TW200307869A - Method and device for manufacturing display device - Google Patents

Abstract

The present invention is a method to write E-EDID information into the ROM 18 of the liquid crystal display device 12, and provides a method to proceed the writing operation steps continuously after the image check is completed using the same device. The present invention comprises: a test data selection step to select the image test data for proceeding the image check of the liquid crystal display device 12; a reading step of manufacturing serial number to read the manufacturing serial number; an E-EDID information writing step to find the specified manufacturing data in the E-EDID information of the corresponding image test data from the image checking device, and write the found specified manufacturing data, the read manufacturing serial number, and the current manufacturing year/week counted by the timer into ROM 18 as the E-EDID information; and an image checking step to proceed the image check by the selected image test data.

Description

200307869 ⑴

(Explanation of the invention should state: the technical field, prior art, contents, embodiments, and drawings of the invention are briefly explained) TECHNICAL FIELD OF THE INVENTION The present invention relates to display devices such as liquid crystal display devices, organic EL display devices, and CRTs. Manufacturing method of EDID information writing. Previous technologies include the Video Electronics Standards Association (VESA), which promotes the standardization of image-related technologies and the formulation and support of graphic magazine standards. O The VESA re-clarified computer monitors on February 1, 2000. Of four standard specifications. The first standard specification is Enhanced Extended Identification Date (E-EDID). The E-EDID specifies the functions of the display and ID as the data format transmitted to the host computer. The data consists of 128 bytes. The second standard specification is the Enhanced Display Date Channel (E-DDC). This E-DDC is a regulation that specifies the specifications of the communication channel between the display and the host computer and the mutual transmission of data. Therefore, the setting and control of the configuration are carried out using this channel, which is to expand the existing DDC in order to handle a large amount of data. The third standard specification is VESA-Generalized Timing Formula (GTF). The GTF is a standard for determining the timing method of the display. It fixes the update rate of the display and no longer requires a preset standard. The fourth standard specification is the video signal standard (Video Signal Standard 200307869 (2) and the development of a standard display card for graphics cards [problems to be solved by the invention]. Recently, the E_EDID information described above has been incorporated into liquid crystal display devices. After sales. This is because the history of the liquid crystal display device can be judged after writing the E_EDID information. Therefore, in order for the liquid crystal display device to memorize the E-EDID information, R is set in the driving circuit of the liquid crystal display device. 〇MW. The method for making Brother Yi write is to write the E-EDID information to the LCD display that has been completed and passed the image inspection. At the same time, in order to write the E-EDID information, it is necessary to reconnect to the nest. It is necessary to increase the number of steps for re-entering the type of the liquid crystal display device and so on. Therefore, there is a disadvantage that the operation steps need to be increased. Because the invention is in view of the above-mentioned shortcomings, the writing system in the display device: calendar data There is no need to increase the number of work steps, but to provide a manufacturing method that can be placed. [Means to Solve the Problem] Zhishen: Therefore, the invention of item 1 relates to the An organic el display, a notice, and a display device, such as a display device, can be written in the manufacturing history including the manufacturing process, the manufacturing year, and the specification information of the display device. The manufacturing method of the display device is characterized by: The data selection and recall in the figure is to perform the image inspection of the aforementioned display device, 'select the subject to be recorded; the image test equipment to which the aforementioned display device is applied in the inspection device, and the serial number reading step is to read the aforementioned display Manufacture of the device-6- (3) (3) 200307869 Ι The cautious & resume data writing step is to check the Ik resume S section of the image selected above, and take the aforementioned image "Specification data" The read specification data, == number, and the current year and week measured by the timer of the aforementioned image inspection device are inserted into the aforementioned recording medium as a manufacturing resume and Beko Wo.

In one step, the image data of the image test data from the aforementioned image inspection-Shangzhi is used to perform the image inspection of the display device by the former sincerely shaking AA apricot. For example, the display device of the application item 1, the toast, * The above-mentioned hesitation to the linen 1P, the invention of the application item 2 is if :: select: The image test data shows the type of dress is made If the type is writable, the aforementioned reading step is performed; if it is a manufacturing method, the aforementioned image inspection step is performed when it is a cheek. For example, the display device of the application item 1 is to be stopped, stopped, and produced. The invention of the application item 3 is a step of reading the resume data. The information is already written in the recording media. The data has been written. Pre-entry data; discrimination steps, which are: Judgment of the second record ㈣ in the record '] It is stated that the manufacturing history data read is abnormal; when the aforementioned manufacturing history data # Material is hanging, the aforementioned image is inspected and installed. The current manufacturing year and week are guaranteed at $ a +. • The manufacturing history data read from Yiyizhijizi to Zeshu is subjected to the above-mentioned image inspection steps. Then, the aforementioned manufacturing history data writing step is performed. The invention of claim 4 is related to the manufacturing device of the display device. Its special features are: a first memory unit, which has an A characteristic of eight guarantees. Each display device has images like the test data and the front needle, t 7 ^ Figures] The description of the display specifications (size) of each of the multiple image test data; the memory of the aforementioned manufacturing serial number -2; the timer for measuring the year of the week data; the connection to the aforementioned Eryi interface 200307869

And control unit, which will store Erqiu > 夂 次 Twist ^ The first memory and the second memory (each Beco and the aforementioned year and week data. _ Fan interface 0 The present invention is about manufacturing history The nesting and image inspection of the data department can be performed using the same image inspection device.

Ding Yun's treatment method can make the productivity increase dramatically. I The manufacturing history data in the present invention includes the manufacturing serial number information of the display device, the manufacturing year and week data, and the specification data identifying the type of the display device. The manufacturing number data is a serial number given to the display device in the form of a bar code label or the like before the manufacturing steps of the present invention. However, in addition to this method, a method of storing a serial number in the ROM-IC of the display device may be adopted. The manufacturing year and week data is composed of the manufacturing year data and the manufacturing week data (1 to 53 weeks, and the leap year is 54 weeks). In the present invention, the inspection device timer is written in the recording medium of the display device when the manufacturing history data is embedded. Measured year and week data. Regarding the specification data, it is the length and width data of the display device screen, and various recommended timings (horizontal display period, horizontal blank period, vertical display period, vertical blank period, etc.). (The display device is used by the merchant to manage the model of the display device). Although the combination of the specifications can be changed according to the needs of the user, it is usually based on the standardized model codes such as the E_EDID standard. And as mentioned before, 3 e-edid: ^ standard is generally available. In addition, the image test data is composed of various timing signals and image data driving the display device, and the size and operation timing of the screen and various types of test data corresponding to different driving voltage types are stored in the inspection device (5) (5) 200307869

The first memory of a drive such as a built-in hard disk. The operator of the inspection device confirms the type (model) of the display setting of the inspection object with a sticker or the like attached to the display device, and the file name of the test data displayed in the inspection device display (a file name in the same form as the model) Display) Select the same file name as the type of the inspection target. After selecting the file name of the test data, in the specification data stored in the first memory of the same inspection device with a built-in hard disk drive, 埯% JL f can automatically select the same file name as the selected test data file b 々V 叩 疋 The specifications of the slot case names that match the display device model to be inspected). formula. In the manufacturing history writing step, the selected specification data is inputted with the manufacturing number data of the second memory unit composed of a RAM (random access memory) and the like built in the inspection device, and the clock 眭 〃τ The combination of the year and week data measured by the device is sent to the interface, and then sent to the display device. In addition, test data and specification data can also be stored in separate hard disk devices built into the inspection rack. Then in the image inspection step ', the display device is driven by the selected test data, and its lighting state is observed visually or by a camera to check whether there are defects in the display. The image data included in the test data corresponds to the type and display order of the image patterns (all lit, partially lit, etc.) used in the inspection and can be any image data. In addition, each piece of hardware (control device, memory device, interface) that constitutes the inspection device system can use a hardware configuration that is well-known by various manufacturers, and can have various configurations without departing from the scope of the present invention. [Embodiment of the invention] 200307869

⑻ The following describes a procedure for writing an image inspection and manufacturing history data of the liquid crystal display device 12 using the image inspection device 10 according to an embodiment of the present invention, with reference to FIGS. 1 to 5. In this embodiment, the manufacturing history data is constructed with reference to the E-EDID standard. (1) Configuration of liquid crystal display device 12 FIG. 1 is a block diagram showing the relationship between the image inspection device 10 and the liquid crystal display device 12. As shown in FIG. In this embodiment, the display device 12 to be inspected is composed of a well-known TFT liquid crystal module. That is, as shown in FIG. 1, a driving circuit substrate 14 provided on the back surface of a liquid crystal cell 13 made of liquid crystal cell 13 made by sealing liquid crystal between two glass substrates including a TF τ array is mounted with a driving TFT not shown in the figure. The controller 1C that distributes control signals such as externally input image data and other clock signals to the peripheral drive circuit 1C constituted by the scan line drive circuit and the signal source drive circuit of the array, and is equipped with a memory for storing E-EDID information. ROM 18. Therefore, after inputting the control signal from the outside of the controller IC, a connector 16 having multiple terminals is provided for inputting E-EDID information into the ROM 18. A label 20 is attached on the rear side of the liquid crystal display device to display a bar code indicating the manufacturing number of the liquid crystal display device 12. (2) Composition of the image inspection device The image inspection device 10 outputs test data including image data for image inspection to the liquid crystal display device 12, and E-EDID information is confirmed before the image inspection. The function of writing and reading, the device for image inspection immediately after e_edid information processing. The image inspection device 10 is composed of a computer as a main part. Specifically, the image inspection device 10 includes a CPU 25 as a control device and a timer 22 that measures the current date, time, and week. In addition, test data corresponding to various liquid crystal display devices 12 for image inspection are stored in a first hard disk drive 26 composed of hard disks, and E-EDID information corresponding to the test data is recorded on a second hard disk. Disc drive 2 of 8. This E-EDID information is recorded as a file in a specific form (for example, 'EXCELL (registered trademark)). In addition, the image inspection device is provided with an interface that is not shown in the figure and outputs various kinds of inspection data and E_EDID information stored in the memory unit through the connection lines 16 to the connector 16 of the liquid crystal display device 12. . The interface can be constructed using well-known computer hardware. Therefore, once the test data is selected, the E-EDID information corresponding to the selected test data can be called up. Furthermore, an E-EDID flag is provided in each test data to determine whether the type of E-EDID information is required or the type of e-EDID information is not required. When the E_EDID flag is ON, E-EDID information is called up by the second hard disk drive 28. This is because according to different users, there are requirements for memorizing the E-EDID information to the display device and unnecessary requirements. In order to meet the two requirements, it is determined whether the E_EDID information needs to be embedded while entering the test data. Therefore, as shown below, the display device marked as OFF does not write the E-EDID information, but directly performs the inspection step, so that the steps can be shortened and the production efficiency can be improved. In addition, Zuofeng ^ # soil, J servant dish BOX 24 is connected to the inspector for operation, and a barcode reader 300 job BOX 24 is set up, and 7 LCDs are installed. The touch panel is the same as the display device model (for example: △ χ χ χ χ (△ is -11- 200307869

English letters, X is an integer from 0 to 9)) In the test data name displayed in the same format, select a file with the same name as the model of the display device to be checked. (3) Contents of E-EDID information Next, the manufacturing history data determined by the E-EDID specifications will be described with reference to FIGS. 4 and 5. The E-EDID information is composed of 128-byte data from the address 00 to 1 27, and the manufacturing history of the liquid crystal display device 12 is recorded in each address. For example, the manufacturing week is recorded in address 16; the manufacturing year is recorded in address 17; the maximum horizontal display size and the maximum vertical display size are recorded in addresses 21 and 22. At address 127, the check sum (Add Sum) of all data from address 00 to address 126 is recorded. The Check Sum is used to determine whether the E-EDID information is normal or abnormal, as the standardized data of the E-EDID specification. Check Sum data after adding some data from address 00 to address 126 is normal if it is 0, and abnormal if it is a number other than 00. (4) Image checking and writing procedure of E-EDID information The following describes the image checking and writing of E-EDID information of the liquid crystal display device 2 according to the flowcharts of FIG. 2 and FIG. 3. This step is the last step in the liquid crystal display device 12, and is a step performed in a state where the liquid crystal display device 12 is completely assembled. ^ At first, the connecting wire of the inspection device 10 is connected to the connector 16 of the liquid crystal display device 12. First check the E_EDID information before image inspection. E_EDID information of the liquid crystal display device of the judgment object in the first step (2) • 12- 200307869

I $ 可以 # # »^ 文. That is, if the e-EDID information is not embedded in the liquid crystal display device 12, the e-edid information is again embedded. If the e-edid information has been embedded, it is judged whether the modification is made and re-embedded. When the E-EDID information has been embedded, it is equivalent to the liquid crystal display device 12 which performs an image inspection after adjustment after the image inspection step is failed. After that, if the E-EDID information can be changed, proceed to step 2. If it is prohibited, proceed to step 3. In the second step, since the E-EDID information can be changed, select 12 types of test data corresponding to the LCD display π device for image inspection, and then enter the fourth step 骡. In the third step, since the change of the E-EDID information is prohibited, the liquid crystal display device 12 is set to the reading confirmation mode in the common menu). This read confirmation mode is a mode for judging whether the E-EDID information that has been written is normal or abnormal 'is implemented in a later step. In the fourth step, it is determined whether the E-EDID mark in the image inspection test data read by the image inspection device 10 is ON or OFF. That is, if the E-EDID φ flag is OFF, the e-EDID information is no longer embedded in the inspection step. Conversely, if the E-EDID flag is ON, the process proceeds to step 5. In the fifth step, it is determined whether there is E-EDID information corresponding to the test data in the second hard disk drive 28. The E-EDID information is the same as the test data, and is saved in the same file name as the model of the display device (for example: △ XXXX (△ is an English letter and X is an integer from 0 to 9). The test data and E-EDID The information recognizes ij according to the different symbols (.edi, etc.). Check that the program's crawling file name is the same as the test data file name in the device -13- 200307869

E-EDID information. So in the second hard disk drive 28, is it 啕? The green E-EDID information is then displayed after the error is displayed. If E-EDID information is stored, proceed to step 6 骡. In the sixth step, a 'test' and a sample are read from the first hard disk drive 26 of the image inspection apparatus 10, and an image inspection is prepared. Then read by bar code ^ read the manufacturing number. In the seventh step, the barcode 20 on the back of the liquid crystal display device 10 is read by the barcode reader 30, and the manufacturing number is input to the image inspection device 10, so that it is recorded in the image inspection device 10 built in $ = 1 •• hidden part (not shown in the figure) constituted by a memory device such as RAM. In the eighth step, it is determined whether the last 5 digits of the manufacturing number read are digits. If it is not a number, return to step 6 and instruct the reading of the manufacturing number again. Enter 4 D. This judgment is on the back of the liquid crystal display device 10 A bar code with a plurality of information other than the input manufacturing number is affixed. In the case of misoperation, other information is instructed to re-read. When the last 5 digits of the manufacturing number are numbers, proceed to step 9. In the ninth step, it is determined whether or not the manufacturing number has been read within the last day. If it is the same manufacturing number, step i0 is performed. If it is a different manufacturing number, go to step 12. In the tenth step, since the manufacturing number read in the last day is the same, the indicator of the job box 24 flashes to remind the inspector's attention. Step 11: If the inspector notices and presses the cursor button of job box 24, it enters Step 12. If the inspector does not press the downstream mark button, it returns to Step 6 and reads the manufacturing number again. -14- 200307869

(11) Step 12: Press the test start button of job box 24 to start the image check. Step 13: Determine whether it is a read confirmation wedge. If it is the reading confirmation mode, because it is necessary to judge whether the E-EDID information in the ROM 18 embedded in the liquid crystal display device 12 is normal, it proceeds to step 14. If it is not the read confirmation mode, go to step 16. Step I4: Read the E-EDID information embedded in the ROM 18 of the liquid crystal display device 12, and determine whether the cheek sum of the read E-EDID information is 0 (that is, whether it is normal) in step 15. If normal, go to step 19 骡. If it is still abnormal, it is necessary to enter step 16 to write E-EDID information again. In the 16th step, the E-EDID information is sent from the mesial surface of the inspection device, and the E-ED ID information is written into the ROM 18 of the liquid crystal display device 12. The E-EDID information written here is the E-EDID information corresponding to the test data, the manufacturing number is written in the manufacturing number read by the barcode reader 30, and the manufacturing year is the time written in the image inspection device 10 The real time of the current year and week measured by the device 2 2. In step 17, the image inspection device 10 reads the written E-EDID information again, and in step 18, it checks whether the read E-EDID information is normal or abnormal. Therefore, it is determined whether the read check sum is equal to the written check sum or not. When the check sums are equal or the value is 0, it is judged that the E-EDID information is normally embedded and the process proceeds to step 19. In all other cases, an error message is displayed and the check ends. In step 19, the newly read E-EDID information is displayed on job box 24. -15 · 200307869

(12): The year of manufacture, and in the 20th step, normal image inspection is performed. That is, the test data selected in the moment A material selection step 2 is sent from the interface portion of the inspection device to the liquid crystal display device 12, and after the liquid crystal display device is lit, the defects on the display are visually or photographically consumed. In this way, the writing of the E-EDID information and the image inspection are continuously performed using the same device, to simplify the operation steps. In addition, “E-EDID information cannot be written to the next step before it is confirmed as normal writing. You can set the E-EDID information write forget function and check function in the program. Definitely, enter the E-EDID negative after inputting the manufacturing number with the barcode reader 30. Because it has a confirmation function, it can prevent the E-EDID information from being entered incorrectly. Furthermore, although the liquid crystal display device 12 is prohibited from replacing the E_EDID information, it can be judged whether the E_EDID information embedded in the read confirmation mode is normal or abnormal. Although the liquid crystal display device has been described in the above embodiment, if the display device is replaced with an organic EL display device or a crt display device with a brown tube, the E-EDID information can also be written continuously after the image inspection step. In addition to the various hardware constituting the image inspection device, the computer system can use well-known components to make various changes within the scope of the scope of the present invention. For example, the first memory unit and the second memory unit may be constituted by a hard disk drive device called early digging. There is also a memory device that can be used in combination with hard drives and RAMs with different functions. [Effect of the invention] -16- 200307869 (13) According to the above description, the present invention can continuously write E-EDID information on the display device after image inspection, which simplifies the operation steps and prevents Mistakes in nesting steps. Brief Description of the Drawings Fig. 1 is a block diagram of an image inspection apparatus as an embodiment of the present invention. FIG. 2 is a first flowchart of the image checking and writing steps. FIG. 3 is a second flowchart of image inspection and nesting step. Figure 4 is a chart showing the E_EDID information table. FIG. 5 is a chart continuing the table of FIG. 4. Explanation of Symbols 10 Image Inspection Device 12 Liquid Crystal Display Device 14 Drive Circuit Board 16 Connector 18 ROM 20 Bar Code 22 Timer 24 Job Box 26 First Hard Disk Drive 28 Second Hard Disk Drive 30 Bar Code Reader-17 -

Claims (1)

ZUUJU / 50V patent claim _ 1. A method for manufacturing a display device includes the display in the recording medium, which is the year of the week data set in the display device and identifies the ::: Manufacturing number of the clothes set The display system of the display device of the data and the history data is made up of the specifications of the display device. The manufacturing method of the asset is based on the image inspection card, and the manufacturing method is characterized in that the inspection device is provided with the first record = the display device Steps: Multiple image tests of the aforementioned illustrated device :: It stores the former fan specifications corresponding to each of the display test data, and the second memory testing unit corresponding to the foregoing multiple images; The interface part of the device storing the aforementioned manufacturing number; the picking section :: timer; various rules stored in the display memory section connected to the front: the -memory section and the second interface section; > and the foregoing The weekly data is sent to the previous test data selection step. The aforementioned multiple image test image test data is adapted. The adaptation is to display the manufacturing number data of the 7F device ...: The booklet is given to the aforementioned display equipment before the day image inspection device is turned on. Brother Yi ’s memory department; has created resume information, i ^ U write step 'It is for the aforementioned specifications stored in the former memory department. The specifications of the image collection number of this image are stored in the steps of making and obscuring the acquisition. ^ ^ ^ ^ ≪ Fu Yiji recalls Shao Zhongji; and the current year and week measured by the aforementioned timer ^ 200307869 Inserting the aforementioned recording medium through the aforementioned mesofacial surface; and an image inspection step for performing a luminescence inspection on the aforementioned display device, which is after the aforementioned manufacturing history data writing step, the aforementioned image selected in the aforementioned test data selecting step The image test data is sent to the display device through the interface. 2. For the manufacturing method of the display device according to item 1 of the scope of patent application, wherein the aforementioned image test data includes judgment data for whether the aforementioned manufacturing history data is required, and if the image test data selected in the aforementioned test data selection step needs to be related to When the judgment data of No is displayed as not manufacturing history data, the aforementioned manufacturing number data reading step and manufacturing history data writing step are omitted. 3. For the manufacturing method of the display device of the patent application No. 1 item, wherein the inspection step is performed, it is to check whether there is the aforementioned manufacturing history data on the aforementioned recording medium before the aforementioned testing data selection step; reading the manufacturing history data Take the step, which reads the manufacturing history data detected in the aforementioned detection step, and memorizes it in the aforementioned second memory section; the judgment step, which is based on the total included in the aforementioned second memory section and stored The total value of each specification data in the manufacturing history data to determine whether the manufacturing history data is qualified; and if the foregoing manufacturing history data is determined to be abnormal, the foregoing writing step is continued, and if the foregoing manufacturing history data is determined to be normal In place of the aforementioned step, the present manufacturing year measured by the timer is overwritten into the storage medium of the display device. 200307869 4. A manufacturing device for a display device, comprising: a first memory unit that stores a plurality of image test data of each display device and the aforementioned display specifications (sizes) corresponding to each of the plurality of image test data Data; a second memory unit storing the aforementioned manufacturing number; a timer for measuring year-of-week data; an interface portion connected to the aforementioned display device; and a control unit which is to be stored in each of the first memory unit and the second memory unit The data and the aforementioned weekly data are sent to the aforementioned interface.