TW358549U - Tester for testing integrted circuit - Google Patents

Tester for testing integrted circuit

Info

Publication number
TW358549U
TW358549U TW087207574U TW87207574U TW358549U TW 358549 U TW358549 U TW 358549U TW 087207574 U TW087207574 U TW 087207574U TW 87207574 U TW87207574 U TW 87207574U TW 358549 U TW358549 U TW 358549U
Authority
TW
Taiwan
Prior art keywords
integrted
tester
testing
circuit
testing integrted
Prior art date
Application number
TW087207574U
Other languages
Chinese (zh)
Inventor
qiu-xiong Zheng
Original Assignee
Innotest Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Innotest Inc filed Critical Innotest Inc
Priority to TW087207574U priority Critical patent/TW358549U/en
Publication of TW358549U publication Critical patent/TW358549U/en

Links

TW087207574U 1998-05-15 1998-05-15 Tester for testing integrted circuit TW358549U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW087207574U TW358549U (en) 1998-05-15 1998-05-15 Tester for testing integrted circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW087207574U TW358549U (en) 1998-05-15 1998-05-15 Tester for testing integrted circuit

Publications (1)

Publication Number Publication Date
TW358549U true TW358549U (en) 1999-05-11

Family

ID=54643640

Family Applications (1)

Application Number Title Priority Date Filing Date
TW087207574U TW358549U (en) 1998-05-15 1998-05-15 Tester for testing integrted circuit

Country Status (1)

Country Link
TW (1) TW358549U (en)

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