TW473776B - Oxidation processing unit - Google Patents

Oxidation processing unit Download PDF

Info

Publication number
TW473776B
TW473776B TW089109931A TW89109931A TW473776B TW 473776 B TW473776 B TW 473776B TW 089109931 A TW089109931 A TW 089109931A TW 89109931 A TW89109931 A TW 89109931A TW 473776 B TW473776 B TW 473776B
Authority
TW
Taiwan
Prior art keywords
processing chamber
ozone
chamber container
unit
processing
Prior art date
Application number
TW089109931A
Other languages
Chinese (zh)
Inventor
Masaaki Hasei
Junichi Kobayashi
Kenji Honma
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP11142561A external-priority patent/JP2000332006A/en
Priority claimed from JP11196831A external-priority patent/JP2001023977A/en
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Application granted granted Critical
Publication of TW473776B publication Critical patent/TW473776B/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67098Apparatus for thermal treatment
    • H01L21/67115Apparatus for thermal treatment mainly by radiation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67098Apparatus for thermal treatment
    • H01L21/67109Apparatus for thermal treatment mainly by convection

Abstract

An oxidation processing unit of the invention include a processing chamber vessel having an inside in which a substrate can be placed, said processing chamber vessel having a window through which ultraviolet rays can penetrate, a lamp housing having an ultraviolet lamp which can irradiate ultraviolet rays to the inside of the processing chamber vessel through the window, and a process-gas supplying unit for supplying a process gas including ozone into the inside of the processing chamber vessel. The lamp housing is provided with an intake port for introducing an air for cooling into the lamp housing and an outlet port for exhausting the air for cooling from the lamp housing. The outlet port is connected to an ozone-decomposing unit. When the ultraviolet rays from the ultraviolet lamp are irradiated to the process gas supplied into the inside of the processing chamber vessel, the ozone in the process gas is decomposed to conduct an oxidation process to the substrate placed in the inside of the processing chamber vessel. If ozone is generated in the lamp housing, the ozone can be decomposed to a permitted level by the ozone-decomposing unit when the ozone is exhausted through the outlet port.

Description

473770 A7 五、發明說明(1) 發明背景 發明領域 本發明係關於-種於一處理腔室容器對一基材例如半 導體晶圓進行氧化處理之氧化處理單元。 先前技術之揭示 作為對基材如半導體晶圓進行氧化處理之氧化處理單 元之一,單一基材用之氧化處理單元由曰本專利公開案第 7937^998(1^-97377)等已知。單一基材的氧化處理單 元包括·一處理腔室容器具有一内側其中放置半導體晶圓 ,一處理氣體供給單之用以供給包括臭氧Ο;之處理氣體 至處理腔室容器内側,及一燈罩具有紫外光,其可經由處 理腔至谷器窗口發射紫外光至處理腔室容器内側。來自紫 外燈的紫外光照射處理腔室容器内側臭氧,故臭氧被分解 而對置於處理腔室容器内側的半導體晶圓進行氧化處理。 氧化處理單元中,為了提昇藉燈罩的紫外燈發射紫外 光的效率,較佳維持紫外燈表面溫度於預定溫度(24〇至27〇 °C),如此發明人查驗設置一進氣口及一出氧口於燈罩用 以使冷卻空氣流過其中。此種情況下,紫外燈表面溫度可 經由调整冷卻空氣流過燈罩的流量而維持於預定範圍。通 常出氣口係聯結至熱排放系統。 但於氧化處理單元,當冷卻用空氣流過燈罩時,冷卻 用空氣的氧氣可藉紫外燈發射的紫外光之具有特定波長的 射線以化學方式改變成臭氧。此例中,臭氧可由燈罩排放 至熱排放系統。 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱) (請先閱讀背面之注意事項再填寫本頁) 裝---I L----訂--------- 經濟部智慧財產局員工消費合作社印製 4 五、發明說明(2 ) 此外,若噴淋頭與平台加熱器間的空間小,則處理腔 室容器内側的剩餘臭氧可藉平台加熱器充分熱分解。伸若 贺淋頭與平台加熱器間之空間夠大俾改良氧化處理的均勾 度則剩餘臭乳不足以藉平台加熱器熱分解。此種情況下 ,剩餘臭氧可由處理腔室容器内側排放。 發明概述 本發明意圖有效解決前述問題。本發明之目的係提供 -種氧化處理單元’其中由燈罩排放至熱排放系統的臭氧 可降至容許程度。本發明之另一目的係提供一種可防止臭 氧於燈罩產生的氧化處理單元。 本發明之另一目的係提供一種氧化處理單元,其中由 處理腔室容器内側排放的臭氧可降至容許程度。 經濟部智慧財產局員工消費合作社印製 一種氧化處理單元包含··一處理腔室容器具有一内側 其中可改置基材,該處理腔室容器具有一窗口,紫外線可 穿透該窗口;-燈罩具有-紫外燈,紫外燈可發射紫外光 通過窗口至處理腔室容器内側;一處理氣體供給單元用以 供給一包括臭氧的處理氣體至處理腔室容器内側;一進氣 口用以將冷卻用空氧導入燈罩内部;一出氣口用以由燈罩 排放冷卻用空氣;以及一臭氧分解單元聯結至一出氣口; 其中來自紫外燈的紫外光照射至供給至處理腔室容器内側 的處理氣體,故處理氣體的臭氧被分解而對置於處理腔室 容器内側的基材進行氧化處理。 根據該特色’即使臭氧於燈罩產生,當臭氧通過出氣 口排放時臭氧可被臭氧分解單元分解且降至容許程度。 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 473776 A7 _____ B7 五、發明說明(3) 較佳臭氧分解單元係由一催化單元組成,催化單元具 有種催化劑主要包括二氧化鍾。另外臭氧分解單元係由 -熱分解單元具有-加熱||組成。經由使用此等簡單的臭 氧分解單元,容易分解臭氧。 此外一種氧化處理單元包含:一處理腔室容器具有一 内側其中可設置基材,該處理腔室容器具有一窗口,紫外 線可穿透該窗口; 一燈罩具有一紫外燈,紫外燈可發射紫 外光通過窗口至處理腔室容器内側;一處理氣體供給單元 用以供於一包括臭氧的處理氣體至處理腔室容器内側;一 進氣口用以將冷卻用惰性氣體導入燈罩内部;一出氣口用 以由燈罩排放冷卻用惰性氣體;其中來自紫外燈的紫外光 照射至供給至處理腔室容器内側的處理氣體,故處理氣體 的臭氧被分解面對置於處理腔室容器内側的基材進行氧化 處理。 根據此項特色,可防止臭氧於燈罩内產生。 較佳進氣口及出氣口連通至循環系統使惰性氣體循環 ,循環統設置有一熱輻射器其可輻射由循環系統循環至惰 性氣體之熱量。此種情況下可減少使用的惰性氣體容積而 達成降低成本。 此外,一氧化處理單元包含:一處理腔室容器具有一 内側其中可設置一基材;一處理氣體供給單元用以供給一 種包括臭氧之處理氣體至處理腔室容器内側;一加熱器用 以加熱置於處理腔室容器内側之基材;一排氣系統用以降 低處理腔室容器内側的壓力,以及由處理腔室容器内側排 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公髮) (請先閱讀背面之注意事項再填寫本頁) tr--------- 經濟部智慧財產局員工消費合作社印製 6 473776 經濟部智慧財產局員工消費合作社印製 Α7 Β7 五、發明說明(4) 放氣體;以及一熱分解單元設置於排氣系統用以熱分解臭 氧;其中包括於供給處理腔室容器内側的處理氣體的臭氧 被分解而對設置於處理腔室容器内側的基材進行氧化處理 〇 根據此項特色,由處理腔室容器内側排放的臭氧可降 至容許程度。 | 較佳熱分解單元包括一鋁氧製成的導熱器。此例中即 使由處理腔室容器内側排放的氣體含有氮氧化物(Ν〇χ), 仍可防止熱分解單元被腐蝕而改善其耐用性。 較佳分解臭氧之催化單元係改置於排氣系統之比熱分 解單元之下游部分。此種情況下,未由熱分解單元分解的 剩餘臭氧可藉催化單元有效分解。此外即使於排氣系統的 壓力改變造成處理腔室容器内側產生逆流,仍可防止基材 受治金污染。 較佳一惰性氣體導入單元用以使用惰性氣體稀釋由處 I 理腔室容器内側排放的氣體係設置於排氣系統之比熱分解 單元更上游部分。此種情況下即使由處理腔室容器内側排 放的氣體含有氮氧化物(Ν0Χ),排氣系統的改備及/或催化 單元的催化劑可避免被氮氧化物腐蝕或損壞,原因在於由 處理腔室容器排放的氣體已經以惰性氣體稀釋故。 圖式之簡單說明 第1圖為根據本發明之單一基材用氧化處理單元之第 一具體實施例之示意縱剖面圖; 第2圖為第1圖所示氧化處理單元之第一具體實施之 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 4 I---— II---- I I----— II ^ ----l· I--^-----I 1^ (請先閱讀背面之注意事項再填寫本頁)473770 A7 V. Description of the invention (1) Background of the invention The present invention relates to an oxidation processing unit for oxidizing a substrate such as a semiconductor wafer in a processing chamber container. Disclosure of the prior art As one of the oxidation treatment units for oxidizing a substrate such as a semiconductor wafer, an oxidation treatment unit for a single substrate is known from Japanese Patent Publication No. 7937 ^ 998 (1 ^ -97377) and the like. A single substrate oxidation processing unit includes a processing chamber container having an inner side in which a semiconductor wafer is placed, a processing gas supply unit for supplying a processing gas including ozone, and a lamp cover having the inside of the processing chamber container. Ultraviolet light, which can emit ultraviolet light through the processing chamber to the trough window to the inside of the processing chamber container. The ultraviolet light from the ultraviolet lamp irradiates the ozone inside the container of the processing chamber, so the ozone is decomposed to oxidize the semiconductor wafer placed inside the container of the processing chamber. In the oxidation treatment unit, in order to improve the efficiency of the ultraviolet light emitted by the ultraviolet lamp by the lamp cover, it is preferable to maintain the surface temperature of the ultraviolet lamp at a predetermined temperature (24 to 27 ° C). The oxygen port is in the lamp cover to allow cooling air to flow through it. In this case, the surface temperature of the ultraviolet lamp can be maintained in a predetermined range by adjusting the flow rate of the cooling air flowing through the lamp cover. The air outlet is usually connected to a heat exhaust system. However, in the oxidation treatment unit, when the cooling air flows through the lamp cover, the oxygen of the cooling air can be chemically changed into ozone by the ultraviolet light having a specific wavelength emitted by the ultraviolet lamp. In this example, ozone can be emitted from the lampshade to the heat emission system. This paper size applies to China National Standard (CNS) A4 specification (210 X 297 public love) (Please read the precautions on the back before filling this page) Loading --- I L ---- Order ------- -Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 4 V. Description of the invention (2) In addition, if the space between the sprinkler and the platform heater is small, the remaining ozone inside the processing chamber container can be fully borrowed by the platform heater Thermal decomposition. If the space between the shower head and the platform heater is large enough to improve the uniformity of the oxidation treatment, the remaining stinky milk is not enough to be thermally decomposed by the platform heater. In this case, the remaining ozone can be emitted from the inside of the processing chamber container. SUMMARY OF THE INVENTION The present invention is intended to effectively solve the aforementioned problems. The object of the present invention is to provide an oxidation treatment unit 'in which the ozone emitted from the lamp cover to the heat emission system can be reduced to a tolerable level. Another object of the present invention is to provide an oxidation treatment unit capable of preventing ozone from being generated in a lamp cover. Another object of the present invention is to provide an oxidation treatment unit in which ozone emitted from the inside of a processing chamber container can be reduced to a tolerable level. The Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs prints an oxidation processing unit containing a processing chamber container having an inner side in which a substrate can be changed, the processing chamber container has a window through which ultraviolet light can penetrate; With-ultraviolet lamp, ultraviolet lamp can emit ultraviolet light through the window to the inside of the processing chamber container; a processing gas supply unit is used to supply a processing gas including ozone to the inside of the processing chamber container; an air inlet is used for cooling Air oxygen is introduced into the lamp cover; an air outlet is used to discharge cooling air from the lamp cover; and an ozone decomposition unit is connected to an air outlet; wherein the ultraviolet light from the ultraviolet lamp is irradiated to the processing gas supplied to the inside of the processing chamber container, so The ozone of the processing gas is decomposed, and the substrate placed inside the processing chamber container is oxidized. According to this feature ', even if ozone is generated in the lampshade, when ozone is discharged through the air outlet, ozone can be decomposed by the ozone decomposition unit and reduced to an allowable level. This paper size applies to China National Standard (CNS) A4 specification (210 X 297 mm) 473776 A7 _____ B7 V. Description of the invention (3) The preferred ozone decomposition unit is composed of a catalytic unit. Oxidation bell. In addition, the ozone decomposition unit is composed of a -thermal decomposition unit having -heating ||. By using these simple ozone decomposition units, ozone is easily decomposed. In addition, an oxidation treatment unit includes: a processing chamber container having an inner side in which a substrate can be disposed, the processing chamber container having a window through which ultraviolet rays can penetrate; a lampshade having an ultraviolet lamp, and the ultraviolet lamp can emit ultraviolet light Through the window to the inside of the processing chamber container; a processing gas supply unit for supplying a processing gas including ozone to the inside of the processing chamber container; an air inlet for introducing cooling inert gas into the interior of the lamp cover; an air outlet for The cooling inert gas is discharged from the lampshade; wherein the ultraviolet light from the ultraviolet lamp is irradiated to the processing gas supplied to the inside of the processing chamber container, so the ozone of the processing gas is decomposed and oxidized to face the substrate placed inside the processing chamber container. deal with. According to this feature, ozone can be prevented from being generated in the lampshade. Preferably, the air inlet and the air outlet are connected to the circulation system to circulate the inert gas. The circulation system is provided with a heat radiator which can radiate the heat circulated from the circulation system to the inert gas. In this case, the volume of inert gas used can be reduced to reduce costs. In addition, the oxidation treatment unit includes: a processing chamber container having an inner side in which a substrate can be disposed; a processing gas supply unit for supplying a processing gas including ozone to the inside of the processing chamber container; and a heater for heating and setting The substrate inside the processing chamber container; an exhaust system to reduce the pressure inside the processing chamber container, and the paper is discharged from the inside of the processing chamber container. The paper size applies to Chinese National Standard (CNS) A4 (210 X 297) (Please read the notes on the back before filling out this page) tr --------- Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 6 473776 Printed by the Employee Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs Α7 Β7 5 Explanation of the invention (4) Gas release; and a thermal decomposition unit provided in the exhaust system to thermally decompose ozone; the ozone included in the processing gas supplied to the inside of the processing chamber container is decomposed to the inside of the processing chamber container According to this feature, the ozone emitted from the inside of the processing chamber container can be reduced to an allowable level. | The preferred thermal decomposition unit includes a heat exchanger made of alumina. In this example, even if the gas discharged from the inside of the processing chamber container contains nitrogen oxides (NOx), the thermal decomposition unit can be prevented from being corroded and its durability can be improved. The preferred ozone-decomposing catalytic unit is relocated to the downstream portion of the specific thermal decomposition unit of the exhaust system. In this case, the remaining ozone not decomposed by the thermal decomposition unit can be effectively decomposed by the catalytic unit. In addition, even if the pressure in the exhaust system is changed to cause backflow inside the processing chamber container, the substrate can be prevented from being contaminated with gold. It is preferable that an inert gas introduction unit is used to dilute the gas system discharged from the inside of the processing chamber container with an inert gas, and the gas system is disposed at an upstream portion of the exhaust system than the thermal decomposition unit. In this case, even if the gas discharged from the inside of the processing chamber container contains nitrogen oxides (NOx), the modification of the exhaust system and / or the catalyst of the catalytic unit can be prevented from being corroded or damaged by the nitrogen oxides because the processing chamber The gas discharged from the chamber container has been diluted with an inert gas. Brief description of the drawings. Fig. 1 is a schematic longitudinal sectional view of a first embodiment of an oxidation treatment unit for a single substrate according to the present invention. Fig. 2 is a first embodiment of the oxidation treatment unit shown in Fig. 1. This paper size applies to China National Standard (CNS) A4 (210 X 297 mm) 4 I ---- II ---- I I ----- II ^ ---- l · I-^- ---- I 1 ^ (Please read the notes on the back before filling this page)

供氣官6透過質量-流量_控制器(圖中未顯示)聯結至已知的 經濟部智慧財產局員工消費合作社印製 臭氧化器(圖中未顯示)。氧氣供給臭氧化器作為臭氧原料 。此外小量添加氣體例如氮氣供給臭氧化器改良臭氧 產生效率。 直徑比半導體晶圓W更大的圓形開口形成於處理腔室 谷器1之頂板。紫外光可穿透的窗口 1〇係氣密式附著於圓 形開口。窗口 10可由紫外光可穿透的材料例如水晶製成。 相型燈罩20包括至少一盞紫外燈21透過窗口 1〇設置於處理 腔室容器1之頂板上。 此例中,可設置複數紫外燈21於燈罩2〇。複數紫外燈 21可通過窗口 10發射外光至處理腔室容器丨内側。當紫外 光由紫外燈21照射處理腔室容器丨内侧的氣氛時,氣氛所 含的臭氧(〇3)被分解成氧(〇2)及活性氧(〇+)。半導體晶圓 W因活性氧而進行氧化處理。 各盞紫外燈21於其表面溫度維持預定範圍(24〇至27〇 c)時可更有效發射紫外光。如此經由燈罩2〇形成冷卻系 統,用以維持罩於燈罩20内部的紫外燈21表面溫度於預定 粑圍。冷卻系統可使用空氣冷卻。該例中,冷卻系統有進 氣口22,出氣口23及鼓風機24用於強迫通風。出氣口以連 通至熱排放系統50。催化單元51設置於熱排放系統5〇作為 可分解臭氧的臭氧分解單元。如此即使燈罩2〇内部冷卻空 氣所含的氧被紫外燈21發射的紫外線中具有特定波長(185 毫微米)的射線以化學方式改變或臭氧,催化單元51仍可 分解臭氧。 (請先閱讀背面之注意事項再填寫本頁) η裝-----r---訂------The gas supply officer 6 is connected to a known ozone generator (not shown in the figure) by a mass-flow_controller (not shown in the figure), which is printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. Oxygen is supplied to the ozonator as raw ozone. In addition, a small amount of added gas such as nitrogen is supplied to the ozonator to improve the efficiency of ozone production. A circular opening having a larger diameter than the semiconductor wafer W is formed on the top plate of the processing chamber valleyr 1. The UV-transparent window 10 is air-tightly attached to a circular opening. The window 10 may be made of a material that is transparent to ultraviolet light, such as crystal. The phase-type lamp cover 20 includes at least one ultraviolet lamp 21 disposed on the top plate of the processing chamber container 1 through a window 10. In this example, a plurality of ultraviolet lamps 21 may be provided on the lamp cover 20. The plurality of ultraviolet lamps 21 can emit external light through the window 10 to the inside of the processing chamber container. When the ultraviolet light is irradiated to the atmosphere inside the container of the processing chamber by the ultraviolet lamp 21, the ozone (〇3) contained in the atmosphere is decomposed into oxygen (〇2) and active oxygen (〇 +). The semiconductor wafer W is oxidized by active oxygen. Each ultraviolet lamp 21 can more effectively emit ultraviolet light when its surface temperature is maintained in a predetermined range (240 to 27 ° C). In this way, a cooling system is formed through the lamp cover 20 to maintain the surface temperature of the ultraviolet lamp 21 inside the lamp cover 20 within a predetermined range. The cooling system can be cooled with air. In this example, the cooling system has an air inlet 22, an air outlet 23 and a blower 24 for forced ventilation. The air outlet is connected to the heat exhaust system 50. The catalytic unit 51 is provided in the heat emission system 50 as an ozone decomposition unit capable of decomposing ozone. In this way, even if the oxygen contained in the cooling air inside the lampshade 20 is chemically changed or ozone by ultraviolet rays having a specific wavelength (185 nm) emitted from the ultraviolet lamp 21, the catalytic unit 51 can still decompose ozone. (Please read the precautions on the back before filling out this page) η equipment ----- r --- order ------

n ϋ I $, 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 10 第2圖為燈罩冷卻系統之示意圖。各燈罩20對應各處 腔至谷器,具有一進氧口 22以導入冷卻用空氧至燈罩20 及一出氣口用以排放燈罩2〇的冷卻用空氣。鼓風機24放置 於各燈罩2㈣以強迫將冷卻用空氣由出氣口23吹送至熱排 放系統50。 熱排放系統50係由一主排放管5〇a連通至工廠之另一 排放系統(圖中未顯示),複數副排放管5〇b係各自聯結至 各燈罩2〇之各出氣口23,及一接頭50y聯結主排放管50a及 複數田彳排放管5Gb。催化單元51係設置於各副排放系統湯 。偵測臭氧用的臭氧感測器52設置於各副排放管5〇b位在 比催化單元51更下游部分。 一阻尼器(圖中未顯示)用以防止逆流設置於接頭5〇y ,此處理複數副排放管5〇b接合主排放管5〇a。鼓風機”設 置於主排管50a。鼓風機53之操作容量(功率)係經由考量 由燈罩20排放的空氣量 '催化單元51之排放阻力以及管路 的排放阻力決定。 如第3圖所示,催化單元51包含一對碳狀殼體61及62 。該對殼體61及62各自有一聯結部611)、62b於其中部一周 邊凸緣61c、62c於其周邊部。聯結部611^、6孔具有凸緣61& 、62a。周邊凸緣61c及62c係以螺栓等接合,故催化劑65 被夾置於二線網63及64間且被罩於且固定於該對殼體61及 62内。於催化單元51,氣體可通過的催化劑“面積大。可 使用竺iiS作為催化劑65。但較佳使用二氧化錳作為催化 劑65 ’原因在於二氧化錳遠更耐封且較不可燃。 473776 A7n ϋ I $, this paper size is in accordance with China National Standard (CNS) A4 (210 X 297 mm) 10 Figure 2 is a schematic diagram of the lamp shade cooling system. Each lampshade 20 corresponds to the cavity to the trough, and has an oxygen inlet 22 for introducing cooling oxygen to the lampshade 20 and an air outlet for exhausting the cooling air of the lampshade 20. A blower 24 is placed on each of the lamp covers 2 to force the cooling air to be blown from the air outlet 23 to the heat discharge system 50. The heat emission system 50 is connected from one main exhaust pipe 50a to another exhaust system of the factory (not shown in the figure), and the plurality of auxiliary exhaust pipes 50b are respectively connected to the respective air outlets 23 of each lampshade 20, and A joint 50y connects the main discharge pipe 50a and a plurality of field discharge pipes 5Gb. The catalytic unit 51 is provided in each auxiliary exhaust system. An ozone sensor 52 for detecting ozone is provided at each sub-emission pipe 50b at a position further downstream than the catalytic unit 51. A damper (not shown in the figure) is used to prevent the backflow from being set at the joint 50y. This process involves a plurality of auxiliary discharge pipes 50b joining the main discharge pipe 50a. The “blower” is installed in the main exhaust pipe 50a. The operating capacity (power) of the blower 53 is determined by considering the amount of air discharged from the lamp cover 20 'the discharge resistance of the catalytic unit 51 and the discharge resistance of the pipeline. As shown in FIG. The unit 51 includes a pair of carbon-like casings 61 and 62. Each of the pair of casings 61 and 62 has a connecting portion 611), 62b in the middle, and a peripheral flange 61c, 62c on the peripheral portion. The connecting portion 611 ^, 6 holes It has flanges 61 & 62a. The peripheral flanges 61c and 62c are connected by bolts or the like, so the catalyst 65 is sandwiched between the second wire nets 63 and 64 and is covered and fixed in the pair of casings 61 and 62. The catalytic unit 51 has a large area of a catalyst through which a gas can pass. As the catalyst 65, ZhuiS can be used. However, the use of manganese dioxide as the catalyst 65 'is preferred because manganese dioxide is far more resistant to sealing and less flammable. 473776 A7

五、發明說明(9) 經濟部智慧財產局員工消費合作社印製 其次說明述氧化處理單元之操作如後。 當半導體晶圓W以氧化處理單元處理時,首先設置於 轉運Jk至谷裔13的轉運臂(圖中未顯示)經由閘閥8轉運半 導體晶圓w至處理腔室容器丨内側。半導體晶圓w置於平 台3上且藉靜電夾頭固定。然後結合於平台3的加熱器加熱 半導體晶圓W至預定處理溫度。然後處理腔室容器丨内側 壓力藉由從處理腔室容器1内側排放氣體而被降至預定處 理壓力。處理腔室容器内側的壓力被維持於預定處理壓力 (於真空程度),同時作為處理氣體的臭氧氣體供給處理腔 室容器1内側。臭氧化器產生的臭氧氣體經由供氣管6導入 喷淋頭5且由大量噴氣孔朝向置於處理空間5的平台3上的 半導體晶圓W喷射。 同時,燈罩20之紫外燈21打開俾開始照射紫外光。紫 外光通過水晶製成的窗口 10且進入維持於預定壓力(於預 疋真空程度)的處理腔室容器1内側。然後紫外光通過水晶 製成的噴淋頭5及進入處理空間5的氣氛,該氣氛主要由臭 氧組成。然後臭氧被紫外光分解成氧氣及活性氧。置於平 台3上的半導體晶圓w由於活性氧而進行氧化處理。 氧化處理過程中,冷卻系統主要由進氧口 22,出氣口 23及鼓風機24組成,冷卻系統使冷卻用空氣流經燈罩2〇而 冷卻紫外燈21,俾維持紫外燈21表面溫度於固定範圍。此 例中’流動於燈罩20的冷卻用空氣的氧被紫外燈21發射的 紫外光中具有特定波長的射線以化學方式改變成臭氧。然 後臭氧可連同其地氣體由出氣口23排放至熱排放系統50。 本紙張尺度適用中_家標準(CNS)A4規格(21G x 297公餐) 12 (請先閱讀背面之注意事項再填寫本頁)V. Description of the invention (9) Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs Next, the operation of the oxidation treatment unit will be described as follows. When the semiconductor wafer W is processed by the oxidation processing unit, a transfer arm (not shown) for transferring Jk to the valley 13 is first set to transfer the semiconductor wafer w to the inside of the processing chamber container 丨 via the gate valve 8. The semiconductor wafer w is placed on the stage 3 and fixed by an electrostatic chuck. The heater coupled to the stage 3 then heats the semiconductor wafer W to a predetermined processing temperature. The pressure inside the processing chamber container 丨 is then reduced to a predetermined processing pressure by discharging gas from the inside of the processing chamber container 1. The pressure inside the processing chamber container is maintained at a predetermined processing pressure (at a vacuum level), and ozone gas, which is a processing gas, is supplied to the inside of the processing chamber container 1. The ozone gas generated by the ozonizer is introduced into the shower head 5 through the air supply pipe 6 and is ejected from a large number of air jet holes toward the semiconductor wafer W placed on the platform 3 of the processing space 5. At the same time, the ultraviolet lamp 21 of the lamp cover 20 is turned on and starts to irradiate ultraviolet light. The ultraviolet light passes through the window 10 made of crystal and enters the inside of the processing chamber container 1 maintained at a predetermined pressure (at a pre-vacuum level). The ultraviolet light then passes through the shower head 5 made of crystal and enters the atmosphere of the processing space 5, which atmosphere is mainly composed of ozone. Ozone is then decomposed into oxygen and reactive oxygen by ultraviolet light. The semiconductor wafer w placed on the stage 3 is oxidized by active oxygen. During the oxidation process, the cooling system is mainly composed of an oxygen inlet 22, an air outlet 23, and a blower 24. The cooling system allows the cooling air to flow through the lamp cover 20 to cool the ultraviolet lamp 21, and to maintain the surface temperature of the ultraviolet lamp 21 within a fixed range. In this example, the oxygen of the cooling air flowing through the lamp cover 20 is chemically changed into ozone by the rays having a specific wavelength in the ultraviolet light emitted from the ultraviolet lamp 21. Ozone can then be emitted from the air outlet 23 to the heat emission system 50 along with its gas. This paper size is applicable _ house standard (CNS) A4 specification (21G x 297 meals) 12 (Please read the precautions on the back before filling this page)

^73776 A7^ 73776 A7

五、發明說明(10) 經濟部智慧財產局員工消費合作社印製 /、體實%例中,可分解臭氧的催化單元5 1係設置於連通至 出氣23的田彳排放管50b。如此當臭氧經出氣口 23排放時 可由催化單元5 1的催化劑65分解及降至不超過容許濃度 (O.lppm)。 若催化單元51之催化劑65的能力太過惡化,因而臭氧 通過催化單元51流出’臭氣感測器52感測臭氧(情況)。如 此則可防止臭氧流出,如經由使用臭氧感測器52交互鎖定 改變作業模式成為安全模式而防止臭氧流出。安全模式表 不當臭氧感測器52感測得預定容積的臭氧時紫外燈21熄減 的模式,當臭氧感測器52檢測得小量臭氧時警示燈點亮而 催促更換催化劑的模式等。 本發明非僅限於前述具體實施例而可做各種修改。例 如設置於來自燈罩的熱排放系統之臭氧分解單元可為具有 可以熱方式分解臭氧的加熱器的熱分解單元來替代催化單 疋。此外冷卻用空氣流經前述具體實施例之燈罩,但可使 Ιβ冷it空氣流經燈罩。 第4圖為燈罩之另一冷卻系統之示意圖。於第4圖所示 例中,燈罩20係聯結至惰性氣體循環系統7〇,該系統可使 冷卻用惰性氣體循環通過燈罩20。較佳惰性氣體循環系統 70包含一循管71並可使惰性氣體如氮氣(N2)循環通過燈罩 20,以及設置於循環管71的熱輻射器72可輻射由循環管w 循環的惰性氣體的熱量。 如此為了冷卻紫外燈21 ,使惰性氣體如氮氣(NJ替代 空氣循環通通燈罩2 0。如此於燈罩内部無法產生臭氣。換 -----------—-裝-----r---訂---------線 (請先閱讀背面之注意事項再填寫本頁)V. Description of the invention (10) Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs / Example, the ozone-decomposable catalytic unit 51 is installed in the field discharge pipe 50b connected to the gas outlet 23. Thus, when ozone is discharged through the air outlet 23, it can be decomposed by the catalyst 65 of the catalytic unit 51 and reduced to not more than the allowable concentration (0.1 ppm). If the capacity of the catalyst 65 of the catalytic unit 51 is too deteriorated, ozone flows out through the catalytic unit 51 and the odor sensor 52 senses ozone (case). This can prevent ozone from flowing out, such as by using the ozone sensor 52 to interactively lock it. Changing the operating mode to a safe mode prevents ozone from flowing out. The safety mode indicates a mode in which the ultraviolet lamp 21 is turned off when the ozone sensor 52 senses a predetermined volume of ozone, a mode in which a warning lamp lights up when the ozone sensor 52 detects a small amount of ozone, and urges catalyst replacement. The present invention is not limited to the foregoing specific embodiments and various modifications can be made. For example, an ozone decomposition unit provided in a heat emission system from a lampshade may be a thermal decomposition unit having a heater capable of thermally decomposing ozone instead of a catalytic unit. In addition, the cooling air flows through the lampshade of the foregoing specific embodiment, but Iβ cold air can flow through the lampshade. Figure 4 is a schematic diagram of another cooling system of the lampshade. In the example shown in FIG. 4, the lamp cover 20 is connected to an inert gas circulation system 70, which can circulate the inert gas for cooling through the lamp cover 20. The preferred inert gas circulation system 70 includes a circulation tube 71 and can circulate an inert gas such as nitrogen (N2) through the lamp cover 20, and a heat radiator 72 provided on the circulation tube 71 can radiate the heat of the inert gas circulated by the circulation tube w. . In order to cool the ultraviolet lamp 21 in this way, an inert gas such as nitrogen (NJ replaces the air circulation and passes through the lamp cover 20. Therefore, no odor can be generated inside the lamp cover. Change ------------- install ---- -r --- order --------- line (please read the precautions on the back before filling this page)

本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱) 473776This paper size applies to China National Standard (CNS) A4 (210 X 297 public love) 473776

言之無需設置臭氧分解單元。此外若惰性氣體係由燈罩排 放至熱排放系統,則需y惰,氣體價格極高。如此如第 4圖所示,惰性氣體循環通過燈罩2G,純射器72轄射由 循環系統71循環的惰性氣體之熱量。此例中僅需小量惰性 氣體可遠更降低成本。 一一一— ______________ 前述具體實施例之氧化處理單元屬於冷壁型|土。但 本發明可應用於土靜ϋ。此外前述具體實施例之氧化 處理單it為單基材用處理單元。但本發明可應用至批次 型處理單元。基材可為玻璃基材、LCD基材等而非半導體 晶圓。In other words, there is no need to provide an ozone decomposition unit. In addition, if the inert gas system is discharged from the lampshade to the heat emission system, it needs to be inert, and the gas price is extremely high. In this way, as shown in FIG. 4, the inert gas is circulated through the lamp cover 2G, and the pure emitter 72 radiates the heat of the inert gas circulated by the circulation system 71. In this case, only a small amount of inert gas is required, which can greatly reduce costs. One by one — ______________ The oxidation treatment unit of the foregoing specific embodiment belongs to a cold-wall type | soil. However, the present invention can be applied to soil stillness. In addition, the oxidation treatment unit it of the foregoing specific embodiment is a treatment unit for a single substrate. However, the present invention is applicable to a batch type processing unit. The substrate may be a glass substrate, an LCD substrate, etc. instead of a semiconductor wafer.

— — — — — — — — — I — · I 11 (請先閱讀背面之注意事項再填寫本頁) 然後參照第5至8圖說明本發明之第二具體實施例之進 一步細節。 第5圖為根據本發明之單一基材用氧化處理單元之第 二具體實施例之示意縱剖面圖。第6圖為第二具體實施例 之氣體系統之示意圖。第7圖為氣體系統之催化單元之縱 剖面圖。第8圖為氣體系統之熱分解單元之示意縱剖面圖 l·---^----— — — — — — — — — I — · I 11 (Please read the notes on the back before filling this page) and then refer to Figures 5 to 8 for further details of the second embodiment of the present invention. Fig. 5 is a schematic longitudinal sectional view of a second embodiment of the oxidation treatment unit for a single substrate according to the present invention. Fig. 6 is a schematic diagram of the gas system of the second embodiment. Fig. 7 is a longitudinal sectional view of a catalytic unit of a gas system. Fig. 8 is a schematic longitudinal sectional view of a thermal decomposition unit of a gas system l · --- ^ ----

1· n ϋ ·1 I % 經濟部智慧財產局員工消費合作社印製 參照第5圖,說明第二具體實施例之單一基材用氧化 處理單元之主要構造。單一基材用氧化處理單元包含一處 理腔至谷器1 01 ’其係由耐熱且防触材料如銘製成。排氣 口 102設置於處理腔室容器101底部。棑氣口 1〇2連通至排 氣系統150,具有一真空幫浦151 (排氣單元)及一壓力控制 器,用於由處理腔室容器1〇1内側排放氣體以及降低處理 腔室容器101内側壓力至預定壓力。排氣系統15〇連通至設 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公髮) '^ -- 473776 經濟部智慧財產局員工消費合作社印製 15 A7 __B7 _ 五、發明說明(12) 置於工廠的處理排放管線其具有去除有害材料的單元。 旋轉平台(感測器或夾持器)103設置於處理腔室容器 101用於夫持基材如半導體基材W。靜電失頭設置於平台 103上表面俾以靜電方式黏至半導體晶圓W。此外,加熱 器(圖中未顯示)結合於平台103俾加熱半導體晶圓w至半 導體晶圓W表面一致的預定溫度。 > 噴淋頭1 〇 5設置於處理腔室容器1 〇 1頂板用以供給處理 氣體至半導體晶圓W上表面(欲處理表面)。喷淋頭具 有内部空間及大量噴射孔(圖中未顯示)用以噴射供給於内 部空間處理氣體朝向處理空間s的平台103上的半導體晶 圓W。喷淋頭1 〇 5可由紫外光可穿透的耐熱材料例如較佳 為水晶製成。作為處理氣體之臭氧氣體(〇3)由氣體導入管 1〇6(構成處理氣體供給單元16〇之一部分)供給喷淋頭1〇5 内部空間。 如第6圖所示,處理氣體供給單元16〇具一臭氧化器161 > 。臭氧化器161產生臭氧經由氣體導入管106供給噴淋頭 105。起燃管線162由氣體導入管1〇6分支。然後至臭氧穩 定產生為止,臭氧並未被導入處理腔室容器1〇1内部,反 而經由起燃管線162排放至排氣系統150之排氣管152。 氣體導入管106有個開關閥163。同樣地起燃管線162 有個開關閥164。氧氣(〇2)供給臭氧化器161作為臭氧原料 。此外少量氮氣(N2)適合供給臭氧化器161俾改良臭氧產 生效率。 直徑大於半導體晶圓W之直徑的圓形開口形成於處理 本紙張尺度適用中國國豕標準(CNS)A4規格(21〇 X 297公餐) — II --I I l· I--^ . I--II-- (請先閱讀背面之注意事項再填寫本頁) 吨76 A7 B7 五、 發明說明(B) 腔室容器101的頂板。紫外光可穿透的窗口11〇氣密式附接 於圓形開口。窗口 110可由紫外光可穿透的材料如水晶製 成。晶圓轉運口 1 〇7係設置於處理腔室容器1 〇丨之側壁一部 分。閘閥108設置於毗鄰晶圓轉運口 i 〇7外側。開口 n丨設 置於處理腔室容器101之另一側壁部分。開口 U1用以檢視 處理腔室容器101内側。蓋U2通常設置於毗鄰開口 m外 側。 燈罩120設置於窗口 110。一或多盞紫外燈121設置於 燈罩120。紫外燈121發射紫外光通過窗口 11〇至處理腔室 容器101内部。當紫外光由紫外燈121通過窗口 11〇照射至 處理腔室容器101内側氣氛時,氣氛中所含臭氧(〇3)被分 解成氧氣(〇2)及活性氧(CT)。半導體晶圓w因活性氧而進 行氧化處理。 紫外燈121於表面溫度維持於預定範圍時可更有效率 發射紫外光。如此通過燈罩12〇形成冷卻系統用於維持罩 於燈罩120内部的紫外燈121表示溫度於預定範圍。冷卻系 統有個進氣口 122、一出氧口 123及一鼓風機124用以強迫 通風·出氣口 123聯結至工廠的熱排放系統(圖中未顯示) 如第6圖所示,熱分解單元155可熱分解排放氣體中剩 餘的或混合的臭氧,熱分解單元設置於排放系統15〇之排 氣管152位在比真空幫浦151更上游部分。換言之介於處理 腔室谷器101與真空幫浦15 1間。此外為求更為安全,分解 臭氧催化單元156設置於排放系統15〇之比真空幫浦15丨更 (請先閱讀背面之注意事項再填寫本頁) 裝 :----訂--------- 經濟部智慧財產局員工消費合作社印製 五、 經濟部智慧財產局員工消費合作社印製 ^3?7g 發明說明(Η) 下游部分。經由起燃管線162供給的氣體係經由催化單元 156棑放至排放管152。 如第7圖所示,催化單元156包含:一不銹鋼製成的管 型殼體156k ; —上催化劑156a及一下催化劑1 56b其係設置 於‘型设體156k之轴線方向(於排放氣體之流動方向);一 上臭氧感測器156c係設置於上催化劑156a與下催化劑156b 間;及一下臭氧感測器156d係設置於此下催化劑丨56b更下 游部分。催化劑156a及156b為二氧化錳製成,二氧化錳比 活性碳更為耐熱。 如第8圖所示,熱分解單元155包括一鋁氧製成的熱方 塊155b(導熱器)。詳言之,熱分解單元155具有水晶玻璃 製成的管型本體155a。鋁氧製成的熱方塊155b含大量氣體 通道。熱方塊155b設置於管型本體155&。陶瓷加熱器155c θ又置於管型本體15 5 a外側用以加熱熱方塊15 5 b。冷卻水管 155d設置於陶瓷加熱器155c外側。絕熱蓋155£包圍冷卻水 管155d外側。 至於熱分H元155,可使用不銹鋼製成加熱器。但1 · n ϋ · 1 I% Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs Referring to Fig. 5, the main structure of the oxidation treatment unit for a single substrate of the second embodiment will be described. The oxidation treatment unit for a single substrate includes a processing cavity to the trough device 1 01 ′, which is made of a heat-resistant and anti-contact material such as inscription. The exhaust port 102 is provided at the bottom of the processing chamber container 101. The gas port 10 is connected to the exhaust system 150, and has a vacuum pump 151 (exhaust unit) and a pressure controller for discharging gas from the inside of the processing chamber container 101 and lowering the inside of the processing chamber container 101. Pressure to a predetermined pressure. Exhaust system 15〇 Connected to the paper size Applicable to the Chinese National Standard (CNS) A4 specification (210 X 297 issued) '^-473776 Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 15 A7 __B7 _ V. Description of the invention (12) The processing and discharge pipeline placed in the factory has a unit for removing harmful materials. A rotating platform (sensor or holder) 103 is provided in the processing chamber container 101 for holding a substrate such as a semiconductor substrate W. The electrostatic loss head is disposed on the upper surface of the platform 103 and is electrostatically adhered to the semiconductor wafer W. In addition, a heater (not shown) is coupled to the stage 103 to heat the semiconductor wafer w to a predetermined temperature uniform on the surface of the semiconductor wafer W. > The shower head 105 is set on the top surface of the processing chamber container 101 to supply a processing gas to the upper surface of the semiconductor wafer W (the surface to be processed). The shower head has an internal space and a large number of ejection holes (not shown in the figure) for ejecting the semiconductor wafer W on the platform 103 supplied with the internal space processing gas toward the processing space s. The shower head 105 may be made of a heat-resistant material which is transparent to ultraviolet light, such as preferably crystal. The ozone gas (〇3), which is a processing gas, is supplied to the internal space of the shower head 105 from a gas introduction pipe 106 (constituting a part of the processing gas supply unit 160). As shown in Fig. 6, the processing gas supply unit 160 has an ozonator 161 >. The ozonator 161 generates ozone and supplies it to the shower head 105 via a gas introduction pipe 106. The light-off line 162 is branched from the gas introduction pipe 106. Then, until the ozone is stably generated, the ozone is not introduced into the processing chamber container 101, but is discharged to the exhaust pipe 152 of the exhaust system 150 through the light-off line 162. The gas introduction pipe 106 has an on-off valve 163. Similarly, the ignition line 162 has an on-off valve 164. Oxygen (〇2) is supplied to the ozonator 161 as an ozone raw material. In addition, a small amount of nitrogen (N2) is suitable for supplying 161 俾 of the ozonator to improve the efficiency of ozone production. A circular opening with a diameter larger than the diameter of the semiconductor wafer W is formed to handle the paper size applicable to the Chinese National Standard (CNS) A4 specification (21 × X 297 meals) — II --II l · I-^. I- -II-- (Please read the notes on the back before filling this page) T 76 A7 B7 V. Description of the invention (B) The top plate of the chamber container 101. Ultraviolet light-transmissive window 11 is air-tightly attached to the circular opening. The window 110 may be made of a material that is transparent to ultraviolet light, such as crystal. The wafer transfer port 107 is provided at a part of the side wall of the processing chamber container 10. The gate valve 108 is disposed adjacent to the outside of the wafer transfer port 107. The opening n is provided in the other side wall portion of the processing chamber container 101. The opening U1 is used to view the inside of the processing chamber container 101. The cover U2 is usually provided outside the adjacent opening m. The lamp cover 120 is disposed on the window 110. One or more ultraviolet lamps 121 are disposed on the lamp cover 120. The ultraviolet lamp 121 emits ultraviolet light through the window 110 to the inside of the processing chamber container 101. When ultraviolet light is irradiated to the atmosphere inside the processing chamber container 101 by the ultraviolet lamp 121 through the window 110, the ozone (〇3) contained in the atmosphere is decomposed into oxygen (〇2) and active oxygen (CT). The semiconductor wafer w is oxidized by active oxygen. The ultraviolet lamp 121 can more efficiently emit ultraviolet light when the surface temperature is maintained within a predetermined range. In this way, a cooling system is formed by the lamp cover 120 to maintain the ultraviolet lamp 121 inside the lamp cover 120 to indicate a temperature within a predetermined range. The cooling system has an air inlet 122, an oxygen outlet 123, and a blower 124 for forced ventilation. The air outlet 123 is connected to the factory's heat emission system (not shown). As shown in FIG. The residual or mixed ozone in the exhaust gas can be thermally decomposed. The thermal decomposition unit is arranged in the exhaust pipe 152 of the exhaust system 15 at a position upstream of the vacuum pump 151. In other words, it is between the processing chamber valley device 101 and the vacuum pump 151. In addition, in order to be more secure, the ozone decomposing unit 156 is installed in the exhaust system 15 ° more than the vacuum pump 15 丨 (Please read the precautions on the back before filling this page). ----- Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 5. Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs ^ 3 ~ 7g Description of the Invention (Η) The downstream part. The gas system supplied through the light-off line 162 is discharged to the exhaust pipe 152 through the catalytic unit 156 '. As shown in FIG. 7, the catalytic unit 156 includes: a stainless steel tube-shaped housing 156k;-an upper catalyst 156a and a lower catalyst 156b, which are arranged in the axial direction of the 'type setting body 156k (in (Flow direction); an upper ozone sensor 156c is disposed between the upper catalyst 156a and a lower catalyst 156b; and a lower ozone sensor 156d is disposed further downstream of the lower catalyst 56b. The catalysts 156a and 156b are made of manganese dioxide, which is more resistant to heat than activated carbon. As shown in Fig. 8, the thermal decomposition unit 155 includes a thermal block 155b (heat conductor) made of alumina. Specifically, the thermal decomposition unit 155 has a tube-shaped body 155a made of crystal glass. The thermal block 155b made of alumina contains a large number of gas channels. The thermal block 155b is provided in the tubular body 155 &. The ceramic heater 155c θ is placed outside the tubular body 15 5 a to heat the hot block 15 5 b. The cooling water pipe 155d is provided outside the ceramic heater 155c. A thermal insulation cover 155 £ surrounds the outside of the cooling water pipe 155d. As for the heat element H element 155, a stainless steel heater can be used. but

_*"**_丨_ __ι_丨__υ»III 較佳使用^呂氧製成加熱器作為熱分解單元155。其理由說 明如後’如前述’氮氣(N2)供給臭氧化器161俾更穩定產 生臭氧。如此氮氣及臭氧可能反應而產生氮氧化物(Ν〇χ) 。liAik物(Ν〇χ)ϋ1^;變成硝酸(νο3)。硝酸造成腐蝕。換 -〜一..,、一一·,· 一—》 言之,當熱方塊155b係由鋁氧製成時,熱方塊1551)可防止 被氮氧化物腐姓。 此外熱方塊155b可由任一種陶瓷製成。 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) -----:-------------^ (請先閱讀背面之注意事項再填寫本頁) 17_ * " ** _ 丨 _ __ι_ 丨 __υ »III It is preferable to use a heater made of ^ Lu as the thermal decomposition unit 155. The reason is explained later. As described above, the nitrogen gas (N2) is supplied to the ozonator 161 俾 to generate ozone more stably. In this way, nitrogen and ozone may react to produce nitrogen oxides (NOx). liAik (N0χ) ϋ1 ^; becomes nitric acid (νο3). Nitric acid causes corrosion. Change-~ one .., one one ..., one-- "In other words, when the thermal block 155b is made of aluminum oxide, the thermal block 1551) can be prevented from being rotten by nitrogen oxides. In addition, the thermal block 155b may be made of any ceramic. This paper size applies to China National Standard (CNS) A4 (210 X 297 mm) -----: ------------- ^ (Please read the notes on the back before filling in this (Page) 17

47377B η 修正 補充 Α7 Β7 經濟部智慧財產局員工消費合作社印製 五、發明說明(15) 催化單元156係設置於排於系統150之比熱分解單元 155更下游部分之理由如後。由於排放系統15〇之壓力改變 可能產生由排放系統150至處理腔室容器1〇1内部的逆流。 然後若催化單元156設置於接近處理腔室容1〇1,則催化劑 二氧化錳可能流入處理腔室容器内部。二氧化錳對半導體 晶圓W造成治金污染。 此外,為了防止排放系統150内部的設備或構造被腐 蝕,可有效導入惰性氣體如氮氣(N2)至排氣管152來以惰 性氣體稀釋氮氧化物(NOx)。於第6圖所示單元,惰性氣 體導入管158(惰性氣體導入單元)聯結至熱排放系統15〇於 比熱分解單元155更上游部分,換言之介於處理腔室容器 101與熱分解單元155間《惰性氣體導入管158之作用係以 氮氣(N2)稀釋排放的氣體。如此可防止真空幫浦1 5 1、催 化單元1 56等被腐蝕或損壞。 其次說明前述氧化處理單元之操作如後。 當半導體晶圓W以氧化處理單元處理時,首先轉運臂 (圖中未顯示)設置於轉運腔室容器,轉運半導體晶圓W至 經由閘閥108至處理腔室容器101内部。半導體晶圓w置於 平台103上且由靜電失頭固定。然後結合平台1〇3之加熱器 加熱半導體晶圓W至預定處理溫度。然後處理腔室容器1〇i 内部壓力藉由處理腔室101内側排放氣而被降至預定處理 壓力。處理腔室容器101内側壓力維持於預定處理壓力(於 真空程度),同時作為處理氣體之臭氧氣體供給處理腔室 容器101内側《臭氧化器161產生的臭氧氣體(〇3)經由供氣 本紙張尺度過用中國國家標準(CNS)A4規格(210 X 297公釐) <請先閱讀背面之注意事項再填寫本頁) 丨· 裝 訂-------- 473776 經濟部智慧財產局員工消費合作社印製 A7 B7 五、發明說明(17) 容易被偵知。若偵測得催化劑156a&156b的惡化等,則可 以新的催化劑更換催化劑156&及156b。 如此根據氧化處理單元,熱分解臭氧用的熱分解單元 155設置於排放系統15〇。如此廢氣裏的剩餘臭氧可降至容 許程度。 此外熱分解單元155包括鋁氧製成的熱方塊1551)(導熱 器)。如此即使排放氣體含有氮氧化物(Ν〇χ),熱分解單元 15 5可避免被腐|虫而改良其耐用性。 此外,分解臭氧之催化單元156設置於排放系統15〇於 比熱分解單元155更下游部分。如此未被熱分解單元155所 分解的殘餘臭氧可被催化單元丨56充分分解。此外即使由 於排氣管152壓力變化而於處理腔室容器1〇1内部產生逆流 ,也可避免半導體晶圓W受催化劑的治金污染。 此外,以惰性氣體稀釋排放氣體用之惰性氣體導入單 兀158設置於排氣系統! 50位於比催化單元丨56更上游部分 且比熱分解單元1 55更上游部分。如此即使排放氣體含有 氮氧化物(NOx),排氣系統150之設備及/或催化單元156的 催化劑可避免受氮氧化物的腐蝕或損壞,如此改良其耐用 性。 ' 本發明非僅囿限於前述具體實施例,而可做多種修改。例 如前述具體實施例之氧化處理單元屬於冷壁型。但本發明 可應用於熱壁型。此外,臭氧可藉紫外光分解而於處理腔 室容器内部被基材進行氧化處理。但臭氧也可由熱式紫外 光以及熱的組合分解。此外,前述具體實施例之氧化處理 <請先閱讀背面之注意事項再填寫本頁)47377B η Amendment Supplement Α7 Β7 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 5. Description of the Invention (15) The reason why the catalytic unit 156 is installed in the system 150 downstream of the thermal decomposition unit 155 is as follows. Due to the pressure change of the discharge system 150, a backflow from the discharge system 150 to the inside of the processing chamber container 101 may occur. Then, if the catalytic unit 156 is disposed close to the processing chamber volume 101, the catalyst manganese dioxide may flow into the inside of the processing chamber container. Manganese dioxide causes gold pollution to the semiconductor wafer W. In addition, in order to prevent the equipment or structure inside the exhaust system 150 from being corroded, an inert gas such as nitrogen (N2) may be effectively introduced into the exhaust pipe 152 to dilute nitrogen oxides (NOx) with the inert gas. In the unit shown in FIG. 6, the inert gas introduction pipe 158 (inert gas introduction unit) is connected to the heat exhaust system 15, which is upstream of the thermal decomposition unit 155, in other words, between the processing chamber container 101 and the thermal decomposition unit 155. The function of the inert gas introduction pipe 158 is to dilute the discharged gas with nitrogen (N2). This prevents the vacuum pump 1 5 1 and the catalytic unit 1 56 from being corroded or damaged. The operation of the aforementioned oxidation treatment unit will be described later. When the semiconductor wafer W is processed by the oxidation processing unit, a transfer arm (not shown) is first provided in the transfer chamber container, and the semiconductor wafer W is transferred to the inside of the processing chamber container 101 through the gate valve 108. The semiconductor wafer w is placed on the stage 103 and fixed by an electrostatic head. The semiconductor wafer W is then heated to a predetermined processing temperature in conjunction with the heater of the platform 103. Then, the internal pressure of the processing chamber container 10i is reduced to a predetermined processing pressure by discharging gas inside the processing chamber 101. The pressure inside the processing chamber container 101 is maintained at a predetermined processing pressure (at a vacuum level), and at the same time, ozone gas as a processing gas is supplied to the inside of the processing chamber container 101. The ozone gas generated by the ozonizer 161 passes through the paper supply air. Standards have been used in China National Standard (CNS) A4 specifications (210 X 297 mm) < Please read the notes on the back before filling this page) 丨 Binding -------- 473776 Staff of Intellectual Property Bureau, Ministry of Economic Affairs Printed by Consumer Cooperative A7 B7 V. Description of Invention (17) Easy to detect. If deterioration of the catalyst 156a & 156b is detected, the catalyst 156 & and 156b can be replaced with a new catalyst. In this way, according to the oxidation treatment unit, the thermal decomposition unit 155 for thermally decomposing ozone is provided in the exhaust system 150. In this way, the residual ozone in the exhaust gas can be reduced to a tolerable level. In addition, the thermal decomposition unit 155 includes a thermal block 1551) (a heat conductor) made of aluminum oxide. In this way, even if the exhaust gas contains nitrogen oxides (NOx), the thermal decomposition unit 15 5 can avoid being rotten by insects and improve its durability. In addition, the ozone-decomposing catalytic unit 156 is provided in the exhaust system 150 further downstream than the thermal decomposition unit 155. The residual ozone thus not decomposed by the thermal decomposition unit 155 can be sufficiently decomposed by the catalytic unit 56. In addition, even if a backflow occurs inside the processing chamber container 101 due to the pressure change of the exhaust pipe 152, the semiconductor wafer W can be prevented from being contaminated with gold by the catalyst. In addition, an inert gas introduction unit 158 for diluting the exhaust gas with an inert gas is installed in the exhaust system! 50 is located more upstream than the catalytic unit 56 and more upstream than the thermal decomposition unit 1 55. Thus, even if the exhaust gas contains nitrogen oxides (NOx), the equipment of the exhaust system 150 and / or the catalyst of the catalytic unit 156 can be prevented from being corroded or damaged by the nitrogen oxides, thus improving its durability. '' The present invention is not limited to the foregoing specific embodiments, but various modifications can be made. For example, the oxidation treatment unit of the foregoing specific embodiment is of a cold wall type. However, the present invention is applicable to a hot wall type. In addition, ozone can be decomposed by ultraviolet light to be oxidized by the substrate inside the processing chamber container. However, ozone can also be decomposed by a combination of thermal ultraviolet light and heat. In addition, the oxidation treatment of the foregoing specific embodiments < Please read the precautions on the back before filling this page)

473776 . A7 _B7_ 五、發明說明(18) 單元為單一基材的處理單元。但本發明也可應用至批次式 處理單元。基材可為玻璃基材、LCD基材等而非半導體晶 經濟,部智慧財產局員工消費合作社印製473776. A7 _B7_ 5. Description of the invention (18) The unit is a processing unit with a single substrate. However, the present invention is also applicable to a batch type processing unit. The substrate can be glass substrate, LCD substrate, etc. instead of semiconductor crystal Economy, printed by the consumer cooperative of employees of the Ministry of Intellectual Property Bureau

I------— — — — — — · I I I l· I I I 訂— — — — — — — I- (請先閱讀背面之注意事項再填寫本頁) 21 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 473776 A7 _B7_ 五、發明說明(19) 元件標號對照 經濟部智慧財產局員工消費合作社印製 1...處理腔室容器 2...排氣口 3...旋轉平台 5...噴淋頭 6...共氣管 7...晶圓轉運口 8···閘閥 10···窗口 11·.·開口 12·..蓋 13...轉運腔室容器 15…處理氣體排放系統 20...燈罩 21..,紫外燈 22...進氣口 23...出氣口 24…鼓風機 50…處理熱排放系統 50a...主排放管 50b...副排放管 50y...接頭 51..催化單元 5 2...臭氧感測器 53...鼓風機 61-2...殼體 61a-62a...凸緣 61b-62b…聯結部 61c-62c...周邊凸緣 6 3 · 4...線網 65...催化劑 70...隋性氣體循環系統 71...循環管 72…熱輻射器 101·.處理腔室容器 102."排氣口 103…旋轉平台 105...噴淋頭 106…氣體導入管 107…晶圓轉運口 10 8...閘閥 110···窗口 111···開口 112…蓋 120··.燈罩 (請先閱讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) —22 473776 A7 _B7 五、發明說明(20) 經濟,部智慧財產局員工消費合作社印製I ------— — — — — — · III l · III Order — — — — — — — — I- (Please read the notes on the back before filling out this page) 21 This paper size applies to Chinese national standards ( CNS) A4 specification (210 X 297 mm) 473776 A7 _B7_ V. Description of the invention (19) The component number is printed on the basis of the employee's consumer cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 1 ... processing chamber container 2 ... exhaust port 3 ... rotation platform 5 ... spray head 6 ... common air pipe 7 ... wafer transfer port 8 ... gate valve 10 ... window 11 ... opening 12 ... cover 13 ... Transfer chamber container 15 ... Process gas exhaust system 20 ... Lamp cover 21 .., UV lamp 22 ... Air inlet 23 ... Air outlet 24 ... Blower 50 ... Process heat exhaust system 50a ... Main exhaust pipe 50b ... sub-emission pipe 50y ... connector 51..catalytic unit 5 2 ... ozone sensor 53 ... blower 61-2 ... case 61a-62a ... flange 61b-62b ... couplings 61c-62c ... peripheral flanges 6 3 · 4 ... wire network 65 ... catalyst 70 ... inert gas circulation system 71 ... circulation tube 72 ... heat radiator 101 ... treatment Chamber container 102. " Exhaust port 103 ... Rotary platform 105 ... Spray Head 106 ... gas introduction tube 107 ... wafer transfer port 10 8 ... gate valve 110 ... window 111 ... opening 112 ... cap 120 ... light cover (please read the precautions on the back before filling this page) Paper size applies to China National Standard (CNS) A4 (210 X 297 mm) —22 473776 A7 _B7 V. Description of invention (20) Printed by the Consumer Cooperative of the Ministry of Economy and Intellectual Property Bureau

121…紫外燈 122...進氣口 123...出氣口 124...鼓風機 150…排氣系統 151…真空幫浦 152...排氣管 155…熱分解單元 155a...管形本體 155b...熱方塊 15 5 c…陶究加熱器 155d...冷卻水管 155e...絕熱蓋 156...催化單元 156a...上催化劑 156b··.下催化劑 156c...上臭氧感測器 156d...下臭氧感測器 156k...管形殼體 158…隋性氣體導入單元 160…處理氣體供給單元 161…臭氧化器 162...起燃管線 163-4...開關閥 -------------裝----l·---訂---------線 (請先閱讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 23121 ... ultraviolet lamp 122 ... air inlet 123 ... air outlet 124 ... blower 150 ... exhaust system 151 ... vacuum pump 152 ... exhaust pipe 155 ... thermal decomposition unit 155a ... tube shape Body 155b ... heat block 15 5c ... ceramic heater 155d ... cooling water pipe 155e ... insulation cover 156 ... catalytic unit 156a ... upper catalyst 156b ... lower catalyst 156c ... upper Ozone sensor 156d ... lower ozone sensor 156k ... tubular housing 158 ... inert gas introduction unit 160 ... processing gas supply unit 161 ... ozonizer 162 ... ignition line 163-4. .. on-off valve ------------- install ---- l · --- order --------- line (Please read the precautions on the back before filling this page ) This paper size applies to China National Standard (CNS) A4 (210 X 297 mm) 23

Claims (1)

473776473776 τ、申請專利範圍 1. 一種氧化處理單元,包含; -處理腔室容器具有一内侧其中可設置基材,該 處理腔室容器具有-窗σ,紫外線可穿透該窗口, 一燈罩具有—紫外燈,紫外燈可發射紫外光通過 窗口至處理腔室容器内側, 一處理氣體供給單元用以供給一包括臭氧的處理 氣體至處理腔室容器内側, 一進氣口用以將冷卻用—空-色導入燈罩内部, 一出氣口用以由燈罩排放冷卻用空氣,以及 一臭氧分解單元聯結至一出氣口, 其中來自紫外燈的紫外光照射至供給至處理腔室 容器内側的處理氣體,故處理氣體的臭氧被分解而對 置於處理腔室容器内側的基材進行氧化處理。 2. 如申請專利範圍第1項之氧化處理單元,其中: 臭氧分解單元係由一催化單元之組成,該單元含 有一種催化劑主要包含二氧化錳。 3. 如申請專利範圍第1項之氧化處理單元,其中: 臭氧分解單元係由一具有一加熱器之熱分解單元 組成。 4. 一種氧化處理單元,包含; 一處理腔室容器具有一内側其中可設置基材,該 處理腔室容器具有一窗口,紫外線可穿透該窗口, 一燈罩具有一紫外燈,紫外燈可發射紫外光通過 窗口至處理腔室容器内側, 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公餐) (請先閱讀背面之注意事項再填寫本頁) --------訂---------線—齡 經濟部智慧財產局員工消費合作社印製 > n ϋ .1 — ϋ .1 ϋ ϋ 24 β3776 經濟部智慧財產局員工消費合作社印製 Ab B5 Cb -___ D8 申請專利範圍 一處理氣體供給單元用以供給一包括臭氧的處理 氣體至處理腔室容器内側, 一進氣口用以將冷卻用惰性氣體導入燈罩内部, 以及 一出氣口用以由燈罩排放冷卻用惰性氣體, 其中來自紫外燈的紫外光照射至供給至處理腔室 容器内側的處理氣體,故處理氣體的臭氧被分解而對 置於處理腔室容器内側的基材進行氧化處理。 5.如申請專利範圍第4項之氧化處理單元,其中: 進氣口及出氣口係連通至循環系統用以使惰性裹 體循環,以及 循環系統設置^ ^射器,其可輻射循環系統致使 循環的惰性氣體的熱。 6· —種氧化處理單元,包含; 一處理腔室容器具有一内側其中可設置基材, 處理氣體供給卓元用以供給一包括臭氧的處理 氣體至處理腔室容器内側, 一加熱器用以加熱置於處理腔室容器内側之基材 , 一排氣系統用以降低處理腔室容器内側的壓力, 以及由處理腔室容器内側排放氣體,以及 一 單^設置於排氣系統用以熱分解臭氧, 其中包括於供於處理腔室容器内側的處理氣體的 臭氧被分解而對設置於處理腔室容器内側的基材進行 本纸張尺度適用中國國家標準(CNS)A4規格(210 X 297公餐) 4 ----------------------裝--------訂---------線 (請先閱讀背面之注意事項再填寫本頁} 25 申請專利範圍 氧化處理。 7. 如申請專利範圍第6項之氧化處理單元,其中: 熱分解單元包括-紹氧製成的導熱器。 8. 如申=專利範圍第6項之氧化處理單元,其中: /刀解臭氧之催化單元係設置於排氣系統位在比 熱分解單元更下游部分。 9. 如申請專利範圍第6項之氧化處理單元,其中·· 一惰性氣體導入單元用以使用惰性氣體稀釋由處 理月工至谷益内側排放的氣體,該惰性氣體導入單元係 e又置排放系統位在比熱分解單元更上游部分。 --------^---------線 —ttw. (請先閱讀背面之;i意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 26τ, patent application scope 1. An oxidation treatment unit comprising:-a processing chamber container having an inner side in which a substrate can be set, the processing chamber container having a window σ, ultraviolet rays can penetrate the window, and a lampshade having-ultraviolet rays Lamp, ultraviolet lamp can emit ultraviolet light through the window to the inside of the processing chamber container, a processing gas supply unit is used to supply a processing gas including ozone to the inside of the processing chamber container, and an air inlet is used for cooling-air- Color is introduced into the lamp cover, an air outlet is used to discharge cooling air from the lamp cover, and an ozone decomposition unit is connected to an air outlet, in which ultraviolet light from the ultraviolet lamp is irradiated to the processing gas supplied to the inside of the processing chamber container, The ozone of the gas is decomposed to oxidize the substrate placed inside the processing chamber container. 2. For example, the oxidation treatment unit in the scope of patent application, wherein: the ozone decomposition unit is composed of a catalytic unit, which contains a catalyst mainly containing manganese dioxide. 3. The oxidation treatment unit according to item 1 of the patent application scope, wherein: the ozone decomposition unit is composed of a thermal decomposition unit with a heater. 4. An oxidation processing unit comprising: a processing chamber container having an inner side in which a substrate can be set, the processing chamber container having a window through which ultraviolet rays can penetrate, a lampshade having an ultraviolet lamp, and an ultraviolet lamp capable of emitting Ultraviolet light passes through the window to the inside of the processing chamber container. This paper size is applicable to Chinese National Standard (CNS) A4 (210 X 297 meals) (Please read the precautions on the back before filling this page) ------- -Order --------- Line-printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs > n ϋ .1 — ϋ .1 ϋ ϋ 24 β3776 Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economy Ab B5 Cb -___ D8 Patent application scope A processing gas supply unit is used to supply a processing gas including ozone to the inside of the processing chamber container, an air inlet is used to introduce cooling inert gas into the interior of the lampshade, and an air outlet is used by The lamp cover emits inert gas for cooling, in which ultraviolet light from the ultraviolet lamp is irradiated to the processing gas supplied to the inside of the processing chamber container, so the ozone of the processing gas is decomposed and placed on Substrate holder inside the processing chamber for oxidation treatment. 5. The oxidation treatment unit according to item 4 of the scope of patent application, wherein: the air inlet and the air outlet are connected to the circulation system to circulate the inert wrap, and the circulation system is provided with a radiator which can radiate the circulation system to cause circulation Of inert gas. 6. · An oxidation processing unit comprising: a processing chamber container having an inner side in which a substrate can be set, a processing gas supply Zhuo Yuan for supplying a processing gas including ozone to the inside of the processing chamber container, and a heater for heating A substrate placed inside the processing chamber container, an exhaust system to reduce the pressure inside the processing chamber container, and gas to be discharged from the inside of the processing chamber container, and a single set in the exhaust system to thermally decompose ozone Among them, the ozone included in the processing gas supplied to the inside of the processing chamber container is decomposed, and the substrate provided inside the processing chamber container is subjected to the paper standard applicable to Chinese National Standard (CNS) A4 specification (210 X 297 meals) ) 4 ---------------------- install -------- order --------- line (please read the back first Please fill in this page again for attention} 25 Oxidation treatment in the scope of patent application. 7. For example, the oxidation treatment unit in the scope of patent application item 6, where: The thermal decomposition unit includes-a heat exchanger made of oxygen. 8. Rushen = patent scope The oxidation treatment unit of item 6, wherein: The catalytic unit is located in the exhaust system downstream of the thermal decomposition unit. 9. For example, the oxidation treatment unit in the scope of patent application No. 6, where an inert gas introduction unit is used to dilute the inert gas from the processing month to The gas discharged from the inside of Gu Yi, the inert gas introduction unit system e is also set to the discharge system located upstream of the thermal decomposition unit. -------- ^ --------- line—ttw. ( (Please read the back; please fill in this page for the details) (Printed by the Intellectual Property Bureau of the Ministry of Economic Affairs, Consumer Cooperatives 26
TW089109931A 1999-05-24 2000-05-23 Oxidation processing unit TW473776B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP11142561A JP2000332006A (en) 1999-05-24 1999-05-24 Oxidizing apparatus
JP11196831A JP2001023977A (en) 1999-07-12 1999-07-12 Oxidation apparatus

Publications (1)

Publication Number Publication Date
TW473776B true TW473776B (en) 2002-01-21

Family

ID=26474526

Family Applications (1)

Application Number Title Priority Date Filing Date
TW089109931A TW473776B (en) 1999-05-24 2000-05-23 Oxidation processing unit

Country Status (2)

Country Link
KR (1) KR20010020883A (en)
TW (1) TW473776B (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100706790B1 (en) * 2005-12-01 2007-04-12 삼성전자주식회사 Oxidation treatment apparatus and method
KR102162336B1 (en) * 2019-03-08 2020-10-06 주식회사 원익큐엔씨 Apparatus for removing ozone generated during surface modification
JP7186114B2 (en) 2019-03-15 2022-12-08 東京エレクトロン株式会社 SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD
KR102138300B1 (en) * 2020-03-25 2020-07-27 주식회사 아우르다 air sterilization device and method

Also Published As

Publication number Publication date
KR20010020883A (en) 2001-03-15

Similar Documents

Publication Publication Date Title
US9017613B2 (en) Ultraviolet photoreactor for the purification of fluids
KR100882052B1 (en) Nitrogen enriched cooling air module for uv curing system
US20150114822A1 (en) Photocatalytic Oxidation Apparatus for Oxidizing Volatile Organic Compounds
JP3004730B2 (en) Improved lamp cooler for UV lamp reactor assembly
JPH08150317A (en) Waste gas treating device
KR20050074275A (en) Gas heating method and gas heating device
WO2000006961A1 (en) Drier, drier assembly and drying method
TW473776B (en) Oxidation processing unit
JP2018020939A (en) Ozone generator
JP5003976B2 (en) Ozonizer and process system
WO1995001307A1 (en) Treatment of fluids
JPS6157222A (en) Apparatus for purifying noxious substance containing halogen
JP3780989B2 (en) Deodorizer
CN101109073A (en) Nitrogen enriched cooling air module for uv curing system
JP2006207864A (en) Combustion deodorizing device and combustion deodorizing method
JP4329629B2 (en) Excimer lamp
TWM608358U (en) Waste gas treatment facility
JP5391452B2 (en) Ozonizer and process system
JP2006275421A (en) Exhaust gas detoxifying device
JP5904063B2 (en) Gas activation device and nitrogen oxide treatment device
JP2006096600A (en) Ozone generator
CN213099706U (en) Portable catalyst infrared sterilization device
CN213475666U (en) Advanced oxidation system for treating sewage
JP2004000920A (en) Reactor and reaction method
JP2002263596A (en) Ultraviolet irradiation device

Legal Events

Date Code Title Description
GD4A Issue of patent certificate for granted invention patent
MM4A Annulment or lapse of patent due to non-payment of fees