TW571246B - System and method for dynamic image recognition - Google Patents
System and method for dynamic image recognition Download PDFInfo
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- TW571246B TW571246B TW089115037A TW89115037A TW571246B TW 571246 B TW571246 B TW 571246B TW 089115037 A TW089115037 A TW 089115037A TW 89115037 A TW89115037 A TW 89115037A TW 571246 B TW571246 B TW 571246B
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- 238000000034 method Methods 0.000 title claims abstract description 122
- 230000007547 defect Effects 0.000 claims abstract description 83
- 238000007689 inspection Methods 0.000 claims abstract description 49
- 238000012937 correction Methods 0.000 claims abstract description 18
- 230000009467 reduction Effects 0.000 claims description 159
- 230000002079 cooperative effect Effects 0.000 claims description 58
- 238000009966 trimming Methods 0.000 claims description 51
- 238000004458 analytical method Methods 0.000 claims description 42
- 238000006243 chemical reaction Methods 0.000 claims description 40
- 238000013507 mapping Methods 0.000 claims description 25
- 238000004364 calculation method Methods 0.000 claims description 17
- 238000012549 training Methods 0.000 claims description 16
- 230000006870 function Effects 0.000 claims description 14
- 238000003384 imaging method Methods 0.000 claims description 13
- 230000008569 process Effects 0.000 claims description 10
- 238000003860 storage Methods 0.000 claims description 7
- 230000009466 transformation Effects 0.000 claims description 7
- 230000008859 change Effects 0.000 claims description 6
- 238000009795 derivation Methods 0.000 claims description 6
- 238000007639 printing Methods 0.000 claims description 4
- 241001270131 Agaricus moelleri Species 0.000 claims description 2
- 238000007781 pre-processing Methods 0.000 claims description 2
- 238000004590 computer program Methods 0.000 claims 9
- PCTMTFRHKVHKIS-BMFZQQSSSA-N (1s,3r,4e,6e,8e,10e,12e,14e,16e,18s,19r,20r,21s,25r,27r,30r,31r,33s,35r,37s,38r)-3-[(2r,3s,4s,5s,6r)-4-amino-3,5-dihydroxy-6-methyloxan-2-yl]oxy-19,25,27,30,31,33,35,37-octahydroxy-18,20,21-trimethyl-23-oxo-22,39-dioxabicyclo[33.3.1]nonatriaconta-4,6,8,10 Chemical compound C1C=C2C[C@@H](OS(O)(=O)=O)CC[C@]2(C)[C@@H]2[C@@H]1[C@@H]1CC[C@H]([C@H](C)CCCC(C)C)[C@@]1(C)CC2.O[C@H]1[C@@H](N)[C@H](O)[C@@H](C)O[C@H]1O[C@H]1/C=C/C=C/C=C/C=C/C=C/C=C/C=C/[C@H](C)[C@@H](O)[C@@H](C)[C@H](C)OC(=O)C[C@H](O)C[C@H](O)CC[C@@H](O)[C@H](O)C[C@H](O)C[C@](O)(C[C@H](O)[C@H]2C(O)=O)O[C@H]2C1 PCTMTFRHKVHKIS-BMFZQQSSSA-N 0.000 claims 6
- 239000008186 active pharmaceutical agent Substances 0.000 claims 1
- 230000000712 assembly Effects 0.000 abstract description 10
- 238000000429 assembly Methods 0.000 abstract description 10
- 238000012360 testing method Methods 0.000 description 40
- 238000012545 processing Methods 0.000 description 13
- 238000004422 calculation algorithm Methods 0.000 description 12
- 238000013138 pruning Methods 0.000 description 12
- 230000000007 visual effect Effects 0.000 description 11
- 230000008901 benefit Effects 0.000 description 10
- 230000003287 optical effect Effects 0.000 description 10
- 238000004519 manufacturing process Methods 0.000 description 9
- 238000001514 detection method Methods 0.000 description 8
- 238000011179 visual inspection Methods 0.000 description 8
- 238000011960 computer-aided design Methods 0.000 description 7
- 230000003247 decreasing effect Effects 0.000 description 7
- 238000007667 floating Methods 0.000 description 6
- 238000012886 linear function Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 230000007246 mechanism Effects 0.000 description 4
- 230000011218 segmentation Effects 0.000 description 4
- 101100457021 Caenorhabditis elegans mag-1 gene Proteins 0.000 description 3
- 101100067996 Mus musculus Gbp1 gene Proteins 0.000 description 3
- 238000013480 data collection Methods 0.000 description 3
- 230000002950 deficient Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- MGIUUAHJVPPFEV-ABXDCCGRSA-N magainin ii Chemical compound C([C@H](NC(=O)[C@H](CCCCN)NC(=O)CNC(=O)[C@@H](NC(=O)CN)[C@@H](C)CC)C(=O)N[C@@H](CC(C)C)C(=O)N[C@@H](CC=1NC=NC=1)C(=O)N[C@@H](CO)C(=O)N[C@@H](C)C(=O)N[C@@H](CCCCN)C(=O)N[C@@H](CCCCN)C(=O)N[C@@H](CC=1C=CC=CC=1)C(=O)NCC(=O)N[C@@H](CCCCN)C(=O)N[C@@H](C)C(=O)N[C@@H](CC=1C=CC=CC=1)C(=O)N[C@@H](C(C)C)C(=O)NCC(=O)N[C@@H](CCC(O)=O)C(=O)N[C@@H]([C@@H](C)CC)C(=O)N[C@@H](CCSC)C(=O)N[C@@H](CC(N)=O)C(=O)N[C@@H](CO)C(O)=O)C1=CC=CC=C1 MGIUUAHJVPPFEV-ABXDCCGRSA-N 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 230000002093 peripheral effect Effects 0.000 description 3
- 230000003044 adaptive effect Effects 0.000 description 2
- 238000013459 approach Methods 0.000 description 2
- 230000000875 corresponding effect Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000000835 fiber Substances 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000000717 retained effect Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 238000000844 transformation Methods 0.000 description 2
- 239000013598 vector Substances 0.000 description 2
- 229930091051 Arenine Natural products 0.000 description 1
- 101150106280 Mchr1 gene Proteins 0.000 description 1
- 235000010726 Vigna sinensis Nutrition 0.000 description 1
- 244000042314 Vigna unguiculata Species 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 230000006399 behavior Effects 0.000 description 1
- 244000309464 bull Species 0.000 description 1
- 230000000739 chaotic effect Effects 0.000 description 1
- 230000019771 cognition Effects 0.000 description 1
- 238000012790 confirmation Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000004570 mortar (masonry) Substances 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 238000003909 pattern recognition Methods 0.000 description 1
- 108090000623 proteins and genes Proteins 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 229910052704 radon Inorganic materials 0.000 description 1
- SYUHGPGVQRZVTB-UHFFFAOYSA-N radon atom Chemical compound [Rn] SYUHGPGVQRZVTB-UHFFFAOYSA-N 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 238000004153 renaturation Methods 0.000 description 1
- 230000002441 reversible effect Effects 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 210000002784 stomach Anatomy 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 238000013024 troubleshooting Methods 0.000 description 1
- 238000005303 weighing Methods 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/0008—Industrial image inspection checking presence/absence
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F18/00—Pattern recognition
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
- H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
- H05K13/0815—Controlling of component placement on the substrate during or after manufacturing
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30141—Printed circuit board [PCB]
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V2201/00—Indexing scheme relating to image or video recognition or understanding
- G06V2201/06—Recognition of objects for industrial automation
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S706/00—Data processing: artificial intelligence
- Y10S706/902—Application using ai with detail of the ai system
- Y10S706/903—Control
- Y10S706/908—Electronic or computer, internal or network, circuit
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/363,004 US6577757B1 (en) | 1999-07-28 | 1999-07-28 | System and method for dynamic image recognition |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW571246B true TW571246B (en) | 2004-01-11 |
Family
ID=23428396
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW089115037A TW571246B (en) | 1999-07-28 | 2000-10-17 | System and method for dynamic image recognition |
Country Status (5)
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI408611B (zh) * | 2010-11-30 | 2013-09-11 | Pixart Imaging Inc | 利用物件特徵相異性進行多個物件之動態影像辨識方法及使用該方法之系統 |
| TWI479428B (zh) * | 2008-10-14 | 2015-04-01 | Sicpa Holding Sa | 用於物品識別之方法及系統 |
| TWI751306B (zh) * | 2017-03-24 | 2022-01-01 | 美商克萊譚克公司 | 缺陷偵測之方法及系統 |
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- 2000-06-19 AU AU56242/00A patent/AU5624200A/en not_active Abandoned
- 2000-06-19 EP EP00941546A patent/EP1203341A2/en not_active Withdrawn
- 2000-06-19 WO PCT/US2000/016831 patent/WO2001009820A2/en not_active Application Discontinuation
- 2000-10-17 TW TW089115037A patent/TW571246B/zh not_active IP Right Cessation
-
2002
- 2002-04-22 US US10/127,366 patent/US6687397B2/en not_active Expired - Fee Related
- 2002-04-22 US US10/127,654 patent/US6614925B2/en not_active Expired - Fee Related
- 2002-04-22 US US10/127,518 patent/US6771819B2/en not_active Expired - Fee Related
- 2002-04-22 US US10/127,129 patent/US6650770B2/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI479428B (zh) * | 2008-10-14 | 2015-04-01 | Sicpa Holding Sa | 用於物品識別之方法及系統 |
| US9064187B2 (en) | 2008-10-14 | 2015-06-23 | Sicpa Holding Sa | Method and system for item identification |
| TWI408611B (zh) * | 2010-11-30 | 2013-09-11 | Pixart Imaging Inc | 利用物件特徵相異性進行多個物件之動態影像辨識方法及使用該方法之系統 |
| TWI751306B (zh) * | 2017-03-24 | 2022-01-01 | 美商克萊譚克公司 | 缺陷偵測之方法及系統 |
Also Published As
| Publication number | Publication date |
|---|---|
| US6650770B2 (en) | 2003-11-18 |
| US20030016858A1 (en) | 2003-01-23 |
| US6577757B1 (en) | 2003-06-10 |
| US6614925B2 (en) | 2003-09-02 |
| US20020159643A1 (en) | 2002-10-31 |
| WO2001009820A2 (en) | 2001-02-08 |
| US6687397B2 (en) | 2004-02-03 |
| US20020168098A1 (en) | 2002-11-14 |
| AU5624200A (en) | 2001-02-19 |
| US6771819B2 (en) | 2004-08-03 |
| WO2001009820A3 (en) | 2001-11-15 |
| US20030053677A1 (en) | 2003-03-20 |
| EP1203341A2 (en) | 2002-05-08 |
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