TW356944U - Improved structure for testing probe of circuit board - Google Patents

Improved structure for testing probe of circuit board

Info

Publication number
TW356944U
TW356944U TW087200663U TW87200663U TW356944U TW 356944 U TW356944 U TW 356944U TW 087200663 U TW087200663 U TW 087200663U TW 87200663 U TW87200663 U TW 87200663U TW 356944 U TW356944 U TW 356944U
Authority
TW
Taiwan
Prior art keywords
circuit board
improved structure
testing probe
probe
testing
Prior art date
Application number
TW087200663U
Other languages
Chinese (zh)
Inventor
gui-liang Xu
Original Assignee
Landrex Technologies Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Landrex Technologies Co Ltd filed Critical Landrex Technologies Co Ltd
Priority to TW087200663U priority Critical patent/TW356944U/en
Publication of TW356944U publication Critical patent/TW356944U/en

Links

TW087200663U 1998-01-15 1998-01-15 Improved structure for testing probe of circuit board TW356944U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW087200663U TW356944U (en) 1998-01-15 1998-01-15 Improved structure for testing probe of circuit board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW087200663U TW356944U (en) 1998-01-15 1998-01-15 Improved structure for testing probe of circuit board

Publications (1)

Publication Number Publication Date
TW356944U true TW356944U (en) 1999-04-21

Family

ID=54643024

Family Applications (1)

Application Number Title Priority Date Filing Date
TW087200663U TW356944U (en) 1998-01-15 1998-01-15 Improved structure for testing probe of circuit board

Country Status (1)

Country Link
TW (1) TW356944U (en)

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