TW449528B - Improved polishing pad with reduced moisture absorption - Google Patents
Improved polishing pad with reduced moisture absorption Download PDFInfo
- Publication number
- TW449528B TW449528B TW088109099A TW88109099A TW449528B TW 449528 B TW449528 B TW 449528B TW 088109099 A TW088109099 A TW 088109099A TW 88109099 A TW88109099 A TW 88109099A TW 449528 B TW449528 B TW 449528B
- Authority
- TW
- Taiwan
- Prior art keywords
- pad
- patent application
- item
- scope
- additive
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
- B24D11/001—Manufacture of flexible abrasive materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D3/00—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
- B24D3/02—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent
- B24D3/20—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially organic
- B24D3/22—Rubbers synthetic or natural
- B24D3/26—Rubbers synthetic or natural for porous or cellular structure
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D3/00—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
- B24D3/34—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents characterised by additives enhancing special physical properties, e.g. wear resistance, electric conductivity, self-cleaning properties
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Manufacture Of Porous Articles, And Recovery And Treatment Of Waste Products (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Abstract
Description
經濟部智慧財產局員工消費合作杜印製 4495 2 8 A7 __B7___ 五、發明說明(/ ) 相關申請案= 本案係1998年6月2日於美國所申請、序號 60/087,742之臨時申請案的完整申請案。 發明背景= 本發明之目的是要製造具有增加抵抗溼氣吸收之拋光 墊、帶或其他裝置,以便改善平坦化效果和均一性。 目前可得之拋光墊典型爲聚氨酯發泡材料,由於其很 容易吸收溼氣,因此其有效性和均一性會受到限制。在操 作時,拋光墊會和水溶性漿液和淸除溶液做連續接觸。吸 收的溼氣會以下列雨方式影響拋光墊的功能: 由於物性和化性的衰退而產生軟化、膨脹或失去堅硬 的特性,結果使得拋光墊的平坦化效果和壽命都降低了, 由於使用期間逐漸改變了拋光墊的性質及完整性,結 果產生不穩定和不一致的效能。 由於之前的拋光墊的疏水性太強,因而溼潤性不佳, 漿液無法充分分佈,且移除率也會降低,所以先前製造具 .有減少溼氣吸收或具有增加抵抗衰退能力之拋光墊的嘗試 均受到了限制。本發明經由親水性添加物的使用而克服了 一般疏水性拋光墊的限制。 發明綜述: 本發明包含一相對抗溼氣的拋光墊,其具有添加物可 改善拋光墊表面的溼潤性,以使漿液良好的分布。 發明簡述= 雖然本發明之描述係有關於墊*然而本發明亦可爲任 3 I I I I 1 1 ^^ · I I *--1 - I «II I I I ! I I {請先閱讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 經濟部智慧財產局員工消費合作社即製 《495 2 8 A7 . ____B7_- _ 五、發明說明(α ) 何適合的型式或形狀,包括(但並不限制於)片狀、帶狀、 碟片狀、滾筒狀和鐘擺狀等。 拋光墊的基底材料可爲任何聚合物材料或任何聚合物 材料的組合,包括熱塑性和交聯的材料,其在浸泡24小時 之後吸收少於4%的溼氣。 拋光墊可包含一多孔的結構。此多孔性可用任何適當 的方法來達成,包括(但並不限制於)吹氣、起泡、和夾雜 充塡的或未充塡的中空微元件等。此孔洞可爲尺寸、形狀 和品質(開放的或封閉的胞室)的任意組合或分佈。 拋光墊可以包含任何型式的組織紋理,其可自然形成 或以任何適當的方法形成。此組織紋理可在製造過程時產 生,或在使用時產生。 適合改善溼潤性和漿液之分佈性的添加物包括任何型 式的親水性添加物,如界面活性劑,及相對極性的聚合物 材料,包括(但並不限制於)聚氨酯 '聚醯胺、和聚酯。添 加物可爲液態、固態、半固態、或固態和液態的組合此 添加物與拋光墊中其他的材料可呈反應性或非反應性。添 加物可位於聚合物基底中或拋光材料的孔洞中。添加牧J可· 爲任何形狀、尺寸、或分布,且能夠執行額外的功能(例如 親水性的中空珠子,用來增加溼潤性和產生多孔性卜 物可維持在原來的位置且與拋光材料一起磨耗掉,或 加物可突然釋出或沾附成一層披覆、塡入、或以其他-方g 改善墊表面和漿液之間的交互作用。. 4 — 111 — — —--- > — I . — — — ---I i i I I I__I_I (請先閱讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNSDA4規格(210x 297公t )Printed by the Intellectual Property Bureau of the Ministry of Economic Affairs on employee consumption 4495 2 8 A7 __B7___ V. Description of the Invention (/) Related Application = This case is the complete provisional application numbered 60 / 087,742, filed in the United States on June 2, 1998 Application. BACKGROUND OF THE INVENTION = The purpose of the present invention is to manufacture a polishing pad, belt or other device having increased resistance to moisture absorption in order to improve the flattening effect and uniformity. The polishing pads currently available are typically polyurethane foams, and because they absorb moisture easily, their effectiveness and uniformity are limited. During operation, the polishing pads are in continuous contact with the water-soluble slurry and the wipe solution. The absorbed moisture will affect the function of the polishing pad in the following ways: Softening, swelling or loss of rigidity due to the decline of physical properties and chemical properties. As a result, the flattening effect and life of the polishing pad are reduced. Gradually changing the nature and integrity of the polishing pad results in unstable and inconsistent performance. Because the previous polishing pad was too hydrophobic, so the wettability was poor, the slurry could not be fully distributed, and the removal rate would be reduced, so the previous manufacturing of polishing pads that have reduced moisture absorption or increased resistance to decay Attempts have been limited. The present invention overcomes the limitations of conventional hydrophobic polishing pads through the use of hydrophilic additives. Summary of the Invention: The present invention includes a relatively moisture-resistant polishing pad with additives that can improve the wettability of the surface of the polishing pad, so that the slurry is well distributed. Brief description of the invention = Although the description of the present invention is about pads *, the present invention can also be used for any 3 IIII 1 1 ^^ · II *-1-I «II III! II {Please read the notes on the back before filling (This page) This paper size is in accordance with the Chinese National Standard (CNS) A4 (210 X 297 mm). This is the “495 2 8 A7. __B7_- _” _5_7_7__ _ 5 What is the invention description (α)? The type or shape includes, but is not limited to, sheet, belt, disc, roller, and pendulum. The base material of the polishing pad can be any polymer material or any combination of polymer materials, including thermoplastic and crosslinked materials, which absorb less than 4% of moisture after soaking for 24 hours. The polishing pad may include a porous structure. This porosity can be achieved by any suitable method, including (but not limited to) air blowing, foaming, and inclusion of filled or unfilled hollow micro-elements. This hole can be any combination or distribution of size, shape and quality (open or closed cells). The polishing pad may contain any type of tissue texture, which may be formed naturally or by any suitable method. This tissue texture can be generated during the manufacturing process or during use. Additives suitable for improving wettability and slurry distribution include any type of hydrophilic additives, such as surfactants, and relatively polar polymer materials, including (but not limited to) polyurethane 'polyamines, and polymers ester. Additives can be liquid, solid, semi-solid, or a combination of solid and liquid. The additive can be reactive or non-reactive with other materials in the polishing pad. Additives can be located in the polymer substrate or in the holes of the polishing material. Adding Maki may be any shape, size, or distribution, and can perform additional functions (such as hydrophilic hollow beads, used to increase wetting and produce porosity. The material can be maintained in the original position and together with the polishing material Wear away, or the additive can be suddenly released or attached as a layer of coating, penetration, or other -square g to improve the interaction between the surface of the pad and the slurry .. 4 — 111 — — —--- > — I. — — — --- I ii II I__I_I (Please read the notes on the back before filling out this page) This paper size applies to Chinese national standard (CNSDA4 specification (210x 297mm t))
Claims (1)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US8774298P | 1998-06-02 | 1998-06-02 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW449528B true TW449528B (en) | 2001-08-11 |
Family
ID=22206976
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW088109099A TW449528B (en) | 1998-06-02 | 1999-06-02 | Improved polishing pad with reduced moisture absorption |
Country Status (6)
Country | Link |
---|---|
EP (1) | EP1091831A1 (en) |
JP (1) | JP2002516764A (en) |
KR (1) | KR100563172B1 (en) |
AU (1) | AU4272499A (en) |
TW (1) | TW449528B (en) |
WO (1) | WO1999062673A1 (en) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002043922A1 (en) * | 2000-11-29 | 2002-06-06 | Psiloquest, Inc. | Crosslinked polyethylene polishing pad for chemical-mechnical polishing, polishing apparatus and polishing method |
US6688956B1 (en) | 2000-11-29 | 2004-02-10 | Psiloquest Inc. | Substrate polishing device and method |
US6596388B1 (en) | 2000-11-29 | 2003-07-22 | Psiloquest | Method of introducing organic and inorganic grafted compounds throughout a thermoplastic polishing pad using a supercritical fluid and applications therefor |
US6846225B2 (en) | 2000-11-29 | 2005-01-25 | Psiloquest, Inc. | Selective chemical-mechanical polishing properties of a cross-linked polymer and specific applications therefor |
US7059946B1 (en) | 2000-11-29 | 2006-06-13 | Psiloquest Inc. | Compacted polishing pads for improved chemical mechanical polishing longevity |
US6579604B2 (en) | 2000-11-29 | 2003-06-17 | Psiloquest Inc. | Method of altering and preserving the surface properties of a polishing pad and specific applications therefor |
US6575823B1 (en) | 2001-03-06 | 2003-06-10 | Psiloquest Inc. | Polishing pad and method for in situ delivery of chemical mechanical polishing slurry modifiers and applications thereof |
US6764574B1 (en) | 2001-03-06 | 2004-07-20 | Psiloquest | Polishing pad composition and method of use |
US6838169B2 (en) | 2002-09-11 | 2005-01-04 | Psiloquest, Inc. | Polishing pad resistant to delamination |
JP2008221367A (en) * | 2007-03-09 | 2008-09-25 | Toyo Tire & Rubber Co Ltd | Polishing pad |
KR101225436B1 (en) | 2011-01-27 | 2013-01-22 | 삼성전자주식회사 | Polishing pad and manufacturing method thereof |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4728552A (en) * | 1984-07-06 | 1988-03-01 | Rodel, Inc. | Substrate containing fibers of predetermined orientation and process of making the same |
US4613345A (en) * | 1985-08-12 | 1986-09-23 | International Business Machines Corporation | Fixed abrasive polishing media |
JPS62156365A (en) * | 1985-12-27 | 1987-07-11 | Kanebo Ltd | Production of suede-like sheet material |
JPH0288229A (en) * | 1988-09-26 | 1990-03-28 | Rodeele Nitta Kk | Laminate and support of abrasive member in which the laminate is used and abrasive cloth |
JPH074769B2 (en) * | 1991-10-11 | 1995-01-25 | ロデール・ニッタ株式会社 | Polishing cloth |
JP3354744B2 (en) * | 1995-04-25 | 2002-12-09 | ニッタ株式会社 | Polishing cloth and method for attaching and detaching the polishing cloth to and from a polishing machine surface plate |
JPH09248756A (en) * | 1996-03-08 | 1997-09-22 | Chiyoda Kk | Polishing cloth |
JPH10550A (en) * | 1996-06-11 | 1998-01-06 | Toshiba Mach Co Ltd | Abrasive cloth dressing method and its device |
JPH10146754A (en) * | 1996-11-14 | 1998-06-02 | Hitachi Chem Co Ltd | Polishing template material |
-
1999
- 1999-06-01 WO PCT/GB1999/001515 patent/WO1999062673A1/en not_active Application Discontinuation
- 1999-06-01 KR KR1020007013658A patent/KR100563172B1/en not_active IP Right Cessation
- 1999-06-01 JP JP2000551920A patent/JP2002516764A/en active Pending
- 1999-06-01 EP EP99955238A patent/EP1091831A1/en not_active Withdrawn
- 1999-06-01 AU AU42724/99A patent/AU4272499A/en not_active Abandoned
- 1999-06-02 TW TW088109099A patent/TW449528B/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
WO1999062673A1 (en) | 1999-12-09 |
EP1091831A1 (en) | 2001-04-18 |
JP2002516764A (en) | 2002-06-11 |
AU4272499A (en) | 1999-12-20 |
KR20010071381A (en) | 2001-07-28 |
KR100563172B1 (en) | 2006-03-27 |
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Legal Events
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GD4A | Issue of patent certificate for granted invention patent | ||
MK4A | Expiration of patent term of an invention patent |