitutes the inspection device system can use a hardware configuration that is well-known by various manufacturers, and can adopt various configurations without departing from the scope of the present invention. O: \ 82 \ 82616-920721. DOC \ 6 \ WCK -9-1224731 ⑹

實施方式 下面對本發明實施例之一的關於用圖像檢查裝置1 〇進 行液晶顯示裝置1 2的圖像檢查及製造履歷資料寫入的步 驟,參照圖1到圖5進行說明。另外在本實施例中,是參照 E-EDID規格構成製造履歷資料。 (1) 液晶顯示裝置1 2的構成 圖1是顯示圖像檢查裝置1 0及液晶顯示裝置1 2關係之區 塊圖。 一 - 本實施例中,檢查對象的顯示裝置12是由熟知的TFT液 晶模組構成。即如圖1所示,在含有TFT陣列的2枚玻璃基 板中間封入液晶所製成的液晶單元1 3的背面設置的驅動 電路基板14中,搭載了圖中沒有顯示的向藉由驅動TFT陣 列的掃描線驅動電路及信號源驅動電路構成的周邊驅動 電路IC中分配由外部輸入的圖像資料和其他時脈信號等 的控制信號的控制器1C,而且還搭載了為記憶E-EDID資訊 的ROM 18。因此輸入由控制器1C外部來的控制信號後,為 了向ROM 1 8中輸入E-EDID資訊設置了有多個端子的連接 器1 6。並且液晶顯示裝置的背面側貼附有顯示該液晶顯示 裝置1 2的製造編號的條碼的標貼2 0。 (2) 圖像檢查裝置10的構成 圖像檢查裝置10是,向液晶顯示裝置12輸出包含為進行 圖像檢查的圖像資料的測試資料,且圖像檢查前有先確認 E-EDID資訊的寫入與讀取的功能,E-EDID資訊處理後馬上 進行圖像檢查的裝置。圖像檢查裝置10是以電腦為主要部 O:\82\82616-920721 DOC\6\WCK -10- 1224731 ⑺ 7. 21Embodiments The following describes a procedure for performing image inspection and writing of manufacturing history data of the liquid crystal display device 12 using the image inspection device 10 according to one embodiment of the present invention, with reference to FIGS. 1 to 5. In addition, in this embodiment, the manufacturing history data is constructed with reference to the E-EDID standard. (1) Configuration of liquid crystal display device 12 Fig. 1 is a block diagram showing the relationship between the image inspection device 10 and the liquid crystal display device 12. First-In this embodiment, the display device 12 to be inspected is composed of a well-known TFT liquid crystal module. That is, as shown in FIG. 1, a driving circuit substrate 14 provided on the back surface of a liquid crystal cell 13 made of liquid crystal cells sealed between two glass substrates including a TFT array is provided with a driving TFT array not shown in the figure. The controller 1C that distributes control signals such as image data and other clock signals from external inputs to the peripheral drive circuit IC composed of a scanning line drive circuit and a signal source drive circuit, and is also equipped with a memory for storing E-EDID information ROM 18. Therefore, after inputting a control signal from the outside of the controller 1C, a connector 16 having multiple terminals is provided for inputting E-EDID information into the ROM 18. A label 20 is attached to the rear side of the liquid crystal display device to display a bar code indicating the manufacturing number of the liquid crystal display device 12. (2) Configuration of the image inspection device 10 The image inspection device 10 outputs test data including image data for image inspection to the liquid crystal display device 12, and the E-EDID information is confirmed before the image inspection. The function of writing and reading. It is a device for image inspection immediately after E-EDID information processing. The image inspection device 10 is mainly composed of a computer O: \ 82 \ 82616-920721 DOC \ 6 \ WCK -10- 1224731 ⑺ 7. 21

分構成,真體而言有作為控制裝置的CPU 25和計測現在之 年月日及時間和週的計時器22。 另外,對應各種液晶顯示裝置1 2為進行圖像檢查的測試 資料記憶在由硬碟構成的第一硬碟驅動器2 6中,而且與該 測試資料一對一對應的E-EDID資訊記錄在第二硬碟驅動 器2 8中。該E-EDID資訊以特定形式(例如,EXCELL (登錄 商標))的檔案形式被記綠。 並且,圖像檢查裝置中設置了圖中沒有顯示的為通過連i严 接液晶顯示裝置1 2的連接器1 6的連接線把儲存在記憶部 中的檢查用的各種資料和E-EDID資訊輸出的介面部。該介 面部可以使用熟知的電腦的硬體構成。 因此,一旦選擇了測試資料,就可以調出與被選擇之測 試資料對應的E-EDID資訊。而且,在各測試資料中設置了 可以判別是需要E-EDID資訊的種類,還是不需要E-EDID資 訊的種類的E-EDID標誌。該E-EDID標德為ON時由第二硬 碟驅動器28調出E-EDID資訊。 這是因為根據用戶不同會有需要把E_EDID資訊記憶至 顯示裝置的要求與不需要的要求,為滿足兩方面的要求在 輸入測試資料的同時就確定了是否需要寫入E_EDID資 訊。因此在標誌為OFF的顯示裝置中如後所述不進行 E-EDID資訊的寫入而是直接實施檢查步驟,這樣就可以縮 短步驟從而提高生產效率。 還有,連接了檢查人員操作用的作業B0X 24 ’並且連接 了條碼讀取器30。作業BOX 24上設置了有液晶顯示器的觸 〇 \82\82616-920721. DOC\6\WC K -11 - ⑻ 摸式面板,在與顯示裝置的型號(例如:△ X χ X χ (△是 英文字母,X是0〜9的整數))相同形式顯示的測試資料名 中選擇與檢查對象之顯示裝置的裂號一致名稱的檔案。 (3) E-EDID資訊的内容 其次,關於由E-EDID規格決定的製造履歷資料參照圖4 及圖5說明。 E-EDID資訊由從位址〇 〇開始到! 2 7為止的} 2 8位元組資 料組成,各在址中記綠了關於液晶顯示裝置丨2的製造履歷; 資料。 例如,位址1 6中記錄了製造週,位址1 7中記綠了製造 年,位址21及位址22中記錄了最大水平顯示尺寸和最大垂 直顯示尺寸。位址1 2 7中記錄了從位址〇 〇到位址1 2 6中所有 資料的相加後的檢查合計(Check Sum)。 該Check Sum是用來判斷該E-EDID資訊為正常還是異 常’作為E-EDID規格被標準化的資料。位址〇〇到位址126 中有的資料相加後的Check Sum資料的下2位若為〇〇則顯 示正常,若為0 0以外的數字則顯示異常。 (4)圖像檢查及E-EDID資訊的寫入步驟 下面依據圖2及圖3的流程圖,對液晶顯示裝置1 2的圖像 檢查及E-EDID資訊寫入步驟進行說明。 該步驟是位於液晶顯示裝置1 2的最後步驟,是液晶顯示 裝置1 2完全組裝好的狀態下進行的步驟。最初把檢查裝置 1 0的連接線連接到液晶顯示裝置1 2的連接器丨6。 首先在圖像檢查前確認E-EDID資訊。 O:\82\82616-920721. DOC\6\ WC K -12- 1224731It is divided into two parts: a CPU 25 as a control device and a timer 22 that measures the current year, month, day, time, and week. In addition, test data corresponding to various liquid crystal display devices 12 for image inspection is stored in a first hard disk drive 26 composed of hard disks, and E-EDID information corresponding to the test data is recorded in the first Two hard drives 2 in 8. This E-EDID information is recorded in the form of a file in a specific form (for example, EXCELL (registered trademark)). In addition, the image inspection device is provided with various data and E-EDID information for inspection stored in the memory unit through connection cables not shown in the figure, which are connected to the connector 16 of the liquid crystal display device 12 strictly. Output of the mesial face. The interface can be constructed using well-known computer hardware. Therefore, once the test data is selected, the E-EDID information corresponding to the selected test data can be called up. Furthermore, an E-EDID flag is set in each test data to determine whether the type of E-EDID information is required or the type of E-EDID information is not required. When the E-EDID flag is ON, the E-EDID information is called up by the second hard disk drive 28. This is because, depending on the user, there will be a requirement to memorize the E_EDID information to the display device and an unnecessary requirement. In order to meet the two requirements, it is determined whether the E_EDID information needs to be written while entering the test data. Therefore, in the display device whose flag is OFF, as will be described later, the E-EDID information is not written but the inspection step is directly performed, so that the step can be shortened and the production efficiency can be improved. Also, a job B0X 24 'for inspector operation is connected and a barcode reader 30 is connected. A touch screen with a liquid crystal display is set on the job box 24. \\\\ 16616-920721. DOC \ 6 \ WC K -11-摸 The touch panel is the same as the display device model (for example: △ X χ X χ (△ 是English letters, X is an integer from 0 to 9)) In the test data name displayed in the same form, select a file with the same name as the crack number of the display device to be checked. (3) Contents of E-EDID information Next, the manufacturing history data determined by the E-EDID specifications will be described with reference to FIGS. 4 and 5. E-EDID information starts from address 〇 〇! } Up to 27} 2 8-byte data composition, each of which is recorded in green on the manufacturing history of the liquid crystal display device 2; data. For example, the manufacturing week is recorded in address 16; the manufacturing year is recorded in address 17; the maximum horizontal display size and the maximum vertical display size are recorded in addresses 21 and 22. At address 1 27, the check sum (Check Sum) after the addition of all data from address 00 to address 1 26 is recorded. The Check Sum is used to determine whether the E-EDID information is normal or abnormal 'as data standardized by the E-EDID specification. The sum of the next two digits of the Check Sum data after adding the data from address 00 to address 126 is normal. If it is a number other than 0, the display is abnormal. (4) Image checking and writing procedure of E-EDID information Next, the image checking and writing of E-EDID information of the liquid crystal display device 12 will be described with reference to the flowcharts of FIGS. 2 and 3. This step is the last step in the liquid crystal display device 12 and is a step performed in a state where the liquid crystal display device 12 is completely assembled. Initially, the connection line of the inspection device 10 is connected to the connector 6 of the liquid crystal display device 12. First check the E-EDID information before the image check. O: \ 82 \ 82616-920721. DOC \ 6 \ WC K -12- 1224731

第1步驟中,判斷對象之液晶顯示裝置1 2的E-EDID資訊 是否可以變更。即若液晶顯示裝置1 2中沒有寫入E-EDID 資訊則重新寫入E-EDID資訊,若已經寫入E-EDID資訊則判 斷能否修改後重新寫入。在E-EDID資訊已經寫入的情況下 相當於進行圖像檢查步驟為不合格時調整後再度進行圖 像檢查的液晶顯示裝置1 2。 之後,E-EDID資訊可以變更時進入第2步騾,禁止變更 的情況下進入第3步驟。 - 在第2步驟中由於可以變更E-EDID資訊,選擇對應液晶 顯示裝置1 2種類進行圖像檢查的測試資料後進入第4步 驟。 第3步驟中由於禁止E-EDID資訊的變更,液晶顯示裝置 1 2在公用選項單中設定為閱讀確認模式)。該閱讀確認模 式是判斷已經寫入的E-EDID資訊是正常還是異常的模 式,在後面的步驟中實施。In the first step, it is determined whether the E-EDID information of the subject liquid crystal display device 12 can be changed. That is, if the E-EDID information is not written in the liquid crystal display device 12, the E-EDID information is rewritten, and if the E-EDID information has been written, it is judged whether it can be rewritten after modification. When the E-EDID information has been written, it is equivalent to the liquid crystal display device 12 which performs the image inspection again after the image inspection step is failed. After that, if the E-EDID information can be changed, proceed to step 2 骡. If the change is prohibited, proceed to step 3. -In the second step, since the E-EDID information can be changed, select the test data corresponding to the 12 types of liquid crystal display device for image inspection, and then enter the fourth step. In the third step, since the change of the E-EDID information is prohibited, the liquid crystal display device 12 is set to the reading confirmation mode in the common menu). This reading confirmation mode is a mode for judging whether the E-EDID information that has been written is normal or abnormal, and is implemented in the subsequent steps.

第4驟中判斷對於在圖像檢查裝置1 0中讀取的關於圖像 檢查測試資料中的E-EDID標誌是ON還是OFF。即若E-EDID 標誌為OFF時貝不再寫入E-EDID資訊進行檢查步驟。反之 若E-EDID標誌為ON時則進入第5步驟。 在第5步驟中判斷在第二硬碟驅動器2 8中是否存在與測 試資料對應的E-EDID資訊。該E-EDID資訊與測試資料同 樣,以與顯示裝置的型號(例如··△ X X X X (△是英文字母 ,X是0〜9的整數))相同形式的檔案名被保存,測試資料與 E-EDID資訊根據彼此不同的識別符號(.edi等)識別。檢查 O:\82\82616-920721. DOC\6\WCK -13- 1224731In the fourth step, it is determined whether the E-EDID flag in the image inspection test data read by the image inspection device 10 is ON or OFF. That is, if the E-EDID flag is OFF, the E-EDID information will no longer be written to check the steps. Conversely, if the E-EDID flag is ON, the process proceeds to step 5. In the fifth step, it is determined whether there is E-EDID information corresponding to the test data in the second hard disk drive 28. The E-EDID information is the same as the test data, and is saved in the same file name as the display device model (for example, △ XXXX (△ is an English letter, X is an integer from 0 to 9). The test data is the same as the E- EDID information is identified by different identification symbols (.edi, etc.) from each other. Check O: \ 82 \ 82616-920721. DOC \ 6 \ WCK -13- 1224731

裝置中經過程式化來檢索檔案名與測試資料檔案名一致 的E-EDID資訊。因此在第二硬碟驅動器2 8中如果沒有記錄 E-EDID資訊則作業BOX 24進行錯誤顯示後結束。若存在 E-EDID資訊則進入第6步驟。 第6步驟中從圖像檢查裝置1 0的第一硬碟驅動器2 6中讀 取測試資料,準備進行圖像檢查。然後由條碼讀取器3 0 讀取製造編號。 第7步騾-中,藉由條碼讀取器3 0讀取液晶顯示裝置1 0背 面的條碼2 0,把製造編號輸入到圖像檢查裝置1 0,使之記 錄在由内置在圖像檢查裝置1 0的RAM等記憶裝置構成的 第二記憶部(圖中沒有顯示)中。 在第8步騾中,判斷讀取的製造編號的最後5位是否為數 字,如果不是數字則回到第6步驟再次指示讀取製造編 號。進行該判斷是因為在液晶顯示裝置1 0背面貼附有多個 輸入製造編號以外之資訊的條碼,在操作失誤輸入其他資 訊的情況下,指示重新讀取。製造編號最後5位為數字時 進入第9步驟。 在第9步驟,判斷是否是最近1天以内已經讀過的製造編 號。若是相同的製造編號則進行第1 0步驟。若是不同的製 造編號時進入第1 2步驟。 第1 0步驟中,由於是與最近1天内讀取的製造編號相 同,因此使作業BOX 24的指示燈閃爍提醒檢查人員的注 意。第1 1步驟若檢查人員注意到後按下作業BOX 24的游標 鍵後進入第1 2步驟,若沒有按下游標鍵則回到第6步驟再 O:\82\82616-920721 DOC\6\WCK -14- 1224731 (11) 換The device is programmed to retrieve E-EDID information whose file name matches the test data file name. Therefore, if the E-EDID information is not recorded in the second hard disk drive 28, the operation box 24 ends with an error display. If E-EDID information exists, go to step 6. In the sixth step, the test data is read from the first hard disk drive 26 of the image inspection apparatus 10, and the image inspection is prepared. The bar code reader 30 then reads the manufacturing number. In step 7--, the bar code reader 3 0 reads the bar code 2 0 on the back of the liquid crystal display device 10, and enters the manufacturing number into the image inspection device 10, and records it in the image inspection device. A second storage unit (not shown) formed by a storage device such as a RAM of the device 10. In step 8), it is judged whether the last 5 digits of the manufacturing number read are digits. If it is not a number, it returns to step 6 and instructs to read the manufacturing number again. This judgment is made because a plurality of bar codes for inputting information other than the manufacturing number are affixed to the back of the liquid crystal display device 10, and when another information is inputted by mistake in operation, it is instructed to read again. When the last 5 digits of the manufacturing number are numbers, proceed to step 9. In the ninth step, it is determined whether or not the manufacturing number has been read within the last day. If it is the same manufacturing number, step 10 is performed. If it is a different manufacturing number, go to step 12. In step 10, since the manufacturing number read in the last day is the same, the indicator of job box 24 flashes to remind the inspector's attention. Step 11 If the inspector notices and presses the cursor button of job BOX 24 and then enters step 12; if the downstream cursor key is not pressed, it returns to step 6 and O: \ 82 \ 82616-920721 DOC \ 6 \ WCK -14- 1224731 (11)

WW

次進行製造編號的讀取步驟。 第1 2步驟按下作業box 24的測試開始按鈕開始圖像檢 查。 第1 3步驟,判斷是否為讀取確認模式。若為讀取確認模 式,因為有必要對寫入液晶顯示裝置1 2的ROM 18中的 E-EDID資訊進行是否正常的判斷,進入第1 4步驟。若不是 請取確認模式則進入第丨6步驟。 第1 4步驟,讀取自液晶顯示裝置1 2的ROM 1 8窝入的 E-EDID資訊,第丨5步驟進行讀取的e-EDID資訊的Check Sum 是否為0 (即是否為正常)的判斷。若為正常則進入第1 9步 驟。若還是異常則有必要進入第1 6步驟再次寫入E-EDID 資訊。 第16步驟,由檢查裝置的介面部送出E-EDID資訊,並把 該E-EDID資訊寫入到液晶顯示裝置12的R〇M 18中。這裡被 寫入的E-EDID資訊是對應測試資料的E-EDID資訊,製造編 號是寫入由條碼讀取器3 0讀取的製造編號,製造年週是寫 入圖像檢查裝置1 0的計時器2 2所計測的現在的年週的真 實時間。 第1 7步驟,圖像檢查裝置1 〇再次讀取寫入的E-EDID資 訊,第1 8步驟檢查該讀取的E-EDID資訊是正常的還是異常 的。因此讀取的Check Sum是否等於寫入的check Sum,還 有判斷Check Sum的數值是否為〇。check Sum相等或者數值 為0時則判斷E-EDID資訊被正常寫入而進入第19步驟。除 此以外的情況都顯示錯誤資訊並結束檢查。 O:\82\82616-920721. DOC\6\WCK -15-Read the manufacturing number twice. Step 1 2 Press the test start button of job box 24 to start the image check. Step 13: Determine whether it is a read confirmation mode. If it is the read confirmation mode, it is necessary to judge whether the E-EDID information written in the ROM 18 of the liquid crystal display device 12 is normal or not, and the process proceeds to step 14. If not, please take the confirmation mode and go to step 6 Step 14: Read the E-EDID information embedded in the ROM 1 8 of the liquid crystal display device 12; check whether the Check Sum of the e-EDID information read in step 5 is 0 (that is, whether it is normal). Judge. If it is normal, go to step 19. If it is still abnormal, it is necessary to enter step 16 to write E-EDID information again. In the 16th step, the E-EDID information is sent from the mesial surface of the inspection device, and the E-EDID information is written in the ROM 18 of the liquid crystal display device 12. The E-EDID information written here is the E-EDID information corresponding to the test data, the manufacturing number is written in the manufacturing number read by the barcode reader 3 0, and the manufacturing year is written in the image inspection device 10 The real time of the current year and week measured by the timer 2 2. In step 17, the image inspection device 10 reads the written E-EDID information again, and in step 18, it checks whether the read E-EDID information is normal or abnormal. Therefore, it is determined whether the read check sum is equal to the written check sum or not. When the check Sum is equal or the value is 0, it is judged that the E-EDID information is normally written and the process proceeds to step 19. In all other cases, an error message is displayed and the check ends. O: \ 82 \ 82616-920721. DOC \ 6 \ WCK -15-

1224731 在第19步驟,在作業BOX 24上顯示剛讀取的E-EDID資訊 中的製造年週,第2 0步驟則進行正常的圖像檢查。即在測 試資料選擇步驟2中被選擇的測試資料從檢查裝置的介面 部送出到液晶顯示裝置1 2,使液晶顯示裝置點亮後用目視 或者照相確認是否存在顯示上的缺陷。 如此,E-EDID資訊的寫入和圖像檢查使用相同的裝置連 續進行,可以簡化作業步驟。 另夕卜,寫入E-EDID的資訊沒有被確認為正常寫入前則不= 能進入下一步驟,可以在程式中設置E-EDID資訊寫入忘記 防止功能和檢查功能的功能。 還有,以條碼讀取器3 0輸入製造編號後寫入E-EDID資 訊,因為具有確認功能,可以防止E-EDID資訊有誤輸入的 情況。 而且,儘管是禁止E-EDID資訊取代的液晶顯示裝置1 2, 但可以判別在讀取確認模式下寫入的E-EDID資訊是正常 的還是異常的。 上述實施例中說明了關於液晶顯示裝置,但若換成有機 EL顯示裝置或布朗管的CRT的顯示裝置,同樣也可以在圖 像檢查步驟後連續進行E-EDID資訊的寫入。 此外構成圖像檢查裝置的各種硬體,電腦系統可以使用 熟知的構件,在不超過本發明主旨的範圍内可以進行各種 變更。例如第一記憶部和第二記憶部也可以由單獨的硬碟 驅動裝置構成。還有可以適切組合使用硬碟驅動裝置和 RAM等功能不同的記憶裝置。 O:\82\826! 6-920721. DOO-6\WCK -16- 1224731 (13)1224731 In step 19, the manufacturing year and week in the newly read E-EDID information are displayed on job box 24, and in step 20, normal image inspection is performed. That is, the test data selected in the test data selection step 2 is sent from the interface portion of the inspection device to the liquid crystal display device 12, and after the liquid crystal display device is lit, it is visually or photographically confirmed whether there is a display defect. In this way, the writing of the E-EDID information and the image inspection are continuously performed using the same device, which can simplify the operation steps. In addition, if the information written in E-EDID is not confirmed as normal writing, it will not be able to go to the next step. You can set the E-EDID information writing forget function and the check function in the program. In addition, the E-EDID information is written into the barcode reader 30 after entering the manufacturing number, because it has a confirmation function, which prevents the E-EDID information from being entered incorrectly. Furthermore, although the liquid crystal display device 12 is prohibited from replacing the E-EDID information, it can be judged whether the E-EDID information written in the read confirmation mode is normal or abnormal. Although the liquid crystal display device has been described in the above embodiment, if the display device is replaced with an organic EL display device or a brown tube CRT display device, the E-EDID information can also be written continuously after the image inspection step. In addition, various hardware constituting the image inspection apparatus and the computer system can use well-known components, and various changes can be made within the scope not exceeding the gist of the present invention. For example, the first storage unit and the second storage unit may be constituted by separate hard disk drive devices. There are also memory devices that can be used in appropriate combinations such as hard disk drives and RAM. O: \ 82 \ 826! 6-920721. DOO-6 \ WCK -16- 1224731 (13)

[發明之功效] 通過以上說明,本發明在顯示裝置上可以在圖像檢查後 連續進行E-EDID資訊的寫入,在簡化了作業步驟的同時也 可以防止在寫入步驟中發生的失誤。 圖式簡單說明 圖1係作為本發明實施例之一的圖像檢查裝置的區塊 圖。 圖2係圖像檢查和寫入步驟的第一流程圖。 圖3係圖像檢查和寫入步騾的第二流程圖。 圖4係顯示E-EDID資訊表的圖表。 圖5係延續圖4表格的圖表。 圖 式代表符 號 說 明 10 圖 像 檢 查 裝 置 12 液 晶 顯 示 裝 置 14 驅 動 電 路 基 板 16 連 接 器 18 ROM 20 條 碼 22 計 時 器 24 作 業 BOX 2 6 第 一 硬 碟 驅 動 器 28 第 二 硬 碟 驅 動 器 30 條 碼 讀 取 器 O:\82\82616-920721 DOC\6\WCK -17-[Effects of the Invention] According to the above description, the present invention can continuously write E-EDID information on the display device after image inspection, which simplifies the operation steps and prevents errors in the writing step. Brief Description of the Drawings Fig. 1 is a block diagram of an image inspection apparatus as one embodiment of the present invention. FIG. 2 is a first flowchart of the image checking and writing steps. FIG. 3 is a second flowchart of the image checking and writing steps. Figure 4 is a diagram showing an E-EDID information sheet. FIG. 5 is a chart continuing the table of FIG. 4. Description of Symbols of the Symbols 10 Image Inspection Device 12 Liquid Crystal Display Device 14 Drive Circuit Board 16 Connector 18 ROM 20 Bar Code 22 Timer 24 Job Box 2 6 First Hard Disk Drive 28 Second Hard Disk Drive 30 Bar Code Reader O : \ 82 \ 82616-920721 DOC \ 6 \ WCK -17-

Claims (1)

12247311224731 第091136828號專利申請案 中文申請專利範圍替換本(93年7月) 拾、申請專利範圍 1. 一種顯示裝置之製造方法,其係在顯示裝置中設置的 記錄媒體中寫入包括該顯示裝置的製造編號資料、製 造年週資料及識別該顯示裝置種類的規格資料之製造 履歷資料的顯示裝置之製造方法,其特徵為具有: 於圖像檢查裝置上連接前述顯示裝置的步驟,前述圖 像檢查裝置具備:第一記憶部,其係儲存對應每一種 顯示裝置之多個圖像測試資料以及對應前述多個圖像 測試資料各個的前述規格資料;儲存前述製造編號的 第二記憶部;計測年週資料的計時器;連接於前述顯 示裝置的介面部;控制部,將前述第一記憶部以及第 二記憶部中儲存的各種資料以及前述年週資料送出至 前述介面部; 測試資料選擇步驟,其係自前述第一記憶部中儲存的 前述多個圖像測試資料中,選擇適應前述顯示裝置的 圖像測試資料; 製造編號資料讀取步驟,其係將賦予至前述顯示裝置 的製造編號資料輸入前述畫像檢查裝置,使其記憶在 前述第二記憶部; 製造履歷資料寫入步驟,其係對於儲存在前述第一記 O:\82\82616-930715.DOCN7 1224731Patent Application No. 091136828 Chinese Application for Patent Scope Replacement (July 1993) Pick up and apply for patent scope 1. A method for manufacturing a display device, which is written in a recording medium provided in the display device including the display device The manufacturing method of a display device for manufacturing serial number data, manufacturing year and week data, and specification data identifying the type of the display device includes the steps of connecting the display device to the image inspection device, and the image inspection The device includes: a first memory unit that stores a plurality of image test data corresponding to each display device and the aforementioned specification data corresponding to each of the plurality of image test data; a second memory unit that stores the aforementioned manufacturing number; and a measurement year A timer for weekly data; an interface part connected to the display device; a control part that sends various data stored in the first and second memory parts and the year-of-week data to the interface part; a test data selection step, It is from the plurality of image test data stored in the first memory section. Choose to adapt the image test data of the display device; The step of reading the manufacturing number data is to input the manufacturing number data given to the display device into the image inspection device so that it is stored in the second memory section; write the manufacturing history data Into the step, it is for the first record stored in the aforementioned O: \ 82 \ 82616-930715.DOCN7 1224731 申請導利範圍:續:頁.、 憶部中的前述規格資料中,將對應前述測試資料選擇 步驟内所選擇的圖像測試資料的前述規格資料,前述 製造編號讀取步驟中記憶在前述第二記憶部中的前述 製造編號,及前述計時器所計測的現在的年週資料., 經由前述介面部寫入前述記錄媒體;及 、 對前述顯示裝置進行發光檢查的圖像檢查步驟,其係 在前述製造履歷資料寫入步驟之後,將在前述測試資 料選擇步驟選擇的前述圖像測試資料經由前述介面部 送至前述顯示裝置。 2. 如申請專利範圍第1項之顯示裝置之製造方法,其中前 述圖像測試資料包含前述製造履歷資料是否需要的判 別資料,若前述測試資料選擇步驟中選擇的圖像測試 資料之需要與否的判別資料顯示為不要製造履歷資料 時,省略前述製造編號資料讀取步驟以及製造履歷資 料寫入步驟。 3. 如申請專利範圍第1項之顯示裝置之製造方法,其中進 行檢查步驟,其係在前述測試資料選擇步驟前檢查前 述記錄媒體上有無前述製造履歷資料者; 製造履歷資料的讀取步驟,其係讀取前述檢出步驟中 檢出的製造履歷資料,使之記憶在前述第二記憶部中 者; O:\82\82616-930715.DOC\7\ -2- 1224731Application guidance scope: Continued: pages. The aforementioned specifications in the memory section will correspond to the aforementioned specifications for the image test data selected in the aforementioned test data selection step, and the aforementioned manufacturing number reading step will be stored in the aforementioned section. The memory number in the two memory sections and the current year and week data measured by the timer are written into the recording medium via the interface; and an image inspection step for performing a light emission inspection on the display device. After the manufacturing history data writing step, the image test data selected in the test data selection step is sent to the display device through the interface surface. 2. For the manufacturing method of the display device according to item 1 of the scope of the patent application, wherein the aforementioned image test data includes judgment data for whether the aforementioned manufacturing history data is required, and if the image test data selected in the aforementioned test data selection step is required or not When the discriminating data is displayed as not manufacturing history data, the aforementioned manufacturing number data reading step and manufacturing history data writing step are omitted. 3. For the manufacturing method of the display device according to item 1 of the scope of patent application, wherein the inspection step is performed, it is to check whether there is the aforementioned manufacturing history data on the aforementioned recording medium before the aforementioned test data selection step; the reading steps of the manufacturing history data, It is the one that reads the manufacturing history data detected in the aforementioned detection step and stores it in the aforementioned second memory; O: \ 82 \ 82616-930715.DOC \ 7 \ -2- 1224731 β !ΐ. . 1 Pf月 曰I 判定步驟,其係依據合計包含在前述第二記憶部所儲 存之製造履歷資料中的各規格資料之合計值以判定該 製造履歷資料是否合格者;及 若前述製造履歷資料被判定為異常時則繼續進行前 述寫入步驟,若前述製造履歷資料被判定為正常時則 取代前述寫入步驟,而將前述計時器所計測的現在的 製造年週覆寫至該顯示裝置的記憶媒體中。 4. 一種顯示裝置之製造裝置,其特徵為具備:第一記憶 部,其係記憶每一種顯示裝置之多個圖像測試資料以 及對應前述多個圖像測試資料各個的前述顯示規格 (大小)資料;記憶前述製造編號之第二記憶部;計測年 週資料的計時器;連接於前述顯示裝置之介面部;及 控制部,其係將儲存在前述第一記憶部及第二記憶部 之各資料及前述年週資料送出至前述介面部。 O:\82\82616-930715.DOC\7\ -3-β! ΐ.. 1 Pf month I judgment step, which is based on the total value of each specification data included in the manufacturing history data stored in the aforementioned second memory section to determine whether the manufacturing history data is qualified; and if When the manufacturing history data is determined to be abnormal, the writing step is continued. When the manufacturing history data is determined to be normal, the writing step is replaced, and the current manufacturing year and week measured by the timer is overwritten to The display device is in a storage medium. 4. A manufacturing device for a display device, comprising: a first memory unit that stores a plurality of image test data of each display device and the aforementioned display specifications (sizes) corresponding to each of the plurality of image test data Data; a second memory unit storing the aforementioned manufacturing number; a timer for measuring year-of-week data; an interface portion connected to the aforementioned display device; and a control unit which is to be stored in each of the aforementioned first memory unit and the second memory unit The data and the aforementioned weekly data are sent to the aforementioned interface. O: \ 82 \ 82616-930715.DOC \ 7 \ -3-
TW091136828A 2001-12-26 2002-12-20 Method and device for manufacturing display device TWI224731B (en)

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