TW555722B - A method of manufacturing high-temperature sensor with metal/ceramic joint - Google Patents
A method of manufacturing high-temperature sensor with metal/ceramic joint Download PDFInfo
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- TW555722B TW555722B TW091101583A TW91101583A TW555722B TW 555722 B TW555722 B TW 555722B TW 091101583 A TW091101583 A TW 091101583A TW 91101583 A TW91101583 A TW 91101583A TW 555722 B TW555722 B TW 555722B
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- C04B37/00—Joining burned ceramic articles with other burned ceramic articles or other articles by heating
- C04B37/02—Joining burned ceramic articles with other burned ceramic articles or other articles by heating with metallic articles
- C04B37/023—Joining burned ceramic articles with other burned ceramic articles or other articles by heating with metallic articles characterised by the interlayer used
- C04B37/026—Joining burned ceramic articles with other burned ceramic articles or other articles by heating with metallic articles characterised by the interlayer used consisting of metals or metal salts
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K31/00—Processes relevant to this subclass, specially adapted for particular articles or purposes, but not covered by only one of the preceding main groups
- B23K31/02—Processes relevant to this subclass, specially adapted for particular articles or purposes, but not covered by only one of the preceding main groups relating to soldering or welding
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B18/00—Layered products essentially comprising ceramics, e.g. refractory products
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/328—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by welding
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- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
- H05K3/4038—Through-connections; Vertical interconnect access [VIA] connections
- H05K3/4053—Through-connections; Vertical interconnect access [VIA] connections by thick-film techniques
- H05K3/4061—Through-connections; Vertical interconnect access [VIA] connections by thick-film techniques for via connections in inorganic insulating substrates
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- B32B2311/00—Metals, their alloys or their compounds
- B32B2311/02—Noble metals
- B32B2311/06—Platinum
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- B32B2311/00—Metals, their alloys or their compounds
- B32B2311/22—Nickel or cobalt
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2311/00—Metals, their alloys or their compounds
- B32B2311/30—Iron, e.g. steel
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- C04B2237/02—Aspects relating to interlayers, e.g. used to join ceramic articles with other articles by heating
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- C04B2237/30—Composition of layers of ceramic laminates or of ceramic or metallic articles to be joined by heating, e.g. Si substrates
- C04B2237/32—Ceramic
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- C04B2237/343—Alumina or aluminates
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- C04B2237/00—Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
- C04B2237/30—Composition of layers of ceramic laminates or of ceramic or metallic articles to be joined by heating, e.g. Si substrates
- C04B2237/40—Metallic
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- C04B2237/00—Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
- C04B2237/30—Composition of layers of ceramic laminates or of ceramic or metallic articles to be joined by heating, e.g. Si substrates
- C04B2237/40—Metallic
- C04B2237/405—Iron metal group, e.g. Co or Ni
- C04B2237/406—Iron, e.g. steel
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- C04B2237/00—Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
- C04B2237/30—Composition of layers of ceramic laminates or of ceramic or metallic articles to be joined by heating, e.g. Si substrates
- C04B2237/40—Metallic
- C04B2237/408—Noble metals, e.g. palladium, platina or silver
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- C04B2237/00—Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
- C04B2237/50—Processing aspects relating to ceramic laminates or to the joining of ceramic articles with other articles by heating
- C04B2237/62—Forming laminates or joined articles comprising holes, channels or other types of openings
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- C04B2237/00—Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
- C04B2237/50—Processing aspects relating to ceramic laminates or to the joining of ceramic articles with other articles by heating
- C04B2237/68—Forming laminates or joining articles wherein at least one substrate contains at least two different parts of macro-size, e.g. one ceramic substrate layer containing an embedded conductor or electrode
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/09—Use of materials for the conductive, e.g. metallic pattern
- H05K1/092—Dispersed materials, e.g. conductive pastes or inks
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/11—Printed elements for providing electric connections to or between printed circuits
- H05K1/111—Pads for surface mounting, e.g. lay-out
- H05K1/112—Pads for surface mounting, e.g. lay-out directly combined with via connections
- H05K1/113—Via provided in pad; Pad over filled via
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- H—ELECTRICITY
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/03—Conductive materials
- H05K2201/0332—Structure of the conductor
- H05K2201/0335—Layered conductors or foils
- H05K2201/035—Paste overlayer, i.e. conductive paste or solder paste over conductive layer
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- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09209—Shape and layout details of conductors
- H05K2201/095—Conductive through-holes or vias
- H05K2201/0959—Plated through-holes or plated blind vias filled with insulating material
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09818—Shape or layout details not covered by a single group of H05K2201/09009 - H05K2201/09809
- H05K2201/09981—Metallised walls
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/24—Reinforcing the conductive pattern
- H05K3/245—Reinforcing conductive patterns made by printing techniques or by other techniques for applying conductive pastes, inks or powders; Reinforcing other conductive patterns by such techniques
- H05K3/247—Finish coating of conductors by using conductive pastes, inks or powders
- H05K3/248—Finish coating of conductors by using conductive pastes, inks or powders fired compositions for inorganic substrates
Abstract
Description
發明領域: 明:關於-種製作财高溫感测器之金屬 尤其是關於一種應用於製作高溫感測元件以的 i s ',、具有耐南溫、抵抗長時間高週疲勞、可承成夕” 循環及高可靠度等特點。 人夕次熱 發明背景: 在高溫感測元件(使用溫度高於攝氏8〇〇产)的制 中,將會遭遇到金屬與陶究材料的接攝人氏=度)的製程 ”材㈣良好的抗氧化性及言,Field of the invention: Ming: About-a kind of metal for making high-temperature sensors, especially for is', which is used to make high-temperature sensing elements, has resistance to south temperature, resists long-term high-cycle fatigue, and can withstand the evening. " Features such as cycle and high reliability. Background of the Invention: In the manufacture of high-temperature sensing elements (using temperatures higher than 800 ° C), they will encounter the exposure of metals and ceramic materials = Degree) process "material has good oxidation resistance and said,
的陶瓷材料θ φ 一 與屬材料相比較時,絕大# A 溫感測元件之基才反。至 ^用陶竞材料製作高 作之中,往往☆高溫感測元件 一般而一遇到陶瓷與金屬材料的接合問題。 或共價鍵為d材料屬於脆性材質’主要以離子鍵 鍵結方式為金屬:式,而金屬材料屬於韌性材質,主 當這兩種完全且其熱膨脹係數遠較陶竟材料為高 性質相當複雜,I:構的材質加以接合後,其接合界面的 應力、界面的鍵纟ΐΐ分擴散反應、、熱膨服差異所引發之ί 接點於使用中的;」冓造…等’适些因素都有可能造成、 高溫感測元件亦::度降低甚至於t生破壞”匕外,上迷 言,當高溫感則-二犯使用於熱循%的狀態下。舉例而 4几件使用在汽車引擎中時,引擎運轉 于造When comparing the ceramic material θ φ to the base material, the base of the extremely large # A temperature sensing element is reversed. To ^ In the production of high-quality ceramic materials, high-temperature sensing elements are often encountered when joining ceramic and metal materials. Or the covalent bond is d. The material is a brittle material. The ionic bonding method is mainly metal: type, and the metal material is a tough material. The two types are complete and their thermal expansion coefficient is much higher than that of the ceramic material. I: After joining the materials of the structure, the stress at the joint interface, the bond diffusion reaction at the interface, and the ί contact caused by the difference in thermal expansion are in use; It is possible that the high-temperature sensing element is also :: the degree is reduced or even damaged. In addition to the myth, when the temperature is high, the second offense is used in the state of heat cycle. For example, 4 or more are used in cars. When the engine is running, the engine is running
第5頁 1^· ^yrzz 五、發明說明(2) 成向溫;反之,當引擎停止 而復始、日復-日長時間的;日:將回復至室1。如此周 瓷與金屬材料接點位置於使用 ,此咼溫感測元件内陶 測元件的關鍵技術之一。此 之可靠度’為製作此類感 長時間的承受由於引擎運 ,此高溫感測元件亦需能夠 cycle fatigue):而不發生產生的高週疲勞(high 之開發,在技術層次上極為困貝‘:故綜合而言,此類元件 金屬與陶瓷材料間之技人 - ’即“於金屬肖陶竞材料?斤面臨最主要的問題之 後及使用的過程中,因、、θ产^各熱膨脹係數不同,於接合 ::發熱應力的原因,大 程中,局部受熱而引發局部材= : = 於製 力。此熱應力即使是在相同的材料Ϊ =熱; 本身熱膨脹係數的差異所 由,接&材料 即使接合材料内部並無溫度梯度存:由;=;:, 同材料收縮(或膨脹)的大小不同,將: 後内部有熱應力之存在。此類丄2 χ Λτ 熱膨服係、數接合界面及其鄰近區域。 Α10二大。部份常用的金屬材料與結構陶究材料如: :量因^大部分的金屬與陶個 在八接δ面均有大量的熱應力存在。而此種熱應力若Page 5 1 ^ ^ yrzz V. Description of the invention (2) Cheng Xiangwen; conversely, when the engine is stopped and restarted, day after day-long time; day: will return to room 1. In this way, the location of the contact point between porcelain and metal materials is one of the key technologies of ceramic sensing elements in this temperature sensing element. The reliability of this is to make such a long-term endurance. Due to the engine operation, this high-temperature sensing element must also be able to cycle fatigue): no high cycle fatigue (high development is extremely technically difficult) ': Therefore, in general, the technical person between this type of element metal and ceramic materials-' that is, after the main problem and the process of use, the thermal expansion due to The coefficient is different, because of the joint: the cause of thermal stress. In the process, the local material is caused by local heating. = = = The braking force. This thermal stress is even in the same material Ϊ = heat; due to the difference in thermal expansion coefficient itself, Even if there is no temperature gradient in the joining material, the difference between the shrinkage (or expansion) of the material is different from that of the material, and there will be: There is thermal stress inside the back. This kind of 丄 2 χ Λτ thermal expansion Coupling interface and its adjacent area. Α10 is two. Some commonly used metal materials and structural ceramic materials such as: Quantitative factors ^ Most metals and ceramics have a large amount of thermal stress on the δ face of the eight joints. ... and this If stress
第6頁 555722Page 6 555722
五、發明說明(3) 在陶£材料内部引發張應力,將可能造成陶瓷材料本身或 接合界面之破壞。就目前的技術中,有許多方式可被用來 降低此接合界面之熱應力。首先,是利用多層結構來降低 熱應力。舉例來說’利用適當的中間層進行塑性變形而消 =部分熱應力’為一可行的解決之道。此中間層應當具備 南韋刃性、低降伏強度及適中的熱膨脹係數。此法的缺點在 於其材料的組合’特別是中間層材料之選擇是可遇而不可 求的。如果並無適當的中間層材料可用,則此法並不可 行。另外一個值得深思的問題是,如果此接合材料應用於5. Description of the invention (3) Inducing tensile stress inside the ceramic material may cause damage to the ceramic material itself or the joint interface. In the current technology, there are many ways that can be used to reduce the thermal stress of this bonding interface. First, the multilayer structure is used to reduce thermal stress. For example, the use of an appropriate intermediate layer for plastic deformation to eliminate part of the thermal stress is a feasible solution. This intermediate layer should have Nanwei cutting edge, low yield strength and moderate thermal expansion coefficient. The disadvantage of this method is that its combination of materials', especially the choice of the material of the intermediate layer, is met but not required. This method is not feasible if no suitable interlayer material is available. Another question worth pondering is if this bonding material is applied
具有反覆熱循環的環境之中,則中間層將累積巨大的塑性 1形’而最後將導致其破壞。故當接合件應用於具有熱循 壞之環境中時,此法僅能延緩接合件的破壞而並非絕對有 效0 另外一個目前受到相當重視的材料,稱為功能性梯 度材料(FGM,functionally graded materials)。此材In an environment with repeated thermal cycles, the intermediate layer will accumulate a huge plastic shape and eventually cause its destruction. Therefore, when the joint is applied in an environment with thermal cycling, this method can only delay the destruction of the joint, but it is not absolutely effective. Another material that is currently receiving considerable attention is called functionally graded materials (FGM) ). This material
料是藉由配置兩端接合材料之成分梯度變化,來改變接合 材料之熱膨脹係數差異,若能降低接合材料之熱膨脹係數 差異’應當能夠於接合界面之區域内,獲致緩慢熱膨脹係 數變化,藉此以減少其接點鄰近區域,於溫度改變時所引 發之熱應力。此方法可藉由不同成分粉末的混合,經燒結 後而製成上述功能性梯度材料。但應用此法必使用適當 料,若無適合的中間填則無法製iljb功能性 梯度松料。 1行製作高溫感測元件,部分是以印刷雷^^模式,It is expected that the difference in the thermal expansion coefficient of the bonding material can be changed by configuring the composition gradient change of the bonding material at both ends. If the difference in the thermal expansion coefficient of the bonding material can be reduced, it should be possible to obtain a slow thermal expansion coefficient change in the region of the bonding interface, thereby In order to reduce the thermal stress caused by the temperature change near the contact area. In this method, the functional gradient material can be prepared by sintering the powders of different ingredients. However, the application of this method must use appropriate materials, without suitable intermediate filling can not make iljb functional gradient pine. One line makes high-temperature sensing elements, partly in a printed mine ^^ pattern,
第7頁 555722 五、發明說明(4) 基板上以薄^將主^成^白金之薄膜, 皇^瓷基板上侔雷阻i電壓訊號,經t 3 顯 邮專二t 獲小訊號,合! ^^·、、’必=口凡鍵結金晨,維掊良妊且可主 Μ-ϋ。咼溫感測元侔夕全μΙΓΤ, ~I Γ . τ ^ ΓΤ〜..J ^ :一結最大^度一般僅數檄朵丄 7Γ^··二’、j婁愈厚經一燒結德由於合屬! 4 、土 t 號導兔^與基板上薄層合 舍,若將古拉、隹―~~~^-^ ----在製 離而#失功能7 ^ " *-~-—見及·Α^_基板剝 j目較於Page 7 555722 V. Description of the invention (4) The substrate is made of ^ platinum film with a thin ^ on the substrate, and a voltage signal of thunder resistance i on the porcelain substrate is obtained. !! ^^ · ,, ‘must be = Fan Fan bond Jin Chen, Wei Wei is pregnant and can control M-ϋ.咼 Temperature sensing element 侔 xiquan μΙΓΤ, ~ I Γ. Τ ^ ΓΤ ~ .. J ^: The maximum degree of a knot is generally only a few 丄 7Γ ^ ·· 二 ', j Lou Yuhou is a Together! 4. Earth t # rabbit ^ and the thin layer on the substrate, if the Gula, 隹 ~~~~ ^-^ ---- in the control and # lose function 7 ^ " *-~--see And · Α ^ _ substrate peeling
、μλ^α^μλ銲接製程^ 鼓A^·接點,具有產lj1j支術所無支 上金屬斑陶瓷材料接合方 蹇·Α·有自動化程度高_二速度快, Μλ ^ α ^ μλ welding process ^ Drum A ^ · contact, with lj1j branch operation without the support of the metal spot ceramic material joint square Α · Α · has a high degree of automation _ two speed
第8頁 555722 五、發明說明(5) 支術上的可利用拇 發明之簡要說明: 本發明之主要目的係提供一插刹 元件連接訊號導熗 j j :具有耐高溫、抵抗長時間高週疲勞、〜〜 循衣及高可靠度之特點。使用此方法所 =夕次熱 件,將可以長時間的使用於高溫、震χ ς溫感夠元 之下。 及熱循環的環境 本發明中主接黑去係以下列步驟完成: (1)於一陶瓷基板之接點部位形成一預留之孔 二11)製作該陶瓷基板上的鍵結層,該鍵結芦/ 戎孔洞之内壁表面及其周圍部分;及 θ ν形成於 (Hj)於該陶瓷基板上預留之孔洞内填入支撐金 7)於上述陶瓷基板於之接點部位表面’ ⑺於該接點部位套入金屬訊號導線;及作導通層,及 (vi)在該接點部位進行銲接製程,形成銲點。 發明之詳細說明: 裊 合的方、、^發月提/出一種製作耐尚溫感測器之金屬與陶瓷接 ^、抿^具1係利用一接點部分,此接點部位具有耐$ :特m間高週疲勞、可承受多次熱循環及高可靠$ 間的使用於高溫、震動、及熱循環的環境之下 第9頁 555722 五、發明說明(6) f考圖示’詳細說明本發明之具體工藝。第一圖為本發明 中陶瓷基板於銲接前接點部位橫截面之剖面示音圖。第一 陶:是基板,(2)是陶竞基板上預留之工洞,⑺ 的鍵結層,該鍵結層(3)係至少形成於孔洞 (2)之内壁表面及其周圍部分。陶究基板⑴為電的絕緣 :的:=!】的材料為氧化銘。至於鍵結層⑴所使 用的材枓至少需滿足下列三個條件。一 β 料熱膨服係數與陶究基板⑴熱膨脹係數之疋差異γ小愈 τ 溫感測元件於使用中產生的熱應力。其 二:疋鍵結層⑴必需能夠和陶竟基板形成良好的接合。 鍵結:(3 )本身必須能夠耐高溫。為了同時滿足上 Μ=、1 件、’.Ί最常見的做法是使用貴重金屬(Preci ous Metais)粉末與特殊低溶點的陶兗粉末依一定比 (V。塗而佈最於板i1)上,經燒結製程後,形成鍵結層 (3)。而最常使用的貴重金屬粉末是白金粉末。 金紹1次乂上述陶曼基板上預留之孔洞⑺内填入支樓 須與陶究基板⑴之㈣脹屬⑷之熱膨脹係數必 基、鐵,:全::高溫性質。舉例而言,錄基、始 B r 4 . ^ 〇 基複合材料或白金皆可為製作支撐金 屬(4)之材料。此外,管心姑扶u 广F又作兔 結成型後,皆可作為支撐金屬:、t或粉末t壓製或燒 ⑷填入後,㈣此接:金屬』4)。當第二圖中支樓金屬 S中鍵結層(3)的主要功能之一, 第10頁 555722 五、發明說明(7) 是白金粉末比例的貴重金屬粉末(最常使用的 最後,特/低竞粉末混合後燒結而成。 之外圍後號導線(6)預置於導通層⑸ 能夠:ί溫=二金f訊號導線⑷的材質必須 言,鎳二i 支撑金屬⑷進行鋒接。舉例而 之材料。銲接金皆可為製作金屬訊號導線(6) 銲、電漿銲接及電阻銲接等方式。 ^子束知接、鼠 上、?:ϊ! 成銲接後橫截面之剖面示意圖。圖中 上下兩個銲點(7)連接支撐金屬(4)、導通& Μ 訊號導線⑷三個部份,並形成一導通層5):2 f t f 7 -t ® H a a ^的接點0由於此 點部位之直接VVA材广所構成’相較於金屬與陶莞接 本二ίΐ 大幅提升。4求更高經濟效益, 佑"迠蛀斤k之间溫感測兀件’亦可僅進行單面粉末塗 佈、燒結後再進行銲接。 物^ 以銲 是無法直 i 登型所提供銲點坪^主要异以金屬材 之形成,而緊 里週疲勞使用年境之起將遠優於傳统上直捲以銲Page 8 555722 V. Description of the invention (5) Brief description of the available thumb invention on the technique: The main purpose of the present invention is to provide a brake element connection signal guide 炝 jj: It has high temperature resistance and resistance to long-term high cycle fatigue , ~~ Features of high reliability and reliability. The secondary heating parts used in this method can be used for a long time under high temperature and vibration. And thermal cycling environment In the present invention, the main black connection is completed in the following steps: (1) forming a reserved hole in a contact portion of a ceramic substrate 11) making a bonding layer on the ceramic substrate, the key The surface of the inner wall and surrounding parts of the hole / jong hole; and θ ν formed in (Hj) the hole reserved in the ceramic substrate is filled with support gold 7) on the surface of the contact portion of the ceramic substrate The contact part is sheathed with a metal signal wire; and is used as a conductive layer, and (vi) a welding process is performed at the contact part to form a solder joint. Detailed description of the invention: The combination of the square, the metal, the metal, and the ceramic is used to make a temperature-resistant sensor. The metal and ceramic joints ^ and 抿 ^ 1 use a contact part, and this contact part has resistance to $ : High cycle fatigue, can withstand multiple thermal cycles, and high reliability. Use in high temperature, vibration, and thermal cycle environments. Page 9 555722 5. Description of the invention (6) f. The specific process of the present invention will be described. The first figure is a cross-sectional acoustic diagram of a cross section of a ceramic substrate in a contact portion before welding in the present invention. The first pottery: is the substrate, (2) is a hole reserved on the substrate of Tao Jing, the bonding layer of ⑺, the bonding layer (3) is formed at least on the inner wall surface of the hole (2) and the surrounding part. The ceramic substrate ⑴ is an electrical insulation :::! As for the material used for the bonding layer, at least the following three conditions must be satisfied. The difference between the thermal expansion coefficient of the β material and the thermal expansion coefficient of the ceramic substrate γ is smaller τ The thermal stress generated by the temperature sensing element in use. Second: the 疋 bond layer⑴ must be able to form a good bond with the ceramic substrate. Bonding: (3) itself must be able to withstand high temperatures. In order to satisfy M =, 1 piece, '.Ί at the same time, the most common method is to use a precious metal (Preci ous Metais) powder and a special low melting point ceramic 的 powder according to a certain ratio (V. Tu Er cloth is the most suitable for board i1) After the sintering process, a bonding layer (3) is formed. The most commonly used precious metal powder is platinum powder. Jin Shao once: The holes reserved on the above-mentioned Taoman substrate are filled into the branch building. The thermal expansion coefficient of the substrate and the ceramic substrate must be based on the thermal expansion coefficient, iron, and all :: high temperature properties. For example, base materials, starting B 4. ^ 〇 based composite materials or platinum can be used to make the supporting metal (4). In addition, Guan Xingu Fu and Guang F can be used as supporting metal: t or powder t after pressing or firing. After filling in, connect here: metal 4). When one of the main functions of the bonding layer (3) in the branch metal S in the second picture, page 10 555722 V. Description of the invention (7) is a precious metal powder in the proportion of platinum powder (the most commonly used last, special / The low-competition powder is mixed and sintered. The outer rear lead wire (6) is preset on the conductive layer. Able to: ί = = two gold f signal wire ⑷ The material must be said, nickel two i support metal ⑷ for frontal connection. For example And the material. Welding gold can be used to make metal signal wires (6) welding, plasma welding, and resistance welding. ^ The sub-beam is connected, the mouse is on,?: Ϊ! The cross-sectional schematic diagram after welding is completed. The two upper and lower solder joints (7) connect the three parts of the support metal (4), conduction & M signal wires, and form a conduction layer 5): 2 ftf 7 -t ® H aa ^ At this point, the direct VVA material composition is much higher than that of metal and ceramics. 4 For higher economic benefits, you can also use only one-sided powder coating and sintering before welding. Material ^ welding is not straight. The welding joints provided by the type ^ are mainly formed of metal materials, and the fatigue life of the tight end will be much better than the traditional straight coil welding.
第11頁Page 11
1 555722 五、發明說明(8) 接製程(或硬銲製程)所接合的金屬與陶瓷材料接點。 上述之具體實施例是用來詳細說明本發明之目的、 特徵及功效,對於熟悉該項技藝人士而言,根據上述說明 對該具體實施例作部分變更或修改,均不脫離本發明之精、 神範疇。以任何更動與潤飾在不脫離本創作發明之基本精_ 神下,均應屬於本發明之適用範圍。1 555722 V. Description of the invention (8) Metal and ceramic material joints in the joining process (or brazing process). The specific embodiments described above are used to describe the purpose, features and effects of the present invention in detail. For those skilled in the art, according to the above description, some changes or modifications to the specific embodiments will be made without departing from the essence of the present invention. Divine category. Any modification and modification without departing from the basic essence of this invention should belong to the scope of application of this invention.
第12頁 555722 圖式簡單說明 第一圖為本發明中陶瓷基板於銲接前接點部位橫截面之剖 面示意圖。 第二圖為本發明第一圖内陶瓷基板上預留之孔洞中填入支 撐金屬後之剖面示意圖。 第三圖為本發明第二圖於支撐金屬填入後將此接點接點部 位之上下兩端製作導通層後之剖面示意圖。 第四圖為本發明中陶瓷基板於接點部位完成銲接後橫截面 之剖面示意圖。Page 12 555722 Brief description of the drawings The first diagram is a schematic cross-sectional view of a cross section of a ceramic substrate in a contact portion before welding in the present invention. The second figure is a schematic cross-sectional view of a hole reserved in the ceramic substrate in the first figure of the present invention after the supporting metal is filled in. The third diagram is a schematic cross-sectional view of the second diagram of the present invention after the support metal is filled after the conductive layer is formed on the upper and lower ends of this contact point. The fourth figure is a schematic cross-sectional view of the cross section of the ceramic substrate after the soldering is completed at the contact portion in the present invention.
圖式中圖號之簡單說明: 1 -陶曼基板 2 -孔洞 3 -鍵結層 4- 支撐金屬 5- 導通層 6 -金屬訊號導線 7-銲點Brief description of the figure numbers in the drawing: 1-Taurman substrate 2-Hole 3-Bonding layer 4- Supporting metal 5- Conducting layer 6-Metal signal wire 7- Solder joint
第13頁Page 13
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TW091101583A TW555722B (en) | 2002-01-30 | 2002-01-30 | A method of manufacturing high-temperature sensor with metal/ceramic joint |
US10/218,051 US6648208B2 (en) | 2002-01-30 | 2002-08-12 | Method of manufacturing a joint between metal and a ceramic substrate for a high temperature sensor |
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TW091101583A TW555722B (en) | 2002-01-30 | 2002-01-30 | A method of manufacturing high-temperature sensor with metal/ceramic joint |
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Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
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WO2008031366A1 (en) * | 2006-09-13 | 2008-03-20 | Siemens Aktiengesellschaft | Printed circuit board, particularly ceramic circuit board |
US9917372B2 (en) | 2014-06-13 | 2018-03-13 | Nxp Usa, Inc. | Integrated circuit package with radio frequency coupling arrangement |
US10103447B2 (en) | 2014-06-13 | 2018-10-16 | Nxp Usa, Inc. | Integrated circuit package with radio frequency coupling structure |
US10225925B2 (en) * | 2014-08-29 | 2019-03-05 | Nxp Usa, Inc. | Radio frequency coupling and transition structure |
US9887449B2 (en) * | 2014-08-29 | 2018-02-06 | Nxp Usa, Inc. | Radio frequency coupling structure and a method of manufacturing thereof |
DE102015221979A1 (en) * | 2015-11-09 | 2017-05-11 | Robert Bosch Gmbh | Contacting arrangement for a printed circuit board substrate and method for contacting a printed circuit board substrate |
US10228290B2 (en) | 2016-04-13 | 2019-03-12 | Board Of Regents, The University Of Texas System | Systems and methods for wireless temperature sensing |
DE102022204292A1 (en) * | 2022-05-02 | 2023-11-02 | Robert Bosch Gesellschaft mit beschränkter Haftung | Contact arrangement with a welded flexible circuit board |
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US5180440A (en) * | 1988-11-23 | 1993-01-19 | Pace Incorporated | Printed circuit thermocouple arrangements for personnel training and equipment evaluation purposes |
US5209390A (en) * | 1989-07-03 | 1993-05-11 | General Electric Company | Hermetic package and packaged semiconductor chip having closely spaced leads extending through the package lid |
US5497546A (en) * | 1992-09-21 | 1996-03-12 | Matsushita Electric Works, Ltd. | Method for mounting lead terminals to circuit board |
JP3116273B2 (en) * | 1996-04-26 | 2000-12-11 | 日本特殊陶業株式会社 | Relay board, method of manufacturing the same, structure including board, relay board, and mounting board, connection body between board and relay board |
DE19910078A1 (en) * | 1999-03-08 | 2000-09-28 | Bosch Gmbh Robert | Process for increasing the manufacturing reliability of soldered connections |
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2002
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