TW362154B - Slots for electrical parts - Google Patents

Slots for electrical parts

Info

Publication number
TW362154B
TW362154B TW087101851A TW87101851A TW362154B TW 362154 B TW362154 B TW 362154B TW 087101851 A TW087101851 A TW 087101851A TW 87101851 A TW87101851 A TW 87101851A TW 362154 B TW362154 B TW 362154B
Authority
TW
Taiwan
Prior art keywords
electrical parts
plate
plates
slots
guide plate
Prior art date
Application number
TW087101851A
Other languages
Chinese (zh)
Inventor
Yasushi Kajiwara
Original Assignee
Enplas Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP04156497A external-priority patent/JP3460919B2/en
Priority claimed from JP27380597A external-priority patent/JP3503800B2/en
Application filed by Enplas Co Ltd filed Critical Enplas Co Ltd
Application granted granted Critical
Publication of TW362154B publication Critical patent/TW362154B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06705—Apparatus for holding or moving single probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Nonlinear Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)

Abstract

A kind of slot for electrical parts which is to clamp the electrical parts by two plates. By the clamping method, the nominal contact voltage is set between the contact plate and the electrode of the electrical components. The feature is that there is a guide component on one of the plates and the guide plate on the other plate; the said guide plate has the base set and a plate which is bent from the front end and vertical to the base set. When pressing one of the said plates, there is a flexible guide plate in the front of the electrical parts and spring-contact to the said guiding components.
TW087101851A 1997-02-11 1998-02-11 Slots for electrical parts TW362154B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP04156497A JP3460919B2 (en) 1997-02-11 1997-02-11 Socket for electrical components
JP27380597A JP3503800B2 (en) 1997-09-21 1997-09-21 Display panel inspection socket

Publications (1)

Publication Number Publication Date
TW362154B true TW362154B (en) 1999-06-21

Family

ID=57940779

Family Applications (1)

Application Number Title Priority Date Filing Date
TW087101851A TW362154B (en) 1997-02-11 1998-02-11 Slots for electrical parts

Country Status (2)

Country Link
KR (1) KR100474163B1 (en)
TW (1) TW362154B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI743730B (en) * 2020-04-06 2021-10-21 旺矽科技股份有限公司 Probe card

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0562712U (en) * 1991-09-25 1993-08-20 松下電工株式会社 Fixture mounting structure
JP3229918B2 (en) * 1995-07-06 2001-11-19 株式会社エンプラス Display panel inspection socket
JP3285465B2 (en) * 1995-04-20 2002-05-27 株式会社エンプラス Display panel inspection socket
JPH0921437A (en) * 1995-07-07 1997-01-21 Tosok Corp Plate spring

Also Published As

Publication number Publication date
KR19980071232A (en) 1998-10-26
KR100474163B1 (en) 2005-06-16

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