TW456518U - IC testing device - Google Patents

IC testing device

Info

Publication number
TW456518U
TW456518U TW88217626U TW88217626U TW456518U TW 456518 U TW456518 U TW 456518U TW 88217626 U TW88217626 U TW 88217626U TW 88217626 U TW88217626 U TW 88217626U TW 456518 U TW456518 U TW 456518U
Authority
TW
Taiwan
Prior art keywords
testing device
testing
Prior art date
Application number
TW88217626U
Other languages
Chinese (zh)
Inventor
Rung-Guei Deng
Original Assignee
Hon Tech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hon Tech Inc filed Critical Hon Tech Inc
Priority to TW88217626U priority Critical patent/TW456518U/en
Publication of TW456518U publication Critical patent/TW456518U/en

Links

TW88217626U 1999-10-14 1999-10-14 IC testing device TW456518U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW88217626U TW456518U (en) 1999-10-14 1999-10-14 IC testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW88217626U TW456518U (en) 1999-10-14 1999-10-14 IC testing device

Publications (1)

Publication Number Publication Date
TW456518U true TW456518U (en) 2001-09-21

Family

ID=21654918

Family Applications (1)

Application Number Title Priority Date Filing Date
TW88217626U TW456518U (en) 1999-10-14 1999-10-14 IC testing device

Country Status (1)

Country Link
TW (1) TW456518U (en)

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Legal Events

Date Code Title Description
GD4K Issue of patent certificate for granted utility model filed before june 30, 2004
MM4K Annulment or lapse of a utility model due to non-payment of fees