TW552632B - Gas absorption-type wafer protection device and method thereof - Google Patents

Gas absorption-type wafer protection device and method thereof Download PDF

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Publication number
TW552632B
TW552632B TW91109973A TW91109973A TW552632B TW 552632 B TW552632 B TW 552632B TW 91109973 A TW91109973 A TW 91109973A TW 91109973 A TW91109973 A TW 91109973A TW 552632 B TW552632 B TW 552632B
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Taiwan
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gas
suction
wafer
suction cup
item
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TW91109973A
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Chinese (zh)
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Hui-Chi Su
Song-Tsang Chiang
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Ind Tech Res Inst
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Abstract

The present invention provides a gas absorption-type wafer protection device and method thereof. The structure of the gas absorption-type wafer protection device of the present invention comprises: a degas chuck; degassing device; recess groove of circular plate and outgassing device. The present invention utilizes the way of degassing to absorb the silicon wafer onto the degas chuck, and then the degas chuck is put inside the recess groove of circular plate which is connected to the outgassing device, so as to vent gas to the outgassing channel between the periphery of degas chuck and the recess groove of circular groove, and make the gas spills over from the outgassing channel, which prevents the etching solution from leaking into the silicon wafer side and solves the nonuniform stress problem generated in the well-known technology.

Description

552632 五、發明說明ο) 【發明的應用範圍】 本發明是關於_錄 > 碰 法,特別是關於二種:二=式晶圓保護裝置及其方 晶圓保護裝置及其方^。 ;sa p之蝕刻製程的氣體吸附式 【發明的背景】 現今積體電路开杜 度以及減少封襄尺寸展指為了降低成本、增加可靠 發之列。 ^如’兹刻、黏晶及封裝等製程,均在研 _ 另外於晶圓表面形成電路之後再進行日北钻 程也相當重要。在晶背後:進订曰"蝕刻的製 壞,需要使用具有選擇降二“二,為了避免電路遭到損 甲基銨氫氧化物(TMAH 'Tet刻T進行蝕刻。例如採用四552632 V. Description of the invention ο [Scope of application of the invention] The present invention relates to the recording method, and particularly to two methods: two-type wafer protection devices and methods thereof. The gas adsorption type of sa p etching process [Background of the invention] The opening degree of integrated circuits and the reduction of the size of sealed circuits are meant to reduce costs and increase reliability. ^ Processes such as lithography, die bonding, and packaging are all under development. _ In addition, it is also important to perform the Japan-North drilling process after forming circuits on the wafer surface. Behind the crystal: The damage caused by the "etching" requires the use of a selective drop "two," in order to avoid damage to the circuit. Methyl ammonium hydroxide (TMAH 'Tet carved T. Etch. For example, four

Hydroxlde)^^U ^ ΓΓ Yl 中,带成雷炻i / / ,、對鋁反應小(積體電路製程 宝。但是ΤΜΑΗ^列,之金屬為鋁)較不會造成電路的損 液,氯氧化如/Λ化钟⑽)钱刻 、、右你田如E ^扪1炎-占為蝕刻速度快、價格便宜且溶 鋁。,長,但其缺點為對鋁的選擇性差,同時也會蝕刻 、因此,一種採用晶背保護夾具來保護晶圓的方式可解 /、处的問題。其將晶圓正面朝内安裝於晶背保護夾呈, 蝕刻的部分再進行钱刻,纟改善現有晶背蝕刻 衣程的問冑。目前所使用之晶背保護夾具是以螺絲鎖緊的Hydroxlde) ^^ U ^ ΓΓ Yl, with a thunder 炻 i / /, and a small reaction to aluminum (integrated circuit manufacturing process. However, in the TMAΗ ^ column, the metal is aluminum) is less likely to cause circuit damage, chlorine Oxidation such as / Λ 化 钟 ⑽) Qian Ke, You You Tian, such as E ^ 扪 1 Yan-Zhan is fast in etching speed, cheap in price and soluble in aluminum. It is long, but its disadvantage is that the selectivity to aluminum is poor, and it will also etch. Therefore, a way to protect the wafer with a crystal back protection fixture can solve the problem. It mounts the wafer front side inward on the wafer back protection clip, and then etches the etched part to improve the existing wafer back etching process. The crystal back protection fixture currently used is locked by screws

第4頁 552632 五、發明說明(2) m 曰曰圓夾在晶背保護夾具的上 膠壞(0-r 1 ng)作| μ装也 > 、低I之間,再以橡 用螺絲鎖緊或是其他;:::二應=緩衝。然而,使 械應力的影響造成曰η二1"'、、工固定晶圓,會因為機 的情形。 成aB0的受力不均’進而使晶圓產生破片 此外還有一種晶圓的保護方法兔· * 部分披覆高分子(PQlyme〇^,再開始4 ·在欲保護之晶圓 但是,w方式並需在:* 合易屋生同分子殘留的問題。 【發明之目的與概述】 鑒於以上習知技術的問題,本發明一 式:曰圓保護裝置及其方*。本發明係利用氣體 2曰曰囫保護裝置密合於晶圓表面,並進—步利用氣體星力 來防止蝕刻液的滲漏來達到保護晶圓的目的。 用曰==在::善習知技術的缺"決-般使 列;:二二:iΛΑ保5曰曰圓常常會發生的晶圓破片以及蝕 題。以及使用高分子層保護方法的製_ 層殘留的缺點。此外Μ吏用本發明之晶圓保護裝 置可配合氫氧化鉀(ΚΟΗ)蝕刻液進行蝕刻,當然也沒有使 ^ΤΜΑΗ蝕刻液所產生的蝕刻速度緩慢並且價格昂貴的問 本發明提供一種氣體吸附式晶圓保護裝置及其方法, _ 552632 五、發明說明(3) 人^月所提供之氣體吸附式晶圓保護裝置,裝置的会士構包 ^有j抽氣吸盤、抽氣裝置、圓盤凹槽及出氣裝置f其連 f關係與特徵為··抽氣吸盤係覆蓋住矽晶圓所欲保護^部 ^ 其抽氣吸盤還包含了抽氣通路。抽氣通路連接於抽氣 ^置’抽氣裝置利用抽氣的方式使矽晶圓吸附於抽氣吸瑕i 二保^以於進行石夕晶圓#刻時防止儀刻液侵钱到矽晶圓所 ^古、°蔓的部分。其抽氣吸盤係置於圓盤凹槽内,圓盤凹样 ^ :度係高於抽氣吸盤,抽氣吸盤與圓盤凹槽之間隙係7 一,氣通路。圓盤凹槽係連接於出氣裝置,出氣裝置/ ^^體至出氣通路,使氣體由出氣通路溢出,以防止^ 刻液由晶圓的側面滲入。 々此蝕 盤凹ϊ:好i發!之氣體吸附式晶圓保護裝置所使用的圓 成抽2::::雙更!:用雙層結構之夹層部分开 1 :附於抽氣吸盤時更加;合更=置使 吸盤與矽晶圓密合。其彈性二3,再啟動抽氣裝置使抽氣 性。 ’、體而要可以抵抗钱刻液的腐餘 配合本發明之氣體吸附式 之吸附式晶圓保護方法,步曰^保濩衣置虱體,本發明 式晶圓保護裝置,其結構盥特::有::先提供氣體吸附 使用出氣裝置通入氣體於圓ί乳的方式吸附於抽氣吸盤; 孔體於Η盤凹槽與抽氣吸盤所形成之出Page 4 552632 V. Description of the invention (2) m said that the circle is clamped on the back of the crystal back protection fixture (0-r 1 ng) to make it bad | μ 装 也 > between low I, and then use rubber screws Locking or other; ::: Two should = buffer. However, the effect of mechanical stress on the wafer can be caused by the machine condition. The uneven force of aB0 'will cause the wafer to break apart. There is also a method for wafer protection. * Partially coated with polymer (PQlyme〇 ^, restart 4) On the wafer to be protected, however, the w method And need to: * The problem of biomolecular residues in Heyiwu. [Objective and Summary of the Invention] In view of the problems of the above-mentioned conventional technology, the present invention has a formula: a round protection device and its method *. The invention uses a gas. The protection device is tightly attached to the surface of the wafer, and further uses gas star power to prevent the leakage of the etching solution to achieve the purpose of protecting the wafer. Use == 在 :: The lack of good knowledge technology " Decision- General column: 22: iΛΑ 保 5 wafer breakage and erosion problems that often occur in the circle. And the disadvantages of using the polymer layer protection method to make layer residues. In addition, the use of the wafer protection of the present invention The device can be etched with a potassium hydroxide (K0 液) etchant, and of course, it does not make the etching speed produced by the ^ TMAΗ etchant slow and expensive. The present invention provides a gas adsorption wafer protection device and method, _ 552632 V. Invention Explanation (3) The gas-adsorbed wafer protection device provided by the person ^ month, the unit's academic structure includes a suction suction cup, a suction device, a disc groove, and a gas outlet device. ·· Exhaust suction cup covers the silicon wafer to protect it ^ The exhaust suction cup also includes an exhaust path. The exhaust path is connected to the exhaust air exhaust device. The exhaust device uses the exhaust method to make the silicon wafer Adsorbed to the suction and suction flaws. The second guarantee is to prevent the engraving liquid from invading money on the silicon wafers when the stone is being carved. The suction cup is placed in the groove of the disc. Inside, the disc concave sample ^: The degree is higher than the suction cup, the gap between the suction cup and the disc groove is 7.1, the air passage. The disc groove is connected to the air outlet device, the air outlet device / ^^ 体 到The gas outlet path allows the gas to overflow from the gas outlet path to prevent the etch solution from infiltrating from the side of the wafer. 蚀 This etched disk is recessed: Good hair! The round absorption pump used by the gas adsorption wafer protection device 2 ::: : Double more !: Use the double-layer structure of the sandwich part to open 1: It is even more when attached to the suction suction cup; Closer = put the suction cup close to the silicon wafer. Its elasticity 2 and 3, Then start the air extraction device to make the air extraction. 'The body must be able to resist the scum of the liquid engraved liquid and cooperate with the gas adsorption type adsorption wafer protection method of the present invention. The structure of the wafer protection device is as follows: Yes :: First, gas adsorption is provided and the gas is sucked into the suction sucker by using the gas outlet device to pass gas into the round milk; the hole is formed by the groove of the pan and the suction sucker. Out of

【較佳實施例說明】 本發明 是配合氣體 式使晶圓保 防止钱刻液 具所谷易造 式晶圓保護 均造成的問 以有效的隔 在本發明實 凹槽及出氣 利用密封裝 封裝置為置 護裝置 晶圓表 明特別 渗漏的 晶圓均 出氣裴 會產生 了由抽 氣體吸 附於抽 與矽晶 所揭露 吸附式 護裝置 的滲漏 成的破 裝置可 題;而 離蝕刻 施例中 裝置所 置使矽 放於抽 之氣體 晶圓保 密合於 。本發 片以及 以提供 且配合 液,不 ,包含 組成的 晶圓吸 氣吸盤 曰曰_保 的設計 面,並 是解決 問題。 勻的吸 置所形 #刻液 氣吸盤 附式晶 氣吸盤 圓的接 護裝置 ,以氣 且利用 習知的 本發明 附力, 成的氣 漏滲的 、抽氣 圓保護 時更加 合面之 久丹万法, 體吸附的方 氣體壓力來 晶背保護夾 之氣體吸附 避免應力不 體隔離層可 問題。 裝置、圓盤 裝置。並且 也、合,其密 一圓形橡膠[Description of the preferred embodiment] The present invention is compatible with the gas type to prevent the wafer from being damaged by the easy-to-fabricate wafer protection caused by the liquid engraving tool. It is effectively separated from the solid groove of the present invention and the air is sealed with a seal. The device is a protection device wafer, which indicates that all leaked wafers are outgassing, and a broken device caused by the leakage of the suction gas to the suction protection device disclosed by the suction and silicon crystal can be generated; The middle device is placed so that the silicon wafer is put in the pumped gas wafer and kept secretly. This chip, as well as the solution provided, does not include the design surface of the wafer suction chuck, and it is a solution to the problem. Shaped uniformly engraved #engraved liquid gas suction cup attached crystal gas suction cup round connection device, using gas and the use of the conventional force of the invention, the formation of gas leakage, the extraction circle protection is more close to the surface In the Jiudan Wanfa method, the pressure of the gas adsorbed by the square gas to the gas adsorption of the crystal back protection clip can avoid stress and the problem of the body isolation layer. Device, disc device. And also, close, its dense a round rubber

552632 五、發明說明(5) 環(0-r i ng) 保護i ί : ΓΛ ’ Λ為本本發二實,例之氣體吸附式晶圓 保護裝置是由抽氣;盤20、』;;=之:f吸附式晶圓 |裝置,組成。其中,抽氣;;= 層圓般之内層圓盤21與外層圓盤22結合::結内 句圓盤21係組合在外 。而成。内 氣通路。内i 厚度約為5公厘(_)。尤其内層圓卜4®起之邊緣的 件。然後,將抽氣裝ΐ3;=容納石夕晶圓10表面的元 2氣通路吸附在抽氣吸盤2。上抽;ί:抽使梦晶圓10經 10能夠牢靠且4 = 等高的結構,使… 其次,再將抽氣吸盤2〇 盤20上。 吸盤20與圓盤凹的3在一圓盤凹槽40内,抽氣 路則連接出氣裝』以;虽的距離形成出氣通路,出氣通 吸盤20與圓盤凹样 $,乳裝置50即可使氣體由抽氣 離層以防止兹刻r:侵==之間溢出’形成氣體隔 措4〇的邊緣需高於抽氣==邊緣。需注意圓盤凹 此外,本發明每# 乂 ,片 Γ緣。 用的圓盤凹桿之分二也列之軋體吸附式晶圓保護裝置所使 氣吸盤可設計兔_二可為不鏽鋼與鐵氟龍其中之一。且抽 部分形成抽氣通政衣狀的雙層結構,利用雙層結構之夾層 乳通路。以及抽氣吸盤可設計為在其邊緣具有 第8頁 552632552632 V. Description of the invention (5) Ring (0-ri ng) protection i ί: ΓΛ 'Λ is based on the present invention, the example of a gas adsorption wafer protection device is pumping; disk 20, "; = = : F adsorption wafer | device, composition. Among them, pumping air;; = the inner layer disk 21 is combined with the outer layer disk 22 like a layer of circle :: inside the sentence disk 21 is combined outside. Made. Internal air passage. The thickness of inner i is about 5 mm (_). In particular, the edges of the inner round rim 4®. Then, the suction device 3; = the element 2 gas passage that holds the surface of the Shi Xi wafer 10 is adsorbed on the suction cup 2. Pumping up; ί: Pumping makes the dream wafer 10 through 10 secure and 4 = a structure of equal height, so that ... Secondly, the suction sucker 20 is set on the tray 20. The suction cup 20 and the concave 3 of the disk are in a disk groove 40, and the exhaust path is connected to the air outlet. "Although the distance forms an air outlet path, the air outlet suction cup 20 and the disk are concave, and the milk device 50 can be The gas should be separated from the layer by pumping to prevent the moment r: invasion == overflow between the edges to form a gas barrier measure 40. The edge must be higher than the pumping == edge. It should be noted that the disc is concave. In addition, each edge of the present invention has an edge. The two parts of the disc concave rod and the rolling body adsorption type wafer protection device are used to make the air suction cup can be designed as a rabbit_two can be one of stainless steel and Teflon. And the pumping part forms a double-layered structure with a suction-type garment, using the sandwich milk channel of the double-layered structure. And the suction suction cup can be designed to have

圓吸附於抽氣吸般時更:更包含使用密封裳置使矽晶 裝置為置放於抽J吸般:::二本發明實施例使用之密封 (O-ring),於啟圓的接合面之一圓形橡膠環 氣吸盤心=:氣裝置時圓形橡膠環(一)能使抽 明少S ί本發明實施例之氣體吸附式晶圓保護裝置,本發 =-^附式晶圓保護方法,包含下列所述步驟。首 抽二Ϊ前述之氣體吸附式晶圓保護裝置。接I,再啟動 ,衣置30將矽晶圓丨〇之欲保護面利用抽氣的方式吸附於 抽,吸盤20,暴露出矽晶圓1〇之待蝕刻面。接下來,使用 出乳装置50通入氮氣或是空氣於圓盤凹槽4〇與抽氣吸盤2〇 =形成之出氣通路,使氣體由出氣通路溢出以形成氣體隔 離層防止蝕刻液滲入。接續著,通入的氮氣或是空氣的壓 力可適當的調整在1至10〇sccm。最後,則可使用蝕刻液開 始進行矽晶圓之钱刻。The circular adsorption is more effective when the suction is sucked: it also includes the use of a sealed device to place the silicon crystal device in the suction J :: 2: The sealing (O-ring) used in the embodiment of the present invention is connected to the opening of the circle. One of the faces is a round rubber ring air suction cup core =: the round rubber ring when the air device is used (1) can make the pump less light S the gas adsorption type wafer protection device of the embodiment of the present invention, the hair =-^ attach crystal The circle protection method includes the steps described below. First, the aforementioned gas adsorption wafer protection device is pumped. Connect to I and start again. The garment 30 sucks the surface to be protected of the silicon wafer by suction, and the suction cup 20 exposes the surface to be etched of the silicon wafer 10. Next, the milk production device 50 is used to pass nitrogen or air into the air outlet path formed by the disc groove 40 and the suction cup 20 to allow the gas to overflow from the air outlet path to form a gas barrier layer to prevent the infiltration of the etching solution. Next, the pressure of the nitrogen or air to be passed can be adjusted appropriately to 1 to 10 sccm. Finally, the silicon wafer can be etched using an etchant.

上述之氣體吸附式晶圓保護方法,最後的蝕刻步驟可 為將钱刻液置入蝕刻槽,再把矽晶圓與氣體吸附式晶圓保 護裝置浸入蝕刻槽以進行钱刻的步驟。以及,利用圓形橡 膠環(Ο-ring)使矽晶圓吸附於抽氣吸盤時更加密合的步 驟。此外,由出氣通路溢出之氣體的壓力需大於蝕刻液之 液體壓力和抽氣吸盤的抽氣壓力以防止钱刻液滲入,而且 抽氣吸盤的抽氣壓力也需要大於蝕刻液之液體壓力使石夕晶 圓能夠牢靠的固定於抽氣吸盤上。還有,蝕刻液可選用氫 氧化鉀溶液,相較於使用四甲基銨氫氧化物(TMAH,In the above-mentioned gas adsorption wafer protection method, the final etching step may be a step of placing a money engraving solution into an etching bath, and then immersing a silicon wafer and a gas adsorption wafer protection device in the etching bath for money carving. In addition, a round rubber ring (0-ring) is used to make the silicon wafer adhere to the suction chuck more densely. In addition, the pressure of the gas overflowing from the gas outlet path must be greater than the liquid pressure of the etching solution and the suction pressure of the suction cup to prevent the penetrating liquid from penetrating, and the suction pressure of the suction cup must be greater than the liquid pressure of the etching solution. The wafer can be firmly fixed on the suction sucker. In addition, as the etching solution, a potassium hydroxide solution can be used, as compared with the use of tetramethylammonium hydroxide (TMAH,

552632 五、發明說明(7)552632 V. Description of Invention (7)

Tetramethyl Ammonium Hydroxide)# 刻液可降低製程成 〇 以 Λ W本發明之較佳實施例揭露如上所述,然其並非用 精:2 ί 3明’任何熟習相關技藝者,在不脫離本發明之 專作些許之更動與潤飾,因此本發明之 為準。 圍須視本說明書所附之申請專利範圍所界定者Tetramethyl Ammonium Hydroxide) # The etching solution can reduce the manufacturing process to 0. The preferred embodiment of the present invention is disclosed as above, but it is not refined: 2 3 3 'Anyone skilled in related arts will not depart from the present invention. Made a few changes and retouching, so the present invention prevails. It must be as defined by the scope of the patent application attached to this specification

552632 圖式簡單說明 第1圖為本發明實施例之氣體吸附式晶圓保護裝置的 截面示意圖。 【圖 式符號 說 明 ] 10 矽 晶 圓 20 抽 氣 吸 盤 21 内 層 圓 盤 22 外層 圓 盤 30 抽 氣 裝 置 40 圓 盤 凹 槽 50 出 氣 裝 置552632 Brief description of drawings Figure 1 is a schematic cross-sectional view of a gas adsorption type wafer protection device according to an embodiment of the present invention. [Explanation of figure symbols] 10 Silicon crystal circle 20 Suction suction cup 21 Inner layer disc 22 Outer layer disc 30 Exhaust device 40 Disc groove 50 Exhaust device

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Claims (1)

552632 六、申請專利範圍 1. 一種氣體吸附 程,其包含有 一抽氣吸 用以保護及固 路; 抽氣裝 式將該梦晶圓 蝕刻時阻止蝕 一圓盤凹 抽氣吸盤與該 一出氣裝 氣裝置通入一 路溢出形成一 圓的邊緣。 2 ·如申請專利範 置,其中該圓 - 〇 3 ·如申請專利範 置’其中該抽 高起之一内層 4 ·如申請專利範 置’其中該抽 均勻的抽氣孔 5 ·如申請專利範 式曰曰圓保遵裝置,係應用於晶圓之蝕刻製 Ϊ =’係f盘住—石夕晶圓所欲保護的部分, 疋該矽日日圓,該抽氣吸盤係具有一抽氣通 置連接於該插氣通路係並利用抽氣的方 吸附於該抽氣吸盤,用以於進行該矽晶圓 刻液侵蝕到該矽晶圓所欲保護的部分; 槽’该抽氣吸盤係置於該圓盤凹槽内,該 圓盤凹槽之間隙係形成一出氣通路;及 f ’該圓盤凹槽係連接該出氣裝置,該出 ,體至該出氣通路,使該氣體由該出氣通 氣體隔離層’以防止蝕刻液侵蝕到該矽晶 圍第1項所述之氣體吸附式晶圓保護裝 盤凹槽之材料係為不鏽鋼與鐵氟龍其中之 圍第1項所述之氣體吸附式晶圓保護裝 氣吸盤係為一環狀的雙層結構,係由邊緣 圓盤與一外層圓盤結合而成。 ,第1項/斤述之氣體吸附式晶圓保護裝 乳吸盤係為在該抽氣吸盤邊緣具有複數個 0 圍第1項所述之氣體吸附式晶圓保護裝552632 6. Application patent scope 1. A gas adsorption process, which includes a suction suction to protect and fix the road; the suction device prevents the etching of a disc concave suction suction cup and the outgas when the dream wafer is etched The filling device overflows all the way to form a round edge. 2 · If you apply for a patent, where the circle-〇3 · If you apply for a patent, 'where the pumping is one of the inner layers 4 · If you apply for a patent,' where the pumping holes are uniform 5 The Yuen-Yuan device is used for the etching of wafers. '=' F-clamping — the part that Shi Xi wafer wants to protect. 疋 The silicon yen and the suction cup have a suction vent. Connected to the air-intake path system and sucked to the air-exhaust suction cup by means of air-exhaust, used to etch the silicon wafer etching solution to the part to be protected by the silicon wafer; In the disc groove, a gap between the disc grooves forms an air outlet passage; and f 'the disc groove is connected to the air outlet device, the outlet body to the air outlet passage, so that the gas passes through the gas outlet. The gas barrier layer is used to prevent the etching solution from eroding the gas-adsorbed wafer protection mounting groove described in item 1 of the silicon crystal enclosure. The material is the gas described in item 1 of stainless steel and Teflon. The suction type wafer protection and gas suction cup is a ring-shaped double-layer structure. From the edge of the disc and an outer layer bonded disc. The gas adsorption wafer protection device described in item 1 / kg. The milk sucker is a gas adsorption wafer protection device with a plurality of 0s on the edge of the suction cup. 第12頁 552632 六、申請專利範圍 利用該出氣裝置通入一氣體至該圓盤凹槽與該抽氣 吸盤所形成之該出氣通路,使該氣體由該出氣通路溢出 以形成一氣體隔離層用以防止蝕刻液侵蝕到該矽晶圓的 邊緣;及 使用一钱刻液開始進行該石夕晶圓之#刻。 9.如申請專利範圍第8項所述之氣體吸附式晶圓保護方 法,其中更包含將該蝕刻液置入一蝕刻槽,將該矽晶圓 與該氣體吸附式晶圓保護裝置置入該蝕刻槽以進行蝕刻 的步驟。 1 0.如申請專利範圍第8項所述之氣體吸附式晶圓保護方 法,其中該抽氣吸盤係為一環狀的雙層結構,係由邊 緣高起之一内層圓盤與一外層圓盤結合而成。 11.如申請專利範圍第8項所述之氣體吸附式晶圓保護方 法,其中該抽氣吸盤係為在該抽氣吸盤邊緣具有複數 個均勻的抽氣孔。 1 2.如申請專利範圍第8項所述之氣體吸附式晶圓保護方 法,其中該圓盤凹槽之邊緣係高於該抽氣吸盤的外 緣。 1 3.如申請專利範圍第8項所述之氣體吸附式晶圓保護方 法,其中更包含提供一密封裝置使該矽晶圓吸附於該 抽氣吸盤時更加密合的步驟。 1 4.如申請專利範圍第1 3項所述之氣體吸附式晶圓保護方 法,其中該密封裝置係為置放於該抽氣吸盤與該矽晶 圓的接合面之一彈性體。Page 12 552632 VI. Patent application scope Use the gas outlet device to pass a gas to the gas outlet path formed by the disc groove and the suction sucker, so that the gas overflows from the gas outlet path to form a gas barrier layer. In order to prevent the etching solution from eroding the edge of the silicon wafer; and use a coin etching solution to start the #etching of the Shixi wafer. 9. The gas-adsorbed wafer protection method according to item 8 of the scope of the patent application, further comprising placing the etching solution in an etching tank, and placing the silicon wafer and the gas-adsorption wafer protection device in the A step of etching a groove to perform etching. 10. The gas adsorption wafer protection method according to item 8 of the scope of the patent application, wherein the suction cup is a ring-shaped double-layer structure, and an inner layer disc and an outer circle are raised from the edge. Plate combined. 11. The gas adsorption wafer protection method according to item 8 of the scope of the patent application, wherein the suction suction cup has a plurality of uniform suction holes on the edge of the suction suction cup. 1 2. The gas-adsorbed wafer protection method according to item 8 of the scope of patent application, wherein the edge of the disc groove is higher than the outer edge of the suction cup. 1 3. The gas-adsorbed wafer protection method according to item 8 of the patent application scope, further comprising the step of providing a sealing device to make the silicon wafer more densely sealed when it is adsorbed on the suction chuck. 14. The gas-adsorbed wafer protection method as described in item 13 of the scope of the patent application, wherein the sealing device is an elastomer placed on a joint surface of the suction cup and the silicon circle. 552632 六、申請專利範圍 1 5.如申請專利範圍第8項所述之氣體吸附式晶圓保護方 法,其中該由該出氣通路溢出之該氣體的壓力係大於 該蝕刻液之液體壓力。552632 6. Application patent scope 1 5. The gas adsorption wafer protection method according to item 8 of the patent application scope, wherein the pressure of the gas overflowing from the gas outlet path is greater than the liquid pressure of the etching solution. 第15頁Page 15
TW91109973A 2002-05-14 2002-05-14 Gas absorption-type wafer protection device and method thereof TW552632B (en)

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