TW380703U - Improved structure for the IC testing device - Google Patents

Improved structure for the IC testing device

Info

Publication number
TW380703U
TW380703U TW087221120U TW87221120U TW380703U TW 380703 U TW380703 U TW 380703U TW 087221120 U TW087221120 U TW 087221120U TW 87221120 U TW87221120 U TW 87221120U TW 380703 U TW380703 U TW 380703U
Authority
TW
Taiwan
Prior art keywords
testing device
improved structure
improved
testing
Prior art date
Application number
TW087221120U
Other languages
Chinese (zh)
Inventor
Dan-Yi Wang
Original Assignee
Top Forward Science Enterprise Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Top Forward Science Enterprise Co Ltd filed Critical Top Forward Science Enterprise Co Ltd
Priority to TW087221120U priority Critical patent/TW380703U/en
Publication of TW380703U publication Critical patent/TW380703U/en

Links

TW087221120U 1998-12-18 1998-12-18 Improved structure for the IC testing device TW380703U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW087221120U TW380703U (en) 1998-12-18 1998-12-18 Improved structure for the IC testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW087221120U TW380703U (en) 1998-12-18 1998-12-18 Improved structure for the IC testing device

Publications (1)

Publication Number Publication Date
TW380703U true TW380703U (en) 2000-01-21

Family

ID=60582961

Family Applications (1)

Application Number Title Priority Date Filing Date
TW087221120U TW380703U (en) 1998-12-18 1998-12-18 Improved structure for the IC testing device

Country Status (1)

Country Link
TW (1) TW380703U (en)

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