TW569376B - Multi(dual)-piece wafer retaining ring and method for fabricating the same - Google Patents

Multi(dual)-piece wafer retaining ring and method for fabricating the same Download PDF

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Publication number
TW569376B
TW569376B TW91134988A TW91134988A TW569376B TW 569376 B TW569376 B TW 569376B TW 91134988 A TW91134988 A TW 91134988A TW 91134988 A TW91134988 A TW 91134988A TW 569376 B TW569376 B TW 569376B
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Taiwan
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ring
scope
patent application
wafer
item
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TW91134988A
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Chinese (zh)
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TW200409269A (en
Inventor
Charlie Chang
Yao-Hui Tseng
Kelly Lu
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Dura Tek Inc
Takaotek Corp
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Publication of TW200409269A publication Critical patent/TW200409269A/en

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Abstract

A multi(dual)-piece wafer retaining ring and method for fabricating the same are disclosed. The retaining ring comprises a metal ring with fixing portions. A molding plastic ring is formed on a surface of the metal ring with forming fixing portions. The molding plastic ring has a central opening for fixing a wafer. The molding plastic ring covers the fixing portions of the metal ring during molding process so as to bonding together rapidly and fixedly.

Description

569376 五、發明說明(1) 【發明所屬之技術領域】 本發明係有關於一種化學機械研磨設備宙chemical mechanical polishing apparatus 宛,特別係有關於一種 多〔雙〕件晶圓拘束環及其製造方法,該拘束環係可供裝 配於化學機械研磨設備之研磨基座。 【先前技術】 習知積體電路係大量製造於 如四kwwerj 積體電路製造過程中,化學機械研磨宙chemical mechanical polishing, CMP宛係為其中不可或缺之步 驟。在沉積與钱刻形成線路之後,晶圓之處理表面不再保 持平坦,會使得後續之曝光顯影顯得不準確,而化學機械 研磨即利用化學反應與機械作用研磨平坦化該晶圓表面。 傳統化學機械研磨設備係主要包含有一研磨平台,研磨平 台上設有一研磨墊,對應於該研磨墊上方係為三研磨頭, 習知研磨頭係包含一研磨基座、一吸附裝置〔chuck〕、 一緩衝膜宙backing film宛及一拘束環宙“七^^ ing 宛…等等’該拘束環係夾固晶圓之邊緣,用以固定該晶 圓,使得晶圓之被研磨面能抵觸研磨墊而旋 CMP〔化學機械研磨〕處理中,拘走 ^ T 列米J衣之下環面亦抵觸該 研磨墊,故拘束環係與研磨墊相同灼太 更換。 ^ ^^日1』杓為耗知材,需要定期 在中華民國專利 有多層固定環的研 拘束環〔或稱固定 公告第48 5089號「 磨頭」中,揭露出 %、維持環、定位 化學機械研磨用之具 一種多〔雙〕件晶圓 環或邊緣壓覆環〕,569376 V. Description of the invention (1) [Technical field to which the invention belongs] The present invention relates to a chemical mechanical polishing apparatus, and particularly relates to a multiple [double] piece wafer restraint ring and a manufacturing method thereof. The restraint ring can be used for the grinding base of the chemical mechanical grinding equipment. [Previous technology] It is known that integrated circuit systems are manufactured in large quantities in the manufacturing process of four-kwwerj integrated circuits. Chemical mechanical polishing, CMP is an indispensable step. After the lines are formed by deposition and money engraving, the processed surface of the wafer is no longer kept flat, which will make subsequent exposure and development appear inaccurate. Chemical mechanical polishing uses chemical reaction and mechanical action to planarize the wafer surface. Traditional chemical mechanical polishing equipment mainly includes a polishing platform. A polishing pad is provided on the polishing platform, corresponding to three polishing heads above the polishing pad. The conventional polishing head system includes a polishing base, an adsorption device (chuck), A buffering film backing film and a restraint ring "Seven ^^ ing Wan ... etc." The restraint ring clamps the edge of the wafer to fix the wafer so that the polished surface of the wafer can resist grinding. In the CMP [Chemical Mechanical Polishing] treatment, the ring surface under the T-Rimi J-shirt was also in contact with the polishing pad, so the restraint ring system was replaced with the same as the polishing pad. ^ ^^ Day 1 Consumable materials need to be regularly disclosed in the Republic of China patent with a multi-layered fixing ring [or fixed bulletin No. 48 5089 "grinding head", which exposes the%, maintenance ring, positioning chemical mechanical polishing, etc. [ Double] piece wafer ring or edge lamination ring],

第6頁 569376 五、發明說明(2) 如第1圖所示,該拘束環11 0係包含有一不銹鋼上環11 2及 一管狀 PPS 下環 111〔PPS 係為 Polyphenylene sulphide 〔聚苯硫化物〕工程塑膠之簡稱〕,上環11 2與下環11 1之 間係以黏膠層11 3黏合,該拘束環11 0係裝設於CMP設備之 研磨基座1 6 0,在拘束環11 〇與研磨基座1 6 0之間係設有一 間隔軟膜1 3 4,該軟膜1 3 4之内緣係夾設有支撐件1 3 〇之上 夾具133與下夾具132,在支撐件130之下夾具132下方設有 一支撐板131 ’該支撐板131係支樓一缓衝膜120,以構成 一研磨頭,當一晶圓140固定於該研磨頭時,晶圓1 4〇之邊 緣係被拘束環110之管狀PPS下環111所固定,晶圓140之上 表面〔一般係為背面,亦可為正面〕係接觸該緩衝膜 1 2 0 ’藉此,定位該晶圓1 4 〇並使晶圓1 4 〇之下表面接觸一 研磨墊1 5 0,進行化學機械研磨,習知該拘束環丨丨〇之製造 私係如第2圖所不’如步驟1 〇 1與1 〇 2般,先行個別準備 一不銹鋼上環1 1 2及一管狀PPS下環1 1 1,再執行上下環壓 合步驟1 03,在不銹鋼上環1 1 2與一管狀pps下環111形成有 一熱固性環氧黏膠並壓合一起,該壓合步驟1 〇 3 —般約需 要三日工作日,之後執行烘烤步驟丨〇4,將熱固性環氧黏 膠完全熱固化為黏膠層1 1 3,此一烘烤步驟1 〇 4約另需要二 日工作日,之後再執行精加工步驟1 0 5,如此方能穩固結 合該不銹鋼上環11 2與管狀PPS下環1 π,否則不銹鋼上環 112與管狀pps下環ill有可能受到研磨扭力而脫層,導致 無法被使用’此一製造不僅加工緩慢費時且造價亦高昂。 在中華民國專利公告第4 9 7 5 2 3號「晶圓研磨定位環構造Page 6 569376 V. Description of the invention (2) As shown in Figure 1, the restraint ring 11 0 series includes a stainless steel upper ring 11 2 and a tubular PPS lower ring 111 [PPS is Polyphenylene sulphide [polyphenylsulfide] project Abbreviation of plastic], the upper ring 11 2 and the lower ring 11 1 are bonded with an adhesive layer 11 3. The restraint ring 110 is installed on the grinding base 160 of the CMP equipment, and the restraint ring 11 0 is ground and ground. Between the bases 160, a spacer soft film 1 3 4 is arranged. The inner edge of the soft film 1 3 4 is provided with a supporting member 1 300. The upper clamp 133 and the lower clamp 132 are under the supporting member 130. A support plate 131 is provided below. The support plate 131 is a buffer film 120 of the supporting building to form a polishing head. When a wafer 140 is fixed to the polishing head, the edge of the wafer 140 is bound by a ring 110. The tubular PPS lower ring 111 is fixed, and the upper surface of the wafer 140 (generally the back surface or the front surface) is in contact with the buffer film 1 2 0 ′, thereby positioning the wafer 1 4 0 and making the wafer 1 The surface below 40 is in contact with a polishing pad 150, and chemical mechanical polishing is performed. As shown in Figure 2, as in steps 1 〇1 and 〇2, first prepare a stainless steel upper ring 1 12 and a tubular PPS lower ring 1 1 1 separately, and then perform the upper and lower ring pressing step 1 03, the stainless steel upper ring 1 1 2 and a tubular pps lower ring 111 are formed with a thermosetting epoxy adhesive and pressed together. The pressing step 1 〇3-generally takes about three working days, and then the baking step is performed. The oxygen viscose is completely thermally cured into the viscose layer 1 1 3. This baking step 1 0 4 requires another two working days, and then the finishing step 1 0 5 is performed, so that the stainless steel upper ring 11 2 can be firmly combined. And tubular PPS lower ring 1 π, otherwise the stainless steel upper ring 112 and tubular pps lower ring ill may be delaminated due to grinding torsion, resulting in failure to use. This manufacturing is not only slow and time-consuming, but also expensive. In the Republic of China Patent Bulletin No. 4 9 7 5 2 3 "Wafer Polishing Locating Ring Structure

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569376 五、發明說明(3) =無:環另一種多〔雙〕件晶圓拘束環,其包含 端環之内二ίί有小於定位環環體之厚度與外徑,且鋼無 鋼無端環=;=位環環體之内徑’一塑膠層係包覆該 上居姓姓構成%體,由於鋼無端環係埋設於該塑膠層, 用二=☆強度不若呈兩層狀之拘束環1 1 〇,下層結構中可 〔/ I磨耗之厚度亦不若呈兩層狀之拘束環11〇來得更厚 之:I磨蝕利用層較薄〕,且因鋼無端環被包覆,定位環 浐,肱二為塑膠層,不易辨識耗損點,當磨蝕至鋼無端 5 r 土 /亏染晶圓,使得化學機械研磨失敗,故該晶圓拘束 展係未能充份發揮多件式複合性組合材料之特性。 【發明内容】 四本1明之主要目的係在於提供一種多〔雙〕件晶圓拘束 環二利用模製塑膠環包覆金屬環下表面之嵌合部,使得兩 者忐快速穩固的一體結合,具有製造快速與結合穩固之功 效。 四本發明之次一目的係在於提供一種多〔雙〕件晶圓拘束 環t製造方法,利用模製塑膠環模製〔molding〕包覆金 屬環下表面之嵌合部,使得模製塑膠環在成形時即快速穩 固地結合於該金屬環,具有製造快速與結合穩固之功效。 依本發明之晶圓拘束環,該拘束環係包含有一如不銹鋼 之金屬環,該金屬環之下表面係具有嵌合部,如環狀嵌合 凸座或凹槽,較佳地,該嵌合部係形成有徑向嵌合槽,該 金屬環之下表面係模製形成有一模製塑膠環,如PP S工程 塑膠,該模製塑膠環具有一中心開口 ,用以定位一晶圓,569376 V. Description of the invention (3) = None: Another ring of multiple [double] wafer restraint rings, including the inner ring of the end ring, which has a thickness and outer diameter smaller than the ring ring body, and steel without steel without end ring =; = The inner diameter of the ring body 'a plastic layer covering the upper surname constitutes% body, because the steel endless ring system is buried in the plastic layer, using two = ☆ the strength should not be restricted to two layers Ring 1 1 0, in the lower layer structure [/ I abrasion thickness should not be two-layered restraint ring 11 10 is thicker: I abrasion utilization layer is thinner], and because the steel endless ring is covered and positioned The humerus is a plastic layer, and it is difficult to identify the wear point. When it is abraded to the endless steel 5 r soil / defective wafer, the chemical mechanical polishing fails, so the wafer restraint system failed to fully utilize the multi-piece composite The characteristics of combination materials. [Summary of the Invention] The main purpose of the four books and one Ming is to provide a multiple [double] piece wafer restraint ring. The lower part of the metal ring is covered with a molded plastic ring, so that the two are fast and stable. It has the effect of fast manufacturing and stable combination. 4. A second object of the present invention is to provide a method for manufacturing a multiple [double] piece wafer restraint ring t, which uses a molded plastic ring to mold a [molding] covering a fitting portion on a lower surface of a metal ring, so that the plastic ring is molded. It is quickly and firmly bonded to the metal ring when it is formed, which has the effect of making it fast and stable. According to the wafer restraint ring of the present invention, the restraint ring system includes a metal ring such as stainless steel, and the lower surface of the metal ring has a fitting portion, such as a ring-shaped fitting protrusion or groove. Preferably, the fitting ring The joint is formed with a radial fitting groove. The lower surface of the metal ring is molded with a molded plastic ring, such as PP S engineering plastic. The molded plastic ring has a central opening for positioning a wafer.

第8頁 569376 五、發明說明(4) ' 模製塑膠環在模製形成過程中包覆金屬環之嵌合部,以建 到快速穩固的一體結合,較佳地,在金屬環之下表面形成 有一預模處理層宙pre-molding treating layer宛,如報 才造面或界面黏結材宙interface bonding material宛。 依本發明之晶圓拘束環之製造方法,首先提供一金屬 環,該金屬環係具有一上表面及一下表面,其中該上表面 係供裝設於一研磨基座,該下表面係形成有至少一嵌合 部;之後’模製一模製塑膠環於該金屬環之該下表面,其 係將PPS工程塑膠射出成型於由該金屬環與模具所形成之 模八’该PPS工程塑膠係包覆該金屬環之篏合部,當該 工程塑膠成形為一結合於該金屬環之模製塑膠環後,該 製塑膠環係具有一中心開口,以供一待磨晶圓之定位。、 【實施方式】 請參閱所附圖式,本發明將列舉以下之實施例說明·· 依本發明之一具體實施例,如第3圖所示,本發明之曰 圓拘束環1係為多〔雙〕件組合,用以裝設於化學機^ 磨〔CMP〕設備之研磨基座,以組合成用以拘束及定位一 待磨晶圓之研磨頭,該晶圓拘束環丨主要包含有一在上 位之金屬環10以及一在下部位之模製塑膠環2〇,盆中 屬環10係可為不錄鋼材質或其它硬質材料 3圖厂 ,:金屬環Η係具有一上表⑽及一下表面12,該圖上斤 供研磨基座’例如可在上表面11設有螺孔13, 二Ϊ王、,且如第3及4圖所示,該金屬環1 0之下表面i 係形成有嵌合部",如一體成形於該下表面12::=Page 8 569376 V. Description of the invention (4) '' The molded plastic ring is covered with the fitting part of the metal ring during the molding process to build a fast and stable integrated combination, preferably, the surface under the metal ring A pre-molding treating layer is formed, such as surface coating or interface bonding material. According to the method for manufacturing a wafer restraint ring according to the present invention, a metal ring is first provided. The metal ring has an upper surface and a lower surface, wherein the upper surface is for mounting on a grinding base, and the lower surface is formed with At least one fitting portion; afterwards, 'mold a molded plastic ring on the lower surface of the metal ring, which is formed by injection-molding PPS engineering plastic on a mold formed by the metal ring and a mold' After the coupling portion covering the metal ring is formed into a molded plastic ring combined with the metal ring, the plastic ring has a central opening for positioning a wafer to be ground. [Embodiment] Please refer to the attached drawings. The present invention will enumerate the following embodiment description. According to a specific embodiment of the present invention, as shown in FIG. 3, the circular restraint ring 1 of the present invention is mostly [Double] -piece assembly for mounting on a polishing base of a chemical machine CMP [CMP] equipment to form a polishing head for restraining and positioning a wafer to be polished. The wafer restraint ring 丨 mainly includes a The metal ring 10 in the upper position and a molded plastic ring 20 in the lower part. The ring 10 in the basin can be made of non-steel material or other hard materials. The metal ring series has an upper surface and a lower surface. Surface 12, the figure is provided for grinding the base. For example, screw holes 13 and two kings can be provided on the upper surface 11, and as shown in FIGS. 3 and 4, the lower surface i of the metal ring 10 is formed. There is a fitting portion ", such as integrally formed on the lower surface 12 :: =

第9頁 569376Page 9 569376

或肷合凹槽,在本實施例中 座,以利於機械加工且又不糸為%狀嵌口凸 合部14之# 处/衫響螺孔13之分佈位置,該嵌 地,如第4及R ^ 、係可為倒「Τ」形或鳩尾形等等,較佳 人凹押1 5 、二所不,嵌合部1 4之下表面係形成有徑向嵌 口 曰,以乓進對模製塑膠環20之結合性,嗜模製塑# 環20係為模製〔_1Η· Ί… 口注茨模t塑膠 19播制I〔moldlng〕成形於該金屬環10之下表面 K,模I塑膠環2〇係可為1>1^宙1>〇1丫1)1^1^161^ su 1 phi de象笨硫化物〕或其它軟質工程塑膠等材質,其 材質係在化學機械研磨過程有足夠之鈍化安定狀態,、以^方 止其被,耗粒子與研磨中晶圓產生作用,該模製塑膠環2 〇 係包覆該金屬環10之嵌合部14,並且該模製塑膠環2〇係具 ^ ^中〜開口 21 ’用以定位一待磨晶圓,該中心開口之直 考工係可為四、六、八或十二吋,較佳地,在金屬環1 0之下 表面12形成有一預模處理層宙pre — m〇1 ding treating layer犯’如粗糖面宙⑶”“ surafce宛或界面黏結材宙 interface bonding material宛,用以增進與模製塑膠環 2 0之結合。 關於上述之晶圓拘束環之製造流程係如第6圖所示,首 先在準備步驟31中,提供一具有嵌合部14之金屬環1〇,作 為晶圓拘束環1之硬質上環,利用機械加工或其它方法使 ~金屬環1 0形成有預定形狀之嵌合部1 4,之後,執行一模 製步驟32宙molding process宛,將金屬環10置於模具, 由金屬環10之下表面12與模具形成一模穴,將PPS工程塑 膠射出成型於該模穴,且包覆該金屬環1()之嵌合部14,並Or a recessed groove, which is seated in this embodiment to facilitate machining and not to be the # position of the% -shaped indented convex joint portion 14 / the distribution position of the shirt ring screw hole 13, the inlayed ground, as in Section 4 And R ^, can be inverted "T" shape or dovetail shape, etc., it is better to recess 1 5 and Er Suo. The lower surface of the fitting portion 14 is formed with a radial indentation. The binding properties of the molded plastic ring 20, and the indulgence of the molded plastic # ring 20 is molded [_1Η · Ί ... Mouth moulding t plastic 19 broadcast I [moldlng] is formed on the lower surface K of the metal ring 10, mold I plastic ring 20 series can be 1 > 1 ^ Zhou1 > 〇1 丫 1) 1 ^ 1 ^ 161 ^ su 1 phi de like stupid sulfide] or other soft engineering plastics and other materials, the material is based on chemical mechanical grinding The process has sufficient passivation and stability to stop the quilt. The particles and the wafer have an effect during grinding. The molded plastic ring 20 covers the fitting portion 14 of the metal ring 10, and the molding The plastic ring 20 is provided with a middle opening 21 ′ for positioning a wafer to be polished. The direct test system of the central opening can be four, six, eight, or twelve inches. Preferably, the metal ring 1 Below 0 The surface 12 is formed with a pre-mold processing layer pre-m〇1 ding treating layer, such as coarse sugar surface, "surafce" or interface bonding material, to improve the bonding with the molded plastic ring. . The manufacturing process of the above-mentioned wafer restraint ring is shown in FIG. 6. First, in the preparation step 31, a metal ring 10 having a fitting portion 14 is provided as a hard upper ring of the wafer restraint ring 1. The metal ring 10 is formed into a fitting portion 14 of a predetermined shape by processing or other methods. After that, a molding step 32 is performed, and the metal ring 10 is placed in a mold. The lower surface 12 of the metal ring 10 Form a cavity with the mold, inject PPS engineering plastic into the cavity, and cover the fitting portion 14 of the metal ring 1 (), and

第10頁 569376 五、發明說明(6) 在固化成形後PPS工程塑膠形成為模製塑膠環20,此一模 製步驟32 —般僅需要數小時即可完成,在模製步驟32之 後,模製塑膠環20即與金屬環10穩固結合,再執行一精加 工步驟33之後,即製得一晶圓拘束環1,在製造上更為快 速且上下環之間結合穩固。 本發明之保護範圍當視後附之申請專利範圍所界定者為 準,任何熟知此項技藝者,在不脫離本發明之精神和範圍 内所作之任何變化與修改,均屬於本發明之保護範圍。Page 10 569376 V. Description of the invention (6) The PPS engineering plastic is formed into a molded plastic ring 20 after curing. This molding step 32 is generally completed in just a few hours. After the molding step 32, the mold The plastic ring 20 is firmly combined with the metal ring 10, and after a finishing step 33 is performed, a wafer restraint ring 1 is manufactured, which is faster in manufacturing and is firmly bonded between the upper and lower rings. The protection scope of the present invention shall be determined by the scope of the appended patent application. Any changes and modifications made by those skilled in the art without departing from the spirit and scope of the present invention shall fall within the protection scope of the present invention. .

第11頁 569376 圖式簡單說明 【圖式簡單說明】 第1圖:傳統多〔雙〕件式晶圓拘束環之截面圖; 第2圖:傳統多〔雙〕件式晶圓拘束環之製造流程圖; 第3圖:依據本發明之一具體實施例,一晶圓拘束環之截 面不意圖, 第4圖:依據本發明之一具體實施例,該晶圓拘束環之金 屬環下表面示意圖; 第5圖:依據本發明之一具體實施例,沿第4圖5 -5線剖線 不意圖,及 第6圖:依據本發明之一具體實施例,該晶圓拘束環之製 造流程圖。 【元件符號簡單說明】 1 晶圓拘束壞 10 金屬環 11 上表面 12 下表面 13 螺孔 14 嵌合部 15 徑向欲合槽 20 模製塑膠層 21 中心開口 31 提供一具嵌合部之金屬環 32 模製一模製塑膠環於金屬環之下表面且包覆該嵌合部 33 精加工 101 提供一不錄鋼上環 102 提供一管狀PPS>環 103 壓合上環與下環 I 0 4烘烤黏膠 1 0 5 精加工 II 0 拘束環 111 下環 11 2 上環Page 11 569376 Simple illustration of the drawings [Simplified illustration of the drawings] Figure 1: Sectional view of the traditional multiple [double] -piece wafer restraint ring; Figure 2: Manufacturing of the traditional multiple [double] -piece wafer restraint ring Flow chart; Figure 3: According to a specific embodiment of the present invention, a cross section of a wafer restraint ring is not intended, Figure 4: A schematic diagram of a lower surface of a metal ring of the wafer restraint ring according to a specific embodiment of the present invention Figure 5: According to a specific embodiment of the present invention, along the line 5-5 of Figure 4 is not intended to cut, and Figure 6: According to a specific embodiment of the present invention, the manufacturing process of the wafer restraint ring . [Simplified description of component symbols] 1 Wafer restraint 10 Metal ring 11 Upper surface 12 Lower surface 13 Screw hole 14 Fitting portion 15 Radial fit groove 20 Molded plastic layer 21 Center opening 31 Provide a metal with a fitting portion Ring 32 Molded a molded plastic ring on the lower surface of the metal ring and covers the fitting portion 33 Finishing 101 Provides a non-recorded steel upper ring 102 Provides a tubular PPS > ring 103 Presses the upper and lower rings I 0 4 Baked glue 1 0 5 Finishing II 0 Restraint ring 111 Lower ring 11 2 Upper ring

第12頁 569376 圖式簡單說明 113 黏膠層 120 131 支撐板 132 134 間隔軟膜 140 160 研磨基座 緩衝膜 130支撐件 下夾具 133上夾具 晶圓 150研磨墊 in·· 第13頁Page 12 569376 Brief description of the diagram 113 Adhesive layer 120 131 Support plate 132 134 Spacer film 140 160 Grinding base Buffer film 130 Supporting lower fixture 133 Upper fixture Wafer 150 Polishing pad in ·· page 13

Claims (1)

569376 六、申請專利範圍 【申請專利範圍】 1、 一種晶圓拘束環,其包含: 一金屬環,具有一上表面及一下表面,其中該上表面 係供裝設於一研磨基座,該下表面係形成有至少一嵌合 部;及 一模製塑膠環,其係模製於該金屬環之該下表面且包 覆該嵌合部,該模製塑膠環係具有一中心開口,用以定位 一待磨晶圓。 2、 如申請專利範圍第1 項所述之晶圓拘束環,其中該嵌 合部係一體成形於該金屬環。 3、 如申請專利範圍第2 項所述之晶圓拘束環,其中該嵌 合部係為一欲合凸座。 4、 如申請專利範圍第3 項所述之晶圓拘束環,其中該嵌 合部係為環狀之嵌合凸座。 5、 如申請專利範圍第1或4 項所述之晶圓拘束環,其中 該嵌合凸座之下表面係形成有徑向嵌合槽。 6、 如申請專利範圍第1項所述之晶圓拘束環,其中該模 製塑膠環係為PPS工程塑膠。 7、 如申請專利範圍第1項所述之晶圓拘束環,其中該金 屬環之下表面係形成有一預模處理層,用以增進與該模製 塑膠環之結合。 8、 如申請專利範圍第7項所述之晶圓拘束環,其中該預 模處理層係為一粗糙面。 9、 如申請專利範圍第7項所述之晶圓拘束環,其中該預569376 6. Scope of patent application [Scope of patent application] 1. A wafer restraint ring, comprising: a metal ring with an upper surface and a lower surface, wherein the upper surface is provided for mounting on a grinding base, and the lower surface The surface is formed with at least one fitting portion; and a molded plastic ring is molded on the lower surface of the metal ring and covers the fitting portion. The molded plastic ring has a central opening for: Position a wafer to be ground. 2. The wafer restraint ring according to item 1 of the scope of the patent application, wherein the embedded part is integrally formed on the metal ring. 3. The wafer restraint ring as described in item 2 of the scope of patent application, wherein the embedding portion is an assembling protrusion. 4. The wafer restraint ring as described in item 3 of the scope of patent application, wherein the fitting portion is a ring-shaped fitting protrusion. 5. The wafer restraint ring according to item 1 or 4 of the scope of patent application, wherein a radial fitting groove is formed on the lower surface of the fitting protrusion. 6. The wafer restraint ring described in item 1 of the scope of patent application, wherein the molded plastic ring is PPS engineering plastic. 7. The wafer restraint ring described in item 1 of the scope of patent application, wherein a pre-mold processing layer is formed on the lower surface of the metal ring to improve the bonding with the molded plastic ring. 8. The wafer restraint ring according to item 7 of the scope of patent application, wherein the pre-mold processing layer is a rough surface. 9. The wafer restraint ring described in item 7 of the scope of patent application, wherein the 第14頁 569376 六、申請專利範圍 模處理層係為界面黏結材。 .1〇,、、如中,專利範圍第1項所述之晶圓拘束環,其中該 模製塑膠環係於研磨晶圓時同時被磨耗,且該模製塑膠環 ^被磨耗粒子係具有在化學機械研磨過程足夠之鈍化狀 態,以防止與晶圓作用。 11、如申請專利範圍第丨項所述之晶圓拘束環,豆 模製塑膠環之中心開口直徑為四、六或八吋。八 1 2、如申請專利範圍第丨項所述之晶圓拘束環, 模製塑膠環之中心開口直徑為十二吋。 、17 1 3、一種晶圓拘束環之製造方法,其係包含: 提供一金屬環,該金屬環係具有一上表面及一下表 !右。該i表面係供裝設於一研磨基座,該下表面係形 成有至少一嵌合部;及 模製一模製塑膠環於該金屬環之該下表面,复 工程塑膠射出成型於由該金屬環與模具所形成之= 穴,該PPS工程塑膠係包覆該金屬環之嵌合部,告^ 程塑膠成形為一結合於該金屬環模製〜 癤朦捲在且亡 ^ 依衣f修彡衣後,該模製 J膠%係具有一中心開口,以供一待磨晶圓之定位。 14、如申請專利範圍第13項所述之晶圓拘束環之 其中該嵌合部係一體成形於該金屬環。 k 、:中申Λ專人?1圍第1…述之晶圓拘束環之製造方 其中忒嵌合部係為一嵌合凸座。 、二申Λ專:i範圍第15 $所述之晶圓拘束環之製造方 其中该肷合部係為環狀之嵌合凸座。 •參 ?JC!Page 14 569376 VI. Scope of patent application The mold treatment layer is an interface bonding material. .10 ,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,-,,,,,,,,,,,,,-,,, Passive state during the CMP process to prevent interaction with the wafer. 11. According to the wafer restraint ring described in item 丨 of the scope of patent application, the central opening diameter of the bean-molded plastic ring is four, six or eight inches. 8 1 2. As for the wafer restraint ring described in item 丨 of the patent application scope, the center opening diameter of the molded plastic ring is twelve inches. A method for manufacturing a wafer restraint ring includes: providing a metal ring, the metal ring system having an upper surface and a lower surface; right. The i surface is provided for mounting on a grinding base, and the lower surface is formed with at least one fitting portion; and a molded plastic ring is molded on the lower surface of the metal ring, and the engineering plastic is injection-molded on the lower surface. Formed by metal ring and mold = cavity, the PPS engineering plastic is covering the fitting part of the metal ring, and ^ Cheng plastic is molded into a combination with the metal ring molding ~ 疖 疖 rolled in and died ^ 依 衣 f After repairing the clothes, the molded J gel% has a central opening for positioning a wafer to be polished. 14. The wafer restraint ring according to item 13 of the patent application scope, wherein the fitting portion is integrally formed on the metal ring. k: Special person of Zhongshen Λ? The manufacturing method of the wafer restraint ring described in 1st 1st ... wherein the 忒 fitting part is a fitting protrusion. 2. Ershen Λ Special: The manufacturer of the wafer restraint ring described in the 15th range of i, wherein the coupling part is a ring-shaped fitting protrusion. • See? JC! 法 15 法, 16 法, ΦΦ 569376 六、申請專利範圍 1 7、如申請專利範圍第1 3或1 6項所述之晶圓拘束環之製 造方法,其中該嵌合凸座之下表面係形成有徑向嵌合槽。 1 8、如申請專利範圍第1 3項所述之晶圓拘束環之製造方 法,其中於模製步驟之前,該金屬環之下表面係先形成有 一預模處理層,用以增進與該模製塑膠環之結合。 1 9、如申請專利範圍第1 8 項所述之晶圓拘束環之製造方 法,其中該預模處理層係為一粗糙面。 2 〇、如申請專利範圍第1 8 項所述之晶圓拘束環之製造方 法,其中該預模處理層係為界面黏結材。Method 15 method, 16 method, ΦΦ 569376 6. Application for patent scope 1 7. Manufacturing method of wafer restraint ring as described in item 13 or 16 of patent application scope, wherein the lower surface of the fitting protrusion is formed There are radial fitting grooves. 18. The method for manufacturing a wafer restraint ring as described in item 13 of the scope of the patent application, wherein before the molding step, a pre-mold processing layer is formed on the lower surface of the metal ring to enhance contact with the mold. Combination of plastic rings. 19. The method for manufacturing a wafer restraint ring as described in item 18 of the scope of patent application, wherein the pre-mold processing layer is a rough surface. 20. The method for manufacturing a wafer restraint ring as described in item 18 of the scope of patent application, wherein the pre-mold processing layer is an interface bonding material. 第16頁Page 16
TW91134988A 2002-11-28 2002-11-28 Multi(dual)-piece wafer retaining ring and method for fabricating the same TW569376B (en)

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