TW582060B - A reticle transferring support and transferring method thereof - Google Patents

A reticle transferring support and transferring method thereof Download PDF

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Publication number
TW582060B
TW582060B TW92106407A TW92106407A TW582060B TW 582060 B TW582060 B TW 582060B TW 92106407 A TW92106407 A TW 92106407A TW 92106407 A TW92106407 A TW 92106407A TW 582060 B TW582060 B TW 582060B
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Taiwan
Prior art keywords
photomask
support
reticle
transfer
mask
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TW92106407A
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Chinese (zh)
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TW200419643A (en
Inventor
Po-Ching Lin
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Powerchip Semiconductor Corp
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Publication of TW200419643A publication Critical patent/TW200419643A/en

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  • Preparing Plates And Mask In Photomechanical Process (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

A reticle transferring support is provided. The reticle transferring support includes a supporting base for containing a reticle, a plurality of braces for supporting the reticle, and a plurality of holders for fixing the position of the reticle. The braces are spheroids composed of soft plastic, and the position of the braces is adjustable so that the reticle will not be damaged. The holders have an inclined plane so that the position of the reticle will be fixed automatically.

Description

582060 五、發明說明(1) 發明所屬之技術領域 本發明提供一種光罩傳送支撐座(reticle transferring support),尤指一種可避免光罩磨損之光 罩傳送支撐座。 ' 先前技術 微影製程(photolithography)可以說是整個半導體 製程中,相當舉足輕重的步驟之一。舉凡是與M〇S元件的 結構相關的,如各層薄膜的圖案(patterη)以及摻質 (dopant)的區域,都是經由微影製程這個步驟來決定 的。微影製程的基本步驟,是先於半導體晶片(wafer)表 面覆上一層感光材料(ph〇t〇-sensitive material),接 著利用一平行光穿過一以玻璃為主體的光罩(reticle) 後’照射在感光材料之上。由於光罩上具有一基體線路 的佈局(lay out)圖案,所以感光材料便得以進行選擇性 (selective)的感光反應,以將光罩上的圖案轉移 (transfer)至半導體晶片上。 一般而言’光罩包含有一平坦且透明的玻璃或石英 當作基板,以及一層厚度約1〇〇〇A的鉻膜覆蓋於光罩的 表面之上’製作光罩時係利用一蝕刻製程對該鉻膜進行 餘刻’使該光罩表面形成一包含有可透光區及不透光區582060 V. Description of the invention (1) Technical field to which the invention belongs The present invention provides a reticle transferring support, especially a reticle transferring support which can avoid abrasion of the reticle. '' Prior technology Photolithography can be said to be one of the most important steps in the entire semiconductor process. For example, the structure related to the MOS device, such as the pattern of each layer of film and the dopant area, are determined through the lithography process. The basic step of the lithography process is to cover the surface of the semiconductor wafer with a layer of phot-sensitive material, and then use a parallel light to pass through a glass-based reticle. 'Irradiate on photosensitive material. Since the photomask has a layout pattern of the base circuit, the photosensitive material can perform a selective photoreaction to transfer the pattern on the photomask to the semiconductor wafer. Generally speaking, 'the photomask includes a flat and transparent glass or quartz as a substrate, and a chrome film with a thickness of about 1000 A covering the surface of the photomask.' The chromium film is etched to 'form the surface of the photomask to include a light-transmissive region and an opaque region.

582060 582060582060 582060

五、發明說明(2) 的佈局(lay out)圖案,以便之後可以利用微影製程進行 圖案轉移。因此為了保護佈局圖案,目前大多是將光罩 放置在一光罩盒中,利用機械手臂(robot)將光罩盒傳送 至曝光機(exposure apparatus)等機台,以避免光罩表 面刮痕的產生。 圖一與圖二為習知一光罩盒之光罩支撐座1〇之上視 圖與剖面圖。如圖一所示,光罩支撐座10包含有一支撐 基座12,其上具有四個長方型的支撐點14,用以支撐一 光罩 16。為符合 sEMI(semiconductor equipment & material international)標準,光罩支撐座1〇左右兩側 必須保留〇 · 9 5 m m的間距(例如SMIF pod),以利於光罩之 載入/載出等操作,然而此一間距卻使得操作人員利用光 罩夾j手動方式置入光罩16後不易固定光罩16之位置, 尤其若放置位置偏差太大時,會影響後續曝光機台以機 械手臂真空吸附光罩之動作,因此操作人員必 罩1 6至適當位置。 ^ ^ 而募=ΐ L人力胃整光罩16位置,可*因為人為疏多 而導致先罩16位置偏差,且在調整過中也會因為光}V. Description of the invention (2) lay out the pattern so that the pattern transfer can be performed later using the lithography process. Therefore, in order to protect the layout pattern, most of the masks are currently placed in a mask box, and the robot box is used to transfer the mask box to a machine such as an exposure apparatus to avoid scratches on the surface of the mask. produce. Figures 1 and 2 are top and sectional views of a mask support base 10 of a conventional mask box. As shown in FIG. 1, the photomask support base 10 includes a support base 12 having four rectangular support points 14 for supporting a photomask 16. In order to comply with the sEMI (semiconductor equipment & material international) standard, a space of 0.95 mm (for example, SMIF pod) must be reserved on the left and right sides of the mask support base 10 to facilitate loading / unloading operations of the mask. However, this distance makes it difficult for the operator to fix the position of the photomask 16 after manually placing the photomask 16 by using the photomask clamp j. Especially if the placement position is too large, it will affect the subsequent exposure machine to use a robotic arm to absorb light. The operation of the cover, so the operator must cover 16 to the appropriate position. ^ ^ And recruit = ΐ L human stomach adjusts the 16 position of the mask, but the position of the mask 16 may be misaligned because of artificial sparseness, and it will also be affected by light during adjustment}

背面與接觸點1 4間的摩擦而使光罩背面產生到痕而 光時產生像面傾斜等問題,嚴重影響光罩正常運作。 圖二所不,習知光罩支撐座1 〇之支撐點1 4為一長方形戈 結構,其與光罩16之接觸面積較大,不僅容易在調整另The friction between the back surface and the contact points 14 causes scratches on the back surface of the photomask, and problems such as tilting the image surface during light exposure, which seriously affect the normal operation of the photomask. As shown in FIG. 2, the supporting point 14 of the conventional photomask support base 10 is a rectangular structure, and the contact area with the photomask 16 is relatively large.

第6頁 罩 顯 發明說明(3) ί H造Λ光/污染,且I能導致光單邊緣條碼區(未 ^具二及附區(未顯示)之損壞。 含中ϊΐί,三,圖三為習知方法將一光罩置入一光罩 罩傳# t ί,傳送方法之流程圖。如圖三所示,習知光 辱送方法包含有下列步驟: 步驟30:開始; ^驟32 :利用一光罩開闔器將光罩盒開啟·, 內,利用一光罩夾以人工方式將光罩放置於光罩盒 内之支撐座上; 步驟36 步驟38 步驟4 0 調整光罩位置; 利用光罩開闔器將光罩盒關閉 結束。 口在習知光罩傳送方法中,首先必須利用一光罩開闔 ^本例如Asyst ALU 〇pener,將光罩盒開啟,然後利用 調整式將光罩放人光罩盒内之支撑座上並 關閉。然而如前所述,早同阖器將尤卓| 撐座為了符合SEMI標準^方法中由於光罩盒内之支 的間距,且支撐點丨4為 支撐座左右兩側需保留〇 · 9 5mm 極易造成光罩底部之到p方形,與光罩接觸面積過大, 成後續曝光機台在栽=、光罩位置偏差或光罩傾斜造 光罩時產生問題。 582060 五、發明說明(4) ㉖明内容 |造成光罩表面產生= ?摩擦 在 |撐座, 產生到 動將光罩載入一 式載入 含有一 U支撐 |位置。 圓弧面 置。 本發明之申請專利範 可以自動固定光罩之 痕,之後並可配合一 光罩盒中, 產生之人為 ’用來容納 以及複數個 固定架之内 可以有效固 光罩可能 支撐基座 該光罩, 其中該等 之設計, 圍中揭露了 位置,避免 光罩儲存機 以排除習知 疏失。該光 一光罩,複 固定架,用 種光罩傳送支 面因摩擦 械手臂自 以人工方 支樓座包 撐點,用 該光罩之 是一傾斜 上之位 光罩背 台之機 技術中 罩傳送 數個支 來固定 側為一傾斜平面或 定該光罩在支撐座 k右由ί i發明之光罩傳送支揮座上設置之固定_内側 ίί:;:ΓΐΓ,因此在利用光罩夾將光罩 調整光罩:置之動被固定,可省略習知技術中 -光罩儲存機台=2罩傳送支撑座可進-步利用 因此可解決習知ίϊϊ手臂準確將光罩載入光罩盒中, η技術中以人工方式載入光罩所造成的光 第8頁 582060 五、發明說明(5) 罩位置偏差問題。 實施方式 請參考圖四與圖五。圖四與圖五為本發明一光罩盒 之光罩傳送支撐座50之上視圖與剖面圖。如圖四與圖五 所示’本發明光罩傳送支撐座5〇包含有一支撐基座52, 用以容納一光罩5 8,複數個支撐點5 4,用以支撐光罩 58’以及複數個固定架56,用以固定光罩5 6的位置。值 得注意的是,本發明光罩傳送支撐座5 〇上所設置之支撐 點54具有一橢圓形之結構,因此與光罩之接觸面積較 小,且$撐點5 4之位置可作適度調整,使支撐點5 4的位 置避開光罩5 8上之條碼區(未顯示)與真空吸附區(未顯 示)’進而避免上述區域與支撐點間之摩擦造成光罩損 壞。支撐點5 4係由較柔軟之材質(如塑膠)所構成,也可 避免傷害光罩58背面。此外由於本發明光罩傳送支撐座 50之=架56之^㈣狀係為一傾斜面或《一傾斜圓弧 面之=汁,因此备光罩58被置入支撐基座52上時光罩會 :12上6緊密接觸而自動被固定,不會產生光罩位置 請參考圖六,圖六為本發明氺 圖。如圖六所示,本發明光罩傳、1法之流程 驟: 早1寻送方法包含有下列步 $ 9頁 582060 五、發明說明(6) 步驟1 0 0 ··開始; 機 步驟1〇2:將光罩傳送支撐座與光罩盒放置於 台之載入平台(load port)上之兩侧; 、 儲存 步驟1 04 :利用光罩夾將光罩放置在光 步驟1 0 6 ··間啟光罩盒; 專$支撐座内; f驟1 08 用光罩儲存機台之機械手 步驟1 1 0 ··利用機械手臂將光罩載入卓取出, 步驟1 1 2 :關閉光罩盒; + μ T ’ 步驟1 1 4 ··結束。 由此可知本發明之光罩傳读t 4 ^ |罩傳送支撲座作為光罩傳送介面,並二=2本發明之光 台來完成傳送光罩之動作。如前夕止a 一光罩儲存機 先將光罩傳送支揮座與光罩盒並;放置二=首 為儲存光罩之用,但由於機么 先/儲存機台本身係作 送光罩之功能,故在本發以;;械手臂具有傳 運傳送光罩之用途。接著利用送方法中可作為搬 放置於本發明之光罩傳 夾以人工方式將光罩 J揮座上設置有= =時由於光罩傳送 J啟;罩盒,以機械手臂將光罩::2巧損。隨後 1出’再將光罩以光罩盒巾 座中取 第10頁 582060 五 以 的 不 過 生 、發明說明(7) 人光罩之傳送方法為直接利用光罩夾 、光罩載入光罩盒中,操作人員在載入 夠罩調整至適當位置’此種傳送方式不ί 當:=雙損’…後續曝光機台傳送光罩時發 =於習知技術’本發明利用—光罩傳送支撑座作 為傳送;丨面’其中因宁並 撐π π & 固架之傾斜面没计與橢圓形軟性支 光罩位置能迅速自動,垃装献人内時 〜疋日勃固疋,接者配合先罩儲存機台的使 置’::ΐ械手臂精確地將光罩載入光罩盒内之適當位 ㊁面mi知方法中因人工調整光罩位置所造成光罩 穹面刮痕的問題。 以上所述僅為本發明之較佳實施例,凡依本發明申 請專利,圍所做之均等變化與修飾,皆應屬本發明專利 之涵蓋範圍。Description of the invention on page 6 (3) ί H creates light / pollution, and I can cause damage to the single-edged bar code area (not shown) and the attached area (not shown). A conventional method is to place a photomask into a photomask. The flow chart of the transmission method. As shown in FIG. 3, the conventional photodiscrimination method includes the following steps: Step 30: Start; Step 32: Use A photomask opener opens the photomask box. Inside, a photomask is used to manually place the photomask on the support in the photomask box; Step 36 Step 38 Step 40 Adjust the position of the photomask; Use The photomask opening device closes the photomask box. In the conventional photomask transfer method, you must first use a photomask ^^ such as Asyst ALU pener, open the photomask box, and then use the adjustment type to place the photomask The support seat inside the mask box is closed and closed. However, as mentioned earlier, the pedestal will be especially good | The bracket is in accordance with the SEMI standard ^ method because of the distance between the branches in the mask box, and the support points 丨 4 For the left and right sides of the support seat, 0.95 mm must be reserved. It is easy to cause the bottom of the mask to reach the p-square shape. , The contact area with the mask is too large, which will cause problems when the subsequent exposure machine is planted, the position of the mask is misaligned, or the mask is tilted to make the mask. 582060 V. Description of the invention ? Friction on the support, when the mask is loaded, it will be loaded with a U support position. The arc surface is set. The patent application of the present invention can automatically fix the mark of the mask, and can be matched with a light later. In the mask box, the artificial artifacts used to accommodate and fix the photomask within a plurality of fixing frames may support the photomask of the base. Among these designs, the position is exposed in the enclosure to avoid the photomask storage machine to eliminate It ’s a mistake. The light is a light mask, a complex fixed frame, and a kind of light mask is used to convey the supporting surface. The friction arm is used to support the artificial square pedestal support points. The light mask is an inclined back cover. In the machine technology, the cover transfers several supports to fix the side as an inclined plane or fix the photomask on the right of the support base k. The inner cover of the cover transfer support swing invented by the _ inside ί:; ΓΓΓ, so Using photomask Clip the reticle to adjust the reticle: the movement of the reticle is fixed, which can be omitted in the conventional technology-reticle storage machine = 2 hood transfer support base can be further used-so it can solve the problem In the photomask box, the light caused by manually loading the photomask in the η technology page 8 582060 5. Description of the invention (5) The problem of the position deviation of the photomask. For implementation, please refer to FIG. 4 and FIG. It is a top view and a cross-sectional view of a mask transfer support base 50 of a mask box according to the present invention. As shown in FIGS. 4 and 5 'the mask transfer support base 50 according to the present invention includes a support base 52 for receiving a The photomask 58, a plurality of support points 54, are used for supporting the photomask 58 'and a plurality of fixing frames 56 for fixing the positions of the photomask 56. It is worth noting that the support point 54 provided on the photomask transmission support base 50 of the present invention has an oval structure, so the contact area with the photomask is small, and the position of the support point 54 can be adjusted appropriately. , So that the positions of the support points 54 are kept away from the barcode area (not shown) and the vacuum suction area (not shown) on the photomask 5 8 ', thereby preventing the photomask from being damaged due to the friction between the above area and the support points. The support points 5 and 4 are made of a softer material (such as plastic), which can also prevent the back of the mask 58 from being damaged. In addition, since the shape of the frame 56 of the photomask transmission support base 50 of the present invention is an inclined surface or an inclined circular arc surface = juice, the photomask 58 will be placed when it is placed on the support base 52. : 12 on 6 is fixed in close contact and is automatically fixed. The position of the photomask will not be generated. Please refer to FIG. 6, which is a drawing of the present invention. As shown in Figure 6, the photomask transmission method of the present invention is as follows: Step 1 of the early search method includes the following steps: $ 9, page 582060 5. Description of the invention (6) Step 1 0 0 ·· Start; Machine step 1〇 2: Place the reticle transfer support and reticle box on both sides of the load port on the stage; Storing step 1 04: Use the reticle clip to place the reticle in the step 1 0 6 ·· Open the photomask box; in the special support base; f Step 1 08 Use the robot to store the photomask with the photomask. Step 1 1 ··· Use the mechanical arm to load the photomask and remove it. Step 1 1 2: Close the photomask. Box; + μ T 'Step 1 1 4 ·· End. It can be known from this that the mask transfer t 4 ^ | mask transfer support base of the present invention is used as a mask transfer interface, and 2 = 2 the optical stage of the present invention to complete the action of transferring the mask. As on the eve, a photomask storage machine first combines the photomask transfer support with the photomask box; placing two = the first is for the storage of photomasks, but because the machine / storage machine itself is used for photomask delivery Function, so in this hair; Robot arm has the purpose of transporting and transmitting photomask. Then, using the sending method, the mask J can be placed on the mask of the present invention manually, and the mask J is set to swing = = when the mask is transferred to J; the mask box is used to mechanically arm the mask :: 2 Clever. Followed by 1 'and then take the mask out of the mask box towel holder. Page 582060 Five-year-old, uninventive, description of the invention (7) The method of transferring the mask is to use the mask clip and mask to load the mask directly. In the box, the operator adjusts the hood to the appropriate position when loading. 'This transmission method is not. When: = double loss' ... issued when the subsequent exposure machine transmits the reticle = in the conventional technology. The present invention utilizes-reticle transmission. The support base is used as a transmission; 丨 the surface of which 因 π π & the sloped surface of the fixed frame and the elliptical flexible support mask position can be quickly and automatically. Cooperate with the setting of the mask storage machine ':: The mechanical arm accurately loads the mask into the proper position in the mask box. In the method, the dome surface of the mask is scratched due to manual adjustment of the mask position. The problem. The above description is only a preferred embodiment of the present invention, and any equivalent changes and modifications made in applying for a patent in accordance with the present invention shall fall within the scope of the patent of the present invention.

第11頁 582060Page 11 582060

圖式之簡單說明 圖一為習知一光罩 圖二為習知一光罩 圖三為習知一光罩 圖四為本發明一光 圖五為本發明一光 圖六為本發明一光 圖式之符號說明 傳送支樓座之上視圖。 傳送支樓座之剖面圖。 傳送方法之流程圖。 罩傳送支撐座之上視圖。 罩傳送支撐座之剖面圖。 罩傳送方法之流程圖。 10 14 30 〜40 50 54 58 光罩支撐座 支撐點 習知之光罩傳送步驟 光罩傳送支撐座 支撐點 光罩 12 16 52 56 支撐基座 光罩 支撐基座 固定架Brief description of the drawings: Figure 1 is a conventional mask; Figure 2 is a conventional mask; Figure 3 is a conventional mask; Figure 4 is a light of the invention; Figure 5 is a light of the invention; Figure 6 is a light of the invention; Symbols of the drawings illustrate the top view of the transfer tower. Sectional view of the teleportation pedestal. Flow chart of transmission method. Top view of hood transfer support. Sectional view of the hood transfer support. Flow chart of hood transfer method. 10 14 30 ~ 40 50 54 58 Photomask support base Support points Conventional photomask transfer steps Photomask support base Support point Photomask 12 16 52 56 Support base Photomask Support base Fixture

1 0 0〜1 1 4本發明之光罩傳送步驟1 0 0 ~ 1 1 4 Mask transfer step of the present invention

$ 12頁$ 12 pages

Claims (1)

582060 六、申請專利範圍 1· 一種光罩傳送支撐座(reticle transferring support),包含有: 一支揮基座(supporting base),用以容納一光罩; 複數個支撐點(brace),設置於該支撐基座上用以支 撐該光罩;以及 複數個固定架(holder),設置於該支撐基座之邊緣 部分用以固定該光罩之位置; /其中該等固定架係用來使得該光罩被載入該支撐基 座後可與該等固定架内侧之部分端點相接觸,以 光罩產生水平位移。 1項之光罩傳送支撐座,其中該等 2 ·如申請專利範圍第1項之 固疋‘内側係為一傾斜平面582060 6. Scope of patent application 1. A reticle transferring support (reticle transferring support), including: a supporting base for accommodating a reticle; a plurality of support points (brace) provided at The support base is used to support the photomask; and a plurality of holders are provided on the edge portion of the support base to fix the position of the photomask; / wherein the holders are used to make the After the photomask is loaded into the support base, it can be in contact with some end points on the inner side of the fixing frames to generate a horizontal displacement by the photomask. The reticle transfer support of item 1, of which 2 · As in the first scope of the patent application, the solid ‘inside is an inclined plane 4 · 如 W第1項之光罩傳送支撐座, 傾斜圓弧面。 其中該等 4·如申請專利範圍第 支撐點係為橢圓體結構 接觸面積。 1項之光罩傳送支撐座,其中該等 ,以減小該等支撐點與該光罩之4 · Incline the circular arc surface as in the reticle transfer support of W item 1. Among them 4. The supporting point is the contact area of the ellipsoidal structure as described in the patent application. Item 1 of the reticle transfer support base, where these are used to reduce the number of support points and the reticle. 1項之光罩傳送支撐座 其中該等Photomask transfer support for item 1 of which 582060 六、申請專利範圍582060 6. Scope of Patent Application •如申請專利範圍第丨項之光罩傳送支撐座,其中該等 i Ϊ 5 ΐ位於該支撐基座之角落,且該等支撐點之位置 ;吸S i調整以避免接觸到位於該光罩上之條碼區與真 罩傳 之一 一機 載出 8. 機台 罩載9. 座包 一支 複數 以及 請專利範圍第1項之光罩傳送支撐座,其中該光 =支撐座係設於一光罩儲存機台(reticle stocker: μίί , (load port)上,且該光罩儲存機台包含有 f (r〇b〇t)用以將該光罩傳送支撐座内之 並傳送至一光罩傳送盒(SMIF pod)。 一種光罩傳送方法,包含有. c傳送支樓座與一光罩盒放置於一光罩儲存 上me st〇cker)之載人平台(i〇ad p〇⑴上; 利用—夾將一光罩置入該光罩傳送支撐座中; 出#於ϊ光罩儲存機台上之機械手臂將該光 出该先罩傳送支撐座;以及 利用4機械手臂將該光罩傳送至該光罩盒中。 含:了專利圍第8項之方法,《中該光罩傳送支撐 撐基座,用以容納該光罩; 個支撑點’言交置於$支樓基座上用g支撐該光罩;• If the mask transfer support base of item 丨 of the patent application range, where i Ϊ 5 ΐ is located at the corner of the support base and the position of the support points; adjust S i to avoid contact with the mask One of the above barcode area and the real mask transmission is carried out by one machine 8. The machine casing is carried 9. The seat bag is provided in plural and the photo transmission support base of item 1 of the patent scope is required, wherein the light = support base is located at A reticle stocker (μίί, (load port)), and the reticle stocker includes f (r〇b〇t) to transfer the reticle into a support base and transfer it to a Photomask transfer box (SMIF pod). A method of photomask transfer, including a manned platform (i〇ad p〇) where a transfer pedestal and a photo mask box are placed on a photo mask storage device. Use a clip to place a photomask into the photomask support support; a robot arm on the photomask storage machine will take the light out of the photomask support support; and use 4 robotic arms to The reticle is transferred to the reticle box. Contains: The method of item 8 of the patent, "The reticle transfer support base A base for accommodating the photomask; a support point ’is placed on the base of the supporting building with g to support the photomask; 第14頁 582060 六、申請專利範圍 複數個固定架,設置於該支撐基座之邊緣部分,用以固 定該光罩之位置。 1 0.如申請專利範圍第8項之方法,其中該方法另包含有 利用該光罩儲存機台開啟及關閉該光罩盒之步驟。 - 1 1.如申請專利範圍第8項之方法,其中該方法另包含有 ‘ 利用該機械手臂將該光罩由該光罩盒中取出,並將該光 罩傳送回該光罩傳送支撐座之步驟。Page 14 582060 VI. Scope of patent application A plurality of fixing frames are arranged on the edge portion of the supporting base for fixing the position of the photomask. 10. The method according to item 8 of the scope of patent application, wherein the method further comprises the steps of using the photomask storage machine to open and close the photomask box. -1 1. The method according to item 8 of the patent application scope, wherein the method further includes' removing the photomask from the photomask box using the robot arm, and transferring the photomask back to the photomask transmission support base The steps. 第15頁Page 15
TW92106407A 2003-03-21 2003-03-21 A reticle transferring support and transferring method thereof TW582060B (en)

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