TW526575B - Electronic part - Google Patents

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Publication number
TW526575B
TW526575B TW090129921A TW90129921A TW526575B TW 526575 B TW526575 B TW 526575B TW 090129921 A TW090129921 A TW 090129921A TW 90129921 A TW90129921 A TW 90129921A TW 526575 B TW526575 B TW 526575B
Authority
TW
Taiwan
Prior art keywords
electronic component
substrate
bumps
bonded
weight
Prior art date
Application number
TW090129921A
Other languages
English (en)
Inventor
Kazunobu Shimoe
Mitsuo Takeda
Toshiaki Takata
Norihiko Takada
Original Assignee
Murata Manufacturing Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Murata Manufacturing Co filed Critical Murata Manufacturing Co
Application granted granted Critical
Publication of TW526575B publication Critical patent/TW526575B/zh

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Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/02Details
    • H03H9/05Holders; Supports
    • H03H9/058Holders; Supports for surface acoustic wave devices
    • H03H9/059Holders; Supports for surface acoustic wave devices consisting of mounting pads or bumps
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
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    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
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    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L24/81Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
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    • H01L2224/02Bonding areas; Manufacturing methods related thereto
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    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
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    • H01L2224/061Disposition
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    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/12Structure, shape, material or disposition of the bump connectors prior to the connecting process
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    • H01L2224/13001Core members of the bump connector
    • H01L2224/13099Material
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    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
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  • Physics & Mathematics (AREA)
  • Acoustics & Sound (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
  • Wire Bonding (AREA)

Description

526575 A7 _______B7_______ 五、發明說明(() 技術領域 本發明有關一種電子部件,該電子郵件包含一電子元 件以及一基板,該基板上安裝該電子元件。 發明背景 近年來’包含電子元件及其上安裝該等電子元件之基 板的電子部件之大小及高度已漸增地變小。在此等情勢中 ,常採用所謂倒裝片製程(flip-flop process)即,其中一電 子元件之一預定表面與一基板之一預定表面係藉由導電凸 塊而機械地或電性地相互連接的方法。 第1A及1B圖係利用相關技術普遍所使用之倒裝片法 電子部件10之個別不同的縱向橫剖面圖。 如第1A及1B圖中所示,電子部件1〇包含一電子元 件20以及一基板30,且該基板30上安裝該電子元件20。 如第1A圖中所示,電子元件20之一預定之功能性表 面120係定位以便以一特定方向(第1A圖中向下地)面向, 且相反於基板30之一預定之安裝表面130,該電子元件20 與基板30藉由金屬凸塊40而彼此電性地及機械地連接, 該金屬凸塊40則插置於該電子元件20與基板30之間。此 外,如第1B圖中所示,爲強化該連接,例如在半導體裝 置領域之中,一般熟知的是充塡樹脂90於電子元件20與 基板30間的方法,使用於上述目的之樹脂90則大致地稱 爲下方充塡物。 然而,在其中電子或類似物係配置於諸如表面聲波元 件之電子元件的功能性表面上且若樹脂黏著於該等功能性 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁) Φ 訂i -線丨— 526575 A7 ____B7 ___ 五、發明說明(>〇 表面時該等元件之功能無法充分地達成時,則無法施加該 下方充塡物。因此,該等電子元件係僅藉由凸塊而機械地 連接於基板的安裝表面,若以電子元件之重量爲主之該等 凸塊之總接觸面積小時,則由於掉落,振動等所造成之外 部機械性負荷,將造成其中電子元件從凸塊脫開之問題, 而劣化了電子部件本身之功能。 發明槪要 本發明已鑑於上述問題而想出。本發明之目的在於提 供一種電子部件,其中一電子元件與一基板可以足夠的強 度相互機械性地接合。 ' 爲達成上述目的,本發明之電子部件含有一電子元件 及該電子元件安裝於其之一基板,電子元件與基板係利用 至少三個凸塊而電性地或機械地相互連接,其特徵爲:藉 電子元件之重量來除接合該電子元件之該等凸塊的總接合 面積所獲之値以及藉電子元件之重量來除接合於基板之該 等凸塊的總接合面積所獲得之値兩者均至少爲8.8mm2/g。 有利的是,若藉電子元件之重量來除接合於該電子元 件之該等凸塊的總接合面積所獲得之値以及藉電子元件之 重量來除接合於該基板之該等凸塊的總接合面積所獲得之 値兩者均至少爲11.6 mm2/g。 此外,較佳地,本發明之電子部件係其中該等凸塊由 Au或一含有Au爲主要成分的合金所構成。 而且,較佳地,本發明之電子部件係其中電子元件及 基板僅藉由凸塊而相互機械性地連接。 4 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁) _ϋ· ϋ ·ϋ n n —1 n 一— ον f ϋ ϋ— n —ϋ n n n I n A7 526575 _ B7____ 五、發明說明(3 ) 而且,在本發明之電子部件中,電子元件可爲一表面 聲波元件,包含·至少一形成在壓電基板上的IDT電極。 根據本發明之電子部件可獲得足夠強度之機械接合, 即使是用於諸如含有其中下方充塡物無法使用以接合電子 元件於基板之表面聲波元件的電子部件之表面聲波裝置。 圖式簡單說明 第1A及1B圖係利用相關技術普遍所使用之倒裝片法 的電子部件之個別不同的縱向橫剖面圖; 第2圖係根據本發明一實施例之電子部件的立體圖; 第3圖係第2圖實施例之電子元件的縱向橫剖面圖; 第4圖係當作一實例電子元件之表面聲波元件的立體 圖,其功能性表面係定位於圖中之上側之上;以及 第5圖係一圖表,顯示藉電子元件的重量來除金屬凸 塊的總接合面積所取得之値與藉掉落測試所測量之故障比 例間之關係。 元件符號說明 (請先閱讀背面之注意事項再填寫本頁) 訂丨丨 •線丨-- 1 電子部件 2 電子元件 3 基板 4 凸塊. 10 電子部件 20 電子元件 21 IDT電極 22 電極墊 5 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 526575 A7 _B7 五、發明說明(Lf ) 30 基板 31 內電極端子 32 外電極端子 40 金屬凸塊 90 樹脂 130,131 安裝表面 較佳實施例之詳細說明 下文中將參照第2至4圖說明本發明一實施例。 第2·圖係根據本發明一實施之電子部件1的立體圖; 第3圖係此實施例之電子部件1之縱向橫剖面圖;此外, 第4圖係一電子元件2之立體圖,其在此實例中係一表面 聲波元件,具有一定位於其上側之上的功能性表面12,當 配向如圖中所示。 在此實施例中,該電子部件1係一表面安裝部件,且 係安裝於一主機板(未圖示)之上。如第2、3、及4圖中所 示,電子部件1包含電子元件2及基板3,例如電子元件2 爲一表面聲波元件,具有至少一 IDT電極形成於一壓電基 板之一預定功能性表面上;基板3係由諸如陶質材料,樹 脂,或類似物所製成,且具有一安裝電子元件2於上之預 定安裝表面。具有電子元件2安裝於該處之基板3覆蓋有 一蓋,且電子元件2亦覆蓋有蓋,雖然並未顯示於第2、3 、及4圖中。 如第4圖中所示,在一表面聲波元件之電子元件2之 中,用於發射一接收一表面聲波之TDT(內指狀)電極21及 6 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁) -------訂---------線~ 526575 A7 _ B7_.___ 五、發明說明(f ) 電極墊_ 22係形成於其一預定功能性表面12之上,該IDT 電極21及電極墊22係形成使得可獲得預定的電性特徵, 例如由金或含有金爲主要成分之合金所構成之金屬凸塊4 係形成於電極墊22之上。在此實施例中,如第4圖中所示 ,一金屬凸塊4係形成於4個金屬墊22之各金屬墊22之 上,用於該等金屬凸塊之形成係採用眾所皆知之打線凸塊 法(wire-bumping method) 〇 若金屬凸塊係以總數1或2個形成時,則可由掉落或 類似者造成之機械性衝擊會將立即施加一諸如動量之力於 電子部件1,所以對於衝擊而言,電子部件1之耐久性將 劣化,爲此理由,較佳地,該等金屬凸塊4係以至少3個 的數目形成。 電極墊22包含導電電極,各導電電極含有鋁(A1)爲主 要成分,其係形成一底部電極上而具有一接點金屬(含有鈦 (T〇、鎳(Ni)、鉻化鎳(NiCr)或類似物爲主要成分之薄膜)插 置於該等墊與底部電極之間,該底部電極係與IDT電極22 同時藉眾所皆知之光成像術所形成,雖然並未顯示於第4 圖之中。 如第2及3圖中所示,內電子端子31係配置於基板3 之預定安裝表面13之上且連接於金屬凸塊4。此外,藉其 可表面地安裝電子部件於一主機板(未圖示)上之外電極端 子32係形成於基板3相反於安裝表面13之面上,內電極 端子31與外電極端子32係藉由形成於基板3之面上之導 體而相互地電性連接。在此實施例中,內電極端子31,外 __ 7 本紙張尺度適用中國國家標準(CNS)A4規格 χ 297公釐) (請先閱讀背面之注意事項再填寫本頁) --------訂---------線""· 526575 A7 ___B7____ 五、發明說明(t ) 電極端子32,及連接該等端子之導體含有鎢(W)爲主要成 分且具有鎳及金分別地依電鍍於該處之上。 在此實例中爲表面聲波元件之電子元件2係藉例如眾 所皆知之倒裝片接合法,利用超音波及熱量二者皆有地經 由金屬凸塊4而電性地及機械地連接及固定於形成在基板 3安裝表面13上的內電極31,電鍍有金之內電極端子31 的表面可由於金-金接合而充分地接合於由金所構成或包含 金之金屬凸塊。應注意的是,並未使用下方充塡物或類似 物,因爲電子元件2爲表面聲波元件。 在上述電子部件1之中,藉電子元件2之重量來除其 中金屬凸塊4與電子元件2相互接合的總面所獲得之値以 及藉電子元件2之重量來除其中金屬凸塊4與基板3相互 接合的總面積所獲得之値二者係設定於8.8 mm2/g,也就是 說,因爲並未使用下方充塡物,此係執行以便防止電子元 件2與基板3之間的機械接合劣化。 下文中將參照第5圖說明藉掉落測試所測量之電子部 件1之故障比例,藉電子元件2之重量來除其中金屬凸塊 4與電子元件2相互接合的總面積所獲得之値,·以及藉電 子元件2之重量來除其中金屬凸塊4與基板3相互接合的 總面積所獲得之値之間的關係。 第5圖係一圖表,顯示藉電子元件2的重量來除其中 金屬凸塊4與電子元件2相互連接之總面積所取得之値與 藉掉落測試所測量之故障比間的關係。 用於掉落測試,製備1〇〇個各含有當作電子元件2之 8 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁) -------訂·-------I 丨 -- 526575 A7 __—_____________B7_____ 五、發明說明() 具有3·52 mm2/g重量之鋰氧鉅(Li Ta 03)之表面聲波元件的 樣品且安裝於基板及接受荷重掉落測試,測量故障比例, 尤其該測試係執行於假設該電子部件將使用於行動電話中 。一樣品係固定於100g重量的上面(即,相反於該重量掉 落時將接觸於地面之面)而以將測量之電子元件2之六面中 的一表面接觸於該重量的上面,使該樣品從1.5米之高度 掉落16次,此係執行用於具有實質矩形平行四邊形的電子 元件2的六面之一。在此掉落測試中,接合於基板3之金 屬塊4的總接合面積係比接合於電子元件2之金屬凸塊4 的總接合面積更大。 在此實施例中,接合於電子元件2之金屬凸塊4的總 接合面積以及接合於基板3之金屬凸塊4的總接合面積將 確定如下。 關於接合於電子元件2的金屬凸塊4的總接合面積, 在倒裝片接合法之中,含有金當作一主要成分之金屬凸塊 4係接觸於含有鋁爲主要成分而形成於電子元件2之上的 電極墊22,而施加超音波或熱量以使金與鋁相互擴散,使 形成金與鋁的合金層,該合金屬會促成接合,所以該合金 層的接合面積係視爲總接合面積。爲確定總接合面積,將 本發明之電子部件1浸入於塩酸之內以溶解含有鋁爲主要 組件的電極墊,藉此,含有金爲主要成分之金屬凸塊4會 分離自電子元件2。金屬凸塊4之表面的觀察顯示金在顏 色上爲金色的’而包含金及鋁之合金層爲灰色,測量分離 前接觸電極墊22以及其上形成鋁及金合金層之各金屬凸塊 9 本紙張尺度適用中酬家標準(CNS)A4規格(210 X 297公爱) ' " " (請先閱讀背面之注意事項再填寫本頁) -------訂·-------. I -- 526575 A7 ____B7___ 五、發明說明( 4之表面部分的面積,該等面積之總計係視爲接合於電子 元件2之金屬凸塊4的總接合面積,利用可執行計算之顯 微鏡來計算其上形成鋁及金合金層之金屬凸塊4部分的面 積。 關於接合於基板3之金屬凸塊4的總接合面積,基板 的接合面積電鍍有金,而金屬凸塊4含有金當作主要成分 ,所以基板3與金屬凸塊4係利用相同形式材料相互接合 。因此,測量各凸塊4之接合面積,且取總面積爲接合於 基板3之金屬凸塊4的總接合面積。各凸塊4之接觸面積 藉紅色檢查法或類似法予以測量,根據紅色檢查法,電子 部件係浸入於組色油墨之內使得電子部件之表面著色紅色 ,之後,使金屬凸塊分離自基板,及測量該基板來著色紅 色之部分的面積。 如第5圖中所示地,對於藉電子元件2之重量來除接 合於電子元件2之金屬凸塊4的總接合面積所獲得之6.000 mm2/g値而言,藉掉落測試所獲得之電子部件1的故障率 爲 3 1 % 〇 此外,對於藉電子元件2之重量來除接合於電子元件 2之金屬凸塊4的總接合面積所獲得之8.000 mm2/g之値而 言,藉掉落測試所獲得之電子部件1的故障率爲15%。 另一方面,對於藉電子元件2之重量來除接合於電子 元件2之金屬凸塊4的總接合面積所獲得之8.800 mm2/g 之値而言,藉掉落測試所獲得之電子部件1的故障率低, 亦即7%。 10 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁) 訂--- 線丨-- 526575 a? B7 ----------^---— 玉、發明說明(了) 用於8.800mm2/g之此値’只有限少數之例子,例如其 中當由於使用者不小心而掉落行動電話小於100次之時, 所以當故障率降低至7%時,可認爲該電子部件1之耐久性 在其實際的使用中實質地沒有問題。 因此,較佳地,藉電子元件2之重量來除接合於電子 元件2之金屬凸塊4的總接合面積所獲得之値係設定於 8.8mm2/g或更高,藉此,可提供具有由掉落所造成之故障 率低的高品質電子部件。更佳地,藉除接合於電子元件2 之金屬凸塊4的總接合面積所獲得之値可設定於 11.6mm2/g或更高,在此例中,掉落測試顯示0%的故障率 ,在實用上可實質較佳地防止掉落所造成的故障。 應注意的是,此掉落測試係涉及其中接觸於基板3之 金屬凸塊4的總接觸面積比接合於電子元件2之金屬凸塊 4的總接合面積更大的例子。相似的結果亦獲得於其中接 合於電子元件2之金屬凸塊4的總接合面積比接觸於基板 3之金屬凸塊4的總接觸面積更大的例子。 雖然上述說明給定了根據本發明一實施例之電子部件 的較佳結構及性質的細節,但應瞭解的是,本發明並未受 限於其中所述之特定處。更特別地,可作成許多修正及變 化。 例如,在此實施例中該等金屬凸塊4係藉打線凸塊法 所形成,但未受限於此方法,例如可藉電鍍法來形成該等 金屬凸塊4。 此外,在此實施例中,可疊層含有鋁爲主要組件的導 _ 11 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁) 訂i 線丨-- A7 526575 _ B7___ 五、發明說明(le) 電材料與接觸金屬來當作電極墊22之結構的實例,但該疊 層並無限制性,該等電極墊22可以同時地與IDT電極21 藉光成像術來形成,層的數目可視需要地選擇。此外’ IDT電極21與電極墊22的組態並未受限於第4圖中所示 之該等組態。 在此實施例中,雖然內電極端子31,外電極端子32 ,以及連接該等電極之導體各具有其中鎳及金係電鍍於鎢 (W)上的結構,但並未受限於此。較佳地’最上層係由金 所製成以用於其對於由金或由含有金爲主要成分之合金所 製成的金屬凸塊的充分連接性。 而且,在此實施例中,雖然該倒裝片接合法採用超音 波及熱量,但可應用使用熱量或超音波之倒裝片接合法而 無任何問題。 此外,在本發明之此實施例中,雖然採用安裝於一$ 機板上之表面安裝部件當作電子部件1以作爲一實例,但 共未受限於此。無庸置疑地,本發明可應用於一包含直接 安裝於主機板上之電子元件的電子部件(圖中未示出)。 產業利用性 根據本發明之電子部件,藉電子部件之重量來除接合 於該電子元件之複數個凸塊的總接合面積所獲得之値以及 藉電子元件之重量來除接觸於基板之凸塊的總接觸面積所 獲得之値二者係設定於8.8mm2/g或更高,或較佳地設定於 11.6mm2/g或更高,因此,可獲得足夠強度的機械性接合 ,即使是用於諸如各含有一表面聲波元件的表面聲波裝置 12 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁) 訂------
-ΙΊ n la ϋ n ϋ n ϋ n I 526575 A7 __B7___五、發明說明(Μ )之其中下方充塡物無法使用於接合電子元件於基板的電子 部件。 (請先閱讀背面之注意事項再填寫本頁) 訂— -線丨·! 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐)

Claims (1)

  1. 526575 B8 C8 D8 六、申請專利範圍 (請先閲讀背面之注意事項再塡寫本頁) 1. -種電子部件(1),其含有一電子元件(2)及該電子元 件(2)安裝於其上之一基板(3),該電子元件(2)與該基板(3) 係利用至少三個凸塊(4)而電性地或機械性地相互連接,其 特徵爲:藉該電子元件(2)之重量來除接合於該電子元件(2) 之該等凸塊(4)的總接合面積所獲得之値以及藉該電子元件 (2)之重量來除接合於該基板(3)之該等凸塊(4)的總接合面 積所獲得之値二者均至少爲8.8mm1 2/g。 2. 如申請專利範圍第1項之電子部件(1),其中藉該電 子元件(2)之重量來除接合於該電子元件(2)之該等凸塊(4) 的總接合面積所獲得之値以及藉該電子元件(2)之重量來除 接合於該基板(3)之該等凸塊(4)的總接合面積所獲得之値二 者均至少爲11.6mm2/g。 3. 如申請專利範圍第1或第2項之電子部件(1),其中 該電子元件(2)及該基板(3)僅藉由該等凸塊(4)而相互機械 性地連接。 4. 如申請專利範圍第1項之電子部件(1),其中該等凸 塊(4)係藉由金或一含有金爲主要成分的合金所製成。 5. 如申請專利範圍第1項之電子部件(1)’其中該電子 元件(2)爲一表面聲波元件,包含至少一形成在一壓電基板 上的IDT電極(21)。 1 2 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐)
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